CN108955562A - The micro- depth of field digitlization extended method of micro-vision system and system based on computer micro-vision layer scanning technology - Google Patents
The micro- depth of field digitlization extended method of micro-vision system and system based on computer micro-vision layer scanning technology Download PDFInfo
- Publication number
- CN108955562A CN108955562A CN201810622582.5A CN201810622582A CN108955562A CN 108955562 A CN108955562 A CN 108955562A CN 201810622582 A CN201810622582 A CN 201810622582A CN 108955562 A CN108955562 A CN 108955562A
- Authority
- CN
- China
- Prior art keywords
- micro
- field
- space
- depth
- vision
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Abstract
The present invention discloses the depth of field digitlization extended method and system of a kind of micro-vision system based on computer micro-vision layer scanning technology, it passes through computer micro-vision layer scanning technology first and obtains tomoscan image, obtains the corresponding three-dimension disclocation view field space of tomoscan image by the step-length of tomoscan image combination Precision Position Location System;Secondly, passing through the technology reengineerings three-dimension disclocation spatial digitalized information such as rasterizing, digitlization;Finally, obtaining the digitlization microscopic field of view space of depth of field extension according to the digital information in the tomography space of all acquisitions and tomography spatial positional information, depth of field extension is realized.The present invention overcomes the contradictions of high-resolution and the big depth of field, breach the limitation that the small depth of field of micro-vision system obtain super scene depth space information can not accurately, and the microscopic field of view spatial information of the microassembly system of hyperfocal distance is showed using digitized information, the visual in image three-dimension object information for characterizing super depth of field microscopic field of view space.
Description
Technical field
The invention belongs to intelligence manufacture field and field of scientific studies, are specifically servicing to micro assemby and microoperation field, tool
Body is related under micro-vision technology more particularly to microscopic field of view space comprising observation and operation across nanoscale object.
Background technique
Micro-vision system is to observe the key equipment of micro parts, small items, cell.In order to clearly observe
The global topographical information of different size objects, then need the depth of field according to different objects size adjusting micro-vision system, this increasing
Operation difficulty has been added to also reduce the accuracy of observation of micro-vision system.The micro-vision system under high-resolution, high-amplification-factor
System can see small items clearly, but resolution ratio and the depth of field are inversely itself intrinsic characteristics, so that it can not observe
Information within the scope of to larger depth.Therefore, the contradiction of high-resolution and the big depth of field limits the performance of micro-vision system.?
Micro assemby field, object or component assembly for different scale can not obtain institute using micro-vision system in depth
Need to be assembled the overall picture of object, when observing a part of part or object, another part part has exceeded micro-vision system
The depth of field, and can not observe simultaneously, can not provide when this will lead to assembly or operation object to execute it and effectively control signal,
So that assembly or operation can not be successfully progress.Based on problem above, need to study a kind of micro- scape of micro-vision system
The solution extended deeply.
Summary of the invention
The purpose of the present invention is being directed to the observation across the more parts of scale, due to micro-vision system there are high-resolution and greatly
The depth of field is difficult to the contradictory problems met simultaneously and leads to that observation mission technical difficulty is big, precision is low and can not be observed etc. ask
Topic provides a kind of micro- depth of field digitlization extension side of micro-vision system based on computer micro-vision layer scanning technology
Method and system.
The technical solution adopted by the present invention to solve the technical problems is as follows:
A kind of depth of field digitlization extended method of the micro-vision system based on computer micro-vision tomoscan, master
Will using computer micro-vision layer scanning technology using micro-vision system to the microscopic field of view space of microassembly system into
Row scanning, obtains tomoscan image;Micro- field depth extending method based on computer micro-vision layer scanning technology utilizes
The step-length reconstruct for the tomoscan image sequence combination Precision Position Location System that computer micro-vision layer scanning technology obtains obtains
Corresponding three-dimension disclocation view field space is obtained, and calculates three-dimension disclocation view field space digital information and then obtains the number of depth of field extension
Micro- depth of field digitlization extension is realized in word microscopic field of view space.Specific step is as follows:
Step 1, tomoscan image sequence and precision positioning are obtained using computer micro-vision layer scanning technology
The displacement sequence of system.
Step 2, it according to the tomoscan image sequence of acquisition and the step series of Precision Position Location System, reconstructs three-dimensional disconnected
Layer view field space, calculates three-dimension disclocation spatial digitalized information, obtains the digitlization microscopic field of view space of depth of field extension, realizes aobvious
Micro- depth of field extension;Step 2 specifically includes:
2.1 obtain corresponding three-dimension disclocation visual field using tomoscan image sequence and Precision Position Location System step series
Spatial sequence vector;
Information other than 2.2 removal three-dimension disclocation view field spaces;
2.3 pairs of three-dimension disclocation view field space sequence trellis and grid numeralization, obtain the number of three-dimension disclocation view field space
Word information;
2.4 according to three-dimension disclocation view field space digital information, and the Digital Three-Dimensional microscopic field of view for calculating depth of field extension is empty
Between Se, realize the micro- depth of field extension in microscopic field of view space.
Further, in step 1, the tomoscan image in microscopic field of view space is obtained, is disconnected using computer micro-vision
Layer scanning technique controls micro-vision system by Precision Position Location System and carries out tomography to micro-vision space along its optical axis direction
Scanning obtains the two-dimensional ct image in micro-vision space local fault space, and particular content is as follows:
(1.1) step-length, the direction of motion, movement for carrying out the Precision Position Location System of computer micro-vision tomoscan are determined
When mode, movement velocity, initial position and initial position micro-vision system object lens away from define coordinate origin it is vertical away from
From Dc, the image principle point location that micro-vision system optical axis passes through focal plane is (x0, y0);Determine corresponding micro-vision system
Visual field resolution sizes, depth of field size, pixel dimension, amplification factor, suitable light source intensity is set.
(1.2) Precision Position Location System (1) control micro-vision system (2) is along the reference axis of definition coordinate system (7) with one
Fixed moving step sizes carry out the two-dimentional tomoscan image sequence that image slices scanning obtains Z-direction, Precision Position Location System
Step-length is Δ.The displacement for recording tomoscan image sequence and Precision Position Location System is as follows:
Imgz=[Img1 Img2 … Imgk … ImgN]
Dz=[D1 D2 … Dk … DN]
Wherein ImgzMicro-vision system, which is controlled, for Precision Position Location System in microassembly system carries out tomoscan acquisition
The vector of tomoscan image sequence construct, N are time that Precision Position Location System controls that micro-vision system is scanned along Z-direction
Number, DzMotion vector when micro-vision system carries out tomoscan is controlled for Precision Position Location System.Precision Position Location System kth time
Displacement D after movementkIt is as follows with the relational expression of its step delta:
Dk=(k-1) Δ, k=1,2 ..., N
Further, in step 2, the tomoscan of (2.1) based on the scanning acquisition of computer micro-vision layer scanning technology
Image sequence is realized in conjunction with the moving step sizes of Precision Position Location System, reconstructs the three-dimension disclocation view field space of each tomoscan image
Sequence;The visual field high (Height) that micro-vision system (2) is arranged is H, and visual field wide (Width) is W, the step of Precision Position Location System
A length of Δ, along the tomographic sequence Img of Z axis scanningzCorresponding three-dimension disclocation space size is H × W × Δ, obtains three
Tie up tomography view field space sequence vector are as follows:
Sz=[S1 S2 … Sk … SN]
S in formulakAre as follows:
X in formulak、yk、zkRespectively define coordinate system (7) X-axis, Y-axis, the range in Z-direction, d2For micro-vision system
The object distance of system (2).
(2.2) information other than three-dimension disclocation view field space sequence is removed;Along the three-dimension disclocation view field space S of Z-directionk
Corresponding Precision Position Location System is D along the displacement of Z-directionk;According to the corresponding object distance d of the image distance of micro-vision system (2)2,
It is in X-direction sectionIt is in Y direction sectionIt is in Z-direction sectionSignal in range is three-dimensional tomographic space SkInformation, go
Unless signal within the scope of this;
(2.3) rasterizing and the grid numeralization of three-dimension disclocation view field space sequence, obtains three-dimension disclocation view field space
Digital information;For three-dimension disclocation view field space Sk, the grid cube of the pixel of n × n × n is set, is utilizedA grid cube is to three-dimension disclocation view field space SkDiscretization, and it is vertical according to grid cubic site and grid
The functional value of cube constructs a three-dimensional digital matrixIt indicates.The number that pixel is 1 in each grid cube is set
Npix, setting grid cube assignment threshold value is TH, if Npix>=TH, then this grid cube is assigned a value of 1, is otherwise assigned a value of 0.Three
Tie up tomography view field space SkIn (pi, qi, ri) assignment function of grid cube of position isThat is:
Whereinpi∈ [1 2 ... p], qi∈ [1 2 ... q], ri∈ [1 2 ... r],
Npix(pi, qi, ri) it is that position is pixel is 1 in the grid cube of (pi, qi, ri) in three-dimension disclocation view field space Sk
Number.
(2.4) according to along Z-direction three-dimension disclocation view field space digital information, the Digital Three-Dimensional of depth of field extension is calculated
The micro- depth of field extension in microscopic field of view space is realized in microscopic field of view space.Calculate the Digital Three-Dimensional microscopic field of view of depth of field extension
Space SeDetailed process is as follows:
(2.4.1) calculates two adjacent three-dimension disclocation space SskWith Sk+1Sliceable calculating digitlization matrix Gk、Gk+1.It is fixed
Adopted Precision Position Location System (1) control micro-vision system (2) carries out tomoscan (Flag along Z axis positive directionz=1), according to two
Adjacent three-dimensional tomography space SkWith Sk+1Digitlization matrix beThen:
When Precision Position Location System (1) control micro-vision system (2) carries out tomoscan (Flag along Z axis negative directionz=-
1) when:
(2.4.2) calculates the microscopic field of view space S of the extension of micro-vision system (2)eDigital information GeAre as follows:
Wherein [] ' representing matrix transposition, FlagzFor recording along the direction for defining the scanning of coordinate system Z axis.Digitlization letter
Cease GeMicroscopic field of view space S after the depth of field extension along Z-direction of descriptioneSize is H × W × De, micro- after extending at this time
The depth of field D of view field spaceeAre as follows:
De=N × Δ
Wherein N is the tomoscan image quantity obtained.
Present invention further propose that a kind of micro-vision system based on computer micro-vision layer scanning technology is aobvious
Micro- depth of field digitizes expansion system, including Precision Position Location System (1), micro-vision system (2) and master computer (25).
