CN108957724A - A kind of microscope alignment correction method based on Fourier's lamination imaging technique - Google Patents
A kind of microscope alignment correction method based on Fourier's lamination imaging technique Download PDFInfo
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Abstract
A kind of microscope alignment correction method based on Fourier's lamination imaging technique proposed in the present invention, its main contents includes: global offset model, the reconstruction of high-definition picture and alignment correction, its process is, first initialize the high-resolution object and pupil function of reconstruction, then all LED are successively lighted, low-resolution image is generated respectively, and apply strength constraint, then object function and pupil function are updated, above step is repeated until algorithmic statement, the global offset of last directly correction LED array reaches minimum value until the cost function of search global offset.The present invention solves the problems, such as that previous Fourier's lamination imaging position modification method will increase algorithm complexity, computer load and calculate the time, is capable of the dislocation of fast and effeciently correct microscope imaging, while the algorithm used is simple and practical.
Description
Technical field
The present invention relates to calculating fields, misplace more particularly, to a kind of microscope based on Fourier's lamination imaging technique
Bearing calibration.
Background technique
Fourier lamination imaging microscope (FPM) is a kind of calculating imaging technique newly developed, can provide high-resolution
(HR) and the image of 1,000,000,000 pixels of wide visual field (FOV).Fourier's lamination imaging technique can be applied to optical microphotograph field, obtain
The micro-image for the resolution that secures satisfactory grades, can be used for field of biomedicine, carry out essence to the microorganisms such as virus and human organ
True research treatment；It, can be more easily to small biology using Fourier's lamination imaging technique in life science
Tissue carries out deep scientific research.However, previous Fourier's lamination imaging position modification method will increase algorithm complexity,
Computer load and calculating time.
A kind of microscope alignment correction method based on Fourier's lamination imaging technique is proposed in the present invention, is first initialized
The high-resolution object and pupil function of reconstruction, then successively light all LED, generate low-resolution image respectively, and apply
Add strength constraint, then update object function and pupil function, repeats above step until algorithmic statement, finally directly correct
The global offset of LED array reaches minimum value until the cost function of search global offset.The present invention being capable of fast and effeciently school
The dislocation of positive microscope imaging, while the algorithm used is simple and practical.
Summary of the invention
It will increase algorithm complexity, computer load and calculating for previous Fourier's lamination imaging position modification method
The problem of time, the purpose of the present invention is to provide a kind of microscope alignment correction sides based on Fourier's lamination imaging technique
Method first initializes the high-resolution object and pupil function of reconstruction, then successively lights all LED, generate low resolution respectively
Rate image, and apply strength constraint, object function and pupil function are then updated, repeats above step until algorithmic statement, most
The global offset of directly correction LED array reaches minimum value until searching for the cost function of global offset afterwards.
To solve the above problems, the present invention provides a kind of microscope alignment correction side based on Fourier's lamination imaging technique
Method, main contents include:
(1) global offset model；
(2) reconstruction of high-definition picture；
(3) alignment correction.
Wherein, the global offset model, being one, only for tool there are two the simplification position model of the factor, x and y are determining
Two factors of the position of each light emitting diode (LED), (xm,n,ym,n) represent m row n-th column LED position.
Wherein, the reconstruction of the high-definition picture, one is divided into six steps:
(1) high-resolution (HR) the object O that initialization is rebuildj(kx,ky) and pupil function Pj(kx,ky)；
(2) low resolution (LR) image is generated；
(3) apply strength constraint；
(4) object and pupil function are updated；
(5) step (2) are repeated to all LED and arrives (4)；
(6) step (2) to (5) are repeated until algorithmic statement.
Further, the generation low-resolution image refers to corresponding with the following formula generation column of m row n-th LED
Low-resolution image:
WhereinIndicate the Fourier spectrum of the LR image obtained with m row the n-th column LED illumination.
Further, the application strength constraint is to apply strength constraint to captured image with following formula:
WhereinWithIt is LR picture strip strength constraint and the complex field without strength constraint respectively.
Further, the update object and pupil function refer to and update object and pupil function with following formula:
Wherein, δ1And δ2It is two iotazation constants, for guaranteeing the stability of quantity.
Wherein, the alignment correction refers to the global offset of directly correction LED array, until the cost of global offset
Function reaches minimum, and in order to improve efficiency, only calculates the incident vector in the lighting area of target.
Further, the LED array, the incident wave vector of each LED are as follows:
Wherein in view of the spacing of two adjacent LEDs is d, the range delta x and Δ y of global offset are set as [- d, d], Δ x and
The value of Δ y initialization is all 0mm.
Further, the cost function refers to the cost function of judgement search global offset Δ x and Δ y, every time weight
Judge whether cost function reaches minimum value after building high-definition picture, is searched again for if not.
Further, the search global offset refers to using simulated annealing (SA) algorithm and searches in a cycle
Rope Δ x and Δ y, it is then inclined in the overall situation of correction LED array until this circulation is continued until that cost function reaches minimum value
After shifting, by traditional Fourier lamination imaging algorithm, the HR image of all LR image reconstruction samples is utilized；In certain situations
Under, after the global offset for correcting LED array, need to correct the intrinsic office of each LED using an iteration of conventional SA algorithm
The subtle location error in portion, finally, the HR amplitude for the caused reconstruct that misplaced by LED and the degeneration of phase can be eliminated.
Detailed description of the invention
Fig. 1 is a kind of system flow of the microscope alignment correction method based on Fourier's lamination imaging technique of the present invention
Figure.
Fig. 2 is a kind of image-forming principle of the microscope alignment correction method based on Fourier's lamination imaging technique of the present invention
Figure.
Fig. 3 is a kind of global offset mould of the microscope alignment correction method based on Fourier's lamination imaging technique of the present invention
Type figure.
Specific embodiment
It should be noted that in the absence of conflict, the features in the embodiments and the embodiments of the present application can phase
It mutually combines, invention is further described in detail in the following with reference to the drawings and specific embodiments.
Fig. 1 is a kind of system flow of the microscope alignment correction method based on Fourier's lamination imaging technique of the present invention
Figure.It mainly include global offset model, the reconstruction of high-definition picture and alignment correction.
Wherein, the reconstruction one of high-definition picture is divided into six steps:
(1) high-resolution (HR) the object O that initialization is rebuildj(kx,ky) and pupil function Pj(kx,ky)；
(2) low resolution (LR) image is generated；
(3) apply strength constraint；
(4) object and pupil function are updated；
(5) step (2) are repeated to all LED and arrives (4)；
(6) step (2) to (5) are repeated until algorithmic statement.
Further, the generation low-resolution image refers to corresponding with the following formula generation column of m row n-th LED
Low-resolution image:
WhereinIndicate the Fourier spectrum of the LR image obtained with m row the n-th column LED illumination.
Further, the application strength constraint is to apply strength constraint to captured image with following formula:
WhereinWithIt is LR picture strip strength constraint and the complex field without strength constraint respectively.
Further, the update object and pupil function refer to and update object and pupil function with following formula:
Wherein, δ1And δ2It is two iotazation constants, for guaranteeing the stability of quantity.
Wherein, alignment correction refers to the global offset of directly correction LED array, until the cost function of global offset reaches
Minimum, and in order to improve efficiency, only calculate the incident vector in the lighting area of target.
The wherein incident wave vector of each LED are as follows:
Wherein in view of the spacing of two adjacent LEDs is d, the range delta x and Δ y of global offset are set as [- d, d], Δ x and
The value of Δ y initialization is all 0mm.
Further, the cost function refers to the cost function of judgement search global offset Δ x and Δ y, every time weight
Judge whether cost function reaches minimum value after building high-definition picture, is searched again for if not.
Further, the search global offset refers to using simulated annealing (SA) algorithm and searches in a cycle
Rope Δ x and Δ y, it is then inclined in the overall situation of correction LED array until this circulation is continued until that cost function reaches minimum value
After shifting, by traditional Fourier lamination imaging algorithm, the HR image of all LR image reconstruction samples is utilized；In certain situations
Under, after the global offset for correcting LED array, need to correct the intrinsic office of each LED using an iteration of conventional SA algorithm
The subtle location error in portion, finally, the HR amplitude for the caused reconstruct that misplaced by LED and the degeneration of phase can be eliminated.
Fig. 2 is a kind of image-forming principle of the microscope alignment correction method based on Fourier's lamination imaging technique of the present invention
Figure.
The image-forming principle of Fourier's lamination imaging technique is to open LED in order, and captures object is under different light angles
Low-resolution image, the high-definition picture of reconstruction of objects.Wherein in the spatial domain, it is surveyed using the intensity of low-resolution image
Magnitude guarantees the convergence solved as constraint condition, and in Fourier, the constraint coherence transfer function of object lens is made
For support constraint.After successive ignition, the high-resolution complex field and pupil function of available object.
Fig. 3 is a kind of global offset mould of the microscope alignment correction method based on Fourier's lamination imaging technique of the present invention
Type figure.
Global offset model is one, and only for tool there are two the simplification position model of the factor, x and y are determining each light-emitting diodes
Two factors of the position of (LED) are managed, Δ x and Δ y are the sizes of global offset, when dot representative does not deviate where LED
Position, diamond shape indicate the position after deviating where LED.
For those skilled in the art, the present invention is not limited to the details of above-described embodiment, without departing substantially from essence of the invention
In the case where mind and range, the present invention can be realized in other specific forms.In addition, those skilled in the art can be to this hair
Bright to carry out various modification and variations without departing from the spirit and scope of the present invention, these improvements and modifications also should be regarded as of the invention
Protection scope.Therefore, it includes preferred embodiment and all changes for falling into the scope of the invention that the following claims are intended to be interpreted as
More and modify.
Claims (10)
1. a kind of microscope alignment correction method based on Fourier's lamination imaging technique, which is characterized in that main includes the overall situation
Migration model (one)；The reconstruction (two) of high-definition picture；Alignment correction (three).
2. based on global offset model (one) described in claims 1, which is characterized in that global offset model, which is one, only to be had
There are two the simplification position model of the factor, x and y are two factors of the position of determining each light emitting diode (LED), (xm,n,
ym,n) represent m row n-th column LED position.
3. the reconstruction (two) based on high-definition picture described in claims 1, which is characterized in that one is divided into six steps
It is rapid:
(1) high-resolution (HR) the object O that initialization is rebuildj(kx,ky) and pupil function Pj(kx,ky)；
(2) low resolution (LR) image is generated；
(3) apply strength constraint；
(4) object and pupil function are updated；
(5) step (2) are repeated to all LED and arrives (4)；
(6) step (2) to (5) are repeated until algorithmic statement.
4. based on generation low-resolution image described in claims 3, which is characterized in that generate m row n-th with following formula
Arrange the corresponding low-resolution image of LED:
WhereinIndicate the Fourier spectrum of the LR image obtained with m row the n-th column LED illumination.
5. based on application strength constraint described in claims 3, which is characterized in that applied with following formula to captured image
Strength constraint:
WhereinWithIt is LR picture strip strength constraint and the complex field without strength constraint respectively.
6. based on update object and pupil function described in claims 3, which is characterized in that with following formula update object and
Pupil function:
Wherein, δ1And δ2It is two iotazation constants, for guaranteeing the stability of quantity.
7. based on alignment correction described in claims 1 (three), which is characterized in that the global offset of LED array is directly corrected,
Until the cost function of global offset reaches minimum, and in order to improve efficiency, only calculate entering in the lighting area of target
Directive amount.
8. based on LED array described in claims 7, which is characterized in that the incident wave vector of each LED are as follows:
Wherein in view of the spacing of two adjacent LEDs is d, the range delta x and Δ y of global offset are set as [- d, d], Δ x and Δ y
The value of initialization is all 0mm.
9. based on cost function described in claims 7, which is characterized in that judge search after rebuilding high-definition picture every time
Whether the cost function of global offset Δ x and Δ y reach minimum value, search again for if not.
10. based on search global offset described in claims 9, which is characterized in that using simulated annealing (SA) algorithm come
Δ x and Δ y is searched in one circulation, until this circulation is continued until that cost function reaches minimum value, then in correction LED
After the global offset of array, by traditional Fourier lamination imaging algorithm, schemed using the HR of all LR image reconstruction samples
Picture；In some cases, it after the global offset for correcting LED array, needs to correct using an iteration of conventional SA algorithm every
The subtle location error in a LED intrinsic part, finally, the HR amplitude and phase reconstructed caused by LED dislocation can be eliminated
It degenerates.
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Cited By (5)
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| CN109683299A (en) * | 2019-01-10 | 2019-04-26 | 浙江大学 | A kind of high-resolution micro imaging system of polychrome multi-angle illumination |
| CN110378981A (en) * | 2019-07-19 | 2019-10-25 | 中国科学院长春光学精密机械与物理研究所 | Fourier's lamination microscope pupil restoration methods neural network based |
| CN111062889A (en) * | 2019-12-17 | 2020-04-24 | 北京理工大学 | Light intensity correction method for Fourier laminated microscopic imaging technology |
| CN111158131A (en) * | 2019-12-31 | 2020-05-15 | 杭州电子科技大学 | LED matrix correction method based on Fourier laminated imaging |
| CN113160212A (en) * | 2021-05-11 | 2021-07-23 | 杭州电子科技大学 | Fourier laminated imaging system and method based on LED array position error fast correction |
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| US20150160450A1 (en) * | 2012-10-30 | 2015-06-11 | California Institute Of Technology | Embedded pupil function recovery for fourier ptychographic imaging devices |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109683299A (en) * | 2019-01-10 | 2019-04-26 | 浙江大学 | A kind of high-resolution micro imaging system of polychrome multi-angle illumination |
| CN110378981A (en) * | 2019-07-19 | 2019-10-25 | 中国科学院长春光学精密机械与物理研究所 | Fourier's lamination microscope pupil restoration methods neural network based |
| CN110378981B (en) * | 2019-07-19 | 2022-11-15 | 中国科学院长春光学精密机械与物理研究所 | Fourier laminated microscope pupil recovery method based on neural network |
| CN111062889A (en) * | 2019-12-17 | 2020-04-24 | 北京理工大学 | Light intensity correction method for Fourier laminated microscopic imaging technology |
| CN111062889B (en) * | 2019-12-17 | 2023-10-24 | 北京理工大学 | Light intensity correction method for Fourier stacked microscopic imaging technology |
| CN111158131A (en) * | 2019-12-31 | 2020-05-15 | 杭州电子科技大学 | LED matrix correction method based on Fourier laminated imaging |
| CN111158131B (en) * | 2019-12-31 | 2021-09-28 | 杭州电子科技大学 | LED matrix correction method based on Fourier laminated imaging |
| CN113160212A (en) * | 2021-05-11 | 2021-07-23 | 杭州电子科技大学 | Fourier laminated imaging system and method based on LED array position error fast correction |
| CN113160212B (en) * | 2021-05-11 | 2024-04-16 | 杭州电子科技大学 | Fourier laminated imaging system and method based on LED array position error rapid correction |
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