CN109142922A - Thin-film capacitor life-span prediction method - Google Patents
Thin-film capacitor life-span prediction method Download PDFInfo
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- CN109142922A CN109142922A CN201810945057.7A CN201810945057A CN109142922A CN 109142922 A CN109142922 A CN 109142922A CN 201810945057 A CN201810945057 A CN 201810945057A CN 109142922 A CN109142922 A CN 109142922A
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention discloses a kind of thin-film capacitor life-span prediction methods, include the following steps: the direct current capacitors of one, a standard of selection, test sample is N number of, test method is as follows: 1, after capacitor is placed in the environment of 30 ± 2 DEG C at least 12 hours, proof voltage between progress terminal, test capacity is lost after five minutes；2, capacitor is placed in the environment of 70 DEG C at least 12 hours；3, at 70 DEG C, 2600VDC is applied to capacitor and is kept for 500 hours.The present invention program has filled up membrane capacitance and has carried out experience judgement according to field measurement situation, technological gap without life prediction scheme, the journey system of repairing of repairing of only different phase provides technical support, and can be used as the decision model of the thin-film capacitor class device of total system grade product PHM, positive effect has been achieved in terms of maintenance determines with predictive repairing.
Description
Technical field
The present invention relates to the technical field of membrane capacitance test, specially a kind of thin-film capacitor life-span prediction methods.
Background technique
Thin film capacitor is to work as electrode with metal film, can have one group of metal film to be wound in cylindrical shape or multiple groups cylindrical membrane simultaneously
Join the capacitor constituted.Due to the performance advantages such as its is nonpolarity, insulation impedance is high, frequency characteristic is excellent, in solar power generation, electricity
Gasification railway, wind power industry are all widely used, and the capacitance of thin-film capacitor can gradually decay after long-term use, most
Normal function is influenced eventually.
The technical solution of the prior art one: the variation of membrane capacitance capacitance directly influences properties of product, to guarantee product just
Normal function realizes that it is exactly the time according to regulation that most of power electronic systems, which carry out periodic maintenance scheme, at present, periodically examines
The situation of change for looking into capacitance carries out examination to small quantities of product and repairs, judges whether that capacitor is replaced.
The shortcomings that prior art one: the working service situation of electronic product repairs -- preventive overhaul -- after having been engaged at present
Condition maintenarnce -- prospective maintenance.Prior art one belongs to typical preventive overhaul, repair on technical conditions, has the drawback that:
1, whether maintenance program lacks prediction to service life of the following capacitor just for the capacitor current state for carrying out maintenance, to being able to satisfy
It is next to lack prediction with the period.2, capacitance attenuation model can not be established, later period repair and maintenance can not be supported to maintain business liter
Grade is needed at the business that predictability is repaired.
The technical solution of the prior art two: according to membrane capacitance life prediction formula, the prediction of capacitor bulk life time is carried out.
In formula: L: the service life (h) of (field strength E) under workload,
L0: the service life (105h is often customary in the world, many years of experience data) of (field strength E0) when design,
E0: the electric field strength (V/m) when design,
T0: the temperature (70 DEG C) when design,
Th: the capacitor hot(test)-spot temperature (DEG C) under workload (voltage),
T: operating temperature,
C: A Leiniesi (Arrhenius) coefficient (being approximately equal to 13).
The shortcomings that prior art two: according to membrane capacitance life prediction formula, carrying out the prediction scheme of capacitor bulk life time, main
The device lifetime that be applied to design initial stage identifies that the accuracy of life prediction depends on the temperature product identified when design selection
Long-term operating temperature and average field intensity.It has the following disadvantages:
1, result is just in the single model of Utopian capacitance applications.And the case where genuine products work, often transported
The factors influences such as row environmental change, external electrical network fluctuation, working environment and potential are in the situation of Long-term Fluctuation.Such as rail traffic
Product, different uses section, and environment temperature difference is huge, and power grid quality difference is huge, causes identical capacitor different
It is larger with service life after the longtime running of section and perfect forecast aging variation.
2, the failure of capacitor calculates the capacitor service life as boundary condition according to the 8% of initial capacitance, and capacitor is in system
In boundary condition, often determined according to the design margin that designer retains capacitor when electronic product project is initial.
It is constant clearly to there is excessive maintenance hidden danger as boundary value using 8%, it be easy to cause maintenance cost higher.
Summary of the invention
Object of the present invention is to the failure mechanism by analysis membrane capacitance, decay characteristic establishes a set of energy for different application
The thin-film capacitor service life Accurate Prediction scheme of environment, not homologous ray, various boundary.
The present invention is achieved through the following technical solutions:
A kind of thin-film capacitor life-span prediction method, includes the following steps:
One, the direct current capacitors of a standard is selected, test sample is N number of, and test method is as follows:
After step 1, capacitor are placed in the environment of 30 ± 2 DEG C at least 12 hours, proof voltage between progress terminal, 5 minutes
Test capacity is lost afterwards；
Step 2, capacitor are placed in the environment of 70 DEG C at least 12 hours；
Step 3, at 70 DEG C, to capacitor apply 2600VDC (1.4Un) keep 500 hours；
Step 4, durability test proceed to 500 hours, and capacitor should stop being powered, and static sky at ambient temperature
It is cooling in gas, 1000 electric discharges, peak point current 1.4*4=5.6KA are carried out to sample；
Step 5 repeats from Step 2 to Step 4；
During the test, every 96 hours, a capacitor's capacity is measured and recorded.
Two, the service life trend of capacitor obeys exponential distribution function f (x), and enabling x is the time, and y is test value (capacitance), record
Measured value, wherein the test value of all samples takes weighted average under a certain specific time,It is corresponding to obtain measured value
Relation table.
Three, distribution function f (x) is calculated, the method is as follows:
To y=aebxBoth sides take logarithm to obtain
Ln y=ln a+bx
It enablesc0=ln a, c1=b, then matched curve are
By yiAfter taking logarithm, former tables of data becomes new data table, to this new data, uses straight lineIt carries out minimum
Two multiply fitting
Normal equation isFor
Solve c0And c1
You can get it y=aebxThe value of middle a and b.
The capacitance under prediction other times is calculated by above-mentioned formula, the life prediction of capacitor is carried out with this.
Accelerated aging test is carried out by sampling to typical case's membrane capacitance early period, real data is carried out to a large amount of field datas
Screening, fitting, establish the mathematical model of project verification.The time is used by input capacitance, it is accurate to carry out to the service life of capacitor
Prediction.
The present invention has rational design, has actual use value well.
Detailed description of the invention
Fig. 1 shows the times of actual measurement and capacitance corresponding data.
Specific embodiment
Specific embodiments of the present invention are described in detail below.
A kind of thin-film capacitor life-span prediction method, the service life of membrane capacitance is in the dielectric and production technology for not considering filling
Under conditions of, the attenuation process for decaying to capactive film of capacitor's capacity.By testing a kind of capacitance variation of capacitor, can obtain
To the attenuation change for being applicable in the type membrane capacitance.The present invention program changes reason by the capacitance of accelerated aging test test capacitors
Think model.
Specific step is as follows:
One, the ideal model for establishing capacitor's capacity decaying is realized by accelerated ageing, the standard according to locomotive capacitor
" 25121 rail transit rolling stock electric power of equipment electronic capacitor of GB/T " (corresponding IEC 61881) and " GB/T 17702-
2013 power electronic capacitors " (corresponding IEC61071), the direct current capacitors of a standard is selected, test sample is N number of, test side
Method is as follows:
After step 1, capacitor are placed in the environment of 30 ± 2 DEG C at least 12 hours, proof voltage between progress terminal, 5 minutes
Test capacity is lost afterwards；
Step 2, capacitor are placed in the environment of 70 DEG C at least 12 hours；
Step 3, at 70 DEG C, to capacitor apply 2600VDC (1.4Un) keep 500 hours；
Step 4, durability test proceed to 500 hours, and capacitor should stop being powered, and static sky at ambient temperature
It is cooling in gas, 1000 electric discharges, peak point current 1.4*4=5.6KA are carried out to sample；
Step 5 repeats from Step 2 to Step 4.
During the test, every 96 hours, a capacitor's capacity is measured and recorded, as shown in Figure 1.Capacitor 1.4Un,
It is carried out durability test 500 hours under the conditions of 70 DEG C, 100000 hours under corresponding declared working condition under service condition.
Two, ideal model amendment is carried out according to actual capacitance value
The capacitor for extracting different traffic coverages in different time periods carries out capacitance actual measurement, and multiple groups capacitor's capacity is fitted respectively to be divided
Analysis is distributed and calculates distribution parameter accordingly, further according to every group of calculated distribution parameter of data, is finally fitted to revised
Degradation model distribution parameter.
According to the Analysis on Mechanism of capacitor, the service life trend of capacitor obeys exponential distribution function, and enabling x is the time, and y is test value
(capacitance) records measured value, wherein the test value of all samples takes weighted average under a certain specific time,?
It is as shown in the table to measured value mapping table:
| Time Xi | X1 | X2 | X3 | X4 |
| Test value Yi | Y1 | Y2 | Y3 | Y4 |
Such as certain actual value is to be as follows:
Three, distribution function f (x) is calculated, calculation method is as follows:
To y=aebxBoth sides take logarithm to obtain
Ln y=ln a+bx
It enablesc0=ln a, c1=b, then matched curve are
By yiAfter taking logarithm, it is as follows that former data become new data:
To this new data, straight line is usedLeast square fitting is carried out, this is according to function
Normal equation isFor
Abbreviation is
Solve c0=0.6695, c1=0.1997
Therefore
Therefore
That is y=1.9532e0.1997x
The capacitance under prediction other times can be calculated by the formula, the life prediction of capacitor is carried out with this.
The present invention program has filled up membrane capacitance and has carried out experience judgement, the skill of no life prediction scheme according to field measurement situation
Art blank, the journey system of repairing of repairing of only different phase does not provide technical support, and can be used as the film of total system grade product PHM
The decision model of capacitance kind device has achieved positive effect in terms of maintenance determines with predictive repairing.
It should be noted last that the above examples are only used to illustrate the technical scheme of the present invention and are not limiting.Although ginseng
It is described the invention in detail according to embodiment, those skilled in the art should understand that, to technical side of the invention
Case is modified or replaced equivalently the spirit and scope without departure from technical solution of the present invention, should all cover of the invention
In scope of the claims.
Claims (1)
1. a kind of thin-film capacitor life-span prediction method, characterized by the following steps:
One, the direct current capacitors of a standard is selected, test sample is N number of, and test method is as follows:
1, after capacitor is placed in the environment of 30 ± 2 DEG C at least 12 hours, proof voltage between terminal is carried out, test is held after five minutes
Amount loss；
2, capacitor is placed in the environment of 70 DEG C at least 12 hours；
3, at 70 DEG C, 2600VDC is applied to capacitor and is kept for 500 hours；
4, durability test proceeds to 500 hours, and capacitor should stop being powered, and cold in still air at ambient temperature
But, 1000 electric discharges, peak point current 1.4*4=5.6KA are carried out to sample；
5, from Step 2 to Step 4 is repeated；
During the test, every 96 hours, a capacitor's capacity is measured and recorded；
Two, the service life trend of capacitor obeys exponential distribution function f (x), and enabling x is the time, and y is test value (capacitance), record actual measurement
Value, wherein the test value of all samples takes weighted average under a certain specific time,Obtain measured value corresponding relationship
Table；
Three, distribution function f (x) is calculated, the method is as follows:
To y=aebxBoth sides take logarithm to obtain
Ln y=ln a+bx
It enablesc0=ln a, c1=b, then matched curve are
By yiAfter taking logarithm, former tables of data becomes new data table, to this new data, uses straight lineCarry out least square
Fitting
C=(c0, c1)T,
Normal equation isFor
Solve c0And c1
You can get it y=aebxThe value of middle a and b,
The capacitance under prediction other times is calculated by above-mentioned formula, the life prediction of capacitor is carried out with this.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110083955A (en) * | 2019-05-05 | 2019-08-02 | 西南交通大学 | The type selecting and design method of transmission system traction Support Capacitor |
| CN112782498A (en) * | 2019-11-11 | 2021-05-11 | 株洲中车时代电气股份有限公司 | Fault monitoring method and device for capacitor |
| CN113156281A (en) * | 2021-04-26 | 2021-07-23 | 深圳市汇北川电子技术有限公司 | Test method for checking voltage resistance of automobile capacitor |
| CN114093670A (en) * | 2021-11-24 | 2022-02-25 | 南通百正电子新材料股份有限公司 | Thin film capacitor, current circuit monitoring system thereof and service life prediction method |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004170361A (en) * | 2002-11-22 | 2004-06-17 | Yaskawa Electric Corp | Device for diagnosing capacitor lifetime and capacitor lifetime diagnosis method |
| CN101226218A (en) * | 2007-12-28 | 2008-07-23 | 西安电力机械制造公司 | Method for testing life of power condenser element |
| CN102033182A (en) * | 2010-12-10 | 2011-04-27 | 北京航空航天大学 | Method for predicting life of solid tantalum electrolytic capacitor |
| CN102590659A (en) * | 2012-01-31 | 2012-07-18 | 中国航天标准化研究所 | Method for evaluating storage life of capacitor by using acceleration tests |
| CN102590660A (en) * | 2012-01-31 | 2012-07-18 | 中国航天标准化研究所 | Method for estimating working life of capacitor |
| CN104950200A (en) * | 2015-05-28 | 2015-09-30 | 南通一品机械电子有限公司 | Energy-saving capacitor element service life testing method |
| CN106855596A (en) * | 2016-12-27 | 2017-06-16 | 深圳市汇北川电子技术有限公司 | A kind of life test method of new-energy automobile metallic film capacitor |
-
2018
- 2018-08-20 CN CN201810945057.7A patent/CN109142922A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004170361A (en) * | 2002-11-22 | 2004-06-17 | Yaskawa Electric Corp | Device for diagnosing capacitor lifetime and capacitor lifetime diagnosis method |
| CN101226218A (en) * | 2007-12-28 | 2008-07-23 | 西安电力机械制造公司 | Method for testing life of power condenser element |
| CN102033182A (en) * | 2010-12-10 | 2011-04-27 | 北京航空航天大学 | Method for predicting life of solid tantalum electrolytic capacitor |
| CN102590659A (en) * | 2012-01-31 | 2012-07-18 | 中国航天标准化研究所 | Method for evaluating storage life of capacitor by using acceleration tests |
| CN102590660A (en) * | 2012-01-31 | 2012-07-18 | 中国航天标准化研究所 | Method for estimating working life of capacitor |
| CN104950200A (en) * | 2015-05-28 | 2015-09-30 | 南通一品机械电子有限公司 | Energy-saving capacitor element service life testing method |
| CN106855596A (en) * | 2016-12-27 | 2017-06-16 | 深圳市汇北川电子技术有限公司 | A kind of life test method of new-energy automobile metallic film capacitor |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110083955A (en) * | 2019-05-05 | 2019-08-02 | 西南交通大学 | The type selecting and design method of transmission system traction Support Capacitor |
| CN110083955B (en) * | 2019-05-05 | 2022-03-15 | 西南交通大学 | Selection and design method of traction support capacitor of transmission system |
| CN112782498A (en) * | 2019-11-11 | 2021-05-11 | 株洲中车时代电气股份有限公司 | Fault monitoring method and device for capacitor |
| CN113156281A (en) * | 2021-04-26 | 2021-07-23 | 深圳市汇北川电子技术有限公司 | Test method for checking voltage resistance of automobile capacitor |
| CN113156281B (en) * | 2021-04-26 | 2024-03-22 | 深圳市汇北川电子技术有限公司 | Test method for checking voltage resistance performance of automobile capacitor |
| CN114093670A (en) * | 2021-11-24 | 2022-02-25 | 南通百正电子新材料股份有限公司 | Thin film capacitor, current circuit monitoring system thereof and service life prediction method |
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