CN109188309B - Method for accurately determining dynamic threshold parameters of high-voltage detonator detection circuit - Google Patents

Method for accurately determining dynamic threshold parameters of high-voltage detonator detection circuit Download PDF

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CN109188309B
CN109188309B CN201811205580.2A CN201811205580A CN109188309B CN 109188309 B CN109188309 B CN 109188309B CN 201811205580 A CN201811205580 A CN 201811205580A CN 109188309 B CN109188309 B CN 109188309B
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threshold
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resistor
threshold value
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CN109188309A (en
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杜铜练
张溢文
梁敏
赵建鹏
闫彦
傅梦杨
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705 Research Institute China Shipbuilding Industry Corp
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    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract

The invention relates to a method for accurately determining dynamic threshold parameters during detection of a high-voltage detonator, which comprises the steps of calculating R2 and R3 resistance values by establishing a calculation formula of a resistor in a threshold detection circuit, and measuring an actual threshold value VT1、VT2Calculating a difference value between the actual measured threshold value and the theoretical threshold value, correcting the theoretical threshold value through the difference value, and returning the corrected threshold value to recalculate the resistance values of R2 and R3; adjusting the resistance values of R2 and R3, and measuring and verifying the actual threshold value V againT1、VT2The verification result can meet the required threshold error; regulating the analog feedback voltage signal of the precise DC regulated power supply to make its output voltage be VT1And VT2The output of the observation logic decision circuit can be accurately and dynamically turned over at two threshold points. Compared with the prior art, the method is more accurate, and provides a favorable premise for accurate detection and performance evaluation of the high-pressure detonator; the test equipment is miniaturized, the cost is reduced, and the field inspection is facilitated.

Description

Method for accurately determining dynamic threshold parameters of high-voltage detonator detection circuit
Technical Field
The invention relates to a method for accurately determining parameters of a dynamic threshold detection circuit of a high-voltage detonator, which is suitable for testing and performance evaluation when special power supplies such as the high-voltage detonator and the like are checked.
Background
Usually, when the high-voltage detonator circuit works, the high-voltage converter continuously and reciprocally charges the high-voltage energy storage capacitor, so that the voltage of the high-voltage capacitor is always maintained within the minimum voltage required by the detonator for initiating one hundred percent and the allowable upper and lower error ranges, and the high-voltage capacitor is also a special power supply in fact. The high-voltage feedback circuit samples the voltage on the high-voltage capacitor, and when the voltage on the high-voltage capacitor exceeds an upper limit voltage value, the threshold detection and judgment control circuit stops outputting a dynamic frequency signal so as to stop charging the high-voltage capacitor; when the voltage on the high-voltage capacitor drops below the lower limit value, the threshold detection and judgment control circuit outputs a dynamic frequency signal, and the high-voltage capacitor is continuously charged through the high-voltage conversion circuit. Therefore, when the high-voltage detonator is detected by the testing equipment, the charging process of the high-voltage energy storage capacitor of the product needs to be detected and accurate threshold detection and control are carried out so as to maintain the voltage of the high-voltage energy storage capacitor within the allowable error range, and therefore the high-voltage capacitor power supply can reliably detonate the detonator. When the conventional special test equipment is used for detecting the high-voltage initiator, the parameters of a detection circuit are lack of theoretical calculation, so that actual debugging is carried out blindly, which is always a difficult point and cannot be completely solved for a long time; in addition, the test equipment usually adopts a PXI industrial control system to carry out inspection and performance evaluation for the platform and an adapter mode, and the mode has the advantages of large system frame, high cost, low reliability, no contribution to field inspection of products and the like. Aiming at the situation, the method for accurately determining the threshold detection circuit parameters during the detection of the high-voltage detonator is constructed, and is used for solving the detection and performance evaluation of the high-voltage detonator.
Disclosure of Invention
Technical problem to be solved
In order to avoid the defects of the prior art, the invention provides a method for accurately determining a dynamic threshold parameter during detection of a high-voltage detonator, and the dynamic threshold parameter is more accurately determined.
Technical scheme
A method for accurately determining dynamic threshold parameters during detection of a high-voltage initiator, namely a method for correcting a theoretical threshold value by using an actually tested threshold value, is characterized by comprising the following steps:
step 1: determining the calculation formulas of resistors R2 and R3 in a threshold detection circuit, wherein the threshold detection circuit comprises a comparator, a resistor R1, a resistor R2 and a resistor R3, wherein the inverting terminal of the comparator is connected with a feedback voltage signal, and a reference voltage V is referred toREFThe non-inverting terminal of the comparator being connected via a resistor R1, of resistor R2One end of the comparator is grounded, and the other end of the comparator is connected with the output end of the comparator; one end of the resistor R3 is grounded, and the other end is connected with the in-phase end of the comparator;
Figure BDA0001829264730000021
Figure BDA0001829264730000022
wherein, VOHThe operational amplifier outputs a high level voltage, VOLThe operational amplifier outputs a low level voltage, a k-threshold scale factor, a1Threshold back difference value, Δ2Operational amplifier outputting high and low level difference value VREFA reference voltage;
step 2: the operational amplifier obtained by measurement outputs a high level VOHAnd output low level VOLReference voltage VREFAnd the theoretically calculated threshold scale factors k and delta1Calculating the threshold return difference value according to the formula in the step 1 to obtain R2 and R3 resistance values, realizing R2 and R3 by using potentiometers in the circuit, and measuring an actual threshold value VT1、VT2；
And step 3: will actually measure the threshold value VT1、VT2And a theoretical threshold value V'T1、V′T2Calculating the difference value to obtain delta VT1、ΔVT2If Δ VT> 0, subtracting Δ V from the theoretical thresholdT(ii) a If Δ VT< 0, adding Δ V to the theoretical threshold valueTRecalculating the corrected threshold value according to the step 1 to obtain R2 and R3 resistance values;
and 4, step 4: measuring the R2 and R3 resistance values obtained in the step 3 again according to the step 2 to verify the actual threshold value VT1、VT2The verification result can meet the required threshold error;
and 5: the ARM single chip continuously outputs a PWM dynamic frequency signal with adjustable frequency and duty ratio to a logic decision circuit, a threshold detection circuit outputs the PWM dynamic frequency signal to the logic decision circuit, an oscilloscope is used for testing the output end of the logic decision circuit and adjusting the analog feedback voltage signal of a precise direct current stabilized power supplySo that its output voltage is at VT1And VT2The output of the observation logic decision circuit can be accurately and dynamically turned at two threshold points, and the error can be less than 10 mV.
Advantageous effects
The invention provides a method for accurately determining dynamic threshold parameters during detection of a high-voltage detonator, which comprises the steps of calculating R2 and R3 resistance values by establishing a calculation formula of a resistor in a threshold detection circuit, and measuring an actual threshold value VT1、VT2Calculating a difference value between the actual measured threshold value and the theoretical threshold value, correcting the theoretical threshold value through the difference value, and returning the corrected threshold value to recalculate the resistance values of R2 and R3; adjusting the resistance values of R2 and R3, and measuring and verifying the actual threshold value V againT1、VT2The verification result can meet the required threshold error; regulating the analog feedback voltage signal of the precise DC regulated power supply to make its output voltage be VT1And VT2The output of the observation logic decision circuit can be accurately and dynamically turned over at two threshold points. Compared with the prior art, the method is more accurate, and provides a favorable premise for accurate detection and performance evaluation of the high-pressure detonator; the test equipment is miniaturized, the cost is reduced, and the field inspection is facilitated.
Drawings
FIG. 1 is a schematic diagram of the detection circuit
1-threshold detection circuit, 2-ARM single chip circuit, 3-logic decision circuit.
FIG. 2 is a schematic diagram of a threshold detection circuit
FIG. 3 is a schematic diagram of a feedback voltage signal
Detailed Description
The invention will now be further described with reference to the following examples and drawings:
as described in the background, when inspecting a high voltage initiator, a testing device first generates and outputs a dynamic frequency signal with adjustable frequency and adjustable pulse width to enable a high voltage capacitor of the high voltage initiator to be in a charging state, and at the same time, the high voltage initiator outputs a feedback voltage signal with a bounded requirement, so that a threshold detection circuit is also required by the detection deviceThe change ranges of the feedback signal, namely the upper limit voltage and the lower limit voltage, are accurately detected in real time, and whether the dynamic frequency signal is output or not, namely whether the high-voltage capacitor is charged or not, is controlled according to the detection result. In order to realize the task, the technical scheme comprises an ARM single chip microcomputer module, a threshold detection module and a logic judgment module. The ARM single chip module generates a PWM dynamic frequency signal with adjustable frequency and duty ratio, the threshold detection module adopts a comparison circuit formed by operational amplifiers to complete double-threshold detection processing of the feedback signal of the high-voltage initiator, and the voltage threshold value of the feedback signal is used as the upper threshold value V of the threshold detection circuitT1And a lower threshold value VT2According to the magnitude of the input feedback signal, the threshold of the detection circuit is at the upper limit value VT1Lower limit value VT2The output of the threshold detection circuit and the dynamic frequency signal output by the ARM singlechip module are sent to the high-voltage initiator through the logic decision circuit.
The ARM single chip microcomputer module is used for realizing dynamic frequency signals with adjustable frequency and adjustable pulse width.
The threshold detection circuit module is used for detecting a feedback signal of the high-voltage initiator.
The logic decision module is used for deciding whether the dynamic frequency signal is output or not.
The method is characterized in that a resistance calculation formula for determining a threshold value parameter is deduced for solving the existing problems, but due to the influences of operational amplifier output saturation voltage drop, output voltage parameter precision, reference voltage precision, power supply voltage precision, circuit bottom noise, circuit distribution parameters and the like, the actual threshold value and the required error in a circuit are large, threshold conversion is disordered during dynamic work, and even a self-excitation phenomenon sometimes occurs. Therefore, the scheme provides a method for accurately determining the dynamic threshold parameter of the detection circuit, namely a method for correcting the theoretical threshold value by using the actually tested threshold value, so as to solve the problem of accurately determining the parameter of the threshold detection circuit. The detection circuit specifically comprises the following steps:
the method comprises the following steps: the resistances R2, R3 are determined. According to the circuit structure, the calculation formula for deriving the resistances R2, R3 is:
Figure BDA0001829264730000041
Figure BDA0001829264730000042
wherein, VOHThe operational amplifier outputs a high level voltage, VOLThe operational amplifier outputs a low level voltage, a k-threshold scale factor, a1Threshold back difference value, Δ2Operational amplifier outputting high and low level difference value VREFThe reference voltage is referenced.
Step two: the operational amplifier obtained by measurement outputs a high level VOHAnd output low level VOLReference voltage VREFAnd the theoretically calculated threshold scale factors k and delta1Calculating the threshold return difference value according to a step one formula to obtain R2 and R3 resistance values, realizing R2 and R3 by using potentiometers in a circuit, and measuring an actual threshold value VT1、VT2。
Step three: will be a theoretical threshold value VT1、VT2With the actual measurement threshold value VT1、VT2Calculating the difference value to obtain delta VT1、ΔVT2If Δ VT> 0, subtracting Δ V from the theoretical thresholdT(ii) a If Δ VT< 0, adding Δ V to the theoretical threshold valueTAnd recalculating the corrected threshold value according to the step one to obtain R2 and R3 resistance values.
Step four: measuring the resistance values of R2 and R3 obtained in the step three again according to the step two to verify the actual threshold value VT1、VT2And the verification result can meet the required threshold error.
Step five: the ARM single chip microcomputer continuously outputs a PWM dynamic frequency signal with adjustable frequency and duty ratio, an oscilloscope is used for testing the output end of a logic control circuit and adjusting a precise direct current stabilized power supply to enable the output voltage of the precise direct current stabilized power supply to be VT1And VT2The output can be accurately and dynamically turned at two threshold points, and the error can be less than 10 mV.
The embodiment is a method for accurately determining dynamic threshold parameters of a detection circuitThe method is shown in the attached figures 1 and 2. Fig. 1 is a general schematic diagram of a detection circuit, which is composed of a threshold detection circuit 1, an ARM single chip circuit 2 and a logic decision circuit 3. FIG. 2 is a schematic diagram of a threshold detection circuit, which is composed of an integrated circuit comparator N1LM2903, a resistor R1, a resistor R2, a resistor R3, and a reference voltage VREFAnd (4) forming. Wherein the inverting terminal of the comparator is connected with the feedback voltage signal and the reference voltage VREFThe resistor R1 is connected with the in-phase end of the comparator, one end of the resistor R2 is grounded, and the other end of the resistor R2 is connected with the output end of the comparator; one end of the resistor R3 is grounded, and the other end is connected with the non-inverting terminal of the comparator.
1. Determining threshold circuit resistances R2, R3
Push button
Figure BDA0001829264730000051
Figure BDA0001829264730000052
Resolving is carried out, an upper limit value and a lower limit value of an input feedback voltage signal are used as threshold values, and a threshold V is requiredT110.4 ± 0.1V, threshold VT29.7 plus or minus 0.1V; threshold scale factor
Figure BDA0001829264730000053
Threshold back difference value delta1＝0.7。
2. Measurement selection VOH＝12.0V；VOL0.145V; reference voltage VREF12.0V, difference between high and low levels211.855; then, the following is obtained by calculation according to the calculation formulas of the resistors R2 and R3: the resistor R2 is 136.78K Ω, and the resistor R3 is 60.57K Ω. The resistor R2 and the resistor R3 are realized by potentiometers W1 and W2, and the actual threshold V is measuredTTwo thresholds VT1Is 10.55V, threshold VT2It was 9.86V.
3. The difference value is carried out between the actual threshold value and the theoretical threshold value to obtain delta VT1＝0.15V、ΔVT2And (5) performing difference correction on the theoretical threshold value to obtain a corrected V (0.16V)T1Is 10.25V, VT2It was 9.54V. And recalculating R2 and R3 according to steps 1 and 2 to obtain R2-132.62K omega, and R3-54.465K omega。
4. Potentiometers W1 and W2 are respectively adjusted to be close to 132.62K omega and 54.465K omega, and an actual threshold V is measuredTTwo thresholds VT1Is 10.44V, threshold VT29.73V, the actual error is less than 50mV, and the errors are all less than the requirement of 100 mV.
5. And (3) testing the whole detection circuit: the ARM single chip microcomputer outputs PWM signals, the precision direct-current stabilized voltage supply simulates feedback voltage signals, and an oscilloscope is used for observing the output end of the logic decision circuit; adjusting the output of the precision direct current stabilized voltage power supply from 0V to 9.7V to more than 10.4V; and then regulating back from more than 10.4V to less than 9.7V, and observing that the output of the logic decision circuit can be normally and dynamically inverted between 9.7V and 10.4V.
From the results, the threshold value is accurately obtained by determining the parameters of the threshold detection circuit by adopting the method.

Claims (1)

1. A method for accurately determining dynamic threshold parameters during detection of a high-voltage initiator, namely a method for correcting a theoretical threshold value by using an actually tested threshold value, is characterized by comprising the following steps:
step 1: determining the calculation formulas of resistors R2 and R3 in a threshold detection circuit, wherein the threshold detection circuit comprises a comparator, a resistor R1, a resistor R2 and a resistor R3, wherein the inverting terminal of the comparator is connected with a feedback voltage signal, and a reference voltage V is referred toREFThe resistor R1 is connected with the in-phase end of the comparator, one end of the resistor R2 is grounded, and the other end of the resistor R2 is connected with the output end of the comparator; one end of the resistor R3 is grounded, and the other end is connected with the in-phase end of the comparator;
Figure FDA0002544261380000011
Figure FDA0002544261380000012
wherein, VOHThe operational amplifier outputs a high level voltage, VOLThe operational amplifier outputs a low level voltage,
Figure FDA0002544261380000013
threshold scale factor, Δ1Threshold back difference value, Δ2Operational amplifier outputting high and low level difference value VREFA reference voltage; v'T1、V′T2Is a theoretical threshold value;
step 2: the operational amplifier obtained by measurement outputs a high level voltage VOHOperational amplifier output low level voltage VOLReference voltage VREFAnd a threshold scale factor k and a threshold back difference value delta obtained by theoretical calculation1Operational amplifier output high-low level difference value delta2Calculating the resistance values of the resistor R2 and the resistor R3 according to the formula in the step 1, realizing R2 and R3 by using potentiometers in the circuit, and measuring an actual threshold value VT1、VT2；
And step 3: will actually measure the threshold value VT1、VT2And a theoretical threshold value V'T1、V′T2Calculating the difference value to obtain delta VT1、ΔVT2If Δ VT> 0, subtracting Δ V from the theoretical thresholdT(ii) a If Δ VT< 0, adding Δ V to the theoretical threshold valueTRecalculating the corrected threshold value according to the step 1 to obtain the resistance values of the resistor R2 and the resistor R3;
and 4, step 4: measuring the resistance values of the resistor R2 and the resistor R3 obtained in the step 3 again according to the step 2 to verify the actual threshold value VT1″、V″T2The verification result can meet the required threshold error;
and 5: the ARM single chip continuously outputs a PWM dynamic frequency signal with adjustable frequency and duty ratio to a logic decision circuit, a threshold detection circuit outputs the PWM dynamic frequency signal to the logic decision circuit, an oscilloscope is used for testing the output end of the logic decision circuit, and a precision direct current stabilized voltage supply analog feedback voltage signal is adjusted to enable the output voltage to be at VT1"and VT2The output of the observation logic decision circuit can be accurately and dynamically turned at two threshold points, and the error can be less than 10 mV.
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CN112161525B (en) * 2020-09-12 2022-10-11 美唐科技(江苏)有限公司 Data analysis method for receiving circuit of electronic detonator initiator
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