CN108680510B - 一种表面纳米结构磁性测量方法 - Google Patents
一种表面纳米结构磁性测量方法 Download PDFInfo
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- CN108680510B CN108680510B CN201810429088.7A CN201810429088A CN108680510B CN 108680510 B CN108680510 B CN 108680510B CN 201810429088 A CN201810429088 A CN 201810429088A CN 108680510 B CN108680510 B CN 108680510B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
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- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
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CN108680510B true CN108680510B (zh) | 2020-11-03 |
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CN110308041B (zh) * | 2019-06-28 | 2024-05-10 | 金华职业技术学院 | 一种微纳压缩装置 |
CN112462177B (zh) * | 2020-11-13 | 2022-08-30 | 广州市雅江光电设备有限公司 | 一种霍尔元件的感应区间临界点的定位方法 |
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US8893310B2 (en) * | 2012-07-02 | 2014-11-18 | International Business Machines Corporation | Scanned probe microscopy (SPM) probe having angled tip |
US20140130215A1 (en) * | 2012-11-07 | 2014-05-08 | Rave, Llc | Indented Mold Structures For Diamond Deposited Probes |
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2018
- 2018-04-24 CN CN201810429088.7A patent/CN108680510B/zh active Active
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CN1462039A (zh) * | 2002-05-31 | 2003-12-17 | 株式会社日立制作所 | 磁性纳米管 |
JP2004309272A (ja) * | 2003-04-04 | 2004-11-04 | Ricoh Co Ltd | 平面型プローブ、その製造方法及び光ピックアップ装置 |
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CN101603813B (zh) * | 2009-07-10 | 2011-02-02 | 杭州电子科技大学 | 一种光学驻波纳米颗粒尺寸测量装置 |
CN102200543A (zh) * | 2010-03-24 | 2011-09-28 | 国家纳米技术与工程研究院 | 基于原子力显微镜的微型颗粒表面纳米压痕测量装置 |
CN104981701A (zh) * | 2012-11-27 | 2015-10-14 | 许晓汲 | 利用零差检测从近场红外散射获得吸收光谱的方法 |
CN106501552A (zh) * | 2015-09-07 | 2017-03-15 | 中国科学院苏州纳米技术与纳米仿生研究所 | 一种同时测量表面磁性和表面电势的方法 |
CN105137126A (zh) * | 2015-09-16 | 2015-12-09 | 中北大学 | 一种新型氮空位色心金刚石的扫描磁强计 |
CN107782918A (zh) * | 2016-08-29 | 2018-03-09 | 苏州泰岩新材料有限公司 | 一种采用磁性纳米线的磁学原子力显微镜探针 |
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