CN108844920B - V prism refractive index group test method based on reticle angle scribing line grading - Google Patents
V prism refractive index group test method based on reticle angle scribing line grading Download PDFInfo
- Publication number
- CN108844920B CN108844920B CN201810523419.3A CN201810523419A CN108844920B CN 108844920 B CN108844920 B CN 108844920B CN 201810523419 A CN201810523419 A CN 201810523419A CN 108844920 B CN108844920 B CN 108844920B
- Authority
- CN
- China
- Prior art keywords
- refractive index
- prism
- reticle
- grading
- angle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/4133—Refractometers, e.g. differential
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/04—Batch operation; multisample devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06166—Line selective sources
- G01N2201/0618—Halogene sources
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0638—Refractive parts
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention provides a V prism refractive index group test method based on reticle angle reticle grading, which comprises the following steps: 1) calculating the refractive index batch range delta n by adopting a calculation formula of a refractive index V prism test and through differential operation on the relation between the refractive index and the refraction angle, wherein the refractive index batch range delta n corresponds to the refraction angle change delta theta; 2) calculating the displacement Deltay of the refraction angle change Deltatheta on the focal plane of the collimator; 3) grading and scribing lines on the reticle according to the batch grading with different refractive indexes and the corresponding delta y, and converting the batch grading of the refractive indexes into angle scribing line grading of the reticle; 4) and carrying out the angle scribing line grading test of the reticle, thereby realizing the batch grading test of the refractive index. According to the refractive index batch range requirement and the focal length parameter of the collimator, the angle distance between the reticles is calculated, the reticles are graded, and the number of the reticles is determined according to the refractive index batch grade, so that the refractive index batch high-precision rapid test is realized, and the refractive index batch is rapid, accurate and visual.
Description
Technical Field
The invention relates to a method for testing the refractive index of optical glass, in particular to a V prism refractive index group test method based on angle reticle grading of a reticle.
Background
The glass refractive index batch is characterized in that the glass product batch generally takes central data A as a base point, the data is available in a certain range above and below the base point A and is divided into a plurality of grades, and the refractive index range △ n of each grade of product is less than or equal to 10 × 10-5The current general refractive index testing method comprises a V prism method for testing by adopting a V prism refractometer and a minimum deviation angle method for testing by adopting a precision goniometer, wherein the V prism method is simple and convenient to prepare samples and short in testing time, but the testing precision of the V prism refractometer is slightly low (plus or minus 5 × 10)-5) The method is suitable for rapid test of mass production samples; minimum sizeThe deflection angle method has long sample preparation process time and long test time, but the precision goniometer has higher test precision (+/-0.3-1 × 10)-5) And the method is more suitable for high-precision testing of a small amount of samples.
Under the condition that the batch test requirement is fast and accurate, the V prism method and the minimum deviation angle method are difficult to simultaneously realize the fast and accurate test requirement.
Disclosure of Invention
The invention aims to solve the technical problem of providing a rapid, accurate and visual batch test method for the refractive index of optical glass.
The technical scheme adopted by the invention for solving the technical problem is as follows: the V prism refractive index batch test method based on reticle angle scribing grading comprises the following steps:
1) calculating the refractive index batch range delta n by adopting a calculation formula of a refractive index V prism test and through differential operation on the relation between the refractive index and the refraction angle, wherein the refractive index batch range delta n corresponds to the refraction angle change delta theta;
2) then, the displacement delta y of the refraction angle change delta theta on the focal plane of the collimator is solved;
3) grading and scribing lines on the reticle according to the batch grading with different refractive indexes and the corresponding delta y, and converting the batch grading of the refractive indexes into angle scribing line grading of the reticle;
4) and carrying out the angle scribing line grading test of the reticle, thereby realizing the batch grading test of the refractive index.
Further, the refractive index V prism test in the step 1) adopts a V prism transmission method,
the refractive index calculation formula is as follows:the relation between the refractive index and the refraction angle is differentiated to obtain:
further, let n and n0When equal, θ is equal to 0, i.e. △ θ is equal to 2 △ n, and △ n is equal to 10 × 10-5Calculating and converting △ theta results into anglesThe unit of "second" is △ θ ═ 42 ".
Further, the refractive index V prism test in the step 1) adopts a V prism reflection method, and the refractive index calculation formula is as follows:the relation between the refractive index and the refraction angle is differentiated to obtain:
further, let n and n0When equal, θ equals 0, i.e. △ θ equals 4 △ n, then △ n equals 10 × 10-5And (4) calculating, and converting the △ theta result into an angle ' second ' unit, namely △ theta-84 '.
Further, the calculation relation of the displacement Δ y of the refraction angle change Δ θ in the focal plane of the collimator in the step 2) is as follows: and delta y is f ', tan delta theta, f' is the focal length of the emergent collimator objective, and theta is calculated by a radian value.
Further, in the step 3), under the condition that the collimator has the same focal length, the distance between the angle lines on the reticle by adopting a V prism reflection method is 2 times that of a V prism transmission method.
Furthermore, the angle displacement deltay of each step delta n of the refractive index in the step 3) on the reticle is the same, according to the difference of the refractive index values corresponding to the refraction angles of all steps, equally-spaced angle step interval ruling is carried out on the corresponding positions of the collimator focal plane reticle, and every two angle step ruling lines correspond to a refractive index group step.
The invention has the beneficial effects that: and calculating the angle distance between the reticles according to the refractive index batch range requirement and the focal length parameter of the collimator of the testing instrument, scribing and grading, wherein the number of the scribed lines is determined according to the refractive index batch grade, so that the refractive index batch high-precision rapid test is realized, and the refractive index batch becomes rapid, accurate and visual.
Drawings
Fig. 1 is a schematic diagram of the V-prism transmission method operation.
Fig. 2 is a schematic diagram of the operation of the V-prism reflection method.
FIG. 3 is a schematic diagram of an autocollimator measurement of an embodiment of the invention.
FIG. 4 is a schematic view of reticle processing according to an embodiment.
Fig. 5 is a top view of fig. 4.
Detailed Description
The invention uses the calculation formula of the refractive index V prism test principle, and calculates the refractive index group range Deltan corresponding to the refractive angle change Deltatheta through the differential operation of the relation between the refractive index and the refractive angle, and then calculates the displacement Deltay of the refractive index change Deltatheta on the focal plane of the collimator, the focal plane of the collimator is the position of the reticle, and then graduates on the reticle according to the group grading with different refractive indexes and the Deltay corresponding to the group grading, and converts the group grading of the refractive index into the angle scribing grading of the reticle, so that the refractive index group grading test is intuitively changed into the angle scribing grading test of the reticle.
The following is a concrete expression of a refractive index calculation formula of a V prism transmission method and a reflection method, a refractive index and refraction angle relation differential, a refraction angle change delta theta and a displacement delta y relation on a focal plane of a collimator.
(1) V prism transmission method
As shown in figure 1, the spectrum lamp illuminates a focal plane reference reticle of an incident light collimator, parallel light is formed through an objective lens, the parallel light penetrates through a V-prism, a test sample is refracted, and then an image is formed on a focal plane of an emergent light collimator, wherein the V-prism and the test sample have the same mark. The collimator can be adjusted in lifting, pitching and horizontal swinging, and the focal plane position of the emergent collimator can be adjusted in the direction of displacement delta y.
the refractive index and refraction angle relationship is differentiated for equation (1):
as can be seen from formula (2), when △ n is 10 × 10 n-5When n and n are equal0If the angle θ is equal to 0, that is, △ θ is 2 △ n (radian value), the calculated value is substituted into △ n, and the △ θ result is converted into an angle unit of "second", that is, △ θ is 42 ", light is transmitted through the V prism and enters the emergent light collimator, and the calculated relationship of the displacement △ y of the refraction angle △ θ on the focal plane is as follows:
△y=f′·tan△θ=f′·△θ, (3)
wherein f' is the focal length of the emergent light collimator objective, and theta is calculated by using the radian value.
