CN108919021A - A kind of test point automatic testing method - Google Patents
A kind of test point automatic testing method Download PDFInfo
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- CN108919021A CN108919021A CN201810459985.2A CN201810459985A CN108919021A CN 108919021 A CN108919021 A CN 108919021A CN 201810459985 A CN201810459985 A CN 201810459985A CN 108919021 A CN108919021 A CN 108919021A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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Abstract
The present invention provides a kind of test point automatic testing method, by the way that maximum latency Tw and in advance exit criteria Ce and Ct is arranged, in the case where satisfaction exits in advance, can exit the test of current point in advance, greatly shorten the time-consuming entirely tested, improve testing efficiency;, whereas if being unsatisfactory for exit criteria in advance, then continue cycling through test and judgement, thus can avoid test process in due to data fluctuations bring contingency, guarantee the test data of all test points and the authenticity of conclusion and reliability, have good repeatability.The parameter that the present invention needs to be arranged is few, and only Tw, Ce and Ct tri- can open to user on the basis of providing empirical value completely, optimize adjustment according to the actual situation by user.The present invention has good scalability, not only can effectively solve the detection that table and source are directed in electromotive checking, is equally applicable to other fields and scene that similar satisfaction carries out error judgment using standard value and measured value.
Description
Technical field
The invention belongs to electromotive checking technical fields, and in particular to a kind of test point automatic testing method.
Background technique
In the class of accuracy detection of electrical measurement, typically with higher than tested device (Measurand) class of accuracy
Standard (Standard) be used as standard, tested device is detected, and thus carry out transmission of quantity value or tracing to the source.Tested device
It generally can be divided into two kinds:Source and table.If tested device is source, the table of high two grades is generally used to be detected as standard,
It is tested device when detection and carries out source output (such as voltage, electric current, frequency, phase, harmonic wave), standard is as table, to tested device
Source output measures, and the error of tested device can be calculated with the reading value of standard and the reading value of tested device;If tested
Device is table, generally with the source of high two grades (be also possible to a high grade source increase two grades table composition standard
System) it is detected as standard, standard carries out source output (such as voltage, electric current, frequency, phase, harmonic wave) when detection,
Tested device measures the source output of standard, can be calculated with the reading value of standard and the reading value of tested device as table
It is tested the error of device out.Either artificial detection or automatic detection, regardless of being the detection to source or the detection to table, all
It is that high-grade standard is used to read the reading for being tested device as standard value as measured value, then uses standard value and measured value
By the error of tested device, i.e. class of accuracy is accordingly calculated.
In automatic detection process, general method is inspection software according to testing scheme (specific test point to be tested
The test set constituted) standard and tested device are controlled respectively is exported and measured accordingly, after waiting for a period of time, oneself
It is dynamic to obtain its reading value (standard value and measured value), and bring standard value and measured value into error calculation formula, be calculated by
The error for surveying device, subsequently into the test of next test point, until test terminates.During the test, inspection software is controlled respectively
After standard processed and tested device are exported and measured accordingly, why to wait for a period of time, be because of either standard
Device is still tested the stabilization process that device has an output or measurement, and the reading after only equal output and measurement are all stable could be true
Its practical capacity of the reaction of reality.
But the stabilization time of standard and tested device is often different, it is assumed that the stabilization time of standard is Ts, is tested device
The stabilization time be Tm, currently, general software test way is to take the larger value MAX (Ts, Tm) in Ts and Tm as fixing
Waiting time Tw, but doing so can there are the following problems:
1) Ts of standard and the Tm of tested device can generally change because the content of output or measurement is different, or even meeting
It is different because the original state of output is different, for example source is in output voltage, because the closed loop fundamental quantity being related to only has voltage one
It is a, therefore stablizing the time may be shorter, may be 1 second, but in output power because the closed loop fundamental quantity being related to has voltage, electricity
Three, stream, phase etc., therefore its stable time may be longer, may be 3 seconds.In order to guarantee test all in testing scheme
When point test, standard and tested device can be effectively stable, and Tw can only take a very big value to cover all possible maximum
Stablize the time, such as 20 seconds.
