CN108646639A - A kind of analysis and diagnostic test system based on BIT technologies - Google Patents
A kind of analysis and diagnostic test system based on BIT technologies Download PDFInfo
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- CN108646639A CN108646639A CN201810776331.2A CN201810776331A CN108646639A CN 108646639 A CN108646639 A CN 108646639A CN 201810776331 A CN201810776331 A CN 201810776331A CN 108646639 A CN108646639 A CN 108646639A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24036—Test signal generated by microprocessor, for all I-O tests
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The present invention provides a kind of analysis based on BIT technologies and diagnostic test systems, including：Test module, control module, computer module, memory module；Test module tests measurand, and collecting test data；Memory module stores the diagnostic message of built-in test and self-diagnosable system；Control module controls test module gathered data, and carries out information exchange with computer module；The data for the test module acquisition that computer module processing receives in conjunction with the diagnostic message parsing fault message in memory module and position.Compared with existing test system, memory module, computer module etc. are increased in a test system, it can carry out accident analysis, to which existing test system is improved to equipment of the BIT technologies with system synchronization operation is tested, meet the realization of fault signature extraction, the foundation of knowledge base and inference-making computer.In addition there is automation, generalization and intelligentized application well, mentality of designing batch can be used for reference and promoted the use of.
Description
Technical field
The present invention relates to testing fields.More particularly, to a kind of analysis based on BIT technologies and diagnostic test system.
Background technology
Test system is the instruments of inspection of Quality of electronic products, and can provide periodic maintenance for product, it is ensured that reliable and stable
Work, but with the promotion of test complexity, difficulty of test, to the horizontal growing day by day with consumption of on-the-spot test personnel, for pendulum
De- scene constraint, automation, intelligentized test data analysis, fault diagnosis become active demand, therefore have carried out being based on BIT
The test analysis and Diagnosis System of technology.
The compositions such as the current widely used main main control computer of test system, observing and controlling combination, data processing computer, no
Have a real-time interpretation ability of whole test signals, most of mode by subsequent live interpretation, with less automation, in real time
Early warning and failure emergency processing mode, cannot be satisfied the demand of electronic product explosive growth.
Invention content
In order to solve the above-mentioned technical problem at least one of, the present invention provides a kind of analysis based on BIT technologies with
Diagnostic test system, including：Test module, control module, computer module, memory module；
Test module tests measurand, and collecting test data；
Memory module stores the diagnostic message of built-in test and self-diagnosable system；
Control module controls test module gathered data, and carries out information exchange with computer module；
The data for the test module acquisition that computer module processing receives, event is parsed in conjunction with the diagnostic message in memory module
Barrier information simultaneously positions.
Preferably, the memory module is stored with the digital information of measurement, the analog quantity information in equipment, switching value letter
Breath, frequency information, pulse information, the thick fault message of signal detection and those information corresponding encoded information.
Preferably, the test module includes：
Accumulator is simulated, the analog quantity ephemeral data in test process is preserved；
First communication module carries out protocol with measurand；
Avometer module measures voltage, resistance and current signal；
Oscilloscope module records the waveform in test process；
Parallel A/D module acquires the analog quantity of measurand；
Power meter module measures the power of measured signal；And
Relay module selects TCH test channel.
Preferably, the system further comprises：Micro treatment module and the second communication module；
The micro treatment module is used to provide a system to standard time base, is added to storing to the data in memory module
Time term and provide timing node to the data of transmission；
Second communication module makes the micro treatment module establish communication connection with computer module.
Preferably, the system further comprises：
Autoexcitation module acquires the autoexcitation data of measurand and computer module is made to be realized by communication cable in real time
Autoexcitation control to measurand.
Preferably, the system further comprises：
Selftest module is connect with computer module, for carrying out self-test to system.
Preferably, the system further comprises that sample/hold amplifier and photoelectric isolation module, the sampling are kept
Amplifier is connect with simulation accumulator, the photoelectric isolation module and the sample/hold amplifier and the micro treatment module
Connection.
Preferably, the system further comprises digital signal buffer module, is connect with control module, is used for suppression device
Internal cause overvoltage or overcurrent, and reduce the switching loss of device.
Preferably, the system further comprises Signal-regulated kinase, to collected amount of logic, frequency quantity and pulsed quantity
Differential amplification, filtering, amplitude limit and the data buffering of signal.
Preferably, the control module be Zero greeve controller, the Zero greeve controller by AXI buses will control information into
Row parsing.
Beneficial effects of the present invention are as follows：
The present invention provides a kind of analysis based on BIT technologies and diagnostic test systems, compared with existing test system,
Memory module, computer module etc. are increased in test system, can carry out accident analysis, to change existing test system
Into the equipment for BIT technologies and test system synchronization operation, meet fault signature extraction, the foundation of knowledge base and inference-making computer
Realization.In addition there is automation, generalization and intelligentized application well, mentality of designing batch can be used for reference and promoted the use of.
