CN108564560B - 基于色阻颜色的对位方法及对位系统 - Google Patents
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Abstract
本发明公开了一种基于色阻颜色的对位方法及对位系统,所述方法包括:S1、获取各子色阻在光源下的光阻特征值,根据光阻特征值设定画素阙值;S2、根据画素阙值对画素进行二值化处理,得到二值化画素;S3、根据二值化画素计算对位位置,根据对位位置进行色阻的对位。本发明可有效避免COA产品金属线和图形形貌的干扰,提升COA产品量测稳定性;可应对多种形态像素对位,测量位置计算逻辑可编辑,像素不规则时,可选用合理逻辑定义测量位置;二值化处理,可突显色阻特征,颜色识别准确性高。
Description
技术领域
本发明涉及液晶显示技术领域,特别是涉及一种基于色阻颜色的对位方法及对位系统。
背景技术
面板行业的彩膜(CF:Color Filter)工艺过程中,红色R、绿色G、蓝色B的色饱和度(简称色度)是LCD产品光学特性的重要参数,直接影响客户体验,故各工艺环节均需进行不同色阻色度监控。
目前量测特定色阻色度时,依靠图形比对(pattern match)进行定位,由于受COA产品金属线和图形形貌的干扰,容易发生图形抓取错误的情况,定位准确性较低,导致量测数据波动严重,影响制程判断,出现批量异常的风险非常高。
为了进行色度有效监控,提升色阻定位准确性是面临的首要难题。
因此,针对上述技术问题,有必要提供一种基于色阻颜色的对位方法及对位系统。
发明内容
为克服现有技术的不足,本发明的目的在于提供一种LCD显示面板及其制造方法。
为了实现上述目的,本发明一实施例提供的技术方案如下:
一种基于色阻颜色的对位方法,所述方法包括:
S1、获取各子色阻在光源下的光阻特征值,根据光阻特征值设定画素阙值;
S2、根据画素阙值对画素进行二值化处理,得到二值化画素;
S3、根据二值化画素计算对位位置,根据对位位置进行色阻的对位。
作为本发明的进一步改进,所述步骤S2中的二值化处理为:全局固定二值化处理或局部自适应二值化处理。
作为本发明的进一步改进,所述全局固定二值化处理具体为:
按照画素阙值T1将整个画素上的各个像素点的灰度值设置为0或255;
若像素点的像素值大于画素阙值T1则将该像素点的像素值设置为255,否则将该像素点的像素值设置为0。
作为本发明的进一步改进,所述局部自适应二值化处理具体为:
根据像素点所在窗口的像素局部特征计算该像素点对应的画素阙值T2;
若该像素点的像素值大于画素阙值T2则将该像素点的像素值设置为255,否则将该像素点的像素值设置为0。
作为本发明的进一步改进,所述局部自适应二值化中画素阙值T2为:
T2=a*E+b*P+c*Q;
其中,a、b、c是自由参数,E为窗口中像素值的平均值,P为窗口中像素值之间的差平方,Q为窗口中像素值之间的均方根值。
作为本发明的进一步改进,所述步骤S3中二值化画素计算对位位置具体为:
根据二值化画素的形状确定其几何重心位置,以几何重心位置作为该二值化画素的对位位置。
作为本发明的进一步改进,所述色阻包括红色子色阻、绿色子色阻、蓝色子色阻。
作为本发明的进一步改进,所述画素阙值根据红色子色阻的光阻特征值进行设定。
本发明另一实施例提供的技术方案如下:
一种基于色阻颜色的对位系统,所述系统包括:
阙值设定单元,获取各子色阻在光源下的光阻特征值,根据光阻特征值设定画素阙值;
画素处理单元,用于根据画素阙值对画素进行二值化处理,得到二值化画素;
定位单元,用于根据二值化画素计算对位位置,根据对位位置进行色阻的对位。
作为本发明的进一步改进,所述画素处理单元还用于根据画素阙值对画素进行全局固定二值化处理或局部自适应二值化处理,得到二值化画素。
本发明具有以下优点:
可有效避免COA产品金属线和图形形貌的干扰,提升COA产品量测稳定性;
可应对多种形态像素对位,测量位置计算逻辑可编辑,像素不规则时,可选用合理逻辑定义测量位置;
二值化处理,可突显色阻特征,颜色识别准确性高。
附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明中记载的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。
图1为本发明基于色阻颜色的对位方法的流程示意图。
图2为本发明基于色阻颜色的对位系统的模块示意图。
图3a、3b、3c分别为本发明一实施例中原始画素、根据画素阙值处理后的画素、及二值化处理后的画素的示意图。
具体实施方式
为了使本技术领域的人员更好地理解本发明中的技术方案,下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都应当属于本发明保护的范围。
参图1所示,本发明公开了一种基于色阻颜色(Pixel Color)的对位方法,该包括以下步骤:
S1、获取各子色阻在光源下的光阻特征值,根据光阻特征值设定画素阙值;
S2、根据画素阙值对画素进行二值化处理,得到二值化画素;
S3、根据二值化画素计算对位位置,根据对位位置进行色阻的对位。
相应地,参图2所示,本发明还公开了一种基于色阻颜色的对位系统,该系统包括:
阙值设定单元10,获取各子色阻在光源下的光阻特征值,根据光阻特征值设定画素阙值;
画素处理单元20,用于根据画素阙值对画素进行二值化处理,得到二值化画素;
定位单元30,用于根据二值化画素计算对位位置,根据对位位置进行色阻的对位。
本申请中的对位方法及定位系统中主要依靠色阻颜色(pixel Color)来实现对位功能,色阻颜色对位主要包括颜色识别和中心对位两个步骤,以下进行详细说明。
正常的彩膜中色阻包括红色子色阻R、绿色子色阻G、蓝色子色阻B,R、G、B色阻在光源下的光阻特征值存在显著差异,通常情况下G色阻的光阻特征值远高于R色阻和B色阻,通过设定各光阻特征值的阈值和画素的二值化处理,可准确进行色阻定位。
因此,首先根据光阻特征值设定画素阙值T,然后根据画素阙值对画素进行二值化处理,得到二值化画素,最后根据二值化画素计算对位位置,根据对位位置进行色阻的对位。
其中,本发明中的二值化处理可以为全局固定二值化处理或局部自适应二值化处理。
全局固定二值化处理就是对整个画素都采用一个统一的画素阙值来进行二值化。具体为:
按照画素阙值T1将整个画素上的各个像素点的灰度值设置为0或255;
若像素点的像素值大于画素阙值T1则将该像素点的像素值设置为255,否则将该像素点的像素值设置为0。
自适应二值化处理则是根据像素点所在窗口的像素值分布来确定该像素位置上的画素阙值。这样做的好处在于每个像素位置处的画素阙值不是固定不变的,而是由其窗口内像素的分布来决定的。具体为:
根据像素点所在窗口的像素局部特征计算该像素点对应的画素阙值T2;
若该像素点的像素值大于画素阙值T2则将该像素点的像素值设置为255,否则将该像素点的像素值设置为0。
优选地,局部自适应二值化中画素阙值T2为:
T2=a*E+b*P+c*Q;
其中,a、b、c是自由参数,E为窗口中像素值的平均值,P为窗口中像素值之间的差平方,Q为窗口中像素值之间的均方根值。
通过对该窗口的局部特征:窗口中像素值的平均值E,窗口中像素值之间的差平方P,窗口中像素值之间的均方根值Q,设定一个参数方程进行阈值的计算,例如:T2=a*E+b*P+c*Q,这样得出来的二值化画素就更能表现出图像中的细节。
进一步地,二值化处理后的画素,逻辑计算量测位置,以几何重心为例说明,二值化画素计算对位位置具体为:
根据二值化画素的形状确定其几何重心位置,以几何重心位置作为该二值化画素的对位位置。
例如,在三角形中,几何重心位置为两条中线的交点;四边形中,几何重心位置为由一条对角线划分的两个三角心的重心的连线与一条中线的交点;平行四边形中,几何重心位置为两条对角线的交点。
应当理解的是,本发明中以的色阻R、G、B三个子色阻进行说明,当然,色阻也可以包括其他色阻,如黑色子色阻B等,此处不再一一举例进行说明。
在本发明的一具体实施例中,基于色阻颜色(Pixel Color)的对位方法,该包括以下步骤:
参图3a所示,获取各子色阻R、G、B在光源下的光阻特征值,根据色阻R的光阻特征值设定画素阙值T1为180。
根据画素阙值T1对如图3b所示的画素进行二值化处理,得到如图3c所示二值化画素。
本实施例中采用全局固定二值化处理,按照画素阙值T1将整个画素上的各个像素点的灰度值设置为0或255;若像素点的像素值大于画素阙值T1则将该像素点的像素值设置为255,否则将该像素点的像素值设置为0。
最后根据全局固定二值化处理后的二值化画素计算对位位置,根据对位位置进行色阻的对位。
当然,在其他实施例中二值化处理也可以为局部自适应二值化处理,此处不再举例进行详细说明。
本发明实施例还提供一种电子设备。所述电子设备包括至少一个处理器和与所述至少一个处理器连接的存储器,所述存储器用于存储可被所述至少一个处理器执行的指令,所述指令被所述至少一个处理器执行时,使所述至少一个处理器执行上述实施例中的对位方法。
本发明实施例还提供了一种非暂态存储介质,存储有计算机可执行指令,所述计算机可执行指令设置为执行上述的对位方法。
本发明实施例还提供了一种计算机程序产品,所述计算机程序产品包括存储在非暂态计算机可读存储介质上的计算机程序,所述计算机程序包括程序指令,当所述程序指令被计算机执行时,使所述计算机执行上述的对位方法。
本发明实施例提供的对位系统可执行本发明任意实施例所提供的对位方法,具备执行方法相应的功能模块和有益效果。未在上述实施例中详尽描述的技术细节,可参见本发明任意实施例所提供的对位方法。
由以上实施方式可以看出,本发明具有以下有益效果:
可有效避免COA产品金属线和图形形貌的干扰,提升COA产品量测稳定性;
可应对多种形态像素对位,测量位置计算逻辑可编辑,像素不规则时,可选用合理逻辑定义测量位置;
二值化处理,可突显色阻特征,颜色识别准确性高。
本发明的色阻颜色(Pixel Color)对位方法及对位系统,不仅限于MCPD(色度机)对于,可推广至其他领域、其他设备,提高定位的准确性。
对于本领域技术人员而言,显然本发明不限于上述示范性实施例的细节,而且在不背离本发明的精神或基本特征的情况下,能够以其他的具体形式实现本发明。因此,无论从哪一点来看,均应将实施例看作是示范性的,而且是非限制性的,本发明的范围由所附权利要求而不是上述说明限定,因此旨在将落在权利要求的等同要件的含义和范围内的所有变化囊括在本发明内。不应将权利要求中的任何附图标记视为限制所涉及的权利要求。
此外,应当理解,虽然本说明书按照实施方式加以描述,但并非每个实施方式仅包含一个独立的技术方案,说明书的这种叙述方式仅仅是为清楚起见,本领域技术人员应当将说明书作为一个整体,各实施例中的技术方案也可以经适当组合,形成本领域技术人员可以理解的其他实施方式。
Claims (6)
1.一种基于色阻颜色的对位方法,其特征在于,所述方法包括:
S1、获取各子色阻在光源下的光阻特征值,根据光阻特征值设定画素阙值;
S2、根据画素阙值对画素进行二值化处理,得到二值化画素;
其中,所述二值化处理为:全局固定二值化处理或局部自适应二值化处理;
其中,所述局部自适应二值化处理具体为:
根据像素点所在窗口的像素局部特征计算该像素点对应的画素阙值T2;
若该像素点的像素值大于画素阙值T2则将该像素点的像素值设置为255,否则将该像素点的像素值设置为0;
其中,所述局部自适应二值化中画素阙值T2为:
T2=a*E+b*P+c*Q;
其中,a、b、c是自由参数,E为窗口中像素值的平均值,P为窗口中像素值之间的差平方,Q为窗口中像素值之间的均方根值;
S3、根据二值化画素计算对位位置,根据对位位置进行色阻的对位。
2.根据权利要求1所述的基于色阻颜色的对位方法,其特征在于,所述全局固定二值化处理具体为:
按照画素阙值T1将整个画素上的各个像素点的灰度值设置为0或255;
若像素点的像素值大于画素阙值T1则将该像素点的像素值设置为255,否则将该像素点的像素值设置为0。
3.根据权利要求1所述的基于色阻颜色的对位方法,其特征在于,所述步骤S3中二值化画素计算对位位置具体为:
根据二值化画素的形状确定其几何重心位置,以几何重心位置作为该二值化画素的对位位置。
4.根据权利要求1所述的基于色阻颜色的对位方法,其特征在于,所述色阻包括红色子色阻、绿色子色阻、蓝色子色阻。
5.根据权利要求1所述的基于色阻颜色的对位方法,其特征在于,所述画素阙值根据红色子色阻的光阻特征值进行设定。
6.一种基于色阻颜色的对位系统,其特征在于,所述系统包括:
阙值设定单元,获取各子色阻在光源下的光阻特征值,根据光阻特征值设定画素阙值;
画素处理单元,用于根据画素阙值对画素进行二值化处理,得到二值化画素;所述画素处理单元还用于根据画素阙值对画素进行全局固定二值化处理或局部自适应二值化处理,得到二值化画素;
其中,当所述画素处理单元进行所述局部自适应二值化处理时,所述画素处理单元用于根据像素点所在窗口的像素局部特征计算该像素点对应的画素阙值T2;
若该像素点的像素值大于画素阙值T2则将该像素点的像素值设置为255,否则将该像素点的像素值设置为0;
其中,所述局部自适应二值化中画素阙值T2为:
T2=a*E+b*P+c*Q;
其中,a、b、c是自由参数,E为窗口中像素值的平均值,P为窗口中像素值之间的差平方,Q为窗口中像素值之间的均方根值;
定位单元,用于根据二值化画素计算对位位置,根据对位位置进行色阻的对位。
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