CN108761207B - Temperature sensing circuit testing method and device - Google Patents
Temperature sensing circuit testing method and device Download PDFInfo
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- CN108761207B CN108761207B CN201810887484.4A CN201810887484A CN108761207B CN 108761207 B CN108761207 B CN 108761207B CN 201810887484 A CN201810887484 A CN 201810887484A CN 108761207 B CN108761207 B CN 108761207B
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- 238000012360 testing method Methods 0.000 title claims abstract description 86
- 238000005070 sampling Methods 0.000 claims description 67
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/08—Measuring resistance by measuring both voltage and current
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/007—Testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
Abstract
The application discloses a temperature sensing circuit testing method and device. Wherein the device includes: the power module is used for providing a direct current power supply; the testing circuit is connected with the power supply module and used for testing the resistance value of the temperature sensing circuit to be tested; and the recording device is connected with the test circuit and is used for recording the resistance value of the temperature sensing circuit. The application solves the technical problems that the temperature sensing circuit is tested by using the universal meter, so that a lot of inconvenience is brought to the actual test and the test efficiency is lower.
Description
Technical Field
The application relates to the field of circuit testing, in particular to a temperature sensing circuit testing method and device.
Background
At present, when the thermistor and the temperature sensing bulb are used for testing, a constant temperature water tank and a universal meter are generally used for testing the resistance values of the thermistor and the temperature sensing bulb. The universal meter is used for testing, so that a lot of inconvenience is brought to actual testing, and the testing efficiency is low. It is now desirable to design a device that can be quickly tested to test the resistance of thermistors and temperature sensing bulbs to improve test efficiency.
In view of the above problems, no effective solution has been proposed at present.
Disclosure of Invention
The embodiment of the application provides a method and a device for testing a temperature sensing circuit, which at least solve the technical problems that the actual test is inconvenient and the test efficiency is low because a universal meter is used for testing the temperature sensing circuit.
According to an aspect of an embodiment of the present application, there is provided a test apparatus for a temperature sensing circuit, including: the power module is used for providing a direct current power supply; the testing circuit is connected with the power supply module and used for testing the resistance value of the temperature sensing circuit to be tested; and the recording device is connected with the test circuit and is used for recording the resistance value of the temperature sensing circuit.
Optionally, the test circuit comprises: the terminal interface is used for providing a first interface and a second interface, the first interface is connected with the power supply module, the second interface is connected with the sampling circuit, and the first interface and the second interface are used for being connected with the temperature sensing circuit; and the first end of the sampling circuit is connected with the terminal interface in series, and the second end of the sampling circuit is grounded.
Optionally, the sampling circuit includes: sampling a resistor; and/or the temperature sensing circuit comprises: a thermistor or bulb.
Optionally, the number of test circuits is plural, and the plural test circuits are connected in parallel.
Optionally, the recording device includes: color screen paperless recorder.
Optionally, the power module includes: the rectification circuit is connected with the alternating current power supply and used for converting alternating current voltage into direct current voltage; a filter circuit connected to the rectifier circuit for smoothing the waveform of the dc voltage; and the voltage stabilizing circuit is connected with the rectifying circuit and used for converting direct-current voltage.
Optionally, the test device further comprises: the temperature adjusting device is connected with the temperature sensing circuit and used for adjusting the temperature of the temperature sensing circuit so as to change the resistance value of the temperature sensing circuit.
Optionally, the temperature adjusting device includes: the constant temperature water tank is used for adjusting the temperature of the liquid and keeping constant temperature after temperature adjustment so as to change the temperature of the temperature sensing circuit.
According to another aspect of the embodiment of the present application, there is provided another apparatus for testing a temperature sensing circuit, including: the constant temperature water tank is characterized in that a tank body of the constant temperature water tank contains liquid, the liquid is connected with a temperature sensing circuit to be tested, and the constant temperature water tank is used for adjusting the temperature of the liquid and keeping constant temperature after temperature adjustment so as to change the temperature of the temperature sensing circuit; the terminal interface is used for providing a first interface and a second interface, the first interface is connected with a power supply, the second interface is connected with the sampling circuit, and the first interface and the second interface are used for being connected with the temperature sensing circuit; the first end of the sampling circuit is connected with the terminal interface in series, and the second end of the sampling circuit is grounded; and the recording device is connected with the sampling circuit and is used for recording the resistance value of the temperature sensing circuit.
According to another aspect of the embodiment of the present application, there is also provided a method for testing a temperature sensing circuit, including: connecting the temperature sensing circuit and the sampling circuit in series; connecting a temperature sensing end of the temperature sensing circuit with a temperature adjusting device; the method comprises the steps of obtaining first voltages at two ends of a sampling circuit, determining second voltages at two ends of a temperature sensing circuit according to the first voltages, determining current flowing through a series circuit of the temperature sensing circuit and the sampling circuit according to the first voltages and the resistance of the sampling circuit, and determining the resistance of the temperature sensing circuit according to the second voltages and the current.
Optionally, the number of series circuits formed by the temperature sensing circuit and the sampling circuit is plural.
Optionally, the method further comprises: and recording and storing the resistance value of the temperature sensing circuit.
In the embodiment of the application, the testing device of the temperature sensing circuit is composed of the power module, the testing circuit and the recording device, wherein the testing circuit further comprises a sampling circuit, the second voltage at two ends of the temperature sensing circuit is determined according to the first voltage by acquiring the first voltage at two ends of the sampling circuit, the current flowing through the series circuit composed of the temperature sensing circuit and the sampling circuit is determined according to the first voltage and the resistance value of the sampling circuit, and the resistance value of the temperature sensing circuit is determined according to the second voltage and the current, so that the following purposes are achieved: the testing device is simple to operate and convenient to test, can measure the resistance values of a plurality of temperature sensing circuits at the same time, and improves the testing efficiency; the testing device has a memory function, and can check the resistance value of the temperature sensing circuit at any temperature point at any time, so that the technical effect of improving the testing efficiency of the temperature sensing circuit is realized, and the technical problems that the actual test is inconvenient and the testing efficiency is lower due to the fact that the temperature sensing circuit is tested by using the universal meter are solved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain the application and do not constitute a limitation on the application. In the drawings:
FIG. 1 is a block diagram of a temperature sensing circuit testing apparatus according to an embodiment of the present application;
fig. 2 is a block diagram of a power module according to an embodiment of the present application;
FIG. 3 is a circuit diagram of a power module according to an embodiment of the application;
FIG. 4 is a block diagram of a test circuit according to an embodiment of the application;
FIG. 5a is a circuit diagram of a test circuit according to an embodiment of the application;
Fig. 5b is a circuit diagram of a temperature regulating device according to an embodiment of the present application;
FIG. 6 is a block diagram of another temperature sensing circuit testing apparatus according to an embodiment of the present application;
fig. 7 is a flowchart of a method for testing a temperature sensing circuit according to an embodiment of the application.
Detailed Description
In order that those skilled in the art will better understand the present application, a technical solution in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present application without making any inventive effort, shall fall within the scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments of the application described herein may be implemented in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
According to an embodiment of the present application, there is provided a test apparatus embodiment of a temperature sensing circuit, it being noted that the steps shown in the flowcharts of the drawings may be performed in a computer system such as a set of computer executable instructions, and that although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that herein.
Fig. 1 is a structural diagram of a temperature sensing circuit testing apparatus according to an embodiment of the present application, as shown in fig. 1, the apparatus includes:
the power module 10 is used for providing direct current power.
Fig. 2 is a structural view of a power module according to an embodiment of the present application, and as shown in fig. 2, the power module includes: a rectifier circuit 100 connected to an ac power supply for converting an ac voltage into a dc voltage; a filter circuit 102 connected to the rectifier circuit 100 for smoothing a waveform of the dc voltage; the voltage stabilizing circuit 104 is connected to the rectifying circuit 100 and converts the dc voltage.
Fig. 3 is a circuit diagram of a power module according to an embodiment of the application, as shown in fig. 3, BR is a bridge rectifier circuit, and the bridge rectifier circuit rectifies an alternating current into a direct current by using unidirectional conduction of a diode. The bridge rectifier circuit works as follows: when the alternating current is in the positive half cycle, forward voltage is applied to the diodes D1 and D3, and the diodes D1 and D3 are conducted; the diodes D2 and D4 are applied with reverse voltages, the diodes D2 and D4 are cut off, and half-wave rectification voltages with positive upper and negative lower are formed in the channel loop. When the alternating current is in the negative half cycle, positive voltage is applied to the diodes D2 and D4, and the diodes D2 and D4 are conducted; reverse voltages are applied to the diodes D1 and D3, the diodes D1 and D3 are cut off, and half-wave rectification voltages with positive upper and negative lower are formed in the channel loop. Repeating the steps to obtain the full-wave rectification voltage.
The bridge rectifier circuit utilizes four diodes, two by two. When the positive half part of the sine wave is input, the two diodes are conducted to obtain positive output; when the negative half of the sine wave is input, the other two diodes are conducted, and the output is still the positive half of the sine wave because the two diodes are reversely connected. It should be noted that, the diode is selected according to different rectifying modes and load sizes as the rectifying element, if the diode is improperly selected, the circuit cannot work safely, even the diode is burnt out, or the material is small, so that waste is caused. Bridge rectification is the first step of converting alternating current into direct current.
The voltage stabilizing circuit consists of voltage stabilizing modules P1 and P2, wherein P1 is 7812 voltage stabilizing module, P2 is 7805 voltage stabilizing module, and is used for converting high voltage direct current voltage into required low voltage direct current voltage, 78 represents positive voltage stabilization, positive voltage is output, 12 represents output voltage is 12V, and 5V is output by 05 ammeter.
The filter circuit is composed of capacitors C1, C2 and C3, the filter circuit is commonly used for filtering ripple waves in the output voltage of the rectifier circuit, so that the waveform of the output direct-current voltage becomes smooth as much as possible, the capacitors C1, C2 and C3 comprise electrolytic capacitors and ceramic chip capacitors, the electrolytic capacitors are used for high-frequency waves, and the ceramic chip capacitors are used for low-frequency filtering.
And obtaining stable 5V direct current voltage after passing through the rectifying circuit, the filter circuit and the voltage stabilizing circuit.
The testing circuit 12 is connected with the power module 10 and is used for testing the resistance value of the temperature sensing circuit to be tested.
Fig. 4 is a block diagram of a test circuit according to an embodiment of the present application, and as shown in fig. 4, the test circuit 12 includes: the terminal interface 120 provides two interfaces, the first interface 1200 is connected with the power module, the second interface 1202 is connected with the sampling circuit 122, and the first interface 1200 and the second interface 1202 are used for accessing the temperature sensing circuit; the sampling circuit 122, the first end of sampling circuit 122 is connected in series with the terminal interface, and the second end ground of sampling circuit. The terminal interface provides two interfaces for connecting the temperature sensing circuit to be tested into the testing device, and the function of the terminal interface in the testing device is equivalent to a base of the temperature sensing circuit to be tested and is used for connecting the temperature sensing circuit to be tested into the testing device.
In some alternative embodiments of the application, the sampling circuit comprises a sampling resistor and the temperature sensing circuit comprises a thermistor or bulb. The sampling resistor is a resistor with a determined resistance value, is connected in series with the temperature sensing circuit and has a voltage dividing function in the series circuit; the thermistor is one of sensitive components and parts, and has the characteristics of being sensitive to temperature and showing different resistance values at different temperatures; the indoor environment temperature sensing bulb is used for an air conditioner indoor unit, whether the temperature sensing bulb works normally is judged through measuring the resistance of the temperature sensing bulb, and the resistance of the temperature sensing bulb changes along with the temperature change.
In some alternative embodiments of the application, the number of test circuits is a plurality, and the plurality of test circuits are connected in parallel. The testing device comprises a plurality of parallel testing circuits, can realize simultaneous testing of resistance values of a plurality of thermistors, and improves testing efficiency.
