CN108509197A - A kind of testing requirement view generation method and ATE test methods - Google Patents

A kind of testing requirement view generation method and ATE test methods Download PDF

Info

Publication number
CN108509197A
CN108509197A CN201810195379.4A CN201810195379A CN108509197A CN 108509197 A CN108509197 A CN 108509197A CN 201810195379 A CN201810195379 A CN 201810195379A CN 108509197 A CN108509197 A CN 108509197A
Authority
CN
China
Prior art keywords
view
test
template
testing
view template
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201810195379.4A
Other languages
Chinese (zh)
Other versions
CN108509197B (en
Inventor
吴际
孟翰
崔明宝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Tianchuang Kai Rui Technology Co Ltd
Beihang University
Original Assignee
Beijing Tianchuang Kai Rui Technology Co Ltd
Beihang University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Tianchuang Kai Rui Technology Co Ltd, Beihang University filed Critical Beijing Tianchuang Kai Rui Technology Co Ltd
Priority to CN201810195379.4A priority Critical patent/CN108509197B/en
Publication of CN108509197A publication Critical patent/CN108509197A/en
Application granted granted Critical
Publication of CN108509197B publication Critical patent/CN108509197B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00Arrangements for software engineering
    • G06F8/30Creation or generation of source code
    • G06F8/38Creation or generation of source code for implementing user interfaces
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00Arrangements for program control, e.g. control units
    • G06F9/06Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44Arrangements for executing specific programs
    • G06F9/451Execution arrangements for user interfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)

Abstract

The present invention relates to a kind of testing requirement view generation method and ATE test methods, belong to ATE technical field of measurement and test, solve the problems, such as personnel are more in ATE development processes in the prior art, domain knowledge it is complicated it is tediously long caused by test information is inconsistent, imperfect, description mistake.It specifically includes:Build test signal view template, test equipment view template, equipment under test view template;Binding test signal view template, test equipment view template, equipment under test view template build testing process view template;By Eclipse combination Snail GUI, described four are visualized, the visualization view of each view is obtained;According to testing requirement, the occurrence of each views module relevant field attribute is obtained, by occurrence addition in corresponding visualization view, generates testing requirement view.Information is tested convenient for users to intuitivism apprehension, improves testing efficiency.

Description

A kind of testing requirement view generation method and ATE test methods
Technical field
The present invention relates to ATE technical field of measurement and test more particularly to a kind of testing requirement view generation method and the test sides ATE Method.
Background technology
With the development of science and technology, the design of various types of hardware equipment becomes increasingly complex, and function is stronger and stronger.Therefore, Generalization, standardization, the miniaturization of test equipment or platform, it has also become the development trend of testing field.
ATE is the english abbreviation of automated test device (Automatic Test Equipment).ATE is mainly used for firmly The signal testing (such as voltage, electric current, resistance) of part equipment.Since equipment under test type is various, it then follows standard criterion it is different, Even similar equipment under test, there is also the differences between different manufacturers and different model.Therefore, most of ATE is to use In the special equipment for testing a certain model or certain several model equipment under test in specific area.
Currently, a kind of effective, specification test method can be to the multiclass hardware involved in the fields ATE not yet It is tested.A usual ATE equipment manufacturing cost is high, and the exploitation of ATE equipment be related to it is multiple including test side, tested side Software and hardware engineer and user, these personnel cause often to go out in development process for the unified understanding of test poor information Now testing requirement illustrates to describe phenomena such as inconsistent, imperfect, description is wrong, seriously reduces testing efficiency.
Invention content
In view of above-mentioned analysis, the present invention is intended to provide a kind of testing requirement view generation method and ATE test methods, are used With solve personnel are more in current ATE development processes, domain knowledge it is complicated it is tediously long caused by test information it is inconsistent, it is imperfect, The problem of mistake is described.
The purpose of the present invention is mainly achieved through the following technical solutions:
On the one hand, a kind of testing requirement view generation method is provided, is specifically included:
Build test signal view template, test equipment view template, equipment under test view template;
Binding test signal view template, test equipment view template, equipment under test view template, structure testing process regard Artwork plate;
By Eclipse combination Snail GUI, by the test signal view template, test equipment view template, it is tested Device view template and testing process view template are visualized, and the visualization view of each view is obtained;
According to testing requirement, the occurrence of each views module relevant field attribute is obtained, the occurrence is added in phase In the visualization view answered, testing requirement view is generated.
Beneficial effects of the present invention are as follows:Compared with prior art, testing requirement view generation side provided in this embodiment Test signal, test equipment, equipment under test, testing process are built view template by method respectively, can make test related personnel couple Test information formed unified understanding, fully considered the test process of ATE, by each view visualize convenient for users to Intuitively, compactly understand, integration testing information, improve test development efficiency, solve personnel in current ATE development processes More, domain knowledge it is complicated it is tediously long caused by inconsistent, imperfect, the error-prone problem of test information.
On the basis of said program, the present invention has also done following improvement:
Further, the visual presentation that view is completed by Eclipse combination Snail GUI, specifically includes:
Pligin.xml files are created under the engineering catalogue of Eclipse, according to four view templates and Target location and form shown in Eclipse select corresponding extension point under pligin.xml files;
Call the programming interface of Snail GUI, the New View template class file under the engineering catalogue, in New View View template code is write under template class file;
It is established in view template class file by the mapping mechanism of Eclipse and is extended a little in code and pligin.xml files Mapping relations, then code is packaged, is issued, Eclipse is restarted, completes the visual presentation of view.
Advantageous effect using above-mentioned further scheme is:By Eclipse combination Snail GUI, can efficiently complete The visual presentation of view, modular code portable ability is strong, is answered after facilitating tester that will test code revision later For new test environment.
Further, the programming interface of Snail GUI is called, New View template class file includes under the engineering catalogue Following steps:
1) in New View template class file, the SnailLMFEditorBase modules in snail GUI, load are utilized And initialize the background color in view, font information;
2) three control classes, respectively TextCell, Label and Row and then in New View template class file are established:
Text information input by user is preserved using the TextCell classes;
Attribute, the field information in view are limited using the Label classes;
The object of TextCell classes is stored using the Row classes, while capturing mouse event.
Advantageous effect using above-mentioned further scheme is:By to New View template class file in snail GUI Further setting, information included in specification snail GUI, is effectively ensured the consistency of each view.
Further, the test signal view template includes signal type, unit, value type, test mode field.
Advantageous effect using above-mentioned further scheme is:Can in detail, test signal accurately described, ensure test letter Breath ground integrality.
Further, the test equipment view template include pin mark, signal type, function, numberical range, precision, Amount field.
Advantageous effect using above-mentioned further scheme is:Test equipment view can in detail, be accurately described, ensures to survey With trying information integrality.
Further, the equipment under test view template includes pin mark, sense, remarks title, signal type, phase Prestige value can receive maximum value, can receive minimum value field.
Advantageous effect using above-mentioned further scheme is:Equipment under test view can in detail, be accurately described, ensures to survey With trying information integrality.
Further, the testing process view template includes essential attribute and main test stream field.
Advantageous effect using above-mentioned further scheme is:For testing requirement, testing process view template is devised Content, essential attribute can determine that the essential information of testing process view template, test flow table show specific testing process.
Further, after the main test stream is for the testing procedure and testing process in the case of describing use-case successful execution Condition is set, each testing procedure includes the relevant information of test signal view, test equipment view, equipment under test view.
Advantageous effect using above-mentioned further scheme is:It is the most crucial part of testing requirement to test stream, is flowed in test When journey successful execution, it is sequentially completed testing procedure.
Further, the testing process view template further includes fc-specific test FC affluent-dividing and global test affluent-dividing;It is described Fc-specific test FC affluent-dividing is the affluent-dividing that some particular step generates from other streams;The global test affluent-dividing refers to from main survey All steps can generate the affluent-dividing of branch in examination stream.
Advantageous effect using above-mentioned further scheme is:It is abnormal since there are branch, mistakes etc. in actual test flow Phenomenon, so testing process view template can also include fc-specific test FC affluent-dividing and global test affluent-dividing, it is different for describing Branch's situation when often occurring.
On the other hand, a kind of ATE test methods are provided, using the testing requirement view generation method described in one of above-mentioned Testing requirement is generated, is tested using the testing requirement generated:The test equipment is by designated pin to equipment under test Test signal is sent, while receiving the feedback signal of equipment under test, shows equipment under test state, and analyze, judge equipment under test State whether meet code requirement.
It in the present invention, can also be combined with each other between above-mentioned each technical solution, to realize more preferred assembled schemes.This Other feature and advantage of invention will illustrate in the following description, also, certain advantages can become from specification it is aobvious and It is clear to, or understand through the implementation of the invention.The purpose of the present invention and other advantages can by specification, claims with And it realizes and obtains in specifically noted content in attached drawing.
Description of the drawings
Attached drawing is only used for showing the purpose of specific embodiment, and is not considered as limitation of the present invention, in entire attached drawing In, identical reference mark indicates identical component.
Fig. 1 is testing requirement view generation method schematic diagram;
Fig. 2 is exploitation exemplary plots of the Snail GUI on Eclipse;
Fig. 3 is test signal view interface exemplary plot;
Fig. 4 is testing process view interface exemplary plot.
Specific implementation mode
Specifically describing the preferred embodiment of the present invention below in conjunction with the accompanying drawings, wherein attached drawing constitutes the application part, and It is used to illustrate the principle of the present invention together with embodiments of the present invention, be not intended to limit the scope of the present invention.
The specific embodiment of the present invention discloses a kind of testing requirement view generation method, the life of testing requirement view It is as shown in Figure 1 at method schematic diagram.
When implementation, specific works step is as follows:
Step S1, structure test signal view template, test equipment view template, equipment under test view template;
Step S2, binding test signal view template, test equipment view template, equipment under test view template, structure are surveyed Try flowchart illustrative template;
Step S3, by Eclipse combination Snail GUI, each view template visualize generation accordingly Visualization view;
Step S4, according to testing requirement, the occurrence of association attributes is added in corresponding visualization view, generates test Demand view.
Compared with prior art, testing requirement view generation method provided in this embodiment by test signal, test equipment, Equipment under test, testing process build view template respectively, and test related personnel can be made to form unified understanding to test information, filled Divide the test process for considering ATE, each view is visualized convenient for users to intuitive, compactly understanding, integration are surveyed Information is tried, test development efficiency is improved, solves in current ATE development processes that personnel are more, domain knowledge complexity is tediously long and lead Inconsistent, imperfect, the error-prone problem of the test information of cause.
In order in further detail, test signal is accurately described, test signal view template includes signal type, unit, number Value Types, test mode field.Specifically, signal type refers to the affiliated type of the signal, such as voltage, frequency;Unit refers to Be the signal unit, such as volt;Value type refers to the numeric type of the signal value, such as floating type;Test mode Referring to the signal in the fields ATE generally has single-ended measurement and double-end measurement, and the list item is for describing this type of information.Due to surveying Trial signal be connecting test equipment in test process, equipment under test bridge, meanwhile, test signal be also post analysis test knot The key factor of fruit, so, test signal view template includes signal type, unit, value type, test mode field, energy Enough in detail, test signal is accurately described, with ensureing test information integrality.
Similarly, in order in further detail, test equipment is accurately described, the test equipment view template includes pin mark Knowledge, signal type, function, numberical range, precision, quantity.Specifically, pin mark refers to the pin number of test, can be with English The form of word mother's addend group describes, such as pin B2;Signal type refers to the corresponding signal type of the pin;Function refers to The corresponding function of this group of pin;Numberical range refers to that equipment power of test allows the maximum magnitude measured;Precision refers to setting The standby precision measured;Quantity refers to that such function needs number of pins to be used.Since test equipment is in test process to quilt The device that measurement equipment sends test signal, receives equipment under test feedback signal, so test equipment view template includes pin mark Knowledge, signal type, function, numberical range, precision, quantity, can in detail, test equipment accurately described, while by with survey Identical signal type establishes relationship of the same test signal between different views in trial signal view template, and passes through signal Direction, which determines, sends or receives signal, ensures the case where test equipment can analyze equipment under test comprehensively, while ensureing to test The uniqueness of signal.
Similarly, in order in further detail, equipment under test is accurately described, the equipment under test view template includes pin mark Knowledge, remarks title, signal type, desired value, can receive maximum value, can receive minimum value sense.Specifically, pin mark The pin number for referring to equipment under test is known, usually in the form of English alphabet addend group, such as pin A12;Sense refers to It is added to the direction of the leg signal, that is, inputs or exports;Remarks title refers to the customized remark information of user;Signal Type refers to the corresponding signal type of the pin;Desired value refers to expected signal value;Maximum acceptable value refers to allowing Maximum signal level;Acceptable minimum value refers to the minimum signal value allowed.Since equipment under test is received in test process The test signal of test equipment transmission sends equipment of the feedback signal to test equipment, so equipment under test view template includes Pin mark, remarks title, signal type, desired value, can receive maximum value, can receive minimum value, Neng Gouxiang sense Carefully, equipment under test is accurately described, while by establishing same test with identical signal type in test signal view template Relationship of the signal between different views establishes same pin not by identical pin mark in test equipment view template With the relationship between view, and is determined by sense and send or receive signal.Ensure that equipment under test can be according to test The action of equipment forms consistent feedback, while ensureing the uniqueness of same test signal.
Since during actual test, the test equipment sends test signal by designated pin to equipment under test, The feedback signal of equipment under test is received simultaneously, shows equipment under test state, and whether the state for analyzing, judging equipment under test meets Code requirement.Test equipment is connected with equipment under test by pin, and sends or receive signal by pin.So above Three kinds of views are not to isolate, but there is the relationships of cross reference:Each pin of test equipment view corresponds to respectively A signal type in test signal view, each pin of equipment under test view also correspond in test signal view respectively One signal type.Therefore, during actual test, each testing procedure include test signal view, test equipment view, The relevant information of equipment under test view.
In view of actual test process is related to test signal, equipment under test, test equipment, and testing has timing special Point, it is therefore desirable to construct testing process view template, test signal, test equipment, equipment under test are connected, generate complete Testing requirement.The testing process view template includes essential attribute, main test stream.Wherein, essential attribute is for illustrating to survey The essential information of flow is tried, including:Test case name, description item, precondition, dependence;Specifically, test case famous-brand clock Show the title of the testing requirement use-case, is required item;Description item indicates the brief description of the testing requirement use-case, must be filled out to be non- ;Precondition indicates the precondition of the testing requirement use-case, is required item;Dependence indicates the testing requirement use-case Other use-case titles relied on are required item;Main test stream is for the step in the case of describing testing requirement use-case successful execution Rapid and testing process postcondition is required item.Including step and postcondition two parts;Wherein, step indicates main test Flow step, each testing procedure are executed, are not overlapped each other in order, each testing procedure include test signal view, test set The relevant information of standby view, equipment under test view, particular content are determined by testing requirement, are required item.Postcondition indicates master The postcondition of testing process is required item.
Since there are the abnormal phenomenon such as branch, mistake in actual test flow, so, testing process view template can be with Including fc-specific test FC affluent-dividing and global test affluent-dividing, for describing branch's situation when abnormal occur.
Fc-specific test FC affluent-dividing refers to the affluent-dividing that some particular step generates from other streams;Including triggering step, step Rapid and postcondition three parts, according to equipment under test testing requirement, if testing process view includes fc-specific test FC affluent-dividing, This three parts is required item.Wherein, triggering step indicates the testing procedure label of fc-specific test FC affluent-dividing reference;Step indicates special Location survey tries branch flow step, and each step is executed, do not overlapped each other in order, each testing procedure include test signal view, The relevant information of test equipment view, equipment under test view, particular content are determined by testing requirement.Need are tested according to equipment under test It asks, corresponding parametrization clause is added in each step.Postcondition indicates the postcondition of fc-specific test FC affluent-dividing.
Global test affluent-dividing refers to that all steps can generate the affluent-dividing of branch from main test stream;Including guarding item Part, step and postcondition three parts, according to equipment under test testing requirement, if testing process view includes global test branch Stream, then this three parts is required item.Wherein, it guards condition and indicates the condition that global branch is guarded;Step indicates global test point Branch flow step, each step are executed, are not overlapped each other in order, and each testing procedure includes test signal view, test equipment The relevant information of view, equipment under test view, particular content are determined by testing requirement.According to airborne equipment testing requirement, each Corresponding parametrization clause is added in a step.Postcondition indicates the postcondition of global test affluent-dividing.
One complete testing process corresponds to a testing process view, for describing required for completing a test function Overall Steps set.
Optionally, the testing process view template is as shown in table 1:
1 testing process view template of table
According to equipment under test testing requirement under the fields ATE, the specific testing procedure in testing process view template, simultaneously The other information in template is added, testing requirement is ultimately generated.Testing process view example is as shown in table 2:
2 testing process view example of table
Build test signal view template, test equipment view template, equipment under test view template, testing process view mould After plate, by Eclipse combination Snail GUI, the visual presentation of each view is completed.
Eclipse itself possesses abundant graphical interfaces class libraries, and has code development ability, therefore can realize code Exploitation, figure displaying are integrated, are highly convenient for debugging and develop.The advantage of Snail GUI is light weight portable, code It is small, and response speed is very fast, this makes very low for the performance requirement of equipment in actual ATE is applied.
Specifically, the visual presentation of view is completed by Eclipse combination Snail GUI, as shown in Fig. 2, include with Lower process:
Step S31:Pligin.xml files are created under the engineering catalogue of Eclipse, according to four view templates And target location and form shown in Eclipse, corresponding extension point is selected under pligin.xml files;
Step S32:The programming interface of calling Snail GUI, the New View template class file under the engineering catalogue, View template code is write under New View template class file.
Specifically, view template code is write under New View template class file to include the following steps:
1) the SnailLMFEditorBase modules in snail GUI are utilized, loads and initializes the background face in view Color, font information;
2) three control classes, respectively TextCell, Label and Row are established:
Text information input by user is preserved using the TextCell classes;
Attribute, the field information in view are limited using the Label classes;
The object of TextCell classes is stored using the Row classes, while capturing mouse event, such as when user keys in carriage return Line feed deletes word etc. when keying in backspace.
Step S33:Code and pligin.xml files in view template class file are established by the mapping mechanism of Eclipse Code, is then packaged, is issued, restart Eclipse, complete the visual presentation of view by the mapping relations of middle extension point.
The packing process is:The view template code write is chosen, export options are selected, then in drop-down menu Middle selection Plug-in Development --- Deployable plug-ins and framents generate executable jar Packaging file;
The issuing process is:The jar packaging files generated are placed under Eclipse installation directories It is issued in plugins files.
By Eclipse combination Snail GUI, the visual presentation of view can be efficiently completed, modular code can Transfer ability is strong, facilitates tester that will be applied to new test environment after later test code revision.
In step S4, according to testing requirement, the occurrence of each views module relevant field attribute is obtained, by the occurrence Addition generates testing requirement view in corresponding visualization view.The testing requirement view is succinct, clearly reflects survey Information is tried, multi-party personnel is facilitated to reach the consistent of information.
Test signal view interface example is as shown in Figure 3;Testing process view interface example is as shown in Figure 4.
The present invention provides a kind of testing requirement view generation methods, have fully considered the test process of ATE, pass through structure Test signal view template, test equipment view template, equipment under test view template, testing process view template, and tie respectively Corresponding Core attribute values are closed, the visualization exhibition of each view is completed by Snail GUI combination Eclipse plug-in extension modes Show, to specification test process, the unified understanding for facilitating the related personnel of test to form test information improves test development Efficiency, convenient for users to it is intuitive, compactly understand, integration testing information.Solve personnel in current ATE development processes it is more, neck Inconsistent, imperfect, the error-prone problem of test information caused by domain knowledge complexity is tediously long.
In another embodiment of the invention, the testing requirement view generated according to above-described embodiment, test equipment pass through Designated pin sends test signal to equipment under test, while receiving the feedback signal of equipment under test, shows equipment under test state, and Analysis judges whether the state of equipment under test meets code requirement, completes ATE tests.
The test method, improves testing efficiency, convenient for users to it is intuitive, compactly understand, integration testing information.It solves Personnel are more in current ATE development processes, domain knowledge it is complicated it is tediously long caused by test information it is inconsistent, it is imperfect, easily go out Wrong problem.
It will be understood by those skilled in the art that realizing all or part of flow of above-described embodiment method, meter can be passed through Calculation machine program is completed to instruct relevant hardware, and the program can be stored in computer readable storage medium.Wherein, institute It is disk, CD, read-only memory or random access memory etc. to state computer readable storage medium.
The foregoing is only a preferred embodiment of the present invention, but scope of protection of the present invention is not limited thereto, Any one skilled in the art in the technical scope disclosed by the present invention, the change or replacement that can be readily occurred in, It should be covered by the protection scope of the present invention.

Claims (10)

1. a kind of testing requirement view generation method, which is characterized in that
Build test signal view template, test equipment view template, equipment under test view template;
Binding test signal view template, test equipment view template, equipment under test view template build testing process view mould Plate;
By Eclipse combination Snail GUI, by the test signal view template, test equipment view template, equipment under test View template and testing process view template are visualized, and the visualization view of each view is obtained;
According to testing requirement, the occurrence of each views module relevant field attribute is obtained, the occurrence is added corresponding In visualization view, testing requirement view is generated.
2. testing requirement view generation method according to claim 1, which is characterized in that pass through Eclipse combinations Snail GUI completes the visual presentation of view, specifically includes:
Pligin.xml files are created under the engineering catalogue of Eclipse, according to four view templates and in Eclipse The target location of displaying and form select corresponding extension point under pligin.xml files;
Call the programming interface of Snail GUI, the New View template class file under the engineering catalogue, in New View template View template code is write under class file;
It is established in view template class file by the mapping mechanism of Eclipse and extends reflecting for point in code and pligin.xml files Relationship is penetrated, then code is packaged, is issued, Eclipse is restarted, completes the visual presentation of view.
3. testing requirement view generation method according to claim 2, which is characterized in that described to call Snail GUI's Programming interface, New View template class file includes the following steps under the engineering catalogue:
1) it in New View template class file, using the SnailLMFEditorBase modules in snail GUI, loads and first Background color, font information in beginningization view;
2) three control classes, respectively TextCell, Label and Row and then in New View template class file are established:
Text information input by user is preserved using the TextCell classes;
Attribute, the field information in view are limited using the Label classes;
The object of TextCell classes is stored using the Row classes, while capturing mouse event.
4. the testing requirement view generation method according to one of claim 1-3, which is characterized in that the test signal regards Artwork plate includes signal type, unit, value type, test mode field.
5. testing requirement view generation method according to claim 4, which is characterized in that the test equipment view template Including pin mark, signal type, function, numberical range, precision, amount field.
6. testing requirement view generation method according to claim 5, which is characterized in that the equipment under test view template Including pin mark, sense, remarks title, signal type, desired value, it can receive maximum value, receivable minimum value field.
7. testing requirement view generation method according to claim 1 or 6, which is characterized in that the testing process view Template includes essential attribute and main test stream field.
8. testing requirement view generation method according to claim 7, which is characterized in that the main test stream is for describing The postcondition of testing procedure and testing process in the case of use-case successful execution, each testing procedure include that test signal regards The relevant information of figure, test equipment view, equipment under test view.
9. testing requirement view generation method according to claim 8, which is characterized in that the testing process view template Further include fc-specific test FC affluent-dividing and global test affluent-dividing;The fc-specific test FC affluent-dividing is some specific step from other streams Suddenly the affluent-dividing generated;The global test affluent-dividing, which refers to all steps from main test stream, can generate the affluent-dividing of branch.
10. a kind of ATE test methods, it is characterised in that:Using the testing requirement view generation side described in one of claim 1-9 Method generates testing requirement, is tested using the testing requirement generated:The test equipment is set by designated pin to tested Preparation send test signal, while receiving the feedback signal of equipment under test, shows equipment under test state, and analyzes, judges tested set Whether standby state meets code requirement.
CN201810195379.4A 2018-03-09 2018-03-09 Test requirement view generation method and ATE (automatic test equipment) test method Active CN108509197B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810195379.4A CN108509197B (en) 2018-03-09 2018-03-09 Test requirement view generation method and ATE (automatic test equipment) test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810195379.4A CN108509197B (en) 2018-03-09 2018-03-09 Test requirement view generation method and ATE (automatic test equipment) test method

Publications (2)

Publication Number Publication Date
CN108509197A true CN108509197A (en) 2018-09-07
CN108509197B CN108509197B (en) 2020-08-21

Family

ID=63376367

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810195379.4A Active CN108509197B (en) 2018-03-09 2018-03-09 Test requirement view generation method and ATE (automatic test equipment) test method

Country Status (1)

Country Link
CN (1) CN108509197B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112925716A (en) * 2021-03-19 2021-06-08 广东好太太智能家居有限公司 Visual image testing method and device and storage medium

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101575011A (en) * 2009-05-05 2009-11-11 中国民航大学 Automatic test equipment of boeing series aircraft audio management unit and method thereof
CN104699613B (en) * 2015-03-26 2017-08-04 北京航空航天大学 A kind of spacecraft-testing demand automatic creation system and its method
CN105117334A (en) * 2015-08-25 2015-12-02 浪潮电子信息产业股份有限公司 XML based test demand description and realization method
CN106201538B (en) * 2016-07-18 2019-05-31 北京航空航天大学 A kind of browsing real-time data method based on RUCM
CN106776275B (en) * 2016-11-14 2019-06-18 北京航天自动控制研究所 A kind of testing process automatic generation method based on Packet Multiplexing

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112925716A (en) * 2021-03-19 2021-06-08 广东好太太智能家居有限公司 Visual image testing method and device and storage medium
CN112925716B (en) * 2021-03-19 2024-01-23 广东好太太智能家居有限公司 Visual image testing method, visual image testing equipment and storage medium

Also Published As

Publication number Publication date
CN108509197B (en) 2020-08-21

Similar Documents

Publication Publication Date Title
US9378324B2 (en) System and method of detecting design rule noncompliant subgraphs in circuit netlists
CN106557413A (en) Based on the method and apparatus that code coverage obtains test case
US6941546B2 (en) Method and apparatus for testing a software component using an abstraction matrix
US7480826B2 (en) Test executive with external process isolation for user code modules
US20040123272A1 (en) Method and system for analysis of software requirements
CN101996131A (en) Automatic test method and automatic test platform for graphic user interface (GUI) based on x extensive makeup language (XML) packaging key word
CN107562626A (en) A kind of method that encapsulation Selenium and Sikuli realizes Web automatic tests
US20090172476A1 (en) Test Executive System with Memory Leak Detection for User Code Modules
EP2169541A2 (en) Method, system and graphical user interface for configuring a simulator to simulate a plurality of devices
CN109858195A (en) The on-line simulation system of necessary position single-particle inversion failure on a kind of SRAM type FPGA
CN102023861A (en) Method and system for generating test script and test suite
US11144434B2 (en) Refining coverage analyses using context information
US7562274B2 (en) User data driven test control software application the requires no software maintenance
CN102567201A (en) Method for automatically recovering cross-model GUI (graphic user interface) test scripts
CN110321292A (en) Chip detecting method, device, electronic equipment and computer readable storage medium
CN109726830A (en) Equipment routing inspection method, apparatus, electronic equipment and storage medium
CN109918299A (en) A kind of method of comparison database architectural difference
CN108509197A (en) A kind of testing requirement view generation method and ATE test methods
US7451358B2 (en) Test executive system with automatic expression logging and parameter logging
CN103713995A (en) Latent defect identification
CN110286882B (en) Foreground system design and verification method based on model detection
CN108521350A (en) A kind of industrial gateway equipment automatization test method driving script based on XML
Usaola et al. Test case generation with regular expressions and combinatorial techniques
CN105487035B (en) The verification method and device of FPGA border scanning systems
Karnane et al. Automating root-cause analysis to reduce time to find bugs by up to 50%

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant