CN108717172A - A kind of mutual inductor dynamic error test system and method - Google Patents

Abstract

The invention discloses a transformer dynamic error testing system and method. The system includes a dynamic waveform signal source, a signal processing unit, a standard transformer unit and a dynamic error checking unit. The dynamic waveform signal source is used to pass a variety of The method simulates various dynamic loads to generate dynamic waveform signals; the signal processing unit is used to generate a processing signal suitable for the primary side input of the transformer according to the dynamic waveform signal; the standard transformer unit is used to provide standard transformer output as Comparison object; the dynamic error calibration unit is used to perform error analysis according to the output of the standard transformer and the output of the transformer to be tested under the same input, and output error data; the system and method realize the dynamics of the analog power system access The dynamic error test is carried out on the power transformer under load, which provides a technical means for evaluating the influence of dynamic load on the measurement performance of the power transformer.

Description

A testing system and method for dynamic error of transformer

technical field

The invention relates to the field of electric power technology, and more specifically, to a dynamic error testing system and method for a transformer.

Background technique

With the extensive application of power electronic equipment and other new power equipment in the power system, the load characteristics become more and more complex. The most discussed in the existing research is the harmonic source load, which mainly comes from nonlinear power electronic equipment, including AC arc and ferromagnetic nonlinear equipment, such as steel mills, chemical plants, electrified railways, etc. When the sinusoidal fundamental wave voltage is applied to nonlinear equipment, the original sinusoidal AC current waveform will be distorted, the current absorbed by the equipment is different from the applied voltage waveform, and the harmonic current injected into the grid will cause voltage and current sinusoidal waveform distortion. These devices become the harmonic source load of the power system. In the actual power system, the total system load is composed of various loads of different natures, and its characteristics will be more complicated.

Through the basic harmonic analysis of a large number of measured data, the statistics of the harmonic content of the voltage and current, and according to the waveform characteristics of the current sampling signal, the nonlinear special load of the power grid is initially divided into two types: harmonic type and dynamic type. The basic characteristics of the harmonic load are that the voltage contains a small amount of harmonics, the current contains a large number of harmonics, and the current is a steady non-sinusoidal periodic signal; the basic characteristics of the dynamic load are that the voltage contains a small amount of harmonics, the current contains a large number of harmonics, and the current is non-sinusoidal. Steady, non-sinusoidal, non-periodic (local) signals, such as current signals showing dynamic envelope characteristics. Based on the above statistical analysis of the actual load of the power grid, the basic harmonic load no longer satisfies the characteristic description of the special dynamic load, and the signal is locally fluctuating due to amplitude or frequency changes, and the signal is non-stationary for a certain period of time. The proportion of dynamic signals of state is increasing; the error characteristics of existing transformers under harmonic load and dynamic load are different, but the existing error test system is difficult to meet the requirements of dynamic load. Accurate dynamic error measurement.

Contents of the invention

In order to solve the problem that the existing error testing system in the background technology is difficult to meet the problem of accurate dynamic error measurement under dynamic load, the present invention provides a dynamic error testing system and method for transformers. The method and system can be used according to Actual requirements generate dynamic waveform signals by simulating various dynamic loads in various ways, and obtain error results under dynamic loads by comparing with the output of the secondary side of a standard transformer. The dynamic error test system for a transformer includes:

A dynamic waveform signal source, the dynamic waveform signal source includes an input module, a signal source control module and a DA conversion module; the input module is used to receive dynamic waveform parameters in a preset format, and send the dynamic waveform parameters to the signal source Control module; the signal source control module generates a dynamic waveform signal according to the dynamic waveform parameters, and sends the dynamic waveform signal to the DA conversion module; the DA conversion module outputs a corresponding analog waveform signal according to the dynamic waveform signal; the dynamic Waveform parameters include fundamental frequency, fundamental amplitude, fundamental phase, harmonic order, amplitude vector and harmonic content corresponding to each harmonic;

A signal processing unit, the signal processing unit is used to process the analog waveform signal output by the dynamic waveform signal source according to preset rules, and obtain a processing signal suitable for the input of the primary side of the transformer; the output terminal of the signal processing unit is in line with the standard The input end of the transformer unit is connected to the input end of the transformer to be tested;

A standard transformer unit, the standard transformer unit is used to output a standard signal on the secondary side of the standard transformer according to the processing signal input on the primary side of the standard transformer;

A dynamic error checking unit, the dynamic error checking unit includes a signal conversion module, an AD acquisition module, a check control module and a performance check module;

The signal conversion module includes a standard input port and an input port to be tested, the standard input port is connected to the output terminal of the standard transformer, and the input port to be tested is connected to the transformer to be tested; the signal conversion module uses For converting the input standard signal into a standard small signal in a preset format; the signal conversion module is used to convert the input signal to be tested into a small signal to be tested in a preset format;

The verification control module is used to send AD acquisition control instructions to the AD acquisition module according to preset rules; the verification control module is used to send verification control instructions to the performance verification module according to preset rules;

The AD acquisition module is used to convert the standard small signal and the small signal to be measured into a standard digital signal and a digital signal to be measured according to the AD acquisition control instruction sent by the verification control module;

The performance verification module is used for performing error analysis on the standard digital signal and the digital signal to be tested according to the verification control instruction sent by the verification control module, and outputting error data.

Further, the signal processing unit includes a power amplifier and a booster; the power amplifier is used to amplify the analog waveform signal output by the dynamic waveform signal source according to a preset gain; the booster is used to amplify the power The analog waveform signal is boosted according to the preset rules to obtain the voltage processing signal;

The standard transformer unit includes a standard voltage transformer, and the standard voltage transformer is used to output a standard voltage signal according to a voltage processing signal;

The standard input port of the signal conversion module includes a standard voltage input port; the input port to be tested includes a voltage input port to be tested; the signal conversion module is used to convert the input standard voltage signal into a standard small voltage in a preset format signal; the signal conversion module is used to convert the input voltage signal to be measured into a small voltage signal to be measured in a preset format;

Further, the signal processing unit includes a power amplifier and a current booster; the power amplifier is used to amplify the analog waveform signal output by the dynamic waveform signal source according to a preset gain; the current booster is used to amplify the power The analog waveform signal is raised according to the preset rules to obtain the current processing signal;

The standard transformer unit includes a standard current transformer, and the standard voltage transformer is used to output a standard current signal according to the current processing signal;

The standard input port of the signal conversion module includes a standard current input port; the input port to be tested includes a current input port to be measured; the signal conversion module is used to convert the input standard current signal into a standard small current in a preset format signal; the signal conversion module is used to convert the input current signal to be measured into a small current signal to be measured in a preset format;

Further, the input module includes a parameter input submodule and a function input submodule;

The parameter input sub-module is used to receive the dynamic waveform parameters entered by the user in a preset format, and send the dynamic waveform parameters to the signal source control module;

The function input sub-module is used to receive multiple sets of function formulas combined in chronological order input by the user, and send the function formulas to the signal source control module, and the signal source control module obtains Dynamic waveform parameters;

Further, the input module includes a hand-drawn waveform input sub-module;

The hand-drawn waveform input sub-module includes a touch screen sensor and an acquisition card; the touch screen sensor receives the waveform drawn by the user on it, and converts the waveform into a waveform electrical signal and sends it to the acquisition card; Obtain dynamic waveform parameters through waveform electrical signal processing calculation, and send the dynamic waveform parameters to the signal source control module;

Further, the verification control module generates AD acquisition control instructions according to the preset sampling parameters including frequency and sampling rate; the verification control module includes the range, transformation ratio and signal for different transformer types according to the preset The verification parameters of the channel generate verification control instructions;

Described a kind of instrument transformer dynamic error testing method comprises:

Receive dynamic waveform parameters in a preset format, generate dynamic waveform signals according to the dynamic waveform parameters, and convert the dynamic waveform signals into analog waveform signals through DA conversion; the dynamic waveform parameters include fundamental frequency and fundamental amplitude , fundamental wave phase, harmonic order and the corresponding amplitude vector and harmonic content of each harmonic;

The analog waveform signal is respectively input to the input end of the standard sensor and the input end of the sensor to be tested through signal processing;

receiving the standard signal output by the output end of the standard sensor and the signal to be measured output by the output end of the sensor to be measured, performing signal processing and AD sampling on the standard signal and the signal to be measured, and generating a standard signal and a digital signal to be measured;

Error analysis is performed on the standard digital signal and the digital signal to be tested, and error data is output.

Further, when the transformer to be tested is a voltage transformer, the signal processing of the analog waveform signal to the input terminal of the standard sensor and the input terminal of the sensor to be tested respectively further includes: analog waveform signal according to the preset The gain is amplified and the voltage is boosted according to preset rules to obtain a voltage processing signal; the voltage processing signal is respectively input to the input end of the standard voltage sensor and the input end of the voltage sensor to be measured;

Further, when the transformer to be tested is a current transformer, the signal processing of the analog waveform signal to the input terminal of the standard sensor and the input terminal of the sensor to be tested respectively further includes: analog waveform signal according to the preset The gain is amplified and the voltage is boosted according to preset rules to obtain a voltage processing signal; the voltage processing signal is respectively input to the input end of the standard voltage sensor and the input end of the voltage sensor to be measured;

Further, said receiving the dynamic waveform parameters in the preset format also includes:

Receive dynamic waveform parameters entered by the user in a preset format;

Receive multiple sets of function formulas combined in chronological order input by the user, and obtain dynamic waveform parameters according to the solution of the function formulas;

Receive the waveform drawn by the user on the touch screen sensor, convert the waveform into a waveform electrical signal and process and calculate to obtain dynamic waveform parameters.

The beneficial effects of the present invention are: the technical scheme of the present invention provides a dynamic error testing system and method of a transformer, the system and method can simulate the voltage or current signal when the power system is connected to a dynamic load according to the demand, The error result under dynamic load is obtained by comparing with the secondary side output of the standard transformer, and the dynamic load error test is carried out on the power transformer; it provides technical means for evaluating the impact of dynamic load on the measurement performance of the power transformer.

Description of drawings

A more complete understanding of the exemplary embodiments of the present invention can be had by referring to the following drawings:

Fig. 1 is the structural diagram of a kind of transformer dynamic error testing system of the specific embodiment of the present invention;

Fig. 2 is a flow chart of a method for testing a dynamic error of a transformer according to a specific embodiment of the present invention.

Detailed ways

Exemplary embodiments of the present invention will now be described with reference to the drawings; however, the present invention may be embodied in many different forms and are not limited to the embodiments described herein, which are provided for the purpose of exhaustively and completely disclosing the present invention. invention and fully convey the scope of the invention to those skilled in the art. The terms used in the exemplary embodiments shown in the drawings do not limit the present invention. In the figures, the same units/elements are given the same reference numerals.

Unless otherwise specified, the terms (including scientific and technical terms) used herein have the commonly understood meanings to those skilled in the art. In addition, it can be understood that terms defined by commonly used dictionaries should be understood to have consistent meanings in the context of their related fields, and should not be understood as idealized or overly formal meanings.

Fig. 1 is the structural diagram of a kind of transformer dynamic error testing system of the specific embodiment of the present invention; Said system can simulate various dynamic loads to generate dynamic waveform signals in various ways according to actual needs, and through secondary The comparison of side output obtains the error result under dynamic load, and described a kind of instrument transformer dynamic error test system comprises:

A dynamic waveform signal source 110, the dynamic waveform signal source 110 includes an input module 111, a signal source control module 112 and a DA conversion module 113; the input module 111 is used to receive dynamic waveform parameters in a preset format, and convert the dynamic The waveform parameters are sent to the signal source control module 112; the signal source control module 112 generates a dynamic waveform signal according to the dynamic waveform parameters, and sends the dynamic waveform signal to the DA conversion module 113; the DA conversion module generates a dynamic waveform signal according to the dynamic waveform signal Output the corresponding analog waveform signal; the dynamic waveform parameters include fundamental frequency, fundamental amplitude, fundamental phase, harmonic order and amplitude vector corresponding to each harmonic and harmonic content;

Further, the input module 111 includes a parameter input submodule, a function input submodule and a hand-drawn waveform input submodule;

The parameter input sub-module is used to receive the dynamic waveform parameters entered by the user in a preset format, and send the dynamic waveform parameters to the signal source control module 112;

This method of obtaining dynamic waveform parameters is the most direct, and can be obtained by manually inputting dynamic waveform parameters of a specified type by the user;

The function input sub-module is used to receive multiple groups of function formulas combined in chronological order input by the user, and send the function formulas to the signal source control module 112, and the signal source control module 112 is based on the solution to the function formulas. Calculate and obtain dynamic waveform parameters;

The function input sub-module can directly apply the model of dynamic load characteristic simulation in the previous stage to the input end, without manual calculation and input of various parameters;

The hand-drawn waveform input sub-module includes a touch screen sensor and an acquisition card; the touch screen sensor receives the waveform drawn by the user on it, and converts the waveform into a waveform electrical signal and sends it to the acquisition card; Obtain dynamic waveform parameters through the waveform electric signal processing calculation, and send the dynamic waveform parameters to the signal source control module 112;

The touch-screen sensor can be of various types, and can also be equipped with a corresponding touch-screen writing pen for drawing; the horizontal and vertical coordinates and auxiliary lines can be displayed in advance on the touch-screen sensor;

The hand-drawn waveform input sub-module solves the problem that when the characteristics of the dynamic load cannot be obtained by modeling, or the modeling error is large, and the simulation effect cannot be guaranteed, according to the actual waveform of the load measured, the touch screen sensor Reproduce on the above to obtain the corresponding dynamic waveform;

The input module 111 includes but is not limited to the above three input methods, which completely cover various situations of inputting dynamic waveforms or dynamic waveform parameters representing dynamic load characteristics, ensuring the accuracy of the simulation of the required dynamic load ;

Taking the present embodiment as an example, the signal source control module 112 is composed of an industrial computer with a model of IPC-510MB and a DSP with a model of TMS320LF2407, and the control software is written using LabVIEW; the touch-screen sensor uses a Ctfly embedded touch-screen display; The DA converter is a DA converter modeled as LTC2656-12;

A signal processing unit 120, the signal processing unit 120 is used to process the analog waveform signal output by the dynamic waveform signal source 110 according to preset rules, and obtain a processing signal suitable for the primary side input of the transformer; the signal processing unit 120 The output terminal is connected with the input terminal of the standard transformer unit and the input terminal of the transformer to be tested;

Further, the signal processing unit 120 includes a power amplifier, a current booster and a voltage booster; according to the difference of the transformer to be tested (voltage transformer or current transformer), the signal processing unit 120 is selected with a current booster or Booster; further, it can also include a current booster and a booster at the same time, and then switch the working circuit according to the difference of the transformer to be tested;

The power amplifier is used to amplify the analog waveform signal output by the dynamic waveform signal source 110 according to a preset gain; the booster is used to boost the power amplified analog waveform signal according to a preset rule to obtain voltage processing signal; the booster is used to boost the amplified analog waveform signal according to preset rules to obtain a current processing signal;

Taking this embodiment as an example, the power amplifier of the signal processing unit 120 uses the 7796 power amplifier of AE Techron Company; the booster uses a 50KV test transformer;

A standard transformer unit 130, the standard transformer unit 130 is used to output a standard signal at the secondary side of the standard transformer according to the processing signal input at the primary side of the standard transformer;

The standard transformer unit 130 includes a standard voltage transformer and a standard current transformer, the standard voltage transformer is used to output a standard voltage signal according to a voltage processing signal; the standard current transformer is used to output a standard current signal according to a current processing signal;

Taking this embodiment as an example, the standard voltage transformer is a 35kV/100V, 0.005 class voltage transformer; the standard current transformer is a (5A-2000A)/5A, 0.01S class current transformer.

A dynamic error checking unit 140, the dynamic error checking unit 140 includes a signal conversion module 141, an AD acquisition module 142, a check control module 143 and a performance checking module 144;

The signal conversion module 141 includes a standard input port and an input port to be tested, the standard input port is connected to the output end of the standard transformer, and the input port to be tested is connected to the transformer to be tested; the signal conversion module 141 is used to convert the input standard signal into a standard small signal in a preset format; the signal conversion module 141 is used to convert the input signal to be measured into a small signal to be measured in a preset format;

Further, the standard input port of the signal conversion module 141 includes a standard voltage input port; the input port to be tested includes a voltage input port to be tested; the signal conversion module 141 is used to convert the input standard voltage signal into a preset A standard small voltage signal in a format; the signal conversion module 141 is used to convert the input voltage signal to be measured into a small voltage signal to be measured in a preset format;

Further, the standard input port of the signal conversion module 141 includes a standard current input port; the input port to be tested includes a current input port to be measured; the signal conversion module 141 is used to convert the input standard current signal into a preset A standard small current signal in a format; the signal conversion module 141 is used to convert the input current signal to be measured into a small current signal to be measured in a preset format;

The verification control module 143 is used to send AD acquisition control instructions to the AD acquisition module 142 according to preset rules; the verification control module 143 is used to send verification control instructions to the performance verification module 144 according to preset rules;

Further, the verification control module 143 generates AD acquisition control instructions according to the preset sampling parameters including frequency and sampling rate; the verification control module 143 includes the range and transformation ratio for different transformer types according to the preset And the verification parameters of the signal channel generate verification control instructions;

The AD acquisition module 142 is used to convert the standard small signal and the small signal to be measured into a standard digital signal and a digital signal to be measured according to the AD acquisition control instruction sent by the verification control module 143;

The performance verification module 144 is used for performing error analysis on the standard digital signal and the digital signal to be tested according to the verification control instruction sent by the verification control module 143, and outputting error data.

Taking this embodiment as an example, the signal conversion module 141 selects a seven-plate induction voltage divider FGB-02 with a rated voltage of 200V and a shunt A40B with a rated current of 5A to convert the 0-120V voltage signal output from the secondary side of the transformer or The 0-6A current signal is converted into a small voltage signal of about 1V and transmitted to the AD acquisition module 142; the AD acquisition module 142 adopts the A/D chip of AD9695-1300; the verification control module 143 selects Advantech industrial computer IPC-510MB; performance verification Module 144 uses a TMS320F2812 type DSP.

Fig. 2 is the flow chart of a kind of transformer dynamic error testing method of the specific embodiment of the present invention; As shown in Fig. 2, described method comprises:

Step 201, receiving dynamic waveform parameters in a preset format, generating a dynamic waveform signal according to the dynamic waveform parameters, and converting the dynamic waveform signal into an analog waveform signal through DA conversion; the dynamic waveform parameters include fundamental frequency, fundamental Wave amplitude, fundamental wave phase, harmonic order and corresponding amplitude vector and harmonic content of each harmonic;

Further, the receiving of dynamic waveform parameters in a preset format includes three ways:

Mode 1, receiving the dynamic waveform parameters entered by the user according to the preset format;

Mode 2, receiving multiple sets of function formulas combined in chronological order input by the user, and obtaining dynamic waveform parameters according to the calculation of the function formulas;

Mode 3, receiving the waveform drawn by the user on the touch screen sensor, converting the waveform into a waveform electrical signal and processing and calculating to obtain dynamic waveform parameters;

Step 202, inputting the analog waveform signal to the input terminal of the standard sensor and the input terminal of the sensor to be tested respectively through signal processing;

Further, when the transformer to be tested is a voltage transformer, the analog waveform signal is amplified according to a preset gain and boosted according to a preset rule to obtain a voltage processing signal; the voltage processing signal is respectively input into a standard The input terminal of the voltage sensor and the input terminal of the voltage sensor to be measured;

Further, when the transformer to be tested is a current transformer, the analog waveform signal is amplified according to a preset gain and boosted according to a preset rule to obtain a voltage processing signal; the voltage processing signal is respectively input to a standard The input terminal of the voltage sensor and the input terminal of the voltage sensor to be measured;

Step 203, receiving the standard signal output by the output terminal of the standard sensor and the signal to be measured output by the output terminal of the sensor to be tested, performing signal processing and AD sampling on the standard signal and the signal to be tested, and generating a standard signal and a digital signal to be measured ;

Step 204, performing error analysis on the standard digital signal and the digital signal to be tested, and outputting error data.

In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the present disclosure may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure the understanding of this description.

Those skilled in the art can understand that the modules in the device in the embodiment can be adaptively changed and arranged in one or more devices different from the embodiment. Modules or units or components in the embodiments may be combined into one module or unit or component, and furthermore may be divided into a plurality of sub-modules or sub-units or sub-assemblies. All features disclosed in this specification (including accompanying claims, abstract and drawings) and any method or method so disclosed may be used in any combination, except that at least some of such features and/or processes or units are mutually exclusive. All processes or units of equipment are combined. Each feature disclosed in this specification (including accompanying claims, abstract and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise. The step numbers involved in this specification are only used to distinguish each step, and are not used to limit the time or logical relationship between each step. Unless otherwise clearly defined in the text, the relationship between each step includes various possible Happening.

In addition, those skilled in the art will understand that although some embodiments described herein include some features included in other embodiments but not others, combinations of features from different embodiments are meant to be within the scope of the present disclosure. and form different embodiments. For example, any one of the embodiments claimed in the claims may be used in any combination.

The various component embodiments of the present disclosure may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. The present disclosure can also be implemented as an apparatus or system program (eg, computer program and computer program product) for performing a part or all of the methods described herein. Such a program realizing the present disclosure may be stored on a computer-readable medium, or may have the form of one or more signals. Such a signal may be downloaded from an Internet site, or provided on a carrier signal, or provided in any other form.

It should be noted that the above-mentioned embodiments illustrate rather than limit the disclosure, and that those skilled in the art will be able to design alternative embodiments without departing from the scope of the appended claims. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The disclosure can be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In a unit claim enumerating several systems, several of these systems can be embodied by one and the same item of hardware.

The above descriptions are only specific implementations of the present disclosure. It should be noted that those skilled in the art can make several improvements, modifications, and variations without departing from the spirit of the present disclosure. These improvements, Modifications and deformations should be considered as falling within the scope of protection of this application.

Claims (10)

1. a kind of mutual inductor dynamic error tests system, the system comprises：

Dynamic waveform signal source, the dynamic waveform signal source include input module, signal source control module and DA moduluss of conversion Block；The input module is used to receive the dynamic waveform parameter of preset format, and the dynamic waveform parameter is sent to signal Source control module；The signal source control module generates dynamic waveform signal according to the dynamic waveform parameter, and is converted to DA Module sends the dynamic waveform signal；The DA conversion modules answer analog waveform signal according to dynamic waveform signal the output phase； The dynamic waveform parameter include fundamental frequency, fundamental voltage amplitude, fundamental phase, overtone order and the corresponding amplitude of each harmonic to Amount and harmonic content；

Signal processing unit, the analog waveform signal that the signal processing unit is used to export dynamic waveform signal source is according to pre- If rule is handled, the processing signal for being suitable for the input of mutual inductor primary side is obtained；The output end of the signal processing unit with The input terminal of standard mutual inductor unit and the input terminal of to-be-tested transformer are connected；

Standard mutual inductor unit, the standard mutual inductor unit are used for according to the processing letter in the input of standard mutual inductor primary side Number, in standard mutual inductor secondary side outputting standard signal；

Dynamic error verification unit, the dynamic error verification unit include signal conversion module, AD acquisition modules, verification control Module and qualification module；

The signal conversion module includes standard input port and input port to be measured, the standard input port and the mark The output end of quasi- mutual inductor is connected, and the input port to be measured is connected with to-be-tested transformer；The signal conversion module is used for will The standard signal of input is converted to the standard small signal of preset format；The measured signal that the signal conversion module is used to input Be converted to the small signal to be measured of preset format；

The verification control module is used to send the instruction of AD acquisition controls to AD acquisition modules according to preset rules；The verification control Molding block is used to send verification control instruction to performance correction verification module according to preset rules；

The AD that the AD acquisition modules are used to send the standard small signal and small signal to be measured according to verification control module Acquisition control instruction is converted to standardized digital signal and digital signal to be measured；

The verification control instruction that the qualification module is used to be sent according to verification control module is to the standardized digital signal Error analysis, and output error data are carried out with digital signal to be measured.

2. system according to claim 1, it is characterised in that：The signal processing unit includes power amplifier and liter Depressor；The power amplifier is for putting the analog waveform signal that dynamic waveform signal source exports according to preset gain Greatly；The booster obtains voltage processing for the analog waveform signal after power amplification to boost according to preset rules Signal；

The standard mutual inductor unit includes standard potential transformer, and the standard potential transformer, which is used to be handled according to voltage, to be believed Number outputting standard voltage signal；

The standard input port of the signal conversion module includes normal voltage input port；The input port to be measured includes waiting for Survey control source port；The standard that the signal conversion module is used to be converted to the standard voltage signal of input preset format is small Voltage signal；The small voltage to be measured that the signal conversion module is used to be converted to the voltage signal to be measured of input preset format is believed Number.

3. system according to claim 1, it is characterised in that：The signal processing unit includes power amplifier and liter Flow device；The power amplifier is for putting the analog waveform signal that dynamic waveform signal source exports according to preset gain Greatly；The current lifting device obtains current processing for flowing up the analog waveform signal after power amplification according to preset rules Signal；

The standard mutual inductor unit includes standard current transformer, and the standard potential transformer according to current processing for believing Number outputting standard current signal；

The standard input port of the signal conversion module includes normalized current input port；The input port to be measured includes waiting for Survey current input terminal mouth；The standard that the signal conversion module is used to be converted to the standard current signal of input preset format is small Current signal；The low current to be measured that the signal conversion module is used to be converted to the current signal to be measured of input preset format is believed Number.

4. system according to claim 1, it is characterised in that：The input module includes parameter input submodule and letter Number input submodule；

The parameter input submodule is for receiving the dynamic waveform parameter that user is keyed in by preset format, and by the dynamic wave Shape parameter is sent to signal source control module；

The function input submodule is used to receive multigroup function formula of in chronological sequence sequence combination input by user, and will The function formula is sent to signal source control module, and the signal source control module is moved according to the resolving of function formula State waveform parameter.

5. system according to claim 1, it is characterised in that：The input module includes Freehandhand-drawing Waveform Input submodule；

The Freehandhand-drawing Waveform Input submodule includes touch screen sensor and capture card；The touch screen sensor receives user at it The waveform of upper drafting, and the waveform is converted into waveform electric signal and is sent to capture card；The capture card is according to the waveform Electric signal processing, which calculates, obtains dynamic waveform parameter, and the dynamic waveform parameter is sent to signal source control module.

6. system according to claim 1, it is characterised in that：The verification control module is according to preset including cycle And the sampling parameter of sample rate generates the instruction of AD acquisition controls；The verification control module is according to preset including for difference The range of transformer type, the checking parameter generation verification control instruction of no-load voltage ratio and signal path.

7. a kind of mutual inductor dynamic error test method, the method includes：

The dynamic waveform parameter for receiving preset format generates dynamic waveform signal according to the dynamic waveform parameter, and passes through DA The dynamic waveform signal is converted to analog waveform signal by conversion；The dynamic waveform parameter includes fundamental frequency, fundamental wave width Value, fundamental phase, overtone order and the corresponding amplitude vector of each harmonic and harmonic content；

The analog waveform signal is separately input into the input terminal of standard transducer and sensor to be measured by signal processing Input terminal；

The standard signal of standard transducer output end output and the measured signal of sensor output to be measured output are received, by institute After stating standard signal and measured signal progress signal processing and AD samplings, standard secretary signal and digital signal to be measured are generated；

Error analysis, and output error data are carried out to the standardized digital signal and digital signal to be measured.

8. the method according to the description of claim 7 is characterized in that when the to-be-tested transformer be voltage transformer when, it is described Analog waveform signal progress signal processing is separately input into the input terminal of standard transducer and the input terminal of sensor to be measured Further include：Analog waveform signal is amplified according to preset gain and boosts according to preset rules, obtains voltage processing Signal；By the voltage processing signal be separately input into normal voltage sensor input terminal and voltage sensor to be measured it is defeated Enter end.

9. the method according to the description of claim 7 is characterized in that when the to-be-tested transformer be current transformer when, it is described Analog waveform signal progress signal processing is separately input into the input terminal of standard transducer and the input terminal of sensor to be measured Further include：Analog waveform signal is amplified according to preset gain and boosts according to preset rules, obtains voltage processing Signal；By the voltage processing signal be separately input into normal voltage sensor input terminal and voltage sensor to be measured it is defeated Enter end.

10. the method according to the description of claim 7 is characterized in that the dynamic waveform parameter for receiving preset format is also wrapped It includes：

It receives user and presses the dynamic waveform parameter that preset format is keyed in；

Multigroup function formula of in chronological sequence sequence combination input by user is received, and according to the resolving acquisition to function formula Dynamic waveform parameter；

The waveform that user draws in touch screen sensor is received, the waveform is converted into waveform electric signal and handles calculating acquisition Dynamic waveform parameter.