CN109307795A - Data point detection method and device - Google Patents
Data point detection method and device Download PDFInfo
- Publication number
- CN109307795A CN109307795A CN201811458030.1A CN201811458030A CN109307795A CN 109307795 A CN109307795 A CN 109307795A CN 201811458030 A CN201811458030 A CN 201811458030A CN 109307795 A CN109307795 A CN 109307795A
- Authority
- CN
- China
- Prior art keywords
- point
- sampled point
- sampled
- phase
- virtual value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/02—Measuring effective values, i.e. root-mean-square values
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0053—Noise discrimination; Analog sampling; Measuring transients
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/12—Measuring rate of change
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
Abstract
The embodiment of the present application provides a kind of data point detection method and device.The described method includes: sampling obtains the instantaneous value waveform of three-phase voltage；The virtual value of each sampled point is calculated according to the instantaneous voltage value of each sampled point of each phase, and target analysis phase is determined based on the virtual value of the sampled point of each phase；It is obtained according to the corresponding virtual value change rate of each sampled point of target analysis phase and sampled point serial number corresponding to the starting point and end point of voltage dip occurs；Instantaneous value waveform based on sampled point serial number corresponding to starting point and end point and target analysis phase obtains that the angle of the starting point of voltage dip and the angle of end point occurs.This method the characteristics of virtual value change rate meeting acute variation, the starting point and end point that voltage dip occurs is found using the virtual value change rate of each sampled point, and respective angles are calculated after occurring and terminating temporarily drop based on voltage.The accuracy rate for finding voltage dip data point can be improved as a result,.
Description
Technical field
This application involves technical field of power systems, in particular to a kind of data point detection method and device.
Background technique
It can all be used in the industrial production of modernization and arrive power electronic equipment, power electronic equipment is to electrical energy power quality disturbance spy
It is insensitive.Once these equipment can not work normally or stop working because voltage dip occurs, the entire production line all can be by
To influence, it is possible to cause the harm such as equipment halt production, scrap of the product, tool damage, production claim for eot.Therefore, voltage dip
Various equipment and every profession and trade can all be had an impact, it is necessary for studying the start-stop point of voltage dip.
The start-stop for determining voltage dip generally by effective threshold method at present, i.e., find electricity by effective threshold method
Press the data point of pause.Effective threshold method is exactly to set a threshold value δ, carries out data point detection with this threshold value.In existing mark
In standard, threshold value is defined as the 90% of steady state voltage virtual value, due to only considering a phase of voltage dip most serious, the threshold
Value is actually the 90% of the phase steady state voltage virtual value.For temporarily dropping most serious phase, when detecting its virtual value lower than threshold value δ
Sampled point when, algorithm triggers, by virtual value lower than threshold value first point export, as the sampled point where starting point；?
When detecting waveform starting point and then detecting that its virtual value is greater than the sampled point of threshold value, algorithm triggers again, by virtual value
The first point output being restored on threshold value, as the sampled point where end point.
Effective threshold method is used as threshold value for the 90% of steady state voltage virtual value, foundation of the threshold value as detection waveform point, but
Position where real data point should be that instantaneous voltage occurs temporarily drop and terminates the position temporarily dropped, this is 90% with threshold value
Point be obviously different a little, therefore effectively threshold method obtain data point accuracy rate it is not high.
Summary of the invention
In order to overcome above-mentioned deficiency in the prior art, the embodiment of the present application is designed to provide a kind of data point detection
Method and device can be based on voltage and the characteristics of virtual value change rate meeting acute variation, utilize after occurring and terminating temporarily drop
The virtual value change rate of each sampled point finds the starting point and end point that voltage dip occurs, and respective angles are calculated,
The accuracy rate that voltage dip data point occurs is found to improve.
In a first aspect, the embodiment of the present application provides a kind of waveform point detecting method, which comprises
Sampling obtains the instantaneous value waveform of three-phase voltage, wherein each sampled point in the instantaneous value waveform of each phase voltage
Information include instantaneous voltage value and sampled point serial number；
The virtual value of each sampled point is calculated according to the instantaneous voltage value of each sampled point of each phase, and is based on each phase
The virtual value of sampled point determine target analysis phase；
The starting point that voltage dip occurs is obtained according to the corresponding virtual value change rate of each sampled point of target analysis phase
And sampled point serial number corresponding to end point；
Instantaneous value waveform based on sampled point serial number corresponding to the starting point and end point and target analysis phase obtains
The angle of the starting point of voltage dip and the angle of end point occurs.
Second aspect, the embodiment of the present application provide a kind of waveform point detection device, and described device includes:
Sampling module, for sampling the instantaneous value waveform for obtaining three-phase voltage, wherein in the instantaneous value waveform of each phase voltage
The information of each sampled point include instantaneous voltage value and sampled point serial number；
The effective of each sampled point is calculated in determining module, the instantaneous voltage value for each sampled point according to each phase
Value, and target analysis phase is determined based on the virtual value of the sampled point of each phase；
Module is obtained, is obtained for the corresponding virtual value change rate of each sampled point according to target analysis phase and voltage occurs
Sampled point serial number corresponding to the starting point and end point temporarily dropped；
Angle calculation module, for based on sampled point serial number corresponding to the starting point and end point and target analysis phase
Instantaneous value waveform obtain occur voltage dip starting point angle and end point angle.
In terms of existing technologies, the application has the advantages that
The embodiment of the present application provides a kind of data point detection method and device.The instantaneous value of sampling acquisition three-phase voltage first
The information of waveform, each sampled point in the instantaneous value waveform of each phase voltage includes instantaneous voltage value and sampling point number.Then
The virtual value of each sampled point of each phase voltage is calculated, according to the instantaneous voltage value of each sampled point of each phase to be based on being somebody's turn to do
Virtual value determine in three-phase which be mutually used as target analysis phase.After determining target analysis phase, according to the every of target analysis phase
The corresponding virtual value change rate of a sampled point, finds voltage dip starting point from multiple sampled points of the phase and end point is corresponding
Sampled point, obtain sampling point number corresponding to the starting point for occurring temporarily to drop and end point.Finally according to starting point and end
The instantaneous value waveform of the corresponding sampling point number of point and target analysis phase obtains occurring the angle and knot of the starting point of voltage dip
The angle of beam spot.As a result, based on voltage after occurring and terminating temporarily drop virtual value change rate can acute variation the characteristics of, using every
The virtual value change rate of a sampled point finds the starting point and end point that voltage dip occurs, and respective angles are calculated, from
And improve the accuracy rate for finding voltage dip data point.
For enable application above objects, features, and advantages be clearer and more comprehensible, the application preferred embodiment is cited below particularly, and
Cooperate appended attached drawing, is described in detail below.
Detailed description of the invention
Technical solution in ord to more clearly illustrate embodiments of the present application, below will be to needed in the embodiment attached
Figure is briefly described, it should be understood that the following drawings illustrates only some embodiments of the application, therefore is not construed as pair
The restriction of range for those of ordinary skill in the art without creative efforts, can also be according to this
A little attached drawings obtain other relevant attached drawings.
Fig. 1 is the structural schematic diagram of detection device provided by the embodiments of the present application.
Fig. 2 is the flow diagram of waveform point detecting method provided by the embodiments of the present application.
Fig. 3 is the flow diagram for the sub-step that step S130 includes in Fig. 2.
Fig. 4 is the schematic diagram of acquisition first object sampled point and the second destination sample point provided by the embodiments of the present application.
Fig. 5 is the flow diagram for the sub-step that step S140 includes in Fig. 2.
Fig. 6 is voltage dip data point schematic diagram provided by the embodiments of the present application.
Fig. 7 is the block diagram of waveform point detection device provided by the embodiments of the present application.
Icon: 100- detection device；110- memory；120- storage control；130- processor；The detection of 200- data point
Device；210- sampling module；220- determining module；230- obtains module；240- angle calculation module.
Specific embodiment
Below in conjunction with attached drawing in the embodiment of the present application, technical solutions in the embodiments of the present application carries out clear, complete
Ground description, it is clear that described embodiments are only a part of embodiments of the present application, instead of all the embodiments.Usually exist
The component of the embodiment of the present application described and illustrated in attached drawing can be arranged and be designed with a variety of different configurations herein.Cause
This, is not intended to limit claimed the application's to the detailed description of the embodiments herein provided in the accompanying drawings below
Range, but it is merely representative of the selected embodiment of the application.Based on embodiments herein, those skilled in the art are not being done
Every other embodiment obtained under the premise of creative work out, shall fall in the protection scope of this application.
It should also be noted that similar label and letter indicate similar terms in following attached drawing, therefore, once a certain Xiang Yi
It is defined in a attached drawing, does not then need that it is further defined and explained in subsequent attached drawing.Meanwhile the application's
In description, term " first ", " second " etc. are only used for distinguishing description, are not understood to indicate or imply relative importance.
With reference to the accompanying drawing, it elaborates to some embodiments of the application.In the absence of conflict, following
Feature in embodiment and embodiment can be combined with each other.
Fig. 1 is please referred to, Fig. 1 is the structural schematic diagram of detection device 100 provided by the embodiments of the present application.The embodiment of the present application
Described in detection device 100 may be, but not limited to, desktop computer, server etc..As shown in Figure 1, the detection device 100
It include: memory 110, storage control 120 and processor 130.
It is directly or indirectly electrically connected between the memory 110, storage control 120 and each element of processor 130,
To realize the transmission or interaction of data.For example, these elements can pass through one or more communication bus or signal wire between each other
It realizes and is electrically connected.Waveform point detection device 200 is stored in memory 110, the waveform point detection device 200 includes at least
One can be stored in the software function module in the memory 110 in the form of software or firmware (firmware).The place
The software program and module that reason device 130 is stored in memory 110 by operation, such as the data point inspection in the embodiment of the present application
Device 200 is surveyed, thereby executing various function application and data processing, i.e. data point detection side in realization the embodiment of the present application
Method.
Wherein, the memory 110 may be, but not limited to, random access memory (Random Access
Memory, RAM), read-only memory (Read Only Memory, ROM), programmable read only memory (Programmable
Read-Only Memory, PROM), erasable read-only memory (Erasable Programmable Read-Only
Memory, EPROM), electricallyerasable ROM (EEROM) (Electric Erasable Programmable Read-Only
Memory, EEPROM) etc..Wherein, memory 110 is for storing program, the processor 130 after receiving and executing instruction,
Execute described program.The processor 130 and other possible components can control the access of memory 110 in the storage
It is carried out under the control of device 120.
The processor 130 may be a kind of IC chip, the processing capacity with signal.Above-mentioned processor
130 can be general processor, including central processing unit (Central Processing Unit, CPU), network processing unit
(Network Processor, NP) etc..It can also be digital signal processor (DSP), specific integrated circuit (ASIC), scene
Programmable gate array (FPGA) either other programmable logic device, discrete gate or transistor logic, discrete hardware group
Part.It may be implemented or execute disclosed each method, step and the logic diagram in the embodiment of the present application.General processor can be with
It is that microprocessor or the processor are also possible to any conventional processor etc..
It is appreciated that structure shown in FIG. 1 is only to illustrate, detection device 100 may also include it is more than shown in Fig. 1 or
Less component, or with the configuration different from shown in Fig. 1.Each component shown in Fig. 1 can using hardware, software or its
Combination is realized.
Referring to figure 2., Fig. 2 is the flow diagram of waveform point detecting method provided by the embodiments of the present application.The method
Applied to the detection device 100.The detailed process of data point detection method is described in detail below.
Step S110, sampling obtain the instantaneous value waveform of three-phase voltage.
In the present embodiment, the instantaneous value waveform for obtaining three-phase voltage sampled first, that is, obtain the instantaneous of A phase voltage
Be worth waveform, the instantaneous value waveform of B phase voltage, C phase voltage instantaneous value waveform.The instantaneous value waveform of each phase voltage includes multiple
Sampled point.Wherein, an instantaneous value wave period corresponds to a sampling period, and the sampled point quantity in each sampling period is more
It is a.The information of the sampled point is arrived after obtaining a sampled point, the information of sampled point may include the instantaneous of the sampled point
Voltage value, sampling instant, sampled point serial number etc..Optionally, sampled point serial number is named according to the sequencing of sampling instant, that is, is pressed
It is named according to sampling order, for example, having sampled point a, b, c according to sampling instant, then the sampled point serial number of sampled point a can be
The sampled point serial number of 1, sampled point b can be 2, and the sampled point serial number of sampled point c can be 3.
The virtual value of each sampled point is calculated according to the instantaneous voltage value of each sampled point of each phase by step S120,
And target analysis phase is determined based on the virtual value of the sampled point of each phase.
In the present embodiment, only consider that phase of voltage dip most serious.After the instantaneous value waveform for obtaining each phase,
Virtual value (i.e. effective voltage value) is calculated according to the instantaneous voltage value of sampled point each in instantaneous value waveform.Then through comparing
The smallest sampled point of virtual value in all sampled points (sampled point of the sampled point of sampled point, B phase including A phase, C phase) is selected,
Using the corresponding phase of the sampled point as target analysis phase.For example, the virtual value of a sampled point of A phase is in all sampled points
The smallest sampled point of virtual value, then A phase is target analysis phase, and A phase is that phase of voltage dip most serious in three-phase.
In the present embodiment, the virtual value of each sampled point can be calculated in the following manner.
For the sampled point after first sampling period, by each sampled point to the sliding window for taking a cycle in the past, so
Virtual value of the root-mean-square value as the sampled point is calculated according to the instantaneous voltage value of each sampled point in the period afterwards.As
A kind of embodiment will successively be located at each sampled point after the first sampling period as the halt of a calculating cycle, and root
According to the instantaneous voltage value and the first preset formula of each sampled point in the calculating cycle, a root-mean-square value is calculated, the root mean square
Value is the virtual value of the halt of the calculating cycle.It can obtain through the above way each after the first sampling period
The virtual value of sampled point.Wherein, the quantity of the sampled point in calculating cycle is identical as the sampled point quantity in the sampling period.
Optionally, in the present embodiment, first preset formula are as follows:
Wherein, Vrms(n) indicate that the virtual value of the sampled point of sampled point serial number n, V (i) indicate sampled point serial number i's
The instantaneous voltage value of sampled point, wd indicate the sampled point quantity in a sampling period.Sampling number in one sampling period
Amount is identical as the sampled point quantity in a calculating cycle, that is, is wd.
The virtual value of each sampled point after first sampling period can only be calculated using aforesaid way.In actual analysis
Need to retain the virtual value of each sampled point in first sampling period.It optionally, will in an embodiment of the present embodiment
The virtual value of all sampled points is set as the same normal virtual value in first sampling period, and this makes it possible to obtain all sampled points
Virtual value.The virtual value of each sampled point in each first sampling period of phase is obtained namely based on the second preset formula, wherein described
Two preset formulas are as follows:
Vrms(n)=Vrms(wd+1) n=1,2 ..., wd (2)
The virtual value that each sampled point after the first sampling period how is calculated is illustrated below.
Assuming that there are 10 sampled points in a sampling period, according to sampling order have sampled point 1,2,3,4 ....It is adopted in calculating
When the virtual value of sampling point 11, halt by sampled point 11 as a calculating cycle, the calculating cycle include sampled point 2,
3,…,11.Based on formula (1), first calculate the instantaneous voltage value of sampled point 2 square, the instantaneous voltage value of sampled point 3 it is flat
Side ... square of the instantaneous voltage value of sampled point 11, and calculate above-mentioned 10 squares and value；Then it is adopted by this and divided by one
The sampled point quantity 10 in sample period obtains a quotient；Evolution finally is carried out to the quotient to get the virtual value of sampled point 11 is arrived.For
The virtual value calculation of other sampled points after first sampled point is same as above.
Step S130 is obtained according to the corresponding virtual value change rate of each sampled point of target analysis phase and voltage dip is occurred
Starting point and end point corresponding to sampled point serial number.
Referring to figure 3., Fig. 3 is the flow diagram for the sub-step that step S130 includes in Fig. 2.Step S130 may include
Sub-step S131, sub-step S132 and sub-step S133.
The effective of each sampled point is calculated according to the virtual value of each sampled point of target analysis phase in sub-step S131
It is worth change rate.
In the present embodiment, according to sampling order, it is Δ t that the time difference of two adjacent sampled points, which is fixed,.True
It sets the goal after analyzing phase, each sampled point of the target analysis phase can be had according to sampling order (or sampling instant) composition one
Valid value sequence.Then the difference of the virtual value of two sampled points adjacent in effective value sequence is calculated, and by the difference divided by two
The sampling time difference of a sampled point, and using the absolute value of obtained quotient as the virtual value change rate of the sampled point.
Optionally, the effective of each sampled point is calculated in the virtual value of each sampled point according to target analysis phase
The step of value change rate includes: according between the time between the virtual value of each sampled point of target analysis phase, neighbouring sample point
Every and third preset formula the virtual value change rate of each sampled point is calculated.Wherein, the third preset formula are as follows:
Wherein, Mrms(n) indicate that the virtual value change rate of the sampled point of sampled point serial number n, Δ t indicate neighbouring sample point
Between time interval, Vrms(n) virtual value of the sampled point of sampled point serial number n is indicated.
Sub-step S132 successively carries out the virtual value change rate of each sampled point and preset threshold according to sampling order
Compare, the sampled point using first virtual value change rate greater than the preset threshold is as first object sampled point, by last
A virtual value change rate is greater than the sampled point of the preset threshold as the second destination sample point.
Sub-step S133, using the sampled point serial number of the first object sampled point as sampled point sequence corresponding to starting point
Number, using the difference of the sampled point quantity in the sampled point serial number of the first object sampled point and a sampling period as end point
Corresponding sampled point serial number.
In the present embodiment, a threshold value can be preset as the preset threshold.Optionally, the default threshold
Value is x*Vrms(1).In an embodiment of the present embodiment, x=5.According to sampling order, it is big to choose virtual value change rate
In the preset threshold first sampled point as first object sampled point, choose virtual value change rate and be greater than the default threshold
The last one sampled point of value is as the second destination sample point.The first object sampled point is the position of the starting point of voltage dip
It sets, corresponding sampled point is that voltage is temporary after the sampled point serial number of the second destination sample point subtracts the sampled point quantity in a cycle
The position of the end point of drop.
Virtual value change rate is greater than first sampled point and the last one sampled point of preset threshold, respectively corresponds virtual value
Variation just takes place and terminates the point of variation.The point that variation takes place in virtual value is starting point really, but virtual value terminates
The point of variation is not but end point.Because the virtual value in the present embodiment refer to each sampled point n of primary voltage waveform to
Before take a sliding window, take the root-mean-square value of the instantaneous voltage value of all sampled points in the sliding window.So looked for by this method
To the corresponding instantaneous value waveform of that point for restoring completely of virtual value on the previous period sampled point in fact all
It is normal voltage.So virtual value terminates the position of point a cycle after real end point of variation, therefore will find
The sampled point serial number of the second destination sample point subtract the sampled point serial number obtained after the quantity of sampled point in a cycle, be true
The sampling sequence number of positive end point.
Referring to figure 4., Fig. 4 is acquisition first object sampled point and the second destination sample point provided by the embodiments of the present application
Schematic diagram.According to the sampled point serial number and virtual value change rate of each sampled point of preset threshold, target analysis phase, work can be obtained
It is greater than the sampled point (first object sampled point) of default change rate for first virtual value change rate, obtains as last first
Virtual value change rate is greater than the sampled point (the second destination sample point) of default change rate.
Step S140, the instantaneous value based on sampled point serial number and target analysis phase corresponding to the starting point and end point
Waveform obtains that the angle of the starting point of voltage dip and the angle of end point occurs.
In the present embodiment, voltage dip data point can be divided into starting point and end point, they are that voltage is occurring respectively
Angle values corresponding to the point that temporarily drop and end are temporarily dropped.Starting point corresponds to the phase angle of voltage before generation voltage dip, it is
It is to refer to start measurement temporarily to drop the last one positive zero crossing of preceding voltage, this point is from the preceding voltage of temporary drop to temporary drop electricity
The beginning of the transition stage of pressure.Similarly, end point is so that first positive zero crossing of voltage after voltage dip occurs as ginseng
The phase angle of measurement voltage is examined, this point is the end of voltage transition phase after from temporary drop voltage to temporary drop.
Referring to figure 5. and Fig. 6, Fig. 5 be the sub-step that step S140 includes in Fig. 2 flow diagram, Fig. 6 is the application
The voltage dip data point schematic diagram that embodiment provides.Step S140 may include sub-step S141, sub-step S142, sub-step
S143 and sub-step S144.
Sub-step S141, according to the starting point, target analysis phase instantaneous value waveform by the sampling of the target analysis phase
A sampled point for upward zero crossing nearest from the starting point is as the first reference sample point in point.
Wherein, according to sampling order, the first reference sample point is located at before the starting point.
Sub-step S142, the sampled point serial number of sampled point serial number and the starting point based on the first reference sample point
The angle of the starting point is calculated.
Sub-step S143, according to the end point, target analysis phase instantaneous value waveform by the sampling of the target analysis phase
A sampled point for upward zero crossing nearest from the end point is as the second reference sample point in point.
Wherein, according to sampling order, the second reference sample point is located at after the end point.
Sub-step S144, the sampled point serial number of sampled point serial number and the end point based on the second reference sample point
The angle of the end point is calculated.
In the present embodiment, according to the instantaneous value waveform of the starting point, target analysis phase, adopting for target analysis phase is obtained
A upward zero crossing nearest from the starting point and end point respectively samples sampled point as reference sample point in sampling point
Angle is 0 °.Wherein, which is also a sampled point.Then calculated based on reference sample point starting point and
The angle of end point, starting point and end point as voltage dip.
As shown in Figure 6, it is assumed that there are 100 sampled points in a sampling period, the sampled point serial number 524 of starting point, and rises
The sampled point serial number 455 of the corresponding upward zero crossing (i.e. the first reference sample point) of initial point, then the angle of the starting point are as follows:
As a result, by calculating the virtual value change rate of each sampled point, according to the meeting after temporarily drop occurs of virtual value change rate
The characteristics of acutely increasing, being reduced to close to zero again after terminating temporarily drop, can accurately find voltage dip using aforesaid way
The position of data point.Also, the validity of this method is also demonstrated with after measured data detection by largely emulating.It is sharp as a result,
In fashion described above it is also ensured that obtaining the accuracy of voltage dip duration.
Wherein, voltage dip refers to that supply voltage virtual value declines suddenly in a short time and gos up and restores normally existing
As.The duration most cases of this phenomenon are between 0.1s to 1.5s in electric system.It is frequent when describing voltage dip
Residual voltage is used, during residual voltage refers to voltage dip, the minimum value of voltage effective value.
Fig. 7 is please referred to, Fig. 7 is the block diagram of waveform point detection device 200 provided by the embodiments of the present application.The wave
Form point detection device 200 may include sampling module 210, determining module 220, obtain module 230 and angle calculation module 240.
Sampling module 210, for sampling the instantaneous value waveform for obtaining three-phase voltage.
Wherein, the information of each sampled point in the instantaneous value waveform of each phase voltage includes instantaneous voltage value and sampled point sequence
Number.
In the present embodiment, the sampling module 210 is used to execute the step S110 in Fig. 2, about the sampling module
210 specific descriptions are referred to the description of step S110 in Fig. 2.
Each sampled point is calculated in determining module 220, the instantaneous voltage value for each sampled point according to each phase
Virtual value, and target analysis phase is determined based on the virtual value of the sampled point of each phase.
In the present embodiment, the determining module 220 is calculated according to the instantaneous voltage value of each sampled point of each phase
The virtual value of each sampled point, and determine that the mode of target analysis phase includes: based on the virtual value of the sampled point of each phase
Successively using each sampled point after the first sampling period as the halt of a calculating cycle, and according to the meter
Each sampled point after the first sampling period is calculated in the instantaneous voltage value and the first preset formula for calculating each sampled point in the period
Virtual value, wherein first preset formula are as follows:
Wherein, Vrms(n) indicate that the virtual value of the sampled point of sampled point serial number n, V (i) indicate sampled point serial number i's
The instantaneous voltage value of sampled point, wd indicate the sampled point quantity in a sampling period, the sampling number in a sampling period
It measures identical as the sampled point quantity in a calculating cycle；
The virtual value of each sampled point in each first sampling period of phase is obtained based on the second preset formula, wherein described second
Preset formula are as follows:
Vrms(n)=Vrms(wd+1) n=1,2 ..., wd
The virtual value of all sampled points of three-phase voltage is compared, and will a phase conduct corresponding with minimum virtual value
The target analysis phase.
In the present embodiment, the determining module 220 is used to execute the step S120 in Fig. 2, about the determining module
220 specific descriptions are referred to the description of step S120 in Fig. 2.
Module 230 is obtained, is occurred for the corresponding virtual value change rate of each sampled point according to target analysis phase
Sampled point serial number corresponding to the starting point and end point of voltage dip.
In the present embodiment, the module 230 that obtains becomes according to the corresponding virtual value of each sampled point of target analysis phase
Rate obtains the mode of sampled point serial number corresponding to the starting point and end point that voltage dip occurs
The virtual value change rate of each sampled point is calculated according to the virtual value of each sampled point of target analysis phase；
According to sampling order, successively the virtual value change rate of each sampled point is compared with preset threshold, by first
A virtual value change rate is greater than the sampled point of the preset threshold as first object sampled point, the last one virtual value is changed
Rate is greater than the sampled point of the preset threshold as the second destination sample point；
Using the sampled point serial number of the first object sampled point as sampled point serial number corresponding to starting point, by described
The sampled point serial number of 1 destination sample point and the difference of the sampled point quantity in a sampling period are adopted as corresponding to end point
Sample point number.
Optionally, the acquisition module 230 is calculated each according to the virtual value of each sampled point of target analysis phase
The mode of the virtual value change rate of sampled point includes:
According between the virtual value of each sampled point of target analysis phase, neighbouring sample point time interval and third it is default
The virtual value change rate of each sampled point is calculated in formula, wherein the third preset formula are as follows:
Wherein, Mrms(n) indicate that the virtual value change rate of the sampled point of sampled point serial number n, Δ t indicate neighbouring sample point
Between time interval, Vrms(n) virtual value of the sampled point of sampled point serial number n is indicated.
In the present embodiment, the module 230 that obtains is used to execute the step S130 in Fig. 2, about the acquisition module
230 specific descriptions are referred to the description of step S130 in Fig. 2.
Angle calculation module 240, for based on sampled point serial number corresponding to the starting point and end point and target point
The instantaneous value waveform of phase separation obtains that the angle of the starting point of voltage dip and the angle of end point occurs.
In the present embodiment, the angle calculation module 240 is based on sampled point corresponding to the starting point and end point
The instantaneous value waveform of serial number and target analysis phase obtains occurring the side of the angle of the starting point of voltage dip and the angle of end point
Formula includes:
According to the starting point, target analysis phase instantaneous value waveform by the sampled point of the target analysis phase from described
A nearest sampled point for upward zero crossing of initial point is as the first reference sample point, wherein according to sampling order, described the
Reference sample point is located at before the starting point；
Institute is calculated in the sampled point serial number of sampled point serial number and the starting point based on the first reference sample point
State the angle of starting point；
According to the end point, target analysis phase instantaneous value waveform by the sampled point of the target analysis phase from the knot
A nearest sampled point for upward zero crossing of beam spot is as the second reference sample point, wherein according to sampling order, described the
2 reference sample points are located at after the end point；
Institute is calculated in the sampled point serial number of sampled point serial number and the end point based on the second reference sample point
State the angle of end point.
In the present embodiment, the angle calculation module 240 is used to execute the step S140 in Fig. 2, about the angle
The specific descriptions of computing module 240 are referred to the description of step S140 in Fig. 2.
The embodiment of the present application also provides a kind of readable storage medium storing program for executing, and executable calculating is stored on the readable storage medium storing program for executing
Machine instruction, realizes the waveform point detecting method when the executable computer instruction is executed by processor.
It will be understood by those skilled in the art that the embodiment of the present application can provide as method, apparatus or computer program production
Product.Therefore, in terms of the embodiment of the present application can be used complete hardware embodiment, complete software embodiment or combine software and hardware
Embodiment form.Moreover, it wherein includes computer available programs generation that the embodiment of the present application, which can be used in one or more,
The meter implemented in the computer-usable storage medium (including but not limited to magnetic disk storage, CD-ROM, optical memory etc.) of code
The form of calculation machine program product.
The embodiment of the present application is referring to the method, equipment (system) and computer program product according to the embodiment of the present application
Flowchart and/or the block diagram describe.It should be understood that can be realized by computer program instructions in flowchart and/or the block diagram
The combination of process and/or box in each flow and/or block and flowchart and/or the block diagram.It can provide these calculating
Processing of the machine program instruction to general purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices
Device is to generate a machine, so that being generated by the instruction that computer or the processor of other programmable data processing devices execute
For realizing the function of being specified in one or more flows of the flowchart and/or one or more blocks of the block diagram
Device.
In conclusion the embodiment of the present application provides a kind of data point detection method and device.Sampling obtains three-phase electricity first
The information of the instantaneous value waveform of pressure, each sampled point in the instantaneous value waveform of each phase voltage includes instantaneous voltage value and sampled point
Number.Then according to each sampled point of each phase instantaneous voltage value be calculated each phase voltage each sampled point it is effective
Value, to determine which in three-phase mutually as target analysis phase based on the virtual value.After determining target analysis phase, according to target
Analyze phase the corresponding virtual value change rate of each sampled point, found from multiple sampled points of the phase voltage dip starting point and
The corresponding sampled point of end point, obtains sampling point number corresponding to the starting point for occurring temporarily to drop and end point.Last basis rises
Initial point and the instantaneous value waveform of the corresponding sampling point number of end point and target analysis phase obtain occurring the starting point of voltage dip
Angle and end point angle.Based on voltage, virtual value change rate can acute variation after occurring and terminating temporarily drop as a result,
Feature is found the starting point and end point that voltage dip occurs using the virtual value change rate of each sampled point, and is calculated
Respective angles, to improve the accuracy rate for finding voltage dip data point.
The foregoing is merely preferred embodiment of the present application, are not intended to limit this application, for the skill of this field
For art personnel, various changes and changes are possible in this application.Within the spirit and principles of this application, made any to repair
Change, equivalent replacement, improvement etc., should be included within the scope of protection of this application.
Claims (10)
1. a kind of waveform point detecting method, which is characterized in that the described method includes:
Sampling obtains the instantaneous value waveform of three-phase voltage, wherein the letter of each sampled point in the instantaneous value waveform of each phase voltage
Breath includes instantaneous voltage value and sampled point serial number；
The virtual value of each sampled point, and adopting based on each phase are calculated according to the instantaneous voltage value of each sampled point of each phase
The virtual value of sampling point determines target analysis phase；
The starting point and knot that voltage dip occurs are obtained according to the corresponding virtual value change rate of each sampled point of target analysis phase
Sampled point serial number corresponding to beam spot；
Instantaneous value waveform based on sampled point serial number corresponding to the starting point and end point and target analysis phase is occurred
The angle of the starting point of voltage dip and the angle of end point.
2. the method according to claim 1, wherein the instantaneous voltage value of each sampled point according to each phase
The virtual value of each sampled point, and the step of target analysis phase is determined based on the virtual value of the sampled point of each phase packet is calculated
It includes:
Successively using each sampled point after the first sampling period as the halt of a calculating cycle, and according to calculating week
The effective of each sampled point after the first sampling period is calculated in the instantaneous voltage value of each sampled point and the first preset formula in phase
Value, wherein first preset formula are as follows:
Wherein, Vrms(n) indicate that the virtual value of the sampled point of sampled point serial number n, V (i) indicate the sampling of sampled point serial number i
The instantaneous voltage value of point, wd indicate the sampled point quantity in a sampling period, sampled point quantity in a sampling period with
Sampled point quantity in one calculating cycle is identical；
The virtual value of each sampled point in each first sampling period of phase is obtained based on the second preset formula, wherein described second is default
Formula are as follows:
Vrms(n)=Vrms(wd+1) n=1,2 ..., wd
The virtual value of all sampled points of three-phase voltage is compared, and will be described in corresponding with a minimum virtual value phase is used as
Target analysis phase.
3. the method according to claim 1, wherein described corresponding according to each sampled point of target analysis phase
Virtual value change rate obtain occur voltage dip starting point and end point corresponding to sampled point serial number the step of include:
The virtual value change rate of each sampled point is calculated according to the virtual value of each sampled point of target analysis phase；
According to sampling order, the virtual value change rate of each sampled point is compared with preset threshold successively, first is had
Valid value change rate be greater than the preset threshold sampled point as first object sampled point, the last one virtual value change rate is big
In the preset threshold sampled point as the second destination sample point；
Using the sampled point serial number of the first object sampled point as sampled point serial number corresponding to starting point, by first mesh
The sampled point serial number of sampled point and the difference of the sampled point quantity in a sampling period are marked as sampled point corresponding to end point
Serial number.
4. according to the method described in claim 3, it is characterized in that, each sampled point according to target analysis phase it is effective
Value is calculated the step of virtual value change rate of each sampled point and includes:
According to the time interval and third preset formula between the virtual value of each sampled point of target analysis phase, neighbouring sample point
The virtual value change rate of each sampled point is calculated, wherein the third preset formula are as follows:
Wherein, Mrms(n) indicate that the virtual value change rate of the sampled point of sampled point serial number n, Δ t indicate between neighbouring sample point
Time interval, Vrms(n) virtual value of the sampled point of sampled point serial number n is indicated.
5. the method according to claim 1, wherein described based on being adopted corresponding to the starting point and end point
The instantaneous value waveform of sample point number and target analysis phase obtains that the angle of the starting point of voltage dip and the angle of end point occurs
The step of include:
According to the starting point, target analysis phase instantaneous value waveform by the sampled point of the target analysis phase from the starting point
Nearest one is the sampled point of upward zero crossing as the first reference sample point, wherein according to sampling order, first ginseng
Sample is examined before the starting point；
Described rise is calculated in the sampled point serial number of sampled point serial number and the starting point based on the first reference sample point
The angle of initial point；
According to the end point, target analysis phase instantaneous value waveform by the sampled point of the target analysis phase from the end point
Nearest one is the sampled point of upward zero crossing as the second reference sample point, wherein according to sampling order, second ginseng
Sample is examined after the end point；
The knot is calculated in the sampled point serial number of sampled point serial number and the end point based on the second reference sample point
The angle of beam spot.
6. a kind of waveform point detection device, which is characterized in that described device includes:
Sampling module, for sampling the instantaneous value waveform for obtaining three-phase voltage, wherein every in the instantaneous value waveform of each phase voltage
The information of a sampled point includes instantaneous voltage value and sampled point serial number；
The virtual value of each sampled point is calculated for the instantaneous voltage value according to each sampled point of each phase for determining module,
And target analysis phase is determined based on the virtual value of the sampled point of each phase；
Module is obtained, is obtained for the corresponding virtual value change rate of each sampled point according to target analysis phase and voltage dip occurs
Starting point and end point corresponding to sampled point serial number；
Angle calculation module, for the wink based on sampled point serial number and target analysis phase corresponding to the starting point and end point
Duration waveform obtains that the angle of the starting point of voltage dip and the angle of end point occurs.
7. device according to claim 6, which is characterized in that the determining module is according to wink of each sampled point of each phase
When voltage value the virtual value of each sampled point is calculated, and target analysis phase is determined based on the virtual value of the sampled point of each phase
Mode includes:
Successively using each sampled point after the first sampling period as the halt of a calculating cycle, and according to calculating week
The effective of each sampled point after the first sampling period is calculated in the instantaneous voltage value of each sampled point and the first preset formula in phase
Value, wherein first preset formula are as follows:
Wherein, Vrms(n) indicate that the virtual value of the sampled point of sampled point serial number n, V (i) indicate the sampling of sampled point serial number i
The instantaneous voltage value of point, wd indicate the sampled point quantity in a sampling period, sampled point quantity in a sampling period with
Sampled point quantity in one calculating cycle is identical；
The virtual value of each sampled point in each first sampling period of phase is obtained based on the second preset formula, wherein described second is default
Formula are as follows:
Vrms(n)=Vrms(wd+1) n=1,2 ..., wd
The virtual value of all sampled points of three-phase voltage is compared, and will be described in corresponding with a minimum virtual value phase is used as
Target analysis phase.
8. device according to claim 6, which is characterized in that the module that obtains is according to each sampling of target analysis phase
The corresponding virtual value change rate of point obtains the mode of sampled point serial number corresponding to the starting point and end point that voltage dip occurs
Include:
The virtual value change rate of each sampled point is calculated according to the virtual value of each sampled point of target analysis phase；
According to sampling order, the virtual value change rate of each sampled point is compared with preset threshold successively, first is had
Valid value change rate be greater than the preset threshold sampled point as first object sampled point, the last one virtual value change rate is big
In the preset threshold sampled point as the second destination sample point；
Using the sampled point serial number of the first object sampled point as sampled point serial number corresponding to starting point, by first mesh
The sampled point serial number of sampled point and the difference of the sampled point quantity in a sampling period are marked as sampled point corresponding to end point
Serial number.
9. device according to claim 8, which is characterized in that the module that obtains is according to each sampling of target analysis phase
The mode of the virtual value virtual value change rate that each sampled point is calculated of point includes:
According to the time interval and third preset formula between the virtual value of each sampled point of target analysis phase, neighbouring sample point
The virtual value change rate of each sampled point is calculated, wherein the third preset formula are as follows:
Wherein, Mrms(n) indicate that the virtual value change rate of the sampled point of sampled point serial number n, Δ t indicate between neighbouring sample point
Time interval, Vrms(n) virtual value of the sampled point of sampled point serial number n is indicated.
10. device according to claim 6, which is characterized in that the angle calculation module is based on the starting point and knot
The instantaneous value waveform of sampled point serial number and target analysis phase corresponding to beam spot obtains occurring the angle of the starting point of voltage dip
And the mode of the angle of end point includes:
According to the starting point, target analysis phase instantaneous value waveform by the sampled point of the target analysis phase from the starting point
Nearest one is the sampled point of upward zero crossing as the first reference sample point, wherein according to sampling order, first ginseng
Sample is examined before the starting point；
Described rise is calculated in the sampled point serial number of sampled point serial number and the starting point based on the first reference sample point
The angle of initial point；
According to the end point, target analysis phase instantaneous value waveform by the sampled point of the target analysis phase from the end point
Nearest one is the sampled point of upward zero crossing as the second reference sample point, wherein according to sampling order, second ginseng
Sample is examined after the end point；
The knot is calculated in the sampled point serial number of sampled point serial number and the end point based on the second reference sample point
The angle of beam spot.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811458030.1A CN109307795B (en) | 2018-11-30 | 2018-11-30 | Waveform point detection method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811458030.1A CN109307795B (en) | 2018-11-30 | 2018-11-30 | Waveform point detection method and device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109307795A true CN109307795A (en) | 2019-02-05 |
| CN109307795B CN109307795B (en) | 2020-11-06 |
Family
ID=65223759
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811458030.1A Active CN109307795B (en) | 2018-11-30 | 2018-11-30 | Waveform point detection method and device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109307795B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112116013A (en) * | 2020-09-24 | 2020-12-22 | 四川大学 | Voltage sag event normalization method based on waveform characteristics |
| CN113176437A (en) * | 2021-03-26 | 2021-07-27 | 东南大学溧阳研究院 | Method and device for rapidly detecting voltage abnormity |
| CN113376515A (en) * | 2020-03-09 | 2021-09-10 | 西门子股份公司 | Method and device for determining closing time of circuit breaker and computer readable medium |
| CN113917252A (en) * | 2021-09-10 | 2022-01-11 | 联芯集成电路制造(厦门)有限公司 | Arc defect detection method for semiconductor machine |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102375085A (en) * | 2010-08-24 | 2012-03-14 | 西门子公司 | Method for monitoring sudden rising or falling of voltage and monitoring device applying method |
| CN103197135A (en) * | 2013-03-29 | 2013-07-10 | 国家电网公司 | Transient overvoltage monitoring method |
| KR101346366B1 (en) * | 2013-01-03 | 2013-12-27 | 한경대학교 산학협력단 | Sag detection method and system for grid voltage |
| CN103901306A (en) * | 2014-04-09 | 2014-07-02 | 南京航空航天大学 | Method for detecting power grid voltage leap failures |
| CN104267310A (en) * | 2014-09-09 | 2015-01-07 | 中国矿业大学 | Voltage dip source positioning method based on disturbance power direction |
| CN104374988A (en) * | 2014-11-19 | 2015-02-25 | 华北电力大学 | Voltage sag sorting method considering phase jumps |
| CN106226587A (en) * | 2016-07-01 | 2016-12-14 | 浙江工业大学 | A kind of exchange micro-capacitance sensor voltage dip method for quick based on LES HHT |
| CN205941672U (en) * | 2016-08-17 | 2017-02-08 | 云南电网有限责任公司电力科学研究院 | Voltage dip identification system |
| US20170168656A1 (en) * | 2015-12-11 | 2017-06-15 | Schneider Electric USA, Inc. | Visual classification of events |
| CN107462764A (en) * | 2017-09-25 | 2017-12-12 | 南京灿能电力自动化股份有限公司 | A kind of voltage dip detection and the automatic segmentation method portrayed |
| CN107561347A (en) * | 2017-08-16 | 2018-01-09 | 广州供电局有限公司 | Voltage dip order of severity evaluation method and system |
-
2018
- 2018-11-30 CN CN201811458030.1A patent/CN109307795B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102375085A (en) * | 2010-08-24 | 2012-03-14 | 西门子公司 | Method for monitoring sudden rising or falling of voltage and monitoring device applying method |
| KR101346366B1 (en) * | 2013-01-03 | 2013-12-27 | 한경대학교 산학협력단 | Sag detection method and system for grid voltage |
| CN103197135A (en) * | 2013-03-29 | 2013-07-10 | 国家电网公司 | Transient overvoltage monitoring method |
| CN103901306A (en) * | 2014-04-09 | 2014-07-02 | 南京航空航天大学 | Method for detecting power grid voltage leap failures |
| CN104267310A (en) * | 2014-09-09 | 2015-01-07 | 中国矿业大学 | Voltage dip source positioning method based on disturbance power direction |
| CN104374988A (en) * | 2014-11-19 | 2015-02-25 | 华北电力大学 | Voltage sag sorting method considering phase jumps |
| US20170168656A1 (en) * | 2015-12-11 | 2017-06-15 | Schneider Electric USA, Inc. | Visual classification of events |
| CN106226587A (en) * | 2016-07-01 | 2016-12-14 | 浙江工业大学 | A kind of exchange micro-capacitance sensor voltage dip method for quick based on LES HHT |
| CN205941672U (en) * | 2016-08-17 | 2017-02-08 | 云南电网有限责任公司电力科学研究院 | Voltage dip identification system |
| CN107561347A (en) * | 2017-08-16 | 2018-01-09 | 广州供电局有限公司 | Voltage dip order of severity evaluation method and system |
| CN107462764A (en) * | 2017-09-25 | 2017-12-12 | 南京灿能电力自动化股份有限公司 | A kind of voltage dip detection and the automatic segmentation method portrayed |
Non-Patent Citations (2)
| Title |
|---|
| 王巍琴: "电网中基于向量法的电压暂降检测和特征描述", 《煤矿机电》 * |
| 肖湘宁: "《电能质量分析与控制》", 28 February 2004, 中国电力出版社 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113376515A (en) * | 2020-03-09 | 2021-09-10 | 西门子股份公司 | Method and device for determining closing time of circuit breaker and computer readable medium |
| CN112116013A (en) * | 2020-09-24 | 2020-12-22 | 四川大学 | Voltage sag event normalization method based on waveform characteristics |
| CN113176437A (en) * | 2021-03-26 | 2021-07-27 | 东南大学溧阳研究院 | Method and device for rapidly detecting voltage abnormity |
| CN113917252A (en) * | 2021-09-10 | 2022-01-11 | 联芯集成电路制造(厦门)有限公司 | Arc defect detection method for semiconductor machine |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109307795B (en) | 2020-11-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109307795A (en) | Data point detection method and device | |
| CN103698489B (en) | The verification method of test data and device | |
| CN109946535A (en) | A kind of fault arc detection method | |
| CN109374953B (en) | Voltage sag waveform point detection method based on voltage effective value sequence | |
| CN110780261B (en) | Method and system for checking electric quantity acquisition data | |
| CN109284933B (en) | Electronic transformer state evaluation system and method based on mathematical statistics | |
| CN110806556A (en) | Metering abnormity on-line monitoring method and system and readable storage medium | |
| CN113721182B (en) | Method and system for evaluating reliability of online performance monitoring result of power transformer | |
| CN114879122A (en) | Method, device and equipment for detecting abnormal operation of three-phase three-wire intelligent electric energy meter | |
| CN109725220B (en) | Detection method, system and device for transformer oil cooling loop | |
| CN108896805B (en) | Chopped wave signal verification method and system and electric energy detection device | |
| CN109359822A (en) | Electronic type voltage transformer measuring state appraisal procedure and system | |
| CN109142979A (en) | A kind of detection method and device of Abnormal State for Power Distribution Network | |
| CN111929630B (en) | Method and device for detecting saturation of current transformer | |
| CN113156336B (en) | Method and device for identifying single-tube open-circuit fault of Vienna rectifier in two stages and storage medium | |
| CN110259435B (en) | Well condition change identification method based on oil pumping unit electrical parameters | |
| CN114636883A (en) | Alternating current based power system fault determination method and device and storage medium | |
| CN113567805A (en) | Power distribution network fault diagnosis method and device based on data correlation | |
| CN113589209A (en) | Fault recording similarity evaluation method and system | |
| CN110162806A (en) | A kind of phantom error appraisal procedure and system | |
| CN108614147A (en) | Voltage fluctuation detection method and its Source of Gateway Meter | |
| CN115343579B (en) | Power grid fault analysis method and device and electronic equipment | |
| CN115290798B (en) | Stability performance monitoring method and terminal of transformer oil chromatographic online monitoring device | |
| JP2006105714A (en) | Method for determining cause of accident in power transmission line and distribution line | |
| CN110162805A (en) | It is a kind of for electromechanics-electromagnetism hybrid simulation precision appraisal procedure and system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |