CN108828427B - Criterion searching method, device, equipment and storage medium for signal integrity test - Google Patents
Criterion searching method, device, equipment and storage medium for signal integrity test Download PDFInfo
- Publication number
- CN108828427B CN108828427B CN201810224452.6A CN201810224452A CN108828427B CN 108828427 B CN108828427 B CN 108828427B CN 201810224452 A CN201810224452 A CN 201810224452A CN 108828427 B CN108828427 B CN 108828427B
- Authority
- CN
- China
- Prior art keywords
- criterion
- bom
- code
- test
- chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
Landscapes
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Debugging And Monitoring (AREA)
Abstract
The invention is suitable for the technical field of computers, and provides a criterion searching method, a device, equipment and a storage medium for signal integrity test, wherein the method comprises the following steps: according to the received test case for testing the integrity of the chip signal and all the corresponding chip BOM codes, a criterion folder named by the current BOM code is sequentially searched in a chip data manual database, a criterion screenshot corresponding to the test case, a test point and a criterion corresponding to the test point are searched in the criterion record of the folder and the criterion folder, a criterion report relevant to the current BOM code is generated and output according to the criterion screenshot, the test point and the search result of the criterion corresponding to the test point, and when the current BOM code is not the last BOM code in all the chip BOM codes, the next BOM code of the current BOM code is continuously searched according to the steps, so that the degree and accuracy of the criterion search of the signal integrity test are improved, and further the user experience is improved.
Description
Technical Field
The invention belongs to the technical field of computers, and particularly relates to a method, a device, equipment and a storage medium for searching criteria of a signal integrity test.
Background
At present, an intra-industry hardware test engineer tests the signal quality of a chip, and test criteria are all realized by manually searching a data manual (Datasheet), and the method comprises the following specific steps: when a hardware Test engineer takes a hardware Test project, the data sheet of a corresponding chip is downloaded according to a Bill of materials (BOM for short), then a required criterion is searched according to the data sheet of the corresponding chip, then a screenshot is pasted to a report, the specific criterion is arranged and filled in the criterion (criterion) of a Test data (Test data) table, and when a plurality of Test cases or a plurality of chips need to be tested, the Test step needs to be repeatedly executed, so that the problems that the Test work is time-consuming, tedious, easy to make mistakes, the quality of the Test report is poor and the like are caused.
Disclosure of Invention
The invention aims to provide a method, a device, equipment and a storage medium for searching criteria in a signal integrity test, and aims to solve the problems that the search of the criteria in the signal integrity test is complicated, time-consuming and easy to make mistakes due to the fact that the prior art cannot provide an effective method for searching the criteria in the signal integrity test.
In one aspect, the present invention provides a method for searching criteria in a signal integrity test, the method comprising the following steps:
receiving a test case for testing the integrity of a chip signal and all chip BOM codes corresponding to the test case;
sequentially acquiring a BOM code from all chip BOM codes, and setting the acquired BOM code as the current BOM code searched by the criterion under the test case;
searching a criterion folder named by the current BOM code in a pre-established chip data manual database;
searching a criterion screenshot corresponding to the test case in the searched criterion folder, and searching a test point corresponding to the test case and a criterion corresponding to the test case in a criterion record pre-established in the criterion folder;
generating and outputting a criterion report related to the current BOM code according to the criterion screenshot, the test point and a search result of the criterion corresponding to the test point;
and judging whether the current BOM code is the last BOM code in all chip BOM codes, if so, finishing the criterion search under the test case, otherwise, skipping to the step of sequentially acquiring a BOM code from all chip BOM codes.
In another aspect, the present invention provides a criterion searching apparatus for signal integrity test, where the apparatus includes:
the device comprises a parameter receiving unit, a parameter analyzing unit and a parameter analyzing unit, wherein the parameter receiving unit is used for receiving a test case for testing the integrity of a chip signal and all chip BOM codes corresponding to the test case;
the code setting unit is used for sequentially acquiring a BOM code from all chip BOM codes and setting the acquired BOM code as the current BOM code searched by the criterion under the test case;
the folder searching unit is used for searching a criterion folder named by the current BOM code in a pre-established chip data manual database;
a criterion searching unit, configured to search for a criterion screenshot corresponding to the test case in the searched criterion folder, and search for a test point corresponding to the test case and a criterion corresponding to the test case in a criterion record pre-established in the criterion folder;
a criterion report output unit, configured to generate and output a criterion report associated with the current BOM code according to the criterion screenshot, the test point, and a search result of the criterion corresponding to the test point; and
and the code judging unit is used for judging whether the current BOM code is the last BOM code in all chip BOM codes, if so, the criterion search under the test case is ended, and if not, the code setting unit is skipped.
In another aspect, the present invention also provides a computing device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the method when executing the computer program.
In another aspect, the present invention also provides a computer-readable storage medium, in which a computer program is stored, which computer program, when being executed by a processor, carries out the steps of the method as set forth above.
The invention receives a test case for testing the integrity of chip signals and all chip BOM codes corresponding to the test case, sequentially obtains a BOM code from all chip BOM codes, sets the BOM code as the current BOM code, searches a criterion folder named by the current BOM code in a pre-established chip data manual database, searches a criterion screenshot corresponding to the test case in the searched criterion folder, searches test points corresponding to the test case and criteria corresponding to the test cases in a criterion record pre-established by the criterion folder, generates and outputs a report related to the current BOM code according to the criterion screenshot, the test points and the search results of the criteria corresponding to the test cases, judges whether the current BOM code is the last BOM code in all chip BOM codes, if so, ends the search criteria under the test case, otherwise, the next criterion under the test case is searched continuously, so that the automation degree and accuracy of searching the criterion of the signal integrity test are improved, and the user experience is improved.
Drawings
Fig. 1 is a flowchart illustrating an implementation of a criterion searching method for a signal integrity test according to an embodiment of the present invention;
fig. 2 is an exemplary diagram of a criterion report in the criterion searching method for signal integrity test according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a criterion searching apparatus for signal integrity test according to a second embodiment of the present invention;
fig. 4 is a schematic structural diagram of a preferred criterion searching apparatus for signal integrity test according to a second embodiment of the present invention; and
fig. 5 is a schematic structural diagram of a computing device according to a third embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The following detailed description of specific implementations of the present invention is provided in conjunction with specific embodiments:
the first embodiment is as follows:
fig. 1 shows an implementation flow of a criterion searching method for signal integrity testing according to an embodiment of the present invention, and for convenience of description, only the relevant parts related to the embodiment of the present invention are shown, which is detailed as follows:
in step S101, a test case for chip signal integrity test and all chip BOM codes corresponding to the test case are received.
The embodiment of the invention is suitable for computing equipment, such as a personal computer for testing, a tablet computer and the like. The chip BOM code is a uniform code according to the rules of the company for naming the chip, for example, the code may be composed of the company name, the class of the chip, the chip name, and the chip model. The chip BOM code has uniqueness, namely the chip uses the same BOM code when being applied to all finished products or semi-finished products. In the embodiment of the present invention, the test case may be only for one chip, or may be for a plurality of chips, and the test case may be one or a plurality of.
In step S102, a BOM code is sequentially obtained from all chip BOM codes, and the obtained BOM code is set as a current BOM code searched by the criteria under the test case.
In the embodiment of the present invention, specifically, 1 may be sequentially added to a BOM code counter according to the input sequence of all chip BOM codes, a BOM code is obtained each time, and the BOM code is set as the current BOM code searched by the criterion under the test case.
In step S103, a criterion folder named with the current BOM code is searched in a pre-established chip data manual database.
In the embodiment of the present invention, before searching the criterion folder named by the current BOM code, preferably, a chip data manual database (Datasheet Library) is established according to a chip data manual (Datasheet), the criterion folders named by the chip BOM code are respectively established in the Datasheet Library, and the relevant criteria of the chip are placed under the BOM code criterion folder of the corresponding chip, thereby providing a basis for subsequent criterion search.
In step S104, the criterion screenshot corresponding to the test case is searched in the searched criterion folder, and the test point corresponding to the test case and the criterion corresponding to the test point are searched in the criterion record pre-established in the criterion folder.
In the embodiment of the invention, the criterion screenshot is a screenshot of a judgment basis part related to a test case in a data manual (Datasheet) of a chip corresponding to the current BOM code. Preferably, the screenshot of the criterion is a picture file in a jpg format, thereby reducing the size of the screenshot of the criterion and increasing the probability of being identified on the computing device.
In the embodiment of the invention, the test point in the criterion record is the specific content of the chip corresponding to the current BOM code to be tested in the test case, and if the criterion corresponding to the test point is not in the data manual of the chip, the criterion corresponding to the test point depends on the internal reference standard or the industry standard of a company. Preferably, the criterion is recorded as a file in an excel format, so that the management efficiency of the test points and the criteria corresponding to the test points is improved.
In the embodiment of the present invention, before searching the criterion screenshot corresponding to the test case in the searched criterion folder, preferably, when the criterion folder named by the current BOM code is not searched in the pre-established chip data manual database, the corresponding prompt information is output at the corresponding position of the generated current BOM code criterion report, and then the step S102 is skipped to, and the search is continued for the criterion under the test case, so that the automation degree of searching the criterion according to the chip BOM code is improved.
Further preferably, the corresponding prompt messages can be output in different colors, so that the spotlighting degree of the prompt messages in the criterion report is improved.
In step S105, a criterion report associated with the current BOM code is generated and output according to the criterion screenshot, the test point, and the search result of the criterion corresponding to the test point.
In the embodiment of the invention, a criterion report related to the current BOM code is generated and output according to the criterion screenshot, the test point and the search result of the criterion corresponding to the test point. Preferably, when the criterion screenshot or the test point and the criterion corresponding to the test point are found, the criterion screenshot or the test point and the criterion corresponding to the test point are inserted into the position corresponding to the criterion report, and the criterion report is output, so that the completeness and the accuracy of the criterion report are improved. Further preferably, when the criterion screenshot or the test point and the criterion corresponding to the test point are not found, the corresponding prompt information is inserted into the position corresponding to the criterion report, and the criterion report is output, so that the completeness of the criterion report is further improved.
In step S106, it is determined whether the current BOM code is the last BOM code of all chip BOM codes.
In the embodiment of the invention, when the current BOM code is the last BOM code in all chip BOM codes, the step S107 is executed, otherwise, the step S102 is skipped to, and the search for the criterion under the test case is continued, so that the automation degree of searching the criterion according to the chip BOM codes is improved.
In step S107, the search for the criteria under the test case is ended.
In the embodiment of the present invention, after the search of the criteria in the test case is finished, preferably, when a plurality of test cases are received in step S101, the BOM code counter is cleared first, and then step S102 is skipped to continue searching the criteria in the next test case, so as to improve the automation degree of searching the criteria according to the chip BOM code.
As an example, fig. 2 shows an exemplary criterion report, where the Test criterion part is a criterion screenshot of a corresponding Test case found according to the current BOM code, and the Test data part is a specific Test point of the corresponding Test case found according to the current BOM code and a specific criterion corresponding to the Test point.
In the embodiment of the invention, firstly, according to a received test case for testing the integrity of a chip signal and all chip BOM codes corresponding to the test case, a criterion folder named by the current BOM code is sequentially searched in a chip data manual database, then a criterion screenshot, a test point and a criterion corresponding to the test case are searched in the searched criterion folder and a criterion record of the criterion folder, a criterion report related to the BOM code is generated and output according to the criterion screenshot, the test point and a search result of the criterion corresponding to the test point, when the current BOM code is not the last BOM code in all chip BOM codes, the next BOM code of the current BOM code is continuously searched according to the preorder steps, thereby improving the automation degree and the accuracy of the criterion search of the integrity test of the signal test, thereby improving the user experience.
Example two:
fig. 3 shows a structure of a criterion searching apparatus for signal integrity testing according to a second embodiment of the present invention, and for convenience of description, only the parts related to the second embodiment of the present invention are shown, which include:
the parameter receiving unit 31 is configured to receive a test case for chip signal integrity test and all chip BOM codes corresponding to the test case.
The embodiment of the invention is suitable for computing equipment, such as a personal computer for testing, a tablet computer and the like. The chip BOM code is a uniform code according to the rules of the company for naming the chip, for example, the code may be composed of the company name, the class of the chip, the chip name, and the chip model. The chip BOM code has uniqueness, namely the chip uses the same BOM code when being applied to all finished products or semi-finished products. In the embodiment of the present invention, the test case may be only for one chip, or may be for a plurality of chips, and the test case may be one or a plurality of.
And the code setting unit 32 is configured to sequentially obtain a BOM code from all chip BOM codes, and set the obtained BOM code as a current BOM code searched by the criterion under the test case.
In the embodiment of the present invention, specifically, 1 may be sequentially added to a BOM code counter according to the input sequence of all chip BOM codes, a BOM code is obtained each time, and the BOM code is set as the current BOM code searched by the criterion under the test case.
And the folder searching unit 33 is used for searching the criterion folder named by the current BOM code in a pre-established chip data manual database.
In the embodiment of the present invention, before searching the criterion folder named by the current BOM code, preferably, a chip data manual database (Datasheet Library) is established according to a chip data manual (Datasheet), the criterion folders named by the chip BOM code are respectively established in the Datasheet Library, and the relevant criteria of the chip are placed under the BOM code criterion folder of the corresponding chip, thereby providing a basis for subsequent criterion search.
And the criterion searching unit 34 is configured to search the criterion screenshot corresponding to the test case in the searched criterion folder, and search the test point corresponding to the test case and the criterion corresponding to the test point in the criterion record pre-established in the criterion folder.
In the embodiment of the invention, the criterion screenshot is a screenshot of a judgment basis part related to a test case in a data manual (Datasheet) of a chip corresponding to the current BOM code. Preferably, the screenshot of the criterion is a picture file in a jpg format, thereby reducing the size of the screenshot of the criterion and increasing the probability of being identified on the computing device.
In the embodiment of the invention, the test point in the criterion record is the specific content of the chip corresponding to the current BOM code to be tested in the test case, and if the criterion corresponding to the test point is not in the data manual of the chip, the criterion corresponding to the test point depends on the internal reference standard or the industry standard of a company. Preferably, the criterion is recorded as a file in an excel format, so that the management efficiency of the test points and the criteria corresponding to the test points is improved.
In the embodiment of the present invention, before searching the criterion screenshot corresponding to the test case in the searched criterion folder, preferably, when the criterion folder named by the current BOM code is not searched in the pre-established chip data manual database, the corresponding prompt information is output at the corresponding position of the generated current BOM code criterion report, and then the code setting unit 32 is skipped to continue searching the criterion under the test case, thereby improving the automation degree of searching the criterion according to the chip BOM code.
Further preferably, the corresponding prompt messages can be output in different colors, so that the spotlighting degree of the prompt messages in the criterion report is improved.
And a criterion report output unit 35, configured to generate and output a criterion report associated with the current BOM code according to the criterion screenshot, the test point, and a search result of the criterion corresponding to the test point.
In the embodiment of the invention, a criterion report related to the current BOM code is generated and output according to the criterion screenshot, the test point and the search result of the criterion corresponding to the test point. Preferably, when the criterion screenshot or the test point and the criterion corresponding to the test point are found, the criterion screenshot or the test point and the criterion corresponding to the test point are inserted into the position corresponding to the criterion report, and the criterion report is output, so that the completeness and the accuracy of the criterion report are improved. Further preferably, when the criterion screenshot or the test point and the criterion corresponding to the test point are not found, the corresponding prompt information is inserted into the position corresponding to the criterion report, and the criterion report is output, so that the completeness of the criterion report is further improved.
And the code judging unit 36 is configured to judge whether the current BOM code is the last BOM code in all chip BOM codes, if yes, end the criterion search under the test case, and otherwise, jump to the code setting unit 32.
In the embodiment of the invention, when the current BOM code is the last BOM code in all chip BOM codes, the search of the criterion under the test case is ended, otherwise, the code setting unit 32 is skipped to continue searching the criterion under the test case, thereby improving the automation degree of searching the criterion according to the chip BOM codes.
In the embodiment of the present invention, after the search of the criteria in the test case is finished, preferably, when a plurality of test cases are received in the parameter receiving unit 31, the BOM code counter is cleared first, then the code setting unit 32 is skipped to, and the search of the criteria in the next test case is continued, so that the automation degree of searching the criteria according to the chip BOM code is improved.
As shown in fig. 4, preferably, the criterion report output unit 35 includes:
the first report output unit 351 is used for inserting the criterion screenshot or the test point and the criterion corresponding to the test point into the position corresponding to the criterion report when the criterion screenshot or the test point and the criterion corresponding to the test point are found, and outputting the criterion report; and
and a second report output unit 352, configured to insert corresponding prompt information into a position corresponding to the criterion report and output the criterion report when the criterion screenshot or the test point and the criterion corresponding to the test point are not found.
In the embodiment of the present invention, each unit of the criterion searching device for signal integrity test may be implemented by a corresponding hardware or software unit, and each unit may be an independent software or hardware unit, or may be integrated into a software or hardware unit, which is not limited herein.
Example three:
fig. 5 shows the structure of the calculation provided by the third embodiment of the present invention, and for convenience of explanation, only the part related to the third embodiment of the present invention is shown.
The computing device 5 of an embodiment of the invention comprises a processor 50, a memory 51 and a computer program 52 stored in the memory 51 and executable on the processor 50. The processor 50, when executing the computer program 52, implements the steps in the above-described embodiment of the criterion-finding method of signal integrity testing, such as the steps S101 to S107 shown in fig. 1. Alternatively, the processor 50, when executing the computer program 52, implements the functions of the units in the above-described device embodiments, such as the functions of the units 31 to 36 shown in fig. 3.
In the embodiment of the invention, a test case for testing the integrity of chip signals and all chip BOM codes corresponding to the test case are received, a BOM code is sequentially obtained from all chip BOM codes and is set as a current BOM code, a criterion folder named by the current BOM code is searched in a pre-established chip data manual database, a criterion screenshot corresponding to the test case is searched in the searched criterion folder, a test point corresponding to the test case and a criterion corresponding to the test case are searched in a criterion record pre-established in the criterion folder, a criterion report related to the current BOM code is generated and output according to the criterion screenshot, the test point and a search result of the criterion corresponding to the test case, whether the current BOM code is the last BOM code in all chip BOM codes is judged, if yes, the criterion search under the test case is ended, otherwise, the next criterion under the test case is searched continuously, so that the automation degree and accuracy of searching the criterion of the signal integrity test are improved, and the user experience is improved.
The computing equipment of the embodiment of the invention can be a personal computer and a tablet computer for testing. The steps implemented when the processor 50 in the computing device 5 executes the computer program 52 to implement the criterion searching method for signal integrity test can refer to the description of the foregoing method embodiments, and are not described herein again.
Example four:
in an embodiment of the present invention, a computer-readable storage medium is provided, which stores a computer program, which when executed by a processor implements the steps in the above-mentioned criterion searching method embodiment of the signal integrity test, for example, the steps S101 to S107 shown in fig. 1. Alternatively, the computer program may be adapted to perform the functions of the units of the above-described device embodiments, such as the functions of the units 31 to 36 shown in fig. 3, when executed by the processor.
In the embodiment of the invention, a test case for testing the integrity of chip signals and all chip BOM codes corresponding to the test case are received, a BOM code is sequentially obtained from all chip BOM codes and is set as a current BOM code, a criterion folder named by the current BOM code is searched in a pre-established chip data manual database, a criterion screenshot corresponding to the test case is searched in the searched criterion folder, a test point corresponding to the test case and a criterion corresponding to the test case are searched in a criterion record pre-established in the criterion folder, a criterion report related to the current BOM code is generated and output according to the criterion screenshot, the test point and a search result of the criterion corresponding to the test case, whether the current BOM code is the last BOM code in all chip BOM codes is judged, if yes, the criterion search under the test case is ended, otherwise, the next criterion under the test case is searched continuously, so that the automation degree and accuracy of searching the criterion of the signal integrity test are improved, and the user experience is improved.
The computer readable storage medium of the embodiments of the present invention may include any entity or device capable of carrying computer program code, a recording medium, such as a ROM/RAM, a magnetic disk, an optical disk, a flash memory, or the like.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. A method for finding criteria for a signal integrity test, the method comprising the steps of:
receiving a test case for testing the integrity of a chip signal and all chip BOM codes corresponding to the test case;
sequentially acquiring a BOM code from all chip BOM codes, and setting the acquired BOM code as the current BOM code searched by the criterion under the test case;
searching a criterion folder named by the current BOM code in a pre-established chip data manual database;
searching a criterion screenshot corresponding to the test case in the searched criterion folder, and searching a test point corresponding to the test case and a criterion corresponding to the test case in a criterion record pre-established in the criterion folder;
generating and outputting a criterion report related to the current BOM code according to the criterion screenshot, the test point and a search result of the criterion corresponding to the test point;
and judging whether the current BOM code is the last BOM code in all chip BOM codes, if so, finishing the criterion search under the test case, otherwise, skipping to the step of sequentially acquiring a BOM code from all chip BOM codes.
2. The method of claim 1, wherein the step of generating and outputting a criterion report associated with the current chip BOM code according to the criterion screenshot, the test point, and a search result of the criterion corresponding to the test point comprises:
when the criterion screenshot is found or the test point and the criterion corresponding to the test point are found, the criterion screenshot is inserted into the position corresponding to the criterion report or the test point and the criterion corresponding to the test point are inserted into the position corresponding to the criterion report, and the criterion report is output.
3. The method of claim 1, wherein the step of generating and outputting a criterion report associated with the current chip BOM code according to the criterion screenshot, the test point, and a search result of the criterion corresponding to the test point further comprises:
and when the criterion screenshot is not found or the test point and the criterion corresponding to the test point are not found, inserting corresponding prompt information at a position corresponding to the criterion report and outputting the criterion report.
4. The method of claim 1, wherein the screenshot of the criteria is a picture file in jpg format and the record of the criteria is a file in excel format.
5. A criterion searching apparatus for signal integrity test, the apparatus comprising:
the device comprises a parameter receiving unit, a parameter analyzing unit and a parameter analyzing unit, wherein the parameter receiving unit is used for receiving a test case for testing the integrity of a chip signal and all chip BOM codes corresponding to the test case;
the code setting unit is used for sequentially acquiring a BOM code from all chip BOM codes and setting the acquired BOM code as the current BOM code searched by the criterion under the test case;
the folder searching unit is used for searching a criterion folder named by the current BOM code in a pre-established chip data manual database;
a criterion searching unit, configured to search for a criterion screenshot corresponding to the test case in the searched criterion folder, and search for a test point corresponding to the test case and a criterion corresponding to the test case in a criterion record pre-established in the criterion folder;
a criterion report output unit, configured to generate and output a criterion report associated with the current BOM code according to the criterion screenshot, the test point, and a search result of the criterion corresponding to the test point; and
and the code judging unit is used for judging whether the current BOM code is the last BOM code in all chip BOM codes, if so, the criterion search under the test case is ended, and if not, the code setting unit is skipped.
6. The apparatus as claimed in claim 5, wherein said criterion report output unit comprises:
and the first report output unit is used for inserting the criterion screenshot or the test point and the criterion corresponding to the test point into the position corresponding to the criterion report and outputting the criterion report when the criterion screenshot is found or the test point and the criterion corresponding to the test point are found.
7. The apparatus as claimed in claim 5, wherein said criterion report output unit further comprises:
and the second report output unit is used for inserting corresponding prompt information into a position corresponding to the criterion report and outputting the criterion report when the criterion screenshot is not found or the test point and the criterion corresponding to the test point are not found.
8. The apparatus of claim 5, wherein the screenshot of the criteria is a picture file in jpg format and the record of the criteria is a file in excel format.
9. A computing device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that the processor implements the steps of the method according to any of claims 1 to 4 when executing the computer program.
10. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 4.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810224452.6A CN108828427B (en) | 2018-03-19 | 2018-03-19 | Criterion searching method, device, equipment and storage medium for signal integrity test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810224452.6A CN108828427B (en) | 2018-03-19 | 2018-03-19 | Criterion searching method, device, equipment and storage medium for signal integrity test |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108828427A CN108828427A (en) | 2018-11-16 |
| CN108828427B true CN108828427B (en) | 2020-10-27 |
Family
ID=64155057
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810224452.6A Active CN108828427B (en) | 2018-03-19 | 2018-03-19 | Criterion searching method, device, equipment and storage medium for signal integrity test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108828427B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111382036B (en) * | 2018-12-28 | 2024-05-17 | 深圳市共进电子股份有限公司 | Method and system for automatically generating DDR chip test standard report |
| CN110377620A (en) * | 2019-07-16 | 2019-10-25 | 四川康佳智能终端科技有限公司 | A kind of material searching method, computer and storage medium based on BOM tool |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1377499A (en) * | 1999-10-01 | 2002-10-30 | 编码技术瑞典股份公司 | Efficient spectral envelope coding using variable time/frequency resolution and time/frequency switching |
| CN101004556A (en) * | 2006-12-21 | 2007-07-25 | 上海微电子装备有限公司 | Method for optimizing route for exposing wafer |
| CN101551767A (en) * | 2009-01-22 | 2009-10-07 | 浪潮电子信息产业股份有限公司 | Method for testing signal integrity of storage subsystem |
| CN104345260A (en) * | 2013-08-01 | 2015-02-11 | 鸿富锦精密工业（深圳）有限公司 | Signal completeness automatic testing system and method |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8168939B2 (en) * | 2008-07-09 | 2012-05-01 | Luxtera, Inc. | Method and system for a light source assembly supporting direct coupling to an integrated circuit |
| US9673941B2 (en) * | 2015-05-26 | 2017-06-06 | International Business Machines Corporation | Frequency-domain high-speed bus signal integrity compliance model |
| US9638750B2 (en) * | 2015-05-26 | 2017-05-02 | International Business Machines Corporation | Frequency-domain high-speed bus signal integrity compliance model |
-
2018
- 2018-03-19 CN CN201810224452.6A patent/CN108828427B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1377499A (en) * | 1999-10-01 | 2002-10-30 | 编码技术瑞典股份公司 | Efficient spectral envelope coding using variable time/frequency resolution and time/frequency switching |
| CN101004556A (en) * | 2006-12-21 | 2007-07-25 | 上海微电子装备有限公司 | Method for optimizing route for exposing wafer |
| CN101551767A (en) * | 2009-01-22 | 2009-10-07 | 浪潮电子信息产业股份有限公司 | Method for testing signal integrity of storage subsystem |
| CN104345260A (en) * | 2013-08-01 | 2015-02-11 | 鸿富锦精密工业（深圳）有限公司 | Signal completeness automatic testing system and method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108828427A (en) | 2018-11-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108089893B (en) | Method and device for determining redundant resources, terminal equipment and storage medium | |
| CN104657140B (en) | Code generating method and device | |
| CN108897724B (en) | Function completion progress determining method and device | |
| CN112306855B (en) | Interface automation test method, device, terminal and storage medium | |
| CN110096434A (en) | Interface testing method and device | |
| CN109522228B (en) | Interface automation test data construction method, device, platform and storage medium | |
| CN108664471B (en) | Character recognition error correction method, device, equipment and computer readable storage medium | |
| CN110134583B (en) | Software testing and data processing method and device | |
| CN108828427B (en) | Criterion searching method, device, equipment and storage medium for signal integrity test | |
| CN111190807A (en) | Buried point testing method and device | |
| CN112905441A (en) | Test case generation method, test method, device and equipment | |
| CN106557419B (en) | Program testing method and device | |
| CN111475402B (en) | Program function testing method and related device | |
| CN108733674B (en) | A2L file merging method and device | |
| CN112965912B (en) | Interface test case generation method and device and electronic equipment | |
| CN114141302A (en) | Test method of solid state disk and electronic equipment | |
| CN112084111B (en) | Data processing method, system and device | |
| CN111737349B (en) | Data consistency verification method and device | |
| CN110019357B (en) | Database query script generation method and device | |
| CN115757174A (en) | Database difference detection method and device | |
| CN106445949A (en) | Method and device for detecting data change in data table | |
| EP4131129A1 (en) | Report writing assistance system and report writing assistance method | |
| CN113971126A (en) | Test case generation method and system based on automobile instrument test | |
| CN107085553B (en) | Input box testing method and device | |
| CN114003484A (en) | Log output method, device and equipment for interface test and storage medium |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |