CN108955520B - Structured light three-dimensional scanning accessibility analysis method and analysis system - Google Patents
Structured light three-dimensional scanning accessibility analysis method and analysis system Download PDFInfo
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- CN108955520B CN108955520B CN201810344169.7A CN201810344169A CN108955520B CN 108955520 B CN108955520 B CN 108955520B CN 201810344169 A CN201810344169 A CN 201810344169A CN 108955520 B CN108955520 B CN 108955520B
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- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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Abstract
The invention relates to a structured light three-dimensional scanning accessibility analysis method, which comprises the following steps: and constructing a scanning working space according to a geometric measurement model of the structured light three-dimensional scanning equipment. And dispersing the curved surface of the reference model of the workpiece to be detected to obtain the sampling point of the reference model of the workpiece to be detected, which is positioned on the curved surface. And constructing a scanning visual cone space of each sampling point based on the reference model of the workpiece to be detected. And judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working space, the scanning visual cone space and the preset structured light scanning accessibility conditions. And displaying the sampling points which can be reached by scanning and the sampling points which can not be reached by scanning on the curved surface in different colors respectively. The invention analyzes the geometric parameters of the scanning device and the reference model of the workpiece to be detected, and combines the scanning accessibility condition of the structured light to judge the scanning accessibility of the object to be detected, and the accessibility analysis result can provide reference for the scanning operation, so that the operator can adjust and optimize the scanning strategy.
Description
Technical Field
The invention relates to the technical field of three-dimensional scanning, in particular to a structured light three-dimensional scanning accessibility analysis method and an analysis system.
Background
The three-dimensional information acquisition technology is one of the hot spots of research in the field of computers, and various three-dimensional information acquisition technologies are developed at present, such as a probe method adopted by a three-coordinate measuring machine, a flying spot method based on a radar principle, a stereoscopic vision technology and the like. The structured light three-dimensional scanning equipment mainly comprises a structured light projector and a camera, wherein firstly, the projector projects structured light to the surface of a measured object; then, shooting the surface of the measured object through a single camera and a plurality of cameras to obtain a structured light image; and finally, carrying out three-dimensional analysis on the image based on the triangulation principle to obtain the three-dimensional model information of the object. Due to the influence of the surface shape of the object, system parameters and measuring orientation, there may be regions on the surface of the object to be measured that are not measurable due to occlusion. When scanning operation is carried out, a better measurement pose can be obtained only by multiple attempts. How to reduce the influence of the shielding factor on the scanning quality and improve the scanning quality of the measured object is an important problem in the three-dimensional scanning application.
Disclosure of Invention
The present invention provides a structured light three-dimensional scanning accessibility analysis method and an analysis system, which are directed to the above-mentioned shortcomings of the prior art.
The technical scheme for solving the technical problems is as follows: a structured light three-dimensional scanning reachability analysis method comprises the following steps:
step 1, constructing a scanning working space according to a geometric measurement model of structured light three-dimensional scanning equipment;
step 2, dispersing the curved surface of the reference model of the workpiece to be measured to obtain a sampling point of the reference model of the workpiece to be measured, wherein the sampling point is positioned on the curved surface;
step 3, constructing a scanning visual cone space of each sampling point based on the reference model of the workpiece to be detected;
step 4, judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working space, the scanning visual cone space and a preset structured light scanning accessibility condition;
and 5, displaying the sampling points which can be scanned and the sampling points which can not be scanned on the curved surface in different colors respectively.
The invention has the beneficial effects that: aiming at the problems of complex operation, low efficiency, unstable three-dimensional scanning reconstruction quality and the like caused by lack of reference in the current three-dimensional scanning operation, the invention analyzes the geometric parameters of the structured light three-dimensional scanning device and the reference model of the workpiece to be detected, constructs the scanning working space of the scanning device based on the geometric parameters of the structured light three-dimensional scanning device, constructs the visual cone space of the object to be detected based on the reference model of the object to be detected, and judges the scanning accessibility of the object to be detected by combining the accessibility condition of structured light scanning. The accessibility analysis result can provide reference for scanning operation, so that an operator can conveniently adjust and optimize a scanning strategy, and the accessibility analysis result has a better reference value in actual scanning operation.
On the basis of the technical scheme, the invention can be further improved as follows.
Further, before the step 2, the method further includes:
said step 4 comprises:
and judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working angle, the scanning visual cone space and a preset structured light scanning accessibility condition.
Further, the step 1 comprises:
step 1.1, constructing a three-dimensional reference coordinate system by taking a light source central point of the structured light projector as an original point, taking an optical axis of the structured light projector along the depth-of-view direction as a Z axis and taking a normal direction of a plane where the optical axis of the laser projector and the optical axis of the camera are positioned as an X axis;
step 1.2, based on a preset maximum scanning depth of sight and a preset maximum scanning profile, when the structured light three-dimensional scanning device adopts a single-line structured light mode, determining a light plane area under the single-line structured light mode in the reference coordinate system as a scanning working space, and when the structured light three-dimensional scanning device adopts a surface structured light mode, determining a spatial stereo area under the surface structured light mode in the reference coordinate system as a scanning working space;
said step 6 comprises:
when the structured light three-dimensional scanning equipment adopts a single-line structured light mode, performing grid division on the scanning working space through straight lines parallel to the Y axis and the Z axis of the reference coordinate system respectively, and determining each grid point after division as each scanning working point of the structured light three-dimensional scanning equipment; alternatively, the first and second electrodes may be,
when the structured light three-dimensional scanning device adopts a surface structured light mode, cubic grid division is carried out on the scanning working space through planes which are respectively parallel to three coordinate planes of the reference coordinate system, and each grid point after division is determined as each scanning working point of the structured light three-dimensional scanning device.
Further, the step 3 comprises:
step 3.1, determining the maximum visible cone of each sampling point according to a preset threshold of an imaging included angle of each sampling point, wherein the imaging included angle is represented as an included angle between an imaging light beam of the sampling point and a normal direction of the sampling point on the curved surface, and the imaging light beam is represented as a connecting line between the sampling point and the camera;
3.2, constructing a non-interference visual cone of each sampling point, wherein one or more non-interference visual cones of each sampling point are provided;
step 3.3, calculating an intersection area of the maximum visual cone and the non-interference visual cone of each sampling point to obtain a scanning visual cone space of the sampling point, wherein the scanning visual cone space comprises: one or more scanning cones.
Further, the step 4 comprises:
step 4.1, calculating the connection line included angle between two non-coincident points on the boundary line of each scanning visual cone of each sampling point and the sampling point respectively, and determining the maximum connection line included angle corresponding to the sampling point as the maximum visual angle of the sampling point;
and 4.2, sequentially matching the maximum visual angle of each sampling point with each scanning working angle in the scanning working space in terms of direction and size, determining the sampling point as a sampling point which can be scanned when the number of the scanning working angles which are matched with the direction of the sampling point and are smaller than the maximum visual angle is larger than zero, and otherwise, determining the sampling point as a sampling point which can not be scanned.
The invention also provides a structured light three-dimensional scanning accessibility analysis system, which comprises:
the scanning working space construction unit is used for constructing a scanning working space according to a geometric measurement model of the structured light three-dimensional scanning device;
the sampling point determining unit is used for dispersing the curved surface of the reference model of the workpiece to be detected to obtain the sampling point of the reference model of the workpiece to be detected, wherein the sampling point is positioned on the curved surface;
the scanning visible cone space construction unit is used for constructing the scanning visible cone space of each sampling point determined by the sampling point determination unit based on the reference model of the workpiece to be detected;
the analysis and judgment unit is used for judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working space constructed by the scanning working space construction unit, the scanning visual cone space constructed by the scanning visual cone space construction unit and a preset structured light scanning accessibility condition;
and the display unit is used for displaying the sampling points which can be reached by scanning and the sampling points which can not be reached by scanning on the curved surface in different colors respectively.
The invention has the beneficial effects that: aiming at the problems of complex operation, low efficiency, unstable three-dimensional scanning reconstruction quality and the like caused by lack of reference in the current three-dimensional scanning operation, the invention analyzes the geometric parameters of the structured light three-dimensional scanning device and the reference model of the workpiece to be detected through the scanning working space construction unit and the sampling point determination unit, constructs the scanning working space of the scanning device based on the geometric parameters of the structured light three-dimensional scanning device, constructs the visual cone space of the object to be detected based on the reference model of the object to be detected, and carries out scanning accessibility judgment on the object to be detected through the analysis judgment unit according to the scanning accessibility condition of the structured light. The accessibility analysis result can provide reference for scanning operation, so that an operator can conveniently adjust and optimize a scanning strategy, and the accessibility analysis result has a better reference value in actual scanning operation.
Further, the system further comprises:
a scanning working point determining unit, configured to perform grid division on the scanning working space constructed by the scanning working space constructing unit, and determine each grid point after division as each scanning working point of the structured light three-dimensional scanning device;
the scanning working angle determining unit is used for calculating the scanning working angle corresponding to each scanning working point determined by the scanning working point determining unit according to the geometric measurement model, wherein the scanning working angle is represented by the included angle between the scanning working point and the connecting line of a structured light projector and a camera in the structured light three-dimensional scanning equipment;
the analysis and determination unit is specifically configured to:
and judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working angle determined by the scanning working angle determining unit, the scanning visual cone space constructed by the scanning visual cone space constructing unit and a preset structured light scanning accessibility condition.
Further, the scan workspace constructing unit is specifically configured to:
constructing a three-dimensional reference coordinate system by taking a light source central point of the structured light projector as an original point, taking an optical axis of the structured light projector along the depth-of-view direction as a Z axis and taking a normal direction of a plane where the optical axis of the laser projector and the optical axis of the camera are positioned as an X axis;
based on a preset maximum scanning apparent depth and a preset maximum scanning outline, when the structured light three-dimensional scanning equipment adopts a single-line structured light mode, determining a light plane area under the single-line structured light mode in the reference coordinate system as a scanning working space, and when the structured light three-dimensional scanning equipment adopts a surface structured light mode, determining a spatial stereo area under the surface structured light mode in the reference coordinate system as a scanning working space;
the scanning operating point determining unit is specifically configured to:
when the structured light three-dimensional scanning equipment adopts a single-line structured light mode, performing grid division on the scanning working space through straight lines parallel to the Y axis and the Z axis of the reference coordinate system respectively, and determining each grid point after division as each scanning working point of the structured light three-dimensional scanning equipment; alternatively, the first and second electrodes may be,
when the structured light three-dimensional scanning device adopts a surface structured light mode, cubic grid division is carried out on the scanning working space through planes which are respectively parallel to three coordinate planes of the reference coordinate system, and each grid point after division is determined as each scanning working point of the structured light three-dimensional scanning device.
Further, the scanning visual cone space constructing unit is specifically configured to:
determining the maximum visible cone of each sampling point according to a preset threshold value of an imaging included angle of each sampling point, wherein the imaging included angle is represented as an included angle between an imaging light beam of the sampling point and the normal direction of the sampling point on the curved surface, and the imaging light beam is represented as a connecting line between the sampling point and the camera; constructing an interference-free visual cone for each sampling point, wherein one or more of the interference-free visual cones for each sampling point; calculating the intersection area of the maximum visual cone and the non-interference visual cone of each sampling point to obtain a scanning visual cone space of the sampling point, wherein the scanning visual cone space comprises: one or more scanning cones.
Further, the analysis and judgment unit is specifically configured to:
calculating the connection included angle between two non-coincident points on the boundary line of each scanning visual cone of each sampling point and the sampling point, and determining the maximum connection included angle corresponding to the sampling point as the maximum visual angle of the sampling point;
and sequentially matching the maximum visual angle of each sampling point with each scanning working angle in the scanning working space in terms of direction and size, determining the sampling point as a sampling point which can be scanned when the number of the scanning working angles which are matched with the direction of the sampling point and are smaller than the maximum visual angle is greater than zero, and otherwise, determining the sampling point as a sampling point which can not be scanned.
Drawings
Fig. 1 is a block flow diagram of a structured light three-dimensional scanning reachability analysis method according to an embodiment of the present invention;
FIG. 2 is a schematic discrete view of a triangular mesh of a curved surface of a workpiece according to another embodiment of the present invention;
fig. 3 is a block flow diagram of a structured light three-dimensional scanning reachability analysis method according to another embodiment of the present invention;
fig. 4 is a schematic diagram illustrating a structural optical camera scanning workspace definition according to another embodiment of the present invention;
fig. 5 is a schematic view of a binocular structured light camera scanning workspace provided in another embodiment of the present invention;
fig. 6 is a block flow diagram of step 130 in a structured light three-dimensional scanning reachability analysis method according to another embodiment of the present invention;
FIG. 7 is a mapping of a scanning imaging beam vector in a spherical coordinate system according to another embodiment of the present invention;
FIG. 8 is a schematic diagram illustrating the definition of non-interference view cone boundary vectors according to another embodiment of the present invention;
FIG. 9 is a schematic view of a scanning visual cone definition provided in accordance with another embodiment of the present invention;
fig. 10 is a block flow diagram of step 140 in a structured light three-dimensional scanning reachability analysis method according to another embodiment of the present invention;
FIG. 11 is a schematic block diagram of a structured light three-dimensional scanning reachability analysis system provided in accordance with an embodiment of the present invention;
fig. 12 is a schematic block diagram of a structured light three-dimensional scanning reachability analysis system according to another embodiment of the present invention.
In the drawings, the elements represented by the various reference numbers are listed below:
1. structured light projector, 2, scan line, 3, scan profile, 4, camera, 5, imaging triangle, 6, scan workspace, 7, mapping area, 8, no interference visual angle, 9, scan visual area.
Detailed Description
The principles and features of this invention are described below in conjunction with the following drawings, which are set forth by way of illustration only and are not intended to limit the scope of the invention.
Example one
A structured light three-dimensional scanning reachability analysis method 100, as shown in fig. 1, comprising:
and 110, constructing a scanning working space according to a geometric measurement model of the structured light three-dimensional scanning device.
And 120, dispersing the curved surface of the reference model of the workpiece to be detected to obtain a sampling point of the reference model of the workpiece to be detected, wherein the sampling point is positioned on the curved surface.
And step 130, constructing a scanning visual cone space of each sampling point based on the reference model of the workpiece to be detected.
And 140, judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working space, the scanning visual cone space and the preset structured light scanning accessibility conditions.
And 150, displaying the sampling points which can be reached by scanning and the sampling points which can not be reached by scanning on the curved surface in different colors respectively.
The embodiment designs a method for constructing a scanning working space model of structured light three-dimensional scanning equipment based on the geometric parameter characteristics of the structured light three-dimensional scanning equipment, and applies the model to automatic planning of a three-dimensional scanning path of a workpiece.
Aiming at the problems of complex operation, low efficiency, unstable three-dimensional scanning reconstruction quality and the like caused by lack of reference in three-dimensional scanning operation, the embodiment analyzes the geometric parameters of the structured light three-dimensional scanning device and the reference model of the workpiece to be detected, constructs the scanning working space of the scanning device based on the geometric parameters of the structured light three-dimensional scanning device, constructs the visual cone space of the object to be detected based on the reference model of the object to be detected, and performs scanning accessibility judgment on the object to be detected by combining the scanning accessibility condition of the structured light. The accessibility analysis result can provide reference for scanning operation, so that an operator can conveniently adjust and optimize a scanning strategy, and the accessibility analysis result has a better reference value in actual scanning operation.
It should be noted that, in step 110, the curved surface of the reference model of the workpiece to be measured may be discretized by a triangular mesh discretization method, so as to obtain sampling points of the reference model of the workpiece to be measured, where the sampling points are located on the curved surface. In step 120, a triangular mesh discretization method (which can be completed in the prior art) is adopted to discretize the external surface curved surface of the reference model of the workpiece to be measured, and the vertexes of the triangular mesh are obtained as scanning sampling points, as shown in fig. 2. Step 150, the display colors of the reachable and unreachable points are preset, and if the reachable points are set to be displayed in green, the unreachable points are set to be displayed in red. Then each sample point is displayed on the surface of the workpiece in the configured color according to the accessibility and the inaccessibility of the sample point of the workpiece to be measured analyzed in step 140.
According to the embodiment, the workpiece structured light three-dimensional scanning accessibility analysis result can be obtained, and the workpiece three-dimensional scanning accessibility analysis result to be detected is visually presented to a user.
Example two
On the basis of the first embodiment, as shown in fig. 3, before step 120, the method 100 further includes:
and 160, carrying out grid division on the scanning working space, and determining each grid point after the grid division as each scanning working point of the structured light three-dimensional scanning equipment.
And 170, calculating a scanning working angle corresponding to each scanning working point according to the geometric measurement model, wherein the scanning working angle is represented as an included angle between each scanning working point and a connecting line of a structured light projector and a camera in the structured light three-dimensional scanning equipment.
Step 140 includes: and judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working angle, the scanning visual cone space and the preset structured light scanning accessibility condition.
Specifically, in step 170, the corresponding relationship between the scanning working angles and the scanning working points and the scanning working angle range of the structured light three-dimensional scanning device can be obtained according to the scanning working angle corresponding to each scanning working point.
In the measuring process of the scanner, incident light is a connecting line of the structured light projector and a scanning working point, reflected light is a connecting line of the scanning working point and the camera, and the connecting line of the scanning working point, the camera and the structured light projector forms an imaging triangle.
In order to improve the computational efficiency of the reachability analysis algorithm, the scanning working points are sorted and ordered. Specifically, the method can be realized by the following steps: firstly, labeling each scanning working point based on the coordinates of the scanning working points; then, the scanning working points are sequenced according to the included angles of the incident light and the reflected light in the imaging triangle at the scanning working points, and the scanning working angle range in the scanning working space and the corresponding relation between the scanning working angles with different sizes and the scanning working points are obtained.
EXAMPLE III
On the basis of the second embodiment, the step 110 includes:
and step 111, constructing a three-dimensional reference coordinate system by taking the light source central point of the structured light projector as an original point, taking the optical axis of the structured light projector along the depth-of-view direction as a Z axis and taking the normal direction of the plane where the optical axis of the laser projector and the optical axis of the camera are positioned as an X axis.
Step 112, based on the preset maximum scanning depth of sight and the preset maximum scanning profile, when the structured light three-dimensional scanning device adopts a single-line structured light mode, determining a light plane area under the single-line structured light mode in a reference coordinate system as a scanning working space, and when the structured light three-dimensional scanning device adopts a surface structured light mode, determining a spatial three-dimensional area under the surface structured light mode in the reference coordinate system as the scanning working space;
step 160 comprises:
when the structured light three-dimensional scanning equipment adopts a single-line structured light mode, carrying out grid division on a scanning working space through straight lines which are respectively parallel to a Y axis and a Z axis of a reference coordinate system, and determining each grid point after division as each scanning working point of the structured light three-dimensional scanning equipment; alternatively, the first and second electrodes may be,
when the structured light three-dimensional scanning equipment adopts a surface structured light mode, cubic grid division is carried out on a scanning working space through planes which are respectively parallel to three coordinate planes of a reference coordinate system, and each divided grid point is determined as each scanning working point of the structured light three-dimensional scanning equipment.
The scanning working space refers to the space area which can be measured by the scanner under the condition that the scanner is fixed, and the space is related to the field angle and the visual depth parameter of the scanner. In this embodiment, a center point of a light source of the structured light projector is used as an origin, an optical axis of the structured light projector along the depth-of-view direction is used as a Z-axis, a normal direction of a plane where the optical axis of the laser projector and the optical axis of the camera are located is used as an X-axis, a Y-axis is obtained according to a right-hand rule of a cartesian coordinate system, a reference coordinate system is constructed, and a scanning working space of the scanner is described in the reference coordinate system.
When the scanner adopts a single-line structured light mode, the scanning working space is an area on a light plane, and when grid division is carried out, plane grid division is carried out inside the area by straight lines parallel to a Y axis and a Z axis. When the scanner adopts a surface structure light mode, the scanning working space is a space three-dimensional area, and when grid division is carried out, cubic grid division is carried out in the space three-dimensional area by planes parallel to three coordinate planes.
Specifically, as shown in fig. 4, a plane perpendicular to the Z axis of the reference coordinate system within the range of the depth of view of the scanner is regarded as a scanning working plane, the minimum depth of view position, the maximum depth of view position, and the middle position of the scanner are respectively designated to scan the working plane, and the scanning area profile is defined on the scanning working plane according to the geometric parameters or the actual test result of the three-dimensional scanner. When the scanner employs a single line structured light mode, the scanning area is outlined as one projection line (scanning line 2) of the structured light projector 1 on the working plane, as shown in the left diagram of fig. 4 (left diagram of vertical dashed line). When the scanner employs the area structured light mode, the scanning area is outlined as a closed polygon on the working plane, as shown in the right diagram of fig. 4 (the right diagram of the vertical dashed line). And performing linear interpolation based on the scanning area profile (scanning profile 3) on the designated scanning plane to obtain the scanning working space of the scanner.
And after the scanning working space is defined, carrying out grid dispersion on the scanning working space to obtain a scanning working point of the scanner in the scanning working space. As shown in fig. 5, when the scanner adopts the single line structured light mode, in the case of performing the grid division, the planar grid division is performed inside the region with straight lines parallel to the Y axis and the Z axis to obtain the grid points of the scanning work region, as shown in the left diagram (left diagram of the vertical dotted line) of fig. 5.
When the scanner employs the surface structured light mode, cubic meshing is performed with planes parallel to three coordinate planes in the spatial solid region when performing the meshing. Specifically, first, a box of the space in the reference coordinate system (for example, an AABB box) is calculated, and the AABB box is a rectangular parallelepiped whose length, width, and height sides are parallel to the X axis, Y axis, and Z axis of the reference coordinate system, respectively, and is used to describe the spatial range of the scanning work space in the reference coordinate system. Then, a discrete precision is appointed, and the containing box corresponding to the scanning working space is divided into a cubic grid to obtain cubic grid points. Finally, the grid points inside or outside the scanning working space 6 are determined, and the grid points inside the scanning working space region are taken as the scanning working points of the scanner, as shown in the right diagram of fig. 5 (right diagram of vertical dotted line), in which, points P and P are indicated1Point, P2The points respectively represent the scanning operating points.
As shown in fig. 5, in the measurement process of the scanner, the incident light is the connection line between the structured light projector 1 and the scanning working point, the reflected light is the connection line between the scanning working point and the camera 4, and the connection line between the scanning working point and the camera and the structured light projector forms an imaging triangle 5.
Example four
On the basis of any one of the first to third embodiments, as shown in fig. 6, the step 130 includes:
and step 131, determining the maximum visual cone of each sampling point according to a preset threshold of an imaging included angle of each sampling point, wherein the imaging included angle is represented as an included angle between an imaging beam of the sampling point and a normal direction of the sampling point on a curved surface, and the imaging beam is represented as a connecting line between the sampling point and a camera.
And step 132, constructing a non-interference visual cone of each sampling point, wherein one or more non-interference visual cones of each sampling point are provided.
Step 133, calculating an intersection region of the maximum visible cone and the non-interference visible cone of each sampling point to obtain a scanning visible cone space of the sampling point, where scanning the visible cone space includes: one or more scanning cones.
The scanning visual cone space is a cone beam space which is constructed by taking the sampling point on the surface of the workpiece as a vertex and has no interference with the workpiece. The three-dimensional scanning measurement is free of interference, which means that incident light and reflected light are not shielded when a scanner is used for measuring a sampling point.
In the embodiment, when a scanning visual cone space of a sampling point is constructed, a maximum visual cone is constructed by specifying a maximum included angle between an imaging light beam and a normal direction of the sampling point. And then constructing a visible cone without interference between the light beam and the workpiece, and taking the intersection area of the maximum visible cone and the visible cone without interference as a scanning visible cone space of the sampling point. The scanning visual cone space is divided into one or more communicated scanning visual cones based on the connectivity of the light beams in the scanning visual cone space, namely a beam of light is emitted from a sampling point, and is a single cone beam when no shielding exists in the middle of the light beam, and when shielding exists in the middle of the light beam, one light beam is dispersed into a plurality of light beams, so that a plurality of scanning visual cones exist.
Specifically, the construction process of the scanning visual cone space of a single sampling point comprises four steps:
(1) referring to the coordinate axis direction of the workpiece coordinate system (as shown in fig. 7, the left side view of the arrow), a temporary coordinate system PCS (sampling point coordinate system) is established at the sampling point P based on the conversion relationship between the cartesian coordinate system and the spherical coordinate system, the PCS is used for establishing the mapping of the cone-shaped light beam vector in the spherical coordinate system, as shown in fig. 7 (the right side view pointed by the arrow), and the mapping area is 7.
(2) And presetting a maximum included angle alpha between an imaging light beam and the normal direction of the sampling point to construct a maximum visible cone, wherein the imaging light beam is a connecting light ray between the sampling point and a camera receiving lens.
Mapping the boundary vector of the visual cone into a spherical coordinate system, and determining the mapping region omega of the maximum visual cone on the spherical surface1。
(3) The construction of the visible cone without interference between the light beam and the workpiece can be realized by the prior art, and specifically comprises the following steps: (a) and constructing m (m is 180) planes at equal angular intervals by taking the Z axis of the PCS coordinate system as a reference axis, taking a plane which passes through the reference axis and is parallel to the PCS coordinate system XOZ as an initial plane and taking the reference axis as a rotating axis. (b) Respectively calculating the intersection line of each plane and the curved surface of the workpiece, and dispersing the intersection lines into a point set Q (Q) by adopting an equal chord height error dispersion modeiAnd i is 0,1, …, n, and the normal direction of the curved surface of the workpiece at each discrete point is obtained. (c) By calculation of
Determining the boundary vector of the non-interference visual cone, wherein
Is a discrete point q of the intersection line of the sampling point p and the plane and the workpieceiThe unit vector of the composition is formed,
is qiThe judgment condition of the normal vector of the point workpiece curved surface unit and the boundary vector is ηi0 or ηi-1×ηi+1<0, and
the resultant ray does not intersect the curved surface of the workpiece, as in FIG. 8
The boundary vector is a connecting line vector of the discrete point satisfying the above determination condition and the corresponding sampling point. (d) Respectively determining the boundary vectors of the non-interference visible cones corresponding to the m planes, and mapping the boundary vectors to the spherical surface to obtain a mapping region omega of the non-interference visible cones on the spherical surface2。
(4) Calculating the intersection of the maximum visual cone and the non-interference visual cone, and taking the intersection region as the scanning visual cone of the sampling point, as shown in fig. 9, 8 represents the non-interference visual angle, 9 represents the scanning visual region, α represents the maximum included angle between the preset imaging beam and the normal direction of the sampling point1And Ω2The intersection mode determines the scanning visual cone. The maximum visual cone and the non-interference visual cone are mapped to a unified spherical surface, a section of circular arc is respectively and correspondingly arranged on the same meridian on the spherical surface, the intersection of the circular arcs is taken as a mapping area of the scanning visual cone on the meridian, wherein the meridian is an intersection line (circle) of a plane passing through the sphere rotating shaft and the sphere, and the circular arc is an intersection line of the mapping area of the visual cone on the spherical surface and the corresponding plane. Specifically, the Z axis of the PCS coordinate system at the sampling point is taken as a rotating shaft to respectively obtain omega1And Ω2On the spherical surface, the radian angle on the meridian at the equal angular interval Δ θ (Δ θ ═ 1 °), and Ω are calculated1And Ω2And determining the arc boundary of the scanning visual cone on the meridian by taking the intersection of the arc angles on the meridian as the arc angle of the scanning visual cone on the corresponding meridian, and connecting boundary points on adjacent meridians to form a mapping area of the scanning visual cone on the spherical surface. Based on the connectivity of the scanning visual cone in the spherical mapping area, the scanning visual cone may correspond to one or more connected visual cones.
EXAMPLE five
On the basis of the fourth embodiment, as shown in fig. 10, step 140 includes:
and step 141, calculating the connection line included angle between two non-coincident points on the boundary line of each scanning visual cone of each sampling point and the sampling point, and determining the maximum connection line included angle corresponding to the sampling point as the maximum visual angle of the sampling point.
And 142, sequentially matching the maximum visual angle of each sampling point with each scanning working angle in the scanning working space in terms of direction and size, determining the sampling point as a sampling point which can be scanned when the number of the scanning working angles which are matched with the direction of the sampling point and are smaller than the maximum visual angle is larger than zero, and otherwise, determining the sampling point as a sampling point which can not be scanned.
The maximum visual angle in the visual cone is an included angle formed by connecting two non-coincident points on the boundary line of the visual cone and a connecting line of the sampling points. And comparing the visual angles of the boundary points by traversing all the points on the boundary line of the scanning visual cone in the scanning visual cone space of the sampling point to obtain the maximum visual angle in the scanning visual cone at the sampling point. And matching the maximum visual angle with the scanning working angles sequenced in the scanning working space to obtain the scanning working angle smaller than the maximum visual angle in the scanning working space and the corresponding scanning working point, and taking the sampling points with the number of the scanning working points larger than zero as the scanning reachable points.
It should be noted that the orientation information corresponding to the maximum visible angle is relative to the workpiece, the scanning working angle also has an orientation information, and is relative to the reference coordinate system of the scanner, and when the scanning working point is matched with the sampling point, the orientation of the scanner relative to the workpiece can be determined.
The three-dimensional scanning measurement is free of interference, which means that incident light and reflected light are not shielded when a scanner measures a sampling point. When the scanning working point of the scanner coincides with the sampling point, if the scanning incident light and the scanning reflected light are not shielded, the sampling point can be reached. The maximum visual angle in the scanning visual cone is an included angle formed by connecting lines of two non-coincident points on a boundary line of the scanning visual cone and a sampling point, the maximum visual angle in the visual cone at the sampling point is obtained by comparing the visual angles of every two boundary points through traversing the points on the boundary line of the scanning visual cone (namely, one sampling point corresponds to one scanning visual cone space which can correspond to one or more scanning visual cones, each scanning visual cone has one maximum boundary vector included angle, the maximum boundary vector included angles of all the scanning visual cones are compared, the maximum included angle in all the scanning visual cones is obtained, the included angle is the maximum visual angle of the sampling point, and then the included angle is matched with the scanning working angle). And matching the scanning working angles of the maximum visual angle sequenced in the scanning working space to obtain the scanning working angle smaller than the maximum visual angle in the scanning working space and the corresponding reachable scanning working point, and taking the sampling points with the reachable scanning working points of which the number is larger than zero as reachable points.
EXAMPLE six
A structured light three-dimensional scanning reachability analysis system 200, as shown in fig. 11, comprising:
the scanning working space construction unit is used for constructing a scanning working space according to a geometric measurement model of the structured light three-dimensional scanning device;
the sampling point determining unit is used for dispersing the curved surface of the reference model of the workpiece to be detected to obtain the sampling point of the reference model of the workpiece to be detected, wherein the sampling point is positioned on the curved surface;
the scanning visible cone space construction unit is used for constructing the scanning visible cone space of each sampling point determined by the sampling point determination unit based on the reference model of the workpiece to be detected;
the analysis and judgment unit is used for judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working space constructed by the scanning working space construction unit, the scanning visual cone space constructed by the scanning visual cone space construction unit and a preset structured light scanning accessibility condition;
and the display unit is used for displaying the sampling points which can be reached by scanning and the sampling points which can not be reached by scanning on the curved surface in different colors respectively.
Aiming at the problems of complex operation, low efficiency, unstable three-dimensional scanning reconstruction quality and the like caused by lack of reference in the current three-dimensional scanning operation, the invention analyzes the geometric parameters of the structured light three-dimensional scanning device and the reference model of the workpiece to be detected through the scanning working space construction unit and the sampling point determination unit, constructs the scanning working space of the scanning device based on the geometric parameters of the structured light three-dimensional scanning device, constructs the visual cone space of the object to be detected based on the reference model of the object to be detected, and carries out scanning accessibility judgment on the object to be detected through the analysis judgment unit according to the scanning accessibility condition of the structured light. The accessibility analysis result can provide reference for scanning operation, so that an operator can conveniently adjust and optimize a scanning strategy, and the accessibility analysis result has a better reference value in actual scanning operation.
It should be noted that the sampling point determining unit may discretize the curved surface of the reference model of the workpiece to be measured by a triangular mesh discretization method to obtain the sampling points of the reference model of the workpiece to be measured on the curved surface.
EXAMPLE seven
On the basis of the sixth embodiment, as shown in fig. 12, the system 200 further includes:
the scanning working point determining unit is used for carrying out grid division on the scanning working space constructed by the scanning working space constructing unit and determining each grid point after division as each scanning working point of the structured light three-dimensional scanning equipment;
the scanning working angle determining unit is used for calculating a scanning working angle corresponding to each scanning working point determined by the scanning working point determining unit according to the geometric measurement model, wherein the scanning working angle is represented as an included angle between the scanning working point and a connecting line of a structured light projector and a camera in the structured light three-dimensional scanning equipment;
the analysis and determination unit is specifically configured to: and judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working angle determined by the scanning working angle determining unit, the scanning visual cone space constructed by the scanning visual cone space constructing unit and a preset structured light scanning accessibility condition.
The specific technical analysis is the same as that of the second embodiment, and is not repeated herein.
Example eight
On the basis of the seventh embodiment, the scan workspace constructing unit is specifically configured to:
constructing a three-dimensional reference coordinate system by taking a light source central point of a structured light projector as an original point, taking an optical axis of the structured light projector along the depth-of-view direction as a Z axis and taking a normal direction of a plane where the optical axis of the laser projector and the optical axis of the camera are positioned as an X axis; based on the preset maximum scanning apparent depth and the preset maximum scanning outline, when the structured light three-dimensional scanning equipment adopts a single-line structured light mode, a light plane area under the single-line structured light mode in a reference coordinate system is determined as a scanning working space, and when the structured light three-dimensional scanning equipment adopts a surface structured light mode, a space three-dimensional area under the surface structured light mode in the reference coordinate system is determined as the scanning working space.
The scanning operating point determining unit is specifically configured to: when the structured light three-dimensional scanning equipment adopts a single-line structured light mode, carrying out grid division on a scanning working space through straight lines which are respectively parallel to a Y axis and a Z axis of a reference coordinate system, and determining each grid point after division as each scanning working point of the structured light three-dimensional scanning equipment; alternatively, the first and second electrodes may be,
when the structured light three-dimensional scanning equipment adopts a surface structured light mode, cubic grid division is carried out on a scanning working space through planes which are respectively parallel to three coordinate planes of a reference coordinate system, and each divided grid point is determined as each scanning working point of the structured light three-dimensional scanning equipment.
The specific technical analysis is the same as that of the third embodiment, and is not repeated herein.
Example nine
On the basis of any one of the sixth to eighth embodiments, the scanning visible cone space constructing unit is specifically configured to:
determining the maximum visible cone of each sampling point according to a preset threshold value of an imaging included angle of each sampling point, wherein the imaging included angle is represented as an included angle between an imaging light beam of the sampling point and the normal direction of the sampling point on a curved surface, and the imaging light beam is represented as a connecting line between the sampling point and a camera; constructing a non-interference visual cone of each sampling point, wherein one or more non-interference visual cones of each sampling point are provided; calculating the intersection area of the maximum visual cone and the non-interference visual cone of each sampling point to obtain the scanning visual cone space of the sampling point, wherein the scanning visual cone space comprises the following steps: one or more scanning cones.
The detailed technical analysis is the same as that of the fourth embodiment, and is not repeated herein.
Example ten
On the basis of the ninth embodiment, the analysis and judgment unit is specifically configured to:
and calculating the connection line included angle between two non-coincident points on the boundary line of each scanning visual cone of each sampling point and the sampling point respectively, and determining the maximum connection line included angle corresponding to the sampling point as the maximum visual angle of the sampling point. And matching the position and the size of the maximum visual angle of each sampling point with each scanning working angle in a scanning working space in sequence, determining the sampling point as a sampling point which can be scanned when the number of the scanning working angles which are matched with the position of the sampling point and are smaller than the maximum visual angle is larger than zero, and otherwise, determining the sampling point as a sampling point which can not be scanned.
The detailed technical analysis is the same as that of the fifth embodiment, and is not repeated herein.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (8)
1. A structured light three-dimensional scanning accessibility analysis method is characterized by comprising the following steps:
step 1, constructing a scanning working space according to a geometric measurement model of structured light three-dimensional scanning equipment;
step 2, dispersing the curved surface of the reference model of the workpiece to be measured to obtain a sampling point of the reference model of the workpiece to be measured, wherein the sampling point is positioned on the curved surface;
step 3, constructing a scanning visual cone space of each sampling point based on the reference model of the workpiece to be detected;
step 4, judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working space, the scanning visual cone space and a preset structured light scanning accessibility condition;
step 5, displaying the sampling points which can be scanned and the sampling points which can not be scanned on the curved surface in different colors respectively;
the scanning visual cone space comprises: one or more scanning cones, the step 4 comprising:
step 4.1, calculating the connection line included angle between two non-coincident points on the boundary line of each scanning visual cone of each sampling point and the sampling point respectively, and determining the maximum connection line included angle corresponding to the sampling point as the maximum visual angle of the sampling point;
step 4.2, sequentially matching the maximum visual angle of each sampling point with each scanning working angle in the scanning working space in terms of direction and size, determining the sampling point as a sampling point which can be scanned when the number of the scanning working angles which are matched with the direction of the sampling point and are smaller than the maximum visual angle is larger than zero, and otherwise, determining the sampling point as a sampling point which can not be scanned;
and the scanning working angle is represented as an included angle between a scanning working point and a connecting line of a structured light projector and a camera in the structured light three-dimensional scanning equipment.
2. A structured light three dimensional scanning reachability analysis method according to claim 1, further comprising, before said step 2:
step 6, carrying out grid division on the scanning working space, and determining each grid point after division as each scanning working point of the structured light three-dimensional scanning equipment;
step 7, calculating a scanning working angle corresponding to each scanning working point according to the geometric measurement model;
said step 4 comprises:
and judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working angle, the scanning visual cone space and a preset structured light scanning accessibility condition.
3. The structured light three-dimensional scanning reachability analysis method according to claim 2, wherein the step 1 comprises:
step 1.1, constructing a three-dimensional reference coordinate system by taking a light source central point of the structured light projector as an original point, taking an optical axis of the structured light projector along the depth-of-view direction as a Z axis and taking a normal direction of a plane where the optical axis of the structured light projector and the optical axis of the camera are positioned as an X axis;
step 1.2, based on a preset maximum scanning depth of sight and a preset maximum scanning profile, when the structured light three-dimensional scanning device adopts a single-line structured light mode, determining a light plane area under the single-line structured light mode in the reference coordinate system as a scanning working space, and when the structured light three-dimensional scanning device adopts a surface structured light mode, determining a spatial stereo area under the surface structured light mode in the reference coordinate system as a scanning working space;
said step 6 comprises:
when the structured light three-dimensional scanning equipment adopts a single-line structured light mode, performing grid division on the scanning working space through straight lines parallel to the Y axis and the Z axis of the reference coordinate system respectively, and determining each grid point after division as each scanning working point of the structured light three-dimensional scanning equipment; alternatively, the first and second electrodes may be,
when the structured light three-dimensional scanning device adopts a surface structured light mode, cubic grid division is carried out on the scanning working space through planes which are respectively parallel to three coordinate planes of the reference coordinate system, and each grid point after division is determined as each scanning working point of the structured light three-dimensional scanning device.
4. A structured light three-dimensional scanning reachability analysis method according to claim 2 or 3, wherein said step 3 comprises:
step 3.1, determining the maximum visible cone of each sampling point according to a preset threshold of an imaging included angle of each sampling point, wherein the imaging included angle is represented as an included angle between an imaging light beam of the sampling point and a normal direction of the sampling point on the curved surface, and the imaging light beam is represented as a connecting line between the sampling point and the camera;
3.2, constructing a non-interference visual cone of each sampling point, wherein one or more non-interference visual cones of each sampling point are provided;
and 3.3, calculating the intersection area of the maximum visual cone and the non-interference visual cone of each sampling point to obtain the scanning visual cone space of the sampling point.
5. A structured light three-dimensional scanning reachability analysis system, comprising:
the scanning working space construction unit is used for constructing a scanning working space according to a geometric measurement model of the structured light three-dimensional scanning device;
the sampling point determining unit is used for dispersing the curved surface of the reference model of the workpiece to be detected to obtain the sampling point of the reference model of the workpiece to be detected, wherein the sampling point is positioned on the curved surface;
the scanning visible cone space construction unit is used for constructing the scanning visible cone space of each sampling point determined by the sampling point determination unit based on the reference model of the workpiece to be detected;
the analysis and judgment unit is used for judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working space constructed by the scanning working space construction unit, the scanning visual cone space constructed by the scanning visual cone space construction unit and a preset structured light scanning accessibility condition;
the display unit is used for displaying the sampling points which can be scanned and the sampling points which can not be scanned on the curved surface in different colors;
the scanning visual cone space comprises: one or more scanning visual cones, the analysis and judgment unit is specifically configured to:
calculating the connection line included angle between two non-coincident points on the boundary line of each scanning visible cone of each sampling point and the sampling point respectively, and determining the maximum connection line included angle corresponding to the sampling point as the maximum visible angle of the sampling point;
sequentially matching the maximum visual angle of each sampling point with each scanning working angle in the scanning working space in terms of direction and size, determining the sampling point as a sampling point which can be scanned when the number of the scanning working angles which are matched with the direction of the sampling point and are smaller than the maximum visual angle is larger than zero, and otherwise, determining the sampling point as a sampling point which can not be scanned;
and the scanning working angle is represented as an included angle between a scanning working point and a connecting line of a structured light projector and a camera in the structured light three-dimensional scanning equipment.
6. A structured light three dimensional scanning reachability analysis system according to claim 5, further comprising:
a scanning working point determining unit, configured to perform grid division on the scanning working space constructed by the scanning working space constructing unit, and determine each grid point after division as each scanning working point of the structured light three-dimensional scanning device;
the scanning working angle determining unit is used for calculating the scanning working angle corresponding to each scanning working point determined by the scanning working point determining unit according to the geometric measurement model;
the analysis and determination unit is specifically configured to:
and judging the scanning accessibility of each sampling point under the scanning of the structured light three-dimensional scanning equipment according to the scanning working angle determined by the scanning working angle determining unit, the scanning visual cone space constructed by the scanning visual cone space constructing unit and a preset structured light scanning accessibility condition.
7. The structured light three-dimensional scanning reachability analysis system according to claim 6, wherein said scanning workspace building unit is specifically configured to:
constructing a three-dimensional reference coordinate system by taking a light source central point of the structured light projector as an original point, taking an optical axis of the structured light projector along the depth-of-view direction as a Z axis and taking a normal direction of a plane where the optical axis of the structured light projector and the optical axis of the camera are positioned as an X axis;
based on a preset maximum scanning apparent depth and a preset maximum scanning outline, when the structured light three-dimensional scanning equipment adopts a single-line structured light mode, determining a light plane area under the single-line structured light mode in the reference coordinate system as a scanning working space, and when the structured light three-dimensional scanning equipment adopts a surface structured light mode, determining a spatial stereo area under the surface structured light mode in the reference coordinate system as a scanning working space;
the scanning operating point determining unit is specifically configured to:
when the structured light three-dimensional scanning equipment adopts a single-line structured light mode, performing grid division on the scanning working space through straight lines parallel to the Y axis and the Z axis of the reference coordinate system respectively, and determining each grid point after division as each scanning working point of the structured light three-dimensional scanning equipment; alternatively, the first and second electrodes may be,
when the structured light three-dimensional scanning device adopts a surface structured light mode, cubic grid division is carried out on the scanning working space through planes which are respectively parallel to three coordinate planes of the reference coordinate system, and each grid point after division is determined as each scanning working point of the structured light three-dimensional scanning device.
8. The structured light three-dimensional scanning reachability analysis system according to claim 6 or 7, wherein said scanning visual cone space construction unit is specifically configured to:
determining the maximum visible cone of each sampling point according to a preset threshold value of an imaging included angle of each sampling point, wherein the imaging included angle is represented as an included angle between an imaging light beam of the sampling point and the normal direction of the sampling point on the curved surface, and the imaging light beam is represented as a connecting line between the sampling point and the camera; constructing an interference-free visual cone for each sampling point, wherein one or more of the interference-free visual cones for each sampling point; and calculating the intersection area of the maximum visual cone and the non-interference visual cone of each sampling point to obtain the scanning visual cone space of the sampling point.
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