CN108801478A - Temperature detection circuit, method and fan - Google Patents
Temperature detection circuit, method and fan Download PDFInfo
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- CN108801478A CN108801478A CN201710296793.XA CN201710296793A CN108801478A CN 108801478 A CN108801478 A CN 108801478A CN 201710296793 A CN201710296793 A CN 201710296793A CN 108801478 A CN108801478 A CN 108801478A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/02—Means for indicating or recording specially adapted for thermometers
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04D—NON-POSITIVE-DISPLACEMENT PUMPS
- F04D25/00—Pumping installations or systems
- F04D25/02—Units comprising pumps and their driving means
- F04D25/08—Units comprising pumps and their driving means the working fluid being air, e.g. for ventilation
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F04—POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
- F04D—NON-POSITIVE-DISPLACEMENT PUMPS
- F04D27/00—Control, e.g. regulation, of pumps, pumping installations or pumping systems specially adapted for elastic fluids
- F04D27/004—Control, e.g. regulation, of pumps, pumping installations or pumping systems specially adapted for elastic fluids by varying driving speed
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K2207/00—Application of thermometers in household appliances
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
A kind of temperature detection circuit, the temperature for detecting element under test, the temperature detection circuit include：At least two temperature switches, at least two temperature switch are respectively provided with different operating temperatures, the temperature output temperature signal for detecting the element under test；And processing module, it is electrically connected at least two temperature switch, temperature signal for receiving at least two temperature switches output, and the temperature signal and the corresponding operating temperature of each temperature switch exported in previous moment and current time according at least two temperature switch determines the temperature range of the element under test.The present invention also provides a kind of temperature method for detecting and fan, temperature detection circuit, method and fan in the present invention can reduce the temperature detecting cost to element under test.
Description
Technical field
The present invention relates to a kind of a kind of circuit for detecting more particularly to temperature detection circuit, method and fans.
Background technology
In the prior art, it when detecting element under test temperature, can generally be detected using temperature sensor, temperature sensor
Have the advantages that accuracy is high, however, the cost of temperature in use sensor is higher.
Invention content
In view of this, it is necessary to provide a kind of temperature detection circuit, method and fan, to reduce the temperature to element under test
Detect cost.
The temperature detection circuit that embodiment of the present invention provides, the temperature for detecting element under test, the temperature detecting
Circuit includes：
At least two temperature switches, at least two temperature switch is respectively provided with different operating temperatures, for detecting
The temperature output temperature signal of the element under test, wherein each temperature switch is big in the temperature for detecting the element under test
When its operating temperature, the first temperature signal is exported, is acted less than it in the temperature for detecting the element under test
When temperature, second temperature signal is exported；And
Processing module is electrically connected at least two temperature switch, defeated for receiving at least two temperature switch
The temperature signal gone out, and the temperature signal that is exported in previous moment and current time according at least two temperature switch and
The corresponding operating temperature of each temperature switch determines the temperature range of the element under test.
In addition, a kind of fan that embodiment of the present invention provides, including temperature detection circuit described above.
In addition, embodiment of the present invention additionally provides a kind of temperature detecting method, it is applied in temperature detection circuit, it is described
Temperature detection circuit includes at least two temperature switches, and the temperature detecting method includes：
Receive at least two temperature switches temperature signal for being exported when detecting the temperature of element under test, described at least two
A temperature switch is respectively provided with different operating temperatures, wherein each temperature switch is in the temperature for detecting the element under test
When more than or equal to its operating temperature, the first temperature signal is exported, it is dynamic less than it in the temperature for detecting the element under test
When making temperature, second temperature signal is exported；And
The temperature signal exported in previous moment and current time according at least two temperature switch and each temperature
Degree switchs the temperature range that corresponding operating temperature determines the element under test.
Above-mentioned temperature detection circuit detects the temperature of element under test by least two temperature switches, due to temperature switch
When the temperature for detecting element under test is greater than or equal to its operating temperature, the first temperature signal can be exported, it is to be measured detecting
When component temperature is less than its operating temperature, second temperature signal can be exported.Therefore, processing module at least two temperature by analysis
It switchs the temperature signal exported in previous moment and current time and the corresponding operating temperature of each temperature switch can determine
Which temperature range is the temperature of element under test be in.
Description of the drawings
Fig. 1 is the functional block diagram of the temperature detection circuit in an embodiment of the present invention.
Fig. 2 is the step flow diagram of an embodiment of temperature detecting method of the present invention.
Fig. 3 is by the temperature signal exported in previous moment and current time according at least two temperature switches in Fig. 2
And the corresponding operating temperature of each temperature switch the step of determining the temperature range of element under test, refines flow diagram.
Fig. 4 is by the corresponding action temperature of the temperature signal exported according to each temperature switch, each temperature switch in Fig. 3
The refinement flow diagram for the step of stagnant regions of degree and each temperature switch determine the temperature range of element under test.
Fig. 5 is the step flow diagram of another embodiment of temperature detecting method of the present invention.
Main element symbol description
Temperature detection circuit 1
First temperature switch 10
Second temperature switch 20
Third temperature switch 30
4th temperature switch 40
5th temperature switch 50
Processing module 60
Following specific implementation mode will be further illustrated the present invention in conjunction with above-mentioned attached drawing.
Specific implementation mode
Referring to Fig. 1, Fig. 1 is the functional block diagram of the temperature detection circuit 1 in an embodiment of the present invention.In this implementation
In mode, temperature detection circuit 1 includes at least two temperature switches and processing module 60.
In embodiments of the present invention, at least two temperature switch is for five, respectively the first temperature switch
10, second temperature switch 20, third temperature switch 30, the 4th temperature switch 40 and the 5th temperature switch 50.It is understood that
In other embodiment of the invention, the quantity of temperature switch may be 2,3,4,6 etc., temperature switch it is specific
Quantity is set according to actual conditions.In embodiments of the present invention, the first temperature switch 10, second temperature switch 20,
Three temperature switches 30, the 4th temperature switch 40 and the 5th temperature switch 50 are respectively provided with different operating temperatures, are waited for for detecting
The temperature output temperature signal of element is surveyed, the operating temperature of each temperature switch is selected or set according to actual conditions.Respectively
The selected or setting of the operating temperature of a temperature switch is exemplified below：
It, then can be with if it is desired to the temperature of element under test needs to reach 2 DEG C of precision at 20~40 DEG C in an application scenarios
The temperature switch of selected 52 DEG C sluggish temperature specifications, and the operating temperature of the first temperature switch 10 is 20 DEG C, second temperature is opened
The operating temperature for closing 20 is 25 DEG C, and the operating temperature of third temperature switch 30 is 30 DEG C, the operating temperature of the 4th temperature switch 40
It it is 35 DEG C, the operating temperature of the 5th temperature switch 30 is 40 DEG C.It should be noted that the temperature switch of 2 DEG C of sluggish temperature specifications
If referring to, the operating temperature of the temperature switch is 20 DEG C, in actual temperature detecting, at the temperature of the element under test
When in 20~22 DEG C of temperature ranges, which can just act, i.e., when temperature acts, actually detect member to be measured
The temperature of part is 20~22 DEG C, that is to say, that the stagnant regions of the temperature switch are 20~22 DEG C.It is understood that answering at this
Temperature switch with 5 selected in scene, 2 DEG C of sluggish temperature specifications is only an example, not to the quantity of temperature switch and rule
Lattice limit.
In the present embodiment, when each temperature switch is acted in the temperature for detecting element under test more than or equal to it
When temperature, the first temperature signal can be exported, which is high level ' 1 '；When each temperature switch is waited for detecting
When surveying the temperature of element less than its operating temperature, second temperature signal can be exported, which is low level ' 0 '.It can manage
Solution, in other embodiment of the invention, which may be low level ' 0 ', the second temperature signal
For high level ' 1 '.
Processing module 60 is electrically connected at least two temperature switch.In the present embodiment, processing module 60 is electrically connected
It is connected to the first temperature switch 10, second temperature switch 20, third temperature switch 30, the 4th temperature switch 40 and the 5th temperature switch
50, for receiving the first temperature switch 10, second temperature switch 20, third temperature switch 30, the 4th temperature switch 40 and the 5th
The temperature signal that temperature switch 50 exports, and believed according to the temperature that each temperature switch is exported in previous moment and current time
Number and the corresponding operating temperature of each temperature switch determine the temperature range of the element under test.
Specifically, in one embodiment, processing module 60 can first judge in the temperature range for determining element under test
The temperature signal exported in previous moment and current time with the presence or absence of temperature switch changes, if processing module 60 judges
When going out the temperature signal exported there are temperature switch and changing, it is determined that the temperature of the element under test is output temperature signal
The stagnant regions of changed temperature switch, if changing than the temperature signal that second temperature switch 20 exports, it is determined that
The temperature of element under test be the second temperature switch 20 stagnant regions, i.e., 25~27 DEG C.Similarly, if third temperature switch 30 exports
Temperature signal change, it is determined that the temperature of element under test be the three or two temperature switch 30 stagnant regions, i.e., 30~32
℃.In embodiments of the present invention, processing module 60 is judging whether temperature switch in previous moment and current time institute
When the temperature signal of output changes, if processing module 60 is judged the temperature signal there is no temperature switch output and is become
Change, then processing module 60 can be corresponded to according to temperature signal that each temperature switch is exported, each temperature switch
Operating temperature and the stagnant regions of each temperature switch determine the temperature range of the element under test.Processing module 60 is in root
The sluggishness of the temperature signal, the corresponding operating temperature of each temperature switch and each temperature switch that are exported according to each temperature switch
When area determines the temperature range of element under test, can specifically it be determined as follows：Processing module 60 first determines whether each temperature
Degree switchs whether exported temperature signal is all second temperature signal (low level ' 0 '), processing module 60 judge it is each
When the temperature signal that temperature switch is exported all is second temperature signal (low level ' 0 '), the temperature of the element under test is determined
Minimum movements temperature in operating temperature corresponding less than each temperature switch；If processing module 60 is judged described each
When the temperature signal that temperature switch is exported is not all second temperature signal (low level ' 0 '), each temperature is further judged
Degree switchs whether exported temperature signal is all the first temperature signal (high level ' 1 '), if being all the first temperature signal (high electricity
Flat ' 1 '), it is determined that the temperature of the element under test is more than the maximum temperature switch of operating temperature in each temperature switch
Maximum sluggishness temperature, if being not all the first temperature signal (high level ' 1 '), it is determined that the temperature of the element under test is more than output
The sluggish temperature of the maximum of the maximum temperature switch of operating temperature in the temperature switch of first temperature signal, and less than the second temperature of output
Spend the operating temperature of the temperature switch of operating temperature minimum in the temperature switch of signal (low level ' 0 '), wherein each temperature is opened
The sluggish temperature of maximum of pass is the maximum temperature values in the stagnant regions of each temperature switch.In an embodiment of the present invention, respectively
A temperature switch is then determined in processing module 60 by taking 10 to the 5th temperature switch 50 of the first temperature switch described above as an example
The temperature of the element under test can obtain when being less than the minimum movements temperature in the corresponding operating temperature of each temperature switch
The actual temp section of element under test is less than 20 DEG C；It is described to determine that the temperature of the element under test is more than in processing module 60
The actual temp of element under test can be obtained in each temperature switch when the maximum sluggishness temperature of the maximum temperature switch of operating temperature
Section is more than 42 DEG C；Determine that the temperature of the element under test is more than the temperature of the first temperature signal of output in processing module 60
The sluggish temperature of maximum of the maximum temperature switch of operating temperature (by taking second temperature switch 20 as an example) in switch, and less than output the
It can be obtained when the operating temperature of the temperature switch (third temperature switch 30) of operating temperature minimum in the temperature switch of two temperature signals
The actual temp section for going out element under test is 27~30 DEG C.
In another embodiment of the present invention, processing module 60 can also lead in the temperature range for determining element under test
Under type such as is crossed to determine：The temperature of temperature signal and the element under test that at least two temperature switch is exported is obtained first
The mapping table in section is spent, in the present embodiment, the temperature signal that each temperature switch is exported and the element under test
The mapping table of temperature range be pre-stored in the processing module in storage unit, certainly, which can also
It is stored in the external storage unit of processing module connection.Processing module 60 is after getting the mapping table, according to institute
State mapping table, the temperature signal that at least two temperature switch is exported and the corresponding operating temperature of each temperature switch
Determine that the temperature range of the element under test, specific method of determination are described in detail below.
In embodiments of the present invention, processing module 60 can be logic circuit, micro-control unit or microcontroller
(Microcontroller Unit, MCU), Complex Programmable Logic Devices (Complex Programmable Logic
Device, CPLD), field programmable gate array (Field-Programmable Gate Array, FPGA).
Temperature detection circuit 1 in embodiment of the present invention can be applied in fan, be detected by temperature detection circuit 1
Then the temperature range of element under test exports different control signals according to different temperature ranges, to control fan with not
The same rotating speed is operated.Temperature detection circuit 1 in embodiment of the present invention can also send the temperature detected to report
In alert circuit, so that warning circuit is alarmed when temperature is higher or lower than the temperature that the temperature sensing circuit is detected.
Referring to Fig. 2, Fig. 2 is the step flow chart of an embodiment of temperature detecting method of the present invention.
In the present embodiment, which is applied in temperature detection circuit, the temperature detection circuit packet
At least two temperature switches are included, which includes：
Step S10 receives the temperature signal that at least two temperature switches are exported when detecting the temperature of element under test, institute
It states at least two temperature switches and is respectively provided with different operating temperatures, wherein each temperature switch is detecting the member to be measured
When the temperature of part is more than or equal to its operating temperature, the first temperature signal is exported, in the temperature for detecting the element under test
When less than its operating temperature, second temperature signal is exported.
In the present embodiment, at least two temperature switch is for 5, respectively the first temperature switch, second
Temperature switch, third temperature switch, the 4th temperature switch and the 5th temperature switch.It is understood that in the other realities of the present invention
It applies in mode, the quantity of temperature switch may be 2,3,4,6 etc., and the particular number of temperature switch is according to practical feelings
Condition is set.Each temperature switch is respectively provided with different operating temperatures, and operating temperature can be carried out according to actual conditions
Selected or setting.The selected or setting of the operating temperature of each temperature switch is exemplified below：How the number of element is adjusted
It, then can be with if it is desired to the temperature of element under test needs to reach 2 DEG C of precision at 20~40 DEG C in an application scenarios
The temperature switch of 5 selected " 2 DEG C of sluggish temperature " specification, and the operating temperature of the first temperature switch is 20 DEG C, second temperature is opened
The operating temperature of pass is 25 DEG C, and the operating temperature of third temperature switch is 30 DEG C, and the operating temperature of the 4th temperature switch is 35 DEG C,
The operating temperature of 5th temperature switch is 40 DEG C.If the temperature switch of 2 DEG C of sluggish temperature specifications refers to the dynamic of the temperature switch
It is 20 DEG C to make temperature, then in actual temperature detecting, when the temperature of the element under test is in 20~22 DEG C of temperature ranges,
The temperature switch can just act, i.e., when temperature acts, the temperature for actually detecting element under test is 20~22 DEG C, also
It is to say, the stagnant regions of the temperature switch are 20~22 DEG C.It is understood that the 52 DEG C of sluggishnesses selected in the application scenarios
The temperature switch of temperature specification is only an example, is not limited the quantity of temperature switch and specification
In the present embodiment, each temperature switch is defeated when the temperature for detecting element under test is more than its operating temperature
Go out the first signal, which is high level ' 1 '；When each temperature switch is dynamic less than it in the temperature for detecting element under test
When making temperature, second signal can be exported, which is low level ' 0 '.It is understood that in the other embodiment party of the present invention
In formula, which may be low level ' 0 ', which is high level ' 1 '.Processing module is receiving each temperature
When degree switchs exported temperature signal, the temperature signal that can be exported each temperature switch stores.
Step S20, the temperature signal exported in previous moment and current time according at least two temperature switch
And the corresponding operating temperature of each temperature switch determines the temperature range of the element under test.
Processing module receives each temperature switch (temperature of the first temperature switch described herein above~5th in previous moment
For degree switch) temperature signal that is exported when, the temperature signal correspondence which exports is stored in first and is deposited
In each storage unit between storage area.Processing module receives the temperature signal that each temperature switch is exported at current time
When, the temperature signal which is exported can be corresponded to each storage unit being stored in the second storage unit
In.When processing module is when later moment in time receives the temperature signal that each temperature switch is exported, which can be connect
The temperature signal correspondence of each temperature switch received is stored in each storage unit in second storage unit, with update
Value in second storage unit, while the value correspondence stored before each storage unit in second storage unit being stored in
In each storage unit in first storage unit, replace the first storage single the value stored in the past in second storage unit
The value of member storage.It should be noted that the previous moment in present embodiment refers to that each temperature switch is defeated at current time
First time institute's output temperature signal corresponding time point before going out temperature signal, later moment in time refer to that each temperature switch exists
The temperature signal corresponding time point that first time after current time output temperature signal is exported.
Processing module is in the temperature for receiving at least two temperature switch and being exported in previous moment and current time
When signal, you can the temperature signal exported in previous moment and current time according at least two temperature switch and each temperature
Degree switchs the temperature range that corresponding operating temperature determines element under test
Specifically, with reference to Fig. 3, the step S20 includes：
Step S21 judges whether that the temperature signal that temperature switch is exported in previous moment and current time occurs
Variation.
Processing module can compare each of acquisition after the temperature signal that current time gets that each temperature switch is exported
The temperature signal that a temperature switch is exported in previous moment and current time, to determine whether there is temperature switch in previous moment
It changes with the temperature signal that current time is exported.
Step S22 determines that the temperature of the element under test is the sluggishness of the changed temperature switch of output temperature signal
Area.
If processing module judges that there is the temperature signal exported in previous moment and current time changes, should
Processing module is that can determine that the temperature of the element under test is the stagnant regions of the changed temperature switch of output temperature signal.
Step S23, the temperature signal exported according to each temperature switch, each temperature switch are corresponding dynamic
The stagnant regions for making temperature and each temperature switch determine the temperature range of the element under test.
If processing module is judged to change there is no the temperature signal exported in previous moment and current time,
The processing module can be according to temperature signal that each temperature switch is exported, the corresponding action of each temperature switch
The stagnant regions of temperature and each temperature switch determine the temperature range of the element under test.
Specifically, with reference to Fig. 4, the step S23 includes：
Whether step S231 judges temperature signal that each temperature switch is exported all for second temperature signal.
In the present embodiment, processing module may determine that first temperature signal that each temperature switch is exported whether be all
Second temperature signal, if judging, the temperature signal that each temperature switch is exported all is second temperature signal, can continue to hold
Row step S232, if judging, the temperature signal that each temperature switch is exported is not all second temperature signal, can continue to hold
Row step S233.
Step S232 determines that the temperature of the element under test is less than in the corresponding operating temperature of each temperature switch
Minimum movements temperature.
Whether step S233 judges temperature signal that each temperature switch is exported all for the first temperature signal.
In the present embodiment, processing module is judging that the temperature signal that each temperature switch is exported all is first
When temperature signal, then step S2331 is continued to execute, processing module is in the temperature letter for judging that each temperature switch is exported
When number being not all the first temperature signal, then step S2332 is continued to execute.
It is maximum to determine that the temperature of the element under test is more than operating temperature in each temperature switch by step S2331
The sluggish temperature of maximum of temperature switch.
Step S2332 determines that the temperature of the element under test is more than in the temperature switch of the first temperature signal of output and acts
The sluggish temperature of maximum of the temperature switch of maximum temperature, and most less than operating temperature in the temperature switch of output second temperature signal
The operating temperature of small temperature switch.
It is the step flow chart of another embodiment of temperature detecting method of the present invention with reference to Fig. 5, Fig. 5.The present invention is implemented
Temperature detecting method in mode with the temperature detecting method in Fig. 2 the difference is that：Step S20 in Fig. 2 includes：
Step S24 obtains the temperature of temperature signal and the element under test that at least two temperature switch is exported
The mapping table in section.
Step S25, according to the mapping table, at least two temperature switch in previous moment and current time institute
The temperature signal of output and the corresponding operating temperature of each temperature switch determine the temperature range of the element under test.
In the present embodiment, the temperature signal that each temperature switch is exported and the temperature range of the element under test
Mapping table is pre-stored in the processing module in storage unit, and certainly, which is stored in processing mould
In the external storage unit of block connection.The mapping table is the side according to the temperature range of above-described determining element under test
Method is formulated.In one embodiment, the mapping table is as shown in table 1 below：
It should be noted that in above tableThe value that be the temperature switch export at current time that represents and
The value that previous moment is exported changes.What " 0 " or " 1 " in table represented is that the temperature switch exports at current time
The value that value is exported with previous moment does not change.
Processing module is after getting the mapping table, according to the mapping table and each temperature switch (with above
For first temperature switch~the, five temperature switch) temperature signal that is exported in previous moment and current time institute it is defeated
The operating temperature of the temperature signal, each temperature switch that go out can determine the temperature range of the element under test.According to the correspondence
The method that relation table determines the temperature range of element under test is exemplified below：
For example, first temperature switch~the 5th the temperature signal that is exported in previous moment of temperature switch be " 00000 ",
The temperature signal that the temperature switch of first temperature switch~the 5th is exported at current time is " 10000 ", i.e. the first temperature is opened
It is all second signal ' 0 ' to close the temperature signal that the~the five temperature switch is exported in previous moment, the first temperature at current time
Degree switch institute output temperature signal is the first temperature signal ' 1 ', the~the five temperature switch institute of second temperature switch output temperature letter
Number it is all second temperature signal ' 0 ', then show that the temperature range of element under test is 20~22 DEG C according to the mapping table.Compare again
Such as, the temperature signal that the temperature switch of first temperature switch~the 5th is exported in previous moment and current time is all
It is all the first temperature that " 11000 ", i.e. the first temperature switch, which are switched with second temperature in previous moment and current time institute's output signal,
Signal ' 1 ' is spent, third temperature switch, the 4th temperature switch and the 5th temperature switch are in previous moment and current time exported letter
Number it is all second temperature signal ' 0 ', then show that the temperature range of element under test is 27~30 DEG C according to the mapping table
Temperature detecting method provided by the invention, the temperature of element under test is detected by least two temperature switches, by
In temperature switch when the temperature for detecting element under test is greater than or equal to its operating temperature, the first signal can be exported, is being detected
When being less than its operating temperature to element under test temperature, second signal can be exported, processing module exists by analyzing each thermal module
Signal that current time and previous moment are exported simultaneously compares the temperature range that mapping table can determine element under test.Due to
The present invention is to detect temperature using temperature switch, and the cost of temperature switch is more much lower than the cost of temperature sensor, because
This, using the temperature detecting method in embodiment of the present invention, it is temperature detecting cost that can effectively reduce to element under test.
The above examples are only used to illustrate the technical scheme of the present invention and are not limiting, although with reference to preferred embodiment to this hair
It is bright to be described in detail, it will be understood by those of ordinary skill in the art that, it can modify to technical scheme of the present invention
Or equivalent replacement, without departing from the spirit of the technical scheme of the invention and range.
Claims (10)
1. a kind of temperature detection circuit, the temperature for detecting element under test, which is characterized in that the temperature detection circuit packet
It includes：
At least two temperature switches, at least two temperature switch are respectively provided with different operating temperatures, described for detecting
The temperature output temperature signal of element under test, wherein each temperature switch be more than in the temperature for detecting the element under test or
When person is equal to its operating temperature, the first temperature signal is exported, is less than its operating temperature in the temperature for detecting the element under test
When, export second temperature signal；And
Processing module is electrically connected at least two temperature switch, for receiving at least two temperature switches output
Temperature signal, and the temperature signal that is exported in previous moment and current time according at least two temperature switch and each
The corresponding operating temperature of temperature switch determines the temperature range of the element under test.
2. temperature detection circuit as described in claim 1, which is characterized in that each temperature switch has stagnant regions, the place
Reason module is additionally operable to judge whether that the temperature signal that temperature switch is exported in previous moment and current time changes；
When the processing module judges that the temperature signal exported there are temperature switch changes, the element under test is determined
Temperature be the changed temperature switch of output temperature signal stagnant regions；And
When the processing module judges that the temperature signal there is no temperature switch output changes, according to each temperature
Degree switchs the sluggishness of exported temperature signal, each corresponding operating temperature of temperature switch and each temperature switch
Area determines the temperature range of the element under test.
3. temperature detection circuit as claimed in claim 2, which is characterized in that the processing module is additionally operable to judge described each
Whether the temperature signal that a temperature switch is exported all is second temperature signal；
When the processing module judges that the temperature signal that each temperature switch is exported all is second temperature signal, really
The temperature of the fixed element under test is less than the minimum movements temperature in the corresponding operating temperature of each temperature switch；And
When the processing module judges that the temperature signal that each temperature switch is exported is not all second temperature signal,
Whether temperature signal that each temperature switch is exported further is judged all for the first temperature signal, if being all the first temperature
Signal, it is determined that the temperature of the element under test is most more than the maximum temperature switch of operating temperature in each temperature switch
Large time lag temperature, if being not all the first temperature signal, it is determined that the temperature of the element under test is more than the first temperature signal of output
Temperature switch in the maximum temperature switch of operating temperature the sluggish temperature of maximum, and less than the temperature of output second temperature signal
The operating temperature of the temperature switch of operating temperature minimum in switch, wherein the sluggish temperature of maximum of each temperature switch is each
Maximum temperature values in the stagnant regions of temperature switch.
4. temperature detection circuit as described in claim 1, which is characterized in that the processing module is additionally operable to described in acquisition extremely
The mapping table for the temperature signal and the temperature range of the element under test that few two temperature switches are exported；And
The processing module is additionally operable to the temperature letter exported according to the mapping table, at least two temperature switch
Number and the corresponding operating temperature of each temperature switch determine the temperature range of the element under test.
5. temperature detection circuit as described in claim 1, which is characterized in that the processing module is logic circuit, microcontroller
Unit, Complex Programmable Logic Devices or field programmable gate array.
6. a kind of fan, which is characterized in that including temperature detection circuit described in any one of claim 1 to 5.
7. a kind of temperature detecting method is applied in temperature detection circuit, the temperature detection circuit includes at least two temperature
Switch, which is characterized in that the temperature detecting method includes：
Receive the temperature signal that at least two temperature switches are exported when detecting the temperature of element under test, at least two temperature
Degree switch is respectively provided with different operating temperatures, wherein each temperature switch is more than in the temperature for detecting the element under test
Or when equal to its operating temperature, the first temperature signal is exported, is less than its action temperature in the temperature for detecting the element under test
When spending, second temperature signal is exported；And
The temperature signal and each temperature exported in previous moment and current time according at least two temperature switch is opened
Close the temperature range that corresponding operating temperature determines the element under test.
8. temperature detecting method as claimed in claim 7, which is characterized in that each temperature switch has a stagnant regions, described
The temperature signal exported in previous moment and current time according at least two temperature switch and each temperature switch correspond to
Operating temperature the step of determining the temperature range of the element under test include：
Judge whether that the temperature signal that temperature switch is exported in previous moment and current time changes；
If so, determining that the temperature of the element under test is the stagnant regions of the changed temperature switch of output temperature signal；And
If it is not, the temperature signal then exported according to each temperature switch, the corresponding action temperature of each temperature switch
The stagnant regions of degree and each temperature switch determine the temperature range of the element under test.
9. temperature detecting method as claimed in claim 8, which is characterized in that described to be exported according to each temperature switch
Temperature signal, each corresponding operating temperature of temperature switch and each temperature switch stagnant regions determine described in wait for
Survey element temperature range the step of include：
Judge temperature signal that each temperature switch is exported whether all for second temperature signal；
If so, determining the most petty action that the temperature of the element under test is less than in the corresponding operating temperature of each temperature switch
Make temperature；And
If it is not, whether temperature signal that each temperature switch is exported then further is judged all for the first temperature signal, if
All it is the first temperature signal, it is determined that it is maximum that the temperature of the element under test is more than operating temperature in each temperature switch
The sluggish temperature of maximum of temperature switch, if being not all the first temperature signal, it is determined that the temperature of the element under test is more than output
The sluggish temperature of the maximum of the maximum temperature switch of operating temperature in the temperature switch of first temperature signal, and less than the second temperature of output
Spend the operating temperature of the temperature switch of operating temperature minimum in the temperature switch of signal, wherein the maximum of each temperature switch is late
Stagnant temperature is the maximum temperature values in the stagnant regions of each temperature switch.
10. temperature detecting method as claimed in claim 7, which is characterized in that described according at least two temperature switch
The temperature signal and the corresponding operating temperature of each temperature switch exported in previous moment and current time determines described to be measured
The step of temperature range of element includes：
Obtain the temperature signal pass corresponding with the temperature range of the element under test that at least two temperature switch is exported
It is table；And
The temperature letter exported in previous moment and current time according to the mapping table, at least two temperature switch
Number and the corresponding operating temperature of each temperature switch determine the temperature range of the element under test.
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