CN108957172A - Transmitter test macro and method based on real-time digital-to-analogue analogue system - Google Patents
Transmitter test macro and method based on real-time digital-to-analogue analogue system Download PDFInfo
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- CN108957172A CN108957172A CN201810578457.9A CN201810578457A CN108957172A CN 108957172 A CN108957172 A CN 108957172A CN 201810578457 A CN201810578457 A CN 201810578457A CN 108957172 A CN108957172 A CN 108957172A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/36—Circuit design at the analogue level
- G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
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Abstract
The invention discloses a kind of transmitter test macro and method based on real-time digital-to-analogue analogue system, including tested transmitter, information feedback device and real-time digital-to-analogue analogue system, real-time digital-to-analogue analogue system test parameter according to needed for tested transmitter establishes transmitter test emulation model, exports electric current and/or voltage signal to tested transmitter by low-power level signal mode；Information feedback device combines the electric signal of tested transmitter output and the setting value of corresponding measured parameter, whether meet excessive logic testing condition according to the electric signal that excessive logic testing pressing plate detects tested transmitter output end, amount logic testing condition is owed according to whether the electric signal that deficient amount logic testing pressing plate detects tested transmitter output end meets, result is will test and feeds back to real-time digital-to-analogue analogue system in the form of contact point signal；Real time data analogue system carries out correctness differentiation to test result according to the contact point signal received.The present invention can increase substantially the testing efficiency of transmitter.
Description
Technical field
The present invention relates to a kind of transmitter test macro and method based on real-time digital-to-analogue analogue system, belong to electric system
Technical field.
Background technique
Transmitter is applied relatively broad in electric system, especially in power plant, reacts excitation voltage, exciting current
Voltage transmitter, current transducer application are more extensive, but the test of transmitter lacks effective means, especially transmitter transient state
Characteristic test is difficult to realize using static tester, such as reacts the ripple characteristics reaction of harmonic content, excitation system failure
Or the excitation voltage at abnormal moment falls suddenly, and excitation voltage during encouraging by force is flown up etc..
Summary of the invention
It is an object of the invention to overcome deficiency in the prior art, a kind of change based on real-time digital-to-analogue analogue system is provided
Device test macro and method are sent, the technical issues of test of transmitter important parameter lacks effective means in the prior art is solved.
In order to solve the above technical problems, the technical scheme adopted by the invention is that: the change based on real-time digital-to-analogue analogue system
Send device test macro, comprising: tested transmitter, information feedback device and real-time digital-to-analogue analogue system, the real-time digital-to-analogue are imitative
The signal output end of true system is connected to the input terminal of tested transmitter；The output end of the tested transmitter is connected to letter
The input terminal of feedback device is ceased, the output end of the information feedback device is connected to the signal input of real-time digital-to-analogue analogue system
End；
Real-time digital-to-analogue analogue system establishes transmitter test emulation model according to the parameter tested needed for tested transmitter,
Electric current and/or voltage signal are exported to tested transmitter by low-power level signal mode, and information feedback device is by tested change
The electric signal for sending device to export is converted to contact point signal and feeds back to real-time digital-to-analogue analogue system, and real time data analogue system is according to reception
The contact point signal arrived carries out correctness differentiation to test result.
The information feedback device is connect by On-off signal board with real-time digital-to-analogue analogue system.
The real-time digital-to-analogue analogue system is connect by analog output card with tested transmitter.
The information feedback device is provided with corresponding receiver according to the type of tested transmitter.
The tested transmitter includes current output transmitter and voltage output transmitter.
The information feedback device includes owing amount logic testing pressing plate and excessive logic testing pressing plate；
It is surveyed according to whether the electric signal that excessive logic testing pressing plate detects tested transmitter output end meets excessive logic
Strip part owes amount logic testing according to whether the electric signal that deficient amount logic testing pressing plate detects tested transmitter output end meets
Condition, to realize each parameter testing of tested transmitter.
The present invention also provides a kind of transmitter test methods based on real-time digital-to-analogue analogue system, including tested pick-up
Device, information feedback device and real-time digital-to-analogue analogue system, the test method include the following steps:
Real-time digital-to-analogue analogue system establishes transmitter test emulation model according to the parameter tested needed for tested transmitter,
Electric current and/or voltage signal are exported to tested transmitter by low-power level signal mode；
Information feedback device combines the electric signal of tested transmitter output and the setting value of corresponding measured parameter, according to mistake
Whether the electric signal that amount logic testing pressing plate detects tested transmitter output end meets excessive logic testing condition, according to deficient amount
Whether the electric signal that logic testing pressing plate detects tested transmitter output end, which meets, is owed amount logic testing condition, will test result
Real-time digital-to-analogue analogue system is fed back in the form of contact point signal；
Real time data analogue system carries out correctness differentiation to test result according to the contact point signal received.
Transmitter test includes: limit test, accuracy test, ripple distortion-degree measure and delay time test.
Compared with prior art, the beneficial effects obtained by the present invention are as follows being: tested transmitter, information feedback device and reality
When digital-to-analogue analogue system formed closed-loop system, may be implemented transmitter test item sequence execute, result differentiate, thus substantially
Degree improves the testing efficiency of transmitter；
Measurement for different transmitters, the different simulation model of real-time digital-to-analogue analogue system correspondence establishment, information feedback
Device is corresponding to configure different receivers, can be realized limit value, the precision, the ripple distortion factor, delay time of transmitter
The automatic test of equal important parameters, and test result automatic discrimination is realized according to information feedback device contact information.
Detailed description of the invention
Fig. 1 is the structural block diagram of the transmitter test macro provided by the invention based on real-time digital-to-analogue analogue system；
Fig. 2 is the excitation voltage output model that real-time digital-to-analogue analogue system is established；
Fig. 3 is excessive test logic chart；
Fig. 4 is to owe to measure to try logic chart；
Fig. 5 is delay time to test logic chart.
Specific embodiment
The invention will be further described below in conjunction with the accompanying drawings.Following embodiment is only used for clearly illustrating the present invention
Technical solution, and not intended to limit the protection scope of the present invention.
As shown in Figure 1, being the structural frames of the transmitter test macro provided by the invention based on real-time digital-to-analogue analogue system
Figure, comprising: tested transmitter, information feedback device and real-time digital-to-analogue analogue system.
The signal output end of real-time digital-to-analogue analogue system is connected to the defeated of tested transmitter by analog output card
Enter end；The output end of tested transmitter is connected to the input terminal of information feedback device, and the output end of information feedback device passes through
On-off signal plate is connected to the signal input part of real-time digital-to-analogue analogue system.
Information feedback device is provided with corresponding receiver according to the type of tested transmitter.For inhomogeneity
The tested transmitter of type, information feedback device need to access corresponding receiver, i.e. the hardware of information feedback device needs
It is applicable in the signal output of different types of transmitter, but the software of information feedback device can be constant, because of information feedback device
Inside output is digital signal, realizes limit value, precision, the measurement of delay time according to digital signal amount.Information feedback device
Further include owing amount logic testing pressing plate and excessive logic testing pressing plate, tested transmitter is detected according to excessive logic testing pressing plate
Whether the electric signal of output end meets excessive logic testing condition, and it is defeated to detect tested transmitter according to deficient amount logic testing pressing plate
Whether the electric signal of outlet, which meets, is owed amount logic testing condition, to realize each parameter testing of tested transmitter.
Transmitter is at present based on current output transmitter, voltage output transmitter, the input terminal one of these two types of transmitters
As inputted for small signal, the output of transmitter divides the output of low current signal and the output of small voltage signal, and low current signal is defeated
It is out current output transmitter, the output of small voltage signal is voltage output transmitter.Transmitter test item include limit value,
The important indicators parameters such as precision, the ripple distortion factor, delay time, wherein latter two are that static tester cannot achieve, rear two
Item belongs to transient characterisitics index parameter, realizes in combination with real-time digital-to-analogue analogue system.
The present invention also provides a kind of transmitter test methods based on real-time digital-to-analogue analogue system, can use above-mentioned
Transmitter test macro is achieved, and the specific method is as follows:
Step 1: digital-to-analogue analogue system is established transmitter test according to the parameter tested needed for tested transmitter and is imitated in real time
True mode exports electric current and/or voltage signal to tested transmitter by low-power level signal mode；
By taking the transmitter test module for measuring excitation voltage as an example, as shown in Fig. 2, established for real-time digital-to-analogue analogue system
Transmitter tests excitation voltage output model, and the size equal proportion of generator excitation voltage exports secondary small signal, secondary
Small signal is acquired by excitation voltage transmitter.When excitation voltage exports, settable upper lower limit value and delay output time
Etc. parameters, wherein delay time may be alternatively provided as 0 second, i.e. non-time delay exports.
Excitation voltage is exported by analog output card to transmitter.
Real-time digital-to-analogue analogue system establishes several transmitter test modules, and the simulation of transient characterisitics is emulated by real-time digital-to-analogue
What system was realized, it realizes the limitation output including upper limit value and lower limit value, the superposition output of direct current and each harmonic is realized, with full
The test request of sufficient transmitter transient characterisitics.
Step 2: information feedback device combines the electric signal of tested transmitter output and the setting of corresponding measured parameter
Whether value meets excessive logic testing item according to the electric signal that excessive logic testing pressing plate detects tested transmitter output end
Part owes amount logic testing item according to whether the electric signal that deficient amount logic testing pressing plate detects tested transmitter output end meets
Part will test result and be fed back to real-time digital-to-analogue analogue system in the form of contact point signal；
Information feedback device only needs to change different receivers, can also meet different transmitters using same software
Test request, below to transmitter limit test, accuracy test, ripple distortion-degree measure and delay time test specific side
Method is described in further detail respectively:
I. limit test
Limit test includes maximum value and minimum value, when meeting excessive test or owing amount test condition, information feedback dress
Setting hard contact output is 1, and the otherwise hard contact output of information feedback device is 0, and hard contact output signal taps into real-time digital-to-analogue emulation
System, therefore closed loop feedback system is formd, it can be achieved that the result of closed loop differentiates and the automatic test of closed loop.
Excessive logic is illustrated in figure 3 excessive test logic, adjusting setting value by software is for testing maximum value
0.999 times of maximum value, and excessive logic testing pressing plate, real-time digital-to-analogue emulation system are put into mode by software adjusting or hard open
System 0.998 times of maximum value of output, due to being unsatisfactory for excessive test logic, information feedback device does not have contact output, i.e. output is hard
Contact is 0, and it is 0 that real-time digital-to-analogue analogue system receives hard contact output within the time (it is recommended that being set as 5 seconds~10 seconds) of setting,
Think to meet condition；Real-time digital-to-analogue analogue system is exported at least 1.000 times of maximum values again, is patrolled due to meeting excessive test
Volume, information feedback device has contact output, that is, exporting hard contact is 1, and real-time digital-to-analogue analogue system receives within the set time
Hard contact output is 1, that is, thinks to meet condition.
Amount logic is owed for testing minimum value, is illustrated in figure 4 and owes to measure examination logic, adjusting setting value by software is
0.01 times of per unit value is arranged if minimum value is 0 in 1.001 times of minimum values, and open by software adjusting or firmly put into mode it is deficient
Logic testing pressing plate is measured, real-time digital-to-analogue analogue system exports 1.000 times of minimum values, and if minimum value is 0, exporting is 0, due to meeting
Excessive test logic, information feedback device have contact output, that is, exporting hard contact is 1, and real-time digital-to-analogue analogue system is in setting
It is 1 that hard contact output is received in time, that is, thinks to meet condition；Real-time digital-to-analogue analogue system is exported at least 1.002 times again
Minimum value at least exports 0.02 times of per unit value if minimum value is 0, and due to being unsatisfactory for owing to measure examination logic, information feedback device does not have
There is contact output, that is, exporting hard contact is 0, and it is 0 that real-time digital-to-analogue analogue system receives hard contact output within the set time, i.e.,
Think to meet condition.
Ii. accuracy test
Accuracy test depends on the accuracy test requirement of transmitter, need to take several tests between the minimum and maximum
Point (it is recommended that test point 5~10), if test point respective value is b, accuracy test requirement is a% (a is positive number), uses deficient amount
Logic testing, adjusting setting value by software is b, and puts into excessive logic testing pressure into mode by software adjusting or hard open
Plate, real-time digital-to-analogue analogue system output valve (1-0.05*a%) * b, due to being unsatisfactory for excessive test logic, information feedback device does not have
There is contact output, that is, exporting hard contact is 0, and it is 0 that real-time digital-to-analogue analogue system receives hard contact output within the set time, i.e.,
Think to meet condition；It is again (1+0.05*a%) * b by real-time digital-to-analogue analogue system output valve, is patrolled due to meeting excessive test
Volume, information feedback device has contact output, that is, exporting hard contact is 1, and real-time digital-to-analogue analogue system receives within the set time
Hard contact output is 1, that is, thinks to meet condition.
Iii. ripple distortion-degree measure
Ripple distortion-degree measure transmitter is really reported situations, and the distortion factor is higher to illustrate that waveform more keeps off test waves
Shape, conversely, the distortion factor is lower to illustrate ripple closer to test waveform, such as test point respective value fundamental voltage amplitude or D. C. value are b, smart
Spending test request is a% (a is positive number), and using deficient amount logic testing, adjusting setting value by software is (1+a%) * b, and
It opens by software adjusting or firmly and puts into excessive logic testing pressing plate, real-time digital-to-analogue analogue system output fundamental voltage amplitude or straight into mode
Flow valuve is b, and output harmonic wave amplitude is 0.95*a%*b, and due to being unsatisfactory for excessive test logic, information feedback device does not have contact
Output, that is, exporting hard contact is 0, and it is 0 that real-time digital-to-analogue analogue system receives hard contact output within the set time, that is, thinks full
Sufficient condition；Real-time digital-to-analogue analogue system is exported into fundamental voltage amplitude again or D. C. value is b, output harmonic wave amplitude is 1.05*a%*
B, due to meeting excessive test logic, information feedback device has contact output, that is, exporting hard contact is 1, real-time digital-to-analogue emulation system
It is 1 that system receives hard contact output within the set time, that is, thinks to meet condition.
Iv. delay time tests
The lag time that delay time test logical inverse answers transmitter to export is illustrated in figure 5 delay time test logic,
It is b with test point respective value, amplitude precision test request is a%, and time precision test request is pick-up to be tested for c%
The delay time of device is t, and using deficient amount logic testing, adjusting setting value by software is b, and is adjusted by software or opened firmly
Enter mode and put into excessive logic testing pressing plate, real-time digital-to-analogue analogue system output valve is (1+0.05*a%) * b and continuously less than (1
+ c%) * t delay time, due to being unsatisfactory for excessive test logic, information feedback device does not have contact output, that is, exports hard contact
It is 0, it is 0 that real-time digital-to-analogue analogue system receives hard contact output within the set time, that is, thinks to meet condition；It again will be real-time
Digital-to-analogue analogue system output valve is (1+0.05*a%) * b and is persistently more than or equal to (1+c%) * t delay time, due to meeting
Measure examination logic, information feedback device has contact output, that is, exporting hard contact is 1, real-time digital-to-analogue analogue system setting when
In to receive the output of hard contact be 1, that is, think to meet condition.
Step 3: real time data analogue system carries out correctness to test result according to the contact point signal received and sentences
Not.
Transmitter is tested in the present invention, information feedback device and real-time digital-to-analogue analogue system form closed-loop system, can be with
Realize that the sequence of transmitter test item executes, result differentiates, to increase substantially the testing efficiency of transmitter；For difference
The measurement of transmitter, the different simulation model of real-time digital-to-analogue analogue system correspondence establishment, the corresponding configuration of information feedback device are different
Receiver, can be realized the automatic of the important parameters such as limit value, precision, the ripple distortion factor, the delay time of transmitter
Test, and test result automatic discrimination is realized according to information feedback device contact information.
The above is only a preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, without departing from the technical principles of the invention, several improvement and deformations can also be made, these improvement and deformations
Also it should be regarded as protection scope of the present invention.
Claims (8)
1. the transmitter test macro based on real-time digital-to-analogue analogue system characterized by comprising tested transmitter, information
The signal output end of feedback device and real-time digital-to-analogue analogue system, the real-time digital-to-analogue analogue system is connected to tested transmitter
Input terminal；The output end of the tested transmitter is connected to the input terminal of information feedback device, the information feedback device
Output end be connected to the signal input part of real-time digital-to-analogue analogue system；
Real-time digital-to-analogue analogue system establishes transmitter test emulation model according to the parameter tested needed for tested transmitter, passes through
Low-power level signal mode exports electric current and/or voltage signal to tested transmitter, and information feedback device is by tested transmitter
The electric signal of output is converted to contact point signal and feeds back to real-time digital-to-analogue analogue system, and real time data analogue system is according to receiving
Contact point signal carries out correctness differentiation to test result.
2. the transmitter test macro according to claim 1 based on real-time digital-to-analogue analogue system, which is characterized in that described
Information feedback device is connect by On-off signal board with real-time digital-to-analogue analogue system.
3. the transmitter test macro according to claim 1 or 2 based on real-time digital-to-analogue analogue system, which is characterized in that
The real-time digital-to-analogue analogue system is connect by analog output card with tested transmitter.
4. the transmitter test macro according to claim 3 based on real-time digital-to-analogue analogue system, which is characterized in that described
Information feedback device is provided with corresponding receiver according to the type of tested transmitter.
5. the transmitter test macro according to claim 3 based on real-time digital-to-analogue analogue system, which is characterized in that described
Tested transmitter includes current output transmitter and voltage output transmitter.
6. the transmitter test macro according to claim 1 based on real-time digital-to-analogue analogue system, which is characterized in that described
Information feedback device includes owing amount logic testing pressing plate and excessive logic testing pressing plate；
Whether meet excessive logic testing item according to the electric signal that excessive logic testing pressing plate detects tested transmitter output end
Part owes amount logic testing item according to whether the electric signal that deficient amount logic testing pressing plate detects tested transmitter output end meets
Part, to realize each parameter testing of tested transmitter.
7. based on the transmitter test method of real-time digital-to-analogue analogue system, including tested transmitter, information feedback device and reality
When digital-to-analogue analogue system, which is characterized in that the test method includes the following steps:
Real-time digital-to-analogue analogue system establishes transmitter test emulation model according to the parameter tested needed for tested transmitter, passes through
Low-power level signal mode exports electric current and/or voltage signal to tested transmitter；
Information feedback device combines the electric signal of tested transmitter output and the setting value of corresponding measured parameter, is patrolled according to excessive
Whether the electric signal for collecting the tested transmitter output end of test pressing plate detection meets excessive logic testing condition, according to deficient amount logic
Whether the electric signal that test pressing plate detects tested transmitter output end, which meets, is owed amount logic testing condition, will test result to connect
The form of point signal feeds back to real-time digital-to-analogue analogue system；
Real time data analogue system carries out correctness differentiation to test result according to the contact point signal received.
8. the transmitter test method according to claim 7 based on real-time digital-to-analogue analogue system, which is characterized in that pick-up
Device test includes: limit test, accuracy test, ripple distortion-degree measure and delay time test.
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