CN108600540B - Fall detection method and related product - Google Patents
Fall detection method and related product Download PDFInfo
- Publication number
- CN108600540B CN108600540B CN201810372409.4A CN201810372409A CN108600540B CN 108600540 B CN108600540 B CN 108600540B CN 201810372409 A CN201810372409 A CN 201810372409A CN 108600540 B CN108600540 B CN 108600540B
- Authority
- CN
- China
- Prior art keywords
- hardness
- determining
- electronic device
- acceleration values
- preset
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/72—Mobile telephones; Cordless telephones, i.e. devices for establishing wireless links to base stations without route selection
- H04M1/724—User interfaces specially adapted for cordless or mobile telephones
- H04M1/72448—User interfaces specially adapted for cordless or mobile telephones with means for adapting the functionality of the device according to specific conditions
- H04M1/72454—User interfaces specially adapted for cordless or mobile telephones with means for adapting the functionality of the device according to specific conditions according to context-related or environment-related conditions
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/72—Mobile telephones; Cordless telephones, i.e. devices for establishing wireless links to base stations without route selection
- H04M1/724—User interfaces specially adapted for cordless or mobile telephones
- H04M1/72448—User interfaces specially adapted for cordless or mobile telephones with means for adapting the functionality of the device according to specific conditions
- H04M1/72451—User interfaces specially adapted for cordless or mobile telephones with means for adapting the functionality of the device according to specific conditions according to schedules, e.g. using calendar applications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M2250/00—Details of telephonic subscriber devices
- H04M2250/12—Details of telephonic subscriber devices including a sensor for measuring a physical value, e.g. temperature or motion
Abstract
The embodiment of the application provides a drop detection method and a related product, wherein the drop detection method is applied to an electronic device and comprises the following steps: acquiring the latest falling data of the electronic device; sampling the falling data at intervals to obtain a plurality of acceleration values; the basis hardness of ground material is confirmed to a plurality of acceleration values, consequently, this application embodiment, can promote the accuracy that detects the hardness of ground material.
Description
Technical Field
The application relates to the technical field of signal processing, in particular to a fall detection method and a related product.
Background
With the widespread use of electronic devices (such as mobile phones, tablet computers, etc.), electronic devices have increasingly supported applications and increasingly powerful functions, and have developed towards diversification and personalization, becoming indispensable electronic products in user life. Taking a mobile phone as an example, when a user uses the mobile phone, the mobile phone may fall due to an operation error, but the hardness of the ground material cannot be detected.
Disclosure of Invention
The embodiment of the application provides a drop detection method and a related product, which can improve the accuracy of hardness detection of ground materials.
A first aspect of an embodiment of the present application provides a drop detection method applied to an electronic device, where the method includes:
acquiring the latest falling data of the electronic device;
sampling the falling data at intervals to obtain a plurality of acceleration values;
and determining the hardness of the ground material according to the acceleration values.
A second aspect of embodiments of the present application provides a fall detection apparatus, applied to an electronic apparatus, including an acquisition unit, a sampling unit, and a first determination unit, wherein,
the acquisition unit is used for acquiring the latest falling data of the electronic device;
the sampling unit is used for carrying out interval sampling on the falling data to obtain a plurality of acceleration values;
and the first determining unit is used for determining the hardness of the ground material according to the acceleration values.
A third aspect of embodiments of the present application provides an electronic device, including a processor, a memory, a communication interface, and one or more programs, where the one or more programs are stored in the memory and configured to be executed by the processor, and the programs include instructions for performing the steps in the first aspect of embodiments of the present application.
A fourth aspect of embodiments of the present application provides a computer-readable storage medium, where the computer-readable storage medium stores a computer program for electronic data exchange, where the computer program makes a computer perform part or all of the steps as described in the first aspect of embodiments of the present application.
A fifth aspect of embodiments of the present application provides a computer program product, wherein the computer program product comprises a non-transitory computer readable storage medium storing a computer program operable to cause a computer to perform some or all of the steps as described in the first aspect of embodiments of the present application. The computer program product may be a software installation package.
The embodiment of the application has the following beneficial effects:
it can be seen that, through this application embodiment, acquire electron device is last fall data, it is right fall data and carry out interval sampling, obtain a plurality of acceleration values, the foundation the hardness of ground material is confirmed to a plurality of acceleration values, consequently, the analysis is to falling the acceleration value that data carry out interval sampling back, confirms the hardness of ground material according to the change of acceleration value, can promote electron device to the accuracy and the intelligence that the hardness of ground material detected, and then can also promote the accuracy of judging electron device's damage degree.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1A is a schematic flow chart of a fall detection method according to an embodiment of the present application;
fig. 1B is a schematic flowchart of a method for performing interval sampling on fall data according to an embodiment of the present application;
FIG. 1C is a waveform diagram of acceleration values versus time provided in an embodiment of the present application;
fig. 1D is a schematic flowchart of a remaining drop number prompting method provided in the embodiment of the present application;
FIG. 1E is a schematic flow chart diagram illustrating a method for determining crash parameters according to an embodiment of the present disclosure;
FIG. 1F provides a schematic illustration of a determination of impact contact locations;
fig. 1G is a schematic flow chart of another fall detection method provided in an embodiment of the present application;
fig. 2 provides another drop detection method for an embodiment of the present application;
fig. 3 provides another drop detection method for embodiments of the present application;
fig. 4 is a schematic structural diagram of an electronic device according to an embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of a fall detection device according to an embodiment of the present application;
fig. 6 is a schematic structural diagram of another fall detection device according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The terms "first," "second," and the like in the description and claims of the present application and in the above-described drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.
Reference in the specification to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the specification. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.
The electronic device according to the embodiments of the present application may include various handheld devices, vehicle-mounted devices, wearable devices, computing devices or other processing devices connected to a wireless modem, and various forms of User Equipment (UE), Mobile Stations (MS), terminal equipment (terminal device), and so on. For convenience of description, the above-mentioned apparatuses are collectively referred to as electronic devices.
Referring to fig. 1A, fig. 1A is a schematic flow chart of a fall detection method according to an embodiment of the present disclosure. As shown in fig. 1A, the drop detection method is applied to an electronic device, and the drop detection method specifically includes steps 101 to 103, which are specifically as follows:
101. and acquiring the latest falling data of the electronic device.
Wherein the last fall data of the electronic device may include at least one of the following data: acceleration value when falling, falling time, falling position, falling angle, running state of the electronic device when falling, posture of the user holding the electronic device when falling, and the like. The fall time may be recorded by a system clock of the electronic device after the electronic device falls. The falling position can comprise the falling height of the electronic device, the falling height can be measured through the acceleration sensor, the environment can be shot through the camera, the environment image is obtained, and the falling position of the electronic device is obtained through the image. The acceleration value of the electronic device during falling can be continuously detected within a preset time period through the linear acceleration sensor, so that the acceleration value of the electronic device during falling is obtained, wherein the preset time period can be 1.5 s-2 s, and can be set by a system of the electronic device. The fall angle can be obtained by a fall sensor. The operational state of the electronic device when dropped may include at least one of: off/on state, specific application running in the foreground, CPU usage of the electronic device, power of the electronic device, and the like. The posture of the user holding the electronic device when falling may be the posture of holding the electronic device before falling, for example, a housing of the electronic device may be provided with a pressure sensor, and thus, the posture of the user holding the electronic device may be detected.
Optionally, the electronic device may further acquire the fall data in real time, and acquiring the fall data in real time may be understood as acquiring the acceleration value of the electronic device at preset time intervals through the linear acceleration sensor within a preset time period after the electronic device falls, where the preset time period is 1.5s, and the preset time interval is 10ms, so that the acceleration value of the electronic device may be acquired 150 times within 1.5s after the electronic device falls, and the acceleration value of the electronic device may be acquired in a high-frequency manner, so as to reflect a curve of the change of the acceleration value of the electronic device more truly.
102. And carrying out interval sampling on the falling data to obtain a plurality of acceleration values.
Referring to fig. 1B, fig. 1B is a schematic flowchart of a method for performing interval sampling on fall data according to an embodiment of the present disclosure. As shown in fig. 1B, the interval sampling method includes steps a10 to a12, where the fall data is taken as an example of an acceleration value during a fall, and the following is specifically described:
and A10, acquiring a waveform diagram of an acceleration value and time of the electronic device from the falling data.
Optionally, fig. 1C provides a waveform diagram of acceleration values versus time for the embodiment of the present application. Wherein the horizontal axis is a time axis, the time axis is ms, the vertical axis is an acceleration axis, and the acceleration axis is m/s2Is a unit.
And A11, dividing the time axis of the oscillogram according to a preset time interval to obtain a plurality of time intervals.
Optionally, as shown in fig. 1C, the time axis of the waveform diagram is divided according to a time interval of 6ms, so as to obtain a plurality of time intervals, for example, 109ms to 115ms is a time interval, and 115ms to 121ms is a time interval, so as to divide the time intervals.
And A12, calculating the average value of the acceleration values of each time interval in the plurality of time intervals, and taking the average value of the acceleration values as the acceleration value of each time interval.
The method comprises the steps of calculating the average value of the acceleration values of each time interval, wherein the method can be a high-accuracy method and a common-accuracy method, the high-accuracy method is used for calculating the high accuracy through a calculus principle, the common-accuracy method is used for dividing the acceleration value change in each time interval into a plurality of sub-intervals again, the acceleration value change curve in each sub-interval is regarded as linear change, then the first average value of the acceleration value of each sub-interval is calculated through a linear function average algorithm, finally, the acceleration value of each interval is calculated according to the first average value, the requirement for accuracy under a common scene is met, different accuracy requirements can be met by adopting different accuracy methods, and therefore the practicability of the electronic device is improved.
Optionally, another method for performing interval sampling on fall data may include steps a 20-a 22 as follows:
and A20, acquiring a waveform diagram of an acceleration value and time of the electronic device from the falling data.
And A21, dividing the time axis of the oscillogram according to a preset time interval to obtain a plurality of time intervals.
And A22, taking the acceleration value corresponding to the end point of each time interval as the plurality of acceleration values.
Optionally, the acceleration value corresponding to the end point of each interval is used as the plurality of acceleration values, for example, the acceleration value corresponding to 109ms, the acceleration value corresponding to 115ms, the acceleration value corresponding to 121ms, and the like. Thus, a plurality of acceleration values are obtained, and the acceleration values are the corresponding instantaneous acceleration values at each specific time point.
The specific implementation manners of the steps a20 and a21 may refer to the specific implementation manners corresponding to the steps a10 and a11, and are not described herein again.
103. And determining the hardness of the ground material according to the acceleration values.
Optionally, a method for determining the hardness of the ground material according to the plurality of acceleration values includes: if the number of the acceleration values which are larger than a preset acceleration value is larger than or equal to a preset numerical value, determining that the hardness of the ground material is a first hardness; and if the number of the acceleration values smaller than the preset acceleration value is smaller than the preset value, determining that the hardness of the ground material is a second hardness, wherein the second hardness is smaller than the first hardness.
Wherein, predetermine the acceleration value and be the acceleration value of gravity, the acceleration value of gravity specifically sets up according to the position at electron device place, electron device can fix a position its position and obtain the position at electron device place, after obtaining the position at electron device place, can follow the acceleration value of gravity of obtaining electron device position on the network, also can be through when falling, measure in real time, the measuring method can be for the time of falling according to electron device and the speed when contacting ground, calculate according to the formula between acceleration and the speed, thereby obtain the acceleration value of gravity of electron device position. The number of the acceleration values larger than the preset acceleration value is 10 times larger than or equal to the preset value of the preset values. The first hardness is the hardness of the hard material, the second hardness is the hardness of the soft material, the hardness of the hard material is the hardness of more than 80 degrees, the hardness of the soft material is the hardness of less than or equal to 80 degrees, the Shore hardness is measured by the Shore hardness, the Shore hardness represents a standard of the hardness of the material, and a corresponding durometer is proposed and invented by Albert Ferdinand Shore in 1920 s.
Optionally, referring to fig. 1D, fig. 1D is a schematic flow chart of a remaining drop number prompting method provided in the embodiment of the present application. As shown in fig. 1D, the remaining drop time indication method is performed after determining the hardness of the ground material according to the acceleration value, and the remaining drop time indication method may include steps B1 to B4, which are as follows:
and B1, determining the collision parameters of the electronic device according to the hardness of the ground material.
Optionally, the impact parameter of the electronic device includes a deformation amount, and fig. 1E is a schematic flowchart of a method for determining the impact parameter of the electronic device according to an embodiment of the present disclosure, where fig. 1E is a flowchart of the method for determining the impact parameter. As shown in FIG. 1E, the method for determining collision parameters may include steps B11-B13, as follows:
and B11, extracting the collision contact part of the electronic device and the ground.
Optionally, the contact collision part can be obtained according to the falling angle, and the collision contact part of the electronic device can be roughly estimated according to the falling angle because different falling angles determine that the part of the electronic device falls to the ground first.
Optionally, the collision contact position of the electronic device with the ground is extracted, and the collision contact position can be detected by a pressure sensor of the electronic device. FIG. 1F provides a schematic illustration of determining the location of the impact contact, as described in FIG. 1F.
And B12, determining the collision impact force received within the preset range of the collision contact part according to the hardness of the ground material.
Optionally, the force-bearing point of the collision contact portion is determined, where the collision contact point is the force-bearing point, and of course, the force-bearing point of the collision in this embodiment is not limited to the front side of the touch display screen, and of course, if the frame of the electronic device falls to the ground first, the touch display screen may also be affected by the collision, and therefore, the force-bearing point may also be the frame, and other areas (e.g., the rear cover). The buffering time of the hardness of different ground materials is different, for example, the cement ground buffering time is shorter, and the grassland or sandy beach buffering time is longer, so the mapping relation between the hardness of the ground material and the buffering time can be stored in the electronic device in advance, and then the target buffering time corresponding to the ground material is determined according to the mapping relation, and further, the target buffering time, the landing speed (i.e. the speed when contacting the ground), the mass of the electronic device, and the law of conservation of momentum: ft to mv, i.e. the impact force on the electronic device can be determined, where f denotes the impact force on the electronic device, t is the target buffering time, m is the mass of the electronic device, and v is the landing speed. The stressed radii of the touch display screens corresponding to different collision impact forces are different, different preset ranges can be set, the electronic device can pre-store the mapping relationship between the stressed radii and the preset ranges, the preset ranges are sector areas taking the stressed points of the collision contact parts as the centers, and the sector areas comprise partial areas of the electronic device, as shown in fig. 1F.
And B13, determining the deformation amount of the collision contact part according to the collision impact force.
Optionally, the material of the electronic device at the collision contact portion is extracted, for example, the collision contact portion is an electronic device side frame, the material of the side frame is extracted, the material of the screen is extracted when the collision contact portion is a screen, a mapping relation between a collision impact force and a deformation amount generated due to collision is obtained when the material of the electronic device is subjected to collision impact, the mapping relation between the collision impact force and the deformation amount can be obtained by establishing a deformation amount detection model between the collision impact force and the deformation amount, the deformation amount detection model can be an artificial intelligent learning model, such as a neural network learning model, and the like, and the mapping relation between the collision impact force and the deformation amount is obtained by learning a large amount of sample data of the collision impact force and the deformation amount. The mapping relationship between the collision impact force and the deformation amount can also be obtained through an impact resistance test of the material during the production of the material, and of course, the mapping relationship between the collision impact force and the deformation amount can also be obtained through other methods, which is not specifically limited herein.
B2, determining the damage parameters of the electronic device according to the collision parameters.
Optionally, the deformation of the electronic device is judged to be elastic deformation and inelastic deformation according to the deformation quantity, the object is deformed under the action of external force due to the elastic deformation, and the object can recover to the original shape after the external force is cancelled, so that the deformation is called elastic deformation; inelastic deformation is a phenomenon in which an object may break or deform when subjected to a large force outside the elastic limit, and cannot return to its original shape. If the electronic device is elastically deformed, the damage parameters of the electronic device are judged according to the deformation quantity, the damage parameters comprise the damage degree of components within a preset range, the components within the preset range can be any electronic component, such as a capacitor, an inductor, a diode, a resistor, a chip and the like, and the damage degree can comprise: the part damage can be that the part can normally work but the structure is damaged if the structure is damaged by larger impact force again, and the complete damage is that the part can not normally work.
One method for determining a damage parameter of an electronic device based on a deformation amount is: the maximum deformation of the collision contact part of the electronic device is obtained according to the deformation amount, the damage degree of the part corresponding to the maximum deformation is determined according to the mapping relation between the deformation stored in the electronic device and the damage degree of the part, the mapping relation can be obtained by carrying out big data statistics on data of the electronic device when the electronic device falls for multiple times, the big data statistics is that deformation analysis is carried out on the electronic device after the electronic device falls for multiple times and the damage degree of the part is analyzed, and the mapping relation between the deformation and the damage degree of the part is obtained and is more than 500 times for multiple times. The mapping relationship between the deformation and the damage degree of the component may be different according to the different collision contact portions, for example, the collision contact portion is the mapping relationship between the deformation of the screen and the damage degree of the component, the collision contact portion is the mapping relationship between the deformation of the frame and the damage degree of the component may be different, the component is different, and the mapping relationship between the deformation and the damage degree of the component may be different, for example, when the component is a chip and an inductor, the corresponding mapping relationship may be different. And if the electronic device is subjected to inelastic deformation, determining the damage parameter as that the electronic device is damaged.
And B3, determining the residual falling number of the electronic device according to the damage parameters.
Optionally, if the damage parameter indicates that the electronic device is damaged, determining that the remaining drop frequency of the electronic device is 0. If the damage degree of all the components in the damage parameters is not damaged, subtracting 1 from the residual falling frequency of the electronic device after the last falling to obtain the residual falling frequency after the current falling, and if the damage degree of the components in the damage parameters is partial damage, setting the residual falling frequency to be 1.
And B4, displaying the residual falling times.
Optionally, the remaining falling times can be displayed on the screen after the electronic device falls, and if the screen is damaged and cannot be displayed after the electronic device falls, the remaining falling times can be played in a voice mode.
It can be seen that, through this application embodiment, acquire electron device is last fall data, it is right fall data and carry out interval sampling, obtain a plurality of acceleration values, the foundation the hardness of ground material is confirmed to a plurality of acceleration values, consequently, the analysis is to falling the acceleration value that data carry out interval sampling back, confirms the hardness of ground material according to the change that acceleration value comes, can promote electron device to the accuracy and the intelligence that the hardness of ground material detected, and then can also promote the accuracy of judging electron device's damage degree.
In one possible example, please refer to fig. 1G, and fig. 1G provides a schematic flow chart of another drop detection method according to an embodiment of the present application. As shown in fig. 1G, in determining the hardness of the ground material, the drop detection method may further include steps C1-C3, which are as follows:
and C1, if the acceleration values are all smaller than the preset acceleration value, determining that the ground material is the target material.
Optionally, the target material can be, for example, liquid, a substance doped with liquid, etc., and a plurality of acceleration values are all less than a preset acceleration value, which can indicate that the object does not bounce and the speed thereof will eventually stop, so that it can be determined that the ground may be liquid, etc., that is, the electronic device may have fallen into the liquid, at this time, the damage to the electronic device is large, and the electronic device may be damaged seriously, wherein the preset acceleration value is a local gravity acceleration value.
And C2, acquiring a target instruction corresponding to the target material.
Optionally, the target instruction corresponding to the target material may be: the power-off protection instruction is used for indicating the electronic device to carry out power-off protection and cutting off the power supply of the electronic device, the alarm instruction can send an alarm signal for indicating the electronic device, and the alarm signal can be at least one of the following: vibration, ringing, voice, sending a reminder to the wearable device, and so on.
C3, executing the target instruction.
Optionally, the target instruction may be divided into different priorities, for example, the power-off protection instruction is a first priority, the alarm instruction is a second priority, the first priority instruction is executed before the second priority instruction, and the power-off instruction may be executed immediately after it is determined that the electronic device falls into the liquid as the first priority instruction, so as to protect the electronic device, thereby reducing the occurrence of the damage to the electronic device, and prolonging the service life of the electronic device to a certain extent.
In this example, when the electronic device is detected to fall into the liquid by the acceleration value, the corresponding target instruction is started, and the target instruction is executed according to the priority sequence when the target instruction is executed, so that the probability of the electronic device being damaged can be reduced to a certain extent, and the electronic device can be reminded of falling into the liquid, so that the user can take some corresponding measures, and the user experience can be improved to a certain extent.
Referring to fig. 2, fig. 2 provides another fall detection method according to an embodiment of the present application. As shown in fig. 2, the drop detection method includes the following steps:
201. acquiring the latest falling data of the electronic device;
202. acquiring a oscillogram of an acceleration value and time of the electronic device from the falling data;
203. dividing the time axis of the oscillogram according to a preset time interval to obtain a plurality of time intervals;
204. calculating the average value of the acceleration values of each time interval in the plurality of time intervals, and taking the average value of the acceleration values as the acceleration value of each time interval;
205. and determining the hardness of the ground material according to the acceleration values.
It can be seen that, in this example, the last fall data of the electronic device is acquired, the fall data is subjected to interval sampling to obtain a plurality of acceleration values, and the hardness of the ground material is determined according to the acceleration values, so that the acceleration values obtained after the fall data is subjected to interval sampling are analyzed, the hardness of the ground material is determined according to the change of the acceleration values, the accuracy and the intelligence of the electronic device in detecting the hardness of the ground material can be improved, and the accuracy of judging the damage degree of the electronic device can be improved.
Referring to fig. 3, fig. 3 provides another fall detection method according to an embodiment of the present application. As shown in fig. 3, the drop detection method includes the steps of:
301. acquiring the latest falling data of the electronic device;
302. acquiring a oscillogram of an acceleration value and time of the electronic device from the falling data;
303. dividing the time axis of the oscillogram according to a preset time interval to obtain a plurality of time intervals;
304. calculating the average value of the acceleration values of each time interval in the plurality of time intervals, and taking the average value of the acceleration values as the acceleration value of each time interval;
305. determining the hardness of the ground material according to the acceleration values;
306. extracting a collision contact part of the electronic device and the ground;
307. determining the collision impact force received within the preset range of the collision contact part according to the hardness of the ground material;
308. determining the deformation amount of the collision contact part according to the collision impact force;
309. determining the electronic device damage parameter according to the collision parameter, wherein the collision parameter comprises a deformation amount;
310. determining the residual falling frequency of the electronic device according to the damage parameters;
311. and displaying the residual falling times.
It can be seen that, in this example, the latest falling data of the electronic device is obtained, the falling data is sampled at intervals to obtain a plurality of acceleration values, the hardness of the ground material is determined according to the acceleration values, after the hardness of the ground material is detected, the deformation quantity of the collision contact part of the electronic device is determined according to the hardness, the damage parameter of the electronic device is determined according to the deformation quantity, the remaining falling times are obtained according to the damage parameter, and the remaining falling times are displayed, so that the accuracy and intelligence of the hardness detection of the ground material by the electronic device can be improved by analyzing the acceleration values after the interval sampling of the falling data, the hardness of the ground material is determined according to the change of the acceleration values, the remaining falling times of the electronic device is determined according to the hardness of the ground material, and the falling times are displayed, the intelligence of the electronic device can be further improved to a certain extent, and the user experience is improved.
In accordance with the foregoing embodiments, please refer to fig. 4, fig. 4 is a schematic structural diagram of an electronic device according to an embodiment of the present application, and as shown in the drawing, the electronic device includes a processor, a memory, a communication interface, and one or more programs, where the one or more programs are stored in the memory and configured to be executed by the processor, and the programs include instructions for performing the following steps:
acquiring the latest falling data of the electronic device;
sampling the falling data at intervals to obtain a plurality of acceleration values;
and determining the hardness of the ground material according to the acceleration values.
It can be seen that, through this application embodiment, acquire electron device is last fall data, it is right fall data and carry out interval sampling, obtain a plurality of acceleration values, the foundation the hardness of ground material is confirmed to a plurality of acceleration values, consequently, the analysis is to falling the acceleration value that data carry out interval sampling back, confirms the hardness of ground material according to the change of acceleration value, can promote electron device to the accuracy and the intelligence that the hardness of ground material detected, and then can also promote the accuracy of judging electron device's damage degree.
In one possible example, in terms of the interval sampling of the fall data, the instructions in the program are specifically configured to perform the following operations: acquiring a oscillogram of an acceleration value and time of the electronic device from the falling data; dividing the time axis of the oscillogram according to a preset time interval to obtain a plurality of time intervals; and calculating the average value of the acceleration values of each time interval in the plurality of time intervals, and taking the average value of the acceleration values as the acceleration value of each time interval.
In this example, through the oscillogram that acquires acceleration value and time to and carry out interval division with the time axis of oscillogram, and regard the mean value of the acceleration value of every interval after will dividing as the acceleration value of every interval, carry out discrete processing with the acceleration value, a plurality of acceleration values of acquisition that can be quick, thereby can promote electron device to the speed of falling data processing, promote electron device's treatment effeciency.
In one possible example, in said determining the hardness of the ground material from said plurality of acceleration values, the instructions in said program are further specifically configured to: if the number of the acceleration values which are larger than a preset acceleration value is larger than or equal to a preset numerical value, determining that the hardness of the ground material is a first hardness; and if the number of the acceleration values smaller than the preset acceleration value is smaller than the preset value, determining that the hardness of the ground material is a second hardness, wherein the second hardness is smaller than the first hardness.
In the example, the hardness of the ground material is determined by judging the number of deceleration values larger than the preset acceleration values, and compared with the prior art that the material is determined only by the acceleration change value during collision, the accuracy of the electronic device in detecting the hardness of the ground material is improved to a certain extent.
In one possible example, the instructions in the program are further specifically for performing the following: determining collision parameters of the electronic device according to the hardness of the ground material; determining the damage parameter of the electronic device according to the collision parameter; determining the residual falling frequency of the electronic device according to the damage parameters; and displaying the residual falling times.
In this example, the damage parameter of the electronic device is determined by the hardness of the ground material, the remaining drop frequency is obtained according to the damage parameter, the remaining drop frequency is displayed, and the user can quickly know the damage degree of the electronic device through the remaining drop frequency, so as to remind the user to pay attention to the protection of the electronic device
In one possible example, the impact parameter comprises a deformation quantity, and the instructions in the program are further specifically configured to, in said determining the impact parameter of the electronic device as a function of the hardness of the ground material: extracting a collision contact part of the electronic device and the ground; determining the collision impact force received within the preset range of the collision contact part according to the hardness of the ground material; and determining the deformation amount of the collision contact part according to the collision impact force.
In this example, through the analysis according to the impact force that collision contact position received at preset within range to confirm the deformation volume at collision contact position according to the impact force, with this, can confirm the deformation volume at collision contact position comparatively accurately, thereby promote the accuracy that electron device judged the damage degree.
The above description has introduced the solution of the embodiment of the present application mainly from the perspective of the method-side implementation process. It is understood that the electronic device comprises corresponding hardware structures and/or software modules for performing the respective functions in order to realize the above functions. Those of skill in the art will readily appreciate that the present application is capable of hardware or a combination of hardware and computer software implementing the various illustrative elements and algorithm steps described in connection with the embodiments provided herein. Whether a function is performed as hardware or computer software drives hardware depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
In the embodiment of the present application, the electronic device may be divided into the functional units according to the method example, for example, each functional unit may be divided corresponding to each function, or two or more functions may be integrated into one processing unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit. It should be noted that the division of the unit in the embodiment of the present application is schematic, and is only a logic function division, and there may be another division manner in actual implementation.
In accordance with the above, please refer to fig. 5, and fig. 5 is a schematic structural diagram of a fall detection apparatus according to an embodiment of the present application. Applied to electronic devices, the fall detection device comprises an acquisition unit 501, a sampling unit 502 and a first determination unit 503, wherein,
an obtaining unit 501, configured to obtain last fall data of the electronic apparatus;
a sampling unit 502, configured to sample the fall data at intervals to obtain multiple acceleration values;
a first determining unit 503, configured to determine the hardness of the ground material according to the plurality of acceleration values.
It can be seen that, through this application embodiment, acquire electron device is last fall data, it is right fall data and carry out interval sampling, obtain a plurality of acceleration values, the foundation the hardness of ground material is confirmed to a plurality of acceleration values, consequently, the analysis is to falling the acceleration value that data carry out interval sampling back, confirms the hardness of ground material according to the change of acceleration value, can promote electron device to the accuracy and the intelligence that the hardness of ground material detected, and then can also promote the accuracy of judging electron device's damage degree.
In one possible example, in terms of the interval sampling of the roll-off data, the sampling unit 502 is specifically configured to: acquiring a oscillogram of an acceleration value and time of the electronic device from the falling data; dividing the time axis of the oscillogram according to a preset time interval to obtain a plurality of time intervals; and calculating the average value of the acceleration values of each time interval in the plurality of time intervals, and taking the average value of the acceleration values as the acceleration value of each time interval.
In one possible example, in the aspect of determining the hardness of the ground material according to the plurality of acceleration values, the first determining unit 503 is specifically configured to: if the number of the acceleration values which are larger than a preset acceleration value is larger than or equal to a preset numerical value, determining that the hardness of the ground material is a first hardness; and if the number of the acceleration values smaller than the preset acceleration value is smaller than the preset value, determining that the hardness of the ground material is a second hardness, wherein the second hardness is smaller than the first hardness.
In one possible example, please refer to fig. 6, and fig. 6 is a schematic structural diagram of another fall detection apparatus according to an embodiment of the present application. The fall detection apparatus further comprises a second determination unit 504, a third determination unit 505, a judgment unit 506 and a presentation unit 507, wherein,
a second determining unit 504, configured to determine a collision parameter of the electronic device according to a material of the target object;
a third determining unit 505, configured to determine a collision parameter of the electronic device according to the hardness of the ground material;
a determining unit 506, configured to determine the remaining drop frequency of the electronic device according to the damage parameter;
and a display unit 507, configured to display the remaining drop times.
In one possible example, the impact parameter includes a deformation amount, and in determining the impact parameter of the electronic device according to the material of the target object, the second determining unit 504 is specifically configured to: extracting a collision contact part of the electronic device and the ground; determining the collision impact force received within the preset range of the collision contact part according to the hardness of the ground material; and determining the deformation amount of the collision contact part according to the collision impact force.
Embodiments of the present application also provide a computer storage medium, wherein the computer storage medium stores a computer program for electronic data exchange, and the computer program enables a computer to execute part or all of the steps of any one of the fall detection methods as described in the above method embodiments.
Embodiments of the present application also provide a computer program product comprising a non-transitory computer readable storage medium storing a computer program, the computer program causing a computer to perform some or all of the steps of any one of the fall detection methods as described in the above method embodiments.
It should be noted that, for simplicity of description, the above-mentioned method embodiments are described as a series of acts or combination of acts, but those skilled in the art will recognize that the present application is not limited by the order of acts described, as some steps may occur in other orders or concurrently depending on the application. Further, those skilled in the art should also appreciate that the embodiments described in the specification are preferred embodiments and that the acts and modules referred to are not necessarily required in this application.
In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus may be implemented in other manners. For example, the above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units is only one type of division of logical functions, and there may be other divisions when actually implementing, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted, or not implemented. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of some interfaces, devices or units, and may be an electric or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit may be implemented in the form of hardware, or may be implemented in the form of a software program module.
The integrated units, if implemented in the form of software program modules and sold or used as stand-alone products, may be stored in a computer readable memory. Based on such understanding, the technical solution of the present application may be substantially implemented or a part of or all or part of the technical solution contributing to the prior art may be embodied in the form of a software product stored in a memory, and including several instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method described in the embodiments of the present application. And the aforementioned memory comprises: various media capable of storing program codes, such as a usb disk, a read-only memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and the like.
Those skilled in the art will appreciate that all or part of the steps in the methods of the above embodiments may be implemented by associated hardware instructed by a program, which may be stored in a computer-readable memory, which may include: flash memory disks, read-only memory, random access memory, magnetic or optical disks, and the like.
The foregoing detailed description of the embodiments of the present application has been presented to illustrate the principles and implementations of the present application, and the above description of the embodiments is only provided to help understand the method and the core concept of the present application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.
Claims (14)
1. A fall detection method applied to an electronic device, the method comprising:
acquiring the latest falling data of the electronic device;
sampling the falling data at intervals to obtain a plurality of acceleration values;
and determining the hardness of the ground material according to the plurality of acceleration values, wherein the acceleration values comprise the acceleration values after contacting the ground.
2. The method of claim 1, wherein the sampling the fall data at intervals comprises:
acquiring a oscillogram of an acceleration value and time of the electronic device from the falling data;
dividing the time axis of the oscillogram according to a preset time interval to obtain a plurality of time intervals;
and calculating the average value of the acceleration values of each time interval in the plurality of time intervals, and taking the average value of the acceleration values as the acceleration value of each time interval.
3. The method of claim 1, wherein said determining the hardness of the ground material from the plurality of acceleration values comprises:
if the number of the acceleration values which are larger than a preset acceleration value is larger than or equal to a preset numerical value, determining that the hardness of the ground material is a first hardness;
and if the number of the acceleration values smaller than the preset acceleration value is smaller than the preset value, determining that the hardness of the ground material is a second hardness, wherein the second hardness is smaller than the first hardness.
4. The method of claim 2, wherein said determining the hardness of the ground material from the plurality of acceleration values comprises:
if the number of the acceleration values which are larger than a preset acceleration value is larger than or equal to a preset numerical value, determining that the hardness of the ground material is a first hardness;
and if the number of the acceleration values smaller than the preset acceleration value is smaller than the preset value, determining that the hardness of the ground material is a second hardness, wherein the second hardness is smaller than the first hardness.
5. The method according to any one of claims 1 to 4, wherein after said determining the hardness of the ground material from said acceleration values, the method further comprises:
determining collision parameters of the electronic device according to the hardness of the ground material;
determining the damage parameter of the electronic device according to the collision parameter;
determining the residual falling frequency of the electronic device according to the damage parameters;
and displaying the residual falling times.
6. The method of claim 5, wherein the impact parameter comprises a deformation amount, and wherein determining the impact parameter for the electronic device based on the hardness of the ground material comprises:
extracting a collision contact part of the electronic device and the ground;
determining the collision impact force received within the preset range of the collision contact part according to the hardness of the ground material;
and determining the deformation amount of the collision contact part according to the collision impact force.
7. A fall detection device, applied to an electronic device, comprising:
the acquisition unit is used for acquiring the latest falling data of the electronic device;
the sampling unit is used for carrying out interval sampling on the falling data to obtain a plurality of acceleration values;
and the first determining unit is used for determining the hardness of the ground material according to the plurality of acceleration values, wherein the acceleration values comprise the acceleration values after contacting the ground.
8. The apparatus of claim 7, wherein the sampling unit is specifically configured to:
acquiring a oscillogram of an acceleration value and time of the electronic device from the falling data;
dividing the time axis of the oscillogram according to a preset time interval to obtain a plurality of time intervals;
and calculating the average value of the acceleration values of each time interval in the plurality of time intervals, and taking the average value of the acceleration values as the acceleration value of each time interval.
9. The apparatus according to claim 7, wherein the first determining unit is specifically configured to:
if the number of the acceleration values which are larger than a preset acceleration value is larger than or equal to a preset numerical value, determining that the hardness of the ground material is a first hardness;
and if the number of the acceleration values smaller than the preset acceleration value is smaller than the preset value, determining that the hardness of the ground material is a second hardness, wherein the second hardness is smaller than the first hardness.
10. The apparatus according to claim 8, wherein the first determining unit is specifically configured to:
if the number of the acceleration values which are larger than a preset acceleration value is larger than or equal to a preset numerical value, determining that the hardness of the ground material is a first hardness;
and if the number of the acceleration values smaller than the preset acceleration value is smaller than the preset value, determining that the hardness of the ground material is a second hardness, wherein the second hardness is smaller than the first hardness.
11. The apparatus of any one of claims 7 to 10, further comprising:
the second determining unit is used for determining collision parameters of the electronic device according to the material of a target object, wherein the target object is a collision contact part of the electronic device and the ground;
the third determining unit is used for determining the collision parameters of the electronic device according to the hardness of the ground material;
the judging unit is used for determining the residual falling frequency of the electronic device according to the damage parameters;
and the display unit is used for displaying the residual falling times.
12. The device according to claim 11, wherein the collision parameter comprises a deformation quantity, the second determination unit being in particular configured to:
extracting a collision contact part of the electronic device and the ground;
determining the collision impact force received within the preset range of the collision contact part according to the hardness of the ground material;
and determining the deformation amount of the collision contact part according to the collision impact force.
13. An electronic device comprising a processor, a memory, a communication interface, and one or more programs stored in the memory and configured to be executed by the processor, the programs including instructions for performing the steps in the method of any of claims 1-6.
14. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, is able to carry out the method according to any one of claims 1 to 6.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810372409.4A CN108600540B (en) | 2018-04-24 | 2018-04-24 | Fall detection method and related product |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810372409.4A CN108600540B (en) | 2018-04-24 | 2018-04-24 | Fall detection method and related product |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108600540A CN108600540A (en) | 2018-09-28 |
| CN108600540B true CN108600540B (en) | 2021-02-26 |
Family
ID=63614916
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810372409.4A Active CN108600540B (en) | 2018-04-24 | 2018-04-24 | Fall detection method and related product |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108600540B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117708599A (en) * | 2024-02-04 | 2024-03-15 | 荣耀终端有限公司 | Ground material identification method, network training method and electronic equipment |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203720020U (en) * | 2014-01-17 | 2014-07-16 | 浙江建设职业技术学院 | Testing equipment for strength of roadbeds and road surfaces |
| CN105155501A (en) * | 2015-08-21 | 2015-12-16 | 中南大学 | Handheld type roadbed bevel compactness measuring instrument |
| CA2704453C (en) * | 2009-06-22 | 2016-02-02 | Research In Motion Limited | Portable electronic device and method of measuring drop impact at the portable electronic device |
| CN106407041A (en) * | 2016-09-06 | 2017-02-15 | 广东欧珀移动通信有限公司 | Drop data processing system of terminal |
| CN106453830A (en) * | 2016-09-06 | 2017-02-22 | 广东欧珀移动通信有限公司 | Falling detection method and device |
| CN106501101A (en) * | 2016-10-26 | 2017-03-15 | 上海工程技术大学 | A kind of device for determining accurate device impact resistance characteristic |
-
2018
- 2018-04-24 CN CN201810372409.4A patent/CN108600540B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2704453C (en) * | 2009-06-22 | 2016-02-02 | Research In Motion Limited | Portable electronic device and method of measuring drop impact at the portable electronic device |
| CN203720020U (en) * | 2014-01-17 | 2014-07-16 | 浙江建设职业技术学院 | Testing equipment for strength of roadbeds and road surfaces |
| CN105155501A (en) * | 2015-08-21 | 2015-12-16 | 中南大学 | Handheld type roadbed bevel compactness measuring instrument |
| CN106407041A (en) * | 2016-09-06 | 2017-02-15 | 广东欧珀移动通信有限公司 | Drop data processing system of terminal |
| CN106453830A (en) * | 2016-09-06 | 2017-02-22 | 广东欧珀移动通信有限公司 | Falling detection method and device |
| CN106501101A (en) * | 2016-10-26 | 2017-03-15 | 上海工程技术大学 | A kind of device for determining accurate device impact resistance characteristic |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108600540A (en) | 2018-09-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108769350B (en) | Fall detection method and related device | |
| CN108076218B (en) | Charging reminding method and mobile terminal | |
| EP1722296B1 (en) | Portable terminal having motion-recognition capability and motion recognition method therefor | |
| US7904274B2 (en) | Mobile apparatus | |
| CN109839245B (en) | Electronic device and waterproof quality guarantee condition judgment method thereof | |
| CN103227865B (en) | Display method of voice recognition interface and mobile terminal | |
| CN106510720B (en) | User state prompting method and device | |
| CN108307051B (en) | Electronic device, collision data processing method and related product | |
| CN107608855B (en) | Reminding method and mobile terminal | |
| CN108307383B (en) | Data reporting method and related product | |
| CN110097741B (en) | Method, device and equipment for monitoring state of signboard | |
| CN108307059B (en) | Fall protection method and related product | |
| CN108600540B (en) | Fall detection method and related product | |
| CN110954972B (en) | Wearable device, and falling detection method, device and storage medium thereof | |
| CN108304123B (en) | Page display control method and related product | |
| CN108259669B (en) | Falling information detection method and related product | |
| CN108833671B (en) | Falling detection method of electronic device and related product | |
| CN108307054B (en) | Falling information detection method and related product | |
| CN106412250B (en) | One kind falling statistical method and device | |
| CN108337371B (en) | Electronic device, fall protection method, device and computer readable storage medium | |
| CN105242854B (en) | Method and device for interacting with user in collision and mobile terminal | |
| CN108307052B (en) | Electronic device, fall control method and related product | |
| CN108200290B (en) | Electronic device, method for determining drop damage and related product | |
| CN108429850B (en) | Fall treatment method and related product | |
| CN111812356A (en) | Fall detection method and device based on triaxial accelerometer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |