CN108802589A - Active device offset parameter determines method, apparatus, storage medium and electronic equipment - Google Patents
Active device offset parameter determines method, apparatus, storage medium and electronic equipment Download PDFInfo
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- CN108802589A CN108802589A CN201810555829.6A CN201810555829A CN108802589A CN 108802589 A CN108802589 A CN 108802589A CN 201810555829 A CN201810555829 A CN 201810555829A CN 108802589 A CN108802589 A CN 108802589A
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The embodiment of the present application discloses active device offset parameter and determines method, apparatus, storage medium and electronic equipment.Wherein method includes：The active device in equipment to be tested is obtained in current frequency range or the offset parameter range of frequency point, and determines at least two test offset parameters in the offset parameter range；Offset parameter is tested according to described at least two successively and the active device in the equipment to be tested is set, and determine corresponding linearity test value；The current frequency range or the target bias parameter of frequency point are determined according to the linearity test value and pre-set linearity threshold value.The embodiment of the present application is by using above-mentioned technical proposal, linearity test is carried out under multiple test offset parameters to each measurement equipment to be checked, according to the linearity test value of linearity test feedback, determine the target bias parameter of the active device of each equipment to be tested, it ensure that the superperformance of each equipment to be tested, the active device of same equipment is solved the problems, such as using performance difference caused by same group of offset parameter, improves the consistency of equipment performance.
Description
Technical field
The invention relates to technical field of electronic equipment more particularly to a kind of active device offset parameter determination sides
Method, device, storage medium and electronic equipment.
Background technology
In the electronic equipments such as mobile phone, wrist-watch and tablet computer, it is both provided with active device, such as amplifier.
Active device is the electronic device for being internally provided with power supply, is generally used to the amplification to signal or conversion, the requirement to the linearity
It is high.
It is mainly offset parameter, such as bias voltage and bias current to influence the parameter linearly spent of active device, right at present
It is arranged generally by such as under type in the bias voltage and bias current of active device：First, by the way that each frequency range is arranged
One group of bias voltage and bias current, second is that by one group of bias voltage of each frequency point setting in frequency range and bias current.Example
Property, referring to Fig. 1 a and Fig. 1 b, Fig. 1 a are the schematic diagram for each frequency range being arranged in the related technology offset parameter；Fig. 1 b are related skill
To the schematic diagram of each frequency point setting offset parameter in art.Wherein, the offset parameter of Fig. 1 a Mid Frequencies 1 is A, and the biasing of frequency range 2 is joined
Number is B, and the offset parameter of frequency range 3 is C, and the offset parameter of frequency range 4 is D.Similarly, in Fig. 1 b the offset parameter of each frequency point with such
It pushes away.And the offset parameter being arranged in above-mentioned Fig. 1 a and Fig. 1 b is applied to the active device of correspondence in same type of all electronic equipments
Part.
The set-up mode of above two offset parameter is to the same active device setting in same electronic equipment
Same group of offset parameter, but due to being had differences between the active device in each electronic equipment, same group of offset parameter can be led
It causes the performance of electronic equipment to have differences, influences the consistency of electronic equipment performance.
Invention content
The embodiment of the present application provides active device bias parameter determination method, device, storage medium and electronic equipment, realizes
The precise offset parameter for pointedly determining active device in each electronic equipment, improves the consistency of electronic equipment performance.
In a first aspect, the embodiment of the present application, which provides a kind of active device offset parameter, determines method, including：
The active device in equipment to be tested is obtained in current frequency range or the offset parameter range of frequency point, and in the biasing
At least two test offset parameters are determined in parameter area；
Offset parameter is tested according to described at least two successively and the active device in the equipment to be tested is set, and determine
Corresponding linearity test value；
The mesh of the current frequency range or frequency point is determined according to the linearity test value and pre-set linearity threshold value
Mark offset parameter.
Second aspect, the embodiment of the present application provide a kind of active device offset parameter determining device, including：
Offset parameter determining module is tested, for obtaining the active device in equipment to be tested in current frequency range or frequency point
Offset parameter range, and at least two test offset parameters are determined in the offset parameter range；
It is described to be measured to test offset parameter setting for successively according to described at least two for linearity test value determining module
The active device in equipment is tried, and determines corresponding linearity test value；
Target bias parameter determination module, for true according to the linearity test value and pre-set linearity threshold value
The target bias parameter of the fixed current frequency range or frequency point.
The third aspect, the embodiment of the present application provide a kind of computer readable storage medium, are stored thereon with computer journey
Sequence realizes that the active device offset parameter as described in the embodiment of the present application determines method when the program is executed by processor.
Fourth aspect, the embodiment of the present application provide a kind of electronic equipment, including memory, processor and are stored in storage
On device and the computer program that can run on a processor, the processor realize such as the application when executing the computer program
Active device offset parameter described in embodiment determines method.
The active device offset parameter provided in the embodiment of the present application determines method, obtains the active device in equipment to be tested
Part determines at least two test biasing ginsengs in current frequency range or the offset parameter range of frequency point in the offset parameter range
The active device in equipment to be tested is arranged according to determining test offset parameter successively in number, and determines that the corresponding linearity is surveyed
Examination value determines current frequency range or the target bias parameter of frequency point according to linearity test value and pre-set linearity threshold value.
By using said program, linearity test is carried out under multiple test offset parameters to each measurement equipment to be checked, according to line
Property degree test feedback linearity test value, determine the target bias parameter of the active device of each equipment to be tested, ensure
The superperformance of each equipment to be tested, solves performance difference caused by same group of offset parameter of same equipment application
Problem improves the consistency of equipment performance.
Description of the drawings
Fig. 1 a are the schematic diagram for each frequency range being arranged in the related technology offset parameter；
Fig. 1 b are in the related technology to the schematic diagram of each frequency point setting offset parameter；
Fig. 2 is the flow diagram that a kind of active device offset parameter provided by the embodiments of the present application determines method；
Fig. 3 a are the schematic diagram of each frequency range setting test offset parameter provided by the embodiments of the present application；
Fig. 3 b are the schematic diagram that each frequency point setting provided by the embodiments of the present application tests offset parameter；
Fig. 4 a are the flow diagram that another active device offset parameter provided by the embodiments of the present application determines method；
Fig. 4 b are change curve of the linearity test value provided by the embodiments of the present application with offset parameter；
Fig. 5 is the flow diagram that another active device offset parameter provided by the embodiments of the present application determines method；
Fig. 6 is the flow diagram that another active device offset parameter provided by the embodiments of the present application determines method；
Fig. 7 is a kind of structural schematic diagram of active device offset parameter determining device provided by the embodiments of the present application；
Fig. 8 is the structural schematic diagram of a kind of electronic equipment provided by the embodiments of the present application；
Fig. 9 is the structural schematic diagram of another electronic equipment provided by the embodiments of the present application.
Specific implementation mode
Further illustrate the technical solution of the application below with reference to the accompanying drawings and specific embodiments.It is appreciated that
It is that specific embodiment described herein is used only for explaining the application, rather than the restriction to the application.It further needs exist for illustrating
, illustrate only for ease of description, in attached drawing and the relevant part of the application rather than entire infrastructure.
It should be mentioned that some exemplary embodiments are described as before exemplary embodiment is discussed in greater detail
The processing described as flow chart or method.Although each step is described as the processing of sequence, many of which by flow chart
Step can be implemented concurrently, concomitantly or simultaneously.In addition, the sequence of each step can be rearranged.When its operation
The processing can be terminated when completion, it is also possible to the additional step being not included in attached drawing.The processing can be with
Corresponding to method, function, regulation, subroutine, subprogram etc..
Fig. 2 is the flow diagram that a kind of active device offset parameter provided by the embodiments of the present application determines method, the party
Method can be executed by active device offset parameter determining device, and wherein the device can generally be collected by software and or hardware realization
At in the electronic device.As shown in Fig. 2, this method includes：
Step 201 obtains active device in equipment to be tested in current frequency range or the offset parameter range of frequency point, and
At least two test offset parameters are determined in the offset parameter range.
Illustratively, the electronic equipment in the embodiment of the present application may include the smart machines such as mobile phone and tablet computer.
Wherein, active device is the electronic component for being internally provided with power supply, and illustratively, active device may include but not
Be limited to operational amplifier and power amplifier etc., requirement of the above-mentioned active device to the linearity is high, therefore in different frequency range or
The different offset parameter of setting of person's frequency point, with ensure active device different frequency range or frequency point the linearity.
Illustratively, it can be true according to historical experience that each active device, which needs the frequency range that offset parameter is arranged and frequency point,
It is fixed, it can also be and the frequency range or frequency point that frequency-flat divides are carried out to the operating frequency range of active device.
Illustratively, each frequency range or the offset parameter range of frequency point can be determining based on experience value, and can also be will have
Source device carries out numberical range extension in each frequency range or the fixed offset parameter of frequency point and determines, for example, being put for active device
The numerical value of a certain offset parameter of big device is 0.9, then the range of the offset parameter of amplifier can be determined as (0.9-0.5,
0.9+0.5), wherein 0.5 is numerical value spreading range.Wherein spreading range and measurement equipment to be checked, active device and offset parameter
Type is related.Wherein, the offset parameter of active device includes bias voltage and bias current.Illustratively, active device amplifies
Device can be provided with bias voltage ranges and bias-current range in current frequency point or frequency range.
In the present embodiment, after the current frequency range of determination or the offset parameter range of frequency point, in above-mentioned offset parameter range
At least two numerical value of middle screening are as test offset parameter, wherein test offset parameter is used for in above-mentioned measurement equipment to be checked
Active device carries out linearity test, further determines that and meets the biasing that the active device in the measurement equipment to be checked linearly spends requirement
Parameter.It should be noted that linearity test is carried out for the active device in each measurement equipment to be checked in the present embodiment,
And determine the offset parameter of the active device in each measurement equipment to be checked, wherein active device in each measurement equipment to be checked
Offset parameter can be identical or different, be not construed as limiting to this, as long as ensureing the line of the active device in each measurement equipment to be checked
Property degree.
Illustratively, referring to Fig. 3 a and Fig. 3 b, Fig. 3 a each frequency range setting test offset parameters provided by the embodiments of the present application
Schematic diagram；Fig. 3 b are the schematic diagrames of each frequency point setting test offset parameter provided by the embodiments of the present application.Wherein, Fig. 3 a intermediate frequencies
The test offset parameter of section 1 is A1, A2 and A3, and the test offset parameter of frequency range 2 is B1, B2 and B3, the test biasing ginseng of frequency range 3
Number is C1, C2 and C3, and the test offset parameter of frequency range 4 is D1, D2 and D3, and similarly, the frequency point and corresponding test in Fig. 3 b are inclined
Set parameter.Fig. 3 a and Fig. 3 b are only a kind of examples, the frequency range of active device and the quantity of frequency point in measurement equipment to be checked
3 are not limited to, the frequency range of active device can be related to the type of active device according to the measurement equipment to be checked to the quantity of frequency point,
Illustratively, the operating frequency range of active device is bigger in measurement equipment to be checked, it is thus necessary to determine that the frequency range or frequency point of offset parameter
Quantity is bigger.The quantity of the test offset parameter of each frequency range or frequency point is also not necessarily limited to 3, can be determined according to user demand.It surveys
The quantity of examination offset parameter can be determined according to accuracy requirement and test job amount demand.Wherein, the number of offset parameter is tested
Amount is bigger, and the determination precision of offset parameter is higher, and test job amount is bigger, correspondingly, the quantity of test offset parameter is smaller, partially
The determination precision for setting parameter is lower, and test job amount is smaller.Illustratively, test offset parameter can be in offset parameter range
Middle random selection determines, can also be and is determined according to preset screening rule.
In some embodiments, at least two test offset parameters are determined in the offset parameter range, including：According to
The quantity for testing offset parameter determines test offset parameter in the offset parameter range according to uniform intervals.
Illustratively, if the numberical range of offset parameter is 0.5-1.5, the quantity for testing offset parameter is 5, it may be determined that each
The uniform intervals tested between offset parameter are 0.25, further can determine test offset parameter be respectively 0.5,0.75,1.0,
1.25 with 1.5.Pass through the uniform filler test offset parameter in offset parameter range so that the test offset parameter filtered out is equal
It is even to be distributed in offset parameter range, the linearity situation of each subrange in offset parameter range is can determine by linearity test,
Offset parameter determines inaccurate problem caused by avoiding the test offset parameter due to arbitrary subrange from omitting.
In some embodiments, at least two test offset parameters are determined in the offset parameter range, including：Statistics
The active device of same equipment to be tested is determined in current frequency range or the target bias parameter of frequency point according to statistical result
Distribution density of the target bias parameter in each subrange of offset parameter range；According to the quantity of test offset parameter and each sub- model
The distribution density enclosed determines test offset parameter.
Due to carrying out linearity test to each measurement equipment to be checked, linearity survey is being carried out to current measurement equipment to be checked
Before examination, statistics according to linearity test it is determining with the current same type of other equipment of measurement equipment to be checked this is active
The target bias parameter of device, wherein target bias parameter is expired by what linearity test was screened in testing offset parameter
The offset parameter of sufficient linearity.Illustratively, offset parameter range is divided into multiple subranges, wherein subrange
Quantity can determine that the quantity for testing offset parameter is bigger, the number of the subrange of division according to the quantity of test offset parameter
Amount can be bigger.Such as offset parameter ranging from 0.5-1.5, then can be that the offset parameter range is divided into 5 sub- models
It encloses, i.e. 0.5-0.7,0.7-0.9,0.9-1.1,1.1-1.3 and 1.3-1.5.If the number of devices by test of statistics is
100, quantity of the target bias parameter distribution in above-mentioned 5 subranges is respectively 10,21,48,14 and 7, then can determine target
Offset parameter is respectively 10%, 21%, 48%, 14% and 7% in the distribution density of above-mentioned 5 subranges.If test biasing ginseng
Several total quantitys is 10, can determine in each subrange and tests according to the distribution density of the total quantity of test offset parameter and subrange
The quantity of offset parameter is respectively 1,2,5,1 and 1.Need to have a talk about it is bright, in each subrange test offset parameter quantity it is equal
For the positive integer more than or equal to 0, when obtaining subrange according to the total quantity of test offset parameter and the distribution density of subrange
When the quantity of middle test offset parameter is decimal, it can be accepted or rejected so that the sum of the quantity of offset parameter is tested in each subrange
Value is equal to the total quantity of test offset parameter.
After determining the quantity of test offset parameter of each subrange, uniform intervals can be carried out in each subrange
Numerical value screening, such as 0.5-0.7 subranges quantity be 1, it may be determined that the test offset parameter of the subrange be 0.6,
The quantity of 0.9-1.1 subranges is 5, it may be determined that the test offset parameter of the subrange is 0.9,0.95,1.0,1.05 and 1.1.
Similarly, the test offset parameter of other subranges can be determined according to aforesaid way, while avoiding the boundary value of different subranges
It repeats to select.
The target bias parameter that active device in the equipment of linearity test is had been subjected to by statistics sets to be currently to be detected
The screening of standby middle test offset parameter provides foundation, improves the accuracy of test offset parameter, further increases and currently wait for
The choice accuracy of the target bias parameter of active device in detection device.
Step 202, successively according to it is described at least two test offset parameter the active device in the equipment to be tested is set
Part, and determine corresponding linearity test value.
Illustratively, according to the working frequency of active device in current frequency range or frequency point setting equipment to be tested, and according to
It tests offset parameter and active device is set, carry out linearity test.The test result of wherein linearity test is tested for the linearity
Value is above-mentioned test offset parameter for characterizing in equipment to be tested active device in current frequency range or frequency point and offset parameter
When the linearity.The linearity is characterized by the linearity test value of numeric form by digital quantization to be conducive to different tests
The linearity of offset parameter is compared and screens.
Step 203, determined according to the linearity test value and pre-set linearity threshold value the current frequency range or
The target bias parameter of frequency point.
Wherein, linearity threshold value is to meet the least restrictive number of degrees value of linearity, for example, being greater than or equal to the linearity
The corresponding test offset parameter of linearity test value of threshold value meets linearity, and the linearity for being less than linearity threshold value is tested
It is worth corresponding test offset parameter and is unsatisfactory for linearity.The linearity that meet demand can be filtered out by linearity threshold value is surveyed
Examination value and corresponding test offset parameter.
In some embodiments, can be surveyed in the linearity for meeting linearity filtered out by linearity threshold value
In examination value, the corresponding test offset parameter of any linearity test value is randomly choosed, the target as current frequency range or frequency point is inclined
Set parameter.
In some embodiments, it is determined according to the linearity test value and pre-set linearity threshold value described current
The target bias parameter of frequency range or frequency point, including：Linearity test value of the screening more than or equal to the linearity threshold value；It is sieving
The maximum value of linearity test value is determined in the linearity test value selected, the maximum value of the linearity test value is corresponding
Test offset parameter is determined as target bias parameter.
Wherein, linearity test value shows that more greatly the linearity of active device is better, in the present embodiment, is meeting the linearity
It is required that at least one linearity test value in determining maximum, i.e., corresponding test biasing when active device linearly being spent optimal
Parameter is determined as target bias parameter so that active device can keep optimum linearity degree in current frequency range or frequency point, improve and wait for
The performance of detection device.
It should be noted that if there is no when the linearity test value for being greater than or equal to linearity threshold value, return is set again
Current frequency range or the offset parameter range of frequency point are set, and redefines new test offset parameter and carries out linearity test.To not
Same frequency range or frequency point can be used the above method and determine corresponding target bias parameter, it is ensured that the active device of measurement equipment to be checked
Superperformance of the part in different operating frequency.
The active device offset parameter provided in the embodiment of the present application determines method, obtains the active device in equipment to be tested
Part determines at least two test biasing ginsengs in current frequency range or the offset parameter range of frequency point in the offset parameter range
The active device in equipment to be tested is arranged according to determining test offset parameter successively in number, and determines that the corresponding linearity is surveyed
Examination value determines current frequency range or the target bias parameter of frequency point according to linearity test value and pre-set linearity threshold value.
By using said program, linearity test is carried out under multiple test offset parameters to each measurement equipment to be checked, according to line
Property degree test feedback linearity test value, determine the target bias parameter of the active device of each equipment to be tested, ensure
The superperformance of each equipment to be tested, solves performance difference caused by same group of offset parameter of same equipment application
Problem improves the consistency of equipment performance.
Fig. 4 a are the flow diagram that another active device offset parameter provided by the embodiments of the present application determines method, ginseng
See that Fig. 4 a, the method for the present embodiment include the following steps：
Step 401 obtains active device in equipment to be tested in current frequency range or the offset parameter range of frequency point, and
At least two test offset parameters are determined in the offset parameter range.
Step 402, successively according to it is described at least two test offset parameter the active device in the equipment to be tested is set
Part, and determine corresponding linearity test value.
Step 403, screening are more than the linearity test value of the linearity threshold value.
Step 404 generates change curve of the linearity test value with offset parameter according to the linearity test value filtered out.
Due to testing the restriction of offset parameter quantity, each numerical value in offset parameter range cannot be traversed, is caused each
It tests between offset parameter in the presence of interval.The selection target offset parameter only in testing offset parameter exists and omits just bias ginseng
Several situations.In the present embodiment, line is generated according to the linearity test value for meeting linearity and corresponding offset parameter
Property degree test value with offset parameter change curve, can by the change curve show linearity test value with offset parameter change
Change trend.Illustratively, it is variation of the linearity test value provided by the embodiments of the present application with offset parameter referring to Fig. 4 b, Fig. 4 b
Curve.According to Fig. 4 b it is found that linearity test value first increases with the increase of offset parameter, after increasing to maximum value, with inclined
It sets the increase of parameter and reduces.
Step 405 determines linearity test value most according to the linearity test value with the change curve of offset parameter
Big value, is determined as target bias parameter by the corresponding offset parameter of maximum value of the linearity test value.
Illustratively, according to Fig. 4 b it is found that test offset parameter be respectively 0.5,0.75,1.0,1.25 and 1.5, and respectively
A corresponding linearity test value, linearity test value maximum value position is A in the change curve of Fig. 4 b, corresponding biasing ginseng
Number is B, and offset parameter B belongs to offset parameter range, but is not test offset parameter.It is inclined that offset parameter B is determined as target
Parameter is set, the active device of measurement equipment to be checked may make to be in optimum linear degree in current frequency range or frequency point.
The active device offset parameter provided in the embodiment of the present application determines method, by meeting the linearity and wanting filtering out
After the linearity test value asked, formation linearity test value is with the change curve of offset parameter, the variation based on the change curve
Trend determines the maximum value of linearity test value, and further determines that current frequency range or the target bias parameter of frequency point so that mesh
The selection of mark offset parameter is no longer limited in test offset parameter, is conducive to determine that the optimum linear degree of active device is corresponding
Offset parameter, to improve the performance of measurement equipment to be checked.
Fig. 5 is the flow diagram that another active device offset parameter provided by the embodiments of the present application determines method, this
Embodiment is an alternative of above-described embodiment, correspondingly, as shown in figure 5, the method for the present embodiment includes the following steps：
Step 501 obtains active device in equipment to be tested in current frequency range or the offset parameter range of frequency point, and
At least two test offset parameters are determined in the offset parameter range.
Step 502, successively according to it is described at least two test offset parameter the active device in the equipment to be tested is set
Part, and determine corresponding linearity test value.
Step 503, screening are more than the linearity test value of the linearity threshold value.
Step 504 generates change curve of the linearity test value with offset parameter according to the linearity test value filtered out,
And determine that the linearity test value is inclined with the two neighboring test of inflection point and the inflection point in the change curve of offset parameter
Set parameter.
Wherein, the selection based on linearity test value requires, and the inflection point in change curve is that change curve medium wave peak corresponds to
Point.Illustratively, referring to Fig. 4 b, linearity test value is A points with the inflection point in the change curve of offset parameter, and A points are adjacent
Two test offset parameters be respectively 0.75 and 1.0.
Step 505, in the range between the two neighboring test offset parameter, determine newly-increased test offset parameter.
Wherein, by the range of choice of the ranging from target bias parameter between the two neighboring test offset parameter of inflection point,
Newly-increased test offset parameter can be that uniform intervals determine in the range between two neighboring test offset parameter, and it is inclined to increase test newly
The quantity for setting parameter can be determined according to range between above-mentioned two neighboring test offset parameter, such as range is bigger, increase newly
The quantity for testing offset parameter is bigger, conversely, range is smaller, the quantity for increasing test offset parameter newly is smaller.
Optionally, before determining newly-increased test offset parameter, further include：Judge above-mentioned two neighboring test offset parameter
Difference whether be more than preset value, determine newly-increased test offset parameter step if so, executing；If it is not, then according to above-mentioned linear
Degree test value determines target bias parameter with the change curve of offset parameter.Wherein, preset value can be according to offset parameter
Type determines.
Step 506 determines the corresponding linearity test value of the newly-increased test offset parameter, and updates linearity test value
With the change curve of offset parameter.
Since the corresponding change curve of range is according to linearity test value between above-mentioned two neighboring test offset parameter
Variation tendency determine, there is inaccuracy in the wherein corresponding linear angle value of each offset parameter, by increase
The newly-increased test offset parameter in the range between two neighboring test offset parameter is stated, each newly-increased survey in above range is accurately obtained
Try the corresponding linearity test value of offset parameter so that updated linearity test value with offset parameter change curve more
Accurately.
Step 507 determines linearity test value according to updated linearity test value with the change curve of offset parameter
Maximum value, the corresponding offset parameter of maximum value of the linearity test value is determined as target bias parameter.
The active device offset parameter provided in the embodiment of the present application determines method, according to the line for meeting linearity
Property degree test value generate linearity test value with the change curve of offset parameter after, determine the linearity test value with biasing
The two neighboring test offset parameter of inflection point and the inflection point in the change curve of parameter, in above-mentioned two neighboring test biasing ginseng
In the range between number, newly-increased test offset parameter is determined, and determine its corresponding linearity test value, and update linearity test
Value is determined as according to updated linearity test value with the change curve of offset parameter active with the change curve of offset parameter
Device is in current frequency range or the target bias parameter of frequency point.By by the two neighboring test offset parameter of inflection point in change curve
Be determined as the range of target bias parameter, reduce the appearance range of target bias parameter, and to this reduce the scope it is interior increase into
The newly-increased test offset parameter of row linearity test further increases target bias parameter to improve the accuracy of change curve
Choice accuracy.
Fig. 6 is the flow diagram that another active device offset parameter provided by the embodiments of the present application determines method, this reality
The alternative that example is above-described embodiment is applied, correspondingly, as shown in fig. 6, the method for the present embodiment includes the following steps：
Step 601 obtains active device in equipment to be tested in current frequency range or the offset parameter range of frequency point, and
At least two test offset parameters are determined in the offset parameter range.
Step 602, successively according to it is described at least two test offset parameter the active device in the equipment to be tested is set
Part, and determine corresponding linearity test value.
Step 603, determined according to the linearity test value and pre-set linearity threshold value the current frequency range or
The target bias parameter of frequency point.
Step 604, generated according to the target bias parameter of determining each frequency range or frequency point target bias parameter with frequency range or
The change curve of frequency point.
Wherein, the target bias determination method for parameter of each frequency range or frequency point is identical, since frequency range is a frequency band, respectively
There is also interval between frequency point, each numerical value in the operating frequency range of active device can not be traversed so that in active device
When part works, there are the selection deviations of target bias parameter.
In the present embodiment, change of the target bias parameter with frequency range is generated according to the target bias parameter of fixed each frequency range
Change curve；Similarly, change curve of the target bias parameter with frequency range is generated according to the target bias parameter of fixed each frequency point.
Each frequency range is divided at least two frequency sub-band by step 605, or, determining the interval between each frequency point
Frequency point.
Illustratively, each frequency range can be evenly dividing according to the quantity of frequency sub-band, such as a frequency range is divided into 3
A frequency sub-band.Setting interval frequency point, can be uniformly arranged between two adjacent frequency ranges between two adjacent frequency ranges,
The quantity of interval frequency point can be one or more.
Step 606, according to the target bias parameter with frequency range or the change curve of frequency point, determine the frequency sub-band or institute
State the target bias parameter of interval frequency point.
Illustratively, the target bias parameter for determining frequency sub-band with the change curve of frequency range according to target bias parameter, can
To be the target bias parameter by the target bias parameter of the frequency range as the frequency range center, if for example, frequency sub-band quantity is single
Number, then by the target bias parameter of frequency sub-band centered on the target bias parameter of the frequency range, if frequency sub-band quantity is even numbers,
Using the target bias parameter of the frequency range as the target bias parameter of the frequency range centre frequency, according to existing target bias parameter
Variation tendency, formed change curve, by the centre frequency of each frequency sub-band, corresponding offset parameter is true in above-mentioned change curve
It is set to the corresponding target bias parameter of each frequency sub-band.
Similarly, the target bias parameter of frequency sub-band, Ke Yishi are determined with the change curve of frequency point according to target bias parameter
By each interval frequency point, corresponding offset parameter is determined as each sub- frequency point correspondence in target bias parameter is with the change curve of frequency point
Target bias parameter.
In some embodiments, it after the target bias parameter for determining the frequency sub-band or the interval frequency point, also wraps
It includes：The target bias parameter of the frequency sub-band or the interval frequency point is verified；If the frequency sub-band or interval frequency
The corresponding linearity test value of target bias parameter of point is less than the pre-set linearity threshold value, then abandons the son frequency
The target bias parameter of section or the interval frequency point.
The target bias parameter of frequency sub-band is verified, wherein verification mode can be according to frequency sub-band or interval
The working frequency of active device in frequency point setting equipment to be tested, and according to corresponding target bias parameter setting active device,
Carry out linearity test.If obtained linearity test value is greater than or equal to pre-set linearity threshold value, it is determined that verification
Success retains the frequency sub-band or is spaced the target bias parameter of frequency point, pre-set if obtained linearity test value is less than
Linearity threshold value, it is determined that verification failure, abandon the frequency sub-band or it is described interval frequency point target bias parameter.It is optional
, after verification fails, it can be directed to the frequency sub-band or interval frequency point of verification failure, offset parameter model is targetedly set
It encloses, and determines that method determines that above-mentioned frequency sub-band or the target bias of interval frequency point are joined according to offset parameter provided by the present application
Number.
The whole active device offset parameter provided in the embodiment of the present application determines method, passes through fixed frequency range or frequency point
Target bias parameter determine the change curve of target bias parameter, it is corresponding in the curve according to frequency sub-band or interval frequency point
Offset parameter determines frequency sub-band or the target bias parameter for being spaced frequency point, reduces the frequency spacing of setting target bias parameter,
Improve the operating accuracy of active device at different frequencies in measurement equipment to be checked.
Fig. 7 is a kind of structure diagram of active device offset parameter determining device provided by the embodiments of the present application, the device
It can be typically integrated in electronic equipment by software and or hardware realization, ginseng can be biased by executing the active device of electronic equipment
Number determines method to determine the offset parameter of active device in equipment to be tested.As shown in fig. 7, the device includes：Test biasing
Parameter determination module 701, linearity test value determining module 702 and target bias parameter determination module 703.
Offset parameter determining module 701 is tested, for obtaining the active device in equipment to be tested in current frequency range or frequency
The offset parameter range of point, and at least two test offset parameters are determined in the offset parameter range；
Linearity test value determining module 702, for being tested described in offset parameter setting according to described at least two successively
Active device in equipment to be tested, and determine corresponding linearity test value；
Target bias parameter determination module 703, for according to the linearity test value and pre-set linearity threshold
Value determines the current frequency range or the target bias parameter of frequency point.
The active device offset parameter determining device provided in the embodiment of the present application, to each measurement equipment to be checked multiple
It tests and carries out linearity test under offset parameter, according to the linearity test value of linearity test feedback, determine that each is to be measured
The target bias parameter for trying the active device of equipment, ensure that the superperformance of each equipment to be tested, solves same
Performance difference problem caused by same group of offset parameter of equipment application, improves the consistency of equipment performance.
On the basis of the above embodiments, test offset parameter determining module 701 is used for：
According to the quantity of test offset parameter, test biasing ginseng is determined according to uniform intervals in the offset parameter range
Number；Alternatively,
The active device of same equipment to be tested is counted in current frequency range or the target bias parameter of frequency point, according to
Statistical result determine target bias parameter each subrange of offset parameter range distribution density；
According to the distribution density of the quantity and each subrange of test offset parameter, test offset parameter is determined.
On the basis of the above embodiments, target bias parameter determination module 703 includes：
First linearity test value screening unit, for screening the linearity test value more than the linearity threshold value；
First object offset parameter determination unit, for determining linearity test value in the linearity test value filtered out
Maximum value, the corresponding test offset parameter of the maximum value of the linearity test value is determined as target bias parameter.
On the basis of the above embodiments, target bias parameter determination module 703 includes：
Second linearity test value screening unit, for screening the linearity test value more than the linearity threshold value；
First change curve generation unit, for generating linearity test value with inclined according to the linearity test value filtered out
Set the change curve of parameter；
Second target bias parameter determination unit is used for according to the linearity test value with the change curve of offset parameter
It is inclined to be determined as target by the maximum value for determining linearity test value for the corresponding offset parameter of maximum value of the linearity test value
Set parameter.
On the basis of the above embodiments, target bias parameter determination module 703 further includes：
Knee of curve determination unit, for determining line with the change curve of offset parameter according to the linearity test value
Before the maximum value of property degree test value, determine the linearity test value with inflection point in the change curve of offset parameter and described
The two neighboring test offset parameter of inflection point；
Newly-increased test offset parameter determination unit, is used in the range between the two neighboring test offset parameter, really
Fixed newly-increased test offset parameter；
Change curve updating unit, for determining the corresponding linearity test value of the newly-increased test offset parameter, and more
New linearity test value with offset parameter change curve；
Correspondingly, the second target bias parameter determination unit is used for according to updated linearity test value with offset parameter
Change curve determine the maximum value of linearity test value.
On the basis of the above embodiments, further include：
Second change curve generation module, after determining the target bias parameter of each frequency range or frequency point, according to true
The target bias parameter of fixed each frequency range or frequency point generates target bias parameter with frequency range or the change curve of frequency point；
Frequency sub-band generation module, for each frequency range to be divided at least two frequency sub-band；
It is spaced frequency point determining module, for determining the interval frequency point between each frequency point；
Third target bias parameter determination module, for bent with the variation of frequency range or frequency point according to the target bias parameter
Line determines the target bias parameter of the frequency sub-band or the interval frequency point.
On the basis of the above embodiments, further include：
Target bias parameter verification module, in the target bias parameter for determining the frequency sub-band or the interval frequency point
Later, the target bias parameter of the frequency sub-band or the interval frequency point is verified；
Target bias parameter processing module, if the target bias parameter for the frequency sub-band or the interval frequency point corresponds to
Linearity test value be less than the pre-set linearity threshold value, then abandon the frequency sub-band or the interval frequency point, with
And the target bias parameter of the frequency sub-band or the interval frequency point.
The embodiment of the present application also provides a kind of storage medium including computer executable instructions, and the computer is executable
Instruction determines that method, this method include when being executed by computer processor for executing active device offset parameter：
The active device in equipment to be tested is obtained in current frequency range or the offset parameter range of frequency point, and in the biasing
At least two test offset parameters are determined in parameter area；
Offset parameter is tested according to described at least two successively and the active device in the equipment to be tested is set, and determine
Corresponding linearity test value；
The mesh of the current frequency range or frequency point is determined according to the linearity test value and pre-set linearity threshold value
Mark offset parameter.
Storage medium --- any various types of memory devices or storage device.Term " storage medium " is intended to wrap
It includes：Install medium, such as CD-ROM, floppy disk or magnetic tape equipment；Computer system memory or random access memory, such as
DRAM, DDRRAM, SRAM, EDORAM, blue Bath (Rambus) RAM etc.；Nonvolatile memory, such as flash memory, magnetic medium (example
Such as hard disk or optical storage)；The memory component etc. of register or other similar types.Storage medium can further include other types
Memory or combinations thereof.In addition, storage medium can be located at program in the first computer system being wherein performed, or
It can be located in different second computer systems, second computer system is connected to the first meter by network (such as internet)
Calculation machine system.Second computer system can provide program instruction to the first computer for executing.Term " storage medium " can
To include two or more that may reside in different location (such as in different computer systems by network connection)
Storage medium.Storage medium can store the program instruction that can be executed by one or more processors and (such as be implemented as counting
Calculation machine program).
Certainly, a kind of storage medium including computer executable instructions that the embodiment of the present application is provided, computer
The active device offset parameter that executable instruction is not limited to the described above determines operation, and the application any embodiment can also be performed
The active device offset parameter provided determines the relevant operation in method.
The embodiment of the present application provides a kind of electronic equipment, and can be integrated in the electronic equipment provided by the embodiments of the present application has
Source device bias parameter determining device.Fig. 8 is the structural schematic diagram of a kind of electronic equipment provided by the embodiments of the present application.Electronics is set
Standby 800 may include：Memory 801, processor 802 and is stored in the calculating that can be run on memory 801 and in processor 802
Machine program, the processor 802 realize the active device biasing as described in the embodiment of the present application when executing the computer program
Parameter determination method.
Electronic equipment provided by the embodiments of the present application carries out each measurement equipment to be checked under multiple test offset parameters
The linearity is tested, and according to the linearity test value of linearity test feedback, determines the active device of each equipment to be tested
Target bias parameter ensure that the superperformance of each equipment to be tested, solve the same group of biasing of same equipment application
Performance difference problem caused by parameter improves the consistency of equipment performance.
Fig. 9 is the structural schematic diagram of another electronic equipment provided by the embodiments of the present application.The electronic equipment may include：
Shell (not shown), memory 901, central processing unit (central processing unit, CPU) 902 (are also known as located
Manage device, hereinafter referred to as CPU), circuit board (not shown) and power circuit (not shown).The circuit board is placed in institute
State the space interior that shell surrounds；The CPU902 and the memory 901 are arranged on the circuit board；The power supply electricity
Road, for being each circuit or the device power supply of the electronic equipment；The memory 901, for storing executable program generation
Code；The CPU902 is run and the executable journey by reading the executable program code stored in the memory 901
The corresponding computer program of sequence code, to realize following steps：
The active device in equipment to be tested is obtained in current frequency range or the offset parameter range of frequency point, and in the biasing
At least two test offset parameters are determined in parameter area；
Offset parameter is tested according to described at least two successively and the active device in the equipment to be tested is set, and determine
Corresponding linearity test value；
The mesh of the current frequency range or frequency point is determined according to the linearity test value and pre-set linearity threshold value
Mark offset parameter.
The electronic equipment further includes：Peripheral Interface 903, RF (Radio Frequency, radio frequency) circuit 905, audio-frequency electric
Road 906, loud speaker 911, power management chip 908, input/output (I/O) subsystem 909, other input/control devicess 910,
Touch screen 912, other input/control devicess 910 and outside port 904, these components pass through one or more communication bus
Or signal wire 907 communicates.
It should be understood that diagram electronic equipment 900 is only an example of electronic equipment, and electronic equipment 900
Can have than shown in the drawings more or less component, can combine two or more components, or can be with
It is configured with different components.Various parts shown in the drawings can be including one or more signal processings and/or special
It is realized in the combination of hardware, software or hardware and software including integrated circuit.
The electronic equipment with regard to provided in this embodiment for determining operation to active device offset parameter carries out detailed below
Description, the electronic equipment is by taking mobile phone as an example.
Memory 901, the memory 901 can be by access such as CPU902, Peripheral Interfaces 903, and the memory 901 can
Can also include nonvolatile memory to include high-speed random access memory, such as one or more disk memory,
Flush memory device or other volatile solid-state parts.
The peripheral hardware that outputs and inputs of equipment can be connected to CPU902 and deposited by Peripheral Interface 903, the Peripheral Interface 903
Reservoir 901.
I/O subsystems 909, the I/O subsystems 909 can be by the input/output peripherals in equipment, such as touch screen 912
With other input/control devicess 910, it is connected to Peripheral Interface 903.I/O subsystems 909 may include 9091 He of display controller
One or more input controllers 9092 for controlling other input/control devicess 910.Wherein, one or more input controls
Device 9092 processed receives electric signal from other input/control devicess 910 or sends electric signal to other input/control devicess 910,
Other input/control devicess 910 may include physical button (pressing button, rocker buttons etc.), dial, slide switch, behaviour
Vertical pole clicks idler wheel.It is worth noting that input controller 9092 can with it is following any one connect：Keyboard, infrared port,
The indicating equipment of USB interface and such as mouse.
Touch screen 912, the touch screen 912 are the input interface and output interface between consumer electronic devices and user,
Visual output is shown to user, visual output may include figure, text, icon, video etc..
Display controller 9091 in I/O subsystems 909 receives electric signal from touch screen 912 or is sent out to touch screen 912
Electric signals.Touch screen 912 detects the contact on touch screen, and the contact detected is converted to and is shown by display controller 9091
The interaction of user interface object on touch screen 912, that is, realize human-computer interaction, the user interface being shown on touch screen 912
Object can be the icon of running game, be networked to the icon etc. of corresponding network.It is worth noting that equipment can also include light
Mouse, light mouse are the extensions for the touch sensitive surface for not showing the touch sensitive surface visually exported, or formed by touch screen.
RF circuits 905 are mainly used for establishing the communication of mobile phone and wireless network (i.e. network side), realize mobile phone and wireless network
The data receiver of network and transmission.Such as transmitting-receiving short message, Email etc..Specifically, RF circuits 905 receive and send RF letters
Number, RF signals are also referred to as electromagnetic signal, and RF circuits 905 convert electrical signals to electromagnetic signal or electromagnetic signal is converted to telecommunications
Number, and communicated with communication network and other equipment by the electromagnetic signal.RF circuits 905 may include for executing
The known circuit of these functions comprising but it is not limited to antenna system, RF transceivers, one or more amplifiers, tuner, one
A or multiple oscillators, digital signal processor, CODEC (COder-DECoder, coder) chipset, user identifier mould
Block (Subscriber Identity Module, SIM) etc..
Voicefrequency circuit 906 is mainly used for receiving audio data from Peripheral Interface 903, which is converted to telecommunications
Number, and the electric signal is sent to loud speaker 911.
Loud speaker 911, the voice signal for receiving mobile phone from wireless network by RF circuits 905, is reduced to sound
And play the sound to user.
Power management chip 908, the hardware for being connected by CPU902, I/O subsystem and Peripheral Interface are powered
And power management.
Active device offset parameter determining device, storage medium and the electronic equipment provided in above-described embodiment is executable originally
The active device offset parameter that is there is provided of application any embodiment determines method, have execute the corresponding function module of this method and
Advantageous effect.The not technical detail of detailed description in the above-described embodiments, reference can be made to having of being provided of the application any embodiment
Source device bias parameter determination method.
Note that above are only preferred embodiment and the institute's application technology principle of the application.It will be appreciated by those skilled in the art that
The application is not limited to specific embodiment described here, can carry out for a person skilled in the art it is various it is apparent variation,
The protection domain readjusted and substituted without departing from the application.Therefore, although being carried out to the application by above example
It is described in further detail, but the application is not limited only to above example, in the case where not departing from the application design, also
May include other more equivalent embodiments, and scope of the present application is determined by scope of the appended claims.
Claims (10)
1. a kind of active device offset parameter determines method, which is characterized in that including：
The active device in equipment to be tested is obtained in current frequency range or the offset parameter range of frequency point, and in the offset parameter
At least two test offset parameters are determined in range；
Offset parameter is tested according to described at least two successively and the active device in the equipment to be tested is set, and determine and correspond to
Linearity test value；
Determine that the target of the current frequency range or frequency point is inclined according to the linearity test value and pre-set linearity threshold value
Set parameter.
2. according to the method described in claim 1, it is characterized in that, determining at least two tests in the offset parameter range
Offset parameter, including：
According to the quantity of test offset parameter, test offset parameter is determined according to uniform intervals in the offset parameter range；
Alternatively,
The active device of same equipment to be tested is counted in current frequency range or the target bias parameter of frequency point, according to statistics
As a result distribution density of the determining target bias parameter in each subrange of offset parameter range；
According to the distribution density of the quantity and each subrange of test offset parameter, test offset parameter is determined.
3. according to the method described in claim 1, it is characterized in that, according to the linearity test value and pre-set linear
Degree threshold value determines the current frequency range or the target bias parameter of frequency point, including：
Linearity test value of the screening more than or equal to the linearity threshold value；
The maximum value that linearity test value is determined in the linearity test value filtered out, by the maximum of the linearity test value
It is worth corresponding test offset parameter and is determined as target bias parameter.
4. according to the method described in claim 1, it is characterized in that, according to the linearity test value and pre-set linear
Degree threshold value determines the current frequency range or the target bias parameter of frequency point, including：
Linearity test value of the screening more than or equal to the linearity threshold value；
Change curve of the linearity test value with offset parameter is generated according to the linearity test value filtered out；
The maximum value for determining linearity test value with the change curve of offset parameter according to the linearity test value, by the line
The corresponding offset parameter of maximum value of property degree test value is determined as target bias parameter.
5. according to the method described in claim 4, it is characterized in that, in the change according to the linearity test value with offset parameter
Before changing the maximum value that curve determines linearity test value, further include：
Determine two neighboring test of the linearity test value with inflection point and the inflection point in the change curve of offset parameter
Offset parameter；
In the range between the two neighboring test offset parameter, newly-increased test offset parameter is determined；
It determines the corresponding linearity test value of the newly-increased test offset parameter, and updates linearity test value with offset parameter
Change curve；
Correspondingly, the maximum value of linearity test value is determined with the change curve of offset parameter according to the linearity test value,
Including：
The maximum value of linearity test value is determined with the change curve of offset parameter according to updated linearity test value.
6. according to the method described in claim 1, it is characterized in that, in the target bias parameter for determining each frequency range or frequency point
Later, further include：
It is bent with the variation of frequency range or frequency point that target bias parameter is generated according to the target bias parameter of determining each frequency range or frequency point
Line；
Each frequency range is divided at least two frequency sub-band, or, determining the interval frequency point between each frequency point；
According to the target bias parameter with frequency range or the change curve of frequency point, the frequency sub-band or the interval frequency point are determined
Target bias parameter.
7. according to the method described in claim 6, it is characterized in that, in the target for determining the frequency sub-band or the interval frequency point
After offset parameter, further include：
The target bias parameter of the frequency sub-band or the interval frequency point is verified；
If the corresponding linearity test value of target bias parameter of the frequency sub-band or the interval frequency point is set in advance less than described
The linearity threshold value set then abandons the target bias parameter of the frequency sub-band or the interval frequency point.
8. a kind of active device offset parameter determining device, which is characterized in that including：
Offset parameter determining module is tested, for obtaining biasing of the active device in equipment to be tested in current frequency range or frequency point
Parameter area, and at least two test offset parameters are determined in the offset parameter range；
Linearity test value determining module, tests that offset parameter setting is described to be tested to be set for successively according to described at least two
Active device in standby, and determine corresponding linearity test value；
Target bias parameter determination module, for determining institute according to the linearity test value and pre-set linearity threshold value
State current frequency range or the target bias parameter of frequency point.
9. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the program is held by processor
Realize that the active device offset parameter as described in any in claim 1-7 determines method when row.
10. a kind of electronic equipment, which is characterized in that including memory, processor and storage are on a memory and can be in processor
The computer program of operation realizes having as described in claim 1-7 is any when the processor executes the computer program
Source device bias parameter determination method.
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Cited By (1)
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| CN110334308A (en) * | 2019-04-23 | 2019-10-15 | 中国电子科技集团公司第二十四研究所 | A kind of calculation method optimizing bias condition in voltage sweep parameter testing |
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Cited By (2)
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| CN110334308A (en) * | 2019-04-23 | 2019-10-15 | 中国电子科技集团公司第二十四研究所 | A kind of calculation method optimizing bias condition in voltage sweep parameter testing |
| CN110334308B (en) * | 2019-04-23 | 2022-10-25 | 中国电子科技集团公司第二十四研究所 | Calculation method for optimizing bias condition in power supply scanning parameter test |
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