Fig. 5a is a circuit diagram of a test circuit according to an embodiment of the present application, as shown in fig. 5a, CN1, CN2, CN3, CN4, CN5 are terminal interfaces for connecting a thermistor to be tested, one end of the terminal interfaces is connected to a power supply, the other end is connected to a resistor R1, and at the same time, the interface terminals provide two ports for connecting the thermistor to the test circuit. R1 is a sampling voltage dividing resistor with a determined resistance value, the sampling voltage dividing resistor is connected with a thermistor in series in a circuit, the other end of the R1 is grounded, and the R1 plays a voltage dividing role in the circuit. For example: when the water temperature of the thermistor of the CN1 terminal interface is 50 ℃, the resistance value of the thermistor is 7.17K, and the voltage values of two ends of R1 (the resistance value is 20K) are as follows: 5 x (20/7170+20) =3.68V.
And the recording device 14 is connected with the test circuit 12 and is used for recording the resistance value of the temperature sensing circuit.
As an alternative embodiment of the application, the recording means includes, but is not limited to, a color screen paperless recorder. As shown in FIG. 5a, the color screen paperless recorder is connected with the testing circuit and is responsible for displaying the testing data of the thermistor and recording the data of the thermistor at different temperatures. The color screen paperless recorder is an electronic recording device, adopts a liquid crystal display screen with high brightness and wide visual angle, and has clear display; a large amount of history data can be stored, so that a strong recording function of the paperless recorder is realized; the key and the knob are combined, so that the operation is more flexible and simple, and the operation habit of industrial personnel is truly met; while the stored data may be transferred to a computer or other device for permanent storage or printing. The color screen paperless recorder acquires the voltage value of the sampling voltage dividing resistor, and when the resistance value of the thermistor changes, the voltages at two ends of the sampling voltage dividing resistor also change, so that different voltage values are obtained.
In some embodiments of the present application, the temperature sensing circuit testing device further includes a temperature adjusting device connected to the temperature sensing circuit, for adjusting the temperature of the temperature sensing circuit so as to change the resistance value of the temperature sensing circuit. Fig. 5b is a circuit diagram of a temperature adjusting device according to an embodiment of the present application, and as shown in fig. 5b, when the thermistor R2 is connected to a test circuit through a terminal interface for testing, the temperature sensing head G of the thermistor R2 is connected to the temperature adjusting device.
As an alternative embodiment of the application, the temperature regulating device comprises, but is not limited to, a constant temperature water tank, the structure of the existing constant temperature water tank on the market is generally in a metal rectangle, a shell is made of cold-rolled steel plates, a stainless steel liner, a digital display temperature controller, a power supply and a water pump are all arranged in a control box, and the constant temperature water tank is provided with a core component, namely a microcomputer intelligent control system, for controlling the temperature change, and finally achieving the function of constant temperature. The tank body of the constant temperature water tank contains liquid, is used for adjusting the temperature of the liquid, and keeps constant temperature after temperature adjustment so as to change the temperature of the temperature sensing circuit. In some embodiments of the present application, when the temperature sensing circuit is a thermistor, the temperature sensing head of the thermistor is placed in the constant temperature water tank, the temperature of the liquid in the constant temperature water tank is controlled to change, the temperature of the liquid in the constant temperature water tank is kept constant for a period of time, so that the resistance value of the thermistor is changed, and the resistance value of the thermistor is tested.
Through the steps, the technical effect of rapidly and accurately testing the resistance of the thermistor can be realized, the resistance of a plurality of thermistors can be tested simultaneously by the testing device, the testing efficiency is improved, and the color screen paperless recorder has a strong memory function, so that a technician can check the resistance of the thermistor at any temperature point at any time.
Fig. 6 is a structural diagram of another test device for temperature sensing circuit according to an embodiment of the present application, as shown in fig. 6, the device includes:
the constant temperature water tank 60, the tank body of the constant temperature water tank 60 contains liquid, the liquid is connected with the temperature sensing circuit to be tested, and the constant temperature water tank is used for adjusting the temperature of the liquid and keeping constant temperature after temperature adjustment so as to change the temperature of the temperature sensing circuit. The temperature sensing head of the thermistor is placed in an adjustable constant-temperature water tank, and the resistance value of the thermistor changes along with the change of the temperature of liquid in the water tank.
The terminal interface 62 provides a first interface for connection to a power source and a second interface for connection to the sampling circuit 64.
Sampling circuit 64, a first end of sampling circuit 64 is connected in series with terminal interface 62, and a second end of sampling circuit 64 is grounded. In some embodiments of the present application, sampling circuit 64 includes, but is not limited to, a sampling resistor, which is a resistor of a fixed resistance, connected in series with the temperature sensing circuit, and which acts as a voltage divider in the series circuit.
And a recording device 66 connected with the sampling circuit 64 for recording the resistance value of the temperature sensing circuit.
As an alternative embodiment of the present application, recording device 66 includes, but is not limited to, a color screen paperless recorder. The color screen paperless recorder is an electronic recording device, adopts a liquid crystal display screen with high brightness and wide visual angle, and has clear display; a large amount of history data can be stored, so that a strong recording function of the paperless recorder is realized; the key and the knob are combined, so that the operation is more flexible and simple, and the operation habit of industrial personnel is truly met; while the stored data may be transferred to a computer or other device for permanent storage or printing. The color screen paperless recorder acquires the voltage value of the sampling voltage dividing resistor, and when the resistance value of the thermistor changes, the voltages at two ends of the sampling voltage dividing resistor also change, so that different voltage values are obtained.
It should be noted that, the preferred implementation manner of the embodiment shown in fig. 6 may refer to the related descriptions of the embodiments shown in fig. 1 to 5, which are not repeated herein.
Fig. 7 is a flowchart of a method for testing a temperature sensing circuit according to an embodiment of the application, as shown in fig. 7, the method includes:
In step S702, the temperature sensing circuit is connected in series with the sampling circuit. The thermistor is connected in series with a sampling resistor, wherein the sampling resistor plays a role of voltage division.
Step S704, connecting the temperature sensing end of the temperature sensing circuit with the temperature adjusting device. In some embodiments of the present application, the temperature sensing circuit is a thermistor, and at this time, the temperature sensing head of the thermistor is placed in an adjustable constant temperature water tank for testing, and the resistance value of the thermistor changes along with the change of the temperature of the liquid in the water tank, so that the temperature of the thermistor can be adjusted by adjusting the temperature of the liquid in the constant temperature water tank, and the resistance value of the thermistor can be adjusted.
Step S706, a first voltage at two ends of the sampling circuit is obtained, a second voltage at two ends of the temperature sensing circuit is determined according to the first voltage, a current flowing through a series circuit of the temperature sensing circuit and the sampling circuit is determined according to the first voltage and a resistance value of the sampling circuit, and a resistance value of the temperature sensing circuit is determined according to the second voltage and the current.
The direct current voltage of the power supply is known, and because the resistance value of the sampling resistor is determined, when the thermistor to be tested is connected into the test circuit, the voltage at two ends of the sampling resistor can be obtained, the voltage at two ends of the thermistor to be tested can be obtained by subtracting the voltage at two ends of the sampling resistor from the power supply voltage, the current flowing through the series circuit where the sampling resistor and the thermistor to be tested are located can be calculated according to the voltage at two ends of the sampling resistor and the resistance value of the sampling resistor, and finally the resistance value of the thermistor to be tested can be obtained according to the voltage at two ends of the thermistor to be tested and the calculated current in the series circuit.
The change of the liquid in the constant temperature water tank can cause the resistance of the thermistor to change correspondingly, the resistance of the thermistor can cause the voltage at two ends of the sampling resistor to change, the voltage values at two ends of a plurality of groups of sampling resistors can be collected correspondingly, and the corresponding different resistance of the thermistor corresponding to different temperature points can be obtained through calculation.
In some embodiments of the present application, the number of series circuits formed by the temperature sensing circuit and the sampling circuit is plural. The series circuits are connected in parallel, so that the resistance values of the thermistors can be measured simultaneously, and the testing efficiency is improved.
As an optional embodiment of the present application, the method for testing a temperature sensing circuit further includes recording and storing a resistance value of the temperature sensing circuit. And recording and storing the resistance values of the thermistor to be tested at different temperature points, so that technicians can check the resistance values of the thermistor to be tested at different temperature points at any time.
It should be noted that, the preferred implementation manner of the embodiment shown in fig. 7 may refer to the related descriptions of the embodiments shown in fig. 1 to 5, which are not repeated herein.
The foregoing embodiment numbers of the present application are merely for the purpose of description, and do not represent the advantages or disadvantages of the embodiments.
In the foregoing embodiments of the present application, the descriptions of the embodiments are emphasized, and for a portion of this disclosure that is not described in detail in this embodiment, reference is made to the related descriptions of other embodiments.
In the several embodiments provided in the present application, it should be understood that the disclosed technology may be implemented in other manners. The above-described embodiments of the apparatus are merely exemplary, and the division of the units, for example, may be a logic function division, and may be implemented in another manner, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be through some interfaces, units or modules, or may be in electrical or other forms.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in the embodiments of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present application may be embodied essentially or in part or all of the technical solution or in part in the form of a software product stored in a storage medium, including instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a Read-only memory (ROM), a random access memory (RAM, random Access Memory), a removable hard disk, a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The foregoing is merely a preferred embodiment of the present application and it should be noted that modifications and adaptations to those skilled in the art may be made without departing from the principles of the present application, which are intended to be comprehended within the scope of the present application.
Claims (11)
1. A test device for a temperature sensing circuit, comprising:
the power module is used for providing a direct current power supply;
the testing circuit is connected with the power supply module and used for testing the resistance value of the temperature sensing circuit to be tested;
the recording device is connected with the test circuit and is used for recording the resistance value of the temperature sensing circuit;
The test circuit includes: the terminal interface is used for providing a first interface and a second interface, the first interface is connected with the power supply module, the second interface is connected with the sampling circuit, and the first interface and the second interface are used for being connected with the temperature sensing circuit; and the first end of the sampling circuit is connected with the terminal interface in series, and the second end of the sampling circuit is grounded.
2. The apparatus of claim 1, wherein the sampling circuit comprises: sampling a resistor; and/or, the temperature sensing circuit comprises: a thermistor or bulb.
3. The apparatus of claim 1, wherein the number of test circuits is a plurality, and wherein a plurality of the test circuits are connected in parallel.
4. The apparatus of claim 1, wherein the recording means comprises: color screen paperless recorder.
5. The apparatus of claim 1, wherein the power module comprises:
The rectification circuit is connected with the alternating current power supply and used for converting alternating current voltage into direct current voltage;
A filter circuit connected to the rectifier circuit for smoothing a waveform of the dc voltage;
And the voltage stabilizing circuit is connected with the rectifying circuit and used for converting the direct-current voltage.
6. The apparatus of claim 1, wherein the apparatus further comprises:
and the temperature adjusting device is connected with the temperature sensing circuit and used for adjusting the temperature of the temperature sensing circuit so as to change the resistance value of the temperature sensing circuit.
7. The apparatus of claim 6, wherein the temperature regulating means comprises: and the constant temperature water tank is used for accommodating liquid in the tank body of the constant temperature water tank, regulating the temperature of the liquid and keeping constant temperature after the temperature regulation so as to change the temperature of the temperature sensing circuit.
8. A test device for a temperature sensing circuit, comprising:
The constant temperature water tank is characterized in that a tank body of the constant temperature water tank contains liquid, the liquid is connected with a temperature sensing circuit to be tested, and the constant temperature water tank is used for adjusting the temperature of the liquid and keeping constant temperature after the temperature adjustment so as to change the temperature of the temperature sensing circuit;
The terminal interface is used for providing a first interface and a second interface, the first interface is connected with a power supply, the second interface is connected with the sampling circuit, and the first interface and the second interface are used for accessing the temperature sensing circuit;
the first end of the sampling circuit is connected with the terminal interface in series, and the second end of the sampling circuit is grounded;
and the recording device is connected with the sampling circuit and is used for recording the resistance value of the temperature sensing circuit.
9. A method of testing a temperature sensing circuit, comprising:
Connecting the temperature sensing circuit and the sampling circuit in series;
connecting a temperature sensing end of the temperature sensing circuit with a temperature adjusting device;
The method comprises the steps of obtaining first voltages at two ends of a sampling circuit, determining second voltages at two ends of a temperature sensing circuit according to the first voltages, determining current flowing through a series circuit of the temperature sensing circuit and the sampling circuit according to the first voltages and the resistance of the sampling circuit, and determining the resistance of the temperature sensing circuit according to the second voltages and the current.
10. The method of claim 9, wherein the number of series circuits of the temperature sensing circuit and the sampling circuit is a plurality.
11. The method according to claim 9, wherein the method further comprises: and recording and storing the resistance value of the temperature sensing circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810887484.4A CN108761207B (en) | 2018-08-06 | 2018-08-06 | Temperature sensing circuit testing method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810887484.4A CN108761207B (en) | 2018-08-06 | 2018-08-06 | Temperature sensing circuit testing method and device |
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| CN113588130A (en) * | 2021-06-18 | 2021-11-02 | 格力电器（武汉）有限公司 | Thermistor monitoring method and device, electronic equipment and storage medium |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102033195A (en) * | 2009-09-27 | 2011-04-27 | 湖北省电力试验研究院 | Device and method for measuring dynamic resistance of high-voltage circuit breaker |
| CN102565559A (en) * | 2010-12-28 | 2012-07-11 | 鸿富锦精密工业（深圳）有限公司 | Thermistor testing device |
| CN203519204U (en) * | 2013-10-25 | 2014-04-02 | 珠海格力电器股份有限公司 | Temperature-sensing wrap detection circuit |
| CN104568227A (en) * | 2013-10-25 | 2015-04-29 | 珠海格力电器股份有限公司 | Circuit, method and device for detecting temperature sensing bulb |
| CN104748877A (en) * | 2015-04-08 | 2015-07-01 | 深圳市航盛电子股份有限公司 | Linear signal collection circuit and system of temperature sensor |
| CN106679841A (en) * | 2015-11-05 | 2017-05-17 | 湖南南车时代电动汽车股份有限公司 | Temperature detecting device and temperature detecting method |
| CN208421074U (en) * | 2018-08-06 | 2019-01-22 | 珠海格力智能装备有限公司 | The test device of temperature-sensitive circuit |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9281833B2 (en) * | 2012-05-28 | 2016-03-08 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Analog-to-digital converter with power supply-based reference |
-
2018
- 2018-08-06 CN CN201810887484.4A patent/CN108761207B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102033195A (en) * | 2009-09-27 | 2011-04-27 | 湖北省电力试验研究院 | Device and method for measuring dynamic resistance of high-voltage circuit breaker |
| CN102565559A (en) * | 2010-12-28 | 2012-07-11 | 鸿富锦精密工业（深圳）有限公司 | Thermistor testing device |
| CN203519204U (en) * | 2013-10-25 | 2014-04-02 | 珠海格力电器股份有限公司 | Temperature-sensing wrap detection circuit |
| CN104568227A (en) * | 2013-10-25 | 2015-04-29 | 珠海格力电器股份有限公司 | Circuit, method and device for detecting temperature sensing bulb |
| CN104748877A (en) * | 2015-04-08 | 2015-07-01 | 深圳市航盛电子股份有限公司 | Linear signal collection circuit and system of temperature sensor |
| CN106679841A (en) * | 2015-11-05 | 2017-05-17 | 湖南南车时代电动汽车股份有限公司 | Temperature detecting device and temperature detecting method |
| CN208421074U (en) * | 2018-08-06 | 2019-01-22 | 珠海格力智能装备有限公司 | The test device of temperature-sensitive circuit |
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