CN108802077B - A anchor clamps for metallographic specimen automatic preparation - Google Patents
A anchor clamps for metallographic specimen automatic preparation Download PDFInfo
- Publication number
- CN108802077B CN108802077B CN201810619610.8A CN201810619610A CN108802077B CN 108802077 B CN108802077 B CN 108802077B CN 201810619610 A CN201810619610 A CN 201810619610A CN 108802077 B CN108802077 B CN 108802077B
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- China
- Prior art keywords
- clamp
- auxiliary sleeve
- polishing
- fixed support
- metallographic specimen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000002360 preparation method Methods 0.000 title claims description 15
- 238000005498 polishing Methods 0.000 claims abstract description 63
- 230000000149 penetrating effect Effects 0.000 claims description 3
- 239000000463 material Substances 0.000 abstract description 9
- 238000004458 analytical method Methods 0.000 abstract description 3
- 238000012423 maintenance Methods 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 4
- 238000011160 research Methods 0.000 description 4
- 238000001887 electron backscatter diffraction Methods 0.000 description 3
- 230000001788 irregular Effects 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- 238000005260 corrosion Methods 0.000 description 2
- 230000007797 corrosion Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910001369 Brass Inorganic materials 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 229910001060 Gray iron Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000013016 damping Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000001239 high-resolution electron microscopy Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/2005—Preparation of powder samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
- G01N2223/0565—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction diffraction of electrons, e.g. LEED
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/102—Different kinds of radiation or particles beta or electrons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/309—Accessories, mechanical or electrical features support of sample holder
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
Description
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810619610.8A CN108802077B (en) | 2018-06-15 | 2018-06-15 | A anchor clamps for metallographic specimen automatic preparation |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810619610.8A CN108802077B (en) | 2018-06-15 | 2018-06-15 | A anchor clamps for metallographic specimen automatic preparation |
Publications (2)
Publication Number | Publication Date |
---|---|
CN108802077A CN108802077A (en) | 2018-11-13 |
CN108802077B true CN108802077B (en) | 2020-10-09 |
Family
ID=64086471
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810619610.8A Active CN108802077B (en) | 2018-06-15 | 2018-06-15 | A anchor clamps for metallographic specimen automatic preparation |
Country Status (1)
Country | Link |
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CN (1) | CN108802077B (en) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101708590A (en) * | 2009-11-26 | 2010-05-19 | 上海大学 | Automatic grinding and polishing machine of metallographic specimen |
CN201559120U (en) * | 2009-12-18 | 2010-08-25 | 中国铝业股份有限公司 | Grinding and polishing device for manufacturing sample for metallographic and transmission electron microscope film |
CN102218690A (en) * | 2011-04-21 | 2011-10-19 | 西北工业大学 | Metallographic specimen grinding and polishing machine |
CN203401384U (en) * | 2013-08-31 | 2014-01-22 | 莱州市蔚仪试验器械制造有限公司 | Grinding and burnishing disk of metallographic sample grinding and burnishing machine and power mechanism of grinding and burnishing disk |
CN105690254A (en) * | 2016-03-11 | 2016-06-22 | 江苏元中直流微电网有限公司 | Demounted combination-type metallographic specimen high-efficient grinding and polishing clamp |
CN105904336A (en) * | 2016-06-29 | 2016-08-31 | 东北大学 | Metallographic phase grinding sample pressure adjusting device and metallographic phase grinding and polishing device and method |
CN206578658U (en) * | 2017-03-09 | 2017-10-24 | 长兴华超电子科技有限公司 | A kind of Electronic Components Manufacturing sanding apparatus |
-
2018
- 2018-06-15 CN CN201810619610.8A patent/CN108802077B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101708590A (en) * | 2009-11-26 | 2010-05-19 | 上海大学 | Automatic grinding and polishing machine of metallographic specimen |
CN201559120U (en) * | 2009-12-18 | 2010-08-25 | 中国铝业股份有限公司 | Grinding and polishing device for manufacturing sample for metallographic and transmission electron microscope film |
CN102218690A (en) * | 2011-04-21 | 2011-10-19 | 西北工业大学 | Metallographic specimen grinding and polishing machine |
CN203401384U (en) * | 2013-08-31 | 2014-01-22 | 莱州市蔚仪试验器械制造有限公司 | Grinding and burnishing disk of metallographic sample grinding and burnishing machine and power mechanism of grinding and burnishing disk |
CN105690254A (en) * | 2016-03-11 | 2016-06-22 | 江苏元中直流微电网有限公司 | Demounted combination-type metallographic specimen high-efficient grinding and polishing clamp |
CN105904336A (en) * | 2016-06-29 | 2016-08-31 | 东北大学 | Metallographic phase grinding sample pressure adjusting device and metallographic phase grinding and polishing device and method |
CN206578658U (en) * | 2017-03-09 | 2017-10-24 | 长兴华超电子科技有限公司 | A kind of Electronic Components Manufacturing sanding apparatus |
Also Published As
Publication number | Publication date |
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CN108802077A (en) | 2018-11-13 |
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Legal Events
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PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
EE01 | Entry into force of recordation of patent licensing contract | ||
EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20181113 Assignee: DALIAN XINHE HEAVY INDUSTRY Co.,Ltd. Assignor: DALIAN University Contract record no.: X2023980048257 Denomination of invention: A fixture for automatic preparation of metallographic specimens Granted publication date: 20201009 License type: Common License Record date: 20231124 |
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EE01 | Entry into force of recordation of patent licensing contract | ||
EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20181113 Assignee: DALIAN YAMING AUTOMOTIVE PARTS Co.,Ltd. Assignor: DALIAN University Contract record no.: X2023210000258 Denomination of invention: A fixture for automatic preparation of metallographic specimens Granted publication date: 20201009 License type: Common License Record date: 20231129 Application publication date: 20181113 Assignee: DALIAN HENGYA INSTRUMENTS AND METERS CO.,LTD. Assignor: DALIAN University Contract record no.: X2023210000246 Denomination of invention: A fixture for automatic preparation of metallographic specimens Granted publication date: 20201009 License type: Common License Record date: 20231129 |