Description of the drawings
Specific embodiments of the present invention will be described in further detail below in conjunction with the accompanying drawings.
Fig. 1 shows the analysis provided in an embodiment of the present invention based on BIT technologies and diagnostic test system structural schematic diagram.
Specific implementation mode
In order to illustrate more clearly of the present invention, the present invention is done further with reference to preferred embodiments and drawings
It is bright.Similar component is indicated with identical reference numeral in attached drawing.It will be appreciated by those skilled in the art that institute is specific below
The content of description is illustrative and be not restrictive, and should not be limited the scope of the invention with this.
The various sectional views that embodiment is disclosed according to the present invention are shown in the accompanying drawings.These figures are not drawn to scale
, wherein for the purpose of clear expression, some details are magnified, and some details may be omitted.It is shown in the drawings
Various regions, the shape of layer and the relative size between them, position relationship are merely exemplary, in practice may be due to system
It makes tolerance or technology restriction and is deviated, and those skilled in the art may be additionally designed as required with not similar shape
Shape, size, the regions/layers of relative position.
The present invention provides a kind of analysis based on BIT technologies and diagnostic test systems, including：Test module, control mould
Block, computer module, memory module, test module test measurand, and collecting test data；Memory module stores built-in survey
The diagnostic message of examination and self-diagnosable system；Control module controls test module gathered data, and with computer module into row information
Interaction；The data for the test module acquisition that computer module processing receives, failure is parsed in conjunction with the diagnostic message in memory module
Information simultaneously positions.
The present invention provides a kind of analysis based on BIT technologies and diagnostic test systems, compared with existing test system,
Memory module, computer module etc. are increased in test system, can carry out accident analysis, to change existing test system
Into the equipment for BIT technologies and test system synchronization operation, meet fault signature extraction, the foundation of knowledge base and inference-making computer
Realization.In addition there is automation, generalization and intelligentized application well, mentality of designing batch can be used for reference and promoted the use of.
Preferably, the memory module is stored with the digital information of measurement, the analog quantity information in equipment, switching value letter
Breath, frequency information, pulse information, the thick fault message of signal detection and those information corresponding encoded information.
In addition, in the embodiment illustrated in figure 1, the test module includes：Accumulator is simulated, is preserved in test process
Analog quantity ephemeral data；First communication module carries out protocol with measurand；Avometer module measures voltage, resistance
And current signal；Oscilloscope module records the waveform in test process；Parallel A/D module acquires the analog quantity of measurand；Work(
Rate meter module, measures the power of measured signal；And relay module, select TCH test channel.
The system further comprises：Micro treatment module and the second communication module；The micro treatment module is used for system
Segmentum intercalaris when standard time base being provided, time term is added to storing to the data in memory module and provides the data of transmission
Point；Second communication module makes the micro treatment module establish communication connection with computer module.
Preferably, the system further comprises：Autoexcitation module acquires the autoexcitation data of measurand and makes in real time
Computer module realizes that the autoexcitation to measurand controls by communication cable.
Preferably, the system further comprises：Selftest module is connect with computer module, for being carried out certainly to system
Inspection.
Further, the system further comprises that sample/hold amplifier and photoelectric isolation module, the sampling are protected
It holds amplifier to connect with simulation accumulator, the photoelectric isolation module and the sample/hold amplifier and the microprocessor mould
Block connects.
Further, the system further comprises digital signal buffer module, is connect with control module, is used for suppressor
The internal cause overvoltage of part or overcurrent, and reduce the switching loss of device.
In addition, the system further comprises Signal-regulated kinase, collected amount of logic, frequency quantity and pulsed quantity are believed
Number differential amplification, filtering, amplitude limit and data buffering.
The connection relation of above-mentioned module is described in detail with reference to Fig. 1, it is in the embodiment show in figure 1, described
Control module is Zero greeve controller 9, and the Zero greeve controller 9 is parsed by AXI buses by information is controlled.Micro- place in Fig. 1
Reason module is Aduc812 microprocessors 19, and computer module is host computer 26.Simulate accumulator 2 respectively with measurand
1, sampling amplifier 14 be connected, communication module Ι 3 is connected with measurand 1, backboard 10 respectively, avometer module 4 respectively with quilt
Survey object 1, backboard 10 are connected, and oscilloscope module 5 is connected with measurand 1, backboard 10 respectively, and parallel A/D module 6 is distinguished
It is connected with measurand 1, backboard 10, power meter module 7 is connected with measurand 1, backboard 10 respectively, relay module 8
It is connected respectively with measurand 1, backboard 10, Zero greeve controller 9 with backboard 10, Signal-regulated kinase 18, is sampled and kept respectively
Amplifier 14 is connected with photoelectric isolation module 16, and Signal-regulated kinase 18 is connected with digital signal buffer module 17, photoelectricity
Isolation module 16 is connected with sampling amplifier 14, Aduc812 microprocessors 19 respectively, digital signal buffer module 17 respectively with
Signal-regulated kinase 18, Aduc812 microprocessors 19 are connected, and autoexcitation module 20 is micro- with measurand 1, Aduc812 respectively
Processor 19 is connected, Aduc812 microprocessors 19 respectively with photoelectric isolation module 16, digital signal buffer module 17, self-excitation
Encourage module 20, communication module II 23 is connected, communication module II 23 respectively with Aduc812 microprocessors 19, host computer 26
It is connected, selftest module 22 is connected with host computer 26, and memory module 25 is connected with host computer 26, upper calculating
Machine 26 is connected with selftest module 22, memory module 25, communication module II 23, power supply 27 respectively, power supply 27 and host computer
26 are connected.The device can realize test analysis and diagnostic function.
Belong to " first ", " second " etc. in description and claims of this specification and above-mentioned attached drawing are for distinguishing
Different objects, rather than for describing particular order.In addition, term " comprising " and " having " and their any deformations, meaning
Figure, which is to cover, non-exclusive includes.Such as contain process, method, system, product or the equipment of series of steps or unit
The step of being not limited to list or unit, but further include the steps that optionally not listing or unit, or optionally also
Include for these processes, method or the intrinsic gas step or unit of equipment.
Obviously, the above embodiment of the present invention be only to clearly illustrate example of the present invention, and not be pair
The restriction of embodiments of the present invention may be used also on the basis of the above description for those of ordinary skill in the art
To make other variations or changes in different ways, all embodiments can not be exhaustive here, it is every to belong to this hair
Row of the obvious changes or variations that bright technical solution is extended out still in protection scope of the present invention.
Claims (10)
1. a kind of analysis and diagnostic test system based on BIT technologies, which is characterized in that including：Test module, control module,
Computer module, memory module；
Test module tests measurand, and collecting test data；
Memory module stores the diagnostic message of built-in test and self-diagnosable system；
Control module controls test module gathered data, and carries out information exchange with computer module；
The data for the test module acquisition that computer module processing receives, in conjunction with the diagnostic message parsing failure letter in memory module
It ceases and positions.
2. system according to claim 1, which is characterized in that the memory module is stored with the digital information of measurement, equipment
On analog quantity information, switching value information, frequency information, pulse information, the thick fault message of signal detection and those information
Corresponding encoded information.
3. system according to claim 1, which is characterized in that the test module includes：
Accumulator is simulated, the analog quantity ephemeral data in test process is preserved；
First communication module carries out protocol with measurand；
Avometer module measures voltage, resistance and current signal；
Oscilloscope module records the waveform in test process；
Parallel A/D module acquires the analog quantity of measurand；
Power meter module measures the power of measured signal；And
Relay module selects TCH test channel.
4. system according to claim 1, which is characterized in that the system further comprises：Micro treatment module and second leads to
Interrogate module；
The micro treatment module is used to provide a system to standard time base, adds the time to storing to the data in memory module
And provide timing node to the data of transmission；
Second communication module makes the micro treatment module establish communication connection with computer module.
5. system according to claim 1, which is characterized in that the system further comprises：
Autoexcitation module acquires the autoexcitation data of measurand and computer module is made to be realized to quilt by communication cable in real time
Survey the autoexcitation control of object.
6. system according to claim 1, which is characterized in that the system further comprises：
Selftest module is connect with computer module, for carrying out self-test to system.
7. system according to claim 3, which is characterized in that the system further comprises sample/hold amplifier and light
It is electrically isolated module, the sample/hold amplifier is connect with simulation accumulator, and the photoelectric isolation module is kept with the sampling
Amplifier and micro treatment module connection.
8. system according to claim 1, which is characterized in that the system further comprises digital signal buffer module, with
Control module connects, the internal cause overvoltage for suppression device or overcurrent, and reduces the switching loss of device.
9. system according to claim 1, which is characterized in that the system further comprises Signal-regulated kinase, to acquisition
Differential amplification, filtering, amplitude limit and the data buffering of the amount of logic, frequency quantity and pulsed quantity signal that arrive.
10. system according to claim 1, which is characterized in that the control module is Zero greeve controller, the zero slot control
Device is parsed by AXI buses by information is controlled.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810776331.2A CN108646639A (en) | 2018-07-16 | 2018-07-16 | A kind of analysis and diagnostic test system based on BIT technologies |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201810776331.2A CN108646639A (en) | 2018-07-16 | 2018-07-16 | A kind of analysis and diagnostic test system based on BIT technologies |
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| CN108646639A true CN108646639A (en) | 2018-10-12 |
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| CN201810776331.2A Pending CN108646639A (en) | 2018-07-16 | 2018-07-16 | A kind of analysis and diagnostic test system based on BIT technologies |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109521711A (en) * | 2018-11-14 | 2019-03-26 | 武汉万安智能技术有限公司 | A kind of instrument and equipment automatically controls and detection system |
| CN112269364A (en) * | 2020-09-14 | 2021-01-26 | 北京电子工程总体研究所 | Fault positioning self-testing system and method |
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