Therefore, the calculated position of each delta y can be scribed on the emergent light collimator reticle according to different grades divided by the refractive index n.
(2) V-prism reflection method
As shown in fig. 2, the spectrum lamp illuminates the reference reticle on the focal plane of the autocollimator, parallel light is formed by the objective lens, the parallel light penetrates through the V prism, the test sample is refracted and then reflected on the back parallel plane of the V prism, the V prism and the test sample have the same mark, the light passes through the V prism and the test sample again, finally exits on the front parallel plane of the V prism, and images are formed on the focal plane of the autocollimator. The collimator can be adjusted in elevation, pitching and horizontal swinging, and the focal plane position of the collimator can be adjusted in the direction of displacement delta y.
differentiating the relationship between the refractive index and the refraction angle with respect to equation (4):
as can be seen from equation (5), when △ n is 10 × 10 n-5When n and n are equal0If the angle θ is equal to 0, that is, △ θ is 4 △ n (radian value), the calculated value is substituted into △ n, the △ θ result is converted into an angle "second" unit, that is, △ θ is 84 ", the light is reflected by the V-prism and enters the collimator, and the calculated relationship of the displacement △ y of the refraction angle △ θ on the focal plane is as follows:
△y=f′·tan△θ=f′·△θ, (3)
wherein f' is the focal length of the collimator objective lens, and theta is calculated by the radian value.
Thus, each calculated Δ y position can be scribed on the autocollimator collimator reticle in different classes for the index of refraction n.
From the above, the refraction angle θ of the V-prism reflection method is 2 times that of the V-prism transmission method, so that the distance between the angle lines on the reticle by the reflection method is 2 times that of the transmission method under the same focal length condition of the collimator.
The angle displacement delta y of each angle position delta n of the refractive index on the reticle is the same, according to the difference of the refractive index values corresponding to all the angle positions, equal-interval delta y angle position interval ruling is carried out on the corresponding position of the collimator focal plane reticle, and each two angle position ruling lines correspond to one refractive index batch position.
Example (b): testing by V-prism reflection method
Taking H-QF glass as an example, dividing nd into 6 batches, wherein each batch has 10 units (△ n is less than or equal to 10 × 10)-5) The method comprises the following steps:
the refraction index grading batch test is carried out on the glass by adopting an autocollimator and a V prism reflection method.
According to the glass test data, selecting the same-grade glass to process a reflective V prism and a refractive index standard sample; designing and processing angle grading scribed lines of the reticle in the refraction rate group according to the relation among the refraction angle, the refraction index, the focal length parameter of the autocollimator and the image displacement on the reticle; and finally, carrying out effect verification.
The autocollimator model adopts Nikon 6D, and the measurement schematic diagram is shown in FIG. 3.
After passing through the cross line S, an optical signal emitted by the light source is partially reflected to an optical axis by a semi-reflecting layer in a semi-transparent semi-reflecting prism in the autocollimator, then the optical signal passes through the objective lens to become parallel light and reaches a reflector M which is arranged in front of the objective lens at a certain distance, the light beam is reflected by the surface of the reflector, passes through the objective lens again and further passes through the semi-reflecting layer in the semi-transparent semi-reflecting prism, and an image S1 of the cross line is formed on the reticle. If the mirror is tilted from position a to position B by an angle of tilt θ, the reflected beam will tilt by 2 θ, which will re-enter the objective lens, causing a reticle image shift y. The above relationship is expressed by the following formula:
y=f′·tan 2θ=2·f′·θ
f' is the focal length of the objective lens
1) V-prism and standard material selection
Considering that the field of view of a Nikon 6D autocollimator reticle is only 60', the V prism material needs to be selected and processed with the same mark as the tested sample, and according to a plurality of testing data and batch requirements of H-QF14, the material with nd being 1.59541 is selected to process the reflective V prism and the standard sample.
2) Sample stage processing
The refraction angle of the light reflected by the sample needs to be quantitatively tested, and the position of the reflection type V prism needs to be fixed except for the requirement that the position of a light pipe of the autocollimator needs to be fixed, so that a sample table which is easy to clamp and fix the V prism is designed and processed.
3) Determining a light source
In the case that the dispersion consistency of the glass material cannot be ensured, direct measurement of the d-ray refraction angle of the spectrum is the most effective method, so a helium lamp is used as a test light source.
4) Reticle angle stepping line spacing calculation
The focal length parameter f 'of the Nikon 6D autocollimator objective is 700mm, according to the relation formula of the focal length f' of the lens, the included angle theta between the reflected light and the optical axis and the image displacement y of the reticleThe angular pitch y is calculated on the reticle, where θ ═ 84 ″ is used to calculate a pitch of 0.27 mm.
5) Reticle processing
As shown in FIG. 4 and FIG. 5, the outline dimension phi of the reticle is determined to be 12X 1mm according to the aperture diaphragm of the ocular lens of the autocollimator, the graduation line is 0.007mm thick and 2mm long, and the reticle is symmetrically scribed in the vertical diameter direction. A line is scribed every 80 "corresponding to the angular interval, for a total of six segments of seven lines, each segment being parallel, the lines being 0.007mm thick, and the segments being marked with A, B, C, D, E, F letters in the middle.
6) Testing
Placing a sample (nd is 1.59541) which is calibrated and selected by an angle measuring instrument in advance into a V prism, and debugging an autocollimator pitching and micrometer according to sample data to enable a reflected image (light parallel to a reticle angle line) to be aligned with the line of the affiliated gear, namely: and (3) aligning the standard sample reflection line with nd being 1.59541 to the lower limit line of the D grade data, screwing the knob, fixing the positions of the autocollimator light tube and the light source helium lamp, starting the test, putting the measured sample into the V prism, and judging the refractive index range according to the positions of the reflection image light rays in the six segments of scribed lines, so that the visual, accurate and quick effect can be presented.
7) Data validation
After the autocollimator testing device is adjusted, another sample with 1.59549 calibration data of the goniometer is used for verification, the position of a reflected image is close to the upper limit line of class D, and the index grouping is intuitively and quickly judged by a reticle angle scribing line grading method to meet the pre-design requirement.
Claims (5)
1. The V prism refractive index batch testing method based on reticle angle scribing grading is characterized by comprising the following steps of:
1) calculating the corresponding refraction angle change △ theta of the refraction index batch range △ n by adopting a calculation formula of a refraction index V prism test and performing differential operation on the relation between the refraction index and the refraction angle, wherein the refraction index V prism test adopts a V prism transmission method, and the calculation formula of the refraction index is as follows:the relation between the refractive index and the refraction angle is differentiated to obtain:or the refractive index V prism test adopts a V prism reflectionThe refractive index calculation formula of the radiation method is as follows:the relation between the refractive index and the refraction angle is differentiated to obtain:
2) calculating the displacement Deltay of the refraction angle change Deltatheta on the focal plane of the collimator, wherein the calculation relation of the displacement Deltay of the refraction angle change Deltatheta on the focal plane of the collimator is as follows: f ', tan delta theta, f ', delta theta, wherein f ' is the focal length of the emergent collimator objective, and theta is calculated by a radian value;
3) grading and scribing lines on the reticle according to the batch grading with different refractive indexes and the corresponding delta y, and converting the batch grading of the refractive indexes into angle scribing line grading of the reticle;
4) and carrying out the angle scribing line grading test of the reticle, thereby realizing the batch grading test of the refractive index.
2. The reticle angle reticle-binning-based V-prism refractive index batch test of claim 1 wherein n and n are such that when the refractive index V-prism test uses V-prism transmission, n and n0When equal, θ is equal to 0, i.e. △ θ is equal to 2 △ n, and △ n is equal to 10 × 10-5And (5) calculating, and converting the △ theta result into an angle ' second ' unit, namely △ theta-42 '.
3. The method of claim 1, wherein n and n are measured using a V-prism reflectometry technique when the index V-prism test is performed using a V-prism reflectometry technique0When equal, θ equals 0, i.e. △ θ equals 4 △ n, then △ n equals 10 × 10-5And (4) calculating, and converting the △ theta result into an angle ' second ' unit, namely △ theta-84 '.
4. The batch test method for refractive index of V-prism based on reticle angular line grading of claim 1, wherein step 3) uses V-prism reflection method to have an angular line spacing on the reticle 2 times that of V-prism transmission method under the condition of the collimator having the same focal length.
5. The V-prism refractive index lot test method based on reticle angle reticle grading of claim 1, wherein in the step 3), each index step Δ n is the same as the angular displacement Δ y on the reticle, according to the difference of refractive index values corresponding to different refraction angles of each step, equally spaced angular step intervals are scribed at corresponding positions of the collimator focal plane reticle, and each two angular step reticles correspond to one refractive index lot step.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810523419.3A CN108844920B (en) | 2018-05-28 | 2018-05-28 | V prism refractive index group test method based on reticle angle scribing line grading |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810523419.3A CN108844920B (en) | 2018-05-28 | 2018-05-28 | V prism refractive index group test method based on reticle angle scribing line grading |
Publications (2)
Publication Number | Publication Date |
---|---|
CN108844920A CN108844920A (en) | 2018-11-20 |
CN108844920B true CN108844920B (en) | 2020-09-22 |
Family
ID=64207899
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810523419.3A Active CN108844920B (en) | 2018-05-28 | 2018-05-28 | V prism refractive index group test method based on reticle angle scribing line grading |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN108844920B (en) |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1060358A (en) * | 1990-09-26 | 1992-04-15 | 中国科学院上海光学精密机械研究所 | Atomatic v-prism refractometer |
CN2605569Y (en) * | 2003-03-14 | 2004-03-03 | 成都光明光电信息材料有限公司 | Semi automatic V prismatic refractometer |
CN1731148A (en) * | 2004-11-02 | 2006-02-08 | 中国科学院长春光学精密机械与物理研究所 | A kind of high-precision measuring method of optical glass refractive index |
JP2006170775A (en) * | 2004-12-15 | 2006-06-29 | Canon Inc | Method of measuring refractive index and its measuring device |
CN103808693A (en) * | 2014-02-28 | 2014-05-21 | 陕西师范大学 | Experimental device and experimental method for measuring refractive index of flat transparent medium |
CN106152960A (en) * | 2016-08-25 | 2016-11-23 | 吉林大学 | A kind of spectrometer with removable collimator |
CN106370625A (en) * | 2016-11-10 | 2017-02-01 | 长春理工大学 | V-prism refractometer based on autocollimation and CCD (Charge Coupled Device) visual technology |
CN206387944U (en) * | 2016-11-09 | 2017-08-08 | 长春理工大学 | The V-groove self-calibrating device of V-prism refractometer |
CN207180993U (en) * | 2017-08-11 | 2018-04-03 | 利达光电股份有限公司 | A kind of automatic stepping detection means of Refractive Index of Glass Prism |
CN107991826A (en) * | 2017-12-13 | 2018-05-04 | 西南石油大学 | A kind of device for optical system dispersion compensation and preparation method thereof |
-
2018
- 2018-05-28 CN CN201810523419.3A patent/CN108844920B/en active Active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1060358A (en) * | 1990-09-26 | 1992-04-15 | 中国科学院上海光学精密机械研究所 | Atomatic v-prism refractometer |
CN2605569Y (en) * | 2003-03-14 | 2004-03-03 | 成都光明光电信息材料有限公司 | Semi automatic V prismatic refractometer |
CN1731148A (en) * | 2004-11-02 | 2006-02-08 | 中国科学院长春光学精密机械与物理研究所 | A kind of high-precision measuring method of optical glass refractive index |
JP2006170775A (en) * | 2004-12-15 | 2006-06-29 | Canon Inc | Method of measuring refractive index and its measuring device |
CN103808693A (en) * | 2014-02-28 | 2014-05-21 | 陕西师范大学 | Experimental device and experimental method for measuring refractive index of flat transparent medium |
CN106152960A (en) * | 2016-08-25 | 2016-11-23 | 吉林大学 | A kind of spectrometer with removable collimator |
CN206387944U (en) * | 2016-11-09 | 2017-08-08 | 长春理工大学 | The V-groove self-calibrating device of V-prism refractometer |
CN106370625A (en) * | 2016-11-10 | 2017-02-01 | 长春理工大学 | V-prism refractometer based on autocollimation and CCD (Charge Coupled Device) visual technology |
CN207180993U (en) * | 2017-08-11 | 2018-04-03 | 利达光电股份有限公司 | A kind of automatic stepping detection means of Refractive Index of Glass Prism |
CN107991826A (en) * | 2017-12-13 | 2018-05-04 | 西南石油大学 | A kind of device for optical system dispersion compensation and preparation method thereof |
Non-Patent Citations (4)
Title |
---|
Refractive index dispersion measurement on nonlinear optical polymer using V-prism refractometer;Wei Shi等;《Optics and Lasers in Engineering》;19990924;第41-47页 * |
最小偏向角法V 棱镜法测量折射率的原理公式误差;王文生等;《长春光学精密机械学院学报》;19950131;第5-9页 * |
空气对V 棱镜测量玻璃折射率的影响研究;段丁槊;《科技风》;20171130;第203页 * |
高折射率V 棱镜测试补偿方法研究;吴德林等;《光电工程》;20150131;第20-24页 * |
Also Published As
Publication number | Publication date |
---|---|
CN108844920A (en) | 2018-11-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Pérot et al. | On the application of interference phenomena to the solution of various problems of spectroscopy and metrology | |
US4275964A (en) | Apparatus and method for determining the refractive characteristics of a test lens | |
CN103267743A (en) | Measuring refractive index device and method thereof | |
TW200528698A (en) | Eccentricity measuring method and eccentricity measuring apparatus | |
JP5896792B2 (en) | Aspherical surface measuring method, aspherical surface measuring device, and optical element processing device | |
JP6000577B2 (en) | Aspherical surface measuring method, aspherical surface measuring device, optical element processing apparatus, and optical element manufacturing method | |
CN103105607A (en) | Verification system and verification method for hand type laser distance measuring instrument | |
CN209961611U (en) | Measuring device based on ruler reading telescope and optical lever | |
CN108844920B (en) | V prism refractive index group test method based on reticle angle scribing line grading | |
CN203259473U (en) | Refractivity measuring device | |
CN206146834U (en) | V V -prism refractometer based on auto -collimation and CCD vision technique | |
CN106767471A (en) | Optical interval measurement system and method in a kind of Aspherical-surface testing light path | |
CN103884684A (en) | Optical system of high-accuracy digital V-prism refractometer | |
CN212989163U (en) | Device for measuring refractive index of transparent flat medium | |
CN203772739U (en) | Optical system of high-precision digital V-prism refractometer | |
CN112285059A (en) | Device for measuring liquid refractive index based on CCD method | |
US3508832A (en) | Angle generating system | |
CN108106560B (en) | Method and device for measuring large radius of curvature of optical element by comparison method | |
CN207936924U (en) | The comparative method for measuring device of optical element larger radius of curvature | |
CN201233246Y (en) | Collimator optical wedge micrometer | |
CN217332162U (en) | Device for measuring liquid refractive index by using linear array CCD | |
US3375754A (en) | Lens testing autocollimator | |
US1524089A (en) | Measuring device | |
Fowler et al. | Varifocal spectacle lens surface power measurement | |
CN104501722B (en) | Aspheric optical fiber filament measuring method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |