CN1092871C - Apparatus for inspecting outer lines and method for detecting faults - Google Patents
Apparatus for inspecting outer lines and method for detecting faults Download PDFInfo
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- CN1092871C CN1092871C CN97108938A CN97108938A CN1092871C CN 1092871 C CN1092871 C CN 1092871C CN 97108938 A CN97108938 A CN 97108938A CN 97108938 A CN97108938 A CN 97108938A CN 1092871 C CN1092871 C CN 1092871C
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Abstract
The present invention relates to an outside line testing and analyzing device of a telecommunication network and a method thereof. The device comprises a testing unit (11), a control unit (17) and a collecting and processing unit (19), wherein the testing unit (11) is used for testing various electrical parameters, the control unit (17) is used for controlling the testing unit and can be communicated with the telecommunication network, and the collecting and processing unit (19) is used for collecting and processing test signals. The method comprises the steps that the same parameter is tested by various measuring methods, and corresponding health files are established for every user under certain regional environment in order to compare, analyze and accurately judge failure types. The statistic shows that the test accuracy rate of the device and the method of the present invention is greatly increased, and thus, the failure analyzing accuracy rate is higher than 98%.
Description
The present invention relates to system for testing telecommunication network, relate more specifically to Loop test device and failure analysis methods in it.
It is 97108835.7 that the present invention can be the application number of submitting on February 21st, 1997 such as the applicant, is entitled as a part in the type systematic of patent application of " a kind of system for testing telecommunication network ".Figure 10 shows the position of Loop test device 101 of the present invention in this test macro 111 shown in the part, as shown in the drawing, apparatus of the present invention 101 only with this system in test port matrix 103 and measuring head administration module 102 directly relevant, in case the subscriber complaint that test and management center (not shown) is accepted is delivered to the test interface machine 105 of tested user place branch office by wide area network (DDN/X.25), this interface message processor (IMP) 105 just sends test-request command according to tested Subscriber Number to switch 104, switch returns and allows the test sign, and tested user's subscribers feeder received outer the survey on the bus EBi (i for 〉=1 integer), interface message processor (IMP) 105 is promptly to 102 Loop test orders of measuring head administration module, this administration module 102 is forwarded to Loop test device 101 with the Loop test order, Loop test device 101 just starts Loop test and sends test result back to interface message processor (IMP) 105 by administration module 102, sends test and management center (not shown) by interface message processor (IMP) 105 back to 104 release commands of switch and with test result.The other guide of relevant this patent application can be consulted the document, does not give unnecessary details at this paper.
As everyone knows, the every kind of line fault that causes such as reasons such as swinging cross, ground vapour, broken string, electric leakages all may cause the user not converse or speech quality decline, becoming the main cause of subscriber complaint, is a key factor that improves telecom service quality so how to find failure cause in time to fix a breakdown as early as possible.
Practice shows that failure mode is various, causes that the reason of fault is also ever-changing, and same fault may be caused that same reason may produce the inhomogeneity fault by different reasons, and the fault that the zones of different varying environment produces is also inequality.The line fault analysis promptly is by the every characterisitic parameter of circuit being tested and these test results of analysis-by-synthesis draw whether out of order overall process of circuit, comprising also adjusting failure boundary, also need simultaneously fault to be analyzed according to various test and multiple analytical model according to the circuit actual conditions to the line test of different offices.The described Loop test of the application is finished exactly to various parameter measurements, the A line that mainly refers to Ministry of Posts and Telecommunications's standard code over the ground, the B line over the ground, the direct voltage between A, B line, alternating voltage, the measurement of totally ten binomial parameter such as insulation resistance, electric capacity etc.
Existing test macro adopts single means of testing and single analytical model to analyze basically, and is lower to the accuracy rate of accident analysis, and is subjected to the influence of factors such as regional environment remarkable.
Purpose of the present invention is exactly the above-mentioned defective that overcomes prior art, and a kind of accuracy rate height and the Loop test device and the failure analysis methods that are not subjected to factor affecting such as regional environment are provided.
For the Loop test device of the present invention that reaches this purpose comprises:
Receive the measured signal of self-testing system, be used for test voltage, resistance, the isoparametric test cell of electric capacity;
Be used to control described test cell, and can with the test macro control unit in communication;
Be used to gather from the test signal of test cell and the signal acquisition process unit of being handled;
Described signal acquisition process unit comprises data acquisition circuit and digital information processing system;
Described control unit comprises and is used for control and extraneous communication and is used to control described test circuit action which kind of signal the notice digital information processing system need be gathered and receive the control communication system of its result;
Described test cell comprises that detecting test line has or not the high-voltage detector of bumping power line; The discharge circuit of the remaining electric charge in phone and the line capacitance of releasing; The over-voltage over-current protection circuit that is used for step-down and current limliting when the test process p-wire is run into high pressure; Be used to measure the voltage measurement unit of AC and DC voltage; The resistance measurement unit that is used for the measurement circuitry insulation resistance; Be used to measure the capacitance measurement unit of electric capacity; And the signal condition unit that the signal from described voltage and resistance measurement unit is carried out delivering to after the normalization described data acquisition circuit.
Described resistance measurement unit comprises the high resistant comparison circuit that is provided with a certain high resistant fiducial value; Be used to measure the resistance that is lower than/equals described high resistant fiducial value and measurement result is delivered to the high resistance measurement circuit of described signal condition unit and is used to measure the small resistor that is lower than a certain low resistance and the small resistance measurement circuit of measurement result being delivered to described signal condition unit;
Described capacitance measurement unit comprises the Switching Power Supply that is used to promote reference power supply voltage that links to each other successively; Be used to produce the constant-current circuit of benchmark continuous current for the measured capacitance charging; The comparison circuit that is used for comparison two charge point voltages, and the timing circuit that described two charge point are carried out timing.
Described signal condition unit comprises the low pass filter of the high fdrequency component that is used to filter input signal, the β control unit that cascade is amplified the two-stage programmable amplifier of described low-pass filter output signal and is used for the multiplication factor of the described two-stage programmable amplifier of FEEDBACK CONTROL.Described β control unit comprises and is used for the comparison circuit that described programmable amplifier output signal is compared with the reference signal of setting and receives comparative result controlling described programmable amplifier multiple, the β control circuit of good signal-to noise ratio is provided for the next stage data acquisition.
Described data acquisition circuit in the described signal acquisition process unit comprises selector switch that a plurality of tested users are tested selection and becomes digital signal to be sent to the A/D converter of digital information processing system selected analog signal conversion.
A kind of Loop test analytical method of the present invention comprises the steps: that (1) carry out high pressure to measured signal and detect, and judges whether tested circuit touches power line; (2), then only voltage measurement is carried out in measured signal if test line touches power line; Otherwise execution next step; (3) substation is carried out discharge process, bleed off the residual charge on the phone; (4) simultaneously voltage measurement, resistance measurement and capacitance measurement are carried out in measured signal; (5) every measurement result is compared analysis, to determine fault type.
Described resistance method of temperature measurement may further comprise the steps:
Measure first resistance with resistance measuring circuit;
In the time of in first resistance drops on certain interval, enable subscriber line circuit and measure second resistance;
Distinguish and judge different faults according to whether described first resistance and second resistance be identical; User not on-hook or AB line insulation property is poor.
Whether described high and low two kinds of voltage comparison values of described capacity measurement method are respectively applied for combination capacitor and the line capacitance of measuring line capacitance and phone electric capacity, thereby distinguish between line and phone electric capacity, judge and really break.
The present invention also provides a kind of State Control method that realizes the test of Loop test analytical method multidiameter delay, and its step comprises: (1) is carried out the state initialization to each road successively and is judged described multichannel scan round successively; (2),, and operation placed initial sub-state then with used parameter initialization under the described state if not executing state initialization; (3) if following State Control is then carried out in state initialization: extract this road current state in the state control table from be stored in memory; Carry out the corresponding operating under this state; Be about to behind the complete operation deposit described state control table in after state value is revised.
Because the Loop test that this paper homepage has been mentioned and the polytropy of analysis, complexity, make the test accuracy rate of conventional method be difficult to improve, according to Ministry of Posts and Telecommunications's maintenance place statistics, even if at present the outside line accuracy rate of measuring reaches 80% good, and the present invention design just is being based on and has considered many-sided correlative factor, jumped out the circle of only using laboratory environment analog line model, adopt the said method and the device of the changeable complexity of deacclimatizing actual environment as much as possible, from different perspectives, different levels go to improve the test accuracy rate, thereby great advantage of the present invention and effect are exactly to have improved the test accuracy rate greatly, a large amount of experiment statisticses according to the applicant show, the accident analysis accuracy rate of apparatus of the present invention and method is up to more than 98%, and the multidiameter delay test has obviously improved response and routine test speed to subscriber complaint greatly.
Now be described with reference to the accompanying drawings the embodiment of apparatus of the present invention and method.Same section is represented with same numeral in all accompanying drawings.
Fig. 1 is the structure calcspar of an embodiment of Loop test device of the present invention;
Fig. 2 is the structured flowchart of a daughter board in the test cell shown in Figure 1;
Fig. 3 is the structured flowchart of resistance measurement unit in the device shown in Figure 2;
Fig. 4 is the structured flowchart of capacitance measurement unit in the device shown in Figure 2;
Fig. 5 is the structured flowchart of signal condition unit in the device shown in Figure 2;
Fig. 6 is the structured flowchart of acquisition process shown in Figure 1 unit;
Fig. 7 adopts the schematic flow sheet of State Control method when being the test of explanation multidiameter delay;
The test flow chart on each road when Fig. 8 is explanation method shown in Figure 7;
Fig. 9 is a flow chart of realizing step S74 shown in Fig. 7;
Figure 10 is the schematic diagram that concerns of expression Loop test device of the present invention and system for testing telecommunication network;
Fig. 1 illustrates the structure square of an embodiment of Loop test device of the present invention.
Present embodiment is the situation when Loop test device 101 of the present invention is applied to centralized test system 111, by this figure as seen, the switching matrix that has two 8 * 8 of the test port matrix (RLC) 103 in the measuring system 111 8 outer bus EB1～EB8 that survey that switch can be come are assigned to Loop test plate 101 by p-wire to ML1～ML8.Promptly, adopt parallel four drive tests examination in this example, a Loop test plate 101 comprises the test cell of being made up of four test daughter boards 11, the voltage measured of unit 11 after tested, resistance value selects the circuit-switched data in four tunnel to deliver to signal acquisition process unit 19 through analog switch 12, described acquisition process unit 19 is made up of data acquisition circuit 13 and dsp system 14, the latter communicates by RS232 mode and control unit 17, this control unit 17 comprises governor circuit 16 and 8031 systems 15, the 15 control test circuit actions of 8031 systems, which kind of signal notice dsp system 14 need be gathered, after 14 pairs of dsp systems need the signal of collection to handle, result is delivered to 8031 systems 15, it is dual port RAM that control unit 17 also passes through in 18 examples of communication mailbox, communicate with the administration module (TCN) 102 in the test macro, received by the exchange of information order between the test interface machine CTC in administration module 102 forwarding Loop test plates 101 and the measuring system, the result reports.
Referring to Fig. 2 and Fig. 8, they illustrate a line structure and the testing process thereof of test cell 11 among Fig. 1 respectively.As seen from the figure, test cell 11 acceptance test lines at first are added to high-voltage detector 203 to the measured signal on the ML1, promptly detect high pressure and judge in the S82 step that it has or not and touch power line in S81 step, if touched power line then flow process directly enter voltage measurement step S84, just voltage is added to 205 of voltage measurement units and does voltage measurement; If S82 step judged result is not for bumping power line, then flow process proceeds to S83, discharge via 204 pairs of substations of discharge circuit, carry out again through voltage measurement unit 205 after bleeding off the remaining electric charge on the phone, the voltage of resistance measurement unit 208 capacitance measurement unit 207, resistance capacitance measuring process S84, S85, S86.Be arranged among Fig. 2 before resistance measurement unit 208 and the capacitance measurement unit 207 over-voltage over-current protection circuit 206 the measuring process circuit bump high pressure (power line) but the time step-down current limliting in order to avoid the infringement measuring circuit.Voltage measurement unit 205 herein, and measured value V1, V2 are all exported with voltage form in resistance measurement unit 208, deliver to the data acquisition circuit 13 among Fig. 1 through signal condition unit 201.Capacitance measurement unit 207 adopts constant current charge method measurement (back will be described in detail) its measured value to be calculated by the automatic test interface machine CTC that delivers to measuring system 111 that counts of hardware on the other hand.
As seen from Figure 2, test cell 11 comprises that also the control circuit 202 that is subjected to governor circuit 16 controls is used to control the operation of each test circuit of test cell.
Referring to Fig. 3; this illustrates the concrete structure of resistance measurement shown in Figure 2 unit 208; as seen from the figure; import the high megohm resistance comparator 301 of this unit 208 from the signal of over-voltage over-current protection circuit 206; compare with the fiducial value of 10M Ω; and will introduce high resistance measurement circuit 302 less than the signal of this fiducial value; circuit 302 adopts electric resistance partial pressure principle measuring resistance; and will be added to small resistance measurement circuit 303 less than the small resistor of 10K Ω; the small resistor value of measuring through the constant current manometric method is added to signal condition unit 201 with the output greater than the high resistance measurement circuit 302 of 10K Ω, exports data acquisition circuit 13 (Fig. 1) after its normalization to.
Referring to Fig. 4; this illustrates the concrete structure of capacitance measurement unit 207 shown in Figure 2; by this figure as seen; this example adopts the constant current charge method to measure electric capacity: Switching Power Supply booster circuit 401 general+12V supply voltages are through boosting to+being added to more than the 50V on the constant-current circuit 402 again; to produce the benchmark continuous current to add to the measured capacitance charging of charging voltage comparison circuit 403 from over-voltage over-current protection circuit 206 (Fig. 2); relatively obtain the voltage difference AV of two charge point in the charging process by this comparison circuit 403; and start timing circuit 404 and carry out timing and obtain corresponding time difference Δ t, then just can be by the measured value of step S86 calculating capacitor C shown in Figure 8 according to formula I=C (Δ V/ Δ t).
Referring to Fig. 5, this illustrates the concrete structure of the unit of signal condition shown in Fig. 2 201.By this figure as seen, from voltage among Fig. 2, resistance measurement unit 205,208 voltage signal V1, V2 just enters earlier the two-stage programmable amplifier 502A of cascade after low pass filter 501 filters high fdrequency component, 502B, signal after amplifying just may be output to the data acquisition circuit 13 among Fig. 1, that will particularly point out is programmable amplifier 502A herein, the multiplication factor of 502B is by 503 controls of β control unit, this unit 503 comprises β control circuit 504 and comparison circuit 505, the difference of two reference signals in the output signal of programmable amplifier 502B and the comparison circuit 505 after relatively feeds back to output signal that programmable amplifier 502A and 502B make them between two reference voltages or to the maximum amplification of programmable amplifier through β control circuit 504, so that good input signal is provided for the data acquisition circuit 13 of next stage, improve its input signal-to-noise ratio, reduce to mould/number conversion error thereafter minimum.
Referring to Fig. 6, this illustrates the more specifically structure of signal acquisition process unit 19 among Fig. 1, because the outside line test board has four test daughter boards in this example, can carry out Loop test to 4 users simultaneously, so this signal acquisition process unit 19 selects one of them to send into A/D converter 601 through the corresponding 4 tunnel output signal IS1～IS4 of 12 pairs four tests of analog switch daughter board earlier, the selection control of analog switch 12 and the startup of A/D converter 601 are by 602 controls of DSP56002 system, digital signal DS through converting to sends into DSP56002 system 602, and the output signal 0S after the data processing delivers to 8031 systems 15 among Fig. 1 by the RS232 interface.DSP56002 is the digital signal processor spare that motorola inc makes in this example, 24 bit data bus are arranged, in have two address bus generation units of X, Y can be according to the program that reads from memory under program 605, concurrently to X storage portions 603, Y storage portions 604 is operated, be particularly suitable for digital signal algorithm process (as FFT etc.), can realize various algorithm process fast thereon.
Referring to Fig. 7 and Fig. 9, they are depicted as the flow process of implementing multichannel (this example is 4 tunnel) the State Control method of the present invention that concurrent testing adopted.By this figure as seen, be to adopt four tunnel scan modes during four tunnel parallel processings, each state is provided with a time-out count device according to its maximum execution time, can not move back this state in case occur unexpected, and every road is provided with a total time-out count device.This control flow is: at S71, it is always overtime to judge whether to arrive every road, then enter step S75 and judge whether to have finished four drive tests examinations if arrived, otherwise, if no show total overtime quarter, then enter step S72 and judged whether to carry out the state initialization: to the initialization of used parameter in this state, and operation placed initial sub-state, if being judged to be "No" then proceeds to S73 and carries out above-mentioned state processing, otherwise, if executed above-mentioned state processing then proceed to S74, the various operations down of this state are carried out in the control that gets the hang of, and as shown in Figure 9, this State Control step comprises at first step S91 from memory extracts current state in the state of arrangement and the state control table that corresponding control operation contrasts according to the order of sequence, then, carry out the corresponding operating of this table indication at S92; The new state value that will obtain at step S93 behind the complete operation refreshes and deposits state control table in, then scans next road at S94, and circulation repeats above-mentioned steps, until at S75, judges and carries out S76 when the equal executed of four road concurrent testings finishes, and returns main program.
For realizing that the present invention significantly improves the accuracy rate and the basic purpose of eliminating factor affecting such as regional environment of Loop test and failure judgement, the present invention adopts same parameter utilization different measuring method is distinguished and accurately judged nature of trouble.For example, be difficult to distinguish user not insulation property difference or mixed certainly fault between on-hook and AB line with the single-measurement method, the present invention then distinguishes these faults with two kinds of method of measurement; Because receiver off-book resistance (loop resistance) is non-linear, different supply currents, its equivalent resistance difference, electric current is more little, resistance is big more, according to this principle, accident analysis method of the present invention is measured with resistance measuring circuit earlier, if measured value for example drops on＜3K Ω〉(can not distinguish not fault such as insulation difference between on-hook or AB of user) in the 100K Ω scope time, enabling normal feed circuit (subscriber line circuit) again measures, so if the resistance that records of the latter during less than 3K Ω, then can be judged not on-hook of user, on the contrary then for the AE line insulate poor.And for example, generally all judge and have or not broken string by the capacitance in the measurement phone ringing circuit, but this capacitance is very little sometimes, with the same magnitude of line capacitance, then just being difficult to distinguish what measure is line capacitance or phone electric capacity, so the present invention adopts the test of the two kinds of voltage comparison point of knowing clearly: low voltage comparison point is used to measure line capacitance, and high voltage comparison point is used to measure the shunt capacitance of line capacitance and phone electric capacity.Just can distinguish between line and phone electric capacity by these two kinds of capacitance measurements, thereby whether really conclude broken string.
Though more than in conjunction with the embodiments Loop test device of the present invention and failure analysis methods have been made detailed description; but the present invention is not limited in the system for testing telecommunication network that is used in the applicant; obviously the present invention also can be used for other telecommunication test system that the corresponding interface is provided, and should determine by comprising all apparent change that those skilled in the art may make and the appended claims of remodeling so protection range of the present invention is not restricted to the described embodiments.
Claims (12)
1, a kind of Loop test device of communication network, this device comprises:
Reception is used to test the test cell (11) of electrical parameters from the measured signal of described communication network;
Be used to control described test cell and can with described communication network control unit in communication (17);
Be used to gather from the test signal of test cell and the signals collecting of being handled, processing unit (19);
Described signal acquisition process unit (19) comprises data acquisition circuit (13) and digital information processing system (14);
Described control unit (17) comprises and is used to control with the main control circuit (16) of extraneous communication and is used to control described test circuit action, notifies described digital information processing system need gather which kind of signal and receives the control communication system (15) of its result.
2, Loop test device as claimed in claim 1 is characterized in that: described test cell (11) comprising:
Detect test line and have or not the high-voltage detector (203) of bumping power line;
The discharge circuit (204) of the remaining electric charge in phone and the line capacitance of releasing;
The over-voltage over-current protection circuit (206) that is used for step-down and current limliting when the test process p-wire is run into high pressure;
Be used to measure the voltage measurement unit (205) of AC and DC voltage;
The resistance measurement unit (208) that is used for the measurement circuitry insulation resistance;
Be used to measure the capacitance measurement unit (207) of electric capacity; And
Signal from described voltage measurement unit and described resistance measurement unit is carried out delivering to after the normalization signal condition unit (201) of described data acquisition circuit.
3, Loop test device as claimed in claim 2 is characterized in that:
Described resistance measurement unit (208) comprises the high resistant comparison circuit (301) that is provided with a certain high resistant fiducial value; Be used to measure the resistance that is lower than/equals described high resistant fiducial value
And measurement result is delivered to the high resistance measurement circuit (302) of described signal conditioning circuit; And
Be used to measure small resistor that is lower than a certain low resistance and the small resistance measurement circuit (303) of its measurement result being delivered to described signal condition unit (201).
4, Loop test device as claimed in claim 2 is characterized in that
Described capacitance measurement unit comprises the Switching Power Supply booster circuit (401) that is used to promote reference power supply voltage that links to each other successively;
Be used to produce the constant-current circuit (402) of benchmark continuous current for the measured capacitance charging;
The comparison circuit (403) that is used for comparison two charge point voltages; And
Described two charge point are carried out the timing circuit (404) of timing.
5, Loop test device as claimed in claim 2 is characterized in that:
Described signal condition unit (201) comprises the low pass filter (501) of the high fdrequency component that is used to filter input signal, cascade amplify described low-pass filter output signal the two-stage programmable amplifier (502A, 502B) and the β control unit (503) that is used for the multiplication factor of the described two-stage programmable amplifier of FEEDBACK CONTROL.
6, Loop test device as claimed in claim 2 is characterized in that:
Described data acquisition circuit (13) in the described signal acquisition process unit (19) comprises and becomes digital signal to be sent to the A/D converter (601) of digital information processing system (14) selected analog signal conversion.
7, Loop test device as claimed in claim 5, it is characterized in that: described β control unit (503) comprises and is used for the comparison circuit (505) that described programmable amplifier output signal is compared with the reference signal of setting and receives comparative result controlling described programmable amplifier multiple, the β control circuit (504) of good signal-to noise ratio is provided for the next stage data acquisition.
8, a kind of Loop test analytical method comprises the steps:
(1) high pressure is carried out in measured signal and detect, and judge whether tested circuit bumps
The electric shock line of force;
(2), then only voltage is carried out in measured signal and survey if test line touches power line
Amount; Otherwise execution next step;
(3) substation is carried out discharge process, bleed off the residual charge on the phone;
(4) simultaneously voltage measurement, resistance measurement and capacitance measurement are carried out in measured signal;
(5) every measurement result is compared analysis, to determine fault type.
9, Loop test analytical method as claimed in claim 8 is characterized in that:
Described resistance method of temperature measurement may further comprise the steps:
Measure first resistance with resistance measuring circuit;
In the time of in first resistance drops on certain interval, enable subscriber line circuit and measure second resistance;
Distinguish and judge according to whether described first resistance and second resistance be identical: user not on-hook still is that AB line insulation property are poor.
10, Loop test analytical method as claimed in claim 8 or 9 is characterized in that:
Whether described high and low two kinds of voltage comparison values of described capacity measurement method are respectively applied for combination capacitor and the line capacitance of measuring line capacitance and phone electric capacity, thereby distinguish between line and phone electric capacity, judge and really break.
11, a kind ofly realize that its step comprises as the State Control method of Loop test analytical method multidiameter delay test as described in the claim 8:
(1), successively the state initialization is carried out on each road and judged to described multichannel scan round successively;
(2),, and operation placed initial sub-state then with used parameter initialization under the described state if not executing state initialization;
(3) if following State Control is then carried out in state initialization:
Extract this road current state in the state control table from be stored in memory;
Carry out the corresponding operating under this state;
Be about to behind the complete operation deposit described state control table in after state value is revised.
12, the State Control method of multidiameter delay test as claimed in claim 11 is characterized in that: also comprise described every road is provided with a total time-out count device and each described state is provided with a time-out count device, in case fortuitous event can not move back this state.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN97108938A CN1092871C (en) | 1997-06-06 | 1997-06-06 | Apparatus for inspecting outer lines and method for detecting faults |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN97108938A CN1092871C (en) | 1997-06-06 | 1997-06-06 | Apparatus for inspecting outer lines and method for detecting faults |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1202052A CN1202052A (en) | 1998-12-16 |
| CN1092871C true CN1092871C (en) | 2002-10-16 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN97108938A Expired - Lifetime CN1092871C (en) | 1997-06-06 | 1997-06-06 | Apparatus for inspecting outer lines and method for detecting faults |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1092871C (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4696600B2 (en) * | 2005-03-08 | 2011-06-08 | 日本電気株式会社 | Wireless access network system |
| CN102891937B (en) * | 2012-10-10 | 2015-04-08 | 烽火通信科技股份有限公司 | Multifunctional circuit test board of voice terminal equipment |
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1997
- 1997-06-06 CN CN97108938A patent/CN1092871C/en not_active Expired - Lifetime
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| Publication number | Publication date |
|---|---|
| CN1202052A (en) | 1998-12-16 |
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