CN109142404A - Back scattering imaging system, scanography system and backscatter images imaging method - Google Patents

Back scattering imaging system, scanography system and backscatter images imaging method Download PDF

Info

Publication number
CN109142404A
CN109142404A CN201811291946.2A CN201811291946A CN109142404A CN 109142404 A CN109142404 A CN 109142404A CN 201811291946 A CN201811291946 A CN 201811291946A CN 109142404 A CN109142404 A CN 109142404A
Authority
CN
China
Prior art keywords
signal
backscatter
back scattering
scanning
scanning mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201811291946.2A
Other languages
Chinese (zh)
Other versions
CN109142404B (en
Inventor
于昊
王伟珍
迟豪杰
刘必成
胡煜
孙尚民
李荐民
李元景
陈志强
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nuctech Jiangsu Science And Technology Co Ltd
Nuctech Co Ltd
Original Assignee
Nuctech Jiangsu Science And Technology Co Ltd
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Jiangsu Science And Technology Co Ltd, Nuctech Co Ltd filed Critical Nuctech Jiangsu Science And Technology Co Ltd
Priority to CN201811291946.2A priority Critical patent/CN109142404B/en
Publication of CN109142404A publication Critical patent/CN109142404A/en
Priority to PCT/CN2019/109936 priority patent/WO2020088198A1/en
Priority to PL437748A priority patent/PL437748A1/en
Application granted granted Critical
Publication of CN109142404B publication Critical patent/CN109142404B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The invention discloses a kind of back scattering imaging system, scanography system and backscatter images imaging methods.Back scattering imaging system includes: back scattering line source, the second scanning mode of the first scanning mode and sending scanning light beam that issue when back scattering line source is arranged to execute scanning with no-raster light beam;It carries on the back and dissipates detector, carry on the back scattered detector and detect the first backscatter signal in the case where the back scattering line source of back scattering imaging system is in the first scanning mode, detect the second backscatter signal in the case where back scattering line source is in the second scanning mode;Control device is connect with scattered detector signal is carried on the back, and is arranged to correct the second backscatter signal with the revise signal formed according to the first backscatter signal to obtain amendment backscatter signal, and form graphical information according to amendment backscatter signal;And imaging device, it is connect with control device signal, the backscatter images under the second scanning mode is generated according to graphical information.The backscatter images that the present invention obtains are more clear.

Description

Back scattering imaging system, scanography system and backscatter images imaging method
Technical field
The present invention relates to radiation monitoring technical field, in particular to a kind of back scattering imaging system, scanography system and Backscatter images imaging method.
Background technique
Existing scanography system can be divided into from image-forming principle angle checks system using the transmission of transmission imaging technique Two class product of system is checked with using the back scattering of back scattering imaging technology.
It transmits inspection system and forms transmission image, transmission image is to be located at the object other side after ray passes through object decaying Detector detect and the image that is formed, the transmission signal of ray reflect the information such as density and the thickness of inspected object, It can show the internal structure of object.Transmiting inspection system has ray penetration power strong, the good advantage of picture quality.
Back scattering checks that system utilizes compton effect,scattering, by the photon imaging of capture checking matter reflection, is formed and is dissipated Penetrate image.Dispersion image is to be formed by checking matter close to the ray signal that the object scatter of detector direction certain depth comes out 's.Since the Compton scattering of ray in the low atomic numbers substance such as explosive, drugs is stronger, back scattering checks that system can divide It distinguishes material and is highlighted out organic substance.
As it can be seen that utilizing the back scattering inspection system for transmiting inspection system and utilizing back scattering imaging technology of transmission imaging technique It unites each advantageous when checking container (such as loading space of container body, vehicle).By transmission imaging technique and back Scattering imaging Integration ofTechnology scanography system together can include transillumination imaging system and back scattering imaging system simultaneously, Both comprehensive advantage, but interference can be generated between its transillumination imaging system and back scattering imaging system.Due to back scattering at As the back scattering line source dosage of system is lower, back scattering imaging system will not interfere transmission image;And it generally transmits into As the transmitted ray source dosage of system is higher, backscatter images can be interfered.
The reason of backscatter images are interfered below in conjunction with Fig. 1 and Fig. 2 transmitted ray generated to transmitted ray source It is illustrated.
In scanography system transillumination imaging system and back scattering imaging system all can be vertical angle of view imaging system, It can also be the imaging system of horizontal view angle, can also simultaneously include the imaging system and the imaging of horizontal view angle of vertical angle of view System etc..Fig. 1 be scanography system transillumination imaging system and back scattering imaging system be vertical angle of view imaging system When backscatter images interference principle figure.Fig. 2 is the transillumination imaging system of scanography system and back scattering imaging system is water Look squarely the backscatter images interference principle figure when imaging system at angle.
In Fig. 1 and Fig. 2, the transmitted ray that transmitted ray source issues is received after penetrating checking matter by transmission detectors, is transmitted The received backscatter signal of detector is converted into the transmission image of checking matter;The ray that back scattering line source issues is anti-through checking matter Detector reception is dissipated by carrying on the back after penetrating, carries on the back and dissipates the backscatter images that the received backscatter signal of detector is converted into checking matter.But It is that transmitted ray during the scanning process, is radiated at ground (such as Fig. 1) or scattered ray that checking matter (such as Fig. 2) is formed afterwards can also It is received with being carried on the back scattered detector, to be interfered to backscatter images.In Fig. 1 and Fig. 2,Represent transmitted ray photograph The scattered ray for dissipating detector and receiving is carried on the back after scattering caused by penetrating on the ground, is the interference signal of backscatter images;Represent back scattering line source be radiated at scattering is caused on checking matter after carried on the back and dissipate the scattered ray that receives of detector, for back The useful signal of dispersion image.The back scattering ray formed after different body surfaces is radiated to do caused by backscatter images It disturbs when not consistent or even transmitted ray is radiated at during the scanning process on the different location of checking matter and backscatter images is caused Interference be also not quite similar.
Summary of the invention
The purpose of the present invention is to provide a kind of back scattering imaging system, scanography system and backscatter images imaging sides Method.
First aspect present invention provides a kind of back scattering imaging system, comprising:
Back scattering line source is swept when the back scattering line source is arranged to execute scanning with no-raster light beam issues first It retouches state and issues the second scanning mode of scanning light beam;
It carries on the back and dissipates detector, the back scattering line source for dissipating detector in the back scattering imaging system of carrying on the back is in described first The first backscatter signal is detected under scanning mode, and the second back is detected in the case where the back scattering line source is in second scanning mode Scattered signal;
Control device dissipates detector signal with the back and connect, is arranged to according to the first backscatter signal shape At revise signal correct second backscatter signal to obtain amendment backscatter signal, and according to amendment back scattering letter Number formed graphical information;With
Imaging device is connect with the control device signal, generates second scanning mode according to the graphical information Under backscatter images.
In some embodiments, the back scattering line source is set at time of first scanning mode and is in The ratio of the sum of the time of first scanning mode and second scanning mode is 1%~51%.
In some embodiments, the back scattering line source includes radiographic source and flying spot device, wherein the flying spot device packet It includes the flywheel for being provided with line hole and is provided with the fan-shaped box of collimating slit or the flying spot device includes the rotation for being provided with collimating slit Rotating cylinder.
In some embodiments, the back scattering imaging system includes velocity sensor, and the velocity sensor is for surveying Amount checking matter and the relative moving speed of the back scattering imaging system are to form speed signal, the control device and the speed It spends sensor signal connection and second backscatter signal is corrected according to the speed signal and first backscatter signal Form the amendment backscatter signal.
In some embodiments, there is the first scanning shape when the back scattering line source is arranged to carry out each column scan State continuously performs when two column or more scan with first scanning mode.
Second aspect of the present invention provides a kind of scanography system, including back described in any one of first aspect present invention Scatter imaging system.
In some embodiments, scanography system further includes transmission inspection system.
Third aspect present invention provides a kind of backscatter images imaging method of back scattering imaging system, comprising:
The back of the back scattering imaging system dissipates detector and sweeps in the back scattering line source execution of the back scattering imaging system The first backscatter signal is detected under the first scanning mode that no-raster light beam issues when retouching;
Described carry on the back dissipates detector when the back scattering line source is executed and scanned in the second scanning mode for issuing scanning light beam The second backscatter signal of lower detection;
Second backscatter signal is corrected with the revise signal formed according to first backscatter signal to be repaired Positive backscatter signal, and graphical information is formed according to the amendment backscatter signal;
The backscatter images under second scanning mode are generated according to the graphical information.
In some embodiments, it is dissipated with the revise signal amendment formed according to first backscatter signal second back It includes subtracting the revise signal and correction factor with second backscatter signal that signal, which is penetrated, to obtain amendment backscatter signal Product form the amendment backscatter signal.
In some embodiments, the range of the correction factor is 0.8 to 1.2.
In some embodiments, with when the back scattering line source one column scan of every execution under first scanning mode One first backscatter signal or with when the back scattering line source one column scan of every execution under first scanning mode Two or more first backscatter signals mean value corrected as the revise signal when executing the column scan described the Two backscatter signals.
In some embodiments, in the first scanning shape when continuously performing two column or more scanning with the back scattering line source First backscatter signal under state or when continuously performing two column or more scanning with the back scattering line source described the The mean value of two or more first backscatter signal under one scanning mode executes two column as revise signal amendment Second backscatter signal when above scanning.
In some embodiments, with two or more first back under first scanning mode of same column scan The mean value of scattered signal executes second backscatter signal when two column or more scanning as revise signal amendment;Or Using the mean value of two or more first backscatter signal under first scanning mode of at least two column scans as institute State second backscatter signal when revise signal amendment executes two column or more scanning.
In some embodiments, two or more described first is chosen under first scanning mode of each column scan Backscatter signal, using the mean value for whole first backscatter signal being selected as the revise signal amendment execute this two Second backscatter signal more than column when scanning.
In some embodiments, comprising:
The relative moving speed of checking matter and the back scattering imaging system is measured to form speed signal;
Revise signal amendment second back formed according to the speed signal and first backscatter signal Scattered signal forms the amendment backscatter signal.
In some embodiments, the speed signal shows that the relative moving speed is greater than predetermined relative moving speed When, using the mean value of two or more first backscatter signals under first scanning mode of same column scan as repairing Positive signal amendment executes second backscatter signal when two column or more scanning;The speed signal shows the opposite shifting When dynamic speed is less than or equal to the predetermined relative moving speed, under first scanning mode of at least two column scans The mean value of more than two first backscatter signals executes this two column is above described the when scanning as revise signal amendment Two backscatter signals.
Based on back scattering imaging system provided by the invention, scanography system and backscatter images imaging method, first Backscatter signal is that back scattering line source does not issue the backscatter signal measured when scanning light beam, and the first backscatter signal can be considered week The interference signal that the interference ray in collarette border generates when back scattering imaging system is executed and checked, the second backscatter signal can be considered The interference ray of reflection light and ambient enviroment that the scanning light that back scattering line source issues is got to after checking matter mixes shape At useful signal and interference signal integrated signal, with formed according to the first backscatter signal revise signal amendment second back Scattered signal forms amendment backscatter signal, and the backscatter images under the second scanning mode are formed on the basis of revise signal, Then the influence of interference signal can be at least partly removed on the basis of integrated signal, to make the backscatter images obtained more Clearly.
By referring to the drawings to the detailed description of exemplary embodiment of the present invention, other feature of the invention and its Advantage will become apparent.
Detailed description of the invention
The drawings described herein are used to provide a further understanding of the present invention, constitutes part of this application, this hair Bright illustrative embodiments and their description are used to explain the present invention, and are not constituted improper limitations of the present invention.In the accompanying drawings:
When Fig. 1 is the transillumination imaging system of scanography system and back scattering imaging system is the imaging system of vertical angle of view Backscatter images interference principle figure.
When Fig. 2 is the transillumination imaging system of scanography system and back scattering imaging system is the imaging system of horizontal view angle Backscatter images interference principle figure.
Fig. 3 is the planar structure signal of the principle of back scattering line source in the back scattering imaging system of scanography system Figure.
Fig. 4 is the stereochemical structure signal of the principle of back scattering line source in the back scattering imaging system of scanography system Figure.
Fig. 5 is that the back scattering imaging system of scanography system is not transmitted the scattering that the transmitted ray of imaging system is formed The backscatter images of ray interference.
Fig. 6 penetrates for the scattering that the transmitted ray that the back scattering imaging system of scanography system is transmitted imaging system is formed The backscatter images for not removing interference that line generates when interfering.
Fig. 7 penetrates for the scattering that the transmitted ray that the back scattering imaging system of scanography system is transmitted imaging system is formed The backscatter images that the backscatter images imaging method removal of an embodiment is interfered through the invention when line interferes.
Fig. 8 penetrates for the scattering that the transmitted ray that the back scattering imaging system of scanography system is transmitted imaging system is formed The backscatter images that the backscatter images imaging method removal of another embodiment is interfered through the invention when line interferes.
Fig. 9 penetrates for the scattering that the transmitted ray that the back scattering imaging system of scanography system is transmitted imaging system is formed The backscatter images that the backscatter images imaging method removal of another embodiment is interfered through the invention when line interferes.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.Below Description only actually at least one exemplary embodiment be it is illustrative, never as to the present invention and its application or make Any restrictions.Based on the embodiments of the present invention, those of ordinary skill in the art are not making creative work premise Under every other embodiment obtained, shall fall within the protection scope of the present invention.
Unless specifically stated otherwise, positioned opposite, the digital table of the component and step that otherwise illustrate in these embodiments It is not limited the scope of the invention up to formula and numerical value.Simultaneously, it should be appreciated that for ease of description, each portion shown in attached drawing The size divided not is to draw according to actual proportionate relationship.For technology, side known to person of ordinary skill in the relevant Method and equipment may be not discussed in detail, but in the appropriate case, and the technology, method and apparatus should be considered as authorizing explanation A part of book.In shown here and discussion all examples, any occurrence should be construed as merely illustratively, and Not by way of limitation.Therefore, the other examples of exemplary embodiment can have different values.It should also be noted that similar label Similar terms are indicated in following attached drawing with letter, therefore, once it is defined in a certain Xiang Yi attached drawing, then subsequent attached It does not need that it is further discussed in figure.
In the description of the present invention, it is to be understood that, components are limited using the words such as " first ", " second ", only It is merely for convenience of distinguishing corresponding components, there is no Stated otherwise such as, there is no particular meanings for above-mentioned word, therefore not It can be interpreted as limiting the scope of the invention.
In the description of the present invention, it is to be understood that, the noun of locality such as " front, rear, top, and bottom, left and right ", " it is laterally, vertical, Vertically, orientation indicated by level " and " top, bottom " etc. or position are merely for convenience of description of the present invention and simplification of the description, not In the case where making opposite explanation, these nouns of locality do not indicate that and imply that signified device or element must have a particular orientation Or it is constructed and operated in a specific orientation, therefore should not be understood as limiting the scope of the invention;The noun of locality " inside and outside " Refer to inside and outside the profile relative to each component itself.
The embodiment of the present invention provides a kind of back scattering imaging system, mainly includes back scattering line source, carries on the back scattered detector, control Device and imaging device.
The first scanning mode and sending with the sending of no-raster light beam when back scattering line source is arranged to execute scanning are swept Retouch the second scanning mode of light beam.It carries on the back and dissipates detector in the case where the back scattering line source of back scattering imaging system is in the first scanning mode The first backscatter signal is detected, detects the second backscatter signal in the case where back scattering line source is in the second scanning mode.Control device It dissipates detector signal with carrying on the back and connect, control device is arranged to be corrected the according to the first backscatter signal with the revise signal that is formed Two backscatter signals form graphical information according to amendment backscatter signal to obtain amendment backscatter signal.Imaging device with Control device signal connection, for generating the backscatter images under the second scanning mode according to graphical information.
In the back scattering imaging system of above embodiments, the first backscatter signal is that back scattering line source does not issue scanning light beam When the backscatter signal that measures, the first backscatter signal can be considered that the interference ray of ambient enviroment executes back scattering imaging system The interference signal generated when inspection, after the second backscatter signal can be considered that the scanning light that back scattering line source issues gets to checking matter The interference ray of reflection light and ambient enviroment mixes the integrated signal for the useful signal and interference signal to be formed, and uses root Correct the amendment backscatter signal that the second backscatter signal is formed according to the revise signal that the first backscatter signal is formed, then it can be The influence of interference signal is at least partly removed on the basis of integrated signal, so that the backscatter images obtained be made to be more clear.
Wherein interference ray can be any interference ray in environment, such as can be from same scanography System or different scanning check the transillumination imaging system of system or the interference of other back scattering imaging systems.For by transmission imaging Scanography system of the system together with the back scattering imaging system integration, can reduce transillumination imaging system to back scattering imaging system The interference of system.
In some embodiments, the time that back scattering line source is set at the first scanning mode is scanned in first The ratio of the sum of the time of state and the second scanning mode is 1%~51%.Such as the ratio between the time can be set to 3%, 5%, 8%, 10%, 12%, 15%, 18%, 25%, 35%, 40%, 50% etc..
Back scattering line source includes radiographic source and flying spot device, wherein flying spot device can be various forms, such as Fig. 3 and In embodiment shown in Fig. 4, radiographic source is X-ray machine, and flying spot device includes being provided with the flywheel 1 in line hole and being provided with collimating slit Fan-shaped box 2.
Wherein, Fig. 3 is the planar structure of the principle of back scattering line source in the back scattering imaging system of scanography system Schematic diagram, Fig. 4 are the schematic perspective view of the principle of back scattering line source in the back scattering imaging system of scanography system.
As shown in Figure 3 and Figure 4, flying spot device includes flywheel 1 and fan-shaped box 2.Flywheel 1 can be rotated relative to fan-shaped box 2.Fly 1 is taken turns including wheel disc and wheel disc periphery is set and covers in the wheel rim of fan-shaped 2 radial outside of box, the circumferential setting radial direction along wheel rim goes out Several line holes of light.Fan-shaped box 2 is coaxially disposed within wheel disc side with wheel disc, and is located at the radially inner side of wheel rim, fan-shaped The center point of box 2 is provided with the light admitting aperture for going out the X-ray that beam spot G is issued for receiving X-ray machine, sets on the arcwall face of fan-shaped box 2 It is equipped with the collimating slit of X-ray, in the present embodiment, the circumferential angle of collimating slit is the light-emitting angle of fan-shaped box 2.Only have in each line hole When being in the output optical zone domain of light-emitting angle covering of fan-shaped box 2, X-ray could be penetrated, each line hole is in the light out of fan-shaped box 2 X-ray cannot be penetrated when other than region.
In Fig. 3 and embodiment shown in Fig. 4, O is the center of circle of flywheel 1, and there are four line holes for setting on flywheel 1, respectively For line hole a, line hole b, line hole c, line hole d.Every two adjacent line hole circumferentially has 90 in four line holes The interval angles of degree.The light-emitting angle of fan-shaped box 2 is less than the interval angles of adjacent beam discharge orifice, i.e., each line hole penetrates the angle of ray Degree is less than 90 degree, such as when light-emitting angle accounts for the 90% of adjacent beam discharge orifice interval angles, i.e., light-emitting angle is 81 degree, there is 10% Angle X-ray can not be transmitted on checking matter through flying spot device.
In Fig. 3 and Fig. 4, two endpoints of collimating slit are respectively first end point E and the second endpoint F, center of circle O and first end point Angle between the line OE and center of circle O of E and the line OF of the second endpoint F is light-emitting angle, light-emitting angle in the present embodiment It is 81 degree.In the present embodiment, first end point E is located at an edge (being located at top edge in figs. 3 and 4) for fan-shaped box 2, and second Endpoint F is located at another edge (being located at lower edge in figs. 3 and 4) of fan-shaped box 2.
When four line holes a, b, c, d pass through the fan-shaped box 2 with 81 degree of light-emitting angle, dotted X-ray can be from Back scattering line source issues.For example, line hole a is by from first end point E to the second endpoint F's when flywheel 1 rotates clockwise During 81 degree of light-emitting angles, dotted X-ray issues in the range of from first end point E to the second endpoint F, line hole a just from When removing positioned at the second endpoint F of fan-shaped 2 lower edge of box, line hole b does not enter the output optical zone domain of fan-shaped box 2 also, and apart from position In the first end point E of fan-shaped 2 top edge of box, there are also 9 degree of intervals.And so on, when line hole b is just following from fan-shaped box 2 is located at When second endpoint F of edge is removed, line hole c does not enter the output optical zone domain of fan-shaped box 2 also, and distance is located at 2 top edge of fan-shaped box First end point E there are also 9 degree;When line hole c is just removed from the second endpoint F for being located at 2 lower edge of fan-shaped box, line hole d is also The output optical zone domain of fan-shaped box 2 is not entered, and there are also 9 degree positioned at the first end point E of 2 top edge of fan-shaped box for distance;When line hole, d is rigid When removing from the second endpoint F for being located at 2 lower edge of fan-shaped box, line hole a does not enter the output optical zone domain of fan-shaped box 2, and distance also Positioned at the first end point E of fan-shaped 2 top edge of box, there are also 9 degree.
In Fig. 3 into embodiment shown in Fig. 4, flywheel 1 has just left the second endpoint F of fan-shaped box 2 from a line hole When from start next column scan, when each column scan starts, i.e., will enter the line hole in the output optical zone domain of fan-shaped box 2 due to not Ray can be issued, therefore back scattering line source is in the first scanning mode for not issuing scanning light beam at this time, the line hole is by fan Ray is issued when the output optical zone domain of shape box 2, therefore back scattering line source is in the second scanning mode for issuing scanning light beam at this time.It can See, in the present embodiment, back scattering line source all has the first scanning mode when executing each column scan.
Since in normal scan, flywheel 1 at the uniform velocity rotates, therefore, in the present embodiment, when since each column scan, place When the angle that corresponding line hole rotation is passed through when the first scanning mode is with the first scanning mode and the second scanning mode is in The ratio of interval angles between the light-emitting angle and adjacent beam discharge orifice of the i.e. fan-shaped box 2 of the ratio between angle that line hole rotation is passed through With the ratio of the aforementioned time for being in the first scanning mode and the sum of the time for being in the first scanning mode and the second scanning mode It is consistent.Therefore, in the present embodiment, the time in the first scanning mode scans shape in the first scanning mode and second The ratio of the sum of the time of state is 10%.
In embodiment (not shown), the quantity and arrangement mode in line hole are not limited to the form of Fig. 3 and Fig. 4.For example, The quantity in line hole can be set to 3, the setting of 120 degree of 3 line holes interval.
The ratio of interval angles between the light-emitting angle and adjacent beam discharge orifice of fan-shaped box 2 is not limited to 10%, can basis Concrete condition is suitably set, for example, in some embodiments, can be set to a certain numerical value between 5%~20%, for example, It can be set to 6%, 8%, 12%, 15%, 18% etc., in further embodiments, may be set to be 5% hereinafter, only Can guarantee can at least obtain first backscatter signal, such as a certain numerical value in 1%~5%, in other realities It applies in example, may be set to be 20% or more, such as 20%~51% a certain numerical value.
Control device be, for example, can be implemented as computer for executing function described in the invention, general processor, Programmable logic controller (PLC) (PLC), digital signal processor (DSP), specific integrated circuit (ASIC), field programmable gate array (FPGA) etc..
In some embodiments, back scattering imaging system includes velocity sensor.Velocity sensor is for measuring checking matter Relative moving speed with back scattering imaging system is to form speed signal.Control device is connect to connect with speed sensor signal It receives speed signal and corrects the second backscatter signal shape with according to the revise signal of speed signal and the formation of the first backscatter signal At amendment backscatter signal.An amendment is shared when a few column scans for example, can use when aforementioned relative movement speed is lower The mode of signal is modified the second backscatter signal, when aforementioned relative movement speed is higher can each column scan with from Revise signal mode to the second backscatter signal when row correct.
The back scattering line source of back scattering imaging system has the first scanning mode when can be set to execute each column scan Or it can be set to that there is the first scanning mode when continuously performing two column or more scanning.
The embodiment of the present invention also provides a kind of scanography system of back scattering imaging system including previous embodiment.It should In scanography system, it is possible to reduce environment or scanography internal system disturbing factor do the back scattering imaging system It disturbs.
The scanography system can also include transmission inspection system.Transmission imaging can be reduced using the scanography system Interference of the system to back scattering imaging system.The transmitted ray source of transillumination imaging system can be x ray machine or isotopic source etc. and hold The transmitted ray source of continuous output line.
The embodiment of the present invention also provides a kind of backscatter images imaging method of back scattering imaging system, comprising: back scattering The back of imaging system dissipate detector no-raster light beam issue when the back scattering line source of back scattering imaging system executes scanning the The first backscatter signal is detected under one scanning mode;It carries on the back and dissipates detector sending scanning light beam when back scattering line source is executed and scanned The second backscatter signal is detected under second scanning mode;With the second back of revise signal amendment formed according to the first backscatter signal Scattered signal is to obtain being formed amendment backscatter signal and form graphical information according to amendment backscatter signal;According to graphical information Generate the backscatter images under the second scanning mode.
The back scattering imaging system of backscatter images imaging method and present invention based on the embodiment of the present invention It unites advantage having the same, the influence of interference signal can be at least partly removed on the basis of integrated signal, to make to obtain Backscatter images it is truer.
Fig. 5 is that the back scattering imaging system of scanography system is not transmitted the scattering that the transmitted ray of imaging system is formed The backscatter images of ray interference.Fig. 6 penetrates for the transmission that the back scattering imaging system of scanography system is transmitted imaging system The backscatter images for not removing interference generated when the scattered ray interference that line is formed.Comparison diagram 5 and Fig. 6 are it is found that by transmiting into The scattered ray formed as the transmitted ray of system generates what the backscatter images formed after interference were disturbed to backscatter images Parts of images is unintelligible, and whole image quality is poor.
Fig. 7 penetrates for the scattering that the transmitted ray that the back scattering imaging system of scanography system is transmitted imaging system is formed The backscatter images that the backscatter images imaging method removal of an embodiment is interfered through the invention when line interferes.Fig. 8 is scanning By this hair when the scattered ray interference that the transmitted ray that the back scattering imaging system of inspection system is transmitted imaging system is formed The backscatter images of the backscatter images imaging method removal interference of bright another embodiment.Fig. 9 is that the back of scanography system dissipates Penetrate when imaging system is transmitted the scattered ray interference that the transmitted ray of imaging system is formed another embodiment through the invention The backscatter images of backscatter images imaging method removal interference.Comparison diagram 7 to 9 and Fig. 5 and Fig. 6 are it is found that utilizing the present invention After the interference for the scattered ray that the transmitted ray of the backscatter images imaging method removal transillumination imaging system of each embodiment is formed, Situation of the backscatter images closer to no transillumination imaging system interference shown in fig. 6 under second scanning mode, backscatter images General image is clear, and image quality is preferable.
Fig. 5 into Fig. 9, with the region that height h is marked be line hole do not enter fan-shaped box 2 also output optical zone domain when ( Under one scanning mode) according to the dispersion image of the first backscatter signal formation detected, which is background; Back scattering figure when background region below, as line hole have entered the output optical zone domain of fan-shaped box 2 (under the second scanning mode) Picture.The second backscatter signal, which is corrected, with the revise signal formed according to the first backscatter signal forms amendment backscatter signal, and The backscatter images that the second scanning mode is formed according to the graphical information that amendment backscatter signal is formed, substantially sweep second It retouches in the backscatter images under state and deducts background, the image quality of the backscatter images under the second scanning mode can be improved.
As shown in Figure 7 to 9, can be different with the specific method that the first backscatter signal forms revise signal, generation Final effect also difference, but can realize the purpose for improving backscatter images quality.
In some embodiments, correcting the second backscatter signal to form amendment backscatter signal with revise signal includes with the Two backscatter signals subtract revise signal and the product of correction factor forms amendment backscatter signal.For example, the model of correction factor Enclose is 0.8 to 1.2.It such as can be 0.85,0.90,0.95,0.98,1.0,1.03,1.05,1.08,1.12,1.15,1.17 Deng.Preferably, in the present embodiment, correction factor 1.
In some embodiments, one when can execute a column scan so that back scattering line source is every under the first scanning mode First backscatter signal corrects the second backscatter signal when executing the column scan as revise signal.Hereinafter referred to as this kind of amendment side Method is single-point modification method.
Fig. 7 is to use to scan under the first state that single-point modification method the second backscatter signal of amendment is formed with second Common backscatter images under state.Wherein as the first backscatter signal of revise signal, it can be and execute the column scan When any one first backscatter signal in the first state.Detector is dissipated for example, carrying on the back when if executing a column scan 8 the first backscatter signals are measured under one state altogether, then can take any one in 8 the first backscatter signals, such as with 4th or the 6th the first backscatter signal are as revise signal.
In some embodiments, two when can execute a column scan so that back scattering line source is every under the first scanning mode The mean value of above first backscatter signal corrects the second backscatter signal when executing the column scan as revise signal.Hereinafter referred to as This kind of modification method is single-row multi-point average modification method.
Fig. 8 be use single-row multi-point average modification method correct under the first state that the second backscatter signal is formed and Common backscatter images under second scanning mode.Wherein as the first backscatter signal for forming revise signal, can be Any two or more than two first backscatter signals when executing the column scan in the first state.For example, if executing one Scattered detector is carried on the back when column scan and measures 8 the first backscatter signals altogether in the first state, then can take 8 the first back scatterings letters Any several mean value in number, for example, the 4th and the 6th the first backscatter signal mean value or the 3rd, the 5th and the 7th The mean value of a first backscatter signal, or all 8 the first backscatter signals mean value as revise signal etc..
In some embodiments, in the first scanning mode when can also continuously perform two column or more scanning with back scattering line source Under the second back when executing the above scanning of two column as revise signal amendment of the mean value of the first backscatter signal of two or more Scattered signal.Hereinafter referred to as this kind of modification method is multiple row multi-point average modification method.
For example, can be with the mean value of the first backscatter signal of two or more under the first scanning mode of same column scan The second backscatter signal when two column or more scanning is executed as revise signal amendment.
For another example can be with the first backscatter signal of two or more under the first scanning mode of at least two column scans Mean value executes the second backscatter signal when two column or more scanning as revise signal amendment.Wherein it is possible to be swept in each column More than two first backscatter signals are chosen under the first scanning mode retouched, with all the first backscatter signals for being selected Mean value executes the second backscatter signal when two column or more scanning as revise signal amendment.
Fig. 9 be use multiple row multi-point average modification method correct the second backscatter signal formed first state under and Common backscatter images under second scanning mode.Wherein as the first backscatter signal for forming revise signal, can be Execute any two when two column or more scan in the first state or more than two first backscatter signals.For example, if More than two column scanning is 3 column scans, and back dissipates detector and can measure 8 first in the first state and carry on the back and dissipates when executing each column scan Signal is penetrated, then shares 24 the first backscatter signals, any several mean value in 24 the first backscatter signals, example can be taken Each column are swept in the mean value or 3 column scans of the 4th and the 6th the first backscatter signal in such as 3 column scans when each column scan The mean value of the 3rd, the 5th and the 7th the first backscatter signal when retouching, or all the mean value of 24 the first backscatter signals is made For revise signal etc..
Using single-row multi-point average modification method and multiple row multi-point average modification method relative to using single-point modification method For, the interference signal removed in the second backscatter signal is average, the backscatter images under the second obtained scanning mode It is apparent.
In some embodiments, in the first scanning mode when can also continuously perform two column or more scanning with back scattering line source Under second backscatter signal of first backscatter signal when executing the above scanning of two column as revise signal amendment.
In some embodiments, backscatter images imaging method can also include: measurement checking matter and back scattering imaging system The relative moving speed of system is to form speed signal;It is repaired with according to the revise signal of speed signal and the formation of the first backscatter signal Positive second backscatter signal forms amendment backscatter signal.
For example, when speed signal shows that relative moving speed is greater than predetermined relative moving speed, in same column scan The mean value of the first backscatter signal of two or more under first scanning mode executes two column or more as revise signal amendment and sweeps The second backscatter signal (single-row multiple spot modification method) when retouching.For another example speed signal show relative moving speed be less than or When equal to predetermined relative moving speed, with the first back scattering of two or more letter under the first scanning mode of at least two column scans Number second backscatter signal (multiple row multiple spot amendment side of mean value when executing the above scanning of two column as revise signal amendment Method).
When relative moving speed is greater than predetermined relative moving speed, the background of adjacent column backscatter images is changed greatly, It is conducive to guarantee the total quality of backscatter images using the second backscatter signal is corrected using single-row multiple spot modification method;When opposite When movement speed is less than or equal to predetermined relative moving speed, the background variation of adjacent column backscatter images is little, using multiple row Multiple spot modification method, which corrects the second backscatter signal, can save calculating required time and workload.
Above embodiments are not intended to restrict the invention, for example, the flying spot device of back scattering line source includes being provided with collimation The rotating cylinder of seam.In order to make back scattering line source that there is aforementioned first scanning mode and the second scanning mode when executing scanning, make Corresponding entering light collimating slit and light collimating slit is equipped with to issue rotating cylinder not when rotating to Partial angle out on rotating cylinder Scanning light beam.For example, when designing the collimating slit position of rotating cylinder, in each swing circle of rotating cylinder, setting For that can not penetrate from flying spot device in a certain proportion of angle inner rays, the first backscatter signal can measure at this time.
Finally it should be noted that: the above embodiments are merely illustrative of the technical scheme of the present invention and are not intended to be limiting thereof;To the greatest extent The present invention is described in detail with reference to preferred embodiments for pipe, it should be understood by those ordinary skilled in the art that: still It can modify to a specific embodiment of the invention or some technical features can be equivalently replaced;Without departing from this hair The spirit of bright technical solution should all cover within the scope of the technical scheme claimed by the invention.

Claims (16)

1. a kind of back scattering imaging system characterized by comprising
Back scattering line source, the first scanning shape issued when the back scattering line source is arranged to execute scanning with no-raster light beam State and the second scanning mode for issuing scanning light beam;
It carries on the back and dissipates detector, the back scattering line source for dissipating detector in the back scattering imaging system of carrying on the back is in first scanning The first backscatter signal is detected under state, detects the second back scattering in the case where the back scattering line source is in second scanning mode Signal;
Control device dissipates detector signal and connect with described carry on the back, and is arranged to being formed according to first backscatter signal Revise signal corrects second backscatter signal to obtain amendment backscatter signal, and according to the amendment backscatter signal shape At graphical information;With
Imaging device is connect with the control device signal, is generated under second scanning mode according to the graphical information Backscatter images.
2. back scattering imaging system according to claim 1, which is characterized in that the back scattering line source is set at The ratio of the time of first scanning mode and the sum of time in first scanning mode and second scanning mode Value is 1%~51%.
3. back scattering imaging system according to claim 1, which is characterized in that the back scattering line source include radiographic source and Flying spot device, wherein the flying spot device includes the flywheel (1) for being provided with line hole and the fan-shaped box (2) for being provided with collimating slit, Or the flying spot device includes the rotating cylinder for being provided with collimating slit.
4. back scattering imaging system according to claim 1, which is characterized in that the back scattering imaging system includes speed Sensor, the velocity sensor are used to measure the relative moving speed of checking matter and the back scattering imaging system to form speed Signal is spent, the control device connect with the speed sensor signal and according to the speed signal and first back scattering Second backscatter signal described in signal correction forms the amendment backscatter signal.
5. back scattering imaging system according to claim 1, which is characterized in that the back scattering line source is arranged to carry out often There is first scanning mode with first scanning mode when one column scan or when continuously performing two column or more scanning.
6. a kind of scanography system, which is characterized in that including back scattering imaging system described in any one of claims 1 to 5 System.
7. scanography system according to claim 6, which is characterized in that further include transmission inspection system.
8. a kind of backscatter images imaging method of back scattering imaging system characterized by comprising
The back of the back scattering imaging system dissipates detector when the back scattering line source of the back scattering imaging system executes scanning The first backscatter signal is detected under the first scanning mode that no-raster light beam issues;
Described carry on the back dissipates detector when the back scattering line source is executed and scanned in the second scanning mode test for issuing scanning light beam Survey the second backscatter signal;
Second backscatter signal is corrected with the revise signal formed according to first backscatter signal to obtain amendment back Scattered signal, and graphical information is formed according to the amendment backscatter signal;
The backscatter images under second scanning mode are generated according to the graphical information.
9. backscatter images imaging method according to claim 8, which is characterized in that believed with according to first back scattering It includes scattered with second back that number revise signal formed, which corrects second backscatter signal to obtain amendment backscatter signal, Penetrate that signal subtracts the revise signal and the product of correction factor forms the amendment backscatter signal.
10. backscatter images imaging method according to claim 9, which is characterized in that the range of the correction factor is 0.8 to 1.2.
11. backscatter images imaging method according to claim 8, which is characterized in that often held with the back scattering line source First backscatter signal or every with back scattering line source when one column scan of row under first scanning mode Described in the mean value of two or more first backscatter signal when executing a column scan under first scanning mode is used as Revise signal amendment executes second backscatter signal when column scan.
12. backscatter images imaging method according to claim 8, which is characterized in that continuous with the back scattering line source Execution two arranges above first backscatter signal when scanning under first scanning mode or with the back scattering Line source continuously performs two or more first backscatter signals when two column or more scan under first scanning mode Mean value executes second backscatter signal when two column or more scanning as revise signal amendment.
13. backscatter images imaging method according to claim 12, which is characterized in that
Using the mean value of two or more first backscatter signals under first scanning mode of same column scan as The revise signal amendment executes second backscatter signal when two column or more scanning;Or
Made with the mean value of two or more first backscatter signal under first scanning mode of at least two column scans Second backscatter signal when two column or more scanning is executed for revise signal amendment.
14. backscatter images imaging method according to claim 13, which is characterized in that described the of each column scan More than two first backscatter signals are chosen under one scanning mode, with the whole being selected first backscatter signal Second backscatter signal of mean value when executing the above scanning of two column as revise signal amendment.
15. the backscatter images imaging method according to any one of claim 8 to 14 characterized by comprising
The relative moving speed of checking matter and the back scattering imaging system is measured to form speed signal;
Second back scattering is corrected according to the revise signal that the speed signal and first backscatter signal are formed Signal forms the amendment backscatter signal.
16. backscatter images imaging method according to claim 15, which is characterized in that the speed signal shows described Relative moving speed be greater than predetermined relative moving speed when, with two under first scanning mode of same column scan with Second back when mean value of upper first backscatter signal executes two column or more scanning as revise signal amendment dissipates Penetrate signal;The speed signal show the relative moving speed be less than or equal to the predetermined relative moving speed when, with The mean value of two or more first backscatter signal under first scanning mode of at least two column scans is as amendment letter Number amendment executes second backscatter signal when above scanning of two column.
CN201811291946.2A 2018-11-01 2018-11-01 Back-scattering imaging system, scanning inspection system and back-scattering image imaging method Active CN109142404B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CN201811291946.2A CN109142404B (en) 2018-11-01 2018-11-01 Back-scattering imaging system, scanning inspection system and back-scattering image imaging method
PCT/CN2019/109936 WO2020088198A1 (en) 2018-11-01 2019-10-08 Backscatter imaging system, scanning inspection system, and backscatter imaging method
PL437748A PL437748A1 (en) 2018-11-01 2019-10-08 Backscatter imaging system, scanning inspection system, and backscatter imaging method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811291946.2A CN109142404B (en) 2018-11-01 2018-11-01 Back-scattering imaging system, scanning inspection system and back-scattering image imaging method

Publications (2)

Publication Number Publication Date
CN109142404A true CN109142404A (en) 2019-01-04
CN109142404B CN109142404B (en) 2024-06-11

Family

ID=64807443

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201811291946.2A Active CN109142404B (en) 2018-11-01 2018-11-01 Back-scattering imaging system, scanning inspection system and back-scattering image imaging method

Country Status (3)

Country Link
CN (1) CN109142404B (en)
PL (1) PL437748A1 (en)
WO (1) WO2020088198A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020088198A1 (en) * 2018-11-01 2020-05-07 同方威视技术股份有限公司 Backscatter imaging system, scanning inspection system, and backscatter imaging method

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1556921A (en) * 2002-11-06 2004-12-22 �����Ƽ����̹�˾ X-ray backscatter mobile inspection van
CN101501477A (en) * 2006-08-11 2009-08-05 美国科技工程公司 X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
CN202929217U (en) * 2012-08-21 2013-05-08 同方威视技术股份有限公司 Backscattering human body security check system capable of monitoring radioactive substances carried by human body
US20140226789A1 (en) * 2011-02-08 2014-08-14 Joseph Bendahan Covert Surveillance Using Multi-Modality Sensing
CN105607111A (en) * 2014-11-05 2016-05-25 中国科学院高能物理研究所 Gamma nuclide identification method
CN106442585A (en) * 2016-10-17 2017-02-22 北京君和信达科技有限公司 Back scattering radiation imaging system
CN106841256A (en) * 2017-02-17 2017-06-13 清华大学 Various visual angles back scattering inspection system and various visual angles back scattering inspection method
WO2017113831A1 (en) * 2015-12-29 2017-07-06 清华大学 Handheld backscatter imager and imaging method thereof
WO2018072074A1 (en) * 2016-10-18 2018-04-26 Shenzhen Xpectvision Technology Co., Ltd. Aradiation detector suitable for a pulsed radiation source
CN209148568U (en) * 2018-11-01 2019-07-23 同方威视技术股份有限公司 Back scattering imaging system and scanography system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN200947086Y (en) * 2006-05-19 2007-09-12 清华大学 Detector array and equipment
US9885962B2 (en) * 2013-10-28 2018-02-06 Kla-Tencor Corporation Methods and apparatus for measuring semiconductor device overlay using X-ray metrology
CN109142404B (en) * 2018-11-01 2024-06-11 同方威视技术股份有限公司 Back-scattering imaging system, scanning inspection system and back-scattering image imaging method

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1556921A (en) * 2002-11-06 2004-12-22 �����Ƽ����̹�˾ X-ray backscatter mobile inspection van
CN101501477A (en) * 2006-08-11 2009-08-05 美国科技工程公司 X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
US20140226789A1 (en) * 2011-02-08 2014-08-14 Joseph Bendahan Covert Surveillance Using Multi-Modality Sensing
CN202929217U (en) * 2012-08-21 2013-05-08 同方威视技术股份有限公司 Backscattering human body security check system capable of monitoring radioactive substances carried by human body
CN105607111A (en) * 2014-11-05 2016-05-25 中国科学院高能物理研究所 Gamma nuclide identification method
WO2017113831A1 (en) * 2015-12-29 2017-07-06 清华大学 Handheld backscatter imager and imaging method thereof
CN106442585A (en) * 2016-10-17 2017-02-22 北京君和信达科技有限公司 Back scattering radiation imaging system
WO2018072074A1 (en) * 2016-10-18 2018-04-26 Shenzhen Xpectvision Technology Co., Ltd. Aradiation detector suitable for a pulsed radiation source
CN106841256A (en) * 2017-02-17 2017-06-13 清华大学 Various visual angles back scattering inspection system and various visual angles back scattering inspection method
EP3364176A1 (en) * 2017-02-17 2018-08-22 Tsinghua University Multi-view backscatter inspection system and multi-view backscatter inspection method
CN209148568U (en) * 2018-11-01 2019-07-23 同方威视技术股份有限公司 Back scattering imaging system and scanography system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020088198A1 (en) * 2018-11-01 2020-05-07 同方威视技术股份有限公司 Backscatter imaging system, scanning inspection system, and backscatter imaging method

Also Published As

Publication number Publication date
CN109142404B (en) 2024-06-11
WO2020088198A1 (en) 2020-05-07
PL437748A1 (en) 2022-01-31

Similar Documents

Publication Publication Date Title
JP5054518B2 (en) Method and system for determining the average atomic number and mass of a substance
US7492862B2 (en) Computed tomography cargo inspection system and method
WO2017101471A1 (en) Liquid assay method and system
CN105849772B (en) Check system and method
CN102707324B (en) Backscatter and transmission combined safety detector of X rays
CN103852078B (en) The measuring method and device of space optics attitude sensor stray light shielding angle
KR20090046849A (en) Scatter attenuation tomography
AU2017265073B2 (en) Inspection devices, inspection methods and inspection systems
CN106841256A (en) Various visual angles back scattering inspection system and various visual angles back scattering inspection method
CN209148568U (en) Back scattering imaging system and scanography system
KR102033233B1 (en) Multi modal detection system and method
JP2010523950A (en) Method and measuring apparatus for generating a three-dimensional image of a measuring object using transmitted radiation
CN110325846A (en) Using the specimen inspection equipment of diffraction detector
CN107003420A (en) On the improvement scattered in X-ray apparatus and its application method
US20140056410A1 (en) Back-scatter human body security inspection system and scanning method thereof to detect radioactive matter
AU2023201587A1 (en) Detector assembly for use in CT imaging systems
CN106896121A (en) Detecting system and method
CN109142404A (en) Back scattering imaging system, scanography system and backscatter images imaging method
CN107957429A (en) Method for generating X-ray image data
CN206573504U (en) Various visual angles back scattering inspection system
CN202854352U (en) X-ray backscattering and transmission combined type safety detector
US9279892B2 (en) Systems and methods for scintillators having polished and roughened surfaces
US9091628B2 (en) 3D mapping with two orthogonal imaging views
KR101741246B1 (en) Apparatus and method for processing dual-mode radiation image using rotating modulation collimator
CN109324069A (en) A kind of scanner for X-ray transmission and back scattering integral imaging system

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant