CN109238141A - A kind of chip pin Systems for optical inspection - Google Patents

A kind of chip pin Systems for optical inspection Download PDF

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Publication number
CN109238141A
CN109238141A CN201811106749.9A CN201811106749A CN109238141A CN 109238141 A CN109238141 A CN 109238141A CN 201811106749 A CN201811106749 A CN 201811106749A CN 109238141 A CN109238141 A CN 109238141A
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CN
China
Prior art keywords
chip
optically focused
sliding slot
chip pin
slide rail
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Granted
Application number
CN201811106749.9A
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Chinese (zh)
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CN109238141B (en
Inventor
秦海军
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Mianyang Ding Fei Electronic Technology Co Ltd
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Mianyang Ding Fei Electronic Technology Co Ltd
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Priority to CN201811106749.9A priority Critical patent/CN109238141B/en
Publication of CN109238141A publication Critical patent/CN109238141A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

The invention discloses a kind of chip pin Systems for optical inspection, including chip transmitter, slide rail, optically focused room, and imaging lens, the top of slide rail is arranged in the chip transmitter, sliding slot is equipped with along slide rail direction on slide rail, optically focused room is fixed on slide rail, sliding slot from optically focused room two sides pass through, the optically focused room two sides passed through by sliding slot are equipped with port, port is equipped with liftable barn door, scalable stopper is equipped with being located at the indoor sliding slot bottom of optically focused, chip slides along the chute to be blocked in above scalable stopper, in optically focused room, the one side of face sliding slot is equipped with imaging mouth, it is imaged outside mouth and is equipped with imaging lens, imaging lens pass through imaging mouth face chip and chip pin, several spotlights are equipped with around chip pin in optically focused chamber interior walls.It is detected in application, can carry out automation optical imagery to chip pin, is improved detection efficiency, and unique lighting system is arranged, is improved quality of optical imaging.

Description

A kind of chip pin Systems for optical inspection
Technical field
The present invention relates to field of optical detection, and in particular to a kind of chip pin Systems for optical inspection.
Background technique
Chip needs to detect its pin after packaging is accomplished, judge all pins whether marshalling, with determination Whether chip is defective products.Existing packaged chip to carry out coplanarity inspection to relevant pins mainly by detection microscope It surveys, to judge whether the chip pin of same row, same row are in same plane, whether the spacing between chip pin is qualified, Its detection process low efficiency, time-consuming, and is affected by human factors larger, is easy to appear detection error.
Summary of the invention
The present invention is in view of the deficienciess of the prior art, provide a kind of chip pin Systems for optical inspection, in application, can To carry out automation optical imagery detection to chip pin, improve detection efficiency, and unique lighting system is set, improves optics Image quality.
The invention is realized by the following technical scheme:
A kind of chip pin Systems for optical inspection, including chip transmitter, slide rail, optically focused room, chip and imaging lens The top of slide rail is arranged in head, the chip transmitter, is equipped with sliding slot along slide rail direction on slide rail, sliding It is connected to inside slot and chip transmitter, optically focused room is fixed on slide rail, is located at the lower section of chip transmitter, by one section of cunning Dynamic guide rail closing, sliding slot from optically focused room two sides pass through, the optically focused room two sides passed through by sliding slot are equipped with port, and port is located at sliding slot Top, and liftable barn door is equipped on port, scalable stopper, chip are equipped with being located at the indoor sliding slot bottom of optically focused Slide and be blocked in above scalable stopper along the chute, the chip pin on chip extends perpendicularly out outside sliding slot, optically focused room just Imaging mouth is equipped with to the one side of sliding slot, mouth face chip and chip pin is imaged, is equipped with imaging lens, imaging lens outside imaging mouth Head is connect with computer, and imaging lens are set on two sidewalls in optically focused room in pairs by imaging mouth face chip and chip pin It is equipped with spotlight, the position of spotlight is higher than the top of chip pin, and the outside of spotlight is surrounded by arch optically focused shell, and arch is poly- Bare hull is equipped with light beam cylinder and the second beam light cylinder, and light beam cylinder and the second beam light cylinder connect with inside arch optically focused shell It is logical, the chip pin top of its place side of the exit portal face of light beam cylinder, second its opposite side of beam light cylinder exit portal face The central axes of chip pin top, light beam cylinder and the second beam light cylinder respectively with its corresponding to chip pin central axes at 45 °~60 ° angles.
, in application, chip to be checked in chip transmitter is slided in a manner of outwardly along the chute by chip pin, quilt can be stretched for it Contracting stopper is blocked in optically focused room, and the liftable barn door on port, which is fallen, closes sliding slot, and optically focused room is made to form one only Profit retention is as the sealing chamber of mouth, and the indoor spotlight of optically focused passes through arch optically focused shell, light beam cylinder/second beam light cylinder optically focused is made Direct projection is carried out to the pin top of chip two sides respectively with rear, the reflected light on chip pin is connect by imaging mouth by imaging lens Receive, as a result, imaging lens can by imaging mouth to all chip pins carry out Image Acquisition, and due in optically focused room by outer Light interference in portion's is less, and the reflected light of chip pin is stronger, so the image quality of imaging lens is higher, detection can be improved Image transmitting to computer is carried out rapid image recognition detection after the completion by accuracy, imaging lens Image Acquisition, and detection finishes Afterwards, liftable barn door rises, and scalable stopper retracts, and chip skids off optically focused room along the chute, is further processed, and core And then next chip to be checked is skidded off in piece transmitter to optically focused room, is successively automatically detected in this way, saves manpower The link of participation effectively improves the detection efficiency of chip pin, and by multiple it is demonstrated experimentally that when light beam cylinder and second The central axes of beam light cylinder respectively with its corresponding to chip pin central axes it is at 45 °~60 ° of angles when, chip pin top is anti- The final imaging quality highest of light is penetrated, imaging effect is best, can effectively improve the accuracy of detection.
Preferably, the appearance of the optically focused room, liftable barn door, scalable stopper and slide rail is coated with black Color coating makes in optically focused room in addition to chip pin all darkly in application, light extra in optically focused room can effectively be absorbed Color background, the reflected light from chip pin for as far as possible receiving imaging lens improve the detection accuracy of chip pin.
Preferably, piston graphite anti-friction coating is coated in the sliding slot, in application, chip and sliding slot can be effectively reduced Friction, reduce the abrasion of chip.
Preferably, infrared transmitter and red is respectively equipped on the slide rail between chip transmitter and optically focused room Outer receiver, infrared transmitter and infrared remote receiver are arranged across sliding slot face, in application, chip, which slips over, can stop infrared connect It receives device to receive the signal of infrared transmitter, has determined that chip slips over this, can be used for counting the chip slipped over, Simultaneously when infrared transmitter and infrared remote receiver, which are determined with chip, to be slipped over, scalable stopper will be from the stretching pair of sliding slot bottom Chip, which is formed, to be stopped.
Preferably, it is equipped with selection in movable guide rail and intercepts block to movable guide rail is connected in the bottom end of slide rail, it is living The side of dynamic formula guide rail is equipped with pushing meanss, is connected between movable guide rail and pushing meanss by catch bar, is led movable The back side of rail is equipped with cross track, is respectively equipped with qualified chip collector in the bottom end of movable guide rail and unqualified chip is collected Device, by the promotion of catch bar, movable guide rail can be respectively moved to qualified chip collector and unqualified on cross track Right above chip collector, in application, the chip after detection slides on movable guide rail, select to intercept if its detection is qualified Block not intercepts, and chip directly slides into qualified chip collector, if its detection is unqualified, interception block is selected to block chip It cuts, movable guide rail moves to above unqualified chip collector, and selection intercepts block and decontrols, and chip slides into unqualified chip and collects Device, then movable guide rail is kept in the center, and can effectively improve unqualified chip in this way sifts out efficiency.
Preferably, receiving element, receiving element and work are equipped on the qualified chip collector and unqualified chip collector Dynamic formula guide rail forms docking, convenient to be collected to chip.
Preferably, the pushing meanss are air pressure pushing meanss, easy to use, fast response time.
Preferably, it is coated with reflecting coating on the inner wall of the arch optically focused shell, light beam cylinder and the second beam light cylinder, In application, the uptake and dispersion effect for the light that material issues spotlight can be reduced, effectively enhance the light intensity of the light projected, Promote the optical imaging effect of chip pin.
Preferably, the imaging lens are CCD camera lens, and high resolution is formed by image and is convenient for chip pin Coplanarity detection, improve the accuracy of detection.
Preferably, the height of the port setting is higher than the height of chip pin when chip is slipped over out of sliding slot, can make Chip after detection is smoothly skidded off out of optically focused room.
The present invention has the advantage that and the utility model has the advantages that
1, a kind of chip pin Systems for optical inspection of the present invention can carry out automation optical imagery inspection to chip pin It surveys, saves the link of manpower participation, improve detection efficiency.
2, unique lighting system is arranged in a kind of chip pin Systems for optical inspection of the present invention, improves quality of optical imaging, Improve detection accuracy.
3, a kind of chip pin Systems for optical inspection of the present invention, can will test underproof chip automatic screening and come out, It is collected, in case subsequent processing.
Detailed description of the invention
Attached drawing described herein is used to provide to further understand the embodiment of the present invention, constitutes one of the application Point, do not constitute the restriction to the embodiment of the present invention.In the accompanying drawings:
Fig. 1 is the structural diagram of the present invention;
Fig. 2 is the top view of optically focused room of the invention and imaging lens part;
Fig. 3 is the cross-sectional view of optically focused room of the invention and imaging lens part;
Fig. 4 is the structural schematic diagram of arch optically focused shell parts of the invention;
Fig. 5 is the structural schematic diagram of movable rail sections of the invention;
Fig. 6 is chip pin imaging schematic diagram of the invention.
Label and corresponding parts title in attached drawing:
1- chip transmitter, 2- slide rail, 3- sliding slot, 4- optically focused room, 5- infrared transmitter, 6- infrared remote receiver, 7- Mouth is imaged in scalable stopper, 8-, and 9- imaging lens, 10- spotlight, 11- chip, 12- chip pin, 13- port, 14- can Barn door, the movable guide rail of 15- are gone up and down, 16- selection intercepts block, 17- cross track, 18- pushing meanss, 19- catch bar, 20- Receiving element, 21- qualified chip collector, the unqualified chip collector of 22-, 23- arch optically focused shell, 24- light beam cylinder, 25- Second beam light cylinder.
Specific embodiment
To make the objectives, technical solutions, and advantages of the present invention clearer, below with reference to embodiment and attached drawing, to this Invention is described in further detail, and exemplary embodiment of the invention and its explanation for explaining only the invention, are not made For limitation of the invention.
Embodiment 1
As shown in Figs 1-4, a kind of chip pin Systems for optical inspection, including chip transmitter 1, slide rail 2, optically focused room 4, the top of slide rail 2 is arranged in chip 11 and imaging lens 9, the chip transmitter 1, along cunning on slide rail 2 Dynamic 2 direction of guide rail is equipped with sliding slot 3, is connected to inside sliding slot 3 and chip transmitter 1, optically focused room 4 is fixed on slide rail 2, position In the lower section of chip transmitter 1, one section of slide rail 2 is closed, sliding slot 3 from 4 two sides of optically focused room pass through, passed through by sliding slot 3 4 two sides of optically focused room be equipped with port 13, port 13 is located at the top of sliding slot 3, and equipped with liftable barn door 14 on port 13, 3 bottom of sliding slot in optically focused room 4 is equipped with scalable stopper 7, and chip 11 3 slides along the chute and is blocked in scalable blocking Above block 7, the chip pin 12 on chip 11 is extended perpendicularly out outside sliding slot 3, and in optically focused room, the one side of 4 face sliding slot 3 is equipped with imaging 8 face chip 11 of mouth and chip pin 12 is imaged in mouth 8, is imaged outside mouth 8 and is equipped with imaging lens 9, imaging lens 9 and computer Connection, imaging lens 9 have been arranged in pairs on two sidewalls in optically focused room 4 by imaging 8 face chip 11 of mouth and chip pin 12 Spotlight 10, the position of spotlight 10 are higher than the top of chip pin 12, and the outside of spotlight 10 is surrounded by arch optically focused shell 23, Arch optically focused shell 23 is equipped with light beam cylinder 24 and the second beam light cylinder 25, light beam cylinder 24 and the second beam light cylinder 25 with arch It is connected to inside shape optically focused shell 23,12 top of chip pin of its place side of the exit portal face of light beam cylinder 24, the second beam light 12 top of chip pin of 25 its opposite side of exit portal face of cylinder, the central axes of light beam cylinder 24 and the second beam light cylinder 25 respectively with The central axes of chip pin 12 corresponding to it are at 45 °~60 ° of angles.
Embodiment 2
As shown in figure 5, being equipped with selection in movable guide rail 15 to movable guide rail 15 is connected in the bottom end of slide rail 2 Block 16 is intercepted, the side of movable guide rail 15 is equipped with pushing meanss 18, by pushing away between movable guide rail 15 and pushing meanss 18 Lever 19 connects, and is equipped with cross track 17 at the back side of movable guide rail 15, is respectively equipped with conjunction in the bottom end of movable guide rail 15 Lattice chip collector 21 and unqualified chip collector 22, by the promotion of catch bar 19, movable guide rail 15 can be in transverse rails It is respectively moved on road 17 right above qualified chip collector 21 and unqualified chip collector 22,21 He of qualified chip collector Receiving element 20 is equipped on unqualified chip collector 22, receiving element 20 is docked with the formation of movable guide rail 15.
Embodiment 3
As shown in fig. 6, being presented in a manner of luminous point by 12 image of chip pin collected of imaging lens 9, pass through foundation Each light spot position of coordinate pair is analyzed, determine same row, same row luminous point whether on the same line, and measure each chip The coplanarity and pin spacing detection of chip pin 12 can be thus rapidly completed in spacing between pin 2.
Embodiment 4
When carrying out the detection of chip pin 12 using the detection device, device is placed in the weaker environment of extraneous light as far as possible In, to reduce the external disturbing rays of imaging lens 9 at work, the imaging definition of chip pin 12 is improved, and then improve Detect accuracy;Slide rail 2 is arranged to horizontal by certain angle, so that chip 11 can lean on certainly in sliding slot 3 Body gravity slides, and may dispense with power transmission link in this way, saves the energy.
Embodiment 5
The imaging mouth 8 should not be too large, only need can make all chip pins 12 by imaging mouth 8 in imaging lens 9 at As the distance of 9 range Imaging mouth 8 of imaging lens is arranged in the range of 5-20cm, can both prevent because of imaging lens in this way First 9 from imaging mouth 8 compared with close and caused by 10 light of spotlight too strong influence image quality the problem of, and will not be because of imaging lens 9 lead to chip pin 12 farther out the imaging is not clear from imaging mouth 8, and light beam cylinder 24 and the second beam light cylinder 25 should not be reached into As mouth 8 drop shadow spread in, in order to avoid influence chip pin 12 imaging effect.
Embodiment 6
Chip transmitter 1, infrared transmitter 5, infrared remote receiver 6, scalable stopper 7, imaging lens 9, liftable hide Tabula rasa 14, selection intercept block 16 and pushing meanss 18 are attached with computer, and unified process control is carried out by computer System, efficiently to complete the detection of chip pin 12.
Above-described specific embodiment has carried out further the purpose of the present invention, technical scheme and beneficial effects It is described in detail, it should be understood that being not intended to limit the present invention the foregoing is merely a specific embodiment of the invention Protection scope, all within the spirits and principles of the present invention, any modification, equivalent substitution, improvement and etc. done should all include Within protection scope of the present invention.

Claims (10)

1. a kind of chip pin Systems for optical inspection, which is characterized in that including chip transmitter (1), slide rail (2), optically focused Room (4), chip (11) and imaging lens (9), the chip transmitter (1) are arranged on the top of slide rail (2), lead in sliding Sliding slot (3) are equipped with along slide rail (2) direction on rail (2), are connected to inside sliding slot (3) and chip transmitter (1), optically focused room (4) it is fixed on slide rail (2), is located at the lower section of chip transmitter (1), one section of slide rail (2) is closed, sliding slot (3) from optically focused room (4) two sides pass through, optically focused room (4) two sides passed through by sliding slot (3) be equipped with port (13), port (13) position Liftable barn door (14) are equipped with above sliding slot (3), and on port (13), at sliding slot (3) bottom being located in optically focused room (4) Portion is equipped with scalable stopper (7), and chip (11) is slided and is blocked in above scalable stopper (7) along the chute (3), chip (11) chip pin (12) on extends perpendicularly out sliding slot (3) outside, is equipped with imaging mouth in the one side of optically focused room (4) face sliding slot (3) (8), mouth (8) face chip (11) and chip pin (12) is imaged, is equipped with imaging lens (9) outside imaging mouth (8), imaging lens (9) it is connect with computer, imaging lens (9) are by imaging mouth (8) face chip (11) and chip pin (12), in optically focused room (4) it has been arranged in pairs on interior two sidewalls spotlight (10), the position of spotlight (10) is higher than the top of chip pin (12), optically focused The outside of lamp (10) is surrounded by arch optically focused shell (23), and arch optically focused shell (23) is equipped with light beam cylinder (24) and the second beam light Cylinder (25), light beam cylinder (24) and the second beam light cylinder (25) are connected to arch optically focused shell (23) inside, light beam cylinder (24) chip pin (12) top of its place side of exit portal face, the core of second beam light cylinder (25) its opposite side of exit portal face The central axes of piece pin (12) top, light beam cylinder (24) and the second beam light cylinder (25) respectively with its corresponding to chip pin (12) central axes are at 45 °~60 ° of angles.
2. a kind of chip pin Systems for optical inspection according to claim 1, which is characterized in that the optically focused room (4), can The appearance of lifting barn door (14), scalable stopper (7) and slide rail (2) is coated with black coating.
3. a kind of chip pin Systems for optical inspection according to claim 1, which is characterized in that applied in the sliding slot (3) There is piston graphite anti-friction coating.
4. a kind of chip pin Systems for optical inspection according to claim 1, which is characterized in that be located at chip transmitter (1) infrared transmitter (5) and infrared remote receiver (6), infrared hair are respectively equipped on the slide rail (2) between optically focused room (4) Emitter (5) and infrared remote receiver (6) are arranged across sliding slot (3) face.
5. a kind of chip pin Systems for optical inspection according to claim 1, which is characterized in that in slide rail (2) Bottom end is equipped with selection and intercepts block (16) to being connected to movable guide rail (15) in movable guide rail (15), movable guide rail (15) Side is equipped with pushing meanss (18), is connect between movable guide rail (15) and pushing meanss (18) by catch bar (19), in work The back side of dynamic formula guide rail (15) is equipped with cross track (17), is respectively equipped with qualified chip in the bottom end of movable guide rail (15) and collects Device (21) and unqualified chip collector (22), by the promotion of catch bar (19), movable guide rail (15) can be in cross track (17) it is respectively moved on right above qualified chip collector (21) and unqualified chip collector (22).
6. a kind of chip pin Systems for optical inspection according to claim 1, which is characterized in that the qualified chip is collected It is equipped with receiving element (20) on device (21) and unqualified chip collector (22), receiving element (20) and movable guide rail (15) are formed Docking.
7. a kind of chip pin Systems for optical inspection according to claim 1, which is characterized in that the pushing meanss (18) For air pressure pushing meanss.
8. a kind of chip pin Systems for optical inspection according to claim 1, which is characterized in that the arch optically focused shell (23), reflecting coating is coated on the inner wall of light beam cylinder (24) and the second beam light cylinder (25).
9. a kind of chip pin Systems for optical inspection according to claim 1, which is characterized in that the imaging lens (9) For CCD camera lens.
10. a kind of chip pin Systems for optical inspection according to claim 1, which is characterized in that the port (13) sets The height set is higher than the height of chip pin (12) when chip (11) are slipped over out of sliding slot (3).
CN201811106749.9A 2018-09-21 2018-09-21 Chip pin optical detection system Active CN109238141B (en)

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Application Number Priority Date Filing Date Title
CN201811106749.9A CN109238141B (en) 2018-09-21 2018-09-21 Chip pin optical detection system

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110849281A (en) * 2019-11-13 2020-02-28 江苏鲁汶仪器有限公司 Aperture gauge capable of realizing automatic closed-loop control of optical system and measurement method
US20220274221A1 (en) * 2019-10-25 2022-09-01 Vitaly Tsukanov Systems for Blade Sharpening and Contactless Blade Sharpness Detection

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10153413A (en) * 1996-11-21 1998-06-09 M C Electron Kk Appearance and dimension inspection device for ic lead
JPH10160430A (en) * 1996-11-29 1998-06-19 Precision:Kk Device for inspecting container for appearance on conveyor line
CN1929087A (en) * 2005-09-08 2007-03-14 东京威尔斯股份有限公司 Appearance detection device
CN101382501A (en) * 2007-09-05 2009-03-11 Aju高技术公司 Automatic optical detection device and method
CN103322915A (en) * 2013-06-27 2013-09-25 青岛歌尔声学科技有限公司 Tester measuring chip pin number and pin separation space and measuring method thereof

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10153413A (en) * 1996-11-21 1998-06-09 M C Electron Kk Appearance and dimension inspection device for ic lead
JPH10160430A (en) * 1996-11-29 1998-06-19 Precision:Kk Device for inspecting container for appearance on conveyor line
CN1929087A (en) * 2005-09-08 2007-03-14 东京威尔斯股份有限公司 Appearance detection device
CN101382501A (en) * 2007-09-05 2009-03-11 Aju高技术公司 Automatic optical detection device and method
CN103322915A (en) * 2013-06-27 2013-09-25 青岛歌尔声学科技有限公司 Tester measuring chip pin number and pin separation space and measuring method thereof

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
刘建峰: "基于机器视觉的IC芯片外观检测系统", 《电子制作》 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220274221A1 (en) * 2019-10-25 2022-09-01 Vitaly Tsukanov Systems for Blade Sharpening and Contactless Blade Sharpness Detection
US11904428B2 (en) * 2019-10-25 2024-02-20 Vitaly Tsukanov Systems for blade sharpening and contactless blade sharpness detection
CN110849281A (en) * 2019-11-13 2020-02-28 江苏鲁汶仪器有限公司 Aperture gauge capable of realizing automatic closed-loop control of optical system and measurement method

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