CN108845557B - 用软件应用编程接口对自动化测试特征进行用户控制 - Google Patents

用软件应用编程接口对自动化测试特征进行用户控制 Download PDF

Info

Publication number
CN108845557B
CN108845557B CN201810400227.3A CN201810400227A CN108845557B CN 108845557 B CN108845557 B CN 108845557B CN 201810400227 A CN201810400227 A CN 201810400227A CN 108845557 B CN108845557 B CN 108845557B
Authority
CN
China
Prior art keywords
user
test
api
specific
server
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201810400227.3A
Other languages
English (en)
Chinese (zh)
Other versions
CN108845557A (zh
Inventor
罗特姆·纳胡姆
帕德马贾·奈鲁利
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of CN108845557A publication Critical patent/CN108845557A/zh
Application granted granted Critical
Publication of CN108845557B publication Critical patent/CN108845557B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56016—Apparatus features
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24065—Real time diagnostics
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Automation & Control Theory (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Stored Programmes (AREA)
CN201810400227.3A 2017-04-28 2018-04-28 用软件应用编程接口对自动化测试特征进行用户控制 Active CN108845557B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/582,285 US10592370B2 (en) 2017-04-28 2017-04-28 User control of automated test features with software application programming interface (API)
US15/582,285 2017-04-28

Publications (2)

Publication Number Publication Date
CN108845557A CN108845557A (zh) 2018-11-20
CN108845557B true CN108845557B (zh) 2023-08-08

Family

ID=63917218

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810400227.3A Active CN108845557B (zh) 2017-04-28 2018-04-28 用软件应用编程接口对自动化测试特征进行用户控制

Country Status (5)

Country Link
US (1) US10592370B2 (enExample)
JP (1) JP6761441B2 (enExample)
KR (1) KR102430283B1 (enExample)
CN (1) CN108845557B (enExample)
TW (1) TWI761495B (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12487286B2 (en) 2018-05-16 2025-12-02 Advantest Corporation Diagnostic tool for traffic capture with known signature database
KR102856263B1 (ko) * 2020-02-25 2025-09-05 에스케이하이닉스 주식회사 테스트 시스템 및 그의 구동 방법
TWI773140B (zh) * 2020-03-05 2022-08-01 日商愛德萬測試股份有限公司 用於流量捕獲及除錯工具之圖形使用者介面
US12475024B2 (en) * 2020-04-21 2025-11-18 UiPath, Inc. Test automation for robotic process automation
US11797432B2 (en) 2020-04-21 2023-10-24 UiPath, Inc. Test automation for robotic process automation
CN111694733A (zh) * 2020-05-22 2020-09-22 五八有限公司 一种软件开发工具包sdk的api测试方法以及测试装置
CN115698735A (zh) * 2020-08-04 2023-02-03 爱德万测试公司 使用附加信令测试被测试器件的自动测试设备、分选机和方法
CN112819605A (zh) * 2021-01-29 2021-05-18 山东浪潮通软信息科技有限公司 资金结算业务测试方法、装置及计算机可读介质
CN114911653B (zh) * 2021-02-09 2025-11-04 浙江宇视科技有限公司 一种接口检测方法、装置、电子设备、系统及介质
CN112925509A (zh) * 2021-02-25 2021-06-08 苏州艾方芯动自动化设备有限公司 集成电路测试分选机的通用型硬件相关程序库的架构系统
US20230027880A1 (en) * 2021-07-22 2023-01-26 Infor (Us), Llc Techniques for automated testing of application programming interfaces
CN115187025A (zh) * 2022-06-29 2022-10-14 南京鼎华智能系统有限公司 制造软件塑模系统及其方法
CN115113981B (zh) * 2022-07-11 2025-12-16 苏州忆联信息系统有限公司 启动多个仿真环境验证dut的方法及相关设备
CN116913361B (zh) * 2023-06-08 2024-05-07 深圳市晶存科技有限公司 硬盘自动测试方法、系统及介质
JP2025001923A (ja) 2023-06-21 2025-01-09 キオクシア株式会社 システム
TWI900102B (zh) * 2023-07-31 2025-10-01 旺矽科技股份有限公司 基於節點流程的自動化設備客製化功能開發系統、運作方法、檢測系統與非暫態電腦可讀取儲存媒體
TWI885795B (zh) * 2024-03-12 2025-06-01 廣達電腦股份有限公司 自動化測試系統
WO2025196789A1 (en) * 2024-03-21 2025-09-25 Jio Platforms Limited System and method for performing a plurality of tests on a set top box (stb) device

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101247292A (zh) * 2008-02-22 2008-08-20 中兴通讯股份有限公司 基于通用测试仪表应用编程接口的测试设备及测试方法
TW200943118A (en) * 2007-12-19 2009-10-16 Formfactor Inc Method and apparatus for managing test result data generated by a semiconductor test system
CN102306122A (zh) * 2011-09-14 2012-01-04 北京星网锐捷网络技术有限公司 自动化测试方法及设备
CN102590730A (zh) * 2012-01-16 2012-07-18 中冶南方（武汉）自动化有限公司 模块化开放性pcba功能测试平台、测试系统及方法
JP2014048125A (ja) * 2012-08-30 2014-03-17 Advantest Corp テストプログラムおよび試験システム
CN105092992A (zh) * 2014-04-15 2015-11-25 爱德万测试公司 用于在ate上进行向量控制的测试的方法和设备
CN105144114A (zh) * 2013-02-21 2015-12-09 爱德万测试公司 Fpga块具有混合协议引擎的测试器
CN105378493A (zh) * 2013-02-21 2016-03-02 爱德万测试公司 用于支持协议无关器件测试系统中协议重新配置的基于云的基础设施

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5910895A (en) 1997-06-13 1999-06-08 Teradyne, Inc. Low cost, easy to use automatic test system software
US6681351B1 (en) * 1999-10-12 2004-01-20 Teradyne, Inc. Easy to program automatic test equipment
CA2321346A1 (en) 2000-09-28 2002-03-28 Stephen K. Sunter Method, system and program product for testing and/or diagnosing circuits using embedded test controller access data
TWI344595B (en) 2003-02-14 2011-07-01 Advantest Corp Method and structure to develop a test program for semiconductor integrated circuits
US7519827B2 (en) * 2004-04-06 2009-04-14 Verigy (Singapore) Pte. Ltd. Provisioning and use of security tokens to enable automated test equipment
US7823128B2 (en) * 2004-04-19 2010-10-26 Verigy (Singapore) Pte. Ltd. Apparatus, system and/or method for combining multiple tests to a single test in a multiple independent port test environment
US7197416B2 (en) * 2004-05-22 2007-03-27 Advantest America R&D Center, Inc. Supporting calibration and diagnostics in an open architecture test system
US7210087B2 (en) 2004-05-22 2007-04-24 Advantest America R&D Center, Inc. Method and system for simulating a modular test system
US7852094B2 (en) 2006-12-06 2010-12-14 Formfactor, Inc. Sharing resources in a system for testing semiconductor devices
US7640132B2 (en) * 2007-04-23 2009-12-29 Advantest Corporation Recording medium and test apparatus
JP2008299397A (ja) * 2007-05-29 2008-12-11 Yokogawa Electric Corp テストプログラム開発装置
US20090224793A1 (en) * 2008-03-07 2009-09-10 Formfactor, Inc. Method And Apparatus For Designing A Custom Test System
US8078424B2 (en) 2008-09-29 2011-12-13 Advantest Corporation Test apparatus
US8677198B2 (en) 2009-03-04 2014-03-18 Alcatel Lucent Method and apparatus for system testing using multiple processors
US10118200B2 (en) * 2009-07-06 2018-11-06 Optimal Plus Ltd System and method for binning at final test
US9164859B2 (en) * 2009-09-25 2015-10-20 Qualcomm Incorporated Computing device for enabling concurrent testing
US8127187B2 (en) 2009-09-30 2012-02-28 Integrated Device Technology, Inc. Method and apparatus of ATE IC scan test using FPGA-based system
US20110288808A1 (en) * 2010-05-20 2011-11-24 International Business Machines Corporation Optimal test flow scheduling within automated test equipment for minimized mean time to detect failure
US9514016B2 (en) 2011-02-01 2016-12-06 Echostar Technologies L.L.C. Apparatus systems and methods for facilitating testing of a plurality of electronic devices
US9203617B2 (en) * 2011-08-17 2015-12-01 Vixs Systems, Inc. Secure provisioning of integrated circuits at various states of deployment, methods thereof
US9069719B2 (en) * 2012-02-11 2015-06-30 Samsung Electronics Co., Ltd. Method and system for providing a smart memory architecture
US10371744B2 (en) * 2012-04-11 2019-08-06 Advantest Corporation Method and apparatus for an efficient framework for testcell development
CN102929595A (zh) * 2012-09-20 2013-02-13 腾讯科技（深圳）有限公司 一种实现动作指令的方法及装置
US9053238B2 (en) * 2013-01-25 2015-06-09 International Business Machines Corporation Tool-independent automated testing of software
US10161993B2 (en) * 2013-02-21 2018-12-25 Advantest Corporation Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA block
US20140237292A1 (en) * 2013-02-21 2014-08-21 Advantest Corporation Gui implementations on central controller computer system for supporting protocol independent device testing
US9810729B2 (en) * 2013-02-28 2017-11-07 Advantest Corporation Tester with acceleration for packet building within a FPGA block
KR102030385B1 (ko) * 2013-03-07 2019-10-10 삼성전자주식회사 자동 테스트 장비 및 그 제어방법
WO2015018455A1 (en) * 2013-08-09 2015-02-12 Advantest (Singapore) Pte. Ltd. Automated test equipment, instruction provider for providing a sequence of instructions, method for providing a signal to a device under test, method for providing a sequence of instructions and test system
US10156611B2 (en) * 2013-09-12 2018-12-18 Teradyne, Inc. Executing code on a test instrument in response to an event
JP6581097B2 (ja) * 2014-01-10 2019-09-25 チャンベッラ・リミテッド 自動デバイスプログラム生成のための方法および装置
DE102017117322A1 (de) * 2017-07-31 2019-01-31 Infineon Technologies Ag Verfahren zur Herstellung eines Halbleiterbauelementes mittels computergestütztem Entwurf von Testszenarien

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200943118A (en) * 2007-12-19 2009-10-16 Formfactor Inc Method and apparatus for managing test result data generated by a semiconductor test system
CN101247292A (zh) * 2008-02-22 2008-08-20 中兴通讯股份有限公司 基于通用测试仪表应用编程接口的测试设备及测试方法
CN102306122A (zh) * 2011-09-14 2012-01-04 北京星网锐捷网络技术有限公司 自动化测试方法及设备
CN102590730A (zh) * 2012-01-16 2012-07-18 中冶南方（武汉）自动化有限公司 模块化开放性pcba功能测试平台、测试系统及方法
JP2014048125A (ja) * 2012-08-30 2014-03-17 Advantest Corp テストプログラムおよび試験システム
CN105144114A (zh) * 2013-02-21 2015-12-09 爱德万测试公司 Fpga块具有混合协议引擎的测试器
CN105378493A (zh) * 2013-02-21 2016-03-02 爱德万测试公司 用于支持协议无关器件测试系统中协议重新配置的基于云的基础设施
CN105092992A (zh) * 2014-04-15 2015-11-25 爱德万测试公司 用于在ate上进行向量控制的测试的方法和设备

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
机载设备自动测试系统通用开发平台;孙宝江;秦红磊;李洁;沈士团;;北京航空航天大学学报(03);全文 *

Also Published As

Publication number Publication date
TW201843589A (zh) 2018-12-16
US10592370B2 (en) 2020-03-17
US20180314613A1 (en) 2018-11-01
KR102430283B1 (ko) 2022-08-05
JP6761441B2 (ja) 2020-09-23
JP2018189641A (ja) 2018-11-29
TWI761495B (zh) 2022-04-21
KR20180121410A (ko) 2018-11-07
CN108845557A (zh) 2018-11-20

Similar Documents

Publication Publication Date Title
CN108845557B (zh) 用软件应用编程接口对自动化测试特征进行用户控制
CN105378493B (zh) 用于支持协议无关器件测试系统中协议重新配置的基于云的基础设施
JP6748671B2 (ja) テストプログラムフロー制御
US20140237292A1 (en) Gui implementations on central controller computer system for supporting protocol independent device testing
KR102479320B1 (ko) 상이한 애플리케이션을 사용하는 복수의 사용자를 지원하기 위한 시험 시스템
US11828787B2 (en) Eye diagram capture test during production
US10126362B2 (en) Controlling a test run on a device under test without controlling the test equipment testing the device under test
CN115774662A (zh) 一种业务流程测试方法、装置、设备及存储介质
CN120123156A (zh) 面向指令集的自动化芯片验证方法、装置、终端、介质及产品
CN112527312A (zh) 一种嵌入式系统的测试方法和测试装置
TWI773140B (zh) 用於流量捕獲及除錯工具之圖形使用者介面
KR102253549B1 (ko) 오류 정형화를 이용한 발사통제기 자동 점검 방법 및 그 장치
CN120407024B (zh) 一种指令序列的验证方法、装置、电子设备和存储介质
US20070201372A1 (en) Automated Switching For Executing Tests Involving Electronic Devices
CN121580942A (zh) 一种项目状态汇总方法和装置
CN120779205A (zh) 一种芯片检测装置和方法
CA2291396A1 (en) Assembly and testing tracking system

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
TG01 Patent term adjustment

Free format text: NEW EXPIRY DATE: 20380604

TG01 Patent term adjustment