CN109211981A - The probe calibration method, apparatus and TDS detector of TDS detector - Google Patents
The probe calibration method, apparatus and TDS detector of TDS detector Download PDFInfo
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Abstract
The invention discloses a kind of probe calibration method, apparatus of TDS detector, TDS detector and storage mediums to determine total dissolved solidss TDS theoretical value of the TDS detector with respect to detected solution by the conductivity according to detected solution；According to TDS theoretical value and detected solution TDS actual value, probe calibration coefficient is calculated；According to the technical solution that probe of the probe calibration coefficient to TDS detector is calibrated, solve two detection probes in TDS detector it is inconsistent when, cause TDS detection the problem of error occur, improve the detection accuracy of TDS detector.
Description
Technical field
The present embodiments relate to field of measuring technique more particularly to a kind of probe calibration methods of TDS detector, dress
It sets, TDS detector and storage medium.
Background technique
Water is Source of life, but as the development environment of social economy pollutes increasingly severe, the wherein pollution of water resource
The most serious, the status of water quality is more paid close attention to by everybody, the detection to water quality, guarantees product quality and people's health
Just there is extremely important meaning.The quality of water quality is embodied in the total solids content being dissolved in the water.
Total dissolved solidss (Total dissolved solids, abridge TDS), also known as dissolvability solid amount, measurement are single
Position be mg/litre ((mg/L), it show to contain in 1 liter of water in other words in 1 liter of water dissolved with how many milligrams of soluble solids from
Sub- total amount.TDS value is higher, indicates that the dissolved matter contained in water is more.Total dissolved solidss refer to the total amount of whole solutes in water, including
The content of both inorganic matter and organic matter.
TDS detector in use, causes to wear or corrode, lead to TDS because being used for multiple times to detection probe
There is error in detection.In addition, in the production process of TDS detection probe, since the limitation of production technology cannot be guaranteed that TDS is detected
Two detection probes in instrument are completely the same, and TDS detection is caused error occur.
Summary of the invention
The present invention provides probe calibration method, apparatus, TDS detector and the storage medium of a kind of TDS detector, solves
When two detection probes in TDS detector are inconsistent, TDS detection is caused the problem of error occur.
In a first aspect, a kind of probe calibration method of TDS detector of the embodiment of the present invention, TDS detection circuit includes: first
Probe, the second probe, first resistor and second resistance, which comprises
According to the conductivity of detected solution, the total dissolved solidss TDS of the relatively described detected solution of the TDS detector is determined
Theoretical value；
According to TDS theoretical value and the detected solution TDS actual value, probe calibration coefficient is calculated；
It is calibrated according to probe of the probe calibration coefficient to the TDS detector.
Second aspect, the embodiment of the invention also provides a kind of probe correcting device of TDS detector, TDS detection circuits
It include: that the first probe, the second probe, first resistor and second resistance, described device include:
First determining module, for the conductivity according to detected solution, determine the TDS detector relatively it is described be tested it is molten
The total dissolved solidss TDS theoretical value of liquid；
Computing module, for calculating probe calibration coefficient according to TDS theoretical value and the detected solution TDS actual value；
Calibration module, for being calibrated according to probe of the probe calibration coefficient to the TDS detector.
The third aspect, the embodiment of the invention also provides a kind of TDS survey meters, comprising: memory, TDS detection circuit, control
Making sheet and TDS probe,
The control panel pops one's head in the memory, the TDS detection circuit and the TDS connect respectively；
The external TDS detection circuit of the TDS probe；
The memory, for storing one or more programs；
When one or more of programs are executed by one or more of control panels, so that the control panel realizes such as the
The probe calibration method of TDS detector described in one side.
Fourth aspect, it is described the embodiment of the invention also provides a kind of storage medium comprising computer executable instructions
Computer executable instructions are examined when being executed by computer processor for executing TDS as claimed in any one of claims 1 to 5 such as
Survey the probe calibration method of instrument.
Probe calibration method, apparatus, TDS detector and the storage medium of TDS detector provided by the above embodiment, pass through
According to the conductivity of detected solution, total dissolved solidss TDS theoretical value of the TDS detector with respect to detected solution is determined；It is managed according to TDS
By value and detected solution TDS actual value, probe calibration coefficient is calculated；According to probe calibration coefficient to the probe of TDS detector into
The technical solution of row calibration, solve two detection probes in TDS detector it is inconsistent when, cause TDS detection error occur
The problem of, improve the detection accuracy of TDS detector.
Detailed description of the invention
Fig. 1 is the flow chart of the probe calibration method of the TDS detector in the embodiment of the present invention one；
Fig. 1 a is the structural schematic diagram of the TDS detection circuit in the embodiment of the present invention one；
Fig. 2 is the flow chart of the probe calibration method of the TDS detector in the embodiment of the present invention two；
Fig. 3 is the structural schematic diagram of the probe correcting device of the TDS detector in the embodiment of the present invention three；
Fig. 4 is a kind of structural schematic diagram for server that the embodiment of the present invention four provides.
Specific embodiment
The present invention is described in further detail with reference to the accompanying drawings and examples.It is understood that this place is retouched
The specific embodiment stated is used only for explaining the present invention rather than limiting the invention.It also should be noted that in order to just
Only the parts related to the present invention are shown in description, attached drawing rather than entire infrastructure.
Embodiment one
Fig. 1 is the flow chart of the probe calibration method of the TDS detector in the embodiment of the present invention one, and the present embodiment is applicable
In the probe situation of calibration TDS detector, this method can be executed by the probe calibration of TDS detector, the TDS detector
Probe correcting device can be realized by way of software and/or hardware, in embodiment, set the probe calibration of TDS detector
Device is integrated in TDS detector, i.e. the probe calibration method of calibration TDS detector is executed by TDS detector.
In the present embodiment, TDS detector specifically refers to the TDS value for detecting solution, with the degree of purity of evaluating water quality
Instrument.TDS detection is mainly realized by the circuit in TDS detector.Fig. 1 a is the TDS detection in the embodiment of the present invention one
The structural schematic diagram of circuit, as shown in Figure 1a, TDS detection circuit include: the first probe P1, the second probe P2, first resistor R1
With second resistance R2.First probe P1 passes through the by first resistor R1 access the first driving signal Drive-P, the second probe P2
Two resistance R2 access the second driving signal Drive-N.Further, the first driving signal Drive-P and the second driving signal
Drive-N refers to high level signal or low level signal within a preset period of time.Further, the first driving signal Drive-
P and the second driving signal Drive-N has signal generation apparatus generation, does not limit the type of signal device in the present embodiment
It is fixed, it can to generate the signal generation apparatus of low and high level signal.Further, the first driving signal Drive-P is height
When level signal, the second driving signal Drive-N is low level signal；When first driving signal Drive-P is low level signal,
Second driving signal Drive-N is high level signal.Further, the first probe P1 connects control panel by filter circuit 101
102.Filter circuit 101 includes that 3rd resistor R3 and first capacitor C1, the first probe P1 pass through 3rd resistor R3 connection control panel
102, and the first probe P1 is grounded by 3rd resistor R3 and first capacitor C1.Wherein, 3rd resistor R3 is current-limiting resistance, the
One capacitor C1 is capacitor of uncoupling.
As shown in Figure 1, the probe calibration method of TDS detector provided in this embodiment, mainly includes the following steps:
S110, the conductivity according to detected solution determine that TDS detector is managed with respect to the total dissolved solidss TDS of detected solution
By value.
In the present embodiment, detected solution refers to the solution measured for realizing the calibration popped one's head in TDS detector.Electricity
Conductance is the ability of numerically solution conduction electric current, and commonly used in characterizing the degree of purity of water, conductivity value is smaller, and water is purer
Only.The conductivity of detected solution refers to the ability of detected solution conduction electric current.Further, detected solution, which can be, is pre-configured with
85PPM the 850PPM solution of good standard.
Further, in the present embodiment, the conductivity of detected solution can use high-precision conductivity measuring instrument,
It can also be measured using the conductivity measuring apparatus built in TDS detector.
TDS theoretical value refers to the TDS value being calculated according to the conversion relation between conductivity and TDS theoretical value.Into one
Step, in the data relationship table of pre-stored conductivity and TDS theoretical value, search the corresponding conversion of detected solution conductivity
Coefficient calculates TDS theoretical value according to the conductivity of detected solution and conversion coefficient.
S120, according to TDS theoretical value and detected solution TDS actual value, calculate probe calibration coefficient.
In the present embodiment, TDS actual value refers to the TDS value of detected solution that TDS detector test goes out and shown.
Probe calibration coefficient refers to the coefficient calibrated for the probe to TDS detector so that TDS detector have it is higher
Precision improves the accuracy of measurement.
Further, in the present embodiment, probe calibration coefficient is the quotient of detected solution TDS actual value and TDS theoretical value.
Further, in order to which S110 and S120 can be repeated several times in the calibration accuracy for improving TDS detector, multiple spies are obtained
Head calibration factor calculates the average value of multiple probe calibration coefficients as optimal probe calibration coefficient, carries out to TDS detector
Calibration.
Further, TDS detector is placed in the solution of standard 85PPM, according to the above method, calculates the first probe school
Quasi- coefficient；TDS detector is put into the solution of standard 850PPM, according to the above method, calculates the second probe calibration coefficient, meter
The average value of the first probe calibration coefficient and the second probe calibration coefficient is calculated as probe calibration coefficient.It should be noted that
Under ideal measuring state, the probe calibration coefficient of different solutions is identical.But due to TDS detection manufacture craft, be tested it is molten
The factor of the various aspects such as the mobility of liquid, may cause the probe calibration coefficients of different solutions, there are errors.In order to reduce probe
The error of calibration factor can take multiple measurements the probe calibration coefficient for averaging or repeatedly measuring not same solution
It averages later.
S130, it is calibrated according to probe of the probe calibration coefficient to TDS detector.
In the present embodiment, TDS detector itself can be calibrated according to probe calibration coefficient, can also will be popped one's head in
Calibration factor is for calibrating other TDS detectors.
When the probe calibration coefficient in S110 and S120 is practical according to the conductivity and TDS of technical grade TDS instrument measurement
When value, when being used to calibrate regular grade TDS detector for the calibration factor that technical grade TDS detector calculates, it can increase substantially
The detection accuracy of regular grade TDS detector, it might even be possible to make the testing result and technical grade TDS instrument of regular grade TDS detector
Measurement result it is consistent.
In the present embodiment, calibration is carried out according to probe of the probe calibration coefficient to TDS detector to refer to TDS detector
The TDS value and probe calibration coefficient of acquisition carry out the operation of certain rule, to obtain more accurate TDS value.
The probe calibration method of TDS detector provided in this embodiment is determined by the conductivity according to detected solution
Total dissolved solidss TDS theoretical value of the TDS detector with respect to detected solution；According to TDS theoretical value and detected solution TDS actual value,
Calculate probe calibration coefficient；According to the technical solution that probe of the probe calibration coefficient to TDS detector is calibrated, solve
When two detection probes in TDS detector are inconsistent, cause TDS detection the problem of error occur, improve TDS detector
Detection accuracy.
Embodiment two
Fig. 2 is the flow chart of the probe calibration method of the TDS detector in the embodiment of the present invention two；The present embodiment is applicable
In calibrate TDS detector probe the case where, the present embodiment has advanced optimized the probe calibration method of TDS detector, such as Fig. 2
Shown, the probe calibration method of the TDS detector after optimization mainly includes the following steps:
S210, when TDS detector is placed in detected solution, obtain the first probe of TDS detector circuit voltage accumulation
Value and voltage peak.
