CN108829963A - The extracting method of twisted pair parasitic capacitance and conductance in external conductive casing - Google Patents

The extracting method of twisted pair parasitic capacitance and conductance in external conductive casing Download PDF

Info

Publication number
CN108829963A
CN108829963A CN201810566383.7A CN201810566383A CN108829963A CN 108829963 A CN108829963 A CN 108829963A CN 201810566383 A CN201810566383 A CN 201810566383A CN 108829963 A CN108829963 A CN 108829963A
Authority
CN
China
Prior art keywords
matrix
unit length
free space
inductance
twisted pair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201810566383.7A
Other languages
Chinese (zh)
Other versions
CN108829963B (en
Inventor
孙亚秀
王建丽
钱军竹
林蒙
张铭
宋文良
梁非
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Harbin Engineering University
Original Assignee
Harbin Engineering University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Harbin Engineering University filed Critical Harbin Engineering University
Priority to CN201810566383.7A priority Critical patent/CN108829963B/en
Publication of CN108829963A publication Critical patent/CN108829963A/en
Application granted granted Critical
Publication of CN108829963B publication Critical patent/CN108829963B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/36Circuit design at the analogue level
    • G06F30/367Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Communication Cables (AREA)
  • Coils Or Transformers For Communication (AREA)

Abstract

The extracting method of twisted pair parasitic capacitance and conductance is related to parasitic parameter extraction field in transmission line crosstalk prediction and elimination in external conductive casing, specifically relates to the extracting method of twisted pair parasitic capacitance and conductance in external conductive casing.Include the following steps:S1 show that cross section single line changes to twisted pair central axis spacing h, and then obtain conducting wire to external conductive casing distance d by establishing twisted pair approximate period alternate transport modeliChange;S2 show that unit length inductance matrix L (FS) in each layer media free space, unit length inductance matrix L (INSUL) in insulating layer, unit length answers that (reality) capacitance matrix C (FS), unit length answers (reality) capacitance matrix in insulating layer in free space by the replacement extraction parasitic inductance schematic diagram that establishes mirror imageS3 obtains overall complex capacitance matrix by series connection thoughtAnd obtain parasitic net capacitor C and net conductance matrix G.The present invention is extracted using the thought of dielectric stratifying, and the parasitic parameter of extraction is more accurate.

Description

The extracting method of twisted pair parasitic capacitance and conductance in external conductive casing
Technical field
The present invention relates to parasitic parameter extraction fields in transmission line crosstalk prediction and elimination, specifically relate to multiple twin in external conductive casing The extracting method of line parasitic capacitance and conductance.
Background technique
The electromagnetic coupling of transmission line is embodied in the form of parasitic parameter, to realize that transmission line crosstalk prediction and crosstalk disappear It removes, it is necessary to obtain parasitic parameter first, transmission line unit length parasitic parameter extraction problem is the basis of transmission line crosstalk analysis. The extraction of parasitic parameter is extracted as difficult point with parasitic capacitance and parasitic conductance.
The unit length electrical parameter of actual conditions classics transmission line is only a simple numerical value, can be obtained by mature formula ?.And common unit length electrical parameter is mainly extracted by numerical computation methods such as moment methods.It is with Paul professor C.R The scholar of representative utilizes moment method (MoM), has carried out the analysis of system to the extraction of conductor electrical parameter, and proposes many effective Solution, but usually wire structures are considered as it is uniform and lossless, and be usually placed in it is ideal big on the ground.Analyze non-uniform delivery When insulating coating is to cross talk effects in line, Sergio A.Pignari and Giordano Spadacini are emulated using MoM, and are not had There is the direct solving method of parasitic parameter under the conditions of obtaining non-uniform dielectric.Abdolhamid Shoory et al. is in research twisted pair Near-end cross (NEXT) and when far-end cross talk (FEXT), is considered as zero for twisted pair cross distance, does not account for the change of line linear distance The heterogeneity of caused parasitic parameter, and by medium be considered as it is lossless uniformly, i.e., the extraction of parasitic parameter is idealized.
Many models, which are all built upon, is considered as zero for twisted pair cross section distance, and conductor is ideal, surrounding medium it is lossless and On the basis of the conditions such as uniform, however in a practical situation, these conditions are often not being met, and the parasitic parameter of extraction is inadequate Accurately, so that Accurate Prediction and crosstalk can not be eliminated.For twisted pair, become in cross section wire spacing with position approximately linear Change, and in the case where medium has consumption and non-homogeneous situation, the calculating of parasitic parameter is complicated difficult, and classical transmission-line analysis method is same Sample is no longer applicable in, and the numerical methods such as moment method, FInite Element also because calculation amount is too big and can not effective solution it is non-homogeneous The problem of multi-conductor transmission lines.The present invention proposes the method for solving these problems exactly according to such situation.It can expire Requirements under sufficient practical condition.And it is suitable for any transmission line situation.
In conclusion existing reported literature is to having the non-homogeneous twisted pair parasitic capacitance of consumption and conductance directly to extract problem also It does not study, extracting method still has to be solved.
Summary of the invention
The purpose of the present invention is to provide for twisted pair parasitic capacitance and conductance in the external conductive casing of non-uniform dielectric Extracting method.
The extracting method of twisted pair parasitic capacitance and conductance, includes the following steps in external conductive casing:
(1) by establishing twisted pair approximate period alternate transport model, obtain cross section single line to twisted pair center Axis spacing h changes, and then obtains conducting wire and change to external conductive casing distance di;
(2) by the replacement extraction parasitic inductance schematic diagram that establishes mirror image, unit length self-inductance lii in free space is obtained (FS), unit length mutual inductance l in free spaceij(FS), unit length self-inductance l in dielectricii(INSUL), insulation is situated between Unit length mutual inductance l in matterij(INSUL), and obtain unit length inductance matrix L (FS) in each layer media free space, absolutely Unit length inductance matrix L (INSUL) in edge layer, capacitance per unit length Matrix C (FS) in free space, unit is long in insulating layer Spend capacitance matrix
(3) overall complex capacitance matrix is obtained by series connection thoughtAnd obtain parasitic net capacitor C and net conductance matrix G。
In the step (1), by
L (FS) C (FS)=μ0ε0E(n)
Obtain capacitance per unit length Matrix C (FS) in each layer free space, capacitance per unit length matrix in insulating layerWherein μ is insulating layer magnetic conductivity, μ0For permeability of free space,For insulating layer complex dielectric permittivity, ε0For freedom Space permittivity, E (n) are n rank unit matrix, L (FS) is unit length inductance matrix in free space, L (INSUL) is exhausted Unit length inductance matrix in edge layer, C (FS) be capacitance per unit length matrix in free space,For in insulating layer Capacitance per unit length matrix.
In the step (3), by
Obtain overall complex capacitance matrixWherein C (FS) be free space in capacitance per unit length matrix, For capacitance per unit length matrix in insulating layer.
In the step (2), unit length self-inductance is in dielectric:
Wherein liiIt (INSUL) is unit length self-inductance, r in dielectricsFor external conductive casing inside radius, μ0For free sky Between magnetic conductivity, rwFor twisted pair inner conductor radius, rmFor insulating layer outer radius, diFor i-th wire center and housing central axis Between distance.
In the step (2), unit length mutual inductance is in dielectric:
Wherein lijIt (INSUL) is unit length mutual inductance, s in dielectric1Outside for the center conducting wire i to conducting wire j insulating layer The distance of layer A point, s2For distance of the mirrored center to conducting wire j insulating layer outer layer A point of conducting wire i, sijFor the center conducting wire i to conducting wire The distance at the center j, s " distance of the mirrored center to the center conducting wire j that is conducting wire i, μ0It is circumference for permeability of free space, π Rate.
In the step (2), unit length self-inductance is in free space:
Wherein liiIt (FS) is unit length self-inductance, μ in free space0It is pi, r for permeability of free space, πs For external conductive casing inside radius, diFor i-th wire center between housing central axis at a distance from, rmFor insulating layer outer radius.
In the step (2), capacitance per unit length Matrix C (FS) is real square when dielectric constant is real number in free space Battle array, is complex matrix when dielectric constant is plural number;Capacitance per unit length matrix in insulating layerIt is real in dielectric constant It is real matrix when number, is complex matrix when dielectric constant is plural number.
By appearance of always sending a telegram in replyExpression formula can immediately arrive at the net capacitor of unit length and net conductance matrix.
The beneficial effects of the present invention are:
For non-uniform dielectric, the extraction of parasitic parameter is complicated, and the present invention is extracted using the thought of dielectric stratifying, extracts Parasitic parameter it is more accurate.
Detailed description of the invention
Fig. 1 is concrete operations flow chart
Fig. 2 extracts the explanatory diagram of parasitic inductance using mirror image displacement
Fig. 3 is the total cross-sectional structure of two pairs of twisted pairs being placed in external conductive casing (dotted line connection is a pair) and multiple twin Line single line cross-sectional structure figure
Fig. 4 is twisted pair approximate period alternate transport circuit model
Specific embodiment
The present invention is described further with reference to the accompanying drawing.
1 is external conductive casing in attached drawing three, and 2 be free space, and 3 be insulating layer, and 4 be lead conductor.
It is right by taking the parasitic capacitance and conductance between two to intercouple couple twisted-pair cable line being placed in external conductive casing as an example The present invention is described in detail, then n is 4, constitutes the non-homogeneous MTLs model of 4+1.It is exhausted to be placed in band in external conductive casing Two pairs of twisted pair cross-sectional structures of edge layer are as shown in Figure 4.Then in twisted pair parallel sectionCross section tan β =rm/ l ',Wherein (i=1,2,3,4).All twisted paired conductors are copper material Matter, parameter setting are as follows:
μ0=4 π × 10-7, ε0=8.854187817 × 10-10, the ε of ε=3.50, tan δ=0.02, l'=0.25cm, rw= 0.4064mm, rs=1.778mm, rm=0.889mm
Its parasitic capacitance and conductance are extracted below with the method for the present invention, is that twisted pair cross section is different shown in table 1 Position parasitic capacitance, conductance extract result (frequency f is fixed as 1MHz), and x takes different value to represent different line line spacing, by It is symmetrical matrix in multi-conductor transmission lines inductance matrix, therefore only provides subitem in table, other duplicate keys is then omitted.It can be with by table Find out, the method for the present invention can directly extract twisted pair any section parasitic capacitance and conductance matrix under different frequency, meet reality Situation has very big reference value.
Following table is that twisted pair cross section different location parasitic capacitance and conductance extract result (f=1MHz):
The purpose of the present invention solves the twisted pair parasitic capacitance and conductance that multilayer in conductive shell has consumption non-uniform dielectric to surround Extraction problem.Especially for non-uniform dielectric, the extraction of parasitic parameter is especially complicated, and the present invention uses the thought of dielectric stratifying To extract.
The parasitic inductance that extracts from multi-conductor transmission lines equation, capacitor, conductance parameter matrix are as follows:
Wherein, n is wire count.
Parasitic parameter is mainly influenced by two aspect factors, first is that wire spacing changes caused wire center to ideal conducting The distance of shell changes, second is that the heterogeneity of medium.
Establish twisted pair approximate period alternating inversion model such as Fig. 1, including parallel section and cross section, cross section away from From half be l'.Spacing is not fixed and invariable between twisted paired conductors.Cross section wire spacing changes with position linearity, leads Cause parasitic parameter uneven, each parasitic parameter is related in the location of cross section with it.A pair of of multiple twin as shown in Figure 1 Line middle line line spacing h=x tan β.
If external conductive casing inside radius is rs, i-th wire center between housing central axis at a distance from be di, the different of h will Lead to diDifference.Conducting wire is surrounded by two layers of different medium, and first layer is insulating layer, and the second layer is free space.Conducting wire has consumption Non-uniform dielectric parameter is
Insulating layer:ε, μ, tan δ, rw<r<rm
Free space:ε0, μ0, rm<r<rs
Insulating layer complex dielectric permittivity
Wherein ε and ε0Insulating layer and free space dielectric constant, μ and μ respectively0Respectively insulating layer and free space magnetic conductance Rate, δ are to have consumption insulating layer loss angle.If twisted pair inner conductor radius is rw, insulating layer outer radius is rm.Angle between conducting wire is θijIf the cross section wire center of circle is Oi
Main idea is that being extracted using the parasitic inductance matrix of twisted pair difference every layer of areas of dielectric of section total Net capacitor and conductance matrix, be described as follows:
The case where being surrounded for conducting wire by round insulation medium, there is μ=μ0, therefore unit length inductance is not by non-homogeneous Jie The influence of matter, i.e., it is identical as the situation being placed in uniform dielectric (free space).By in free space, unit length in insulating layer Inductance matrix is respectively defined as L (FS), L (INSUL).Seek parasitic inductance between conducting wire using image method, external conductive casing can be with With on shell center radius directionThe image current at place replaces, as shown in Figure 3.Specific solution is as follows.
Unit length self-inductance and unit length mutual inductance be in dielectric:
Wherein, s1For the center conducting wire i to the distance of conducting wire j insulating layer outer layer A point, s2For conducting wire i mirrored center to conducting wire The distance of j insulating layer outer layer A point, sijFor mirrored center that the center conducting wire i to the distance at the center conducting wire j, s " is conducting wire i to conducting wire The distance at the center j.
Unit length self-inductance and unit length mutual inductance be in free space:
Wherein, s '1For the center conducting wire i to the distance of ideal conducting shell B point, s '1It is led for conducting wire i mirrored center to ideal The distance of electric shell B point.
Then obtain the unit length inductance matrix L (INSUL) and L (FS) in insulating layer and in free space.
The dielectric constant of conducting wire surrounding medium is heterogeneous.Therefore capacitance per unit length, conductance are by non-uniform dielectric It influences.Unit length in insulating layer, free space is answered (reality) capacitance matrix to be respectively defined asC (FS) is (if be situated between Electric constant be it is real, capacitor is just real, conversely, for plural number).
L (FS) C (FS)=μ0ε0E(n)
Wherein, wherein E (n) is n rank unit matrix.
Since in two media contact faces, i.e. surface r=rmPlace is equipotential surface, so total telegram in reply holdsEach area can be regarded as Domain telegram in reply
The series connection of appearance.
By appearance of always sending a telegram in replyExpression formula (7) can immediately arrive at the net capacitor of unit length and net conductance matrix.
By being analyzed above it is found that we must first obtain every layer in view of the needs that the net capacitor of unit length, net conductance are extracted The multiple capacitance matrix of medium then must and need to only extract the parasitic inductance matrix of every layer of areas of dielectric.
The extracting method of the twisted pair parasitic capacitance and conductance that there is consumption non-uniform dielectric to surround in external conductive casing.
It solves complicated for parasitic parameter in non-homogeneous twisted-pair cable crosstalk solution procedure and is typically only capable to for conducting wire being considered as Lossless and uniform realistic problem, the invention proposes have the non-homogeneous parasitic capacitance of the non-homogeneous twisted pair of consumption and electricity in external conductive casing Lead the extracting method of matrix.
The present invention establishes twisted pair approximate period alternate transport model, is approximately no longer zero by twisted pair cross section, Line line spacing changes because of position difference.The twisted pair axial lead spacing schematic diagram further refined, obtains cross section list Line changes to twisted pair central axis spacing h, causes conducting wire to external conductive casing distance diChange.
Establish mirror image replacement extraction parasitic inductance schematic diagram, obtain each layer medium parasitic inductance parameter matrix L (INSUL) and L (FS),
By
L (FS) C (FS)=μ0ε0E(n)
Obtain each layer capacitance matrixWith C (FS), overall complex capacitance matrix is obtained by series connection thought
By
Obtain parasitic net capacitor and net conductance matrix.
According to the multiple twin line model in given external conductive casing, concrete operations are carried out according to given parameters, obtain twisted pair friendship Fork divides parasitic capacitance and conductance matrix of the different location under fixed frequency.

Claims (7)

1. the extracting method of twisted pair parasitic capacitance and conductance in external conductive casing, which is characterized in that include the following steps:
(1) by establishing twisted pair approximate period alternate transport model, obtain cross section single line between twisted pair central axis Change away from h, and then obtains conducting wire to external conductive casing distance diChange;
(2) by the replacement extraction parasitic inductance schematic diagram that establishes mirror image, unit length self-inductance l in free space is obtainedii(FS)、 Unit length mutual inductance l in free spaceij(FS), unit length self-inductance l in dielectricii(INSUL), in dielectric Unit length mutual inductance lij(INSUL), and unit length inductance matrix L (FS), insulating layer in each layer media free space are obtained Capacitance per unit length Matrix C (FS) in middle unit length inductance matrix L (INSUL), free space, unit length electricity in insulating layer Hold matrix
(3) overall complex capacitance matrix is obtained by thought of connectingAnd obtain parasitic net capacitor C and net conductance matrix G.
2. the extracting method of twisted pair parasitic capacitance and conductance in external conductive casing according to claim 1, it is characterised in that: In the step (1), by
L (FS) C (FS)=μ0ε0E(n)
Obtain capacitance per unit length Matrix C (FS) in each layer free space, capacitance per unit length matrix in insulating layer Wherein μ is insulating layer magnetic conductivity, μ0For permeability of free space,For insulating layer complex dielectric permittivity, ε0It is normal for free space dielectric Number, E (n) are n rank unit matrix, L (FS) is unit length inductance matrix in free space, L (INSUL) is unit in insulating layer Length inductance matrix, C (FS) be free space in capacitance per unit length matrix,For unit length electricity in insulating layer Hold matrix.
3. the extracting method of twisted pair parasitic capacitance and conductance in external conductive casing according to claim 1, it is characterised in that: In the step (3), by
Obtain overall complex capacitance matrixWherein C (FS) be free space in capacitance per unit length matrix,It is exhausted Capacitance per unit length matrix in edge layer.
4. the extracting method of twisted pair parasitic capacitance and conductance in external conductive casing according to claim 1, it is characterised in that: In the step (2), unit length self-inductance is in dielectric:
Wherein liiIt (INSUL) is unit length self-inductance, r in dielectricsFor external conductive casing inside radius, μ0For free space magnetic Conductance, rwFor twisted pair inner conductor radius, rmFor insulating layer outer radius, diFor i-th between wire center and housing central axis Distance.
5. the extracting method of twisted pair parasitic capacitance and conductance in external conductive casing according to claim 1, it is characterised in that: In the step (2), unit length mutual inductance is in dielectric:
Wherein lijIt (INSUL) is unit length mutual inductance, s in dielectric1For the center conducting wire i to conducting wire j insulating layer outer layer A point Distance, s2For distance of the mirrored center to conducting wire j insulating layer outer layer A point of conducting wire i, sijFor the center conducting wire i to the center conducting wire j Distance, distance of the mirrored center to the center conducting wire j that s " is conducting wire i, μ0It is pi for permeability of free space, π.
6. the extracting method of twisted pair parasitic capacitance and conductance in external conductive casing according to claim 1, it is characterised in that: In the step (2), unit length self-inductance is in free space:
Wherein liiIt (FS) is unit length self-inductance, μ in free space0It is pi, r for permeability of free space, πsFor conduction Housing interior radius, diFor i-th wire center between housing central axis at a distance from, rmFor insulating layer outer radius.
7. the extracting method of twisted pair parasitic capacitance and conductance in external conductive casing according to claim 1, it is characterised in that: In the step (2), capacitance per unit length Matrix C (FS) is real matrix when dielectric constant is real number in free space, is being situated between It is complex matrix when electric constant is plural number;Capacitance per unit length matrix in insulating layerIt is when dielectric constant is real number Real matrix is complex matrix when dielectric constant is plural number.
CN201810566383.7A 2018-06-05 2018-06-05 Method for extracting parasitic capacitance and conductance of twisted pair in conductive shell Active CN108829963B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810566383.7A CN108829963B (en) 2018-06-05 2018-06-05 Method for extracting parasitic capacitance and conductance of twisted pair in conductive shell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810566383.7A CN108829963B (en) 2018-06-05 2018-06-05 Method for extracting parasitic capacitance and conductance of twisted pair in conductive shell

Publications (2)

Publication Number Publication Date
CN108829963A true CN108829963A (en) 2018-11-16
CN108829963B CN108829963B (en) 2022-03-18

Family

ID=64143700

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810566383.7A Active CN108829963B (en) 2018-06-05 2018-06-05 Method for extracting parasitic capacitance and conductance of twisted pair in conductive shell

Country Status (1)

Country Link
CN (1) CN108829963B (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100096179A1 (en) * 2006-05-17 2010-04-22 Leviton Manufacturing Co., Inc. Communication cabling with shielding separator and discontinuous cable shield
CN103226166A (en) * 2013-03-21 2013-07-31 天津大学 Shielded twisted pair RLCG model and computational method of transfer characteristic thereof
CN105319446A (en) * 2015-10-30 2016-02-10 哈尔滨工程大学 Heterogeneous multiple conductor transmission line inductance matrix direct evaluation method
CN106777444A (en) * 2016-04-06 2017-05-31 长春工业大学 A kind of MVB Network Transfer Media design methods

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100096179A1 (en) * 2006-05-17 2010-04-22 Leviton Manufacturing Co., Inc. Communication cabling with shielding separator and discontinuous cable shield
CN103226166A (en) * 2013-03-21 2013-07-31 天津大学 Shielded twisted pair RLCG model and computational method of transfer characteristic thereof
CN105319446A (en) * 2015-10-30 2016-02-10 哈尔滨工程大学 Heterogeneous multiple conductor transmission line inductance matrix direct evaluation method
CN106777444A (en) * 2016-04-06 2017-05-31 长春工业大学 A kind of MVB Network Transfer Media design methods

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
GIORDANO SPADACINI等: "Impact of Twist Non-Uniformity on Crosstalk in Twisted-Wire", 《IEEE》 *
GIORDANO SPADACINI等: "Transmission-Line Model for Field-to-Wire Coupling in Bundles of Twisted-Wire Pairs Above Ground", 《IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY》 *
SERGIO A. PIGNARI等: "Influence of Twist-Pitch Random Non-Uniformity on the Radiated Immunity of Twisted-Wire Pairs", 《IEEE》 *
邵志江等: "一种分析双绞线串扰的时域方法", 《微波学报》 *
高印寒等: "汽车线束导线间寄生电容及串扰的解析预测模型", 《吉林大学学报(工学版)》 *
高岩峰等: "等效电路模型分析介电响应的方法、意义及应用", 《中国电机工程学报》 *

Also Published As

Publication number Publication date
CN108829963B (en) 2022-03-18

Similar Documents

Publication Publication Date Title
CN106771627B (en) A method of it establishing multicore shielding power cable frequency and becomes MTLs model
CN110531171B (en) Calculation method for determining cable crosstalk critical wiring distance
JP7155260B2 (en) Contactless voltage converter
CN103226166B (en) Computational method of transfer characteristic of shielded twisted pair RLCG
CN105513686A (en) Anti-interference three-layer flat shielding cable
Wang et al. Estimation of multi‐conductor powerline cable parameters for the modelling of transfer characteristics
US9991023B2 (en) Interconnect cable having insulated wires with a conductive coating
CN108829963A (en) The extracting method of twisted pair parasitic capacitance and conductance in external conductive casing
Middelstädt et al. Analytical determination of the first resonant frequency of differential mode chokes by detailed analysis of parasitic capacitances
JP2015155894A (en) Electric characteristics measurement device
Perić et al. Characteristic parameters determination of different striplines configurations using HBEM
Liang et al. Fractional transmission line model of oil‐immersed transformer windings considering the frequency‐dependent parameters
Han et al. Polarization mode basis functions for modeling insulator-coated through-silicon via (TSV) interconnections
Distler et al. Crosstalk simulation of multiple insulated twisted pairs based on transmission line theory
Rotgerink et al. Generic prediction of crosstalk between shielded wires
Van Horck et al. Common-mode currents generated by circuits on a PCB-measurements and transmission-line calculations
Ridel et al. Characterization of complex aeronautic harness—Numerical and experimental validations
US20160020559A1 (en) Capacitive compensation
KR101373719B1 (en) Manufacturing method of coaxial type ac cable
CN110472366A (en) A kind of decoupling method of carrier signal in medium voltage distribution network underground cable line transmission
Lu et al. Calculation of Capacitance Matrix of Non-uniform Multi-conductor Transmission Lines based on S-parameters
CN205846382U (en) A kind of anti-interference three layers of flat power wire
CN205542055U (en) Anti -interference double -deck flat cable
EP0995238A1 (en) A method of reducing signal coupling in a connector, a connector and a cable including such a connector
Yang et al. Study on the electromagnetic interference of shielded cable in rail weighbridge

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant