CN109283366B - Wire rod test fixture - Google Patents
Wire rod test fixture Download PDFInfo
- Publication number
- CN109283366B CN109283366B CN201811208863.2A CN201811208863A CN109283366B CN 109283366 B CN109283366 B CN 109283366B CN 201811208863 A CN201811208863 A CN 201811208863A CN 109283366 B CN109283366 B CN 109283366B
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- CN
- China
- Prior art keywords
- wire
- test hook
- test
- hook mounting
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 130
- 239000000523 sample Substances 0.000 claims abstract description 30
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 5
- 238000003466 welding Methods 0.000 claims description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 abstract description 7
- 238000005476 soldering Methods 0.000 abstract description 7
- 229910000679 solder Inorganic materials 0.000 abstract description 3
- 230000007547 defect Effects 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005056 compaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention discloses a wire rod test fixture, which comprises: the test hook mounting plate is used for mounting a test hook and is of a semicircular structure; the vertical fixing plate is used for installing and fixing the test hook installing plate; and the bottom plate is used for installing and fixing the vertical fixing plate. The wire testing jig is reasonable in structure, the probe testing hook is arranged in the testing hook mounting hole of the testing hook mounting plate during testing, the lower end of the probe testing hook forms a small arc, a shorter wire can be clamped, a wire with a shorter wire stripping end (the total length is 18-25mm, and the soldering tin length is 6-8 mm) can be clamped for testing, and the wire testing jig is also suitable for testing wires with longer wire stripping length; the wire is only required to be split and clamped by the probe test hook each time, and the solder wire is hooked and contacted directly by the probe test hook, so that the test is more stable than the probe is pressed on physical contact.
Description
[ field of technology ]
The invention relates to the technical field of wire testing fixtures, in particular to a wire testing fixture.
[ background Art ]
At present, for testing a plurality of strands (6 strands, type C cable), a wire is fixed by using a wire pressing block, and then is put into a jig for wire testing. The wire pressing block generally uses the way of upper and lower covers to attract (or is more chain to add magnet), require the wire rod to have certain wire stripping length (total length) 30-35mm, tin length 10-20mm on the stranded thin wire, after the attraction, the wire pressing block exposes the soldering tin wire totally, put into the fixture, use quick clamp etc. of up-and-down motion to push down the probe, compress the wire rod and contact with the fixture, carry on the test. The lower cover is provided with a wire slot for fixing a plurality of strands of fixed wires, the upper cover is also provided with a corresponding groove, and the upper cover and the lower cover are attracted through a magnet with larger magnetism. Firstly, a plurality of strands of wires are installed in grooves of corresponding lower covers, and then the upper covers are buckled for compaction. And finally, placing the whole wire pressing block into a jig, and then testing wires.
The method for testing the multi-strand wire has the following defects: 1. the wire stripping length is required to be larger, the wire stripping length is short (the total length is 18-25mm, the soldering tin length is 6-8 mm) and cannot be suitable, and the application range is smaller; 2. the exposed soldering wires of the wire pressing block need to be pressed by using single-row or even double-row probes to be contacted with the jig, and then the test is carried out. The soldering tin wire is easy to deviate, the wire possibly has poor contact, the double-row probes are often used for improving the test stability, the test is unstable, and the installation is complicated.
Therefore, it is necessary to provide a wire testing jig.
[ invention ]
The invention aims to overcome the defects of the prior art and provide a wire rod testing jig, which aims to solve the technical problems of small application range, low testing stability and complicated fixture installation existing in the multi-strand wire rod testing method in the prior art.
In order to achieve the above object, the present invention provides a wire testing jig, comprising:
the test hook mounting plate is used for mounting a probe test hook and is of a semicircular structure;
the vertical fixing plate is used for installing and fixing the test hook installing plate;
and the bottom plate is used for installing and fixing the vertical fixing plate.
Preferably, the vertical fixing plate is vertically installed on the bottom plate, at least one through hole is respectively formed in two sides of the bottom of the vertical fixing plate, and each through hole is fixedly connected with the bottom plate through a bolt fastener.
Preferably, the top of the vertical fixing plate is in an upward convex semicircular arc shape matched with the longitudinal section shape of the test hook mounting plate, the rear end of the test hook mounting plate is connected with the top of the vertical fixing plate, and the joint of the test hook mounting plate and the vertical fixing plate is smooth and has no outward convex.
Preferably, the test hook mounting plate is connected with the vertical fixing plate through one or a combination of a plurality of fasteners and welding.
Preferably, the front part of the test hook mounting plate is provided with a plurality of test hook mounting holes, the rear part of the test hook mounting plate is provided with a plurality of wire grooves, and the test hook mounting plate is provided with threaded holes on the left side and the right side of each test hook mounting hole and the side part of each wire groove.
Preferably, the number of the wire grooves is the same as that of the test hook mounting holes, the wire grooves and the test hook mounting holes are uniformly distributed along the semicircular arc of the test hook mounting plate, and the test hook mounting holes correspond to the wire grooves in front and back.
Preferably, adjacent test hook mounting holes can share a threaded hole.
Preferably, the bottom plate is provided with a plurality of waist-shaped holes for fixing.
The invention has the beneficial effects that: compared with the prior art, the wire testing jig provided by the invention is reasonable in structure, and is composed of the testing hook mounting plate, the vertical fixing plate and the bottom plate, when in testing, the probe testing hook is mounted in the testing hook mounting hole of the testing hook mounting plate, the lower end of the probe testing hook forms a small arc, short wires can be clamped, as the probe testing hook is provided with a circular ring, the circular ring is arranged on the testing hook mounting plate and limited by the testing hook mounting hole, a lead wire on the probe testing hook passes through a corresponding wire slot, then a fastener formed by a gasket pressing ring and a bolt is mounted in a threaded hole, the circular ring and the lead wire on the probe testing hook are pressed and fixed, the wire with a short wire stripping end (the total length is 18-25mm, and the soldering tin length is 6-8 mm) can be clamped for testing, and meanwhile, the wire with a longer wire stripping length is also suitable for testing; the wire is only required to be split and clamped by the probe test hook each time, and the solder wire is hooked and contacted directly by the probe test hook, so that the test is more stable than the probe is pressed on physical contact.
The features and advantages of the present invention will be described in detail by way of example with reference to the accompanying drawings.
[ description of the drawings ]
Fig. 1 is a schematic structural diagram of a wire testing fixture according to an embodiment of the invention.
[ detailed description ] of the invention
The present invention will be further described in detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the detailed description and specific examples, while indicating the invention, are intended for purposes of illustration only and are not intended to limit the scope of the invention. In addition, in the following description, descriptions of well-known structures and techniques are omitted so as not to unnecessarily obscure the present invention.
Referring to fig. 1, an embodiment of the present invention provides a wire testing fixture, including:
the test hook mounting plate 1 is used for mounting a probe test hook 4, and the test hook mounting plate 1 is of a semicircular structure;
a vertical fixing plate 2 for mounting and fixing the test hook mounting plate 1;
and the bottom plate 3 is used for installing and fixing the vertical fixing plate 2.
The vertical fixing plate 2 is vertically arranged on the bottom plate 3, at least one through hole 21 is respectively formed in two sides of the bottom of the vertical fixing plate 2, and each through hole is fixedly connected with the bottom plate 3 through a bolt fastener; the top of the vertical fixing plate 2 is in an upward convex semicircular arc shape which is matched with the longitudinal section shape of the test hook mounting plate 1, the rear end of the test hook mounting plate 1 is connected with the top of the vertical fixing plate 2, and the joint of the test hook mounting plate 1 and the vertical fixing plate 2 is smooth and has no convex; the front part of the test hook mounting plate 1 is provided with a plurality of test hook mounting holes 11, the rear part of the test hook mounting plate 1 is provided with a plurality of wire grooves 12, and the test hook mounting plate 1 is provided with threaded holes 13 on the left side and the right side of each test hook mounting hole 11 and the side part of each wire groove 12.
Further, the test hook mounting plate 1 is connected with the vertical fixing plate 2 through one or a combination of a plurality of fasteners and welding.
Further, the number of the wire grooves 12 is the same as that of the test hook mounting holes 11, the wire grooves 12 and the test hook mounting holes 11 are uniformly distributed along the semicircular arc of the test hook mounting plate 1, and the test hook mounting holes 11 correspond to the wire grooves 12 in front and back; adjacent test hook mounting holes 11 can share a threaded hole 13.
In the embodiment of the invention, the number of the wire grooves 12 and the number of the test hook mounting holes 11 are 6.
The invention relates to a wire testing jig, which is reasonable in structure and comprises a testing hook mounting plate 1, a vertical fixing plate 2 and a bottom plate 3, wherein during testing, a probe testing hook is mounted in a testing hook mounting hole 11 of the testing hook mounting plate 1, the lower end of the probe testing hook forms a small circular arc, a shorter wire can be clamped, as the probe testing hook is provided with a circular ring, the circular ring is arranged on the testing hook mounting plate 1 and limited by the testing hook mounting hole 11, a lead wire on the probe testing hook passes through a corresponding wire slot 12, then a fastener formed by a gasket pressing ring and a bolt is mounted in a threaded hole 13, the circular ring and the lead wire on the probe testing hook are pressed and fixed, the wire with a shorter wire stripping end (the total length is 18-25mm, and the soldering tin length is 6-8 mm) can be clamped for testing the wire with the longer wire stripping length; the wire is only required to be split and clamped by the probe test hook each time, and the solder wire is hooked and contacted directly by the probe test hook, so that the test is more stable than the probe is pressed on physical contact.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, or alternatives falling within the spirit and principles of the invention.
Claims (4)
1. Wire rod test fixture, its characterized in that: comprising the following steps:
the test hook mounting plate (1) is used for mounting a probe test hook (4), and the test hook mounting plate (1) is of a semicircular structure;
the vertical fixing plate (2) is used for installing and fixing the test hook installing plate (1);
a bottom plate (3) for mounting and fixing the vertical fixing plate (2);
the vertical fixing plate (2) is vertically arranged on the bottom plate (3), at least one through hole (21) is respectively formed in two sides of the bottom of the vertical fixing plate (2), and each through hole is fixedly connected with the bottom plate (3) through a bolt fastener;
the front part of the test hook mounting plate (1) is provided with a plurality of test hook mounting holes (11), the rear part of the test hook mounting plate (1) is provided with a plurality of wire grooves (12), and the test hook mounting plate (1) is provided with threaded holes (13) at the left side and the right side of each test hook mounting hole (11) and the side part of each wire groove (12);
the top of the vertical fixing plate (2) is in an upward convex semicircular arc shape which is matched with the longitudinal section shape of the test hook mounting plate (1), the rear end of the test hook mounting plate (1) is connected with the top of the vertical fixing plate (2), and the joint of the test hook mounting plate (1) and the vertical fixing plate (2) is smooth and has no protruding;
the number of the wire grooves (12) is the same as that of the test hook mounting holes (11), the wire grooves are uniformly distributed along the semicircular arc of the test hook mounting plate (1), and the test hook mounting holes (11) correspond to the wire grooves (12) in front and back;
the lower extreme of probe test hook (4) forms a little circular arc, is provided with the ring on probe test hook (4), and the ring is put up on test hook mounting panel (1) to it is spacing through test hook mounting hole (11), and the lead wire on probe test hook (4) passes through corresponding metallic channel (12), then installs in screw hole (13) by the fastener that gasket clamping ring and bolt constitute.
2. The wire testing jig according to claim 1, wherein: the test hook mounting plate (1) is connected with the vertical fixing plate (2) through one or a combination of a plurality of fasteners and welding.
3. The wire testing jig according to claim 1, wherein: the adjacent test hook mounting holes (11) can share a threaded hole (13).
4. The wire testing jig according to claim 1, wherein: the bottom plate (3) is provided with a plurality of waist-shaped holes (31) for fixing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811208863.2A CN109283366B (en) | 2018-10-17 | 2018-10-17 | Wire rod test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811208863.2A CN109283366B (en) | 2018-10-17 | 2018-10-17 | Wire rod test fixture |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109283366A CN109283366A (en) | 2019-01-29 |
| CN109283366B true CN109283366B (en) | 2024-03-26 |
Family
ID=65177481
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811208863.2A Active CN109283366B (en) | 2018-10-17 | 2018-10-17 | Wire rod test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109283366B (en) |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9408142D0 (en) * | 1994-04-25 | 1994-06-15 | Mcgrath John E | Consolidated monitoring cable arrangement |
| US5385477A (en) * | 1993-07-30 | 1995-01-31 | Ck Technologies, Inc. | Contactor with elastomer encapsulated probes |
| WO2002024820A2 (en) * | 2000-09-25 | 2002-03-28 | Chemetall Gmbh | Method for coating metallic surfaces and use of substrates coated in such a way or coatings produced in such a way |
| JP2004239876A (en) * | 2003-02-10 | 2004-08-26 | Jeol Ltd | Scanning probe microscope, probe holder, and probe holder mounting member for transfer |
| KR100806379B1 (en) * | 2006-12-22 | 2008-02-27 | 세크론 주식회사 | Probe, and probe card including the same |
| KR101363367B1 (en) * | 2012-09-04 | 2014-02-25 | 주식회사 에스피에스테크 | Examination apparatus of printed circuit board |
| WO2016112702A1 (en) * | 2015-01-13 | 2016-07-21 | 章炯仁 | Novel connecting structure for led lamp and electric wire, and device for manufacturing same |
| CN207248945U (en) * | 2017-09-05 | 2018-04-17 | 深圳市振云精密测试设备有限公司 | Floating type micropin measurement jig |
| CN108107243A (en) * | 2017-12-26 | 2018-06-01 | 深圳市道格特科技有限公司 | Fast assembling-disassembling probe card |
| CN108589019A (en) * | 2018-05-30 | 2018-09-28 | 江苏润山精密机械科技有限公司 | A kind of probe fixed structure for loom |
| CN209280756U (en) * | 2018-10-17 | 2019-08-20 | 杭州兆华电子有限公司 | A kind of wire test jig |
-
2018
- 2018-10-17 CN CN201811208863.2A patent/CN109283366B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5385477A (en) * | 1993-07-30 | 1995-01-31 | Ck Technologies, Inc. | Contactor with elastomer encapsulated probes |
| GB9408142D0 (en) * | 1994-04-25 | 1994-06-15 | Mcgrath John E | Consolidated monitoring cable arrangement |
| WO2002024820A2 (en) * | 2000-09-25 | 2002-03-28 | Chemetall Gmbh | Method for coating metallic surfaces and use of substrates coated in such a way or coatings produced in such a way |
| JP2004239876A (en) * | 2003-02-10 | 2004-08-26 | Jeol Ltd | Scanning probe microscope, probe holder, and probe holder mounting member for transfer |
| KR100806379B1 (en) * | 2006-12-22 | 2008-02-27 | 세크론 주식회사 | Probe, and probe card including the same |
| KR101363367B1 (en) * | 2012-09-04 | 2014-02-25 | 주식회사 에스피에스테크 | Examination apparatus of printed circuit board |
| WO2016112702A1 (en) * | 2015-01-13 | 2016-07-21 | 章炯仁 | Novel connecting structure for led lamp and electric wire, and device for manufacturing same |
| CN207248945U (en) * | 2017-09-05 | 2018-04-17 | 深圳市振云精密测试设备有限公司 | Floating type micropin measurement jig |
| CN108107243A (en) * | 2017-12-26 | 2018-06-01 | 深圳市道格特科技有限公司 | Fast assembling-disassembling probe card |
| CN108589019A (en) * | 2018-05-30 | 2018-09-28 | 江苏润山精密机械科技有限公司 | A kind of probe fixed structure for loom |
| CN209280756U (en) * | 2018-10-17 | 2019-08-20 | 杭州兆华电子有限公司 | A kind of wire test jig |
Non-Patent Citations (2)
| Title |
|---|
| A Simple Strip Model in the Volume-Surface Integral Equation for Analysis of Arbitrary Probe-Fed Conformal Microstrip Antennas;Mang He等;《IEEE Antennas and Wireless Propagation Letters》;第8卷;全文 * |
| 线缆测试仪拓展应用的研究;卜显武等;《中国新技术新产品》;全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109283366A (en) | 2019-01-29 |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Address after: 310000 No. 10, Xianqiao Road, Zhongtai street, Yuhang District, Hangzhou City, Zhejiang Province Applicant after: Hangzhou Zhaohua Electronics Co.,Ltd. Address before: 310000 building 1-3, No. 31-1, Xianxing Road, Xianlin street, Yuhang District, Hangzhou City, Zhejiang Province Applicant before: CRY SOUND CO.,LTD. |
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| CB02 | Change of applicant information | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |