CN108683563B - Distributed access performance test method, device and system - Google Patents
Distributed access performance test method, device and system Download PDFInfo
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Abstract
The embodiment of the invention discloses a distributed admission performance testing method, a device and a system, wherein the method comprises the following steps: distributing the test configuration file to a plurality of test devices which are distributed, so that each test device generates and executes a test case according to the received test configuration file, performing access test on the plurality of tested devices which are distributed, and feeding back the test case execution result when the test case execution is judged to be successful; receiving a test case execution result fed back by the test device; and generating a test report according to the received execution results of all the test cases. The embodiment of the invention can not use a special performance testing instrument in the prior art, effectively reduces the cost, uses a distributed method to carry out parallel testing on any number of tested devices in batch, has simple testing method, is easy to obtain more detailed testing results and is convenient for analyzing the performance bottleneck subsequently.
Description
Technical Field
The embodiment of the invention relates to the technical field of network communication, in particular to a distributed admission performance testing method, a device and a system.
Background
With the increasingly prominent internet security problem, more and more network environments are accessed to the access system, higher requirements are put forward on the access performance indexes of the access equipment, and higher requirements are put forward for more accurately and conveniently testing the performance indexes of the access system.
At present, the admission performance test of the traditional communication equipment uses a special performance test instrument to perform the admission performance index test on the tested equipment.
However, the existing method for performing the admission performance test on the tested equipment by using one special performance test instrument needs to use the special performance test instrument, which is high in cost, and moreover, the special performance test instrument has strict requirements on test conditions and the test result is not comprehensive enough.
In view of this, how to perform admission performance test on the device under test becomes a technical problem to be solved at present.
Disclosure of Invention
Because the existing method has the problems, the embodiment of the invention provides a distributed admission performance testing method, a device and a system.
In a first aspect, an embodiment of the present invention provides a method for testing distributed admission performance, including:
distributing the test configuration file to a plurality of test devices which are distributed, so that each test device generates and executes a test case according to the received test configuration file, performing access test on the plurality of tested devices which are distributed, and feeding back the test case execution result when the test case execution is judged to be successful;
receiving a test case execution result fed back by the test device;
and generating a test report according to the received execution results of all the test cases.
Optionally, before distributing the test configuration file to the plurality of test devices of the distributed deployment, the method further comprises:
and generating a test configuration file according to the detected test starting command.
In a second aspect, an embodiment of the present invention further provides a distributed admission performance testing method, including:
receiving a test configuration file distributed by a main control device, and generating a test case according to the test configuration file;
executing the generated test case, sending admission requests to a plurality of tested devices which are deployed in a distributed manner through the test case simulation terminal, so that each tested device performs admission action according to the received admission request, and feeding back an admission test result when the admission action is judged to be successfully executed;
receiving an admission test result fed back by the tested device;
and sending the admission test result to the main control device as a test case execution result so that the main control device generates a test report according to all the received test case execution results.
Optionally, the executing the generated test case sends an admission request to a plurality of devices under test deployed in a distributed manner through the test case simulation terminal, so that each device under test performs an admission action according to the received admission request, and feeds back an admission test result when it is determined that the admission action is successfully executed, further including:
executing the generated test case, sending admission requests to a plurality of tested devices which are deployed in a distributed manner through the test case simulation terminal, so that each tested device performs admission action according to the received admission request, and feeding back an admission error log when the admission action execution failure is judged;
accordingly, the method further comprises:
receiving an admission error log fed back by the tested device;
correspondingly, the sending the admission test result to the master control apparatus as a test case execution result includes:
and sending the admission error log to the main control device as a test case execution result.
In a third aspect, an embodiment of the present invention further provides a distributed admission performance testing apparatus, which is applied to a master control apparatus, and includes:
the distribution module is used for distributing the test configuration file to the plurality of test devices which are distributed and deployed so that each test device generates and executes a test case according to the received test configuration file, the plurality of tested devices which are distributed and deployed are subjected to access test through the test case simulation terminal, and the test case execution result is fed back when the test case execution success is judged;
the first receiving module is used for receiving the test case execution result fed back by the test device;
and the first generation module is used for generating a test report according to the received execution results of all the test cases.
Optionally, the apparatus further comprises:
and the second generation module is used for generating a test configuration file according to the detected test starting command.
In a fourth aspect, an embodiment of the present invention further provides a distributed admission performance testing apparatus, which is applied to a plurality of testing apparatuses deployed in a distributed manner, and includes:
the third generation module is used for receiving the test configuration file distributed by the main control device and generating a test case according to the test configuration file;
the first execution module is used for executing the generated test case, sending an admission request to a plurality of tested devices which are distributed and deployed through the test case simulation terminal so that each tested device carries out an admission action according to the received admission request, and feeding back an admission test result when the admission action is judged to be successfully executed;
a second receiving module, configured to receive an admission test result fed back by the device under test;
and the sending module is used for sending the access test result to the main control device as a test case execution result so that the main control device generates a test report according to all the received test case execution results.
Optionally, the first execution module is further configured to
Executing the generated test case, sending admission requests to a plurality of tested devices which are deployed in a distributed manner through the test case simulation terminal, so that each tested device performs admission action according to the received admission request, and feeding back an admission error log when the admission action execution failure is judged;
accordingly, the second receiving module is particularly used for
Receiving an admission error log fed back by the tested device;
accordingly, the sending module is particularly useful for
And sending the admission error log as a test case execution result to the main control device so that the main control device generates a test report according to all the received test case execution results.
In a fifth aspect, an embodiment of the present invention further provides a distributed admission performance test system, including: the system comprises a main control device, a plurality of testing devices deployed in a distributed mode, a plurality of tested devices deployed in a distributed mode and auxiliary devices;
the master control device comprises: the distributed admission performance testing apparatus according to the third aspect;
each testing device is pre-deployed with a pre-testing script, and each testing device comprises: the distributed admission performance testing apparatus according to the fourth aspect;
each tested device is used for receiving the admission requests sent by the distributed test devices, performing admission action according to the received admission requests, feeding back admission test results to the test device which sends the admission requests for executing the admission actions when judging that the admission actions are successfully executed, and feeding back admission error logs to the test device which sends the admission requests for executing the admission actions when judging that the admission actions are failed to be executed;
the auxiliary device is used for providing virtual access purposes for each tested device to simulate the admission action of the terminal and providing users used by the admission configuration file.
Optionally, the device under test is a fixed-model entry device.
Optionally, the testing device and the device under test communicate through a data channel, and the device under test and the accessory device communicate through a data channel.
In a sixth aspect, an embodiment of the present invention provides an electronic device, including: a first processor, a first memory, a first bus, and a computer program stored on the first memory and executable on the first processor;
wherein the first processor and the first memory communicate with each other via the first bus;
the first processor, when executing the computer program, implements the method of the first aspect described above.
In a seventh aspect, an embodiment of the present invention provides another electronic device, including: a second processor, a second memory, a second bus, and a computer program stored on the second memory and executable on the second processor;
the second processor and the second memory complete mutual communication through the second bus;
the second processor, when executing the computer program, implements the method of the second aspect described above.
In an eighth aspect, an embodiment of the present invention provides a non-transitory computer-readable storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the method according to the first aspect.
In a ninth aspect, an embodiment of the present invention provides a non-transitory computer-readable storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the method of the second aspect.
It can be known from the above technical solutions that, in the distributed admission performance testing method, apparatus and system provided in the embodiments of the present invention, the test configuration file is distributed to the plurality of test apparatuses in distributed deployment, so that each test apparatus generates and executes the test case according to the received test configuration file, the test case simulation terminal performs admission testing on the plurality of test apparatuses in distributed deployment, the test case execution result is fed back when the test case execution is determined to be successful, the test case execution result fed back by the test apparatus is received, and the test report is generated according to all the received test case execution results, thereby, a dedicated performance testing instrument in the prior art can not be used, the cost is effectively reduced, a distributed method is used to perform parallel testing on any number of test apparatuses in batch, the testing method is simple, and more detailed test results can be easily obtained, facilitating subsequent analysis of performance bottlenecks.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic flowchart of a distributed admission performance testing method according to an embodiment of the present invention;
fig. 2 is a schematic flowchart of a distributed admission performance testing method according to another embodiment of the present invention;
fig. 3 is a schematic structural diagram of a distributed admission performance testing apparatus according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a distributed admission performance testing apparatus according to another embodiment of the present invention;
fig. 5 is a schematic structural diagram of a distributed admission performance test system according to another embodiment of the present invention;
fig. 6 is a schematic physical structure diagram of an electronic device according to an embodiment of the invention
Fig. 7 is a schematic physical structure diagram of an electronic device according to another embodiment of the present invention.
Detailed Description
The following further describes embodiments of the present invention with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
Fig. 1 shows a schematic flow chart of a distributed admission performance testing method according to an embodiment of the present invention, and as shown in fig. 1, the distributed admission performance testing method according to the embodiment includes:
and S1, distributing the test configuration file to a plurality of test devices which are distributed, so that each test device generates and executes a test case according to the received test configuration file, performing access test on the plurality of tested devices which are distributed and deployed through the test case simulation terminal, and feeding back the test case execution result when the test case execution is judged to be successful.
It should be noted that the method described in this embodiment is applied to the main control apparatus in the distributed admission performance test system described below.
It can be understood that, in this embodiment, the process of generating and executing the test case by each testing device according to the received test configuration file may include: receiving a test configuration file distributed by a main control device, and generating a test case according to the test configuration file; executing the generated test case, sending admission requests to a plurality of tested devices (namely tested equipment) which are deployed in a distributed manner through the test case simulation terminal, so that each tested device carries out admission action according to the received admission requests, feeding back admission test results when the admission action is judged to be successfully executed, and feeding back admission error logs when the admission action is judged to be failed to be executed; and receiving an admission test result fed back by the tested device, sending the admission test result to the main control device as a test case execution result, receiving an admission error log fed back by the tested device, and sending the admission error log to the main control device as a test case execution result.
It can be understood that, in this embodiment, each testing apparatus of the distributed deployment may be a server pre-installed with a performance testing tool curl-loader and a configuration file, that is, in this embodiment, an inexpensive server may be used as the testing apparatus to perform the admission performance test instead of an expensive performance tester.
And S2, receiving the test case execution result fed back by the test device.
And S3, generating a test report according to the received execution results of all the test cases.
It can be understood that, in this embodiment, the master control device centrally controls and issues the test command and the test case to each of the test devices deployed in a distributed manner, so that the multiple test devices deployed in a distributed manner can perform centralized or decentralized tests on the devices under test deployed in a distributed manner, and further collect test results to generate a test report.
In the distributed admission performance testing method provided by this embodiment, by distributing the test configuration file to a plurality of testing apparatuses deployed in a distributed manner, so that each testing device generates and executes the test case according to the received test configuration file, by executing the test case simulation terminal to perform admission test on a plurality of tested devices which are distributed and deployed, when the test case is judged to be successfully executed, the test case execution result is fed back, the test case execution result fed back by the test device is received, the test report is generated according to the execution results of all the received test cases, so that a special performance test instrument in the prior art is not used, the cost is effectively reduced, the distributed method is used for carrying out parallel test on any number of tested devices in batches, the test method is simple, more detailed test results are easy to obtain, and the performance bottleneck can be conveniently analyzed subsequently.
Further, on the basis of the above embodiment, before the step S1, the method according to this embodiment may further include a step not shown in the figure:
and generating a test configuration file according to the detected test starting command.
It can be understood that, when performing the distributed admission performance test, a test configuration file needs to be generated according to the detected test start command, so that each test apparatus in subsequent distributed deployment can generate and execute a test case according to the test configuration file to obtain a test result.
The distributed admission performance test method provided by the embodiment can effectively reduce the cost without using a special performance test instrument in the prior art, can be used for carrying out parallel test on any number of tested devices in batches by using the distributed method, is simple, is easy to obtain more detailed test results, and is convenient for analyzing the performance bottleneck subsequently.
Fig. 2 is a schematic flowchart illustrating a method for testing distributed admission performance according to an embodiment of the present invention, where as shown in fig. 2, the method for testing distributed admission performance according to the embodiment includes:
and P1, receiving the test configuration file distributed by the master control device, and generating a test case according to the test configuration file.
It should be noted that the method described in this embodiment is applied to each testing apparatus in distributed deployment in the following distributed admission performance testing system.
It can be understood that, in this embodiment, each testing apparatus of the distributed deployment may be a server pre-installed with a performance testing tool curl-loader and a configuration file, that is, in this embodiment, an inexpensive server may be used as the testing apparatus to perform the admission performance test instead of an expensive performance tester.
And P2, executing the generated test case, sending admission requests to a plurality of tested devices (namely tested equipment) which are deployed in a distributed manner through the test case simulation terminal, so that each tested device performs admission actions according to the received admission requests, and feeding back admission test results when the admission actions are judged to be successfully executed.
And P3, receiving the admission test result fed back by the tested device.
And P4, sending the admission test result to the master control device as a test case execution result, so that the master control device generates a test report according to all the received test case execution results.
It can be understood that, in this embodiment, a plurality of test devices and a device under test are deployed in a distributed manner, and the plurality of test devices deployed in a distributed manner receive centralized control of the main control device, perform centralized or decentralized tests on the device under test deployed in a distributed manner, and return test results to the main control device, so that the main control device generates a test report according to all returned test results.
It can be understood that, in this embodiment, the testing apparatus and the device under test can implement one-to-one, many-to-one admission test according to the testing requirement, and under the condition that the testing apparatus and the device under test are many-to-one, the configuration file generated by the testing requirement can implement the coordination of multiple testing units to achieve the expected effect.
The distributed admission performance test method provided by this embodiment is applied to a test device deployed in a distributed manner, and includes receiving a test configuration file distributed by a main control device, generating a test case according to the test configuration file, executing the generated test case, sending admission requests to a plurality of devices under test deployed in a distributed manner through a test case simulation terminal, so that each device under test performs admission actions according to the received admission requests, feeding back admission test results when the admission actions are judged to be successfully executed, receiving the admission test results fed back by the devices under test, sending the admission test results to the main control device as test case execution results, so that the main control device generates test reports according to all the received test case execution results, thereby being capable of effectively reducing the cost without using a special performance test instrument in the prior art, the distributed method is used for carrying out parallel test on any number of tested devices in batches, the test method is simple, more detailed test results are easy to obtain, and the subsequent analysis of performance bottlenecks is facilitated.
Further, on the basis of the above embodiment, the step P2 may further include the steps not shown in the figure:
executing the generated test case, sending admission requests to a plurality of tested devices which are deployed in a distributed manner through the test case simulation terminal, so that each tested device performs admission action according to the received admission request, and feeding back an admission error log when the admission action execution failure is judged;
correspondingly, the method of this embodiment may further include:
receiving an admission error log fed back by the tested device;
correspondingly, the step P4 may specifically include:
and sending the admission error log to the main control device as a test case execution result.
The distributed admission performance test method provided by the embodiment can effectively reduce the cost without using a special performance test instrument in the prior art, can be used for carrying out parallel test on any number of tested devices in batches by using the distributed method, is simple, is easy to obtain more detailed test results, and is convenient for analyzing the performance bottleneck subsequently.
Fig. 3 is a schematic structural diagram of a distributed admission performance testing apparatus according to an embodiment of the present invention, where the apparatus is applied to a master control apparatus, and as shown in fig. 3, the distributed admission performance testing apparatus according to the embodiment includes: a distribution module 31, a first receiving module 32 and a first generating module 33; wherein:
the distribution module 31 is configured to distribute the test configuration file to the multiple test apparatuses in distributed deployment, so that each test apparatus generates and executes a test case according to the received test configuration file, performs access test on the multiple devices under test in distributed deployment through the test case simulation terminal, and feeds back a test case execution result when the test case execution is determined to be successful;
the first receiving module 32 is configured to receive a test case execution result fed back by the testing apparatus;
the first generating module 33 is configured to generate a test report according to the received execution results of all the test cases.
Specifically, the distribution module 31 distributes the test configuration file to the multiple test apparatuses deployed in a distributed manner, so that each test apparatus generates and executes a test case according to the received test configuration file, performs an access test on the multiple devices under test deployed in a distributed manner through the test case simulation terminal, and feeds back a test case execution result when the test case execution is judged to be successful; the first receiving module 32 receives the test case execution result fed back by the testing apparatus; the first generating module 33 generates a test report according to the received execution results of all test cases.
It can be understood that, in this embodiment, the process of generating and executing the test case by each testing device according to the received test configuration file may include: receiving a test configuration file distributed by a main control device, and generating a test case according to the test configuration file; executing the generated test case, sending admission requests to a plurality of tested devices (namely tested equipment) which are deployed in a distributed manner through the test case simulation terminal, so that each tested device carries out admission action according to the received admission requests, feeding back admission test results when the admission action is judged to be successfully executed, and feeding back admission error logs when the admission action is judged to be failed to be executed; and receiving an admission test result fed back by the tested device, sending the admission test result to the main control device as a test case execution result, receiving an admission error log fed back by the tested device, and sending the admission error log to the main control device as a test case execution result.
It can be understood that, in this embodiment, each testing apparatus of the distributed deployment may be a server pre-installed with a performance testing tool curl-loader and a configuration file, that is, in this embodiment, an inexpensive server may be used as the testing apparatus to perform the admission performance test instead of an expensive performance tester.
It can be understood that, in this embodiment, the master control device centrally controls and issues the test command and the test case to each of the test devices deployed in a distributed manner, so that the multiple test devices deployed in a distributed manner can perform centralized or decentralized tests on the devices under test deployed in a distributed manner, and further collect test results to generate a test report.
The distributed admission performance testing device of the embodiment is applied to a main control device, can provide a more practical notification corner mark, enables a user to visually see the association between a message notification and an application or a current transaction from the corner mark, is easier to understand the content or object and the importance degree possibly contained in the notification, and enables the user to judge whether the important content needs to be checked or not according to the corner mark displayed at the preset position of the application icon in the subsequent process.
Further, on the basis of the above embodiment, the apparatus of this embodiment may further include:
and the second generation module is used for generating a test configuration file according to the detected test starting command.
It can be understood that, when performing the distributed admission performance test, a test configuration file needs to be generated according to the detected test start command, so that each test apparatus in subsequent distributed deployment can generate and execute a test case according to the test configuration file to obtain a test result.
The distributed access performance testing device can effectively reduce the cost without using a special performance testing instrument in the prior art, and can be used for carrying out parallel testing on any number of tested devices in batches by using a distributed method, so that the testing method is simple, more detailed testing results can be easily obtained, and the performance bottleneck can be conveniently analyzed subsequently.
The distributed admission performance testing apparatus of this embodiment may be configured to execute the technical solution of the method embodiment shown in fig. 1, and the implementation principle and the technical effect are similar, which are not described herein again.
Fig. 4 shows a schematic structural diagram of a distributed admission performance testing apparatus according to another embodiment of the present invention, where the apparatus is applied to multiple testing apparatuses deployed in a distributed manner, and as shown in fig. 4, the distributed admission performance testing apparatus according to this embodiment includes: a third generating module 41, a first executing module 42, a second receiving module 43 and a sending module 44; wherein:
the third generating module 41 is configured to receive a test configuration file distributed by the master control device, and generate a test case according to the test configuration file;
the first execution module 42 is configured to execute the generated test case, and send an admission request to a plurality of devices under test (i.e., devices under test) deployed in a distributed manner through the test case simulation terminal, so that each device under test performs an admission action according to the received admission request, and when it is determined that the admission action is successfully executed, a result of the admission test is fed back;
the second receiving module 43 is configured to receive an admission test result fed back by the device under test;
the sending module 44 is configured to send the admission test result to the main control apparatus as a test case execution result, so that the main control apparatus generates a test report according to all received test case execution results.
Specifically, the third generating module 41 receives a test configuration file distributed by the master control device, and generates a test case according to the test configuration file; the first execution module 42 executes the generated test case, and sends an admission request to a plurality of devices under test deployed in a distributed manner through the test case simulation terminal, so that each device under test performs an admission action according to the received admission request, and feeds back an admission test result when the admission action is judged to be successfully executed; the second receiving module 43 receives the admission test result fed back by the device under test; the sending module 44 sends the admission test result to the main control device as a test case execution result, so that the main control device generates a test report according to all the received test case execution results.
It can be understood that, in this embodiment, each testing apparatus of the distributed deployment may be a server pre-installed with a performance testing tool curl-loader and a configuration file, that is, in this embodiment, an inexpensive server may be used as the testing apparatus to perform the admission performance test instead of an expensive performance tester.
It can be understood that, in this embodiment, a plurality of test devices and a device under test are deployed in a distributed manner, and the plurality of test devices deployed in a distributed manner receive centralized control of the main control device, perform centralized or decentralized tests on the device under test deployed in a distributed manner, and return test results to the main control device, so that the main control device generates a test report according to all returned test results.
It can be understood that, in this embodiment, the testing apparatus and the device under test can implement one-to-one, many-to-one admission test according to the testing requirement, and under the condition that the testing apparatus and the device under test are many-to-one, the configuration file generated by the testing requirement can implement the coordination of multiple testing units to achieve the expected effect.
The distributed admission performance testing device provided by the embodiment is applied to distributed deployed testing devices, a special performance testing instrument in the prior art is not used, the cost is effectively reduced, a distributed method is used for carrying out parallel testing on any number of tested devices in batches, the testing method is simple, more detailed testing results are easy to obtain, and the performance bottleneck can be conveniently analyzed subsequently.
Further, on the basis of the above embodiments, the first execution module 42 of the present embodiment may also be used for
Executing the generated test case, sending admission requests to a plurality of tested devices which are deployed in a distributed manner through the test case simulation terminal, so that each tested device performs admission action according to the received admission request, and feeding back an admission error log when the admission action execution failure is judged;
accordingly, the second receiving module 43 can be specifically used for
Receiving an admission error log fed back by the tested device;
accordingly, the sending module 44 may be specifically used for
And sending the admission error log as a test case execution result to the main control device so that the main control device generates a test report according to all the received test case execution results.
The distributed access performance testing device provided by the embodiment can effectively reduce the cost without using a special performance testing instrument in the prior art, can be used for carrying out parallel testing on any number of tested devices in batches by using a distributed method, is simple in testing method, can easily obtain more detailed testing results, and is convenient for analyzing the performance bottleneck subsequently.
The distributed admission performance testing apparatus of this embodiment may be configured to execute the technical solution of the method embodiment shown in fig. 2, and the implementation principle and the technical effect are similar, which are not described herein again.
Fig. 5 shows a schematic structural diagram of a distributed admission performance test system according to another embodiment of the present invention, and as shown in fig. 5, the distributed admission performance test system according to this embodiment includes: a master device 51, a plurality of test devices 52 deployed in a distributed manner, a plurality of devices under test 53 deployed in a distributed manner, and an accessory device 54;
the main control device 51 includes: the distributed admission performance testing apparatus according to the embodiment shown in fig. 3;
each test apparatus 52 has a pre-test script deployed in advance, and each test apparatus 52 includes: the distributed admission performance testing apparatus according to the embodiment shown in fig. 4;
each tested device 53, configured to receive admission requests sent by multiple testing devices deployed in a distributed manner, perform an admission action according to the received admission requests, when it is determined that the admission action is successfully performed, feed back an admission test result to the testing device that sends the admission request for performing the admission action, and when it is determined that the admission action is failed, feed back an admission error log to the testing device that sends the admission request for performing the admission action;
the accessory device 54 is used to provide virtual access purposes for each device under test to simulate the terminal's admission actions, and to provide the users used by the admission profile.
In a specific application, each testing apparatus of the distributed deployment may be a server pre-installed with a performance testing tool curl-loader and a configuration file, that is, in this embodiment, a cheap server may be used as the testing apparatus to perform the admission performance test instead of a performance tester with a high price.
In a specific application, the testing apparatus 52 and the device under test 53 communicate through a data channel, so that each testing apparatus 52 can simulate a large number of admission terminals to initiate admission processes to the device under test 53.
In a specific application, the device under test 53 and the accessory device 54 communicate through a data channel.
It can be understood that, in this embodiment, the main control device 51 centrally controls and issues the test command and the test case to each of the test devices deployed in a distributed manner, so that the test devices deployed in a distributed manner can perform centralized or decentralized tests on the devices under test deployed in a distributed manner, further collect test results, and generate a test report, that is, control and reset the test devices, the case execution of the devices under test, and the result collection.
It is understood that in the present embodiment, each tested device 53 in the distributed deployment may be a fixed-type admission device, and by cooperating with the accessory device 54, admission interception of the terminal simulated by the testing device 52 may be implemented. The device under test 53 starts, stops, resets and collects and destroys the test result of the test case execution progress by presetting part of the test script and the configuration file. The accessory device 54 provides a virtual access purpose for the admission action of the analog terminal and the user used for the admission configuration file, thus realizing the closed implementation of the whole test system without relating to the external environment.
According to the distributed access performance test system provided by the embodiment, the plurality of test devices and the tested devices are distributed, so that a special performance test instrument in the prior art is not used, the cost is effectively reduced, the distributed method is used for carrying out parallel test on any number of tested devices in batches, the test method is simple, more detailed test results are easy to obtain, and the performance bottleneck can be conveniently analyzed subsequently.
Fig. 6 is a schematic physical structure diagram of an electronic device according to an embodiment of the present invention, and as shown in fig. 6, the electronic device may include: a first processor 601, a first memory 602, a first bus 603, and a computer program stored on the first memory 602 and executable on the first processor 601;
wherein, the first processor 601 and the first memory 602 complete the communication with each other through the first bus 603;
the first processor 601, when executing the computer program, implements the method provided by the embodiment of the method shown in fig. 1, for example, including: distributing the test configuration file to a plurality of test devices which are distributed, so that each test device generates and executes a test case according to the received test configuration file, performing access test on the plurality of tested devices which are distributed, and feeding back the test case execution result when the test case execution is judged to be successful; receiving a test case execution result fed back by the test device; and generating a test report according to the received execution results of all the test cases.
An embodiment of the present invention provides a non-transitory computer-readable storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the method provided by the method embodiment shown in fig. 1, for example, including: distributing the test configuration file to a plurality of test devices which are distributed, so that each test device generates and executes a test case according to the received test configuration file, performing access test on the plurality of tested devices which are distributed, and feeding back the test case execution result when the test case execution is judged to be successful; receiving a test case execution result fed back by the test device; and generating a test report according to the received execution results of all the test cases.
Fig. 7 is a schematic physical structure diagram of an electronic device according to another embodiment of the present invention, and as shown in fig. 7, the electronic device may include: a second processor 701, a second memory 702, a second bus 703 and a computer program stored on the second memory 702 and executable on the second processor 701;
the second processor 701 and the second memory 702 complete communication with each other through the second bus 703;
the second processor 701, when executing the computer program, implements the method provided in the embodiment of the method shown in fig. 2, for example, including: receiving a test configuration file distributed by a main control device, and generating a test case according to the test configuration file; executing the generated test case, sending admission requests to a plurality of tested devices which are deployed in a distributed manner through the test case simulation terminal, so that each tested device performs admission action according to the received admission request, and feeding back an admission test result when the admission action is judged to be successfully executed; receiving an admission test result fed back by the tested device; and sending the admission test result to the main control device as a test case execution result so that the main control device generates a test report according to all the received test case execution results.
An embodiment of the present invention provides a non-transitory computer-readable storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the method provided by the method embodiment shown in fig. 2, for example, including: receiving a test configuration file distributed by a main control device, and generating a test case according to the test configuration file; executing the generated test case, sending admission requests to a plurality of tested devices which are deployed in a distributed manner through the test case simulation terminal, so that each tested device performs admission action according to the received admission request, and feeding back an admission test result when the admission action is judged to be successfully executed; receiving an admission test result fed back by the tested device; and sending the admission test result to the main control device as a test case execution result so that the main control device generates a test report according to all the received test case execution results.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, apparatus, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus, and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means/systems for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element. The terms "upper", "lower", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are intended to be inclusive and mean, for example, that they may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the description of the present invention, numerous specific details are set forth. It is understood, however, that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description. Similarly, it should be appreciated that in the foregoing description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various inventive aspects. However, the disclosed method should not be interpreted as reflecting an intention that: that the invention as claimed requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this invention. It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present invention is not limited to any single aspect, nor is it limited to any single embodiment, nor is it limited to any combination and/or permutation of these aspects and/or embodiments. Moreover, each aspect and/or embodiment of the present invention may be utilized alone or in combination with one or more other aspects and/or embodiments thereof.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention, and they should be construed as being included in the following claims and description.
Claims (15)
1. A distributed admission performance test method is characterized by comprising the following steps:
distributing the test configuration file to a plurality of test devices which are distributed, so that each test device generates and executes a test case according to the received test configuration file, performing access test on the plurality of tested devices which are distributed, and feeding back the test case execution result when the test case execution is judged to be successful;
receiving a test case execution result fed back by the test device;
and generating a test report according to the received execution results of all the test cases.
2. The method of claim 1, wherein prior to distributing the test configuration file to the plurality of test devices in the distributed deployment, the method further comprises:
and generating a test configuration file according to the detected test starting command.
3. A distributed admission performance test method is characterized by comprising the following steps:
receiving a test configuration file distributed by a main control device, and generating a test case according to the test configuration file;
executing the generated test case, sending admission requests to a plurality of tested devices which are deployed in a distributed manner through the test case simulation terminal, so that each tested device performs admission action according to the received admission request, and feeding back an admission test result when the admission action is judged to be successfully executed;
receiving an admission test result fed back by the tested device;
and sending the admission test result to the main control device as a test case execution result so that the main control device generates a test report according to all the received test case execution results.
4. The method according to claim 3, wherein the executing the generated test case sends an admission request to a plurality of devices under test deployed in a distributed manner through the test case simulation terminal, so that each device under test performs an admission action according to the received admission request, and feeds back an admission test result when it is determined that the admission action is successfully executed, further comprising:
executing the generated test case, sending admission requests to a plurality of tested devices which are deployed in a distributed manner through the test case simulation terminal, so that each tested device performs admission action according to the received admission request, and feeding back an admission error log when the admission action execution failure is judged;
accordingly, the method further comprises:
receiving an admission error log fed back by the tested device;
correspondingly, the sending the admission test result to the master control apparatus as a test case execution result includes:
and sending the admission error log to the main control device as a test case execution result.
5. The utility model provides a distributed admission capability test device, is applied to master control set, its characterized in that includes:
the distribution module is used for distributing the test configuration file to the plurality of test devices which are distributed and deployed so that each test device generates and executes a test case according to the received test configuration file, the plurality of tested devices which are distributed and deployed are subjected to access test through the test case simulation terminal, and the test case execution result is fed back when the test case execution success is judged;
the first receiving module is used for receiving the test case execution result fed back by the test device;
and the first generation module is used for generating a test report according to the received execution results of all the test cases.
6. The apparatus of claim 5, further comprising:
and the second generation module is used for generating a test configuration file according to the detected test starting command.
7. A distributed admission performance test device is applied to a plurality of test devices deployed in a distributed mode, and is characterized by comprising the following components:
the third generation module is used for receiving the test configuration file distributed by the main control device and generating a test case according to the test configuration file;
the first execution module is used for executing the generated test case, sending an admission request to a plurality of tested devices which are distributed and deployed through the test case simulation terminal so that each tested device carries out an admission action according to the received admission request, and feeding back an admission test result when the admission action is judged to be successfully executed;
a second receiving module, configured to receive an admission test result fed back by the device under test;
and the sending module is used for sending the access test result to the main control device as a test case execution result so that the main control device generates a test report according to all the received test case execution results.
8. The apparatus of claim 7, wherein the first execution module is further configured to execute the first execution of the first program code
Executing the generated test case, sending admission requests to a plurality of tested devices which are deployed in a distributed manner through the test case simulation terminal, so that each tested device performs admission action according to the received admission request, and feeding back an admission error log when the admission action execution failure is judged;
accordingly, the second receiving module is particularly used for
Receiving an admission error log fed back by the tested device;
accordingly, the sending module is particularly useful for
And sending the admission error log as a test case execution result to the main control device so that the main control device generates a test report according to all the received test case execution results.
9. A distributed admission performance test system, comprising: the system comprises a main control device, a plurality of testing devices deployed in a distributed mode, a plurality of tested devices deployed in a distributed mode and auxiliary devices;
the master control device comprises: the distributed admission performance testing arrangement of claim 5 or 6;
each testing device is pre-deployed with a pre-testing script, and each testing device comprises: the distributed admission performance testing arrangement of claim 7 or 8;
each tested device is used for receiving the admission requests sent by the distributed test devices, performing admission action according to the received admission requests, feeding back admission test results to the test device which sends the admission requests for executing the admission actions when judging that the admission actions are successfully executed, and feeding back admission error logs to the test device which sends the admission requests for executing the admission actions when judging that the admission actions are failed to be executed;
the auxiliary device is used for providing virtual access purposes for each tested device to simulate the admission action of the terminal and providing users used by the admission configuration file.
10. The system of claim 9, wherein the device under test is a fixed model of an access device.
11. The system of claim 9, wherein the testing device and the device under test communicate over a data channel, and wherein the device under test and the accessory device communicate over a data channel.
12. An electronic device, comprising: a first processor, a first memory, a first bus, and a computer program stored on the first memory and executable on the first processor;
the first processor and the first memory are communicated with each other through the first bus;
the first processor, when executing the computer program, implements the method of claim 1 or 2.
13. A non-transitory computer-readable storage medium, having stored thereon a computer program which, when executed by a processor, implements the method of claim 1 or 2.
14. An electronic device, comprising: a second processor, a second memory, a second bus, and a computer program stored on the second memory and executable on the second processor;
the second processor and the second memory complete mutual communication through the second bus;
the second processor, when executing the computer program, implements the method of claim 3 or 4.
15. A non-transitory computer-readable storage medium, having stored thereon a computer program which, when executed by a processor, implements the method of claim 3 or 4.
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CN110493812B (en) * | 2019-08-23 | 2023-04-07 | 上海庆科信息技术有限公司 | Distribution network test processing method, device and system, processor and master control equipment |
CN113468043B (en) * | 2020-03-31 | 2023-09-01 | 福建天泉教育科技有限公司 | Automatic testing method based on multi-service deployment |
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