CN109000614A - A kind of 0 grade of slant detection method and detection system, readable storage medium storing program for executing of structured light projection device - Google Patents
A kind of 0 grade of slant detection method and detection system, readable storage medium storing program for executing of structured light projection device Download PDFInfo
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- CN109000614A CN109000614A CN201810415992.2A CN201810415992A CN109000614A CN 109000614 A CN109000614 A CN 109000614A CN 201810415992 A CN201810415992 A CN 201810415992A CN 109000614 A CN109000614 A CN 109000614A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
- G01C9/02—Details
- G01C9/06—Electric or photoelectric indication or reading means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
- G01C9/02—Details
- G01C9/06—Electric or photoelectric indication or reading means
- G01C2009/066—Electric or photoelectric indication or reading means optical
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Abstract
The invention discloses the 0 grade of slant detection methods and detection system, readable storage medium storing program for executing of a kind of structured light projection device.0 grade of slant detection method includes: step a: structured light projection device is to planar projective hot spot, hot spot acquisition device is to plane acquisition hot spot to obtain light spot image, wherein, the optical axis of hot spot acquisition device is perpendicular to plane, and the optical center connection between structured light projection device and hot spot acquisition device is perpendicular to plane；Step b: 0 grade of point diffraction and the image center in light spot image are determined；Step c: according to the 0 grade of point diffraction and image center determined, 0 grade of inclined tilt parameters of structured light projection device are calculated.0 grade of slant detection method can detecte out 0 grade of inclined tilt parameters of structured light projection device, to be corrected to 0 grade of inclination.
Description
Technical field
The present invention relates to the 0 grade of slant detection methods and detection of structure optical arena more particularly to a kind of structured light projection device
System, readable storage medium storing program for executing.
Background technique
As Apple Inc. uses Face ID technology on intelligent terminal, recognition of face, 3D are done using structure optical mode group
Sensing and VR equipment etc. will become following mainstream.Structure optical mode group mainly includes structured light projection device and structure light camera shooting
Head, structured light projection device are responsible for being scanned to subject projected spot, and structure light video camera head is responsible for shot to being projected onto
Hot spot on object is shot, and then, back-end processor parses the light spot image taken by Processing Algorithm, to obtain
The three-dimensional data of subject.Wherein, it needs to carry out structured light projection device and structure light video camera head before the factory of structure optical mode group
AA alignment, and 0 grade of structured light projection device inclination is too greatly, will have an impact to the appearance of the structure optical mode group after AA.
0 grade of inclination of structured light projection device refers to: in the hot spot that structured light projection device is cast out, 0 grade of point diffraction is (most
Bright spot) it theoretically should be in the front of its optical center, but since production inevitable factor, 0 grade of point diffraction such as tolerance are past
Toward the front that can deviate its optical center.
Summary of the invention
In order to solve above-mentioned the deficiencies in the prior art, the present invention provides a kind of 0 grade of tilt detection side of structured light projection device
Method and detection system, readable storage medium storing program for executing.0 grade of slant detection method can detecte out structured light projection device 0 grade is inclined
Tilt parameters, to be corrected to 0 grade of inclination.
The technical problems to be solved by the invention are achieved by the following technical programs:
A kind of 0 grade of slant detection method of structured light projection device, comprising:
Step a: structured light projection device obtains hot spot figure to plane acquisition hot spot to planar projective hot spot, hot spot acquisition device
Picture, wherein the optical axis of hot spot acquisition device is perpendicular to plane, and the optical center between structured light projection device and hot spot acquisition device connects
Line is perpendicular to plane；
Step b: 0 grade of point diffraction and the image center in light spot image are determined；
Step c: according to the 0 grade of point diffraction and image center determined, 0 grade of inclined inclination ginseng of structured light projection device is calculated
Number.
Further, step a includes:
Step a.a: structured light projection device is placed in front of transmission plane, after hot spot acquisition device is placed on transmission plane
Side, wherein optical center connection of the optical axis of hot spot acquisition device perpendicular to plane, between structured light projection device and hot spot acquisition device
Perpendicular to transmission plane；
Step a.b: structured light projection device is to the front projection hot spot of transmission plane, and hot spot acquisition device is to the back side of transmission plane
Hot spot is acquired to obtain light spot image.
Further, step c includes:
Step c.a: using the optical center connection between structured light projection device and hot spot acquisition device as Z axis, three-dimensional rectangular coordinate is established
Be XYZ, obtain 0 grade of point diffraction coordinate (X0, Y0,0) in coordinate system XYZ and image center coordinate (Xcenter,
Ycenter, 0)；
Step c.b: dxtilt=(X0-Xcenter) * psize and dytilt=(Y0-Ycenter) * psize is calculated, wherein
Psize is the pixel size in light spot image；
Step c.c: dxtilt1=d1/f*dxtilt and dytilt1=d1/f*dytilt are calculated, wherein d1 is hot spot acquisition
For device to the distance of plane, f is the focal length of hot spot acquisition device；
Step c.d: tilt parameters Xtilt=arc tan(dxtilt1/d2 is calculated) * 180/ π and Yxilt=arc tan
(dytilt1/d2) * 180/ π, wherein d2 is distance of the spot projector to plane.
A kind of 0 grade of tilt detection system of structured light projection device, comprising:
Hot spot acquisition device, for acquiring structured light projection device to the hot spot of planar projective to obtain light spot image, optical axis hangs down
Directly in plane, and the optical center connection between structured light projection device is perpendicular to plane；
Processing unit calculates 0 grade of inclined tilt parameters for carrying out processing analysis to the light spot image got；
The processing unit includes: processor and the memory with processor electric connection, is stored in the memory
For the computer program that the processor executes, when the processor executes the computer program, following steps are carried out:
Step 1: reading the light spot image that the hot spot acquisition device is got；
Step 2: determining 0 grade of point diffraction and the image center in light spot image；
Step 3: according to the 0 grade of point diffraction and image center determined, calculating 0 grade of inclined inclination ginseng of structured light projection device
Number.
Further, further includes:
Transmission plane is adopted for the hot spot that bearing structure light projectors are cast out so that hot spot acquisition device carries out hot spot
Collection.
Further, further includes:
Fixed device, for carrying fixed structure light projectors and hot spot acquisition device respectively, so that the light of hot spot acquisition device
Axis is perpendicular to plane, and the optical center connection between structured light projection device and hot spot acquisition device is perpendicular to plane.
Further, the processor carries out following steps when carrying out step 3:
Step 3.1: using the optical center connection between structured light projection device and hot spot acquisition device as Z axis, establishing three-dimensional rectangular coordinate
Be XYZ, obtain 0 grade of point diffraction coordinate (X0, Y0,0) in coordinate system XYZ and image center coordinate (Xcenter,
Ycenter, 0)；
Step 3.2: calculating dxtilt=(X0-Xcenter) * psize and dytilt=(Y0-Ycenter) * psize, wherein
Psize is the pixel size in light spot image；
Step 3.3: calculating dxtilt1=d1/f*dxtilt and dytilt1=d1/f*dytilt, wherein d1 is hot spot acquisition
For device to the distance of plane, f is the focal length of hot spot acquisition device；
Step 3.4: calculating tilt parameters Xtilt=arc tan(dxtilt1/d2) * 180/ π and Yxilt=arc tan
(dytilt1/d2) * 180/ π, wherein d2 is distance of the spot projector to plane.
A kind of readable storage medium storing program for executing, is stored with the computer program executed for processor, which is located
When managing device execution, following steps are carried out:
Step 1: reading the light spot image that the hot spot acquisition device is got；
Step 2: determining 0 grade of point diffraction and the image center in light spot image；
Step 3: according to the 0 grade of point diffraction and image center determined, calculating 0 grade of inclined inclination ginseng of structured light projection device
Number.
Further, when which is executed by processor, following steps are carried out in step 3:
Step 3.1: using the optical center connection between structured light projection device and hot spot acquisition device as Z axis, establishing three-dimensional rectangular coordinate
Be XYZ, obtain 0 grade of point diffraction coordinate (X0, Y0,0) in coordinate system XYZ and image center coordinate (Xcenter,
Ycenter, 0)；
Step 3.2: calculating dxtilt=(X0-Xcenter) * psize and dytilt=(Y0-Ycenter) * psize, wherein
Psize is the pixel size in light spot image；
Step 3.3: calculating dxtilt1=d1/f*dxtilt and dytilt1=d1/f*dytilt, wherein d1 is hot spot acquisition
For device to the distance of plane, f is the focal length of hot spot acquisition device；
Step 3.4: calculating tilt parameters Xtilt=arc tan(dxtilt1/d2) * 180/ π and Yxilt=arc tan
(dytilt1/d2) * 180/ π, wherein d2 is distance of the spot projector to plane.
0 grade for can detecte out structured light projection device the invention has the following beneficial effects: 0 grade of slant detection method inclines
Oblique tilt parameters Xtilt and Ytilt, then technical staff can be according to the two tilt parameters, respectively along X-axis and Y-axis
Opposite direction is with identical angle rotational structure light projectors, 0 grade of correction of a final proof inclination.
Detailed description of the invention
Fig. 1 is the step block diagram of 0 grade of slant detection method provided by the invention；
Fig. 2 is the side view of 0 grade of tilt detection system provided by the invention；
Fig. 3 is the top view of 0 grade of tilt detection system provided by the invention；
Fig. 4 is the schematic diagram of 0 grade of point diffraction and image center in light spot image when detecting；
Fig. 5 is the step block diagram that processing unit executes in 0 grade of tilt detection system provided by the invention.
Specific embodiment
The present invention will be described in detail with reference to the accompanying drawings and examples.
Embodiment one
As shown in Figure 1, a kind of 0 grade of slant detection method of structured light projection device 101, comprising:
Step a: structured light projection device 101 is to planar projective hot spot, and hot spot acquisition device 102 is to plane acquisition hot spot to obtain light
Spot image, wherein the optical axis of hot spot acquisition device 102 is perpendicular to plane, and structured light projection device 101 and hot spot acquisition device
Optical center connection between 102 is perpendicular to plane；
In step a, fixed device can be used to carry fixed structure light projectors 101 and hot spot acquisition device 102 respectively,
So that the optical axis of hot spot acquisition device 102 is perpendicular to plane, and between structured light projection device 101 and hot spot acquisition device 102
Optical center connection is perpendicular to plane.
Step a is specifically included:
Step a.a: as shown in Figures 2 and 3, structured light projection device 101 is placed on 103 front of transmission plane, hot spot is acquired and is filled
It sets 102 and is placed on 103 rear of transmission plane, wherein the optical axis of hot spot acquisition device 102 is perpendicular to plane, structured light projection device
Optical center connection between 101 and hot spot acquisition device 102 is perpendicular to transmission plane 103；
Step a.b: structured light projection device 101 is to the front projection hot spot of transmission plane 103, and hot spot acquisition device 102 is to light transmission
The back side acquisition hot spot of plane 103 is to obtain light spot image.
Preferably, the transmission plane 103 is translucent curtain, and the hot spot acquisition device 102 is structure light video camera head.
Step b: 0 grade of point diffraction and the image center in light spot image are determined；
In step b, 0 grade of point diffraction refers to 0 grade of diffraction grating of optical center of structured light projection device 101, i.e., in light spot image
The maximum pixel of brightness value；It is preferably but not limited to find determination by the binaryzation of image, existing algorithm is not described in detail.
Step c: according to the 0 grade of point diffraction and image center determined, 0 grade of inclination of structured light projection device 101 is calculated
Tilt parameters Xtilt and Ytilt.
Step c is specifically included:
Step c.a: using the optical center connection between structured light projection device 101 and hot spot acquisition device 102 as Z axis, three-dimensional straight is established
Angular coordinate system XYZ obtains 0 grade of point diffraction coordinate (X0, Y0, Z0) and image center coordinate as shown in Figure 4 in coordinate system XYZ
(Xcenter, Ycenter, 0)；
Step c.b: dxtilt=(X0-Xcenter) * psize and dytilt=(Y0-Ycenter) * psize is calculated, wherein
Psize is the pixel size in light spot image；
Step c.c: dxtilt1=d1/f*dxtilt and dytilt1=d1/f*dytilt are calculated, wherein d1 is hot spot acquisition
Device 102 arrives the distance of plane, and f is the focal length of hot spot acquisition device 102；
Step c.d: tilt parameters Xtilt=arc tan(dxtilt1/d2 is calculated) * 180/ π and Yxilt=arc tan
(dytilt1/d2) * 180/ π, wherein d2 is distance of the spot projector to plane.
Wherein, Xtilt is the tilt angle of structured light projection device 101 in the X-axis direction, and Ytilt is structured light projection device
101 inclination inclination angle in the Y-axis direction；D1 and d2 in the above process can be obtained by mode measured directly, psize and f
For the preset parameter value of hot spot acquisition device 102.
0 grade of slant detection method can detecte out structured light projection device 101 0 grade of inclined tilt parameters Xtilt and
Ytilt, then technical staff can be according to the two tilt parameters, respectively in X-direction and Y direction with same size
Angle opposite direction rotational structure light projectors 101, are finally completed 0 grade of inclined correction.
Embodiment two
As shown in Figures 2 and 3,0 grade of tilt detection system of a kind of structured light projection device 101, comprising:
Hot spot acquisition device 102, the hot spot for acquiring structured light projection device 101 to planar projective to obtain light spot image,
Optical axis is perpendicular to plane, and the optical center connection between structured light projection device 101 is perpendicular to plane；
Processing unit for carrying out processing analysis to the light spot image got, and calculates 0 grade of inclined tilt parameters；
The processing unit includes: processor and the memory with processor electric connection, is stored in the memory
For the computer program that the processor executes, when the processor executes the computer program, as shown in figure 5, carrying out as follows
Step:
Step 1: reading the light spot image that the hot spot acquisition device 102 is got；
Step 2: determining 0 grade of point diffraction and the image center in light spot image；
Step 3: according to the 0 grade of point diffraction and image center determined, calculating 0 grade of structured light projection device 101 and inclined incline
Oblique parameter Xtilt and Ytilt.
When detecting, the processing unit can be connected to the hot spot by modes such as data line, bluetooth or WiFi and adopt
Acquisition means 102, to carry out data transmission between the hot spot acquisition device 102；The hot spot acquisition device 102 can with but not
It is limited to for PC, the hot spot acquisition device 102 preferably structure light video camera head.
The detection system further include:
Transmission plane 103, for the hot spot that bearing structure light projectors 101 are cast out, for hot spot acquisition device 102 into
The acquisition of row hot spot.
When detecting, structured light projection device 101 is placed on the front of transmission plane 103, and to the front of transmission plane 103
Projected spot；Hot spot acquisition device 102 is placed on 103 rear of transmission plane, and acquires hot spot to the back side of transmission plane 103
To obtain light spot image.The optical axis of hot spot acquisition device 102 is perpendicular to transmission plane 103, and structured light projection device 101 and hot spot
Optical center connection between acquisition device 102 is perpendicular to transmission plane 103.
Preferably, the transmission plane 103 is translucent curtain.
The detection system further include:
Fixed device, for carrying fixed structure light projectors 101 and hot spot acquisition device 102 respectively, so that hot spot acquisition dress
102 optical axis is set perpendicular to plane, and the optical center connection between structured light projection device 101 and hot spot acquisition device 102 perpendicular to
Plane.
The processor specifically carries out following steps when carrying out step 3:
Step 3.1: using the optical center connection between structured light projection device 101 and hot spot acquisition device 102 as Z axis, establishing three-dimensional straight
Angular coordinate system XYZ obtains 0 grade of point diffraction coordinate (X0, Y0, Z0) and image center coordinate as shown in Figure 4 in coordinate system XYZ
(Xcenter, Ycenter, 0)；
Step 3.2: calculating dxtilt=(X0-Xcenter) * psize and dytilt=(Y0-Ycenter) * psize, wherein
Psize is the pixel size in light spot image；
Step 3.3: calculating dxtilt1=d1/f*dxtilt and dytilt1=d1/f*dytilt, wherein d1 is hot spot acquisition
Device 102 arrives the distance of plane, and f is the focal length of hot spot acquisition device 102；
Step 3.4: calculating tilt parameters Xtilt=arc tan(dxtilt1/d2) * 180/ π and Yxilt=arc tan
(dytilt1/d2) * 180/ π, wherein d2 is distance of the spot projector to plane.
Wherein, Xtilt is the tilt angle of structured light projection device 101 in the X-axis direction, and Ytilt is structured light projection device
101 inclination inclination angle in the Y-axis direction；D1 and d2 in the above process can be obtained by mode measured directly, psize and f
For the preset parameter value of hot spot acquisition device 102.
Embodiment three
A kind of readable storage medium storing program for executing is stored with the computer program executed for processor, and the computer program is by processor
When execution, following steps are carried out:
Step 1: reading the light spot image that the hot spot acquisition device 102 is got；
Step 2: determining 0 grade of point diffraction and the image center in light spot image；
Step 3: according to the 0 grade of point diffraction and image center determined, calculating 0 grade of structured light projection device 101 and inclined incline
Oblique parameter Xtilt and Ytilt.
Wherein, when which is executed by processor, following steps are carried out in step 3:
Step 3.1: using the optical center connection between structured light projection device 101 and hot spot acquisition device 102 as Z axis, establishing three-dimensional straight
Angular coordinate system XYZ, obtain 0 grade of point diffraction coordinate (X0, Y0, Z0) in coordinate system XYZ and image center coordinate (Xcenter,
Ycenter, 0)；
Step 3.2: calculating dxtilt=(X0-Xcenter) * psize and dytilt=(Y0-Ycenter) * psize, wherein
Psize is the pixel size in light spot image；
Step 3.3: calculating dxtilt1=d1/f*dxtilt and dytilt1=d1/f*dytilt, wherein d1 is hot spot acquisition
Device 102 arrives the distance of plane, and f is the focal length of hot spot acquisition device 102；
Step 3.4: calculating tilt parameters Xtilt=arc tan(dxtilt1/d2) * 180/ π and Yxilt=arc tan
(dytilt1/d2) * 180/ π, wherein d2 is distance of the spot projector to plane.
Wherein, Xtilt is the tilt angle of structured light projection device 101 in the X-axis direction, and Ytilt is structured light projection device
101 inclination inclination angle in the Y-axis direction；D1 and d2 in the above process can be obtained by mode measured directly, psize and f
For the preset parameter value of hot spot acquisition device 102.
Embodiments of the present invention above described embodiment only expresses, the description thereof is more specific and detailed, but can not
Therefore limitations on the scope of the patent of the present invention are interpreted as, as long as skill obtained in the form of equivalent substitutions or equivalent transformations
Art scheme should all be fallen within the scope and spirit of the invention.
Claims (9)
1. a kind of 0 grade of slant detection method of structured light projection device characterized by comprising
Step a: structured light projection device obtains hot spot figure to plane acquisition hot spot to planar projective hot spot, hot spot acquisition device
Picture, wherein the optical axis of hot spot acquisition device is perpendicular to plane, and the optical center between structured light projection device and hot spot acquisition device connects
Line is perpendicular to plane；
Step b: 0 grade of point diffraction and the image center in light spot image are determined；
Step c: according to the 0 grade of point diffraction and image center determined, 0 grade of inclined inclination ginseng of structured light projection device is calculated
Number.
2. 0 grade of slant detection method of structured light projection device according to claim 1, which is characterized in that step a includes:
Step a.a: structured light projection device is placed in front of transmission plane, after hot spot acquisition device is placed on transmission plane
Side, wherein 0 grade of tilt parameters of structured light projection device, and the optical center connection between structured light projection device and hot spot acquisition device
Perpendicular to transmission plane；
Step a.b: structured light projection device is to the front projection hot spot of transmission plane, and hot spot acquisition device is to the back side of transmission plane
Hot spot is acquired to obtain light spot image.
3. 0 grade of slant detection method of structured light projection device according to claim 1 or 2, which is characterized in that step c packet
It includes:
Step c.a: using the optical center connection between structured light projection device and hot spot acquisition device as Z axis, three-dimensional rectangular coordinate is established
Be XYZ, obtain 0 grade of point diffraction coordinate (X0, Y0,0) in coordinate system XYZ and image center coordinate (Xcenter,
Ycenter, 0)；
Step c.b: dxtilt=(X0-Xcenter) * psize and dytilt=(Y0-Ycenter) * psize is calculated, wherein
Psize is the pixel size in light spot image；
Step c.c: dxtilt1=d1/f*dxtilt and dytilt1=d1/f*dytilt are calculated, wherein d1 is hot spot acquisition
For device to the distance of plane, f is the focal length of hot spot acquisition device；
Step c.d: tilt parameters Xtilt=arc tan(dxtilt1/d2 is calculated) * 180/ π and Yxilt=arc tan
(dytilt1/d2) * 180/ π, wherein d2 is distance of the spot projector to plane.
4. a kind of 0 grade of tilt detection system of structured light projection device characterized by comprising
Hot spot acquisition device, the hot spot for acquiring structured light projection device to planar projective is to obtain light spot image；
Processing unit calculates 0 grade of inclined tilt parameters for carrying out processing analysis to the light spot image got；
The processing unit includes: processor and the memory with processor electric connection, is stored in the memory
For the computer program that the processor executes, when the processor executes the computer program, following steps are carried out:
Step 1: reading the light spot image that the hot spot acquisition device is got；
Step 2: determining 0 grade of point diffraction and the image center in light spot image；
Step 3: according to the 0 grade of point diffraction and image center determined, calculating 0 grade of inclined inclination ginseng of structured light projection device
Number.
5. 0 grade of tilt detection system of structured light projection device according to claim 4, which is characterized in that further include:
Transmission plane is adopted for the hot spot that bearing structure light projectors are cast out so that hot spot acquisition device carries out hot spot
Collection.
6. 0 grade of tilt detection system of structured light projection device according to claim 4, which is characterized in that further include:
Fixed device, for carrying fixed structure light projectors and hot spot acquisition device respectively, so that the light of hot spot acquisition device
Axis is perpendicular to plane, and the optical center connection between structured light projection device and hot spot acquisition device is perpendicular to plane.
7. according to 0 grade of tilt detection system of structured light projection device described in claim 5-6, which is characterized in that the processing
Device carries out following steps when carrying out step 3:
Step 3.1: using the optical center connection between structured light projection device and hot spot acquisition device as Z axis, establishing three-dimensional rectangular coordinate
Be XYZ, obtain 0 grade of point diffraction coordinate (X0, Y0,0) in coordinate system XYZ and image center coordinate (Xcenter,
Ycenter, 0)；
Step 3.2: calculating dxtilt=(X0-Xcenter) * psize and dytilt=(Y0-Ycenter) * psize, wherein
Psize is the pixel size in light spot image；
Step 3.3: calculating dxtilt1=d1/f*dxtilt and dytilt1=d1/f*dytilt, wherein d1 is hot spot acquisition
For device to the distance of plane, f is the focal length of hot spot acquisition device；
Step 3.4: calculating tilt parameters Xtilt=arc tan(dxtilt1/d2) * 180/ π and Yxilt=arc tan
(dytilt1/d2) * 180/ π, wherein d2 is distance of the spot projector to plane.
8. a kind of readable storage medium storing program for executing is stored with the computer program executed for processor, which is characterized in that the computer
When program is executed by processor, following steps are carried out:
Step 1: reading the light spot image that the hot spot acquisition device is got；
Step 2: determining 0 grade of point diffraction and the image center in light spot image；
Step 3: according to the 0 grade of point diffraction and image center determined, calculating 0 grade of inclined inclination ginseng of structured light projection device
Number.
9. readable storage medium storing program for executing according to claim 8, which is characterized in that when the computer program is executed by processor,
Following steps are carried out in step 3:
Step 3.1: using the optical center connection between structured light projection device and hot spot acquisition device as Z axis, establishing three-dimensional rectangular coordinate
Be XYZ, obtain 0 grade of point diffraction coordinate (X0, Y0,0) in coordinate system XYZ and image center coordinate (Xcenter,
Ycenter, 0)；
Step 3.2: calculating dxtilt=(X0-Xcenter) * psize and dytilt=(Y0-Ycenter) * psize, wherein
Psize is the pixel size in light spot image；
Step 3.3: calculating dxtilt1=d1/f*dxtilt and dytilt1=d1/f*dytilt, wherein d1 is hot spot acquisition
For device to the distance of plane, f is the focal length of hot spot acquisition device；
Step 3.4: calculating tilt parameters Xtilt=arc tan(dxtilt1/d2) * 180/ π and Yxilt=arc tan
(dytilt1/d2) * 180/ π, wherein d2 is distance of the spot projector to plane.
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| CN112307941A (en) * | 2020-10-28 | 2021-02-02 | 广东小天才科技有限公司 | Image conversion method and terminal equipment |
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