2) if the maximum stable time has taken one to be enough to cover all possible maximum latency, certainly will will cause whole
The time-consuming of a test process increases, and wastes a large amount of testing time in certain test point tests for capableing of fast and stable originally;
But if shortening maximum latency, and it is unstable to will cause certain test points for needing long-time stable, test number is caused
According to insincere, most direct performance is exactly that test data can be sayed without repeatability, and test is repeated several times it is possible that complete different
The test result of sample.
3) in order to save the testing time, when theoretically one corresponding fixed waiting can be set for each test point
Between, but this method is actually undesirable.First, point to be tested can be many in general approach, and common has dozens of, if
Each of workload is respectively set can be very big, and each point be arranged actually it is much suitable, it is also difficult to it is expected, only for often
A point is just known after all trying one time;Second, each equipment (standard and tested device) of different manufacturers different model is for same
One test point can may all have the different stabilization time.
(1) the technical issues of solving
The invention aims to overcome the defect problem of above-mentioned prior art test point detection, providing one kind can be protected
The test point automatic testing method of testing time can be shortened to greatest extent by demonstrate,proving multiple test repeatability again.
(2) technical solution
In order to achieve the above object, the present invention is achieved by the following technical programs:
A kind of test point automatic testing method, includes the following steps:
S1, setting one can cover the maximum latency Tw of all test point stable periods;
One S2, setting acceptable enabled condition C, work as if meeting the condition in test process and can terminate in advance
The test of preceding point is tested into next point, which includes the parameter and requirement of two dimensions:
S2.1, error requirements Ce, i.e., each error being calculated continuously is read in test process should be less than Ce;
S2.2, time requirement Ct, i.e., " single reads the error being calculated and is less than Ce " cannot function as mentioning in test process
Before the necessary and sufficient condition that exits, it is necessary to meet " continuous several times read the error being calculated and are respectively less than Ce within the Ct time " ability
It exits in advance;
S3, test software enter corresponding output or measuring state by Communication Control standard and tested device, then open
Beginning timing;
S4, test software read the standard value of standard and the measured value of tested device simultaneously, and carry out error calculation;If
This error Cn is less than Ce, then starts Ct timing;Ct timing is emptied if this error Cn is not less than Ce;
S5, circulation step S4 exit the survey of current test point if each error is respectively less than Ce within the Ct time in advance
Examination, and record corresponding data and conclusion;If being unsatisfactory for exit criteria in advance always, be recycled to the Tw time reach after force knot
The test of beam current point, and record corresponding data and conclusion;
S6, judge whether all test points test and terminate, S3 is entered step if being not finished, carries out next test point
Test, until the test of all test points terminates.
An embodiment according to the present invention, Tw is the maximum latency of test point stable period, Tw in the step S1
Equal to 20 seconds.
An embodiment according to the present invention, in the step S2 error requirements Ce take tested device calibrated error 1/2 or
1/3。
An embodiment according to the present invention, should ensure that can be continuous within the Ct period for the value of time requirement Ct in the step S2
Carry out 3~5 error calculations.
An embodiment according to the present invention, time requirement Ct takes 3~5 seconds in the step S2.
(3) beneficial effect
Beneficial effects of the present invention:A kind of test point automatic testing method not only can guarantee multiple test repeatability, and
And the testing time can be shortened to greatest extent;By the way that maximum latency Tw and in advance exit criteria Ce and Ct is arranged, it is ensured that
The test data of all test points and the authenticity of conclusion and reliability, have good repeatability, exit in advance meeting
In the case where, the test of current point can be exited in advance, greatly shortens the time-consuming entirely tested, and improve testing efficiency;Effectively keep away
Exempt from current general algorithm and cannot take into account test data and conclusion to carry out the intractable of active balance between confidence level and efficiency
Problem;The parameter for needing to be arranged is few, only Tw, Ce and Ct tri-, can be opened on the basis of empirical value is provided completely to
Family is optimized adjustment by user according to the actual situation;This method has good scalability, not only can effectively solve electrical measurement
It is directed to the detection of table and source in test, is equally applicable to similar satisfaction and error judgment is carried out using standard value and measured value
Other fields and scene.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with
It obtains other drawings based on these drawings.
Fig. 1 is detection method flow chart;
Fig. 2 is fluctuating error curve graph;
Fig. 3 is first fluctuating error curve graph of embodiment;
Fig. 4 is second fluctuating error curve graph of embodiment.
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with the embodiment of the present invention
In attached drawing, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described embodiment is
A part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art
Every other embodiment obtained without creative efforts, shall fall within the protection scope of the present invention.
In conjunction with Fig. 1, a kind of test point automatic testing method includes the following steps:
S1, setting one can cover the maximum latency Tw of all test point stable periods, (for example Tw is equal to 20 seconds);
One S2, setting acceptable enabled condition C, work as if meeting the condition in test process and can terminate in advance
The test of preceding point is tested into next point, which includes the parameter and requirement of two dimensions:
S2.1, error requirements Ce, i.e., each error being calculated continuously is read in test process should be less than Ce (generally
Desirable tested device calibrated error 1/2 or 1/3);
S2.2, time requirement Ct, i.e., " single reads the error being calculated and is less than Ce " cannot function as mentioning in test process
Before the necessary and sufficient condition that exits, it is necessary to meet " continuous several times read the error being calculated and are respectively less than Ce within the Ct time " ability
It exits in advance;(value of Ct should ensure that 3~5 error calculations can be carried out continuously within the Ct period to be relatively advisable, and generally preferably takes 3~5
Second);
S3, test software enter corresponding output or measuring state by Communication Control standard and tested device, then open
Beginning timing;
S4, test software read the standard value of standard and the measured value of tested device simultaneously, and carry out error calculation;If
This error Cn is less than Ce, then starts Ct timing;Ct timing is emptied if this error Cn is not less than Ce;
S5, circulation step S4 exit the survey of current test point if each error is respectively less than Ce within the Ct time in advance
Examination, and record corresponding data and conclusion;If being unsatisfactory for exit criteria in advance always, be recycled to the Tw time reach after force knot
The test of beam current point, and record corresponding data and conclusion;
S6, judge whether all test points test and terminate, S3 is entered step if being not finished, carries out next test point
Test, until the test of all test points terminates.
The present invention sets a theoretically maximum waiting time Tw (such as 20 seconds), but not all test point is all
It waits so long, this time is the greatest limit time of a waiting.In test process, first Communication Control standard
Device and tested device enter corresponding output or measuring state, then start timing, start simultaneously at read standard value and measured value into
Row error calculation continues cycling through reading and calculates if error is unqualified (being unsatisfactory for requiring), if until Tw, entire mistake
It is unqualified always in journey, then terminate the test of current test point, it is believed that tested device is unqualified, and records corresponding data and conclusion;
If discovery error is qualified (meeting the requirements) in the process, the test of current test point is terminated in advance, it is believed that tested device is qualified,
And record corresponding data.In actual treatment, if only the error qualification once read with certain is considered as tested device qualification is
Not all right, because either standard is still tested device, its general data are gradually tended towards stability in wave process, are such as schemed
Shown in 2, for certain single reading conclusion, it is understood that there may be contingency, it is necessary to which continuous repeatedly reading, which is all satisfied requirement, can just sentence
It is set to qualification.
When it is implemented, the sub- condition C e and Ct of two dimensions of Rule of judgment C may be constructed a condition rectangle frame, such as scheme
3, shown in Fig. 4, the height of the condition rectangle frame is acceptable allowable error ± Ce, and width is the multiple mistakes for requiring follow-on test
Difference must all guarantee the time cycle Ct less than ± Ce.
During the test, which is considered as putting down to the right on a timeline with the passage of testing time
It moves, it is just primary to right translation that first-order error is often calculated.The condition to exit in advance is, within the continuous Ct time, owns
Error dot must all be fallen within condition decision block, as shown in figure 3, in the width C t time of condition rectangle frame, having at the t1 moment
3 error dots have been fallen in frame, have fallen in outer frame there are also 5 error dots, i.e., only 3 qualified points have 5 not conform to lattice point, because
This is unsatisfactory for exit criteria in advance, needs to continue cycling through test judgement.
When reaching the t2 moment, as shown in figure 4, all 8 error dots in the width C t time of condition rectangle frame are all fallen in
In frame, the point of outer frame, i.e. t2 moment have not met exit criteria in advance, can exit in advance.If encountering limit feelings
Condition is all unsatisfactory for exit criteria in advance within the Tw time, then the test for terminating current point is forced after reaching the Tw moment, and enter
The test of next test point.
In conjunction with Fig. 3 and Fig. 4, it can quickly and effectively be found using the present invention and meet the acceptable off-test moment, it should
The error information at moment can guarantee will not cause that data reliability is low, poor repeatability due to too early terminate, it is also ensured that
The drawbacks such as the waste of testing time, low efficiency will not be caused due to terminating too late, reach the preferably balance of repeatability and efficiency
Point.
In conclusion the embodiment of the present invention, test point automatic testing method not only can guarantee multiple test repeatability,
And the testing time can be shortened to greatest extent;By the way that maximum latency Tw and in advance exit criteria Ce and Ct is arranged, can protect
The test data of all test points and the authenticity of conclusion and reliability are demonstrate,proved, has good repeatability, is moved back in advance meeting
In the case where out, the test of current point can be exited in advance, greatly shortens the time-consuming entirely tested, and improve testing efficiency;Effectively
The spine that test data and conclusion carry out active balance between confidence level and efficiency cannot be taken into account by avoiding current general algorithm
Hand problem;The parameter for needing to be arranged is few, only Tw, Ce and Ct tri-, can be opened on the basis of empirical value is provided completely to
User is optimized adjustment by user according to the actual situation;This method has good scalability, not only can effectively solve electricity
It is directed to the detection of table and source in test, is equally applicable to similar satisfaction using standard value and measured value and carries out error judgment
Other fields and scene.
The above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations;Although with reference to the foregoing embodiments
Invention is explained in detail, those skilled in the art should understand that:It still can be to aforementioned each implementation
Technical solution documented by example is modified or equivalent replacement of some of the technical features;And these modification or
Replacement, the spirit and scope for technical solution of various embodiments of the present invention that it does not separate the essence of the corresponding technical solution.
Claims (5)
1. a kind of test point automatic testing method, which is characterized in that include the following steps:
S1, setting one can cover the maximum latency Tw of all test point stable periods;
One S2, setting acceptable enabled condition C, if current point can be terminated in advance by meeting the condition in test process
Test, into next point test, the condition include two dimensions parameter and requirement:
S2.1, error requirements Ce, i.e., each error being calculated continuously is read in test process should be less than Ce;
S2.2, time requirement Ct, i.e., " single reads the error being calculated and is less than Ce " cannot function as moving back in advance in test process
Necessary and sufficient condition out, it is necessary to which meeting " continuous several times read the error being calculated and are respectively less than Ce within the Ct time " could shift to an earlier date
It exits;
S3, test software enter corresponding output or measuring state by Communication Control standard and tested device, then start to count
When;
S4, test software read the standard value of standard and the measured value of tested device simultaneously, and carry out error calculation;If this
Error Cn is less than Ce, then starts Ct timing;Ct timing is emptied if this error Cn is not less than Ce;
S5, circulation step S4 exit the test of current test point if each error is respectively less than Ce within the Ct time in advance,
And record corresponding data and conclusion;If being unsatisfactory for exit criteria in advance always, be recycled to the Tw time reach after force to terminate
The test of current point, and record corresponding data and conclusion;
S6, judge whether all test points test and terminate, S3 is entered step if being not finished, carries out the survey of next test point
Examination, until the test of all test points terminates.
2. a kind of test point automatic testing method as described in claim 1, it is characterised in that:Tw is test in the step S1
The maximum latency of stable period is put, Tw is equal to 20 seconds.
3. a kind of test point automatic testing method as claimed in claim 2, which is characterized in that error requirements in the step S2
Ce takes the 1/2 or 1/3 of tested device calibrated error.
4. a kind of test point automatic testing method as claimed in claim 3, which is characterized in that time requirement in the step S2
The value of Ct should ensure that can be carried out continuously 3~5 error calculations within the Ct period.
5. a kind of test point automatic testing method as claimed in claim 4, which is characterized in that time requirement in the step S2
Ct takes 3~5 seconds.
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