CN109032932A - A kind of combined test Fault Locating Method for supporting constraint - Google Patents

A kind of combined test Fault Locating Method for supporting constraint Download PDF

Info

Publication number
CN109032932A
CN109032932A CN201810738553.5A CN201810738553A CN109032932A CN 109032932 A CN109032932 A CN 109032932A CN 201810738553 A CN201810738553 A CN 201810738553A CN 109032932 A CN109032932 A CN 109032932A
Authority
CN
China
Prior art keywords
parameter
examining system
point
case
independence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201810738553.5A
Other languages
Chinese (zh)
Other versions
CN109032932B (en
Inventor
魏长安
许永辉
杨京礼
姜守达
张雨
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Harbin Institute of Technology
Original Assignee
Harbin Institute of Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Harbin Institute of Technology filed Critical Harbin Institute of Technology
Priority to CN201810738553.5A priority Critical patent/CN109032932B/en
Publication of CN109032932A publication Critical patent/CN109032932A/en
Application granted granted Critical
Publication of CN109032932B publication Critical patent/CN109032932B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3684Test management for test design, e.g. generating new test cases
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3688Test management for test execution, e.g. scheduling of test suites

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

A kind of combined test Fault Locating Method for supporting constraint, it is used for software testing technology field.The present invention solves the problems, such as not considering existing for traditional combination of software test failure localization method influence of the restriction on the parameters limitation to fault location in combined test.The present invention obtains the error checking use-case of system according to the implementing result of whole test cases, then judges that examining system with the presence or absence of independence safety value, is finally combined test failure positioning according to the judging result of independence safety value;Compared with traditional combined test Fault Locating Method, Fault Locating Method of the invention considers influence of the restriction on the parameters limitation to fault location in combined test, therefore, the scope of application of the method for the present invention is wider, practicability is stronger, overcomes the limitation of the prior art.Present invention could apply to software testing technology field use.

Description

A kind of combined test Fault Locating Method for supporting constraint
Technical field
The invention belongs to software testing technology fields, and in particular to a kind of combined test fault location side for supporting constraint Method.
Background technique
After software test has found failure, developer needs to find out to cause failure reason for it, i.e. the event of progress software Barrier positioning, then by fault location as a result, developer, which can be deep into inside code, carries out fault restoration.
In combination of software test, usually assume that the value of each input parameter is independent of each other, but in actual software system In system, the phenomenon that generally existing restriction on the parameters, this will lead to certain parameter values combinations or input sequence is nonsensical or even nothing Effect, and the research of traditional combination of software test failure localization method or software-based internal structural information or based on soft Part reruns, and there is no consider influence of the restriction on the parameters limitation to fault location in combined test.
Summary of the invention
The purpose of the present invention is survey not consider to combine existing for the traditional combination of software test failure localization method of solution Restriction on the parameters limits the problem of influence to fault location in examination.
The technical solution adopted by the present invention to solve the above technical problem is:
A kind of combined test Fault Locating Method for supporting constraint, the specific steps of this method are as follows:
Step 1: executing whole test cases of examining system, obtained according to the implementing result of whole test cases correct Test use cases and error checking set of uses case;
Step 2: according to the safety value and constraint set of examining system, to judge examining system with the presence or absence of independence safety Value;
Step 3: if step 2 judges examining system, there are independence safety values, directly utilize the independence of examining system Property safety value be combined test failure positioning;
Step 4: if step 2 judges examining system, there is no independence safety values, execute the acquisition of analytical procedure one Error checking use-case, to be combined test failure positioning;
The beneficial effects of the present invention are: the present invention provides a kind of combined test Fault Locating Method for supporting constraint, this Invention obtains the error checking use-case of system according to the implementing result of whole test cases first, then whether judges examining system There are independence safety values, and test failure positioning is finally combined according to the judging result of independence safety value;With tradition Combined test Fault Locating Method compare, Fault Locating Method of the invention considers in combined test restriction on the parameters limitation pair The influence of fault location, therefore, the scope of application of the method for the present invention is wider, practicability is stronger, overcomes the limitation of the prior art.
Method of the invention plays the role of the combined test fault location of software systems good.
Detailed description of the invention
Fig. 1 is a kind of main flow chart of combined test Fault Locating Method for supporting constraint of the present invention;
Fig. 2 is that a mistake is analyzed in a kind of execution of combined test Fault Locating Method for supporting constraint of the present invention The flow chart of test case;
Fig. 3 is the schematic diagram of two distinct types of mistake interaction;
Fig. 4 is the system parameter number of the embodiment of the present invention and the relation curve of maximum determining constraint number;
Fig. 5 is the value number of the system parameter of the embodiment of the present invention and the relation curve of maximum determining constraint number.
Specific embodiment
Further description of the technical solution of the present invention with reference to the accompanying drawing, and however, it is not limited to this, all to this Inventive technique scheme is modified or replaced equivalently, and without departing from the spirit and scope of the technical solution of the present invention, should all be covered Within the protection scope of the present invention.
Specific embodiment 1: embodiment is described with reference to Fig. 1.A kind of group for supporting constraint described in present embodiment Close test failure localization method, the specific steps of this method are as follows:
Step 1: executing whole test cases of examining system, obtained according to the implementing result of whole test cases correct Test use cases and error checking set of uses case;
Step 2: according to the safety value and constraint set of examining system, to judge examining system with the presence or absence of independence safety Value;
Step 3: if step 2 judges examining system, there are independence safety values, directly utilize the independence of examining system Property safety value be combined test failure positioning;
Step 4: if step 2 judges examining system, there is no independence safety values, execute the acquisition of analytical procedure one Error checking use-case, to be combined test failure positioning.
Specific embodiment 2: present embodiment is to a kind of combined test failure for supporting constraint described in embodiment one Localization method is further limited, and the detailed process of the step 2 is
The safety value of examining system is defined as: if the mistake interaction in examining system integrates as Π, and for examining system In any one parameter i, i ∈ [1, k], there is vertex (i, si), so that (i, si) it is not included in mistake interaction collection Π's In any mistake interaction, then claim siFor the point of safes of parameter i, claim the vector (s of the point of safes composition of each parameter of examining system1, s2,…,sk) be the examining system safety value, in which: k is the number of parameter in examining system;
For a parameter in examining system, the number of point of safes can be with more than one.
The constraint set of examining system is defined as: in an examining system, if the valued combinations of certain parameters to survey It tries data invalid or influences software to operate normally, then claim the presence of constraint between these parameters, indicated with mark C, these ginsengs Number is known as constraint, and the corresponding value of parameter is known as obligatory point, and the collection that composition is all constrained in system is collectively referred to as constraint set, about Constriction CsTo indicate;
Judge that examining system whether there is the process of independence safety value according to the safety value of examining system and constraint set are as follows:
Independence safety value is defined as: for the arbitrary parameter i in examining system, if the set that the point of safes of parameter i forms ForConstraint set is Cs, enableIn the presence ofIt is not sky, then it will set The referred to as independence safety value of examining system;Wherein:For intermediate variable.
For the concept that safety value is described in detail, for having there are three the examining system of parameter is inputted, each input parameter With 0,1,2 three value.As shown in figure 3, tie-portion indicates examining system mistake interaction in figure, mistake is handed in Class1 { { (2,0), (3,0) }, { (2,1), (3,0) } } each other represent 2 value of factor as 0 and 3 value of factor is 0, factor, 2 values For 1 and 3 value of factor is 0 two mistake interactions;In type 2 mistake interaction for { (2,0), (3,0) }, { (2,1), (3,0) }, {(1,0),(2,2)}}.In figure, any value of factor 1 is all not included in wrong interaction in Class1, when 2 value of factor is 2 Not by any mistake interaction covering, not by any mistake interaction covering when 3 value of factor is 1 or 2, at this point, the system safety value As S=(s1,s2,s3), each point of safes value is respectively s1={ 1,2,3 }, s2={ 2 }, s3={ 1,2 }, factor 2 in type 2 Any value by mistake interaction covering, at this point, the parameter be not present point of safes, system be not present safety value.
Mistake interaction integrates as Π's is defined as: if there are a certain interactive I for examining system, so that for arbitrarily covering the interaction Test case cause software fault, then I be referred to as one mistake interaction.If any proper subclass is not for mistake interaction I It is wrong interaction, then I is referred to as the minimum mistake interaction of system.
The collection of all minimum mistake interaction compositions of system is collectively referred to as minimum mistake interaction collection, is indicated with Π.If in Π Each mistake interaction has t element, then is denoted as Πt;If each mistake interaction at most has t element in Π, it is denoted as Πt。 If not specified otherwise, the mistake interaction collection being mentioned herein refers both to minimum mistake interaction collection.If test case T is not covered in Π It is any mistake interaction, then claim the test case to avoid Π.
Specific embodiment 3: present embodiment is to a kind of combined test failure for supporting constraint described in embodiment two Localization method is further limited, the detailed process of the step 3 in present embodiment are as follows:
If judging examining system in step 2, there are independence safety values, malfunction test algorithm or adaptive algorithm are utilized To be combined test failure positioning analysis.
The combined test failure that the common combinations test failure localization method of this field can be applied to present embodiment is fixed Position.
Specific embodiment 4: illustrating present embodiment in conjunction with Fig. 1 and Fig. 2.Present embodiment is to described in embodiment three It is a kind of support constraint combined test Fault Locating Method further limited, the tool of the step four in present embodiment Body process are as follows:
If step 2 judges examining system, there is no the error checking use-cases that independence safety value, selecting step one obtain Concentrate any error checking use-case T1As current erroneous use-case T, analysis current erroneous use-case T is executed;Execute the specific of analysis Process is as follows:
Step 4 one, the corresponding non-security parameter set A of initialization current erroneous use-case T, judge the parameter in set A Whether number is less than or equal to minimum mistake interaction dynamics t;
If the number of parameters in set A is less than or equal to minimum mistake interaction dynamics t, replaced using corresponding point of safes Non-security parameter in set A, to position minimum mistake interaction;
If the number of parameters in set A is greater than minimum mistake interaction dynamics t, the parameter in set A is divided into t+1 In set, it is denoted as set A respectively1、A2..., At+1;Choose each set Aj, j=1,2 ..., t+1 judge set AjIn Whether parameter all has independence point of safes;
Step 4 two, independence point of safes is defined as: interaction I, set E are tieed up for a m of examining systemI={ i1, i2,…,imIt is the corresponding parameter set of interaction I, i1,i2,…,imParameter in respectively interactive I, examining system constraint set are Cs, For parameter i any in examining systeml,AndAssuming that parameter ilSafe point set beVertex if it existsSo that for any m-1 parameter in interaction I andExamining system is avoided in the m dimension interaction of composition Constraint set Cs in all constraints, then claimFor parameter ilIndependence point of safes relative to interaction I;
If set AjIn each parameter there are independence point of safes, then using independence point of safes replace set AjIn it is right Parameter is answered, additional testing use-case T ' is generated;
If set AjIn comprising there is no the parameters of independence point of safes, then obtain there is no independence point of safes parameter Secure topical point,
Secure topical point is defined as: interaction I is tieed up for given m, for parameter i ∈ [1, k] a certain in examining system, Vertex (i, ps if it existsi), so that vertex (i, psi) will not cause with the m dimension interaction for interacting any m-1 parameter composition in I Examining system failure, then claim psiThe secure topical point of interaction I is tieed up relative to m for parameter i;Utilize independence point of safes and part Point of safes replaces set AjMiddle corresponding parameter generates additional testing use-case T ';
Step 4 three executes the additional testing use-case T ' that step 4 two generates, and judges whether additional testing use-case T ' occurs Trigger mistake;
If triggering mistake occurs, additional testing use-case T ' is assigned to current erroneous use-case T;
It is selecting that step 1 obtains, except T if not occurring to trigger mistake1Any mistake is surveyed in outer error checking use-case Example T on probation2, by error checking use-case T2It is assigned to current erroneous use-case T;
Current erroneous use-case T is analyzed as procedure described above to execute;Until all error checking use-cases that step 1 obtains It executes analysis to complete, orients minimum mistake interaction, that is, complete the positioning of combined test failure.
Non-security set of factors A refers to: the value of factor is the non-security point of corresponding factor in set A.
If independence safety value is not present in examining system, further constraint is needed to handle.
The test case T of an initiation software fault is chosen, it is corresponding to initialize the use-case first in malfunction analysis procedure Non-security value set of factors;
Then the set is divided into approximately equal t+1 set.For each set of factors, its independence is obtained first Property point of safes, for the factor of independence point of safes cannot be obtained, using may mistake interaction collection seek secure topical point.
Wherein it is noted that following two points: should disperse as far as possible the factor for not having independence point of safes in grouping process Into different groupings, the number of nonindependence point of safes when can reduce each replacement in this way, while being easier to obtain part Point of safes;During seeking secure topical point, acquire if necessary secure topical point because prime number be not more than interaction dynamics, then Directly using correctly interaction obtains known to system, otherwise, need to consider the influence of the secure topical point acquired.Later, it will survey Example T on probation carries out safety value replacement on corresponding position, generates additional testing use-case.If additional testing use-case does not trigger event Barrier then excludes the possibility that non-security value set of factors in the use-case is failure, continues to analyze next test case;Conversely, then will Additional testing use-case is assigned to T, continues to analyze, until non-security value set of factors number be less than interaction dynamics, obtain minimal error friendship Mutually.
The process of non-security value factor is replaced using independence point of safes or using independence point of safes and local point of safes Are as follows: the factor in value sets of factors A, A non-security for one is { i1,i2,…,it, we can use itIndependence peace Full point or secure topical point replace itValue in set A, to judge { i in set A1,i2,…,it-1Whether software is caused Failure;And so on, corresponding parameter is replaced in set A using independence point of safes or the secure topical point of more parameters Value,.
Interactive is defined as: set setWherein: factor ijIt is different,Then this set I is referred to as a t dimension interaction, claims set EI={ i1, i2 ..., itBe The corresponding set of factors of interaction I.One-dimensional interactionAlso referred to as vertex is abbreviated as
Embodiment
To illustrate this paper algorithm fault location effect in the safety value known system with system restriction, tool is chosen first There are five for the examining system of parameter, five parameters use { a, b, c, d, e } to indicate respectively, and parameters value is as follows:
A={ a0, a1 };B={ b0, b1, b2 };C={ c0, c1 };D={ d0, d1, d2 };E={ e0, e1, e2, e3 };
System restriction is { (b0, d1), (a1, e3), (b2, e2), (c0, d1) };Mistake interaction (a1, d2), (b2, e3)};
Assuming that system safety value is it is known that can generate more than ten tests for the examining system for { a0, b0, c0, d0, e0 } Use-case chooses a test case of the triggering system failure, such as { a0, b2, c1, d1, e3 }, herein to illustrate in above-mentioned system Under system constraint, mistake interaction (b2, e3) how is positioned.
In the case where parameter combination of two, for the examining system of five parameters, the grouping plan of 1+2+2 can be used Slightly, it is respectively to three additional testing use-cases are obtained after every group of carry out safety value replacement respectively:
AddTest11={ a0, b2, c1, d0, e0 }
AddTest12={ a0, b0, c0, d1, e3 }
AddTest13={ a0, b2, c1, d1, e3 }
Wherein, AddTest12 introduces constraint, and directly carrying out additional use-case test, to will lead to use-case invalid, it is therefore desirable into Row constraint processing.First determine whether it is to constrain since the safety value replacement of b and c causes to introduce, and the two parameters only have value For 0 point of safes, that is, independence point of safes is not present, so needing to seek its secure topical point respectively.For parameter b, Since parameter a is safety value in AddTest12, the value set for not constituting the parameter b of constraint with a0 is obtained first, it should be { b1, b2 } then can obtain one group of larger correct interaction according to the implementing result of initial stage test case and collect, (b1, D1), (b1, e3) is both present in correct interaction and concentrates, therefore the secure topical point for obtaining parameter b is b1;Next parameter c is sought Secure topical point, equally obtain the value set for not constituting the parameter c of constraint with a0 first, then obtained using correct interaction collection It obtains and b1, d1, e3 constitutes the value of correctly interactive parameter c as c1, thus obtain the additional testing use for supporting constraint Example AddTest120={ a0, b1, c1, d1, e3 }.According to the implementing result of use-case AddTest120, can obtain without constraint feelings The identical positioning conclusion of use-case AddTest12 under condition then illustrates that (d1, e3) is correct interaction that is, by test.
It executes AddTest13 to set out failure, illustrate to interact in { b2, c1, d1, e3 } comprising mistake, continue to be grouped, obtain To following additional testing use-case:
AddTest21={ a0, b0, c1, d1, e3 }
AddTest22={ a0, b2, c0, d1, e3 }
AddTest23={ a0, b2, c1, d0, e0 }
Wherein, AddTest21 introduces constraint, parameter b is replaced with secure topical point b1, implementing result is correct, explanation Without mistake interaction in { c1, d1, e3 };AddTest22 equally introduces constraint, and parameter c is replaced with secure topical point c1, executes As a result mistake illustrates that mistake interaction appears in { b2, d1, e3 }, due to proving that (d1, e3), (b2, d1) are correct hand over before Mutually, the minimal error interaction therefore in the available use-case is (b2, e3).
For the positioning performance and used system scope for illustrating above-mentioned algorithm, number is interacted in fixed system mistake In the case of, it is continuously increased system restriction number and is tested, and the constraint to each number, it is more to attempt different constraint combinations Secondary experiment simultaneously statisticallys analyze, and obtains the determining constraint number of maximum that can be realized positioning in the system (when system restriction number is little When this value, it is centainly able to achieve accurate positionin;And when system restriction number is greater than this value, it is not necessarily able to achieve accurate positionin, This with specifically constrain it is related), acquired results are as shown in table 1, when for fixed error interaction, the maximum that can position in canonical system Constrain number.
Table 1
To further illustrate that the maximum of system support determines the relationship of constraint number and system scale, respectively from system parameter Two aspects of number and each parameter value number carry out experimental analysis.Firstly, being 10 in each parameter value number of fixed system In the case where, it is continuously increased number of parameters and carries out many experiments and count, acquired results are as shown in Figure 4;Secondly, in preset parameter In the case that number is 10, the value number for being continuously increased each parameter carries out many experiments and counts, acquired results such as Fig. 5 institute Show.
Preset parameter value number supports the maximum of positioning to determine that constraint number reduces with the increase of system parameter number. This is because the increase of number of parameters causes combined test that the interaction number covered is needed to increase sharply, while test case number Mesh also increases, but the growth rate of test case is lower than required interactive growth rate.Under conditions of mistake interaction is certain, cause Possible mistake interaction collection is in large scale, and the correct interactive collection scale that can be used accordingly is relatively small, to a certain extent The acquisition of secure topical point is limited, so that maximum determine that constraint number reduces.
Fixed system number of parameters supports the maximum of constraint to determine that constraint number increases with the increase of system parameter value number Add.Although the interaction number that the increase of parameter value number covers needed for equally making increases, the diversification of parameter value will Expand the parameter value range for avoiding constraint to a greater extent, it is easier to local restriction point is obtained, so that maximum determine about Beam number increases.

Claims (4)

1. a kind of combined test Fault Locating Method for supporting constraint, which is characterized in that the specific steps of this method are as follows:
Step 1: executing whole test cases of examining system, correct test is obtained according to the implementing result of whole test cases Set of uses case and error checking set of uses case;
Step 2: according to the safety value and constraint set of examining system, to judge examining system with the presence or absence of independence safety value;
Step 3: if step 2 judges examining system, there are independence safety values, are directly pacified using the independence of examining system Total head is combined test failure positioning;
Step 4: if step 2 judges examining system, there is no independence safety values, execute the mistake of the acquisition of analytical procedure one Test case, to be combined test failure positioning.
2. a kind of combined test Fault Locating Method for supporting constraint according to claim 1, which is characterized in that the step Rapid two detailed process are as follows:
The safety value of examining system is defined as: if the mistake interaction in examining system integrates as Π, and for appointing in examining system It anticipates parameter i, i a ∈ [1, k], there is vertex (i, si), so that (i, si) it is not included in any of mistake interaction collection Π In mistake interaction, then claim siFor the point of safes of parameter i, claim the vector (s of the point of safes composition of each parameter of examining system1,s2,…, sk) be the examining system safety value, in which: k is the number of parameter in examining system;
The constraint set of examining system is defined as: in an examining system, if the valued combinations of certain parameters to test number It is operated normally according to invalid or influence software, then claims the presence of constraint between these parameters, indicated with mark C, these parameters claim For constraint, the corresponding value of parameter is known as obligatory point, and the collection that composition is all constrained in system is collectively referred to as constraint set, constraint set Use CsTo indicate;
Judge that examining system whether there is the process of independence safety value according to the safety value of examining system and constraint set are as follows:
Independence safety value is defined as: for the arbitrary parameter i in examining system, if the set that the point of safes of parameter i forms ForConstraint set is Cs, enableIn the presence ofIt is not sky, then it will set The referred to as independence safety value of examining system;Wherein:For intermediate variable.
3. a kind of combined test Fault Locating Method for supporting constraint according to claim 2, which is characterized in that the step Rapid three detailed process are as follows:
If judge in step 2 examining system there are independence safety value, using malfunction test algorithm or adaptive algorithm come into Row combined test fault locating analysis.
4. a kind of combined test Fault Locating Method for supporting constraint according to claim 3, which is characterized in that the step Rapid four detailed process are as follows:
If step 2 judges in the error checking set of uses case that examining system is obtained there is no independence safety value, selecting step one Any error checking use-case T1As current erroneous use-case T, analysis current erroneous use-case T is executed;Execute the detailed process of analysis It is as follows:
Step 4 one, the corresponding non-security parameter set A of initialization current erroneous use-case T, judge that the number of parameters in set A is It is no to be less than or equal to minimum mistake interaction dynamics t;
If the number of parameters in set A is less than or equal to minimum mistake interaction dynamics t, corresponding point of safes replacement set is utilized Non-security parameter in A, to position minimum mistake interaction;
If the number of parameters in set A is greater than minimum mistake interaction dynamics t, the parameter in set A is divided into t+1 set In, it is denoted as set A respectively1、A2..., At+1;Choose each set Aj, j=1,2 ..., t+1 judge set AjIn parameter Whether independence point of safes all there is;
Step 4 two, independence point of safes is defined as: interaction I, set E are tieed up for a m of examining systemI={ i1, i2,…,imIt is the corresponding parameter set of interaction I, i1,i2,…,imParameter in respectively interactive I, examining system constraint set are Cs, For parameter i any in examining systeml, il∈ [1, k] andAssuming that parameter ilSafe point set beIt pushes up if it exists PointSo that for any m-1 parameter in interaction I andSystem to be measured is avoided in the m dimension interaction of composition All constraints in the constraint set Cs of system, then claimFor parameter ilIndependence point of safes relative to interaction I;
If set AjIn each parameter there are independence point of safes, then using independence point of safes replace set AjMiddle corresponding ginseng Number generates additional testing use-case T ';
If set AjIn comprising there is no independence point of safes parameter, then obtain be not present independence point of safes parameter part Point of safes,
Secure topical point is defined as: interaction I is tieed up for given m, for parameter i ∈ [1, k] a certain in examining system, if depositing In vertex (i, psi), so that vertex (i, psi) with interact in I the m dimension that any m-1 parameter is constituted interact will not cause it is to be measured The system failure then claims psiThe secure topical point of interaction I is tieed up relative to m for parameter i;Utilize independence point of safes and secure topical Point replacement set AjMiddle corresponding parameter generates additional testing use-case T ';
Step 4 three executes the additional testing use-case T ' that step 4 two generates, and judges whether additional testing use-case T ' triggers Mistake;
If triggering mistake occurs, additional testing use-case T ' is assigned to current erroneous use-case T;
It is selecting that step 1 obtains, except T if not occurring to trigger mistake1Any error checking use-case in outer error checking use-case T2, by error checking use-case T2It is assigned to current erroneous use-case T;
Current erroneous use-case T is analyzed as procedure described above to execute;Until all error checking use-cases that step 1 obtains execute Analysis is completed, and is oriented minimum mistake interaction, that is, is completed the positioning of combined test failure.
CN201810738553.5A 2018-07-06 2018-07-06 Constraint-supported combined test fault positioning method Active CN109032932B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810738553.5A CN109032932B (en) 2018-07-06 2018-07-06 Constraint-supported combined test fault positioning method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810738553.5A CN109032932B (en) 2018-07-06 2018-07-06 Constraint-supported combined test fault positioning method

Publications (2)

Publication Number Publication Date
CN109032932A true CN109032932A (en) 2018-12-18
CN109032932B CN109032932B (en) 2021-08-31

Family

ID=64641723

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810738553.5A Active CN109032932B (en) 2018-07-06 2018-07-06 Constraint-supported combined test fault positioning method

Country Status (1)

Country Link
CN (1) CN109032932B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111680725A (en) * 2020-05-28 2020-09-18 哈尔滨工业大学 Gas sensor array multi-fault isolation algorithm based on reconstruction contribution
CN118170690A (en) * 2024-05-14 2024-06-11 南京大学 Combined test multi-fault positioning method based on to-be-determined tuple

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104050086A (en) * 2014-07-01 2014-09-17 南京邮电大学 Error locating method based on combinatorial testing
US20170116106A1 (en) * 2013-08-29 2017-04-27 International Business Machines Corporation Testing of combined code changesets in a software product

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170116106A1 (en) * 2013-08-29 2017-04-27 International Business Machines Corporation Testing of combined code changesets in a software product
CN104050086A (en) * 2014-07-01 2014-09-17 南京邮电大学 Error locating method based on combinatorial testing

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
王建峰 等: ""基于错误交互集的组合测试软件故障定位方法"", 《电子学报》 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111680725A (en) * 2020-05-28 2020-09-18 哈尔滨工业大学 Gas sensor array multi-fault isolation algorithm based on reconstruction contribution
CN111680725B (en) * 2020-05-28 2023-05-05 哈尔滨工业大学 Gas sensor array multi-fault isolation algorithm based on reconstruction contribution
CN118170690A (en) * 2024-05-14 2024-06-11 南京大学 Combined test multi-fault positioning method based on to-be-determined tuple

Also Published As

Publication number Publication date
CN109032932B (en) 2021-08-31

Similar Documents

Publication Publication Date Title
Wong et al. A family of code coverage-based heuristics for effective fault localization
EP1899876B1 (en) System and method for using model analysis to generate directed test vectors
CN102750223B (en) A kind of location of mistake method based on object-oriented program section spectrum
EP2975527A2 (en) A method for tracing computer software
CN106598850B (en) A kind of location of mistake method based on program failure clustering
CN105468517B (en) A kind of mistake of statistics localization method based on Black-box testing Cases yojan
Gong et al. Diversity maximization speedup for fault localization
CN109032932A (en) A kind of combined test Fault Locating Method for supporting constraint
CN104572474B (en) A kind of lightweight location of mistake Implementation Technology based on Dynamic Slicing
Hooda et al. A review: study of test case generation techniques
Angelopoulos et al. Identifying and correcting bias from time-and severity-dependent reporting rates in the estimation of the covid-19 case fatality rate
US11194703B2 (en) System testing infrastructure for analyzing soft failures in active environment
KR101940486B1 (en) Low cost apparatus and method for error-based program testing
Nishiura et al. Improving faulty interaction localization using logistic regression
Ammar et al. Enhanced weighted method for test case prioritization in regression testing using unique priority value
Dutta et al. Effective fault localization using an ensemble classifier
US11132286B1 (en) Dynamic reordering of test case execution
US11609842B2 (en) System testing infrastructure for analyzing and preventing soft failure in active environment
CN107133168B (en) Event sequence fault positioning method
US11593256B2 (en) System testing infrastructure for detecting soft failure in active environment
CN108959091B (en) Event sequence fault positioning method supporting constraint
AU2021103087A4 (en) Big data testing method and system
Friedrichs et al. A comparison infrastructure for fault characterization algorithms
Lian et al. A new fault localizing method for the program debugging process
CN109815133A (en) A kind of method for testing software, calculates equipment and computer storage medium at device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant