CN109309748B - Cloud mobile phone hardware quality batch test method and system - Google Patents
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- H—ELECTRICITY
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- H—ELECTRICITY
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- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
- H04L43/0805—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters by checking availability
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
Abstract
The invention relates to the technical field of networks, in particular to a cloud mobile phone hardware quality batch testing method, which comprises the following steps: connecting the cloud mobile phone cluster; setting test parameters for testing cloud mobile phone cluster hardware; performing hardware test on each cloud mobile phone in the cloud mobile phone cluster according to preset time; acquiring a final hardware test result of each cloud mobile phone of the cloud mobile phone cluster; and scanning the PCB of each cloud mobile phone in the cloud mobile phone cluster, and judging whether the cloud mobile phone passes the hardware test or not by combining the final hardware test result until the scanning is finished, thereby completing the hardware quality batch test of the cloud mobile phone cluster. The invention further provides a cloud mobile phone hardware quality batch test system. According to the invention, the cloud mobile phones can be automatically detected in batches, various hardware qualities of the cloud mobile phones are automatically tested through a network, defective products are picked out in combination with a code scanning detection mode, and the batch test result of the hardware quality is determined, so that the detection efficiency and the detection result are ensured, and the problems of low efficiency and high possibility of errors caused by manual detection are solved.
Description
Technical Field
The invention relates to the technical field of networks, in particular to a cloud mobile phone hardware quality batch testing method and system.
Background
The cloud mobile phone is a smart phone application cloud platform based on cloud computing powerful virtual application and the mobile internet. Based on the outstanding advantages of cloud computing in large-scale computing, strong storage capacity, virtualization application and the like, the cloud platform provides diversified and omnibearing virtual mobile phone application and service for a smart mobile phone user, comprehensively supports display, downloading, application and management service of various mobile phone application programs, excellently realizes all-weather cloud intelligent hosting application, enables the user to be capable of hosting various application programs to a cloud under the state of being separated from a mobile terminal, keeps all-weather online state and comprehensively realizes smart mobile phone application virtualization.
The common cloud mobile phone hardware detection method is that after a single cloud mobile phone is connected with a display, the single cloud mobile phone is electrified to perform single test, and finally, a result is displayed on a screen and is manually recorded, so that the efficiency is low, and errors are easy to occur.
Disclosure of Invention
Embodiments of the present invention are directed to solving at least one of the technical problems occurring in the prior art. Therefore, the embodiment of the invention needs to provide a cloud mobile phone hardware quality batch testing method and system.
The cloud mobile phone hardware quality batch testing method is characterized by comprising the following steps:
step 1, connecting a cloud mobile phone cluster comprising a plurality of cloud mobile phones;
step 2, setting test parameters for testing cloud mobile phone cluster hardware;
step 3, performing hardware test on each cloud mobile phone in the cloud mobile phone cluster according to preset time;
step 4, obtaining a final hardware test result of each cloud mobile phone of the cloud mobile phone cluster;
and 5, scanning the PCB of each cloud mobile phone in the cloud mobile phone cluster, judging whether the cloud mobile phone passes the hardware test or not by combining the final hardware test result until the scanning is finished, and completing the hardware quality batch test of the cloud mobile phone cluster.
In one embodiment, step 2 comprises: the method comprises the steps of setting the quality of any one or more of the hardware including a CPU, a DDR, an EMMC, a GPU and a network communicator as a test parameter for testing the cloud mobile phone cluster hardware.
In one embodiment, the preset time includes a third time, a fourth time and a fifth time, and step 3 includes: performing a first round of hardware test on each cloud mobile phone in the cloud mobile phone cluster according to a third time, performing a second round of hardware test according to a fourth time if the first round of hardware test result is passed, and performing a third round of hardware test according to a fifth time if the second round of hardware test result is passed; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result;
wherein the third time is greater than the fourth time, and the fourth time is greater than the fifth time.
In one embodiment, the preset time further includes a first time and a second time, and step 3 includes: performing a first round of hardware test on each cloud mobile phone in the cloud mobile phone cluster according to a third time, performing a second round of hardware test according to a second time if the first round of hardware test result is not passed, and performing a third round of hardware test according to the first time if the second round of hardware test result is not passed; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result;
the first time is greater than the second time, and the second time is greater than the third time.
In one embodiment, step 5 comprises: scanning an identification code preset on a PCB (printed Circuit Board) of each cloud mobile phone in the cloud mobile phone cluster, and scanning the next cloud mobile phone until the scanning is finished if the final hardware test result of the currently scanned cloud mobile phone is that the hardware quality test is passed; otherwise, recording the failure reason of the cloud mobile phone and treating the cloud mobile phone as a defective product; the failure reason is that any hardware failure in the memory, the storage chip and the network card chip exists in the cloud mobile phone.
The invention also provides a cloud mobile phone hardware quality batch test system, which is characterized by comprising the following steps:
the connection module is used for connecting a cloud mobile phone cluster comprising a plurality of cloud mobile phones;
the setting module is used for setting test parameters for testing the cloud mobile phone cluster hardware;
the testing module is used for carrying out hardware testing on each cloud mobile phone in the cloud mobile phone cluster according to preset time;
the result acquisition module is used for acquiring a final hardware test result of each cloud mobile phone of the cloud mobile phone cluster;
and the scanning judgment module is used for scanning the PCB of each cloud mobile phone in the cloud mobile phone cluster, judging whether the cloud mobile phone passes the hardware test or not by combining the final hardware test result until the scanning is finished, and completing the hardware quality batch test of the cloud mobile phone cluster.
In one embodiment, the setting module is specifically configured to set the hardware quality of any one or more of the CPU, the DDR, the EMMC, the GPU, and the network communicator as a test parameter for testing the cloud mobile phone cluster hardware.
In one embodiment, the preset time includes a third time, a fourth time and a fifth time, the test module is specifically configured to perform a first round of hardware test on each cloud mobile phone in the cloud mobile phone cluster according to the third time, perform a second round of hardware test according to the fourth time if the first round of hardware test result is passed, and perform a third round of hardware test according to the fifth time if the second round of hardware test result is passed; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result;
wherein the third time is greater than the fourth time, and the fourth time is greater than the fifth time.
In one embodiment, the preset time further includes a first time and a second time, the test module is specifically configured to perform a first round of hardware test on each cloud mobile phone in the cloud mobile phone cluster according to a third time, perform a second round of hardware test according to the second time if the first round of hardware test result is failed, and perform a third round of hardware test according to the first time if the second round of hardware test result is failed; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result;
the first time is greater than the second time, and the second time is greater than the third time.
In one embodiment, the scanning judgment module is specifically configured to scan an identification code preset on a PCB of each cloud mobile phone in the cloud mobile phone cluster, and scan the next cloud mobile phone until the scanning is completed if the final hardware test result of the currently scanned cloud mobile phone is that the hardware quality test is passed; otherwise, recording the failure reason of the cloud mobile phone and treating the cloud mobile phone as a defective product; the failure reason is that any hardware failure in the memory, the storage chip and the network card chip exists in the cloud mobile phone.
According to the cloud mobile phone hardware quality batch testing method and system, cloud mobile phones can be automatically tested in batches, various hardware qualities of the cloud mobile phones can be automatically tested through a network, defective products are selected out in combination with a code scanning detection mode, and hardware quality batch testing results are determined.
Advantages of additional aspects of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
The above and/or additional aspects and advantages of embodiments of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
fig. 1 is a schematic flow chart of a cloud mobile phone hardware quality batch testing method according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a cloud mobile phone hardware quality batch test system according to an embodiment of the present invention;
fig. 3 is a work flow chart of the cloud mobile phone hardware quality batch test system according to the embodiment of the invention.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are exemplary only and should not be construed as limiting the embodiments of the present invention.
Referring to fig. 1, a method for batch testing of cloud mobile phone hardware quality according to an embodiment of the present invention includes:
step 1, connecting a cloud mobile phone cluster comprising a plurality of cloud mobile phones.
And 2, setting test parameters for testing the cloud mobile phone cluster hardware.
And 3, performing hardware test on each cloud mobile phone in the cloud mobile phone cluster according to preset time.
And 4, acquiring a final hardware test result of each cloud mobile phone of the cloud mobile phone cluster.
And 5, scanning the PCB of each cloud mobile phone in the cloud mobile phone cluster, judging whether the cloud mobile phone passes the hardware test or not by combining the final hardware test result until the scanning is finished, and completing the hardware quality batch test of the cloud mobile phone cluster.
In step 1, the cloud mobile phone cluster can be regarded as a set of a plurality of cloud mobile phones, and the whole cloud mobile phone cluster can be connected in a wired connection or wireless network connection manner. In this embodiment, the whole cloud mobile phone cluster is connected in a wireless network connection manner. Each cloud mobile phone is connected with the whole cloud mobile phone cluster in a PCB board inserting mode.
In the step 2, the method specifically comprises the following steps: the method comprises the steps of setting the quality of any one or more of the hardware including a CPU, a DDR, an EMMC, a GPU and a network communicator as a test parameter for testing the cloud mobile phone cluster hardware. In this embodiment, other test parameters may also be set according to the requirement of the actual hardware quality test, which is not limited herein.
And step 3, performing hardware test on each cloud mobile phone in the cloud mobile phone cluster according to preset time. Namely, the hardware test is carried out according to the set test parameters and in combination with the preset time. In this embodiment, the preset time may be a fixed time period, or several times. The following is presented in cases:
in a case where the preset time includes a third time, a fourth time and a fifth time, step 3 includes: performing a first round of hardware test on each cloud mobile phone in the cloud mobile phone cluster according to a third time, performing a second round of hardware test according to a fourth time if the first round of hardware test result is passed, and performing a third round of hardware test according to a fifth time if the second round of hardware test result is passed; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result; wherein the third time is greater than the fourth time, and the fourth time is greater than the fifth time.
For example, the third time is set to 72 hours, the fourth time is set to 48 hours, and the fifth time is set to 24 hours, first, a first round of hardware test with a duration of 72 hours may be performed on each cloud mobile phone in the cloud mobile phone cluster according to the set test parameters, if the first round of hardware test result passes, a second round of hardware test with a duration of 48 hours may be performed, if the second round of hardware test result passes, a third round of hardware test with a duration of 24 hours may be performed, and if the third round of hardware test result passes, the final hardware test result of the cloud mobile phone may be output that all tests of each test parameter pass. Namely, the conventional method of unifying the test time is changed, and as the cloud mobile phone needs to be used uninterruptedly, if a time, for example, 100 hours of test, is uniformly set according to the conventional method, the use requirement of the cloud mobile phone is easily not met, and the test round is low, and the situation of insufficient test may also exist. In this embodiment, the test time and the test result are combined, and if the test result is good, the test time is gradually shortened, and the test round is increased to ensure the test result.
In one case, the preset time further includes a first time and a second time, and step 3 includes: performing a first round of hardware test on each cloud mobile phone in the cloud mobile phone cluster according to a third time, performing a second round of hardware test according to a second time if the first round of hardware test result is not passed, and performing a third round of hardware test according to the first time if the second round of hardware test result is not passed; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result; the first time is greater than the second time, and the second time is greater than the third time.
For example, the first time is set to 120 hours, the second time is set to 96 hours, and the third time is still 72 hours, first, a first round of hardware test with a duration of 72 hours may be performed on each cloud mobile phone in the cloud mobile phone cluster according to the set test parameters, if the first round of hardware test result is failed, the second round of hardware test with a duration of 96 hours may be performed, if the second round of hardware test result is still failed, the third round of hardware test with a duration of 120 hours may be performed, and if the third round of hardware test result is failed, the final hardware test result of the cloud mobile phone is output that the test of a specific test parameter of the cloud mobile phone does not pass. Namely, the conventional method of unifying the test time is changed, and as the cloud mobile phone needs to be used uninterruptedly, if a time, for example, 100 hours of test, is uniformly set according to the conventional method, the use requirement of the cloud mobile phone is easily not met, and the test round is low, and the situation of insufficient test may also exist. In this embodiment, the test time and the test result are combined, and if the test result is not good, the test time is gradually prolonged, and the test round is increased to ensure the test result.
Step 4, the obtained final hardware test result of each cloud mobile phone comprises: the test of each test parameter of the cloud mobile phone is passed, or the test of a specific item or all test parameters of the cloud mobile phone is not passed. Of course, the content of the final hardware test result to be obtained can also be preset according to the requirement.
In step 5, the method specifically comprises the following steps: scanning an identification code preset on a PCB (printed Circuit Board) of each cloud mobile phone in the cloud mobile phone cluster, and scanning the next cloud mobile phone until the scanning is finished if the final hardware test result of the currently scanned cloud mobile phone is that the hardware quality test is passed; otherwise, recording the failure reason of the cloud mobile phone and treating the cloud mobile phone as a defective product; the failure reason is that any hardware failure in the memory, the storage chip and the network card chip exists in the cloud mobile phone.
The preset identification code may be a barcode with low cost, a two-dimensional code, or an identification code in other forms, which is not limited herein. Taking the bar code as an example, by scanning the bar code pasted in advance on the PCB of the cloud mobile phone, the name of the cloud mobile phone can be determined according to the bar code, for example, the bar code shows AA-001, and then information is obtained according to the bar code in combination with the final hardware test result of the cloud mobile phone: the test of various test parameters of the cloud mobile phone named as AA-001 passes; and then continue scanning the next cloud mobile phone.
If the final hardware test result of the cloud mobile phone is combined according to the bar code after scanning, information is obtained: when the memory hardware fault exists in the cloud mobile phone named as AA-001, the PCB of the cloud mobile phone is pulled out, and after the specific fault reason of the cloud mobile phone is recorded, the cloud mobile phone is registered as a defective product.
According to the cloud mobile phone quality batch testing method, the cloud mobile phones can be automatically tested in batches, various hardware qualities of the cloud mobile phones are automatically tested through a network, defective products are selected out in combination with a code scanning detection mode, the hardware quality batch testing result is determined, the detection efficiency is guaranteed, the detection result is also guaranteed, and the problems that efficiency is low and errors are prone to being caused by manual detection are solved.
Example 2
As shown in fig. 2, the present embodiment provides a cloud mobile phone hardware quality batch test system, including: the device comprises a connecting module, a setting module, a testing module, a result obtaining module and a scanning judging module, wherein the introduction of each module is as follows:
the connection module is used for connecting a cloud mobile phone cluster comprising a plurality of cloud mobile phones.
The setting module is used for setting test parameters for testing the cloud mobile phone cluster hardware.
And the testing module is used for carrying out hardware testing on each cloud mobile phone in the cloud mobile phone cluster according to preset time.
And the result acquisition module is used for acquiring a final hardware test result of each cloud mobile phone of the cloud mobile phone cluster.
And the scanning judgment module is used for scanning the PCB of each cloud mobile phone in the cloud mobile phone cluster, judging whether the cloud mobile phone passes the hardware test or not by combining the final hardware test result until the scanning is finished, and completing the hardware quality batch test of the cloud mobile phone cluster.
The cloud mobile phone cluster can be regarded as a set of a plurality of cloud mobile phones, and the connection module can be connected with the whole cloud mobile phone cluster in a wired connection mode or a wireless network connection mode. In this embodiment, the whole cloud mobile phone cluster is connected in a wireless network connection manner. Each cloud mobile phone is connected with the whole cloud mobile phone cluster in a PCB board inserting mode.
Specifically, the setting module is specifically configured to set the hardware quality of any one or more of the CPU, the DDR, the EMMC, the GPU, and the network communicator as a test parameter for testing the cloud mobile phone cluster hardware. In this embodiment, other test parameters may also be set according to the requirement of the actual hardware quality test, which is not limited herein.
The testing module performs hardware testing on each cloud mobile phone in the cloud mobile phone cluster according to preset time. Namely, the test module performs hardware test according to the set test parameters and in combination with the preset time. In this embodiment, the preset time may be a fixed time period, or several times. The following is presented in cases:
in one case, the preset time includes a third time, a fourth time and a fifth time, the test module is specifically configured to perform a first round of hardware test on each cloud mobile phone in the cloud mobile phone cluster according to the third time, perform a second round of hardware test according to the fourth time if the first round of hardware test result is passed, and perform a third round of hardware test according to the fifth time if the second round of hardware test result is passed; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result; wherein the third time is greater than the fourth time, and the fourth time is greater than the fifth time.
For example, the third time is set to 72 hours, the fourth time is set to 48 hours, and the fifth time is set to 24 hours, first, the test module may perform a first round of hardware test with a duration of 72 hours on each cloud mobile phone in the cloud mobile phone cluster according to the set test parameters, perform a second round of hardware test with a duration of 48 hours if the first round of hardware test result passes, perform a third round of hardware test with a duration of 24 hours if the second round of hardware test result passes, and output the final hardware test result of the cloud mobile phone by the test module as a result that all tests of each test parameter pass if the third round of hardware test result passes. Namely, the conventional method of unifying the test time is changed, and as the cloud mobile phone needs to be used uninterruptedly, if a time, for example, 100 hours of test, is uniformly set according to the conventional method, the use requirement of the cloud mobile phone is easily not met, and the test round is low, and the situation of insufficient test may also exist. In this embodiment, the test time and the test result are combined, and if the test result is good, the test time is gradually shortened, and the test round is increased to ensure the test result.
In one case, the preset time further includes a first time and a second time, the test module is specifically configured to perform a first round of hardware test on each cloud mobile phone in the cloud mobile phone cluster according to a third time, perform a second round of hardware test according to the second time if the first round of hardware test result is failed, and perform a third round of hardware test according to the first time if the second round of hardware test result is failed; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result; the first time is greater than the second time, and the second time is greater than the third time.
For example, the first time is set to 120 hours, the second time is set to 96 hours, and the third time is still 72 hours, first, the test module may perform a first round of hardware test with a duration of 72 hours on each cloud mobile phone in the cloud mobile phone cluster according to the set test parameters, perform a second round of hardware test with a duration of 96 hours if the first round of hardware test result is failed, perform a third round of hardware test with a duration of 120 hours if the second round of hardware test result is still failed, and output the final hardware test result of the cloud mobile phone as a test failure of a specific test parameter of the cloud mobile phone by the test module if the third round of hardware test result is failed. Namely, the conventional method of unifying the test time is changed, and as the cloud mobile phone needs to be used uninterruptedly, if a time, for example, 100 hours of test, is uniformly set according to the conventional method, the use requirement of the cloud mobile phone is easily not met, and the test round is low, and the situation of insufficient test may also exist. In this embodiment, the test time and the test result are combined, and if the test result is not good, the test time is gradually prolonged, and the test round is increased to ensure the test result.
The final hardware test result of each cloud mobile phone obtained by the result obtaining module includes: the test of each test parameter of the cloud mobile phone is passed, or the test of a specific item or all test parameters of the cloud mobile phone is not passed. Of course, the content of the final hardware test result to be obtained can also be preset according to the requirement.
As shown in fig. 3, specifically, the scanning and judging module scans an identification code preset on a PCB of each cloud cell phone in the cloud cell phone cluster, and if a final hardware test result of a currently scanned cloud cell phone is that a hardware quality test is passed, scans a next cloud cell phone until scanning is completed; otherwise, recording the failure reason of the cloud mobile phone and treating the cloud mobile phone as a defective product; the failure reason is that any hardware failure in the memory, the storage chip and the network card chip exists in the cloud mobile phone.
The preset identification code may be a barcode with low cost, a two-dimensional code, or an identification code in other forms, which is not limited herein. Taking a bar code as an example, the scanning judgment module may determine the name of the cloud mobile phone according to the bar code by scanning the bar code pasted on the PCB of the cloud mobile phone in advance, for example, the bar code shows AA-001, and then obtains information according to the final hardware test result of the cloud mobile phone combined with the bar code: the test of various test parameters of the cloud mobile phone named as AA-001 passes; and then continue scanning the next cloud mobile phone.
If the scanning judgment module after scanning combines the final hardware test result of the cloud mobile phone according to the bar code, information is obtained: when the memory hardware fault exists in the cloud mobile phone named as AA-001, the PCB of the cloud mobile phone is pulled out, and after the specific fault reason of the cloud mobile phone is recorded, the cloud mobile phone is registered as a defective product.
According to the cloud mobile phone quality batch testing method, the cloud mobile phones can be automatically tested in batches, various hardware qualities of the cloud mobile phones are automatically tested through a network, defective products are selected out in combination with a code scanning detection mode, the hardware quality batch testing result is determined, the detection efficiency is guaranteed, the detection result is also guaranteed, and the problems that efficiency is low and errors are prone to being caused by manual detection are solved.
In the description herein, references to the description of the terms "one embodiment," "some embodiments," "an illustrative embodiment," "an example," "a specific example" or "some examples" or the like mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and alternate implementations are included within the scope of the preferred embodiment of the present invention in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present invention.
The logic and/or steps represented in the flowcharts or otherwise described herein, such as an ordered listing of executable instructions that can be considered to implement logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processing module-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium could even be paper or another suitable medium upon which the program is printed, as the program can be electronically captured, via for instance optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner if necessary, and then stored in a computer memory.
It should be understood that portions of embodiments of the present invention may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present invention may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.
The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc.
Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.
Claims (6)
1. A cloud mobile phone hardware quality batch test method is characterized by comprising the following steps:
step 1, connecting a cloud mobile phone cluster comprising a plurality of cloud mobile phones;
step 2, setting test parameters for testing cloud mobile phone cluster hardware;
step 3, performing hardware test on each cloud mobile phone in the cloud mobile phone cluster according to preset time; the preset time comprises a first time, a second time, a third time, a fourth time and a fifth time, wherein the third time is greater than the fourth time, and the fourth time is greater than the fifth time; the first time is greater than the second time, and the second time is greater than the third time; specifically, step 3 comprises
Performing a first round of hardware test on each cloud mobile phone in the cloud mobile phone cluster according to a third time;
if the hardware test result of the first round is passed, performing the hardware test of the second round according to a fourth time, and if the hardware test result of the second round is passed, performing the hardware test of the third round according to a fifth time; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result;
if the hardware test result of the first round is failed, performing the hardware test of the second round according to the second time, and if the hardware test result of the second round is failed, performing the hardware test of the third round according to the first time; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result;
step 4, obtaining a final hardware test result of each cloud mobile phone of the cloud mobile phone cluster;
and 5, scanning the PCB of each cloud mobile phone in the cloud mobile phone cluster, judging whether the cloud mobile phone passes the hardware test or not by combining the final hardware test result until the scanning is finished, and completing the hardware quality batch test of the cloud mobile phone cluster.
2. The cloud mobile phone hardware quality batch test method of claim 1, wherein step 2 comprises:
the method comprises the steps of setting the quality of any one or more of the hardware including a CPU, a DDR, an EMMC, a GPU and a network communicator as a test parameter for testing the cloud mobile phone cluster hardware.
3. The cloud mobile phone hardware quality batch test method of claim 1, wherein step 5 comprises:
scanning an identification code preset on a PCB (printed Circuit Board) of each cloud mobile phone in the cloud mobile phone cluster, and scanning the next cloud mobile phone until the scanning is finished if the final hardware test result of the currently scanned cloud mobile phone is that the hardware quality test is passed; otherwise, recording the failure reason of the cloud mobile phone and treating the cloud mobile phone as a defective product; the failure reason is that any hardware failure in the memory, the storage chip and the network card chip exists in the cloud mobile phone.
4. The utility model provides a cloud cell-phone hardware quality batch test system which characterized in that includes:
the connection module is used for connecting a cloud mobile phone cluster comprising a plurality of cloud mobile phones;
the setting module is used for setting test parameters for testing the cloud mobile phone cluster hardware;
the testing module is used for carrying out hardware testing on each cloud mobile phone in the cloud mobile phone cluster according to preset time; the preset time comprises a first time, a second time, a third time, a fourth time and a fifth time, wherein the third time is greater than the fourth time, and the fourth time is greater than the fifth time; the first time is greater than the second time, and the second time is greater than the third time; the test module is specifically further used for performing a first round of hardware test on each cloud mobile phone in the cloud mobile phone cluster according to a third time, wherein the first round of hardware test is performed on each cloud mobile phone in the cloud mobile phone cluster
If the hardware test result of the first round is passed, performing the hardware test of the second round according to a fourth time, and if the hardware test result of the second round is passed, performing the hardware test of the third round according to a fifth time; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result;
if the hardware test result of the first round is failed, performing the hardware test of the second round according to the second time, and if the hardware test result of the second round is failed, performing the hardware test of the third round according to the first time; outputting a final hardware test result of the cloud mobile phone according to the third round of hardware test result;
the result acquisition module is used for acquiring a final hardware test result of each cloud mobile phone of the cloud mobile phone cluster;
and the scanning judgment module is used for scanning the PCB of each cloud mobile phone in the cloud mobile phone cluster, judging whether the cloud mobile phone passes the hardware test or not by combining the final hardware test result until the scanning is finished, and completing the hardware quality batch test of the cloud mobile phone cluster.
5. The cloud mobile phone hardware quality batch test system of claim 4, wherein the setting module is specifically configured to set hardware quality of any one or more of the hardware quality including a CPU, a DDR, an EMMC, a GPU and a network communicator as a test parameter for testing cloud mobile phone cluster hardware.
6. The cloud mobile phone hardware quality batch test system of claim 4, wherein the scanning judgment module is specifically configured to scan an identification code preset on a PCB of each cloud mobile phone in the cloud mobile phone cluster, and if a final hardware test result of a currently scanned cloud mobile phone is that a hardware quality test is passed, scan a next cloud mobile phone until the scanning is completed; otherwise, recording the failure reason of the cloud mobile phone and treating the cloud mobile phone as a defective product; the failure reason is that any hardware failure in the memory, the storage chip and the network card chip exists in the cloud mobile phone.
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| CN106445828A (en) * | 2016-10-21 | 2017-02-22 | 福建中金在线信息科技有限公司 | Product testing method and device |
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