In the present embodiment, TDS detector detected solution is placed in refer to the first probe of TDS detector and the second spy
Needle is placed in detected solution.Voltage accumulation value is the cumulative of the first voltage value of the first probe and the second voltage value of the first probe
Value, the first voltage value is the voltage value of the first probe when first resistor connects high level signal and second resistance connects low level signal,
Second voltage value is the voltage value of the first probe when first resistor connects low level signal and second resistance connects high level signal, voltage
Peak is the ceiling voltage that the first probe allows to apply.
It is placed in detected solution in TDS detector, and after pressing calibration knob, the signal hair built in TDS detector
Raw device generates driving signal.As shown in Figure 1a, the first driving signal Drive-P is high level signal, the second driving signal
When Drive-N is low level signal, the first voltage value adc1, the first driving signal Drive-P for recording the first probe are low electricity
Ordinary mail number when the second driving signal Drive-N is high level signal, records the second voltage value adc2 of the first probe, according to figure
The series connection voltage divider principle of first resistor R1 and second resistance R2 in 1a calculates the first voltage value adc1's and second voltage value adc2
And adcsum, calculation formula adcsum=adc2+ (ADCMAX-adc1)。
Further, in order to keep probe calibration coefficient results more accurate, multiple first driving signals be can produce
Drive-P and the second driving signal Drive-N calculates to measure multiple the first voltage value adc1 and second voltage value adc2
The voltage accumulation value of first probe.Voltage accumulation value ADCNCalculation formula are as follows: ADCN=adc2+ (ADCmax-adc1)+adc4+
(ADCmax–adc3)+……adcn+(ADCmax–adcn-1).Wherein, ADCmaxIt is that the first probe allows to apply for voltage peak
Ceiling voltage, adc3 be third time record the first probe the first voltage value, adc4 be the 4th time record the first probe
Second voltage value.N indicates the number for recording the first probe voltage value in total, wherein n is even number.Further, odd-times is remembered
The voltage value of first probe of record is that the first driving signal Drive-P is high level signal, and the second driving signal Drive-N is low
The voltage value of first probe when level signal.The voltage value of first probe of even-times record is the first driving signal Drive-P
For low level signal, the voltage value of the first probe when the second driving signal Drive-N is high level signal.
The influence very little of aquatic environment variation, can be ignored when further, due to measurement, then, voltage accumulation
Value ADCNCalculation formula can optimize are as follows:Preferably, measurement time
When number is 10 times, voltage accumulation value are as follows: ADC10=5 × [adc2+ (ADCmax-adc1)]。
S220, the Conductivity Calculation formula according to voltage accumulation value, voltage peak and setting, determine the electricity of detected solution
Conductance.
In the present embodiment, conductivity is the inverse of resistance value.According to voltage accumulation value, voltage peak and the first electricity
Resistance value and first resistor value, calculate the resistance value of detected solution.The resistance value calculation formula of detected solution are as follows:Wherein, RxFor the resistance value of detected solution, ADCNFor voltage accumulation value, N
For times of collection, ADCmaxFor voltage peak, R1For the resistance value of first resistor, R2For the resistance value of second resistance.Wherein, the first electricity
Resistance value R1 and second resistance value R2 is just had determined in TDS detector circuit design, will not be according to probe calibration method
It is changed, therefore first resistor value R1 and second resistance value R2 are fixed inconvenience, and first resistor value R1 and second is electric
Resistance value R2 is stored in memory, is needed in use, directly directly acquiring from memory.
Further, conductivity is the inverse of resistance value, according to the calculation formula of above-mentioned resistance value, finds out the meter of conductivity
Calculate formula are as follows:Wherein, GxFor the conductivity of detected solution.Preferably, it surveys
When amount number is 10 times, Conductivity Calculation formula are as follows:According to conductivity
Calculation formula calculate the value of conductivity.
S230, the corresponding conversion coefficient of conductivity is searched in pre-stored data relationship table.
In the present embodiment, table 1 is the data relationship of conductivity and TDS theoretical value conversion relation that embodiment two provides
Table, as shown in table 1,
Table 1
| Conductivity | Conversion relation |
| Gx<10ms/cm | TDS=0.5Gx (ms/cm) |
| Gx=300-800ms/cm | TDS=0.55Gx (ms/cm) |
| Gx=45000-6000ms/cm | TDS=0.70Gx (ms/cm) |
| Gx=65000-85000ms/cm | TDS=0.75Gx (ms/cm) |
Wherein, ms/cm is the unit of conductivity, Siemens/cm.
It is inquired in the data relationship table formerly stored according to the conductivity precomputed, determines that conductivity is corresponding
Conversion coefficient.
S240, according to conversion coefficient, conductivity and the theoretical value of setting calculation formula, determine TDS theoretical value.
In the present embodiment, conversion coefficient, conductivity and the preset theoretical value formula obtained according to lookup, meter
Calculate TDS theoretical value.The reduction formula of conductivity are as follows: TDStheory=Gx× D, wherein TDStheoryFor TDS theoretical value, GxIt is tested
The conductivity of solution, D are conversion coefficient corresponding with conductivity.
Illustratively, when conductivity is 500ms/cm, the available conversion coefficient of data relationship table according to the pre-stored data
It is 0.55, then calculating TDS theoretical value is TDStheory=500 × 0.55=275.
It should be noted that in the present embodiment, the data relationship table of the conductivity and TDS theoretical value conversion relation that provide with
And TDS theoretical value calculation formula is merely to be illustrated, and is not to be defined to data relation table and calculation formula, it can be with
Other data relationship tables or calculation formula are designed according to demand.
S250, according to TDS theoretical value and detected solution TDS actual value, calculate probe calibration coefficient.
In the present embodiment, probe calibration coefficient is the quotient of detected solution TDS actual value and TDS theoretical value.Probe calibration system
Number calculation formula are as follows:Wherein, Fac is probe calibration coefficient, TDStrueFor detected solution TDS actual value.Root
According to probe calibration coefficient formulas, probe calibration coefficient is calculated.
Further, in order to which S110 and S120 can be repeated several times in the calibration accuracy for improving TDS detector, multiple spies are obtained
Head calibration factor, asks the average value of multiple probe calibration coefficients as optimal probe calibration coefficient, carries out school to TDS detector
It is quasi-.
S260, it is calibrated according to probe of the probe calibration coefficient to TDS detector.
The probe calibration method of TDS detector provided in this embodiment, by being placed in detected solution when TDS detector
When, the voltage accumulation value and voltage peak of the first probe of TDS detector circuit are obtained, according to voltage accumulation value, voltage highest
Value and the Conductivity Calculation formula of setting, determine the conductivity of detected solution；Electricity is searched in pre-stored data relationship table
The corresponding conversion coefficient of conductance determines TDS theoretical value according to conversion coefficient, conductivity and the theoretical value of setting calculation formula；Root
According to TDS theoretical value and detected solution TDS actual value, probe calibration coefficient is calculated；According to probe calibration coefficient to TDS detector
Pop one's head in the technical solution calibrated, solve two detection probes in TDS detector it is inconsistent when, cause TDS to detect
The problem of existing error, improve the detection accuracy of TDS detector.
Embodiment three
Fig. 3 is the structural schematic diagram of the probe correcting device of the TDS detector in the embodiment of the present invention three；The present embodiment can
The case where probe suitable for calibrating TDS detector, wherein the device can be implemented by software and/or hardware, and generally be configured at TDS
In detector, in embodiment, by taking the probe correcting device of TDS detector is configured at TDS detector as an example, it is described.Wherein,
TDS detection circuit includes: the first probe, the second probe, first resistor and second resistance.
As shown in figure 3, the probe correcting device of TDS detector provided in this embodiment, mainly includes following part:
First determining module 310 determines TDS detector with respect to detected solution for the conductivity according to detected solution
Total dissolved solidss TDS theoretical value.
Computing module 320, for calculating probe calibration coefficient according to TDS theoretical value and detected solution TDS actual value；
Calibration module 330, for being calibrated according to probe of the probe calibration coefficient to TDS detector.
The probe correcting device of TDS detector provided in this embodiment is determined by the conductivity according to detected solution
Total dissolved solidss TDS theoretical value of the TDS detector with respect to detected solution；According to TDS theoretical value and detected solution TDS actual value,
Calculate probe calibration coefficient；According to the technical solution that probe of the probe calibration coefficient to TDS detector is calibrated, solve
When two detection probes in TDS detector are inconsistent, cause TDS detection the problem of error occur, improve TDS detector
Detection accuracy.
Further, the probe correcting device of TDS detector provided in this embodiment further include:
Module is obtained, for when TDS detector is placed in the detected solution, obtaining the first electricity of TDS detector circuit
The voltage accumulation value and voltage peak of pole；
Second determining module is determined for the Conductivity Calculation formula according to voltage accumulation value, voltage peak and setting
The conductivity of surveyed solution；
Wherein, voltage accumulation value be the first voltage value of the first probe and the second voltage value of the first probe it is cumulative
Value, the first voltage value is the voltage value of the first probe when first resistor connects high level signal and second resistance connects low level signal,
Second voltage value is the voltage value of the first probe when first resistor connects low level signal and second resistance connects high level signal, voltage
Peak is the ceiling voltage that the first probe allows to apply.
Preferably, the Conductivity Calculation formula indicates are as follows:
Wherein, GxFor the conductivity of the detected solution, ADCNFor the voltage accumulation value, N is times of collection, ADCmaxFor
The voltage peak, R1For the resistance value of the first resistor, R2For the resistance value of the second resistance.
Further, the first determining module 310 includes:
Searching unit, for searching the corresponding conversion coefficient of conductivity in pre-stored data relationship table.
Determination unit, for determining TDS theoretical value according to conversion coefficient, conductivity and the theoretical value of setting calculation formula.
Preferably, theoretical value calculation formula indicates are as follows:
TDStheory=Gx×D
Wherein, TDStheoryFor TDS theoretical value, GxFor the conductivity of detected solution, D is conversion corresponding with conductivity system
Number.
The probe correcting device of TDS detector provided by the embodiment of the present invention can be performed any embodiment of that present invention and be mentioned
The probe calibration method of the TDS detector of confession has the corresponding functional module of execution method and beneficial effect.
Example IV
Fig. 4 is a kind of structural schematic diagram for server that the embodiment of the present invention four provides, as shown in figure 4, the equipment/end
End/server includes processor 410, memory 420, input unit 430, output device 440, control panel 450, TDS detection electricity
Road 460 and TDS probe 470；Control panel 450 is connect with memory 420, TDS detection circuit 460 and TDS probe 470 respectively；TDS
It pops one's head in 470 external TDS detection circuits 460；The quantity of processor 410 can be one or more in server, with one in Fig. 4
For processor 410；Reason device 410, memory 420, input unit 430 and output device 440 in equipment/terminal/server
It can be connected by bus or other modes, in Fig. 4 for being connected by bus.
Memory 420 is used as a kind of computer readable storage medium, can be used for storing software program, journey can be performed in computer
Sequence and module, as the corresponding program instruction/module of the probe calibration method of the TDS detector in the embodiment of the present invention (for example,
The first determining module 310, computing module 320 and calibration module 330 in the probe correcting device of TDS detector.Processor 410
By running the software program, instruction and the module that are stored in memory 420, thereby executing the various function application of server
And data processing, that is, realize the probe calibration method of above-mentioned TDS detector.
Memory 420 can mainly include storing program area and storage data area, wherein storing program area can store operation system
Application program needed for system, at least one function；Storage data area, which can be stored, uses created data etc. according to terminal.This
Outside, memory 420 may include high-speed random access memory, can also include nonvolatile memory, for example, at least one
Disk memory, flush memory device or other non-volatile solid state memory parts.In some instances, memory 420 can be into one
Step includes the memory remotely located relative to processor 410, these remote memories can pass through network connection to equipment/end
End/server.The example of above-mentioned network includes but is not limited to internet, intranet, local area network, mobile radio communication and its group
It closes.
Input unit 430 can be used for receiving the number or character information of input, and generate and equipment/terminal/server
User setting and function control related key signals input.Output device 440 may include that display screen etc. shows equipment.
TDS detector provided by any embodiment of the invention can be performed in TDS detector provided by the embodiment of the present invention
Probe calibration method, have the corresponding functional module of execution method and beneficial effect.
Embodiment five
The embodiment of the present invention five also provides a kind of storage medium comprising computer executable instructions, and the computer can be held
Row is instructed when being executed by computer processor for executing a kind of probe calibration method of TDS detector, this method comprises:
According to the conductivity of detected solution, total dissolved solidss TDS theoretical value of the TDS detector with respect to detected solution is determined；
According to TDS theoretical value and detected solution TDS actual value, probe calibration coefficient is calculated；
It is calibrated according to probe of the probe calibration coefficient to TDS detector.
Certainly, a kind of storage medium comprising computer executable instructions, computer provided by the embodiment of the present invention
TDS detection provided by any embodiment of the invention can also be performed in the method operation that executable instruction is not limited to the described above
Relevant operation in the probe calibration method of instrument
By the description above with respect to embodiment, it is apparent to those skilled in the art that, the present invention
It can be realized by software and required common hardware, naturally it is also possible to which by hardware realization, but in many cases, the former is more
Good embodiment.Based on this understanding, technical solution of the present invention substantially in other words contributes to the prior art
Part can be embodied in the form of software products, which can store in computer readable storage medium
In, floppy disk, read-only memory (Read-Only Memory, ROM), random access memory (Random such as computer
Access Memory, RAM), flash memory (FLASH), hard disk or CD etc., including some instructions are with so that a computer is set
Standby (can be personal computer, server or the network equipment etc.) executes method described in each embodiment of the present invention.
It is worth noting that, in the embodiment of the probe correcting device of above-mentioned TDS detector, included each unit and
Module is only divided according to the functional logic, but is not limited to the above division, as long as corresponding functions can be realized
?；In addition, the specific name of each functional unit is also only for convenience of distinguishing each other, the protection being not intended to restrict the invention
Range.
Note that the above is only a better embodiment of the present invention and the applied technical principle.It will be appreciated by those skilled in the art that
The invention is not limited to the specific embodiments described herein, be able to carry out for a person skilled in the art it is various it is apparent variation,
It readjusts and substitutes without departing from protection scope of the present invention.Therefore, although being carried out by above embodiments to the present invention
It is described in further detail, but the present invention is not limited to the above embodiments only, without departing from the inventive concept, also
It may include more other equivalent embodiments, and the scope of the invention is determined by the scope of the appended claims.
Claims (10)
1. a kind of probe calibration method of TDS detector, TDS detection circuit includes: the first probe, the second probe, first resistor
And second resistance, which is characterized in that the described method includes:
According to the conductivity of detected solution, determine that the total dissolved solidss TDS of the relatively described detected solution of the TDS detector is theoretical
Value；
According to TDS theoretical value and the detected solution TDS actual value, probe calibration coefficient is calculated；
It is calibrated according to probe of the probe calibration coefficient to the TDS detector.
2. the probe calibration method of TDS detector according to claim 1, which is characterized in that be tested in the basis molten
The conductivity of liquid, before determining TDS theoretical value, further includes:
When the TDS detector is placed in the detected solution, the voltage accumulation of first probe of TDS detection circuit is obtained
Value and voltage peak；
According to the voltage accumulation value, voltage peak and the Conductivity Calculation formula of setting, the electricity of the detected solution is determined
Conductance；
Wherein, the voltage accumulation value is the first voltage value of first probe and the second voltage value of first probe
Accumulated value, the first voltage value are the first probes when first resistor connects high level signal and second resistance connects low level signal
Voltage value, the second voltage value are the first probes when first resistor connects low level signal and second resistance connects high level signal
Voltage value, the voltage peak are the ceiling voltage that first probe allows to apply.
3. the probe calibration method of TDS detector according to claim 2, which is characterized in that the Conductivity Calculation is public
Formula indicates are as follows:
Wherein, GxFor the conductivity of the detected solution, ADCNFor the voltage accumulation value, N is times of collection, ADCmaxIt is described
Voltage peak, R1For the resistance value of the first resistor, R2For the resistance value of the second resistance.
4. the probe calibration method of TDS detector according to claim 1, which is characterized in that described according to detected solution
Conductivity, determine that the TDS theoretical value of the relatively described detected solution of the TDS detector includes:
The corresponding conversion coefficient of the conductivity is searched in pre-stored data relationship table；
According to the conversion coefficient, conductivity and the theoretical value of setting calculation formula, the TDS theoretical value is determined.
5. the probe calibration method of TDS detector according to claim 4, which is characterized in that the theoretical value calculates public
Formula indicates are as follows:
TDStheory=Gx×D
Wherein, TDStheoryFor the TDS theoretical value, GxFor the conductivity of the detected solution, D is corresponding with the conductivity
Conversion coefficient.
6. a kind of probe correcting device of TDS detector, TDS detection circuit includes: the first probe, the second probe, first resistor
And second resistance, which is characterized in that described device includes:
First determining module determines the relatively described detected solution of the TDS detector for the conductivity according to detected solution
Total dissolved solidss TDS theoretical value；
Computing module, for calculating probe calibration coefficient according to TDS theoretical value and the detected solution TDS actual value；
Calibration module, for being calibrated according to probe of the probe calibration coefficient to the TDS detector.
7. the probe correcting device of TDS detector according to claim 6, which is characterized in that described device further include:
Module is obtained, for obtaining the TDS detection circuit first when the TDS detector is placed in the detected solution
The voltage accumulation value and voltage peak of electrode；
Second determining module, for determining according to the voltage accumulation value, voltage peak and the Conductivity Calculation formula of setting
The conductivity of the detected solution；
Wherein, the voltage accumulation value be first probe the first voltage value and first probe second voltage value it
Accumulated value, the first voltage value is the first probe when first resistor connects high level signal and second resistance connects low level signal
Voltage value, the second voltage value is the first probe when first resistor connects low level signal and second resistance connects high level signal
Voltage value, the voltage peak be first probe allow apply ceiling voltage.
8. the probe correcting device of TDS detector according to claim 6, which is characterized in that the first determining module includes:
Searching unit, for searching the corresponding conversion coefficient of the conductivity in pre-stored data relationship table；
Determination unit, for determining the TDS reason according to the conversion coefficient, conductivity and the theoretical value of setting calculation formula
By value.
9. a kind of TDS survey meter, comprising: memory, TDS detection circuit, control panel and TDS probe,
The control panel pops one's head in the memory, the TDS detection circuit and the TDS connect respectively；
The external TDS detection circuit of the TDS probe；
The memory, for storing one or more programs；
When one or more of programs are executed by one or more of control panels, so that the control panel is realized as right is wanted
Seek the probe calibration method of any TDS detector of 1-5.
10. a kind of storage medium comprising computer executable instructions, the computer executable instructions are by computer disposal
For executing the probe calibration method such as TDS detector as claimed in any one of claims 1 to 5 when device executes.
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