The Precision Position Location System (1) is for driving micro-vision system (2) to move along micro-vision system optical axis direction
And carry out precision positioning;It includes the telecontrol equipment of realization one-dimensional precise movement and realizes positioning accuracy and micro-vision system
The matched high accuracy positioning movement driving actuator of the depth of field and controller;
The micro-vision system (2) obtains tomoscan image sequence for carrying out image slices scanning;It includes aobvious
Micro- amplifying unit realizes the amplification to imaging object in microscopic field of view space by optical microscopy or electron microscope,
Imaging unit is completed by CCD or CMOS camera to the image objects in microscopic field of view space;
The master computer (25) is used to carry out control calculating to Precision Position Location System (1) and micro-vision system (2), with
And it carries out digitlization microscopic field of view spatial result and shows.
The present invention, which can extend to, realizes that the depth of field of micro-vision system expands using binocular and more mesh micro-vision systems
Exhibition, provides the information such as more detailed space object distribution, size, shape for the super depth of field, across scale microassembly system.
The present invention has an advantage that
(1) it is directed to the contradiction of micro-vision system high-resolution and field depth, the present invention is keeping micro-vision system
The widened range of micro-vision system blur-free imaging in the case where high-resolution;
(2) method that relatively existing micro-vision system improves the depth of field by adjusting amplification factor, the invention avoids
It adjusts amplification factor and camera model inside and outside parameter is changed and does not repeat to calculate mistake caused by camera calibration
Poor problem;
(3) three-dimensional microscopic field of view space after depth of field extension is obtained using digitizing technique, avoids and existing is melted by image
Close the defect that general image clarity declines caused by obtaining depth of field extension;
(4) three-dimensional digital microscopic field of view space after being extended by the depth of field obtains part to the occupancy in space, obtains
Part three-dimensional information, for the High precision reconstruction of part provides condition.
Due to the microscopical view in the different tomography spaces that computer micro-vision layer scanning technology obtains, to each tomography
Space carries out digitlization reconstruct, and obtains entire microscopic field of view space according to the digital information in the tomography space of all acquisitions
Global information is digitized, the Unify legislation of the information in space in super depth of view information and field depth is realized, breaches micro- view
The limitation that the small depth of field of feel system obtain super scene depth space information can not accurately realizes depth of field extension.This method is not only
The contradiction of high-resolution and the big depth of field is overcome, and the microscopic field of view spatial information of the microassembly system of hyperfocal distance is used
Digitized information shows, the visual in image three-dimension object information for characterizing super depth of field microscopic field of view space.
Detailed description of the invention
Fig. 1 is computer micro-vision layer scanning technology schematic illustration;
Fig. 2 is the scanning schematic diagram of Precision Position Location System moving step sizes Yu depth of field different size relationship;
Fig. 3 is that there is the computer micro-vision layer scanning technology of the Precision Position Location System of displacement sensor to realize system
Structure chart;
Fig. 4 is that the computer micro-vision layer scanning technology of conventional fine positioning system realizes system construction drawing;
Fig. 5 is the micro- depth of field digitlization extension of the microassembly system micro-vision system of the orthogonal micro-vision system of binocular
Schematic diagram;
Fig. 6 is the micro- view of computer with the orthogonal micro-vision system of the binocular of the Precision Position Location System of displacement sensor
Feel that layer scanning technology realizes system construction drawing;
Fig. 7 is the computer micro-vision tomoscan skill of the orthogonal micro-vision system of binocular of conventional fine positioning system
Art realizes system construction drawing;
Fig. 8 is the computer micro-vision layer scanning technology schematic illustration of more mesh micro-vision systems;
Fig. 9 is the computer micro-vision tomoscan skill of the orthogonal micro-vision system of more mesh of conventional fine positioning system
Art realizes system construction drawing;
Figure 10 is that have the computer of the orthogonal micro-vision system of more mesh of the Precision Position Location System of displacement sensor micro-
Vision layer scanning technology realizes system construction drawing.
In figure: 1, Precision Position Location System I, 2, micro-vision system I, 3, visual field it is wide, 4, Precision Position Location System I movement step
It is long, 5, the range of microscopic field of view space depth of field extension, 6, workbench, 7, define coordinate system, 8, visual field it is high, 9, the 1st acquisitions
The three-dimensional space depth bounds of faultage image reconstruct, the three-dimensional space depth bounds of the faultage image reconstruct of 10, the 2nd acquisitions,
11, the depth of field of the faultage image of the 1st acquisition, the depth of field of the faultage image of 12, the 2nd acquisitions, the tomography of 13, the 3rd acquisitions
The depth of field of image, 14, step-length be equal to the step-length of the depth of field, 15, step-length be greater than the step-length of the depth of field, 16, kth time scanning step be less than scape
Deep step-length, 17 ,+1 scanning step of kth be less than the step-length of the depth of field, 18 ,+2 scanning steps of kth be less than the step-length of the depth of field,
19, step-length is equal to the depth of field of the depth of field, 20, step-length be greater than the depth of field of the depth of field, 21, step-length be greater than the Non-scanning mode region of the depth of field, 22, the
K scanning step is less than the depth of field of the depth of field, 23, the depth of field of+1 scanning step of kth less than the depth of field ,+2 times 24, kth scanning steps
Less than the depth of field of the depth of field, 25, master computer, 26, image pick-up card, 27, light source controller, 28, Precision Position Location System controller,
29, displacement sensor controller, 30, micro-clamp controller, 31, the displacement sensor of Precision Position Location System I, 32, micro-vision
System I coaxial light source, 33, micro-clamp system, 34, part, 35, lifting rotation workbench, 36, micro-vision system II the 1st time
The three-dimensional space depth bounds of the faultage image reconstruct of acquisition, 37, the faultage image reconstruct acquired for micro-vision system II the 2nd time
Three-dimensional space depth bounds, 38, micro-vision system II the 3rd time acquisition faultage image reconstruct three-dimensional space depth model
It encloses, 39 micro-vision systems II, 40, the step-length of Precision Position Location System II, 41, Precision Position Location System II, 42, micro-vision system
The depth of field of the faultage image of II the 1st acquisitions, 43, the depth of field of the faultage image of micro-vision system II the 2nd time acquisition, 44, aobvious
The depth of field of the faultage image of micro- vision system II the 3rd time acquisition, 45, the displacement sensor of Precision Position Location System II, 46, micro- view
II coaxial light source of feel system, 47, Precision Position Location System III, 48, micro-vision system III, 49, the step-length of Precision Position Location System III,
50, III coaxial light source of micro-vision system, 51, the displacement sensor of Precision Position Location System III.,
Specific embodiment
Below with reference to attached drawing, the preferred embodiment of the present invention is described in detail.Preferred embodiment is only for explanation
The present invention, rather than limiting the scope of protection of the present invention.
Embodiment 1:
Fig. 1 show the micro- depth of field for monocular micro-vision system based on computer micro-vision layer scanning technology
Expansion system has Z-direction of Precision Position Location System I (1) control micro-vision system I (2) along definition coordinate system (7) to aobvious
Micro- view field space carries out tomoscan, and the step-length constraint that Precision Position Location System makees tomoscan is as shown in Figure 2.According to Fig.2,
Precision Position Location System step-length and micro-vision system depth of field size relation schematic diagram, Δ=DOF as shown in label (14) is at this time
Along Z axis carry out tomoscan micro-vision system three-dimension disclocation space depth be DOF, at this time three-dimensional space be H × W ×
Δ;If the Δ < DOF as shown in label (16,17,18), three-dimension disclocation view field space size at this time are as follows: H × W × Δ;If Δ >
DOF, as shown in label (15), three-dimension disclocation view field space size at this time are as follows: H × W × Δ;However, region be greater than can be clear
The maximum space region of imaging, i.e. a depth of field region, it is clear to there is as shown in the reference numeral 21 non-in tomography view field space at this time
Imaging space, prevent tomoscan is from obtaining microscopic field of view spatial information completely, to generate loss of data.Based on computer
The micro- corresponding hardware system structure of depth of field expansion system of micro-vision layer scanning technology is as shown in Figure 3, Figure 4;According to Fig. 4
Shown Precision Position Location System I (1) control micro-vision system I (2) carries out tomoscan.Wherein micro-vision system I (2) by
CCD or CMOS camera is completed to the image objects in microscopic field of view space;Precision Position Location System I (1) is moved by one-dimensional precise
Telecontrol equipment and realization positioning accuracy and the matched high accuracy positioning kinematic driving unit of the micro-vision system depth of field and controller
It constitutes.In order to realize that Precision Position Location System high precision displacement monitors, installs the detection that displacement sensor (31) realize displacement additional, such as scheme
Shown in 3, wherein displacement sensor (31) is for recording high-precision displacement.For this purpose, to realize computer micro-vision tomography
Scanning technique hardware system needs to add displacement sensor controller (29) cooperation displacement sensor.
Embodiment 2:
Fig. 5 show the depth of field expansion system for the orthogonal micro-vision system of binocular, the orthogonal micro-vision of binocular
The hardware system structure of the depth of field extension of system is as shown in Figure 6 and Figure 7;Precision Position Location System II (40) are wherein increased in Fig. 7
It controls micro-vision system II (39) and tomoscan, Precision Position Location System I (1) control is carried out to microscopic field of view space in the horizontal direction
Micro-vision system I (2) processed carries out tomoscan to microscopic field of view space in vertical direction.In order to realize Precision Position Location System
The monitoring of (1,40) high precision displacement installs displacement sensor additional respectively and realizes the detection of displacement as shown in fig. 6, wherein displacement sensor
(31,45) are respectively used to the high-precision displacement of record Precision Position Location System (1,40).To realize that computer micro-vision is disconnected
Layer scanning technique hardware system needs to add displacement sensor controller (29) cooperation displacement sensor device.
Embodiment 3:
Fig. 8 show the depth of field expansion system for the orthogonal micro-vision system of three mesh, and with addition of precision positionings
System III (47) and control micro-vision system III (48), Precision Position Location System (1,40,47) control micro-vision system respectively
(2,39,48) are united along the Z axis, X-axis, the Y-axis progress tomoscan that define coordinate system (7), obtain tomoscan image sequence respectively
Column.The orthogonal micro-vision system of three mesh is extended hard based on the microscopic field of view depth of field of computer micro-vision layer scanning technology
Part system structure is as shown in Figure 9, Figure 10.In Fig. 9, Precision Position Location System I (1) controls micro-vision system I (2) along vertical side
Tomoscan is carried out to microscopic field of view space, Precision Position Location System II (40) controls micro-vision system II (39) on left side edge
Horizontal direction carries out tomoscan to microscopic field of view space, and Precision Position Location System III (47) controls micro-vision system III (48)
Tomoscan is carried out to microscopic field of view space in the horizontal direction in rear side, obtains tomoscan image sequence and three essences respectively
The displacement of close positioning system.To realize that the displacement of Precision Position Location System accurately measures, it is three-dimensional disconnected to improve digitlization reconstruct
The precision of layer scanning space, it is as shown in Figure 10 to install displacement sensor additional for Precision Position Location System (1,40,47) respectively.Figure 10
In, displacement sensor (31,45,51) records the displacement of Precision Position Location System (1,40,47) respectively.To realize the high-precision of displacement
Degree metering computer micro-vision layer scanning technology hardware system needs to add displacement sensor controller (29) with resultant displacement
Sensor device.
Embodiment 4:
The system shown by above embodiments 1- embodiment 3, system can obtain the information such as tomoscan image, go forward side by side
One step is handled as follows information by master computer (25), finally obtains micro- depth of field extension effect, and process is as follows:
Step 1, tomoscan image sequence and precision positioning are obtained using computer micro-vision layer scanning technology
The displacement sequence of system.The specific tomoscan image for obtaining microscopic field of view space is to utilize computer micro-vision tomography
Scanning technique controls micro-vision system by Precision Position Location System and sweeps along its optical axis direction to micro-vision space progress tomography
It retouches, obtains the two-dimensional ct image in micro-vision space local fault space, content is as follows:
Step 1.1 determines step-length, the direction of motion, the fortune for carrying out the Precision Position Location System of computer micro-vision tomoscan
Micro-vision system object lens are away from the vertical of definition coordinate origin when flowing mode, movement velocity, initial position and initial position
Distance Dc, the image principle point location that micro-vision system optical axis passes through focal plane is (x0, y0);Determine corresponding micro-vision system
Visual field resolution sizes, depth of field size, the pixel dimension, amplification factor of system, are arranged suitable light source intensity.
Step 1.2 Precision Position Location System (1) control micro-vision system (2) along define coordinate system (7) reference axis with
Certain moving step sizes carry out the two-dimentional tomoscan image sequence that image slices scanning obtains Z-direction, Precision Position Location System
Step-length be Δ.The displacement for recording tomoscan image sequence and Precision Position Location System is as follows:
Imgz=[Img1 Img2 … Imgk … ImgN]
Dz=[D1 D2 … Dk … DN]
Wherein ImgzMicro-vision system, which is controlled, for Precision Position Location System in microassembly system carries out tomoscan acquisition
The vector of tomoscan image sequence construct, N are time that Precision Position Location System controls that micro-vision system is scanned along Z-direction
Number, DzMotion vector when micro-vision system carries out tomoscan is controlled for Precision Position Location System.Precision Position Location System kth time
Displacement D after movementkIt is as follows with the relational expression of its step delta:
Dk=(k-1) Δ, k=1,2 ..., N
Step 2, it according to the tomoscan image sequence of acquisition and the step series of Precision Position Location System, reconstructs three-dimensional disconnected
Layer view field space, calculates three-dimension disclocation spatial digitalized information, obtains the digitlization microscopic field of view space of depth of field extension, realizes aobvious
Micro- depth of field extension;Step 2 specifically includes:
Step 2.1 obtains corresponding three-dimension disclocation using tomoscan image sequence and Precision Position Location System step series
View field space sequence vector.Specifically, the tomoscan image obtained based on the scanning of computer micro-vision layer scanning technology
Sequence is realized in conjunction with the moving step sizes of Precision Position Location System, reconstructs the three-dimension disclocation view field space sequence of each tomoscan image;
The visual field high (Height) that micro-vision system (2) is arranged is H, and visual field wide (Width) is W, and the step-length of Precision Position Location System is
Δ, along the tomographic sequence Img of Z axis scanningzCorresponding three-dimension disclocation space size is H × W × Δ, is obtained three-dimensional disconnected
Layer view field space sequence vector are as follows:
Sz=[S1 S2 … Sk … SN]
S in formulakAre as follows:
Step 2.2 removes the information other than three-dimension disclocation view field space;
Along the three-dimension disclocation view field space S of Z-directionkCorresponding Precision Position Location System is D along the displacement of Z-directionk;
According to the corresponding object distance d of the image distance of micro-vision system (2)2, it is in X-direction sectionIn Y direction
Section isIt is in Z-direction sectionIn range
Signal is three-dimensional tomographic space SkInformation, go unless signal within the scope of this.
Step 2.3 quantizes to three-dimension disclocation view field space sequence trellis and grid, obtains three-dimension disclocation view field space
Digital information:
For three-dimension disclocation view field space Sk, the grid cube of the pixel of n × n × n is set, is utilizedA grid cube is to three-dimension disclocation view field space SkDiscretization, and it is vertical according to grid cubic site and grid
The functional value of cube constructs a three-dimensional digital matrixIt indicates.The number that pixel is 1 in each grid cube is set
Npix, setting grid cube assignment threshold value is TH, if Npix>=TH, then this grid cube is assigned a value of 1, is otherwise assigned a value of 0.Three
Tie up tomography view field space SkIn (pi, qi, ri) assignment function of grid cube of position isThat is:
Whereinpi∈ [1 2 ... p], qi∈ [1 2 ... q], ri∈ [1 2 ... r],
Npix(pi, qi, ri) it is three-dimension disclocation view field space SkMiddle position is (pi, qi, ri) grid cube in pixel be 1
Number.
Step 2.4 calculates the digitlization three of depth of field extension according to along Z-direction three-dimension disclocation view field space digital information
Microscopic field of view space is tieed up, realizes the micro- depth of field extension in microscopic field of view space.Calculate the micro- view of Digital Three-Dimensional of depth of field extension
Field space SeDetailed process is as follows:
Step 2.4.1 calculates two adjacent three-dimension disclocation space SskWith Sk+1Sliceable calculating digitlization matrix Gk、Gk+1。
It defines Precision Position Location System (1) control micro-vision system (2) and carries out tomoscan (Flag along Z axis positive directionz=1), according to
Two adjacent three-dimension disclocation space SskWith Sk+1Digitlization matrix beThen:
When Precision Position Location System (1) control micro-vision system (2) carries out tomoscan (Flag along Z axis negative directionz=-
1) when:
Step 2.4.2 calculates the microscopic field of view space S of the extension of micro-vision system (2)eDigital information GeAre as follows:
Wherein [] ' representing matrix transposition, FlagzFor recording along the direction for defining the scanning of coordinate system Z axis.Digitlization letter
Cease GeMicroscopic field of view space S after the depth of field extension along Z-direction of descriptioneSize is H × W × De, micro- after extending at this time
The depth of field D of view field spaceeAre as follows:
De=N × Δ
Wherein N is the tomoscan image quantity obtained.
The depth of field of the micro-vision system orthogonal for binocular and three mesh extends, increased X-direction and Y-direction, according to
Upper method does same treatment.
The above description is only a preferred embodiment of the present invention, is not intended to restrict the invention, it is clear that those skilled in the art
Various changes and modifications can be made to the invention by member without departing from the spirit and scope of the present invention.If in this way, of the invention
Within the scope of the claims of the present invention and its equivalent technology, then the present invention is also intended to encompass these to these modifications and variations
Including modification and variation.
Claims (10)
1. a kind of micro- depth of field of micro-vision system based on computer micro-vision layer scanning technology digitizes extended method,
It is characterized in that, the micro- depth of field digitlization extended method comprising steps of
(1) position of tomoscan image sequence and Precision Position Location System is obtained using computer micro-vision layer scanning technology
Shifting amount sequence;
(2) according to the tomoscan image sequence of acquisition and the step-length of Precision Position Location System, three-dimension disclocation view field space is reconstructed,
Three-dimension disclocation spatial digitalized information is calculated, the digitlization microscopic field of view space of depth of field extension is obtained, realizes micro- depth of field number
Change extension;Step (2) specifically includes:
(2.1) corresponding three-dimension disclocation visual field sky is obtained using tomoscan image sequence and Precision Position Location System step series
Between sequence vector;
(2.2) information other than three-dimension disclocation view field space is removed;
(2.3) it quantizes to three-dimension disclocation view field space sequence trellis and grid, obtains the number of three-dimension disclocation view field space
Change information;
(2.4) according to three-dimension disclocation view field space digital information, the Digital Three-Dimensional microscopic field of view space of depth of field extension is calculated
Se, realize that the micro- depth of field in microscopic field of view space digitizes extension.
2. according to the method described in claim 1, it is characterized by: the computer micro-vision tomoscan of the step (1)
Technology includes:
(1.1) step-length, the direction of motion, motion mode, movement for carrying out the Precision Position Location System of micro-vision tomoscan are determined
Micro-vision system object lens are away from the vertical range D for defining coordinate origin when speed, initial position and initial positionc, micro-
The image principle point location that vision system optical axis passes through focal plane is (x0, y0);Determine that the visual field of corresponding micro-vision system is differentiated
Rate size, depth of field size, pixel dimension, amplification factor, are arranged suitable light source intensity;
(1.2) Precision Position Location System (1) control micro-vision system (2) is along the reference axis of definition coordinate system (7) with certain
Moving step sizes carry out image slices scanning, obtain the two-dimentional tomoscan image sequence of Z-direction, the step-length of Precision Position Location System
For Δ, record tomoscan image sequence is ImgzAnd the displacement sequence of Precision Position Location System is Dz:
Imgz=[Img1 Img2 … Imgk … ImgN]
Dz=[D1 D2 … Dk … DN]
Wherein ImgzThe tomography for controlling micro-vision system progress tomoscan acquisition for Precision Position Location System in microassembly system is swept
It traces designs as the vector of sequence construct, N is the number that Precision Position Location System controls that micro-vision system is scanned along Z-direction, DzFor
Precision Position Location System controls motion vector when micro-vision system carries out tomoscan;
Displacement D after Precision Position Location System kth time movementkIt is as follows with the relational expression of its step delta:
Dk=(k-1) Δ, k=1,2 ..., N.
3. according to the method described in claim 2, it is characterized in that the Precision Position Location System moving step sizes Δ of tomoscan needs
Meet: Δ≤DOF
Wherein DOF is the depth of field for carrying out the micro-vision system of tomoscan.
4. method according to claim 1-3, it is characterised in that: described (2.1) utilize the tomoscan obtained
It is as follows that the step series of image sequence combination Precision Position Location System obtain corresponding three-dimension disclocation view field space: setting micro-vision
The a height of H of visual field of system (7), visual field width are W, and the step-length of Precision Position Location System is Δ, along the tomographic sequence of Z axis scanning
ImgkCorresponding three-dimension disclocation space size is H × W × Δ, obtains three-dimension disclocation view field space sequence vector are as follows:
Sz=[S1 S2 … Sk … SN]
S in formulakAre as follows:
X in formulak、yk、zkRespectively define coordinate system (7) X-axis, Y-axis, the range in Z-direction, d2For micro-vision system (2)
Object distance.
5. method according to claim 1-3, it is characterised in that: it is empty that described (2.2) remove three-dimension disclocation visual field
Between other than information method it is as follows: along the three-dimension disclocation view field space S of Z-directionkCorresponding Precision Position Location System is along Z axis side
To displacement be Dk, micro-vision system object lens are away from the vertical of the origin for defining coordinate system when Precision Position Location System initial position
Distance is Dc, according to the corresponding object distance d of micro-vision system (2)2, it is in X-direction sectionIn Y-axis
Direction interval isIt is in Z-direction section's
Signal in range is three-dimensional tomographic space SkInformation, go unless signal within the scope of this.
6. method according to claim 1-3, it is characterised in that: (2.3) are to three-dimension disclocation view field space
Sequence trellis and grid numeralization, the method for obtaining the digital information of three-dimension disclocation view field space are as follows: for three-dimensional disconnected
Layer view field space Sk, the grid cube of the pixel of n × n × n is set, is utilizedA grid cube is to three
Tie up tomography view field space SkDiscretization, and according to grid cubic site and the functional value of grid cube, construct three dimensions
Word matrixIt indicates, the number N that pixel is 1 in each grid cube is setpix, grid cube assignment threshold value is set
For TH, if Npix>=TH, then this grid cube is assigned a value of 1, is otherwise assigned a value of 0, three-dimension disclocation view field space SkIn (pi, qi,
ri) assignment function of grid cube of position isThat is:
Whereinpi∈ [1 2 ... p], qi∈ [1 2 ... q], ri∈ [1 2 ... r], Npix
(pi, qi, ri) it is three-dimension disclocation view field space SkMiddle position is (pi, qi, ri) grid cube in pixel be 1 number.
7. method according to claim 1-3, it is characterised in that: described (2.4) calculate the number of depth of field extension
Change three-dimensional microscopic field of view space SeDetailed process is as follows:
(2.4.1) calculates two adjacent three-dimension disclocation space SskWith Sk+1Sliceable calculating digitlization matrix Gk、Gk+1: work as precision
Positioning system (1) controls micro-vision system (2) and carries out tomoscan (Flag along Z axis positive directionz=1), according to two adjacent three
Tie up tomography space SkWith Sk+1Digitlization matrix beThen:
When Precision Position Location System (1) control micro-vision system (2) carries out tomoscan (Flag along Z axis negative directionz=-1) when:
(2.4.2) calculates the microscopic field of view space S of the extension of micro-vision system (2)eDigital information GeAre as follows:
Wherein [] ' representing matrix transposition, FlagzFor recording along the direction for defining the scanning of coordinate system Z axis.Digital information GeIt retouches
Microscopic field of view space S after the depth of field extension along Z-direction statedeSize is H × W × De, the microscopic field of view after extension is empty at this time
Between depth of field DeAre as follows:
De=N × Δ
Wherein N is the tomoscan image quantity obtained.
8. -7 described in any item methods according to claim 1, it is characterised in that the method is suitable for micro-vision system
For monocular, binocular, three mesh and more mesh micro-vision systems, suitable for micro assemby, micro OS, cell manipulation system it is aobvious
The micro- depth of field of micro- vision system extends.
9. realizing that the micro-vision system based on computer micro-vision layer scanning technology of claim 1-8 the method is aobvious
Micro- depth of field digitizes expansion system, including Precision Position Location System (1), micro-vision system (2) and master computer (25), feature
It is,
The Precision Position Location System (1) for drive micro-vision system (2) moved along micro-vision system optical axis direction and
Carry out precision positioning;It includes the telecontrol equipment of realization one-dimensional precise movement and realizes positioning accuracy and the micro-vision system depth of field
Matched high accuracy positioning movement driving actuator and controller;
The micro-vision system (2) obtains tomoscan image sequence for carrying out image slices scanning;It includes micro- puts
Big unit realizes the amplification to imaging object in microscopic field of view space, imaging by optical microscopy or electron microscope
Unit is completed by CCD or CMOS camera to the image objects in microscopic field of view space;
The master computer (25) is for carrying out control calculating, Yi Jijin to Precision Position Location System (1) and micro-vision system (2)
Digitized microscopic field of view spatial result is shown:
A, corresponding three-dimension disclocation visual field is obtained using the step-length of the tomoscan image sequence combination Precision Position Location System of acquisition
Space;The a height of H of visual field of micro-vision system (7) is set, and visual field width is W, and the step-length of Precision Position Location System is Δ, is swept along Z axis
The tomographic sequence Img retouchedkCorresponding three-dimension disclocation space size is H × W × Δ, obtains three-dimension disclocation view field space
Sequence vector are as follows:
Sz=[S1 S2 … Sk … SN]
S in formulakAre as follows:
X in formulak、yk、zkRespectively define coordinate system (7) X-axis, Y-axis, the range in Z-direction, d2For micro-vision system (2)
Object distance;
B, three-dimension disclocation spatial digitalized information is calculated, the digitlization microscopic field of view space of depth of field extension is obtained, realizes micro- scape
Deep extension, specifically includes:
(2.1) information other than three-dimension disclocation view field space is removed;
(2.2) it quantizes to three-dimension disclocation view field space sequence trellis and grid, obtains the number of three-dimension disclocation view field space
Change information;
(2.3) according to three-dimension disclocation view field space digital information, the Digital Three-Dimensional microscopic field of view space of depth of field extension is calculated
Se, realize the micro- depth of field extension in microscopic field of view space.
10. system according to claim 9, which is characterized in that be also configured with displacement standard volume system, control slice position
Set and record the location information of slice obtained;It includes realizing that displacement passes on the movement mechanism for be set to Precision Position Location System
The displacement quantity sensor of sense, and carry out the Precision Position Location System controller and displacement sensing of guide rail control motion feedback control
Device controller.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810622582.5A CN108955562B (en) | 2018-06-15 | 2018-06-15 | Digital extension method and system for microscopic depth of field of microscopic vision system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810622582.5A CN108955562B (en) | 2018-06-15 | 2018-06-15 | Digital extension method and system for microscopic depth of field of microscopic vision system |
Publications (2)
Publication Number | Publication Date |
---|---|
CN108955562A true CN108955562A (en) | 2018-12-07 |
CN108955562B CN108955562B (en) | 2020-06-16 |
Family
ID=64489251
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810622582.5A Active CN108955562B (en) | 2018-06-15 | 2018-06-15 | Digital extension method and system for microscopic depth of field of microscopic vision system |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN108955562B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111121675A (en) * | 2019-12-11 | 2020-05-08 | 南京理工大学 | Visual field expansion method for microsphere surface microscopic interferometry |
CN112903236A (en) * | 2021-01-29 | 2021-06-04 | 上海交通大学 | Focal plane scanning-based aerodynamic thermal parameter optical test device and method |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104111242A (en) * | 2014-06-17 | 2014-10-22 | 费鹏 | Three dimensional pixel super-resolution microscopic imaging method |
CN105180806A (en) * | 2015-08-25 | 2015-12-23 | 大连理工大学 | Trans-scale geometrical parameter measurement method based on microscopic visual sense |
CN107144241A (en) * | 2017-06-09 | 2017-09-08 | 大连理工大学 | A kind of binocular vision high-precision measuring method compensated based on the depth of field |
-
2018
- 2018-06-15 CN CN201810622582.5A patent/CN108955562B/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104111242A (en) * | 2014-06-17 | 2014-10-22 | 费鹏 | Three dimensional pixel super-resolution microscopic imaging method |
CN105180806A (en) * | 2015-08-25 | 2015-12-23 | 大连理工大学 | Trans-scale geometrical parameter measurement method based on microscopic visual sense |
CN107144241A (en) * | 2017-06-09 | 2017-09-08 | 大连理工大学 | A kind of binocular vision high-precision measuring method compensated based on the depth of field |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111121675A (en) * | 2019-12-11 | 2020-05-08 | 南京理工大学 | Visual field expansion method for microsphere surface microscopic interferometry |
CN111121675B (en) * | 2019-12-11 | 2021-09-03 | 南京理工大学 | Visual field expansion method for microsphere surface microscopic interferometry |
CN112903236A (en) * | 2021-01-29 | 2021-06-04 | 上海交通大学 | Focal plane scanning-based aerodynamic thermal parameter optical test device and method |
Also Published As
Publication number | Publication date |
---|---|
CN108955562B (en) | 2020-06-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN106997614B (en) | Large-scale scene 3D modeling method and device based on depth camera | |
CN102184563B (en) | Three-dimensional scanning method, three-dimensional scanning system and three-dimensional scanning device used for plant organ form | |
DE112017008101T5 (en) | AUTONOMOUS ROBOTS AND METHOD FOR OPERATING THE SAME | |
CN1975324A (en) | Double-sensor laser visual measuring system calibrating method | |
Brücker et al. | Single-view volumetric PIV via high-resolution scanning, isotropic voxel restructuring and 3D least-squares matching (3D-LSM) | |
CN109187591A (en) | A kind of X-ray super-resolution imaging method and its application | |
CN111476242B (en) | Laser point cloud semantic segmentation method and device | |
CN103033525A (en) | CT (computed tomography) system and CT image reconstruction method | |
CN109272575B (en) | Method for improving modeling speed of digital slice scanner | |
CN108955562A (en) | The micro- depth of field digitlization extended method of micro-vision system and system based on computer micro-vision layer scanning technology | |
CN102519434A (en) | Test verification method for measuring precision of stereoscopic vision three-dimensional recovery data | |
CN102042807A (en) | Flexible stereoscopic vision measuring unit for target space coordinate | |
EP2977961A1 (en) | Method and communication device for creating and/or editing virtual objects | |
CN108765484A (en) | Living insects motion pick and data reconstruction method based on two high-speed cameras | |
CN108983702B (en) | Computer microscopic visual slice scanning technology-based microscopic visual field digital extension method and system for microscopic visual system | |
CN202305443U (en) | CT (computed tomography) system | |
CN112525106B (en) | Three-phase machine cooperative laser-based 3D detection method and device | |
CN103192399A (en) | Micro-vision hand-eye calibration method based on target motion | |
CN112633248A (en) | Deep learning all-in-focus microscopic image acquisition method | |
CN110020988B (en) | Super-resolution reconstruction system and reconstruction method based on micro-nano motion platform | |
CN108876838B (en) | Method and system for digitizing micro-operation space of micro-operation system | |
CN108961419A (en) | The microscopic field of view spatial digitalized method and system of the micro-vision system of microassembly system | |
US8914255B2 (en) | Method, apparatus, and computer program product for focus prediction | |
CN201945293U (en) | Flexibility stereoscopic vision measurement device of target space coordinate | |
CN108897279B (en) | Digital extension method and system for field and depth of field of microscopic vision system of micro-assembly system |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |