CN109253800A - A kind of follow-on crystal Fourier transform spectrometer - Google Patents
A kind of follow-on crystal Fourier transform spectrometer Download PDFInfo
- Publication number
- CN109253800A CN109253800A CN201710566191.1A CN201710566191A CN109253800A CN 109253800 A CN109253800 A CN 109253800A CN 201710566191 A CN201710566191 A CN 201710566191A CN 109253800 A CN109253800 A CN 109253800A
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- China
- Prior art keywords
- amici prism
- wave plate
- crystal
- follow
- fourier transform
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- 239000013078 crystal Substances 0.000 title claims abstract description 46
- 230000003287 optical effect Effects 0.000 claims abstract description 30
- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 claims abstract description 20
- 238000003384 imaging method Methods 0.000 claims abstract description 20
- 239000000126 substance Substances 0.000 claims 2
- 230000000694 effects Effects 0.000 abstract description 4
- 238000001228 spectrum Methods 0.000 abstract description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
- G01J2003/2813—2D-array
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
- G01J2003/2816—Semiconductor laminate layer
Abstract
The invention discloses a kind of follow-on crystal Fourier transform spectrometers, it includes the etalon being sequentially arranged in spectrometer along paths direction, Amici prism, convergent mirror and imaging sensor, optical path sequentially passes through etalon, imaging sensor is projected to after Amici prism and convergent mirror, and optical image is generated by imaging sensor, it is mutually perpendicular to by the optical axis that N group crystal thickness wave plate and the N group crystal thickness wave plate that Amici prism two sides are arranged in respectively is arranged in the two sides on the light incident end face of Amici prism, wherein, be arranged in the N group crystal thickness wave plate of Amici prism two sides optical path difference be respectively Amici prism o light and 1 times of e light maximum optical path difference, 2 times, ..., N times and minus 1 times, minus 2 times, ..., negative N times, so that passing through etalon, Amici prism is matched with imaging sensor by point of spectrum Resolution improves 2N+1 times, so that the scanning better effect of spectrometer.
Description
Technical field
The present invention relates to optical instrument device field, especially a kind of follow-on crystal Fourier transform spectrometer.
Background technique
Resolution ratio possessed by the image effect that the imaging sensor of traditional crystal Fourier transform spectrometer generates compared with
To be undesirable, since optical instrument is in Scanning Detction, the detection image generated is finer in resolution ratio, then for inspection
For survey personnel, carrying out result judgement also will be more accurate, thus to traditional crystal Fourier transform spectrometer at
It is also become more and more important as resolution ratio is improved.
Summary of the invention
The purpose of the present invention is to provide a kind of implementations reliably, structure is simple and can effectively improve image detection resolution ratio
Follow-on crystal Fourier transform spectrometer.
In order to realize above-mentioned technical purpose, the technical solution of the present invention is as follows:
A kind of follow-on crystal Fourier transform spectrometer comprising be sequentially arranged in spectrometer along paths direction
Etalon, Amici prism, convergent mirror and imaging sensor, the two sides on the light incident end face of the Amici prism are each provided with
N group crystal thickness wave plate, wherein N >=1, and the optical axis of the N group crystal thickness wave plate that Amici prism two sides are arranged in is mutually perpendicular to,
The optical path is sequentially projected to imaging sensor after etalon, Amici prism and convergent mirror, and is given birth to by imaging sensor
At optical image.
Further, the Amici prism is Wollaston prism or Rochon prism.
As one of embodiment of etalon of the present invention, the etalon is step etalon, the step
The step of etalon is superimposed step by step along one side and is incremented to the opposite other side, and the step is M, wherein M >=1.
Further, the imaging sensor is two-dimensional CCD imaging sensor or cmos image sensor.
As one of embodiment of crystal thickness wave plate of the present invention, further, the crystal thickness wave plate is along light
Two side positions on the light incident end face stacked on top of each other that Amici prism is set of road direction.
As the another embodiment of crystal thickness wave plate of the present invention, the crystal thickness wave plate is along the side of Amici prism
Edge is bonded to each other two side positions for being placed on Amici prism to center position, wherein the crystal thickness wave plate for being bonded to each other placement is edge
Successively decrease step by step to center position in step-like at Amici prism edge.
Further, the optical path difference of the N group crystal thickness wave plate that Amici prism two sides are arranged in is respectively the o of Amici prism
1 times of light and e light maximum optical path difference, 2 times ..., N times and it is 1 times minus, 2 times minus ..., it is N times negative.
Using above-mentioned technical solution, the invention has the benefit that by the light incident end face of Amici prism
Two sides the optical axis of N group crystal thickness wave plate and the N group crystal thickness wave plate that Amici prism two sides are arranged in respectively be set mutually hang down
Directly, wherein the optical path difference that the N group crystal thickness wave plate of Amici prism two sides is arranged in is respectively the o light and e light maximum of Amici prism
1 times of optical path difference, 2 times ..., N times and it is 1 times minus, 2 times minus ..., it is N times negative so that passing through etalon, Amici prism and figure
The resolution ratio of spectrum is improved 2N+1 times as sensor matches, so that the scanning better effect of spectrometer.
Detailed description of the invention
The present invention is further elaborated with reference to the accompanying drawings and detailed description:
Fig. 1 is one of embodiment of apparatus of the present invention；
Fig. 2 is the another embodiment of apparatus of the present invention；
Fig. 3 is one of embodiment of the crystal thickness wave plate of the present invention on Amici prism；
Fig. 4 is another embodiment of the crystal thickness wave plate of the present invention on Amici prism.
Specific embodiment
As shown in Figure 1, the present invention includes the etalon 1 being sequentially arranged in spectrometer along paths direction, light splitting rib
Mirror 2, convergent mirror 3 and imaging sensor 4, it is thick that the two sides on the light incident end face of the Amici prism 2 are each provided with N group crystal
Wave plate (not shown), wherein N >=1, and the optical axis of the N group crystal thickness wave plate that 2 two sides of Amici prism are arranged in is mutually perpendicular to,
The optical path is sequentially projected to imaging sensor 4 after etalon 1, Amici prism 2 and convergent mirror 3, and by image sensing
Device 4 generates optical image.
Further, the Amici prism 2 can use Wollaston prism or Rochon prism.
Further, the imaging sensor 4 can be two-dimensional CCD imaging sensor or cmos image sensor.
Further, the optical path difference of the N group crystal thickness wave plate that 2 two sides of Amici prism are arranged in is respectively Amici prism
1 times of o light and e light maximum optical path difference, 2 times ..., N times and it is 1 times minus, 2 times minus ..., it is N times negative.
As shown in Fig. 2, one of embodiment as etalon 1 of the present invention, the etalon 1 is step standard
Tool, the step of the step etalon is superimposed step by step along one side is incremented to the opposite other side, and the step is M,
Middle M >=1, Amici prism 2 shown in Fig. 2, convergent mirror 3 and imaging sensor 4 are identical as structure shown in Fig. 1.
As shown in figure 3, one of embodiment as crystal thickness wave plate 21 of the present invention, further, the crystal
Thick wave plate 21 is two side positions on the optical path direction light incident end face stacked on top of each other that Amici prism 2 is arranged in.
As shown in figure 4, the another embodiment as crystal thickness wave plate 21 of the present invention, the crystal thickness wave plate 21 are
Two side positions for being placed on Amici prism 2 are bonded to each other to center position along the edge of Amici prism 2, wherein being bonded to each other placement
Crystal thickness wave plate 21 be to successively decrease step by step to center position in step-like along 2 edge of Amici prism.
The present invention uses above-mentioned technical solution, and N is respectively arranged by the two sides on the light incident end face of Amici prism
The optical axis of group crystal thickness wave plate and the N group crystal thickness wave plate that Amici prism two sides are arranged in is mutually perpendicular to, wherein setting exists
The optical path difference of the N group crystal thickness wave plate of Amici prism two sides is respectively the o light and 1 times of e light maximum optical path difference, 2 of Amici prism
Times ..., N times and it is 1 times minus, 2 times minus ..., it is N times negative so that being matched by etalon, Amici prism with imaging sensor
The resolution ratio of spectrum is improved 2N+1 times, so that the scanning better effect of spectrometer.
The foregoing is merely of the invention for example, for a person skilled in the art, religion according to the present invention
Lead, without departing from the principles and spirit of the present invention all equivalent changes done according to scope of the present invention patent, repair
Change, replacement and variant, is all covered by the present invention.
Claims (7)
1. a kind of follow-on crystal Fourier transform spectrometer, it is characterised in that: it includes sequentially setting along paths direction
Etalon, Amici prism, convergent mirror and imaging sensor in spectrometer are set, on the light incident end face of the Amici prism
Two sides be each provided with N group crystal thickness wave plate, wherein N >=1, and the N group crystal thickness wave plate that Amici prism two sides are set
Optical axis be mutually perpendicular to, the optical path is sequentially projected to imaging sensor after etalon, Amici prism and convergent mirror, and
Optical image is generated by imaging sensor.
2. a kind of follow-on crystal Fourier transform spectrometer according to claim 1, it is characterised in that: point
Light prism is Wollaston prism or Rochon prism.
3. a kind of follow-on crystal Fourier transform spectrometer according to claim 1, it is characterised in that: the mark
Quasi- tool is step etalon, and the step of the step etalon is superimposed step by step along one side is incremented to the opposite other side, described
Step be M, wherein M >=1.
4. a kind of follow-on crystal Fourier transform spectrometer according to claim 1, it is characterised in that: the figure
As sensor is two-dimensional CCD imaging sensor or cmos image sensor.
5. a kind of follow-on crystal Fourier transform spectrometer according to claim 1, it is characterised in that: the crystalline substance
Body thickness wave plate is two side positions on the optical path direction light incident end face stacked on top of each other that Amici prism is arranged in.
6. a kind of follow-on crystal Fourier transform spectrometer according to claim 1, it is characterised in that: the crystalline substance
Body thickness wave plate is to be bonded to each other two side positions for being placed on Amici prism to center position along the edge of Amici prism, wherein mutually
The crystal thickness wave plate that fitting is placed is to successively decrease step by step to center position in step-like along Amici prism edge.
7. a kind of follow-on crystal Fourier transform spectrometer according to claim 1, it is characterised in that: the setting
The optical path difference of the N group crystal thickness wave plate of Amici prism two sides be respectively Amici prism o light and 1 times of e light maximum optical path difference,
2 times ..., N times and it is 1 times minus, 2 times minus ..., it is N times negative.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710566191.1A CN109253800B (en) | 2017-07-12 | 2017-07-12 | Improved crystal Fourier transform spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710566191.1A CN109253800B (en) | 2017-07-12 | 2017-07-12 | Improved crystal Fourier transform spectrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109253800A true CN109253800A (en) | 2019-01-22 |
| CN109253800B CN109253800B (en) | 2021-11-02 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710566191.1A Expired - Fee Related CN109253800B (en) | 2017-07-12 | 2017-07-12 | Improved crystal Fourier transform spectrometer |
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| Country | Link |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101008685A (en) * | 2007-01-19 | 2007-08-01 | 华东师范大学 | Color-recombination glass prism |
| CN101251484A (en) * | 2008-04-10 | 2008-08-27 | 中国科学院长春光学精密机械与物理研究所 | Miniature fourier transform spectrometer based on modulation |
| CN102052902A (en) * | 2010-12-10 | 2011-05-11 | 天津大学 | High-precision wide-range low-coherent interference shift demodulation device and demodulation method thereof |
| US20120120231A1 (en) * | 2010-11-15 | 2012-05-17 | Fujitsu Limited | Electromagnetic wave imaging apparatus |
| CN104729403A (en) * | 2015-03-30 | 2015-06-24 | 北方民族大学 | Multiple-beam step type plane reflecting mirror laser interferometer and measurement method thereof |
| CN106595858A (en) * | 2015-10-20 | 2017-04-26 | 南京理工大学 | Hyperspectral imaging device and method based on field-of-view gradient modulation interference |
-
2017
- 2017-07-12 CN CN201710566191.1A patent/CN109253800B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101008685A (en) * | 2007-01-19 | 2007-08-01 | 华东师范大学 | Color-recombination glass prism |
| CN101251484A (en) * | 2008-04-10 | 2008-08-27 | 中国科学院长春光学精密机械与物理研究所 | Miniature fourier transform spectrometer based on modulation |
| US20120120231A1 (en) * | 2010-11-15 | 2012-05-17 | Fujitsu Limited | Electromagnetic wave imaging apparatus |
| CN102052902A (en) * | 2010-12-10 | 2011-05-11 | 天津大学 | High-precision wide-range low-coherent interference shift demodulation device and demodulation method thereof |
| CN104729403A (en) * | 2015-03-30 | 2015-06-24 | 北方民族大学 | Multiple-beam step type plane reflecting mirror laser interferometer and measurement method thereof |
| CN106595858A (en) * | 2015-10-20 | 2017-04-26 | 南京理工大学 | Hyperspectral imaging device and method based on field-of-view gradient modulation interference |
Non-Patent Citations (1)
| Title |
|---|
| ANTOINE LACAN 等: "A static Fourier transform spectrometer for atmospheric sounding: concept and experimental implementation", 《OPTICS EXPRESS》 * |
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Granted publication date: 20211102 |