CN109103897B - Method and device for determining configuration area of dynamic reactive power compensation equipment - Google Patents
Method and device for determining configuration area of dynamic reactive power compensation equipment Download PDFInfo
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J3/00—Circuit arrangements for ac mains or ac distribution networks
- H02J3/12—Circuit arrangements for ac mains or ac distribution networks for adjusting voltage in ac networks by changing a characteristic of the network load
- H02J3/16—Circuit arrangements for ac mains or ac distribution networks for adjusting voltage in ac networks by changing a characteristic of the network load by adjustment of reactive power
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
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Abstract
The invention discloses a method for determining a configuration area of dynamic reactive power compensation equipment, which comprises the following steps: establishing a system simulation model of a power grid to be researched; the system simulation model comprises M candidate sites of the dynamic reactive power compensation equipment to be configured and N faults; performing static stability simulation calculation on the candidate station to obtain a first voltage weakness degree index of the candidate station in a static stability dimension; performing transient stability simulation calculation on the candidate station to obtain a second voltage weakness degree index of the candidate station in a transient stability dimension; calculating a comprehensive voltage weakness degree index of the candidate station according to the first voltage weakness degree index and the second voltage weakness degree index; the method combines the voltage variation of the bus of the candidate station, the variation of the reactive power and the influence factors of the adjacent candidate stations, comprehensively considers the priority of the static stability angle and the transient stability angle, and effectively and accurately obtains the configuration area of the dynamic reactive compensation equipment.
Description
Technical Field
The invention relates to the technical field of power systems, in particular to a method and a device for determining a configuration area of dynamic reactive power compensation equipment.
Background
At present, the voltage reactive problem of the main receiving-end power grid (such as the Jingjin Ji power grid, the long triangular power grid and the bead triangular power grid) in China is becoming more and more prominent. The method mainly has two reasons, on one hand, reactive power consumption of conventional direct current of a multi-loop direct current centralized feed receiving end power grid (a multi-feed receiving end system) is completely compensated by a capacitor and a filter configured in a converter station under a steady state condition, but in the direct current power recovery process after the system is subjected to large disturbance, because bus voltage drops greatly, reactive power of the capacitor and the filter configured in the converter station cannot meet the reactive power consumption requirement of the direct current system, the direct current system needs to absorb a large amount of reactive power from an alternating current power grid, if the dynamic reactive power supporting capability of the receiving end system is insufficient, the bus voltage cannot be recovered for a long time after the large disturbance, and the voltage instability problem occurs; on the other hand, the proportion of the motor load in the power grid is continuously improved, and the motor load can absorb a large amount of reactive power in the fault recovery process after the fault disappears, so that the dynamic reactive power required to be provided by the system is higher as the proportion of the motor load is higher, and if the dynamic reactive support capability of the system is insufficient, the system voltage can not be recovered for a long time, and the voltage instability problem occurs.
In order to improve the dynamic reactive power supporting capability of a power grid, dynamic reactive power compensation equipment (such as a phase modulator, a STATCOM, an SVC and the like) with a proper capacity needs to be installed at a proper position in the power grid, and how to scientifically determine a place for configuring the dynamic reactive power compensation equipment is an urgent problem to be solved.
Disclosure of Invention
The invention aims to provide a method and a device for determining a configuration area of dynamic reactive power compensation equipment, which can comprehensively consider the priority of a static stable angle and a transient stable angle and the interaction between candidate stations when the configuration area of the dynamic reactive power compensation equipment is configured, and effectively and accurately obtain the configuration area of the dynamic reactive power compensation equipment.
The embodiment of the invention provides a method for determining a configuration area of dynamic reactive power compensation equipment, which comprises the following steps:
establishing a system simulation model of a power grid to be researched; the system simulation model comprises M candidate sites of the dynamic reactive power compensation equipment to be configured and N faults;
performing static stability simulation calculation on the candidate station to obtain a first voltage weakness degree index of the candidate station in a static stability dimension;
performing transient stability simulation calculation on the candidate station to obtain a second voltage weakness degree index of the candidate station in a transient stability dimension;
calculating a comprehensive voltage weakness degree index of the candidate station according to the first voltage weakness degree index and the second voltage weakness degree index;
and sequencing the comprehensive voltage weakness degree indexes in high and low, and determining the sequence of configuring the dynamic reactive power compensation equipment for each candidate station.
Preferably, the performing static stability simulation calculation on the candidate site to obtain a first voltage weakness degree index of the candidate site in a static stability dimension specifically includes:
performing reactive power disturbance on any one candidate station;
calculating a voltage reactive sensitivity factor of any candidate station according to the variable quantity of the reactive power of any candidate station after reactive disturbance and the variable quantity of the voltage of the bus;
calculating a system support strength index of any candidate station according to active power of system exchange, reactive power of system exchange, a voltage value of a bus and the voltage and reactive sensitivity factor before reactive disturbance occurs to any candidate station;
calculating influence factors of any two adjacent candidate stations according to the voltage variation of the bus after reactive disturbance of any two adjacent candidate stations;
and calculating a first voltage weakness degree index of the candidate station according to the system support strength index and the influence factors of any two adjacent candidate stations.
Preferably, the calculating a voltage reactive sensitivity factor of any candidate site according to a variable quantity of reactive power of any candidate site after the reactive disturbance occurs and a variable quantity of voltage of the bus specifically includes:
according to formula VperQi＝ΔUi/ΔQiCalculating a voltage reactive sensitivity factor of the ith candidate station;
wherein, Delta UiThe voltage variation of the bus after the reactive disturbance occurs to the ith candidate station; delta QiAnd the variation of the reactive power after the reactive disturbance occurs to the ith candidate station.
Preferably, the calculating a system support strength index of any candidate site according to active power exchanged by the system, reactive power exchanged by the system, a voltage value of a bus and the voltage reactive sensitivity factor before any candidate site generates reactive power disturbance specifically includes:
according to the formula
Calculating system support strength of ith candidate station refers toMarking;
wherein, PNActive power exchanged by the system before reactive disturbance occurs to the ith candidate station; qNReactive power exchanged by the system before reactive disturbance occurs to the ith candidate station; u shapeNAnd (4) generating the voltage value of the bus before the reactive disturbance occurs for the ith candidate station.
Preferably, the calculating, according to the voltage variation of the bus after the reactive disturbance occurs to any two adjacent candidate sites, the influence factor of any two adjacent candidate sites specifically includes:
according to the formula MIIFji＝ΔUj/ΔUiCalculating the influence factor of the ith candidate station on the jth candidate station;
wherein, Delta UjAnd changing the voltage of the bus after the reactive disturbance occurs for the jth candidate station.
Preferably, the calculating a first voltage weak degree index of the candidate station according to the system support strength index and the influence factors of any two adjacent candidate stations specifically includes:
according to the formula
And calculating a first voltage weakness degree index of the ith candidate station.
Preferably, the performing transient stability simulation calculation on the candidate site to obtain a second voltage weakness degree index of the candidate site in a transient stability dimension specifically includes:
performing transient stability scanning calculation on the N faults one by one, and calculating the duration time when the bus voltage of any one candidate station is smaller than a first voltage threshold value after the N faults are removed;
according to the formula
Normalizing the duration;
wherein, TjiBus bar electricity of the ith candidate station after j faults are removedA duration when the voltage is less than a first voltage threshold; t isthCritical time required for judging that the system is in transient voltage instability; lambda is more than or equal to 1;
according to the formula
Calculating a second voltage weakness degree index of the candidate station;
wherein, BRZWiThe second voltage weakness degree index is a second voltage weakness degree index of the ith candidate station; n is the total number of failures.
Preferably, the calculating a comprehensive voltage weakness index of the candidate site according to the first voltage weakness index and the second voltage weakness index specifically includes:
according to the formula BRZHi＝c1×BRJWi+c2×BRZWiCalculating a comprehensive voltage weakness degree index of the candidate station;
wherein, BRZHiThe comprehensive voltage weakness degree index of the ith candidate station is obtained; c. C1A weight coefficient being an indicator of said first voltage weakness, c2Is a weight coefficient of the second voltage weakness level indicator, c1+c2＝1。
The embodiment of the invention also provides a device for determining the configuration area of the dynamic reactive power compensation equipment, which comprises the following steps:
the system simulation model establishing module is used for establishing a system simulation model of the power grid to be researched; the system simulation model comprises M candidate sites of the dynamic reactive power compensation equipment to be configured and N faults;
the first voltage weakness index calculation module is used for carrying out static stability simulation calculation on the candidate station to obtain a first voltage weakness index of the candidate station in a static stability dimension;
the second voltage weakness index calculation module is used for performing transient stability simulation calculation on the candidate station to obtain a second voltage weakness index of the candidate station in a transient stability dimension;
the comprehensive voltage weakness degree index calculation module is used for calculating a comprehensive voltage weakness degree index of the candidate station according to the first voltage weakness degree index and the second voltage weakness degree index;
and the module for determining the configuration area of the dynamic reactive power compensation equipment is used for sequencing the comprehensive voltage weakness degree indexes and determining the sequence of configuring the dynamic reactive power compensation equipment for each candidate station.
The embodiment of the invention also provides a device for determining the configuration area of the dynamic reactive power compensation equipment, which comprises a processor, a memory and a computer program stored in the memory and configured to be executed by the processor, wherein the processor implements the method for determining the configuration area of the dynamic reactive power compensation equipment when executing the computer program.
Compared with the prior art, the method for determining the configuration area of the dynamic reactive power compensation equipment has the advantages that: the method for determining the configuration area of the dynamic reactive power compensation equipment comprises the following steps: establishing a system simulation model of a power grid to be researched; the system simulation model comprises M candidate sites of the dynamic reactive power compensation equipment to be configured and N faults; performing static stability simulation calculation on the candidate station to obtain a first voltage weakness degree index of the candidate station in a static stability dimension; performing transient stability simulation calculation on the candidate station to obtain a second voltage weakness degree index of the candidate station in a transient stability dimension; calculating a comprehensive voltage weakness degree index of the candidate station according to the first voltage weakness degree index and the second voltage weakness degree index; and sequencing the comprehensive voltage weakness degree indexes in high and low, and determining the sequence of configuring the dynamic reactive power compensation equipment for each candidate station. The method combines the voltage variation of the bus of the candidate station, the variation of the reactive power and the influence factors of the adjacent candidate stations, can comprehensively consider the priority of the static stability angle and the transient stability angle and the interaction effect among the candidate stations when the dynamic reactive compensation equipment is configured in the area, and effectively and accurately obtains the configuration area of the dynamic reactive compensation equipment.
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Fig. 1 is a schematic flowchart of a method for determining a configuration area of a dynamic reactive power compensation device according to an embodiment of the present invention;
fig. 2 is a simulation graph after the dynamic reactive power compensation device is configured according to a method for determining a configuration area of the dynamic reactive power compensation device provided by the embodiment of the present invention;
fig. 3 is a schematic structural diagram of an apparatus for determining a configuration area of a dynamic reactive power compensation device according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Please refer to fig. 1, which is a flowchart illustrating a method for determining a configuration area of a dynamic reactive power compensation device according to an embodiment of the present invention, where the method for determining the configuration area of the dynamic reactive power compensation device includes:
s100: establishing a system simulation model of a power grid to be researched; the system simulation model comprises M candidate sites of the dynamic reactive power compensation equipment to be configured and N faults;
s200: performing static stability simulation calculation on the candidate station to obtain a first voltage weakness degree index of the candidate station in a static stability dimension;
s300: performing transient stability simulation calculation on the candidate station to obtain a second voltage weakness degree index of the candidate station in a transient stability dimension;
s400: calculating a comprehensive voltage weakness degree index of the candidate station according to the first voltage weakness degree index and the second voltage weakness degree index;
s500: and sequencing the comprehensive voltage weakness degree indexes in high and low, and determining the sequence of configuring the dynamic reactive power compensation equipment for each candidate station.
In this embodiment, when the dynamic reactive power compensation equipment is configured in the area, the static and transient characteristics of the power grid system can be comprehensively reflected by comprehensively considering the priority of the static stability angle and the transient stability angle, so that the sequence of configuring the dynamic reactive power compensation equipment at each candidate site is more scientific and effective.
In an alternative embodiment, S100: establishing a system simulation model of a power grid to be researched; the system simulation model comprises M candidate sites of the dynamic reactive power compensation equipment to be configured and N faults, and specifically comprises the following steps:
the M candidate sites to be configured with the dynamic reactive power compensation device may be set as: candidate site set S ═ S1，S2，…，SM}，SiThe number of the candidate sites is ith, and M is the number of the candidate sites;
the N faults may be set to a fault set F ═ F1，F2，…，FN}，FjIs the jth fault, and N is the total number of faults.
In an alternative embodiment, S200: performing static stability simulation calculation on the candidate station to obtain a first voltage weakness degree index of the candidate station in a static stability dimension, specifically including:
performing reactive power disturbance on any one candidate station;
calculating a voltage reactive sensitivity factor of any candidate station according to the variable quantity of the reactive power of any candidate station after reactive disturbance and the variable quantity of the voltage of the bus;
calculating a system support strength index of any candidate station according to active power of system exchange, reactive power of system exchange, a voltage value of a bus and the voltage and reactive sensitivity factor before reactive disturbance occurs to any candidate station;
calculating influence factors of any two adjacent candidate stations according to the voltage variation of the bus after reactive disturbance of any two adjacent candidate stations;
and calculating a first voltage weakness degree index of the candidate station according to the system support strength index and the influence factors of any two adjacent candidate stations.
In this embodiment, the larger the value of the first voltage weakness index of the candidate site is, the stronger the voltage supporting effect of the dynamic reactive power compensation equipment configured at the candidate site on the whole system is; the first voltage weak degree index of the candidate station can be effectively calculated by comprehensively considering the system power of the candidate station, the voltage sensitivity index of the bus and the influence factors of two adjacent candidate stations.
In an optional embodiment, the calculating a voltage reactive sensitivity factor of any candidate site according to a variable quantity of reactive power of any candidate site after the reactive disturbance occurs and a variable quantity of voltage of the bus specifically includes:
according to formula VperQi＝ΔUi/ΔQiCalculating a voltage reactive sensitivity factor of the ith candidate station;
wherein, Delta UiThe voltage variation of the bus after the reactive disturbance occurs to the ith candidate station; delta QiAnd the variation of the reactive power after the reactive disturbance occurs to the ith candidate station.
In an optional embodiment, the calculating a system support strength index of any candidate site according to active power of system switching, reactive power of system switching, a voltage value of a bus, and the voltage reactive sensitivity factor before any candidate site generates reactive power disturbance specifically includes:
according to the formula
Calculating a system support strength index of the ith candidate station;
wherein, PNActive power exchanged by the system before reactive disturbance occurs to the ith candidate station; qNIs the ithReactive power exchanged by the system before the candidate station generates reactive disturbance; u shapeNAnd (4) generating the voltage value of the bus before the reactive disturbance occurs for the ith candidate station.
In an optional embodiment, the calculating, according to the voltage variation of the bus after the reactive disturbance occurs to any two adjacent candidate sites, the influence factor of any two adjacent candidate sites specifically includes:
according to the formula MIIFji＝ΔUj/ΔUiCalculating the influence factor of the ith candidate station on the jth candidate station;
wherein, Delta UjAnd changing the voltage of the bus after the reactive disturbance occurs for the jth candidate station.
In an optional embodiment, the calculating, according to the system support strength indicator and the influence factors of any two adjacent candidate stations, a first voltage weakness degree indicator of the candidate station specifically includes:
according to the formula
And calculating a first voltage weakness degree index of the ith candidate station.
In this embodiment, by comprehensively considering the system support strength index and the influence factors of any two adjacent candidate sites, when the dynamic reactive power compensation device is configured, the voltage support strength of a candidate site and the influence of the candidate site on other sites can be considered at the same time.
In an alternative embodiment, S300: performing transient stability simulation calculation on the candidate site to obtain a second voltage weakness degree index of the candidate site in a transient stability dimension, specifically including:
performing transient stability scanning calculation on the N faults one by one, and calculating the duration time when the bus voltage of any one candidate station is smaller than a first voltage threshold value after the N faults are removed;
according to the formula
Normalizing the duration;
wherein, TjiThe duration of time when the bus voltage of the ith candidate station is smaller than the first voltage threshold value after j faults are removed; t isthCritical time required for judging that the system is in transient voltage instability; lambda is more than or equal to 1;
according to the formula
Calculating a second voltage weakness degree index of the candidate station;
wherein, BRZWiThe second voltage weakness degree index is a second voltage weakness degree index of the ith candidate station; n is the total number of failures.
In the embodiment, the transient stability scanning calculation is carried out on the fault set, so that the voltage weakness degree of each candidate station under the transient stability dimension can be comprehensively reflected; the larger the second voltage weak degree index of the candidate site is, the stronger the voltage supporting effect of the dynamic reactive compensation equipment configured on the candidate site on the whole system is; the first voltage threshold is a low voltage threshold set according to actual conditions; the lambda can be taken according to actual experience, but the lambda is more than or equal to 1.
In an alternative embodiment, S400: calculating a comprehensive voltage weakness degree index of the candidate station according to the first voltage weakness degree index and the second voltage weakness degree index, and specifically comprising:
according to the formula BRZHi＝c1×BRJWi+c2×BRZWiCalculating a comprehensive voltage weakness degree index of the candidate station;
wherein, BRZHiThe comprehensive voltage weakness degree index of the ith candidate station is obtained; c. C1A weight coefficient being an indicator of said first voltage weakness, c2Is a weight coefficient of the second voltage weakness level indicator, c1+c2＝1。
In this embodiment, the requirements of the static dimension and the transient stability dimension are integrated, and the priority of the candidate sites can be quantitatively calculated, so that researchers in the field can quickly determine the optimal configuration area scheme of the dynamic reactive compensation equipment.
The following describes the method for determining the configuration area of the dynamic reactive power compensation equipment, which is provided by the present invention, by taking the proposed 5 candidate sites and 20 faults as examples:
selecting 5 sites from S1-S5 according to the actual situation of the candidate sites to form a candidate site set { S1, S2, S3, S4, S5} and 20 typical fault forming fault sets { F1, F2, … and F20 };
the data for each candidate site and some system values are as follows:
the first voltage threshold UthIs 0.9pu, the duration TthTaking 1s and lambda as values 1.5, c1Take 0.8, c2Taking 0.2;
after the processing of step S200 in the present invention, system support strength index data and first voltage weakness index data corresponding to 5 candidate sites are obtained, which are specifically as follows:
[ST1… ST5]＝[0.0451 0.0586 0.0541 0.0287 0.0600]
[BRJW1… BRJW5]＝[0.0923 0.0859 0.0828 0.0782 0.0930]
after the processing of step S300 in the present invention, second voltage weakness index data corresponding to 5 candidate sites is obtained, which is specifically as follows:
[BRZW1… BRZW5]＝[0.3068 0.2750 0.2578 0.2808 0.2970]
after the processing of step S400 in the present invention, the comprehensive voltage weakness index data corresponding to 5 candidate sites is obtained, which is specifically as follows:
[BRZH1… BRZH5]＝[0.1352 0.1237 0.1178 0.1187 0.1338]
after the processing of step S500 of the present invention, the allocation priorities of the candidate sites are S1, S5, S2, S4, and S3.
Please refer to fig. 2, which is a simulation graph of the dynamic reactive power compensation device configured by the method for determining the configuration area of the dynamic reactive power compensation device according to the embodiment of the present invention; as can be analyzed from fig. 2, when the bus voltage is increased to the required recovery value, the effect obtained by configuring the dynamic reactive power compensation equipment at the candidate site S1 is more obvious than that obtained by configuring the dynamic reactive power compensation equipment at the candidate site S5, and thus, the method for determining the configuration area of the dynamic reactive power compensation equipment provided by the invention can effectively and accurately obtain the configuration area of the dynamic reactive power compensation equipment, so that the configuration area is more scientific and effective.
Please refer to fig. 3, which is a schematic structural diagram of an apparatus for determining a configuration area of a dynamic reactive power compensation device according to an embodiment of the present invention, where the apparatus for determining a configuration area of a dynamic reactive power compensation device includes:
the method comprises the steps of establishing a system simulation model module 1 for establishing a system simulation model of a power grid to be researched; the system simulation model comprises M candidate sites of the dynamic reactive power compensation equipment to be configured and N faults;
the first voltage weakness index calculation module 2 is configured to perform static stability simulation calculation on the candidate site to obtain a first voltage weakness index of the candidate site in a static stability dimension;
the second voltage weakness index calculation module 3 is configured to perform transient stability simulation calculation on the candidate site to obtain a second voltage weakness index of the candidate site in a transient stability dimension;
the comprehensive voltage weakness degree index calculation module 4 is configured to calculate a comprehensive voltage weakness degree index of the candidate site according to the first voltage weakness degree index and the second voltage weakness degree index;
and the module 5 for determining the configuration area of the dynamic reactive power compensation equipment is used for sequencing the comprehensive voltage weakness degree indexes and determining the sequence of configuring the dynamic reactive power compensation equipment for each candidate station.
In an alternative embodiment, the system simulation model module 1 is established, and includes:
drawing a candidate site set unit for the M candidates of the dynamic reactive power compensation equipment to be configuredThe station can be set as: candidate site set S ═ S1，S2，…，SM}，SiThe number of the candidate sites is ith, and M is the number of the candidate sites;
a set of failures unit for setting the N failures as a set of failures F ═ { F }1，F2，…，FN}，FjIs the jth fault, and N is the total number of faults.
In an alternative embodiment, the first voltage weakness indicator calculating module 2 includes:
the reactive power disturbance unit is used for performing reactive power disturbance on any candidate station;
the voltage reactive sensitivity factor calculation unit is used for calculating the voltage reactive sensitivity factor of any candidate station according to the variable quantity of the reactive power of any candidate station after reactive disturbance and the variable quantity of the voltage of the bus;
the system supporting strength index calculating unit is used for calculating the system supporting strength index of any candidate station according to the active power of system exchange, the reactive power of system exchange, the voltage value of a bus and the voltage and reactive sensitivity factor before any candidate station generates reactive power disturbance;
the influence factor calculation unit of the adjacent candidate sites is used for calculating the influence factors of any two adjacent candidate sites according to the voltage variation of the bus after the reactive disturbance of any two adjacent candidate sites;
and the first voltage weakness index calculation unit is used for calculating a first voltage weakness index of the candidate station according to the system support strength index and the influence factors of any two adjacent candidate stations.
In this embodiment, the larger the value of the first voltage weakness index of the candidate site is, the stronger the voltage supporting effect of the dynamic reactive power compensation equipment configured at the candidate site on the whole system is; the first voltage weak degree index of the candidate station can be effectively calculated by comprehensively considering the system power of the candidate station, the voltage sensitivity index of the bus and the influence factors of two adjacent candidate stations.
In an alternative embodiment, the second voltage weakness indicator calculating module 3 includes:
the duration calculation unit is used for performing transient stability scanning calculation on the N faults one by one, and calculating the duration when the bus voltage of any candidate station is smaller than a first voltage threshold value after the N faults are removed;
the normalization processing unit is used for performing normalization processing on the duration;
and the second voltage weakness index calculation unit is used for calculating a second voltage weakness index of the candidate station according to the duration and the fault set after the normalization processing.
In the embodiment, the transient stability scanning calculation is carried out on the fault set, so that the voltage weakness degree of each candidate station under the transient stability dimension can be comprehensively reflected; the larger the second voltage weak degree index of the candidate site is, the stronger the voltage supporting effect of the dynamic reactive compensation equipment configured in the candidate site on the whole system is.
In an alternative embodiment, the integrated voltage weakness indicator calculating module 4 includes:
and the comprehensive voltage weakness index calculating unit is used for calculating the comprehensive voltage weakness index of the candidate station according to the first voltage weakness index and the second voltage weakness index.
In this embodiment, the requirements of the static dimension and the transient stability dimension are integrated, and the priority of the candidate sites can be quantitatively calculated, so that researchers in the field can quickly determine the optimal configuration area scheme of the dynamic reactive compensation equipment.
The embodiment of the invention also provides a device for determining the configuration area of the dynamic reactive power compensation equipment, which comprises a processor, a memory and a computer program stored in the memory and configured to be executed by the processor, wherein the processor implements the method for determining the configuration area of the dynamic reactive power compensation equipment as described above when executing the computer program.
Illustratively, the computer program may be partitioned into one or more modules/units that are stored in the memory and executed by the processor to implement the invention. The one or more modules/units may be a series of instruction segments of a computer program capable of performing specific functions, and the instruction segments are used for describing the execution process of the computer program in the device for determining the configuration area of the dynamic reactive power compensation equipment. For example, the computer program may be divided into functional modules that determine the configuration area means of the dynamic reactive power compensation equipment as shown in fig. 3.
The device for determining the configuration area of the dynamic reactive power compensation equipment can be computing equipment such as a desktop computer, a notebook computer, a palm computer and a cloud server. The device for determining the configuration area of the dynamic reactive power compensation equipment can include, but is not limited to, a processor and a memory. It will be understood by those skilled in the art that the schematic diagram is merely an example of a device for determining the configuration area of the dynamic reactive power compensation equipment, and does not constitute a limitation of the device for determining the configuration area of the dynamic reactive power compensation equipment, and may include more or less components than those shown, or combine some components, or different components, for example, the device for determining the configuration area of the dynamic reactive power compensation equipment may further include input and output equipment, network access equipment, a bus, etc.
The Processor may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), an off-the-shelf Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic, discrete hardware components, etc. The general purpose processor may be a microprocessor or the processor may be any conventional processor or the like, the processor is a control center of the device for determining the configuration area of the dynamic reactive power compensation equipment, and various interfaces and lines are used for connecting various parts of the device for determining the configuration area of the dynamic reactive power compensation equipment.
The memory may be configured to store the computer program and/or the module, and the processor may implement various functions of the device for determining the configuration region of the dynamic reactive power compensation equipment by executing or executing the computer program and/or the module stored in the memory and calling data stored in the memory. The memory may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required by at least one function (such as a sound playing function, an image playing function, etc.), and the like; the storage data area may store data (such as audio data, a phonebook, etc.) created according to the use of the cellular phone, and the like. In addition, the memory may include high speed random access memory, and may also include non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), at least one magnetic disk storage device, a Flash memory device, or other volatile solid state storage device.
It should be noted that the above-described device embodiments are merely illustrative, where the units described as separate parts may or may not be physically separate, and the parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. In addition, in the drawings of the embodiment of the apparatus provided by the present invention, the connection relationship between the modules indicates that there is a communication connection between them, and may be specifically implemented as one or more communication buses or signal lines. One of ordinary skill in the art can understand and implement it without inventive effort.
Compared with the prior art, the method for determining the configuration area of the dynamic reactive power compensation equipment has the advantages that: the method for determining the configuration area of the dynamic reactive power compensation equipment comprises the following steps: establishing a system simulation model of a power grid to be researched; the system simulation model comprises M candidate sites of the dynamic reactive power compensation equipment to be configured and N faults; performing static stability simulation calculation on the candidate station to obtain a first voltage weakness degree index of the candidate station in a static stability dimension; performing transient stability simulation calculation on the candidate station to obtain a second voltage weakness degree index of the candidate station in a transient stability dimension; calculating a comprehensive voltage weakness degree index of the candidate station according to the first voltage weakness degree index and the second voltage weakness degree index; and sequencing the comprehensive voltage weakness degree indexes in high and low, and determining the sequence of configuring the dynamic reactive power compensation equipment for each candidate station. The method combines the voltage variation of the bus of the candidate station, the variation of the reactive power and the influence factors of the adjacent candidate stations, can comprehensively consider the priority of the static stability angle and the transient stability angle and the interaction effect among the candidate stations when the dynamic reactive compensation equipment is configured in the area, and effectively and accurately obtains the configuration area of the dynamic reactive compensation equipment.
While the foregoing is directed to the preferred embodiment of the present invention, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention.
Claims (9)
1. A method for determining a configuration region of a dynamic reactive power compensation device, comprising:
establishing a system simulation model of a power grid to be researched; the system simulation model comprises M candidate sites of the dynamic reactive power compensation equipment to be configured and N faults;
performing static stability simulation calculation on the candidate station to obtain a first voltage weakness degree index of the candidate station in a static stability dimension; performing reactive power disturbance on any candidate station; calculating a voltage reactive sensitivity factor of any candidate station according to the variable quantity of the reactive power of any candidate station after reactive disturbance and the variable quantity of the voltage of the bus; calculating a system support strength index of any candidate station according to active power of system exchange, reactive power of system exchange, a voltage value of a bus and the voltage and reactive sensitivity factor before reactive disturbance occurs to any candidate station; calculating influence factors of any two adjacent candidate stations according to the voltage variation of the bus after reactive disturbance of any two adjacent candidate stations; calculating a first voltage weakness degree index of the candidate station according to the system support strength index and the influence factors of any two adjacent candidate stations;
performing transient stability simulation calculation on the candidate station to obtain a second voltage weakness degree index of the candidate station in a transient stability dimension;
calculating a comprehensive voltage weakness degree index of the candidate station according to the first voltage weakness degree index and the second voltage weakness degree index;
and sequencing the comprehensive voltage weakness degree indexes in high and low, and determining the sequence of configuring the dynamic reactive power compensation equipment for each candidate station.
2. The method according to claim 1, wherein the calculating a voltage reactive sensitivity factor of any candidate site according to a change amount of reactive power of any candidate site after the reactive disturbance and a change amount of voltage of the bus bar specifically includes:
according to the formula
Calculating a voltage reactive sensitivity factor of the ith candidate station;
wherein, Delta UiThe voltage variation of the bus after the reactive disturbance occurs to the ith candidate station; delta QiAnd the variation of the reactive power after the reactive disturbance occurs to the ith candidate station.
3. The method for determining the configuration area of the dynamic reactive power compensation equipment according to claim 1, wherein the calculating the system support strength index of any candidate site according to the active power of the system switch, the reactive power of the system switch, the voltage value of the bus, and the voltage reactive sensitivity factor before any candidate site generates the reactive power disturbance specifically comprises:
according to the formula
Calculating a system support strength index of the ith candidate station;
wherein, PNActive power exchanged by the system before reactive disturbance occurs to the ith candidate station; qNReactive power exchanged by the system before reactive disturbance occurs to the ith candidate station; u shapeNThe voltage value of the bus before the reactive disturbance occurs for the ith candidate station,
and the voltage reactive sensitivity factor of the ith candidate station.
4. The method according to claim 1, wherein the calculating the influence factors of any two adjacent candidate sites according to the voltage variation of the bus after the reactive disturbance of any two adjacent candidate sites comprises:
according to the formula MIIFji＝ΔUj/ΔUiCalculating the influence factor of the ith candidate station on the jth candidate station;
wherein, Delta UjThe variation quantity of the voltage of the bus, delta U, after the reactive disturbance occurs to the jth candidate stationiAnd changing the voltage of the bus after the reactive disturbance occurs to the ith candidate station adjacent to the jth candidate station.
5. The method according to claim 1, wherein the calculating a first voltage weakness indicator of the candidate site according to the system support strength indicator and the influence factors of any two adjacent candidate sites specifically includes:
according to the formula
Calculating a first voltage weakness degree index of the ith candidate station; wherein, MIIFjiIs the influence factor of the ith candidate station on the jth candidate station, STiAnd supporting the strength index for the system of the ith candidate station.
6. The method according to claim 1, wherein the performing transient stability simulation calculation on the candidate site to obtain a second voltage weakness indicator of the candidate site in a transient stability dimension includes:
performing transient stability scanning calculation on the N faults one by one, and calculating the duration time when the bus voltage of any one candidate station is smaller than a first voltage threshold value after the N faults are removed;
according to the formula
Normalizing the duration;
wherein, TjiThe duration of time when the bus voltage of the ith candidate station is smaller than the first voltage threshold value after j faults are removed; t isthCritical time required for judging that the system is in transient voltage instability; lambda is more than or equal to 1;
according to the formula
Calculating a second voltage weakness degree index of the candidate station;
wherein, BRZWiThe second voltage weakness degree index is a second voltage weakness degree index of the ith candidate station; n is the total number of failures.
7. The method according to claim 1, wherein the calculating a comprehensive voltage weakness indicator of the candidate station according to the first voltage weakness indicator and the second voltage weakness indicator specifically includes:
according to the formula BRZHi＝c1×BRJWi+c2×BRZWiCalculating a comprehensive voltage weakness degree index of the candidate station;
wherein, BRZHiThe comprehensive voltage weakness degree index of the ith candidate station is obtained; c. C1A weight coefficient being an indicator of said first voltage weakness, c2Is a weight coefficient of the second voltage weakness level indicator, c1+c2＝1。
8. An apparatus for determining a configured area of a dynamic reactive power compensation device, comprising:
the system simulation model establishing module is used for establishing a system simulation model of the power grid to be researched; the system simulation model comprises M candidate sites of the dynamic reactive power compensation equipment to be configured and N faults;
the first voltage weakness index calculation module is used for carrying out static stability simulation calculation on the candidate station to obtain a first voltage weakness index of the candidate station in a static stability dimension; performing reactive power disturbance on any candidate station; calculating a voltage reactive sensitivity factor of any candidate station according to the variable quantity of the reactive power of any candidate station after reactive disturbance and the variable quantity of the voltage of the bus; calculating a system support strength index of any candidate station according to active power of system exchange, reactive power of system exchange, a voltage value of a bus and the voltage and reactive sensitivity factor before reactive disturbance occurs to any candidate station; calculating influence factors of any two adjacent candidate stations according to the voltage variation of the bus after reactive disturbance of any two adjacent candidate stations; calculating a first voltage weakness degree index of the candidate station according to the system support strength index and the influence factors of any two adjacent candidate stations;
the second voltage weakness index calculation module is used for performing transient stability simulation calculation on the candidate station to obtain a second voltage weakness index of the candidate station in a transient stability dimension;
the comprehensive voltage weakness degree index calculation module is used for calculating a comprehensive voltage weakness degree index of the candidate station according to the first voltage weakness degree index and the second voltage weakness degree index;
and the module for determining the configuration area of the dynamic reactive power compensation equipment is used for sequencing the comprehensive voltage weakness degree indexes and determining the sequence of configuring the dynamic reactive power compensation equipment for each candidate station.
9. An apparatus for determining a configuration region of a dynamic reactive power compensation device, comprising a processor, a memory and a computer program stored in the memory and configured to be executed by the processor, wherein the processor, when executing the computer program, implements the method for determining a configuration region of a dynamic reactive power compensation device according to any one of claims 1 to 7.
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| CN112688341B (en) * | 2020-12-21 | 2023-05-30 | 广东电网有限责任公司广州供电局 | Method and device for selecting configuration site of reactive power compensation equipment of direct-current receiving end power grid |
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