CN108760245A - Optical element detection method and device, electronic equipment, readable storage medium storing program for executing - Google Patents
Optical element detection method and device, electronic equipment, readable storage medium storing program for executing Download PDFInfo
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- CN108760245A CN108760245A CN201810404506.7A CN201810404506A CN108760245A CN 108760245 A CN108760245 A CN 108760245A CN 201810404506 A CN201810404506 A CN 201810404506A CN 108760245 A CN108760245 A CN 108760245A
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- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
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Abstract
This application involves a kind of optical element detection method and device, electronic equipment, computer readable storage mediums.The method includes:It receives camera and starts request, acquisition request speckle pattern is started according to camera, speckle pattern is that the laser that light source generates in the projector is irradiated on object by optical element and is formed by image, is carried out abnormality detection to optical element according to speckle pattern.Due to can be carried out abnormality detection to optical element according to the speckle pattern of acquisition in camera start-up course, safety in utilization can be improved.
Description
Technical field
This application involves field of computer technology, are set more particularly to a kind of optical element detection method, device, electronics
Standby, computer readable storage medium.
Background technology
With the development of computer technology, depth image technology is widely used in recognition of face, human-computer interaction, image U.S.
The scenes such as change.Depth image is that the laser that light source generates in the projector is irradiated on object by optical element and is formed by speckle
What image was calculated.When diffraction optical element damages, laser irradiation can cause serious injury human eye to when human eye, deposit
In the low problem of safety in utilization.
Invention content
A kind of optical element detection method of the embodiment of the present application offer, device, electronic equipment, computer-readable storage medium
Matter can in use carry out abnormality detection optical element, improve safety in utilization.
A kind of optical element detection method, the method includes:
It receives camera and starts request;
Start acquisition request speckle pattern according to the camera, the speckle pattern is that the laser that light source generates in the projector is logical
It crosses optical element and is irradiated on object and be formed by image;
The optical element is carried out abnormality detection according to the speckle pattern.
A kind of optical element detection device, described device include:
Request receiving module starts request for receiving camera;
Speckle pattern acquisition module, for starting acquisition request speckle pattern according to the camera, the speckle pattern is projection
The laser that light source generates in device, which is irradiated to by optical element on object, is formed by image;
Detection module, for being carried out abnormality detection to the optical element according to the speckle pattern.
A kind of electronic equipment, including memory and processor store computer program, the calculating in the memory
When machine program is executed by the processor so that the processor executes following steps:
It receives camera and starts request;
Start acquisition request speckle pattern according to the camera, the speckle pattern is that the laser that light source generates in the projector is logical
It crosses optical element and is irradiated on object and be formed by image;
The optical element is carried out abnormality detection according to the speckle pattern.
A kind of computer readable storage medium, is stored thereon with computer program, and the computer program is held by processor
Following steps are realized when row:
It receives camera and starts request;
Start acquisition request speckle pattern according to the camera, the speckle pattern is that the laser that light source generates in the projector is logical
It crosses optical element and is irradiated on object and be formed by image;
The optical element is carried out abnormality detection according to the speckle pattern.
Above-mentioned optical element detection method, device, electronic equipment and computer readable storage medium can be imaged receiving
When head starts request, acquisition is irradiated on object by optical element by the laser of light source generation in the projector and is formed by speckle
Figure, carries out abnormality detection optical element according to speckle pattern.Since abnormal inspection can be carried out to optical element in use
It surveys, improves safety in utilization.
Description of the drawings
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below
There is attached drawing needed in technology description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of application for those of ordinary skill in the art without creative efforts, can be with
Obtain other attached drawings according to these attached drawings.
Fig. 1 is the application scenario diagram of one embodiment optical element detection method;
Fig. 2 is the flow chart of optical element detection method in one embodiment;
Fig. 3 is the flow chart of optical element detection method in another embodiment;
Fig. 4 is the flow chart of optical element detection method in another embodiment;
Fig. 5 is the flow chart of optical element detection method in another embodiment;
Fig. 6 is the flow chart carried out abnormality detection to optical element in one embodiment;
Fig. 7 is the flow chart that another embodiment carries out abnormality detection optical element;
Fig. 8 is the structure diagram of optical element detection device in one embodiment;
Fig. 9 is the schematic diagram of image processing circuit in one embodiment.
Specific implementation mode
It is with reference to the accompanying drawings and embodiments, right in order to make the object, technical solution and advantage of the application be more clearly understood
The application is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the application, and
It is not used in restriction the application.
It is appreciated that term " first " used in this application, " second " etc. can be used to describe herein various elements,
But these elements should not be limited by these terms.These terms are only used to distinguish first element and another element.Citing comes
It says, in the case where not departing from scope of the present application, the first client can be known as the second client, and similarly, can incite somebody to action
Second client is known as the first client.First client and the second client both client, but it is not same visitor
Family end.
Fig. 1 is the application scenario diagram of optical element detection method in one embodiment.As shown in Figure 1, electronic equipment 10 can
Including camera module 110, second processing unit 120, first processing units 130.Above-mentioned second processing unit 120 can be CPU
(Central Processing Unit, central processing unit) module.Above-mentioned first processing units 130 can be MCU
(Microcontroller Unit, micro-control unit) module 130 etc..Wherein, first processing units 130 are connected to second processing
Between unit 120 and camera module 110, above-mentioned first processing units 130 can control Laser video camera head in camera module 110
112, floodlight 114 and color-changing lamp 118, above-mentioned second processing unit 120 can control RGB cameras in camera module 110
116。
Camera module 110 include Laser video camera head 112, floodlight 114, RGB (Red/Green/Blue, red green/
Blue color pattern) camera 116 and color-changing lamp 118.Above-mentioned Laser video camera head 112 is infrared camera, for obtaining infrared figure
Picture.Above-mentioned floodlight 114 is the area source that infrared light can occur;Above-mentioned color-changing lamp 118 is that the point light source of laser can occur and be
With figuratum point light source.Wherein, when floodlight 114 emits area source, Laser video camera head 112 can be according to the light being reflected back
Obtain infrared image.When color-changing lamp 118 emits point light source, Laser video camera head 112 can obtain speckle according to the light being reflected back
Image.Above-mentioned speckle image is the image that pattern deforms upon after the figuratum point light source of band that color-changing lamp 118 emits is reflected.
First processing units 130 include PWM (Pulse Width Modulation, pulse width modulation) module 132,
SPI/I2C (Serial Peripheral Interface/Inter-Integrated Circuit, Serial Peripheral Interface (SPI)/bis-
To two-wire system synchronous serial interface) interface 134, RAM (Random Access Memory, random access memory) module 136
With depth engine 138.Above-mentioned PWM module 132 can emit pulse to camera module, control floodlight 114 or color-changing lamp 118 is opened
It opens so that Laser video camera head 112 can collect infrared image or speckle image.Above-mentioned SPI/I2C interfaces 134 are for receiving second
The face acquisition instructions that processing unit 120 is sent.Above-mentioned depth engine 138 can handle speckle image to obtain depth parallax
Figure.
When second processing unit 120 receives the data acquisition request of application program, for example, when application program need into
When the unlock of pedestrian's face, face payment, face can be sent to first processing units 130 by operating in the CPU core under TEE environment
Acquisition instructions.After first processing units 130 receive face acquisition instructions, impulse wave control can be emitted by PWM module 132
Floodlight 114 is opened and acquires infrared image, control camera module 110 by Laser video camera head 112 in camera module 110
Middle color-changing lamp 118 is opened and acquires speckle image by Laser video camera head 112.Camera module 110 can will be collected infrared
Image and speckle image are sent to first processing units 130.First processing units 130 can be at the infrared image that receives
Reason obtains infrared disparity map;The speckle image received is handled to obtain speckle disparity map or depth parallax figure.Wherein,
It refers to carrying out school to infrared image or speckle image that one processing unit 130 carries out processing to above-mentioned infrared image and speckle image
Just, influence of the inside and outside parameter to image in camera module 110 is removed.Wherein, first processing units 130 can be set to different
The image of pattern, different mode output is different.When first processing units 130 are set as speckle chart-pattern, first processing units
130 pairs of speckle image processings obtain speckle disparity map, and target speckle image can be obtained according to above-mentioned speckle disparity map;At first
When reason unit 130 is set as depth chart-pattern, first processing units 130 obtain depth parallax figure to speckle image processing, according to
Depth image can be obtained in above-mentioned depth parallax figure, and above-mentioned depth image refers to the image with depth information.First processing units
130 can be sent to above-mentioned infrared disparity map and speckle disparity map second processing unit 120, and first processing units 130 can also incite somebody to action
Above-mentioned infrared disparity map and depth parallax figure are sent to second processing unit 120.Second processing unit 120 can be according to above-mentioned infrared
Disparity map obtains Infrared Targets image, obtains depth image according to above-mentioned depth parallax figure.Further, second processing unit
120 can detect according to Infrared Targets image, depth image to carry out recognition of face, face matching, In vivo detection and acquisition
Face depth information.
Communicated between first processing units 130 and second processing unit 120 is by fixed safe interface, to ensure
The safety of transmission data.As shown in Figure 1, the data that second processing unit 120 is sent to first processing units 130 are to pass through peace
Full serial Peripheral Interface or bidirectional two-line synchronous serial interface (SECURE SPI/I2C) 140, first processing units 130 are sent
Data to second processing unit 120 be by safety moving Industry Processor Interface (SECURE MIPIMobile,
Industry Processor Interface)150。
In one embodiment, second processing unit 120 receives the camera of application program and starts request, can be to the
One processing unit 130 sends image capture instruction.First processing units 130 are by controlling color-changing lamp 118 in camera module 110
It opens and speckle pattern is acquired by Laser video camera head 112.Collected speckle pattern can be sent at first by camera module
Unit 130 is managed, first processing units 130 can carry out abnormality detection optical element according to the speckle pattern of acquisition.
In one embodiment, first processing units 130 can also obtain the infrared image of the acquisition of camera module 110,
Second processing unit 120 can carry out recognition of face, after recognition of face passes through, second processing unit according to above-mentioned infrared image
120 can according to speckle pattern carry out In vivo detection, when In vivo detection by when, first processing units can be according to the speckle pattern pair of acquisition
Optical element carries out abnormality detection.
Electronic equipment can be mobile phone, tablet computer, personal digital assistant or wearable device etc. in the embodiment of the present application.
In other embodiments, electronic equipment may include camera module 110 and second processing unit 120.
Fig. 2 is the flow chart of optical element detection method in one embodiment.As shown in Fig. 2, the optical element detection side
Method includes step 202 to step 206.
Step 202, it receives camera and starts request.
Camera can be divided into built-in camera and external camera.Specifically, camera can also be dual camera.Electricity
The camera of sub- equipment can be for acquire the RGB cameras of coloured image, the infrared camera for acquiring infrared image,
The arbitrary combination of Laser video camera head or above-mentioned camera for acquiring laser speckle image.It can use that camera, which starts request,
What family generated after being identified by the camera application programs clicked on display screen, can also be that user passes through on pressing electronic equipment
Camera control generate.
The camera that electronic equipment can receive generation starts request.
Step 204, acquisition request speckle pattern is started according to camera, speckle pattern is that the laser that light source generates in the projector is logical
It crosses optical element and is irradiated on object and be formed by image.
Electronic equipment receive camera start request after, can according to the camera start request control the projector to
Object projective structure light pattern acquires speckle pattern after object reflects by Laser video camera head.Speckle pattern refers to Laser video camera
The laser of head acquisition generated by light source in the projector, which is irradiated to by optical element on object, is formed by speckle image.Electronics
The projector of equipment can be color-changing lamp.The projector includes light source, collimating mirror and optical element.Wherein, light source can be surface launching
Laser, vertical cavity surface laser (VCSEL, Vertical Cavity Surface Emitting Laser) array.Optical element
It can be the combination of both DOE (Diffractive Optical Elements, diffraction optical element), frosted glass or the inside
Deng.Electronic equipment can calculate the depth information of object in picture according to the speckle pattern of acquisition.
Electronic equipment is irradiated to by optical element on object by the laser that light source in the projector generates, and is taken the photograph by laser
As head acquisition is formed by speckle pattern.
Step 206, optical element is carried out abnormality detection according to speckle pattern.
Abnormality detection to optical element refers to whether electronic equipment analyzes optical element according to the luminance information of speckle pattern
Damage.Specifically, electronic equipment can also be according to the damaged condition of the different decision optical element of the brightness of image of speckle pattern.Electricity
Sub- equipment can by set speckle pattern normal brightness range, detect the speckle pattern of acquisition brightness value whether setting just
Optical element is carried out abnormality detection in normal brightness range.Electronic equipment can also be by dissipating speckle pattern with pre-stored
Spot figure is compared to carry out abnormality detection optical element.
Electronic equipment carries out the abnormality detection of optical element according to speckle pattern by detecting the speckle pattern obtained.Electronics is set
For camera acquisition RGB image while being carried out abnormality detection to optical element according to speckle pattern, can be obtained, work as optical element
Abnormality detection by when, the depth information of objects in images can be calculated in electronic equipment according to the speckle pattern of acquisition, according to
The depth information and RGB image that speckle pattern calculates obtain the 3-D view of object.3-D view refers to that can describe object flat
Distributional pattern on face and spatially and tectonic relationship image compare two dimensional image, and 3-D view is other than height and width, also
With depth.
Optical element detection method in the embodiment of the present application, by receive camera start request when, according to camera shooting
The laser that light source generates in the head startup acquisition request projector, which is irradiated to by optical element on object, is formed by speckle pattern, root
Optical element is carried out abnormality detection according to speckle pattern.Due to can be in camera start-up course, according to the speckle pattern pair of acquisition
Optical element carries out abnormality detection, and can improve safety in utilization.
As shown in figure 3, in one embodiment, a kind of optical element detection method provided may include:
Step 302, the infrared image for obtaining acquisition carries out Face datection.
Infrared image refers to that electronic equipment is emitted by controlling floodlight on Infrared irradiation to object, and is taken the photograph by infrared
The image acquired as head.Face datection refers to using certain algorithm to analyze with determination image given image
In image whether the technology containing face.Recognition of face is carried out by the infrared image that infrared camera acquires, can eliminate can
The light-exposed recognition effect difference under different light conditions is larger, especially can not correctly be identified under sidelight shooting or low light environment
The problem of.
Step 304, after recognition of face passes through, In vivo detection is carried out according to speckle pattern.
Recognition of face by refer to electronic equipment acquisition image in include face.Specifically, the face in image can be with
For one or more.When recognition of face is obstructed out-of-date, illustrate there is no face in the image of electronic equipment acquisition, it can not be to image
Carry out In vivo detection.In vivo detection refers to obtaining the depth information of objects in images by speckle pattern, by depth information into
Whether the face that row analysis can obtain in image is live body.When having live body or other objects in image, electronic equipment obtains
Speckle pattern can have lateral shift with reference between the corresponding pixel of speckle pattern, by speckle pattern to acquisition and refer to speckle
The pixel-shift amount of figure carries out calculating the depth value that can obtain the corresponding spatial point of each pixel in speckle pattern apart from camera.When
When depth value of the corresponding spatial point of each pixel apart from camera is same or similar in speckle pattern, then the face information in speckle pattern
For two-dimension human face information.When depth value of the corresponding spatial point of each pixel apart from camera differs in speckle pattern face information
When, it may be determined that the face information in speckle pattern is living body faces information.
After recognition of face passes through, the depth that electronic equipment calculates face according to the speckle pattern of acquisition and with reference to speckle pattern is believed
Breath, to carry out In vivo detection.
Step 306, when In vivo detection by when, optical element is carried out abnormality detection according to speckle pattern.
In vivo detection determines that the face of speckle pattern is by referring to depth information of the electronic equipment according to face in speckle pattern
Living body faces.
If optical component damage, the laser that light source generates in the projector in electronic equipment is shone by the optical element of damage
When being mapped to living human eye, it can cause serious injury to human eye.By In vivo detection by when, according to the speckle pattern of In vivo detection
Optical element is carried out abnormality detection.When detecting optical element exception, the use of the projector can be closed in time, so as not to it is right
User damages, and can improve safety in utilization.
As shown in figure 4, in one embodiment, a kind of optical element detection method provided can also include following step
Suddenly:
Step 402, the infrared image for obtaining acquisition carries out Face datection.
Step 404, after recognition of face passes through, In vivo detection is carried out according to speckle pattern.
Step 406, when In vivo detection not by when, according to speckle pattern obtain camera and portrait distance value.
In vivo detection not by refer to electronic equipment acquisition recognition of face by speckle pattern in face be two-dimentional people
Face information.The distance value of camera and portrait is the distance length of the position of the position and portrait where Laser video camera head.Camera shooting
The distance value of head and portrait can be equivalent to the distance between electronic equipment and portrait value.When In vivo detection not by when, electronics
Equipment can measure the corresponding spatial point distance of each pixel of speckle pattern with the pixel-shift with reference to speckle pattern according to speckle pattern and take the photograph
As the depth value of head, and then depth value of the corresponding spatial point of each pixel of face information apart from camera in speckle pattern is obtained,
To obtain the distance value of camera and portrait.
Step 408, when distance value is more than pre-determined distance, optical element is carried out abnormality detection according to speckle pattern.
Pre-determined distance value can be set according to the characteristic of different laser and real work demand.Specifically, pre-determined distance
Value can be 20 centimetres, 30 centimetres etc. it is without being limited thereto.When the distance value of camera and portrait is more than pre-determined distance value, electronic equipment
Optical element is carried out abnormality detection according to speckle pattern.In one embodiment, when distance value is less than pre-determined distance, electronics is set
It is standby operating current, the working frequency etc. of the projector to be adjusted.Specifically, electronic equipment can be by the work of the projector
Electric current is reduced to that original 20%, 25% etc. are without being limited thereto, and the working frequency of the projector can also be set as to 1fps (Frames Per
Second, transmission frame number per second), 2fps etc. it is without being limited thereto.
Fig. 5 is the flow chart of the application optical element one specific embodiment of detection method, including:
Step 502, infrared image is obtained.Infrared image refers to that electronic equipment emits Infrared irradiation by controlling floodlight
Onto object, and the image acquired by infrared camera.
Step 504, detect in infrared image whether have face;If so, entering step 506;
Step 506, speckle pattern is obtained;
Step 508, detect in speckle pattern whether have live body;If it is not, 514 are then entered step, if so, entering step 510;
Step 510, whether detection optical element is abnormal;If so, entering step 512
Step 512, optical element frequency of abnormity is added 1.
Step 514, the distance value of camera and portrait is obtained according to speckle pattern;
Step 516, distance value is obtained according to speckle pattern, distance value is the distance value of camera and portrait;
Step 518, whether detection optical element is abnormal;If so, entering step 520
Step 520, the frequency of abnormity of optical element is increased by 1.
By the way that when distance value is less than pre-determined distance, the operating current and working frequency that adjust the projector can reduce laser
Light intensity and laser irradiation time, to reduce injury to human eye.Pass through, when distance value is more than pre-determined distance, according to
Whether extremely speckle pattern carries out abnormality detection optical element, optical element can be detected during the use of the projector, carried
High safety in utilization.
According to speckle pattern to optical element in a kind of optical element detection method provided in one of the embodiments,
It carries out abnormality detection, specifically includes:When the number for being consecutively detected speckle pattern exception is more than the first preset value, then optics is judged
Element is abnormal.
Specifically, electronic equipment carries out abnormality detection optical element according to speckle pattern, can be according to the brightness of speckle pattern
Information carries out abnormality detection speckle pattern.When electronic equipment detects that speckle pattern is non-abnormal, can stop to optical element
Abnormality detection.When electronic equipment detects speckle pattern exception, the frequency of abnormity of speckle pattern can be recorded, speckle pattern is abnormal
Number increases by 1, and continues to acquire speckle pattern, is carried out abnormality detection to speckle pattern.Electronic equipment is to be consecutively detected speckle pattern different
When normal number is more than the first preset value, judgement optical element is abnormal.First preset value can be according to the demand in practical application
Set, can be specifically 3 times, 4 times it is without being limited thereto.
By when the number for being consecutively detected speckle pattern exception is more than the first preset value judgement optical element it is abnormal, can be with
Avoid because environmental factor such as in image there are the higher object of reflectivity, outdoor natural light intensity it is big caused by speckle pattern it is different
The result mistake for often causing optical element abnormality detection can improve the accuracy of optical element detection.
In one embodiment, speckle pattern is detected in a kind of optical element detection method provided to specifically include extremely:It obtains
Take the zero level zone luminance value of speckle pattern;When the zero level zone luminance value of speckle pattern is more than predetermined threshold value, then speckle pattern is judged
It is abnormal.
Zero level region refers to the maximum region of brightness value in speckle pattern.Specifically, it is influenced by shooting distance, speckle pattern
Zero level region is likely located at the center of speckle pattern, it is also possible to be located at the center of speckle pattern position to the right.Electronic equipment can lead to
The search box for crossing the default size of setting traverses speckle pattern, using the region where the maximum search box of brightness value as speckle
The zero level region of figure.After electronic equipment determines the zero level region of speckle pattern, the zero level zone luminance value of speckle pattern can be obtained, when
When the zero level zone luminance value of speckle pattern is more than predetermined threshold value, judgement speckle pattern is abnormal.Predetermined threshold value can be according to experimental data
Or the demand of actual use is set.Specifically, predetermined threshold value should be greater than under natural light, and the laser that light source generates in the projector is logical
It crosses optical element and is irradiated to the maximum brightness for being formed by pixel in image on object.
In the case where optical element is abnormal, due to the optical characteristics of laser, the bright of picture centre region can be caused
Degree is abnormal, the size that electronic equipment passes through the brightness value and predetermined threshold value in the region of detection speckle pattern brightness exception, it is possible to determine that
The abnormal conditions of optical element.
In one embodiment, the optical element detection method provided can also include detection optical element frequency of abnormity
Process, as shown in fig. 6, specific steps include:
Step 602, when the number for being consecutively detected speckle pattern exception is more than the first preset value, judgement optical element is different
Often.
When electronic equipment detects that speckle pattern is non-abnormal, the abnormality detection to optical element can be stopped.When electronics is set
For when detecting speckle pattern exception, the frequency of abnormity of speckle pattern can be recorded, the number of speckle pattern exception is increased by 1, and continue
Speckle pattern is acquired, speckle pattern is carried out abnormality detection.Electronic equipment is more than first in the number for being consecutively detected speckle pattern exception
When preset value, judgement optical element is abnormal.
Step 604, when judging optical element exception, optical element frequency of abnormity is added 1.
When optical element frequency of abnormity refers to that electronic equipment carries out abnormality detection optical element according to speckle pattern, light is judged
Learn the number of element exception.Electronic equipment can carry out abnormality detection optical element when receiving camera and starting request, also
Can in face recognition process In vivo detection by when optical element is carried out abnormality detection, can also be obstructed in In vivo detection
It is out-of-date that optical element is carried out abnormality detection when face information and camera are more than pre-determined distance value.Electronic equipment can be remembered
Record the abnormality detection result to optical element under different situations.
When judging optical element exception, electronic equipment can record the frequency of abnormity of optical element, and optical element is different
Normal number increases by 1.
Step 606, when optical element frequency of abnormity is more than the second preset value, forbid the use of the projector.
The projector includes light source, collimating mirror and optical element.Laser is irradiated on object by optical element and forms speckle
Image, when optical component damage, the laser intensity for being irradiated to object increases, and can be caused to human eye seriously when being irradiated to human eye
Injury.Electronic equipment forbids the use of the projector when optical element frequency of abnormity is more than the second preset value, it is possible to reduce because
Optical element is abnormal and causes the injury to human eye.When optical element frequency of abnormity is less than the second preset value, electronic equipment can
It is reminded with sending out optical component damage to user, reduces use of the user to camera or face identification functions, and record optics
The result of optical element exception is uploaded to server by the frequency of abnormity of element.Second preset value can be according to actually using
Demand in journey determines.Specifically, in order to improve safety in utilization, the second preset value can be a smaller numerical value, example
Such as 3 times, 5 times without being limited thereto.
For electronic equipment when the number for being consecutively detected speckle image exception is more than the first preset value, judgement optical element is different
Often, the frequency of abnormity of optical element is increased by 1, when the frequency of abnormity of optical element is more than the second preset value, forbids the projector
Use.Due to that can determine that optical element is abnormal and forbids the projector when frequency of abnormity is more than preset value in repeated detection
Use, the safety in utilization of the projector can be improved while taking into account detection accuracy.
As shown in fig. 7, for another tool carried out abnormality detection to optical element in the application optical element detection method
The flow chart of body embodiment, including:
Step 702, speckle pattern is obtained;
Step 704, whether detection speckle pattern is abnormal, if then entering step 706;
Step 706, judge to detect whether number is more than the first preset value;If it is not, then return to step 702, if so, into
Step 708;
Step 708, judgement optical element is abnormal;
Step 710, optical element frequency of abnormity is added 1;
Step 712, judge whether frequency of abnormity is more than the second preset value;If it is not, then entering step 714 forbids the projector
It uses, if so, entering step 716;
Step 716, it reminds user and reports to server.
In another embodiment, detection method includes the following steps for a kind of optical element provided:
After recognition of face passes through, In vivo detection is carried out according to the speckle pattern of acquisition, speckle pattern is that light source produces in the projector
Raw laser, which is irradiated to by optical element on object, is formed by image;When In vivo detection by when, according to speckle pattern to light
Element is learned to carry out abnormality detection.
Recognition of face refers to RGB image or infrared image of the electronic equipment according to acquisition, using certain algorithm to image
Analyzed with determine in image whether the technology containing face.Recognition of face by refer to electronic equipment acquisition image in contain
There is face.Specifically, recognition of face by when image in face can be one or more.In vivo detection refers to passing through speckle
Whether figure obtains the depth information of objects in images, be living by analyzing depth information the face that can be obtained in image
Body.When In vivo detection is by being there are when living body faces in speckle pattern, electronic equipment can be according to the speckle pattern of acquisition to optics
Element carries out abnormality detection.
When, there are when living body faces, if optical component damage, light source generates in the projector in electronic equipment in speckle pattern
Laser when being irradiated to living human eye by the optical element of damage, can cause serious injury to human eye.By in recognition of face
In the process, optical element is carried out abnormality detection according to the speckle pattern of In vivo detection, it, can be with when detecting optical element exception
User is reminded to reduce the use of camera or stop the use of the projector in time, reduction damages user, and can improve makes
Use safety.
In one embodiment, a kind of optical element detection method is provided, realizes that this method is as follows institute
It states:
First, electronic equipment can receive camera startup request.Camera can be divided into built-in camera and external take the photograph
As head.Specifically, camera can also be dual camera.The camera of electronic equipment can be for acquiring coloured image
RGB cameras, the infrared camera for acquiring infrared image, the Laser video camera head for acquiring laser speckle image or above-mentioned
The arbitrary combination of camera.It can be that user is identified by the camera application programs clicked on display screen that camera, which starts request,
It generates afterwards, can also be that user is generated by pressing the camera control on electronic equipment.Electronic equipment can receive life
At camera start request.
Then, electronic equipment starts acquisition request speckle pattern according to camera, and speckle pattern is that light source generates in the projector
Laser is irradiated on object by optical element and is formed by image.Electronic equipment, can after receiving camera and starting request
Pass through laser after object reflects to object projective structure light pattern to start the request control projector according to the camera
Camera acquires speckle pattern.Speckle pattern refers to that the laser of Laser video camera head acquisition generated by light source in the projector passes through optics member
Part, which is irradiated on object, is formed by speckle image.The projector includes light source, collimating mirror and optical element.Wherein, light source can be
Surface-emission laser, vertical cavity surface laser (VCSEL, Vertical Cavity Surface Emitting Laser) array.Light
It can be both DOE (Diffractive Optical Elements, diffraction optical element), frosted glass or the inside to learn element
Combination etc..
Optionally, electronic equipment can also obtain the infrared image progress Face datection of acquisition, after recognition of face passes through,
Electronic equipment can obtain the speckle pattern of acquisition.Infrared image refers to that electronic equipment emits Infrared irradiation by controlling floodlight
Onto object, and the image acquired by infrared camera.Face datection refers to for given image, using certain algorithm
Image is analyzed with determine in image whether the technology containing face.Recognition of face by refer to electronic equipment acquisition figure
Include face as in.Specifically, the face in image can be one or more.Electronic equipment can pass through in Face datection
When, the speckle pattern of Laser video camera head acquisition is obtained, electronic equipment can be according to the speckle pattern of acquisition to the face information in image
Carry out In vivo detection.
Then, electronic equipment carries out abnormality detection optical element according to speckle pattern.Abnormality detection to optical element is
Refer to electronic equipment and analyzes whether optical element damages according to the luminance information of speckle pattern.Specifically, electronic equipment can also basis
The damaged condition of the different decision optical element of the brightness of image of speckle pattern.Electronic equipment can be by setting the normal of speckle pattern
Brightness range, detect the speckle pattern of acquisition brightness value whether come within the scope of the normal brightness of setting to optical element carry out it is different
Often detection.Electronic equipment can also be different to be carried out to optical element by being compared with pre-stored speckle pattern speckle pattern
Often detection etc..
Optionally, electronic equipment can according to the speckle pattern of acquisition carry out In vivo detection, when In vivo detection by when, according to
Speckle pattern carries out abnormality detection optical element.In vivo detection refers to obtaining the depth information of objects in images by speckle pattern,
Whether it is live body by analyzing depth information the face that can be obtained in image.When having live body or other objects in image
When, the speckle pattern that electronic equipment obtains can have lateral shift with reference between the corresponding pixel of speckle pattern, by acquisition
Speckle pattern, which with the pixel-shift amount with reference to speckle pattern calculate, can obtain the corresponding spatial point distance of each pixel in speckle pattern
The depth value of camera.When the face information in speckle pattern is living body faces, a pixel corresponds in the speckle pattern that electronics obtains
Depth value of the spatial point apart from camera be different.For example, the spatial point distance in speckle pattern face corresponding to nose
The depth value of camera is more than depth value of the spatial point apart from camera in speckle pattern in face corresponding to glasses, so as to
Determine that face is living body faces in speckle pattern.When In vivo detection is living body faces by being the face information in speckle pattern, electricity
Sub- equipment carries out abnormality detection optical element according to speckle pattern.
Optionally, electronic equipment can also be obstructed out-of-date in In vivo detection, and camera and portrait are obtained according to speckle pattern
Distance value carries out abnormality detection optical element according to speckle pattern when distance value is more than pre-determined distance.Pre-determined distance value can be with
It is set according to the characteristic of different laser and real work demand.Specifically, pre-determined distance value can be 20 centimetres, 30 centimetres etc.
It is without being limited thereto.For example, when it is face in a pictures that the face information of speckle pattern is practical, then the face that electronic equipment obtains is each
Depth value of the corresponding spatial point of pixel apart from camera is identical, that is to say, that the shooting of Laser video camera head is two-dimensional people
Face information, In vivo detection do not pass through, and when depth value is less than such as 25 centimetres of pre-determined distance value, and electronic equipment can be according to scattered
Spot figure carries out abnormality detection optical element.Electronic equipment can also be when distance value be less than pre-determined distance, to the work of the projector
Make electric current, working frequency etc. to be adjusted.Specifically, the operating current of the projector can be reduced to original by electronic equipment
20%, 25% etc. is without being limited thereto, and the working frequency of the projector can also be set as to 1fps (Frames Per Second, biography per second
Defeated frame number), 2fps etc. it is without being limited thereto.Electronic equipment distance value be less than pre-determined distance when, adjust the projector operating current and
Working frequency can reduce the light intensity of laser and the irradiation time of laser, to reduce the injury to human eye.
Optionally, electronic equipment by obtain speckle pattern zero level zone luminance value, when the zero level regional luminance of speckle pattern
When value is more than predetermined threshold value, then speckle pattern exception is judged.Zero level region refers to the maximum region of brightness value in speckle pattern.Specifically
Ground is influenced by shooting distance, and the zero level region of speckle pattern is likely located at the center of speckle pattern, it is also possible to is located in speckle pattern
Heart position to the right.The search box that electronic equipment can preset size by setting traverses speckle pattern, most by brightness value
Zero level region of the region as speckle pattern where big search box.It, can be with after electronic equipment determines the zero level region of speckle pattern
The zero level zone luminance value for obtaining speckle pattern judges speckle pattern when the zero level zone luminance value of speckle pattern is more than predetermined threshold value
It is abnormal.Predetermined threshold value can be set according to experimental data or the demand of actual use.
Optionally, when the number that electronic equipment is consecutively detected speckle pattern exception is more than the first preset value, judge optics
Element is abnormal.Electronic equipment carries out abnormality detection optical element according to speckle pattern, can be according to the luminance information pair of speckle pattern
Speckle pattern carries out abnormality detection.When electronic equipment detects that speckle pattern is non-abnormal, the exception inspection to optical element can be stopped
It surveys.When electronic equipment detects speckle pattern exception, the frequency of abnormity of speckle pattern can be recorded, the number of speckle pattern exception is increased
Add 1, and continue to acquire speckle pattern, speckle pattern is carried out abnormality detection.Electronic equipment is being consecutively detected abnormal time of speckle pattern
When number is more than the first preset value, judgement optical element is abnormal.
Optionally, when judging optical element exception, the frequency of abnormity of optical element is added 1 by electronic equipment, when optics member
When part frequency of abnormity is more than the second preset value, electronic equipment forbids the use of the projector.Optical element frequency of abnormity refers to electronics
When equipment carries out abnormality detection optical element according to speckle pattern, the number of optical element exception is judged, when judgement optical element
When abnormal, electronic equipment can record the frequency of abnormity of optical element, and optical element frequency of abnormity is increased by 1.Electronic equipment exists
When optical element frequency of abnormity is more than the second preset value, forbid the use of the projector, it is possible to reduce make because optical element is abnormal
The injury of pairs of human eye.When optical element frequency of abnormity is less than the second preset value, electronic equipment can send out optics to user
Component wear is reminded, and reduces use of the user to camera function or face identification functions, and the exception for recording optical element is secondary
Number, server is uploaded to by the result of optical element exception.
It should be understood that although each step in the flow chart of Fig. 2-7 is shown successively according to the instruction of arrow,
These steps are not that the inevitable sequence indicated according to arrow executes successively.Unless expressly stating otherwise herein, these steps
Execution there is no stringent sequences to limit, these steps can execute in other order.Moreover, at least one in Fig. 2-7
Part steps may include that either these sub-steps of multiple stages or stage are not necessarily in synchronization to multiple sub-steps
Completion is executed, but can be executed at different times, the execution sequence in these sub-steps or stage is also not necessarily successively
It carries out, but can either the sub-step of other steps or at least part in stage be in turn or alternately with other steps
It executes.
Fig. 8 is the structure diagram of the optical element detection device of one embodiment.As shown in figure 8, the device includes:
Request receiving module 820 starts request for receiving camera.
Speckle pattern acquisition module 840, for starting acquisition request speckle pattern according to camera, speckle pattern is light in the projector
The laser that source generates, which is irradiated to by optical element on object, is formed by image.
Detection module 860, for being carried out abnormality detection to optical element according to speckle pattern.
In one embodiment, detection module 860 can be also used for obtaining the infrared image progress Face datection of acquisition, when
After recognition of face passes through, according to speckle pattern carry out In vivo detection, when In vivo detection by when, according to speckle pattern to optical element into
Row abnormality detection.
In one embodiment, detection module 860 can be also used for when In vivo detection not by when, obtained according to speckle pattern
The distance value of camera and portrait carries out the optical element according to speckle pattern abnormal when distance value is more than pre-determined distance
Detection.
In one embodiment, detection module 860 can be also used for be more than when the number that be consecutively detected speckle pattern exception
When the first preset value, judgement optical element is abnormal.
In one embodiment, detection module 860 can be also used for obtaining the zero level zone luminance value of speckle pattern, work as speckle
When the zero level zone luminance value of figure is more than predetermined threshold value, then speckle pattern exception is judged.
In one embodiment, detection module 860 can be also used for when judging optical element exception, and optical element is different
Normal number adds 1, when optical element frequency of abnormity is more than the second preset value, forbids the use of the projector.
Above-mentioned optical element detection device can start the laser that light source generates in the acquisition request projector according to camera
Be irradiated on object by optical element and be formed by speckle pattern, or recognition of face by when obtain speckle pattern carry out live body inspection
After survey, optical element is carried out abnormality detection according to speckle pattern.Due to can be in starting camera and face recognition process, root
According to the speckle pattern of acquisition to optical element abnormality detection, safety in utilization can be improved.
The division of modules is only used for for example, in other embodiments in above-mentioned optical element detection device, can
Optical element detection device is divided into different modules as required, with complete above-mentioned optical element detection device whole or
Partial function.
The realization of modules in the optical element detection device provided in the embodiment of the present application can be computer program
Form.The computer program can be run on electronic equipment or server.The program module that the computer program is constituted can deposit
Storage is on the memory of electronic equipment or server.When the computer program is executed by processor, realize in the embodiment of the present application
The step of described method.
The embodiment of the present application also provides a kind of computer readable storage mediums.One or more is executable comprising computer
The non-volatile computer readable storage medium storing program for executing of instruction, when the computer executable instructions are executed by one or more processors
When so that the processor executes the step of optical element detection method.
A kind of computer program product including instruction, when run on a computer so that computer executes optics
Element testing method.
The embodiment of the present application also provides a kind of electronic equipment.Above-mentioned electronic equipment includes image processing circuit, at image
Managing circuit can utilize hardware and or software component to realize, it may include define ISP (Image Signal Processing, figure
As signal processing) the various processing units of pipeline.Fig. 9 is the schematic diagram of image processing circuit in one embodiment.Such as Fig. 9 institutes
Show, for purposes of illustration only, only showing the various aspects with the relevant image processing techniques of the embodiment of the present application.
As shown in figure 9, image processing circuit includes ISP processors 940 and control logic device 950.Imaging device 910 captures
Image data handled first by ISP processors 940, ISP processors 940 to image data analyzed with capture can be used for really
The image statistics of fixed and/or imaging device 910 one or more control parameters.Imaging device 910 may include thering is one
The camera of a or multiple lens 912 and imaging sensor 914.Imaging sensor 914 may include colour filter array (such as
Bayer filters), imaging sensor 914 can obtain the luminous intensity captured with each imaging pixel of imaging sensor 914 and wavelength
Information, and the one group of raw image data that can be handled by ISP processors 940 is provided.Sensor 920 (such as gyroscope) can be based on passing
The parameter (such as stabilization parameter) of the image procossing of acquisition is supplied to ISP processors 940 by 920 interface type of sensor.Sensor 920
Interface can utilize SMIA (Standard Mobile Imaging Architecture, Standard Mobile Imager framework) interface,
The combination of other serial or parallel camera interfaces or above-mentioned interface.
In addition, raw image data can be also sent to sensor 920 by imaging sensor 914, sensor 920 can be based on passing
920 interface type of sensor is supplied to ISP processors 940 or sensor 920 to deposit raw image data raw image data
It stores up in video memory 930.
ISP processors 940 handle raw image data pixel by pixel in various formats.For example, each image pixel can
Bit depth with 8,10,12 or 14 bits, ISP processors 940 can carry out raw image data at one or more images
Reason operation, statistical information of the collection about image data.Wherein, image processing operations can be by identical or different bit depth precision
It carries out.
ISP processors 940 can also receive image data from video memory 930.For example, 920 interface of sensor will be original
Image data is sent to video memory 930, and the raw image data in video memory 930 is available to ISP processors 940
It is for processing.Video memory 930 can be independent special in a part, storage device or electronic equipment for memory device
With memory, and it may include DMA (Direct Memory Access, direct direct memory access (DMA)) feature.
When receiving from 914 interface of imaging sensor or from 920 interface of sensor or from video memory 930
When raw image data, ISP processors 940 can carry out one or more image processing operations, such as time-domain filtering.Treated schemes
As data can be transmitted to video memory 930, to carry out other processing before shown.ISP processors 940 are from image
Memory 930 receives processing data, and is carried out in original domain and in RGB and YCbCr color spaces to the processing data
Image real time transfer.Treated that image data may be output to display 970 for ISP processors 940, for user's viewing and/or
It is further processed by graphics engine or GPU (Graphics Processing Unit, graphics processor).In addition, ISP processors
940 output also can be transmitted to video memory 930, and display 970 can read image data from video memory 930.?
In one embodiment, video memory 930 can be configured as realizing one or more frame buffers.In addition, ISP processors 940
Output can be transmitted to encoder/decoder 960, so as to encoding/decoding image data.The image data of coding can be saved,
And it is decompressed before being shown in 970 equipment of display.Encoder/decoder 960 can be real by CPU or GPU or coprocessor
It is existing.
The statistical data that ISP processors 940 determine, which can be transmitted, gives control logic device Unit 950.For example, statistical data can wrap
Include the image sensings such as automatic exposure, automatic white balance, automatic focusing, flicker detection, black level compensation, 912 shadow correction of lens
914 statistical information of device.Control logic device 950 may include the processor and/or micro-control that execute one or more routines (such as firmware)
Device processed, one or more routines can determine the control parameter and ISP processors of imaging device 910 according to the statistical data of reception
940 control parameter.For example, the control parameter of imaging device 910 may include 920 control parameter of sensor (such as gain, exposure
The time of integration, stabilization parameter of control etc.), camera flash control parameter, 912 control parameter of lens (such as focus or zoom
With focal length) or these parameters combination.ISP control parameters may include for automatic white balance and color adjustment (for example, in RGB
During processing) 912 shadow correction parameter of gain level and color correction matrix and lens.
In the embodiment of the present application, the application is realized when which stores computer program on a memory
In embodiment the step of optical element detection method.
Used in this application may include to any reference of memory, storage, database or other media is non-volatile
And/or volatile memory.Suitable nonvolatile memory may include read-only memory (ROM), programming ROM (PROM),
Electrically programmable ROM (EPROM), electrically erasable ROM (EEPROM) or flash memory.Volatile memory may include arbitrary access
Memory (RAM), it is used as external cache.By way of illustration and not limitation, RAM is available in many forms, such as
It is static RAM (SRAM), dynamic ram (DRAM), synchronous dram (SDRAM), double data rate sdram (DDR SDRAM), enhanced
SDRAM (ESDRAM), synchronization link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM
(RDRAM), direct memory bus dynamic ram (DRDRAM) and memory bus dynamic ram (RDRAM).
The several embodiments of the application above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
Cannot the limitation to the application the scope of the claims therefore be interpreted as.It should be pointed out that for those of ordinary skill in the art
For, under the premise of not departing from the application design, various modifications and improvements can be made, these belong to the guarantor of the application
Protect range.Therefore, the protection domain of the application patent should be determined by the appended claims.
Claims (10)
1. a kind of optical element detection method, the method includes:
It receives camera and starts request;
Start acquisition request speckle pattern according to the camera, the speckle pattern is that the laser that light source generates in the projector passes through light
Element, which is irradiated on object, is formed by image;
The optical element is carried out abnormality detection according to the speckle pattern.
2. according to the method described in claim 1, it is characterized in that, the method further includes:
The infrared image for obtaining acquisition carries out Face datection;
After recognition of face passes through, In vivo detection is carried out according to the speckle pattern;
When In vivo detection by when, the optical element is carried out abnormality detection according to the speckle pattern.
3. according to the method described in claim 2, it is characterized in that, the method further includes:
When In vivo detection not by when, according to the speckle pattern obtain camera and portrait distance value;
When the distance value is more than pre-determined distance, the optical element is carried out abnormality detection according to the speckle pattern.
4. according to the method described in claim 1, it is characterized in that, described carry out the optical element according to the speckle pattern
Abnormality detection, including:
When the number for being consecutively detected speckle pattern exception is more than the first preset value, judge that the optical element is abnormal.
5. according to the method described in claim 4, it is characterized in that, described detect that the speckle pattern is abnormal, including:
Obtain the zero level zone luminance value of the speckle pattern;
When the zero level zone luminance value of the speckle pattern is more than predetermined threshold value, then judge that the speckle pattern is abnormal.
6. according to the method described in claim 4, it is characterized in that, the method further includes:
When judging the optical element exception, the optical element frequency of abnormity is added 1;
When the optical element frequency of abnormity is more than the second preset value, forbid the use of the projector.
7. a kind of optical element detection method, the method includes:
After recognition of face passes through, In vivo detection is carried out according to the speckle pattern of acquisition, the speckle pattern is that light source produces in the projector
Raw laser, which is irradiated to by optical element on object, is formed by image;
When In vivo detection by when, the optical element is carried out abnormality detection according to the speckle pattern.
8. a kind of optical element detection device, which is characterized in that including:
Request receiving module starts request for receiving camera;
Speckle pattern acquisition module, for starting acquisition request speckle pattern according to the camera, the speckle pattern is in the projector
The laser that light source generates, which is irradiated to by optical element on object, is formed by image;
Detection module, for being carried out abnormality detection to the optical element according to the speckle pattern.
9. a kind of electronic equipment, including memory and processor, computer program, the computer are stored in the memory
When program is executed by the processor so that the processor executes the optical element as described in any one of claim 1 to 7
The step of detection method.
10. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program
The step of method as described in any one of claim 1 to 7 is realized when being executed by processor.
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CN201810404506.7A CN108760245B (en) | 2018-04-28 | 2018-04-28 | Optical element detection method and device, electronic equipment, readable storage medium storing program for executing |
EP19736569.5A EP3567851A4 (en) | 2018-03-12 | 2019-02-18 | Projector and test method and device therefor, image acquisition device, electronic device, readable storage medium |
PCT/CN2019/075386 WO2019174435A1 (en) | 2018-03-12 | 2019-02-18 | Projector and test method and device therefor, image acquisition device, electronic device, readable storage medium |
TW108108335A TWI696391B (en) | 2018-03-12 | 2019-03-12 | Projector, detection method and detection device thereof, image capturing device, electronic device, and computer readable storage medium |
US16/684,299 US11348217B2 (en) | 2018-03-12 | 2019-11-14 | Projector, detection method thereof, and electronic device |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109932828A (en) * | 2019-02-01 | 2019-06-25 | 杭州驭光光电科技有限公司 | Light projection method and light projecting apparatus |
WO2019174435A1 (en) * | 2018-03-12 | 2019-09-19 | Oppo广东移动通信有限公司 | Projector and test method and device therefor, image acquisition device, electronic device, readable storage medium |
CN112577715A (en) * | 2019-09-27 | 2021-03-30 | 三赢科技(深圳)有限公司 | Point inspection method, point inspection device and computer device |
CN112629828A (en) * | 2020-11-27 | 2021-04-09 | 奥比中光科技集团股份有限公司 | Optical information detection method, device and equipment |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102970548A (en) * | 2012-11-27 | 2013-03-13 | 西安交通大学 | Image depth sensing device |
CN103268608A (en) * | 2013-05-17 | 2013-08-28 | 清华大学 | Depth estimation method and device based on near-infrared laser speckles |
WO2017009808A3 (en) * | 2015-07-15 | 2017-03-09 | The Secretary, Department of Electronics and Information Technology (DeitY) | Free space optical communication system, apparatus and a method thereof |
CN106529545A (en) * | 2016-09-26 | 2017-03-22 | 北京林业大学 | Speckle image quality recognition method and system based on image feature description |
-
2018
- 2018-04-28 CN CN201810404506.7A patent/CN108760245B/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102970548A (en) * | 2012-11-27 | 2013-03-13 | 西安交通大学 | Image depth sensing device |
CN103268608A (en) * | 2013-05-17 | 2013-08-28 | 清华大学 | Depth estimation method and device based on near-infrared laser speckles |
WO2017009808A3 (en) * | 2015-07-15 | 2017-03-09 | The Secretary, Department of Electronics and Information Technology (DeitY) | Free space optical communication system, apparatus and a method thereof |
CN106529545A (en) * | 2016-09-26 | 2017-03-22 | 北京林业大学 | Speckle image quality recognition method and system based on image feature description |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019174435A1 (en) * | 2018-03-12 | 2019-09-19 | Oppo广东移动通信有限公司 | Projector and test method and device therefor, image acquisition device, electronic device, readable storage medium |
US11348217B2 (en) | 2018-03-12 | 2022-05-31 | Guangdong Oppo Mobile Telecommunications Corp., Ltd. | Projector, detection method thereof, and electronic device |
CN109932828A (en) * | 2019-02-01 | 2019-06-25 | 杭州驭光光电科技有限公司 | Light projection method and light projecting apparatus |
CN112577715A (en) * | 2019-09-27 | 2021-03-30 | 三赢科技(深圳)有限公司 | Point inspection method, point inspection device and computer device |
CN112629828A (en) * | 2020-11-27 | 2021-04-09 | 奥比中光科技集团股份有限公司 | Optical information detection method, device and equipment |
CN112629828B (en) * | 2020-11-27 | 2023-07-04 | 奥比中光科技集团股份有限公司 | Optical information detection method, device and equipment |
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