CN109108594B - Splicing structure based on three sCMOS detectors - Google Patents
Splicing structure based on three sCMOS detectors Download PDFInfo
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- CN109108594B CN109108594B CN201810777383.1A CN201810777383A CN109108594B CN 109108594 B CN109108594 B CN 109108594B CN 201810777383 A CN201810777383 A CN 201810777383A CN 109108594 B CN109108594 B CN 109108594B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23P—METAL-WORKING NOT OTHERWISE PROVIDED FOR; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS
- B23P19/00—Machines for simply fitting together or separating metal parts or objects, or metal and non-metal parts, whether or not involving some deformation; Tools or devices therefor so far as not provided for in other classes
Abstract
The invention discloses a splicing structure based on three sCMOS detectors, which is characterized in that the three sCMOS detectors are spliced in a staggered way in the view field space according to a delta-shaped structure; taking the No. 1 detector above the delta shape as a reference, specifically taking the No. 1 detector row pixels as a Y-direction reference, and taking the column pixels as an X-direction reference to adjust the position of the No. 1 detector; then, taking the No. 1 detector as a reference, and adjusting the position of the No. 2 detector at the lower left of the triangular shape in the x and y directions according to the splicing requirement; then, the positions of the No. 3 detector at the lower right of the triangle in the x direction and the y direction are adjusted according to splicing requirements by taking the adjusted No. 1 detector and the adjusted No. 2 detector as the reference; and fixing the adjusted three detectors to complete the splicing of the three sCMOS detectors. The splicing structure can overcome the defect of insufficient width in the aspect of image detection, greatly expands the view field through splicing, and realizes wider spectral response range, higher spectral response and ultralow read-out noise.
Description
Technical Field
The invention relates to the technical field of detectors, in particular to a splicing structure based on three sCMOS detectors.
Background
With the development of science and technology, high-resolution satellite images are increasingly familiar to common people and become a part of life of people, and the problems to be solved in the selection of the detector and how to acquire large-frame-width and high-frame-rate images become urgent, which are directly related to the volume, weight and implementation difficulty of cameras.
Although the related schemes for enlarging the field of view of the camera have been studied in the prior art, there is no relevant description on the stitching of CMOS detectors which can achieve a wider spectral response range, a higher spectral response and ultra-low readout noise, and the demand for achieving large-frame-size and high-frame-rate image acquisition through high-performance index detectors is increasingly significant in the field of aerospace.
Disclosure of Invention
The invention aims to provide a splicing structure based on three sCMOS detectors, which can overcome the defect of insufficient width in the aspect of image detection, greatly expand the field of view through splicing, realize wider spectral response range, higher spectral response and ultralow read-out noise and meet the requirements of engineering design.
The purpose of the invention is realized by the following technical scheme:
a splicing structure based on three sCMOS detectors is characterized in that the three sCMOS detectors are spliced in a staggered mode in view field space according to a delta-shaped structure;
the position of the No. 1 detector is adjusted by taking the No. 1 detector above the triangle as a reference, specifically taking the No. 1 detector row pixels as a Y-direction reference and the column pixels as an X-direction reference, a visible pixel point at the upper right corner of the No. 1 detector is defined as a coordinate origin A2(0,0,0), splicing data is recorded, and the Z direction is image plane defocusing amount;
then, defining and recording coordinates of visible pixel points of the No. 1 detector in the other three directions as A1, A0 and A3;
then, taking the No. 1 detector as a reference, adjusting the position of the No. 2 detector at the lower left of the delta shape in the x direction and the y direction by using a three-coordinate measuring instrument according to splicing requirements, and recording the coordinates of visible pixel points in four directions of the adjusted No. 2 detector, wherein the coordinates are B0, B1, B2 and B3;
then, taking the adjusted No. 1 and No. 2 detectors as a reference, adjusting the positions of the No. 3 detector at the lower right of the delta shape in the x direction and the y direction by using a three-coordinate measuring instrument according to splicing requirements, and recording the coordinates of visible pixel points of the adjusted No. 3 detector in four directions, namely C0, C1, C2 and C3;
and fixing the adjusted three detectors to complete the splicing of the three sCMOS detectors.
According to the technical scheme provided by the invention, the splicing structure can overcome the defect of insufficient width in the aspect of image detection, the field of view is greatly expanded through splicing, a wider spectral response range, higher spectral response and ultralow read-out noise are realized, and the engineering design requirement is met.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on the drawings without creative efforts.
Fig. 1 is an overall schematic diagram of a splicing structure based on three sCMOS detectors according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a splicing process of three sCMOS detectors according to an embodiment of the present invention;
FIG. 3 is a right side view of a detector field-of-view stitching process according to an embodiment of the present invention;
FIG. 4 is a bottom view of a detector field-of-view stitching process according to an embodiment of the present invention;
fig. 5 is a circuit block diagram of an engineering application of a spliced detector according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention are clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present invention without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment of the present invention will be further described in detail with reference to the accompanying drawings, and as shown in fig. 1, is an overall schematic diagram of a splicing structure based on three sCMOS detectors provided by the embodiment of the present invention, and the three sCMOS detectors are spatially staggered and spliced in view field according to a delta-shaped structure; the rectangle enclosed by H2 and L2 is the detector interval, and the rectangular shaded area enclosed by H1 and L1 is the effective area covered by the image plane designed for the optical system.
Fig. 2 is a schematic diagram of a splicing process of the three-chip sCMOS detector according to the embodiment of the present invention, where: taking a No. 1 detector above the triangle as a reference, specifically taking a No. 1 detector row pixel as a Y-direction reference, taking a column pixel as an X-direction reference, adjusting the position of the No. 1 detector, defining a visible pixel point at the upper right corner of the No. 1 detector as a coordinate origin A2(0,0,0), and recording splicing data, wherein the Z direction is image plane defocusing amount;
then, defining and recording coordinates of visible pixel points of the No. 1 detector in the other three directions as A1, A0 and A3;
then, taking the No. 1 detector as a reference, adjusting the position of the No. 2 detector at the lower left of the delta shape in the x direction and the y direction by using a three-coordinate measuring instrument according to splicing requirements, and recording the coordinates of visible pixel points in four directions of the adjusted No. 2 detector, wherein the coordinates are B0, B1, B2 and B3;
then, taking the adjusted No. 1 and No. 2 detectors as a reference, adjusting the positions of the No. 3 detector at the lower right of the delta shape in the x direction and the y direction by using a three-coordinate measuring instrument according to splicing requirements, and recording the coordinates of visible pixel points of the adjusted No. 3 detector in four directions, namely C0, C1, C2 and C3;
and fixing the adjusted three detectors to complete the splicing of the three sCMOS detectors.
In the concrete realization, the concatenation requirement that will satisfy includes out of focus volume and target surface inclination, wherein:
1) defocus amount
For the whole system, if CCD is detectedThe pixel size of the detector is B, and the relative aperture is 1/f#The allowable defocus amount isC′CD＝±B*f#And the calculated splicing requirement of the defocus amount is as follows:
R′＝±2λf# 2
where λ is the center wavelength.
2) Target surface inclination angle
In order to ensure that the deviation of the target surface of the detector is smaller than the defocus amount along the optical axis direction, the tilt in two directions perpendicular to the splicing surface must be strictly limited, fig. 3 is a right view of the splicing process of the field of view of the detector according to the embodiment of the present invention, and fig. 4 is a lower view of the splicing process of the field of view of the detector, and the splicing requirement that the tilt angle of the target surface can be obtained from the combination relationship in the figures is as follows:
β1＝R′/H1
β2＝R′/L1
wherein, β1Is the angle of inclination of the pitch direction β2Is the angle of inclination of the roll direction; h1 is the height of the splice effective area; l1 is the length of the effective region for splicing, and the rectangular shaded region surrounded by H1 and L1 is the effective region covered by the image plane of the optical system design.
Based on the splicing requirements, the position adjustment of the No. 2 and No. 3 detectors can be completed by utilizing the three-coordinate measuring instrument, and finally the splicing of the three sCMOS detectors is realized.
In the concrete implementation, the glass fiber reinforced plastic pad below the three sCMOS detectors can be ground, and the flatness of the three sCMOS detectors is ensured to meet the splicing requirement.
After splicing is completed, data points on the spliced detector can be retested under a three-coordinate microscope, and final data is recorded.
The following is a concrete example illustrating the engineering application of the spliced detector:
fig. 5 is a circuit block diagram of an engineering application of a spliced detector according to an embodiment of the present invention, where the circuit block diagram includes an sCMOS channel control module, an sCMOS channel, and a data transmission unit, where:
the sCMOS channel control module and the sCMOS channel are connected through the inter-board connector and are jointly installed in a box body;
the sCMOS channel is used for collecting and transmitting visible light image data, consists of three spliced sCMOS detectors and comprises three channel ports, the three spliced sCMOS detectors are used for collecting data through an electronics system, and the data are directly transmitted to a large-capacity storage unit through a data transmission unit, so that large-picture and high-frame-frequency image detection is realized;
and the sCMOS channel control module is used for providing a power supply for the camera system and controlling the sCMOS channel.
Therefore, the scheme overcomes the defect of insufficient width in the aspect of image detection, greatly expands the field of view, realizes wider spectral response range, higher spectral response and ultralow read-out noise, meets the requirement of engineering design, and realizes the application of the optical fiber in the camera.
It is noted that the embodiments of the present invention not described in detail belong to the prior art known to those skilled in the art, for example, means for changing the relative positions and numbers of the detectors in the figures, and means for changing the splicing apparatus.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (3)
1. A splicing structure based on three sCMOS detectors is characterized in that,
carrying out space staggered splicing on the view fields of the three sCMOS detectors according to the delta-shaped structure;
the position of the No. 1 detector is adjusted by taking the No. 1 detector above the triangle as a reference, specifically taking the No. 1 detector row pixels as a Y-direction reference and the column pixels as an X-direction reference, a visible pixel point at the upper right corner of the No. 1 detector is defined as a coordinate origin A2(0,0,0), splicing data is recorded, and the Z direction is image plane defocusing amount;
then, defining and recording coordinates of visible pixel points of the No. 1 detector in the other three directions as A1, A0 and A3;
then, taking the No. 1 detector as a reference, adjusting the position of the No. 2 detector at the lower left of the delta shape in the x direction and the y direction by using a three-coordinate measuring instrument according to splicing requirements, and recording the coordinates of visible pixel points in four directions of the adjusted No. 2 detector, wherein the coordinates are B0, B1, B2 and B3;
then, taking the adjusted No. 1 and No. 2 detectors as a reference, adjusting the positions of the No. 3 detector at the lower right of the delta shape in the x direction and the y direction by using a three-coordinate measuring instrument according to splicing requirements, and recording the coordinates of visible pixel points of the adjusted No. 3 detector in four directions, namely C0, C1, C2 and C3;
fixing the adjusted three detectors to complete the splicing of the three sCMOS detectors;
further, the splicing requirement to be met comprises the defocusing amount and the target surface inclination angle, wherein:
if the pixel size of the detector is B, the relative aperture is 1/f#，
Then the allowable defocus amount is'CCD＝±B*f#And the calculated splicing requirement of the defocus amount is as follows:
′R＝±2λf# 2
wherein λ is a central wavelength;
the splicing requirement of the inclination angle of the target surface is as follows:
β1＝′R/H1
β2＝′R/L1
wherein, β1Is the angle of inclination of the pitch direction β2Is the angle of inclination of the roll direction; h1 is the height of the splice effective area; l1 is the length of the effective region for stitching, and the rectangular shaded region enclosed by H1 and L1 is the effective region covered by the image plane.
2. The three-slice sCMOS detector-based tile structure of claim 1,
and grinding the glass fiber reinforced plastic pad below the three sCMOS detectors to ensure that the flatness of the three sCMOS detectors meets the splicing requirement.
3. The three-chip sCMOS detector-based mosaic structure of claim 1, wherein data points on the mosaic detector are retested under a three-coordinate microscope and the final data is recorded.
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