CN108415662A - Obtain the method and system of memory physics unclonable function - Google Patents
Obtain the method and system of memory physics unclonable function Download PDFInfo
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0602—Interfaces specially adapted for storage systems specifically adapted to achieve a particular effect
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- G09C1/00—Apparatus or methods whereby a given sequence of signs, e.g. an intelligible text, is transformed into an unintelligible sequence of signs by transposing the signs or groups of signs or by replacing them by others according to a predetermined system
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0628—Interfaces specially adapted for storage systems making use of a particular technique
- G06F3/0638—Organizing or formatting or addressing of data
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0668—Interfaces specially adapted for storage systems adopting a particular infrastructure
- G06F3/0671—In-line storage system
- G06F3/0673—Single storage device
- G06F3/0679—Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP]
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- H—ELECTRICITY
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- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L9/00—Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols
- H04L9/08—Key distribution or management, e.g. generation, sharing or updating, of cryptographic keys or passwords
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Abstract
The present invention provides a kind of method and system obtaining memory physics unclonable function, the method includes：Memory is powered under various environmental parameters, and counts initial logic value of each storage unit of the memory under the various environmental parameters；The statistical characteristics of each storage unit is determined based on the result of the statistics；And element address based on each storage unit and its statistical characteristics generate the physics unclonable function characteristic value sequence of the memory.The method and system provided by the present invention for obtaining memory physics unclonable function will constitute component part of the whole addressing spaces of the memory of PUF as constitutive characteristic value, the PUF characteristic values of final output have statistical significance, more accurate PUF characteristic values, the risk being cracked when can also reduce for encrypting can not only be generated.
Description
Technical field
The present invention relates to technical field of integrated circuits, in particular to a kind of acquisition memory physics unclonable function
(PUF) method and system.
Background technology
Memory physics unclonable function (PUF) technology is ripe day by day in field of information encryption.For example, using it is static with
The cipher key system application platform that machine accesses memory physics unclonable function (SRAM PUF) composition is extensive, good compatibility.It is high
The SRAM PUF of reliability are very crucial for efficient encipherment scheme.
The existing technology about SRAM PUF is using special control unit the storage stablized in the SRAM for constituting PUF
Unit (cell) screens, their address is as the characteristic value for stablizing 0cell or stable 1cell.So-called stabilization
Cell refers to when traversing the combination situations of all voltage-temperatures in different voltage and temperature range, and cell's powers on initial value
All it is numerical value 0 or 1 that is stable, repeating.
However, there are drawbacks for such method：That is, if the system deviation of SRAM is very consistent, the main of cell values is determined
Factor is noise, then being possible to screening does not come out above-mentioned so-called " stabilization " cell, to make this method fail.This
Outside, due to only screening stable cell, the number of bits of the PUF characteristic values ultimately generated is less so that PUF characteristic values are used
The risk being cracked when encryption is very high.
Invention content
In view of the deficiencies of the prior art, on the one hand, the present invention, which provides, a kind of obtaining memory physics unclonable function
Method, the method includes：Memory is powered under various environmental parameters, and counts each storage of the memory
Initial logic value of the unit under the various environmental parameters；Each storage unit is determined based on the result of the statistics
Statistical characteristics；And element address based on each storage unit and its statistical characteristics generate the object of the memory
Manage unclonable function characteristic value sequence.
In one embodiment of the invention, the result based on the statistics determines the system of each storage unit
Counting characteristic value includes：When initial logic value of the storage unit under the various environmental parameters is " 0 ", the storage unit
Statistical characteristics is " 0 "；When initial logic value of the storage unit under the various environmental parameters is " 1 ", the storage list
The statistical characteristics of member is " 1 "；When initial logic value of the storage unit under the various environmental parameters include " 0 " and " 1 " and
When being more than or equal to predetermined threshold for the probability of " 0 ", the statistical characteristics of the storage unit is " F ", wherein " F " indicates the storage list
Member is the storage unit that " 0 " is biased to；When initial logic value of the storage unit under the various environmental parameters include " 0 " and " 1 ",
And when being more than or equal to the predetermined threshold for the probability of " 1 ", the statistical characteristics of the storage unit is " T ", wherein " T " indicates to be somebody's turn to do
Storage unit is the storage unit that " 1 " is biased to；And the initial logic value when storage unit under the various environmental parameters
When situation is not belonging to any one of above-mentioned four kinds of situations, the statistical characteristics of the storage unit is " X ", wherein " X " indicates to be somebody's turn to do
Storage unit is " 0/1 " random storage unit.
In one embodiment of the invention, the element address and its statistical nature based on each storage unit
The physics unclonable function characteristic value sequence that value generates the memory includes：By the system of each storage unit of the memory
Characteristic value addition is counted after corresponding access unit address value to constitute the characteristic value sequence of each storage unit；And according to
Each access unit address sequence is arranged and is combined to the characteristic value sequence of each storage unit, using as described
The physics unclonable function characteristic value sequence of memory.
In one embodiment of the invention, the various environmental parameters include time of multiple voltage values and multiple temperature values
Go through combination.
In one embodiment of the invention, the memory is static RAM.
On the other hand, the present invention also provides a kind of system obtaining memory physics unclonable function, the system packets
It includes：The system comprises control unit, environmental parameters to adjust unit, memory and computing unit, wherein：Described control unit
Unit is adjusted with the environmental parameter to connect, and the various environmental parameters of unit generation are adjusted for controlling the environmental parameter；It is described
Environmental parameter adjusts unit and is connect with the memory, for exporting the various environmental parameters to the memory；The control
Unit processed is connect with the memory, is powered under the various environmental parameters for controlling the memory；And institute
It states computing unit to connect with the memory, for counting each storage unit of the memory in the various environmental parameters
Under initial logic value, the statistical characteristics of each storage unit determined and based on described based on the result of the statistics
The element address of each storage unit and its statistical characteristics generate the physics unclonable function characteristic value sequence of the memory
Row.
In one embodiment of the invention, it includes that voltage regulator and temperature are adjusted that the environmental parameter, which adjusts unit,
Device.
In one embodiment of the invention, the voltage regulator includes selection voltage output unit and multiple partial pressures electricity
Resistance, operating voltage are connected to ground, control of the selection voltage output unit in described control unit by the divider resistance
It is lower that different voltage is exported to the memory.
In one embodiment of the invention, the thermoregulator includes counter, and the counter is in the control
" 0 " and " 1 " is written to the memory cycle under the control of unit, to adjust the temperature of the memory.
In one embodiment of the invention, the memory is static RAM.
The method and system provided by the present invention for obtaining memory physics unclonable function will constitute the memory of PUF
Component part of whole addressing spaces as constitutive characteristic value, the PUF characteristic values of final output have statistical significance, not only
More accurate PUF characteristic values, the risk being cracked when can also reduce for encrypting can be generated.
Description of the drawings
The following drawings of the present invention is used to understand the present invention in this as the part of the present invention.Shown in the drawings of this hair
Bright embodiment and its description, principle used to explain the present invention.
In attached drawing：
Fig. 1 shows the schematic flow of the method according to the ... of the embodiment of the present invention for obtaining memory physics unclonable function
Figure；
Fig. 2A to Fig. 2 C respectively illustrate some storage units included by memory and are initially patrolled when repetition powers on 100 times
Collect the statistical distribution schematic diagram that value is the number of " 1 "；And
Fig. 3 shows the schematic structure of the system according to the ... of the embodiment of the present invention for obtaining memory physics unclonable function
Figure.
Specific implementation mode
In the following description, a large amount of concrete details are given in order to provide more thorough understanding of the invention.So
And it is obvious to the skilled person that the present invention may not need one or more of these details and be able to
Implement.In other examples, in order to avoid with the present invention obscure, for some technical characteristics well known in the art not into
Row description.
It should be understood that the present invention can be implemented in different forms, and should not be construed as being limited to propose here
Embodiment.Disclosure will be made thoroughly and complete on the contrary, providing these embodiments, and will fully convey the scope of the invention to
Those skilled in the art.
The purpose of term as used herein is only that description specific embodiment and not as the limitation of the present invention.Make herein
Used time, " one " of singulative, "one" and " described/should " be also intended to include plural form, unless context is expressly noted that separately
Outer mode.It is also to be understood that term " composition " and/or " comprising ", when being used in this specification, determines the feature, whole
The presence of number, step, operations, elements, and/or components, but be not excluded for one or more other features, integer, step, operation,
The presence or addition of component, assembly unit and/or group.Herein in use, term "and/or" includes any of related Listed Items and institute
There is combination.
In order to thoroughly understand the present invention, detailed step and detailed structure will be proposed in following description, so as to
Illustrate technical solution proposed by the present invention.Presently preferred embodiments of the present invention is described in detail as follows, however in addition to these detailed descriptions
Outside, the present invention can also have other embodiment.
The unclonable letter of acquisition memory physics provided by the present invention is described with reference to a specific example below in conjunction with the accompanying drawings
Several method and systems.Using relatively broad, what is be described more fully below implements technology based on SRAM PUF according to the present invention
The memory that the method and system of the acquisition memory physics unclonable function of example is previously mentioned can be SRAM, naturally it is also possible to
For other any suitable memories.
Fig. 1 shows the schematic of the method 100 according to the ... of the embodiment of the present invention for obtaining memory physics unclonable function
Flow chart.As shown in Figure 1, the method 100 for obtaining memory physics unclonable function includes the following steps：
In step S110, each of memory is powered under various environmental parameters, and counts the memory and deposited
Initial logic value of the storage unit under the various environmental parameters.
In one embodiment, various environmental parameters may include that multiple voltage values are combined with the traversal of multiple temperature values.
Under voltage-temperature combination, memory is powered on, and count each storage unit of the memory in the various environment
Initial logic value under parameter.
Based on step S110, the system of initial logic value of each storage unit under various environmental parameters included by memory
It is as shown in table 1 below to count the results list.
Table 1
In table 1, memory is shown as including storage unit A, storage unit B, storage unit C, storage unit D and depositing
Memory is shown as including this five storage units, actually by storage unit E only for convenience of description and illustratively here
Memory may include any number of storage unit, and the present invention is not limited this.Traversing all environmental parameter (i.e. institutes
The combination of some voltage-temperature parameters) when, the combination repeated several times that can be directed to each voltage-temperature power on memory.
It is simple in order to describe, the experiment three times of three combined spots for voltage-temperature is illustrated only in table 1, experiment is 100 every time
It is secondary, such experiment should be also repeated under remaining environmental parameter, until having traversed all environmental parameter combinations.
As shown in table 1, by statistics：Under different environmental parameters, the initial logic value of storage unit A is always " 0 "；
The initial logic value of storage unit B is always " 1 "；The initial logic value of storage unit C includes " 0 " and " 1 ", and is the general of " 0 "
Rate is significantly higher；The initial logic value of storage unit D includes " 0 " and " 1 ", and significantly higher for the probability of " 1 "；Storage unit E
Initial logic value include " 0 " and " 1 ", and be " 0 " and be " 1 " probability it is suitable.
Based on table 1, under different environmental parameters, the initial logic value of storage unit A is always " 0 ", therefore can will be deposited
Storage unit A is known as the storage unit that " 0 " stablizes；Similarly, under different environmental parameters, the initial logic value of storage unit B
It is always " 1 ", therefore storage unit B can be known as the storage unit that " 1 " stablizes.
For storage unit C, storage unit D and storage unit E, them can be drawn based on the above process several times
When single test powers on and (repeats to power on 100 times), initial logic value is the statistical distribution of the number of " 1 ", such as Fig. 2A to Fig. 2 C
It is shown respectively.
As shown in Figure 2 A, abscissa is that initial logic value is the time intervals of " 1 " after the power is turned on for 100 repetitions, such as is for 4 times
The test result of " 1 " (i.e. 96 times be " 0 ") occurs 21 times, from statistical distribution as can be seen that storage unit C have it is smaller general
Rate (be less than 20%) obtain powering on be " 1 " statistical result, you can storage unit C is known as the storage unit that " 0 " is biased to.
As shown in Figure 2 B, abscissa be 100 repetitions after the power is turned on initial logic value be " 1 " time intervals, such as 92 times
Test result for " 1 " (i.e. 8 times are " 0 ") occurs 16 times, from statistical distribution as can be seen that storage unit D is with larger
Probability (be more than 80%) obtain powering on be " 1 " statistical result, you can storage unit D is known as the storage unit that " 1 " is biased to.
As shown in Figure 2 C, abscissa be 100 repetitions after the power is turned on initial logic value be " 1 " time intervals, be " 0 " and
The number of " 1 " matches each other in strength (all relatively close to 50 times), without being obviously biased to " 1 " or being biased to " 0 ", you can claim storage unit E
For the storage unit that " 0/1 " is random.
Based on above-mentioned statistic processes, following step is can proceed with, now turns to Fig. 1 continuing on follow-up step.
In step S120, the statistical characteristics of each storage unit is determined based on the result of the statistics.
Based on the statistical result in step S110, it may be determined that the statistical characteristics of each storage unit.Each storage unit
Statistical characteristics can be understood as the initial logic value in the statistical significance when storage unit powers on.Why to determine and deposit
The statistical characteristics of storage unit is because under different environmental parameters, and the initial logic value of not each storage unit can
It is fixation/stabilization " 0 " or " 1 ", and is possible to include " 0 " and " 1 " simultaneously, and the appearance of " 0 " and " 1 " has certain statistics
The regularity of distribution, or it is relatively random, as shown in Table 1.Therefore, in the statistical significance that determine each storage unit
Characteristic value, to prepare for the subsequent characteristic value sequence for generating whole memory.
In one embodiment, step S120 may further include：
When initial logic value of the storage unit under the various environmental parameters is " 0 ", the statistics of the storage unit
Characteristic value is " 0 ", i.e., the storage unit is the storage unit that " 0 " stablizes；
When initial logic value of the storage unit under the various environmental parameters is " 1 ", the statistics of the storage unit
Characteristic value is " 1 ", i.e., the storage unit is the storage unit that " 1 " stablizes；
When probability of initial logic value of the storage unit under the various environmental parameters including " 0 " and " 1 " and for " 0 "
It, should when more than or equal to predetermined threshold (predetermined threshold can be set as desired, such as be set as 75%, 80% etc.)
The statistical characteristics of storage unit is " F ", wherein " F " indicates that the storage unit is the storage unit that " 0 " is biased to；
When probability of initial logic value of the storage unit under the various environmental parameters including " 0 " and " 1 " and for " 1 "
When more than or equal to the predetermined threshold, the statistical characteristics of the storage unit is " T ", wherein " T " indicates that the storage unit is " 1 "
The storage unit of deviation；
It is not belonging in above-mentioned four kinds of situations when the case where initial logic value of the storage unit under the various environmental parameters
It is any when, the statistical characteristics of the storage unit is " X ", wherein " X " indicates that the storage unit is " 0/1 " random storage
Unit.
Wherein, statistical characteristics " F ", " T ", " X " are considered as a kind of mark, as previously mentioned, mark " F " can be with table
Show that the storage unit that " 0 " is biased to, initial logic value majority of the representative memory cell under various environmental parameters are " 0 "；It identifies " T "
It can indicate that the storage unit that " 1 " is biased to, initial logic value majority of the representative memory cell under various environmental parameters are " 1 "；
Mark can the random storage unit of " X " expression " 0/1 ", initial logic value of the representative memory cell under various environmental parameters be
Random " 0 " and " 1 ".Similarly, statistical characteristics " 0 " and " 1 " can also see mark as, wherein mark " 0 " expression " 0 "
Stable storage unit, initial logic value of the representative memory cell under various environmental parameters are stable " 0 "；It identifies " 1 "
Indicate that storage unit that " 1 " stablizes, initial logic value of the representative memory cell under various environmental parameters are stable " 1 ".
Therefore, above-mentioned statistical characteristics can be regarded as determining the type of storage unit.
Based on the characteristic value of above-mentioned each storage unit, the physics of the memory including these storage units can be generated not
Function feature value sequence can be cloned.
In step S130, element address and its statistical characteristics based on each storage unit generate the memory
Physics unclonable function characteristic value sequence.
Different from the storage unit for filtering out stable in existing method, method provided by the present invention is by the whole of memory
Component part of the addressing space all as constitutive characteristic value.That is, each access unit address is special address, each feature
The characteristic value of address is the statistical characteristics of the storage unit corresponding to this feature address.Based on each special address and corresponding
Statistical characteristics can generate the physics unclonable function characteristic value sequence of the memory including these storage units.
Specifically, in one embodiment, step S130 may further include：By each storage unit of the memory
Statistical characteristics add after corresponding access unit address value to constitute the characteristic value sequence of each storage unit；And
The characteristic value sequence of each storage unit is arranged and is combined according to each access unit address sequence, using as
The physics unclonable function characteristic value sequence of the memory.
For example, with reference to following table 2, each access unit address of memory is illustratively enumerated (in table 2
A indicates address, subsequent 000~111 expression address value) and the memory that obtains of the above method according to the invention respectively store
The type of unit：
Table 2
| A=000 | A=001 | A=010 | A=011 | A=100 | A=101 | A=110 | A=111 |
| 0 stablizes | 0 is few | 0 stablizes | 0 is random | More than 0 | |||
| 1 stablizes | More than 1 | 1 stablizes | 1 is random | 1 is few | 1 stablizes |
As shown in Table 2, the storage unit of address A=000 is the storage unit that " 0 " stablizes, i.e. its statistical characteristics is
Statistical characteristics addition is obtained the characteristic value sequence of the storage unit by " 0 " after the access unit address value
“0000”；The storage unit of address A=001 is the storage unit that " 1 " stablizes, i.e., its statistical characteristics is " 1 ", by statistics spy
Value indicative addition obtains the characteristic value sequence " 0011 " of the storage unit after the access unit address value；Address A=010
Storage unit be " 1 " be biased to storage unit, i.e., its statistical characteristics be " T ", by the statistical characteristics add in the storage
The characteristic value sequence " 010T " of the storage unit is obtained after the address value of unit；The storage unit of address A=011 is " 1 "
Stable storage unit, i.e. its statistical characteristics are " 1 ", by statistical characteristics addition after the access unit address value
Obtain the characteristic value sequence " 0111 " of the storage unit；The storage unit of address A=100 is the storage unit that " 0 " stablizes, i.e.,
Its statistical characteristics is " 0 ", and statistical characteristics addition is obtained the storage unit after the access unit address value
Characteristic value sequence " 1000 "；The storage unit of address A=101 is " 0/1 " random storage unit, i.e. its statistical characteristics is
Statistical characteristics addition is obtained the characteristic value sequence of the storage unit by " X " after the access unit address value
“101X”；The storage unit of address A=110 is the storage unit that " 0 " is biased to, i.e., its statistical characteristics is " F ", by statistics spy
Value indicative addition obtains the characteristic value sequence " 110F " of the storage unit after the access unit address value；Address A=111
Storage unit be " 1 " stablize storage unit, i.e., its statistical characteristics be " 1 ", by the statistical characteristics add in the storage
The characteristic value sequence " 1111 " of the storage unit is obtained after the address value of unit.
Therefore, for include the storage unit with the address shown by table 2 memory, by above-mentioned each storage unit
Characteristic value sequence arranged and then combined to get to the memory according to the sequence of each access unit address value
Physics unclonable function characteristic value sequence, as：
0000_0011_010T_0111_1000_101X_110F_1111
The physics unclonable function characteristic value sequence has statistical significance.It is identified when encountering " T ", at the beginning of needing repetitive identified
Whether most 1 minorities 0 of beginning logical value；When encountering " T " mark, whether most 0 minorities 1 of repetitive identified initial logic value are needed；When
" X " mark is encountered, uncertain most cases are 0 or 1.
Stablize the storage unit of (i.e. " 0 " stablize and " 1 " stablizes) if it is in existing only filter out, then the memory
Physics unclonable function characteristic value sequence will be confirmed as：
0000_0011_0111_1000_1111
It is obvious that the group number and the physics unclonable function characteristic value sequence generated according to the method for the present invention
0000_0011_010T_0111_1000_101X_110F_1111 is compared, and the risk being cracked is high.In contrast, according to this
The physics unclonable function characteristic value sequence that the method for invention generates reduces the risk being cracked, and is more advantageous to encrypted answer
With.
Based on above description, the method according to the ... of the embodiment of the present invention for obtaining memory physics unclonable function is by structure
At component part of whole addressing spaces as constitutive characteristic value of the memory of PUF, the PUF characteristic values of final output have
Statistical significance can not only generate more accurate PUF characteristic values, the risk being cracked when can also reduce for encrypting.
According to another aspect of the present invention, it provides a kind of unclonable for realizing acquisition memory physics described above
The system of the method for function.It is described with reference to Fig. 3 according to the ... of the embodiment of the present invention for realizing acquisition memory described above
The system of the method for physics unclonable function.
Fig. 3 shows the signal of the system 300 according to the ... of the embodiment of the present invention for obtaining memory physics unclonable function
Property structure chart.As shown in figure 3, system 300 may include control unit 310, environmental parameter adjust unit 320, memory 330 with
And computing unit 340.Wherein, control unit 310 adjusts unit 320 with environmental parameter and the memory 330 is connect；Environment is joined
Number adjusts unit 320 and is connect with memory 330；Memory 330 is connect with computing unit 340.
Control unit 310, which can control environment parameter adjustment unit 320 and generate, to be implemented in conjunction with described in Fig. 2 according to the present invention
Various environmental parameters and control memory in the method for example are powered under the various environmental parameters.Environmental parameter tune
Section unit 320 exports the various environmental parameters generated to memory 330.Illustratively, environmental parameter adjust unit 320 can be with
Including voltage regulator and thermoregulator (not shown in FIG. 3), they are respectively to storage under the control of control unit 310
Device 330 exports a variety of different voltage values and temperature value.
Illustratively, it may include selection voltage output list that environmental parameter, which adjusts the voltage regulator included by unit 320,
First and multiple divider resistances, operating voltage (such as VDD) are connected to ground, the selection voltage output list by the divider resistance
Member exports different voltage under the control of described control unit 310 to the memory 330.Voltage in this example is adjusted
Device can simulate the case where various voltages fluctuate in effective range, can provide different environmental parameters well.At other
In example, environmental parameter adjusts the voltage regulator included by unit 320 can also be using other any suitable ways come real
It is existing, the invention is not limited in this regard.
Illustratively, it may include counter that environmental parameter, which adjusts the thermoregulator included by unit 320, the counting
Device under the control of control unit 310 to 330 recurrent wrIting of the memory " 0 " and " 1 ", to adjust the memory 330
Temperature.Regulate and control the temperature of memory with respect to Regulate Environment temperature, thermoregulator in this example can be more
Effectively adjust the temperature of memory.In other examples, the thermoregulator that environmental parameter is adjusted included by unit 320 also may be used
To be realized using other any suitable ways, the invention is not limited in this regard.
Computing unit 340 is used for initial logic of each storage unit of statistical memory 330 under various environmental parameters
It is worth, and determines the statistical characteristics of each storage unit based on the result of statistics, and based on the element address of each storage unit
And its statistical characteristics generates the physics unclonable function characteristic value sequence of memory 330.
Only the major function of each unit for system 300 is described above, and is omitted and is previously with regard to basis
It is previously with regard in the details that the method according to the ... of the embodiment of the present invention for obtaining memory physics unclonable function has been noted above
Hold, those of ordinary skill in the art can be unclonable according to acquisition memory physics according to the ... of the embodiment of the present invention is previously with regard to
The concrete operations of each unit of the description understanding system 300 of the method for function, for sake of simplicity, details are not described herein again.
Based on above description, the system according to the ... of the embodiment of the present invention for obtaining memory physics unclonable function is by structure
At component part of whole addressing spaces as constitutive characteristic value of the memory of PUF, the PUF characteristic values of final output have
Statistical significance can not only generate more accurate PUF characteristic values, the risk being cracked when can also reduce for encrypting.
On the whole, the method and system according to the ... of the embodiment of the present invention for obtaining memory physics unclonable function is by structure
At component part of whole addressing spaces as constitutive characteristic value of the memory of PUF, the statistical characteristics of storage unit can
With stablize including fixed " 0 " or " 1 ", there is maximum probability to be biased to " 0 " or " 1 " and almost equiprobability or do not have big
" 0 " or " 1 " that probability is biased to.Statistical characteristics is the statistical attribute of " stability " and revocable numerical value.Determining stabilization
(that i.e. " 0 " stablizes or that " 1 " stablizes) cell values, repeat to power on the fixed value all necessarily occurred every time for being responsible for verification；System
There is (that i.e. " 0 " is biased to or that " 1 " is biased to) cell that maximum probability is biased in meter meaning, is then used to be responsible for sentencing for fault tolerant process
It is disconnected.If it is determined that and there is primary error in the cell that stablizes, then be judged as that key mismatches；If big for having in statistical significance
The cell that probability is biased to, each validation value are fixed clearly value 0 or 1, then are judged as that key mismatches.
In other words, physics unclonable function characteristic value sequence is in conduct caused by the method and system based on the present invention
When key, due to assigning each data bit statistics attribute, the comparison to fixed value is not only to the differentiation of characteristic value, also
Include the judgement to statistical value, the statistical attribute of all data bit all meets, and can just be determined as that characteristic value matches, differentiate process
The cycle that the period is repeated several times is needed, for obtaining statistical result, therefore is greatly improved the safety of key.
Although describing the above example embodiment by reference to attached drawing, it should be understood that the above example embodiment is only example
Property, and be not intended to limit the scope of the invention to this.Those of ordinary skill in the art can carry out various change wherein
Become and change, is made without departing from the scope of the present invention and spiritual.All such changes and modifications are intended to be included in appended right and want
It asks within required the scope of the present invention.
Those of ordinary skill in the art may realize that lists described in conjunction with the examples disclosed in the embodiments of the present disclosure
Member and algorithm steps can be realized with the combination of electronic hardware or computer software and electronic hardware.These functions are actually
It is implemented in hardware or software, depends on the specific application and design constraint of technical solution.Professional technician
Each specific application can be used different methods to achieve the described function, but this realization is it is not considered that exceed
The scope of the present invention.
In the instructions provided here, numerous specific details are set forth.It is to be appreciated, however, that the implementation of the present invention
Example can be put into practice without these specific details.In some instances, well known method, structure is not been shown in detail
And technology, so as not to obscure the understanding of this description.
Similarly, it should be understood that in order to simplify the present invention and help to understand one or more of each inventive aspect,
To in the description of exemplary embodiment of the present invention, each feature of the invention be grouped together into sometimes single embodiment, figure,
Or in descriptions thereof.However, the method for the present invention should be construed to reflect following intention：It is i.e. claimed
The present invention claims the more features of feature than being expressly recited in each claim.More precisely, such as corresponding power
As sharp claim reflects, inventive point is that the spy of all features less than some disclosed single embodiment can be used
It levies to solve corresponding technical problem.Therefore, it then follows thus claims of specific implementation mode are expressly incorporated in this specific
Embodiment, wherein each claim itself is as a separate embodiment of the present invention.
It will be understood to those skilled in the art that other than mutually exclusive between feature, any combinations pair may be used
All features disclosed in this specification (including adjoint claim, abstract and attached drawing) and so disclosed any method
Or all processes or unit of equipment are combined.Unless expressly stated otherwise, this specification (including want by adjoint right
Ask, make a summary and attached drawing) disclosed in each feature can be replaced by providing the alternative features of identical, equivalent or similar purpose.
In addition, it will be appreciated by those of skill in the art that although some embodiments described herein include other embodiments
In included certain features rather than other feature, but the combination of the feature of different embodiments means in of the invention
Within the scope of and form different embodiments.For example, in detail in the claims, embodiment claimed it is one of arbitrary
It mode can use in any combination.
The above description is merely a specific embodiment or to the explanation of specific implementation mode, protection of the invention
Range is not limited thereto, and any one skilled in the art in the technical scope disclosed by the present invention, can be easily
Expect change or replacement, should be covered by the protection scope of the present invention.Protection scope of the present invention should be with claim
Subject to protection domain.
Claims (10)
1. a kind of method obtaining memory physics unclonable function, which is characterized in that the method includes：
Memory is powered under various environmental parameters, and counts each storage unit of the memory described various
Initial logic value under environmental parameter；
The statistical characteristics of each storage unit is determined based on the result of the statistics；And
The physics that element address and its statistical characteristics based on each storage unit generate the memory is unclonable
Function feature value sequence.
2. according to the method described in claim 1, it is characterized in that, the result based on the statistics is determined and described is each deposited
The statistical characteristics of storage unit includes：
When initial logic value of the storage unit under the various environmental parameters is " 0 ", the statistical nature of the storage unit
Value is " 0 "；
When initial logic value of the storage unit under the various environmental parameters is " 1 ", the statistical nature of the storage unit
Value is " 1 "；
When initial logic value of the storage unit under the various environmental parameters includes " 0 " and " 1 " and is more than for the probability of " 0 "
When equal to predetermined threshold, the statistical characteristics of the storage unit is " F ", wherein " F " indicates that the storage unit is depositing for " 0 " deviation
Storage unit；
When initial logic value of the storage unit under the various environmental parameters includes " 0 " and " 1 " and is more than for the probability of " 1 "
When equal to the predetermined threshold, the statistical characteristics of the storage unit is " T ", wherein " T " indicates that the storage unit is biased to for " 1 "
Storage unit；
It is not belonging to appointing in above-mentioned four kinds of situations when the case where initial logic value of the storage unit under the various environmental parameters
When a kind of, the statistical characteristics of the storage unit is " X ", wherein " X " indicates that the storage unit is " 0/1 " random storage list
Member.
3. according to the method described in claim 2, it is characterized in that, the element address based on each storage unit and
The physics unclonable function characteristic value sequence that its statistical characteristics generates the memory includes：
The statistical characteristics of each storage unit of the memory is added after corresponding access unit address value with structure
At the characteristic value sequence of each storage unit；And
The characteristic value sequence of each storage unit is arranged and combined according to each access unit address sequence, with
Physics unclonable function characteristic value sequence as the memory.
4. according to the method described in any one of claim 1-3, which is characterized in that the various environmental parameters include multiple
Voltage value is combined with the traversal of multiple temperature values.
5. according to the method described in any one of claim 1-3, which is characterized in that the memory is static random-access
Memory.
6. a kind of system for realizing any one of claim 1-5 the methods, which is characterized in that the system comprises
Control unit, environmental parameter adjust unit, memory and computing unit, wherein：
Described control unit adjusts unit with the environmental parameter and connect, and unit generation is adjusted respectively for controlling the environmental parameter
Kind environmental parameter；
The environmental parameter adjusts unit and is connect with the memory, for joining to the memory output various environment
Number；
Described control unit is connect with the memory, is carried out under the various environmental parameters for controlling the memory
Electricity；And
The computing unit is connect with the memory, for counting each storage unit of the memory in the various rings
Initial logic value under the parameter of border, the statistical characteristics and base that each storage unit is determined based on the result of the statistics
The physics unclonable function that the memory is generated in the element address of each storage unit and its statistical characteristics is special
Value indicative sequence.
7. system according to claim 6, which is characterized in that the environmental parameter adjust unit include voltage regulator and
Thermoregulator.
8. system according to claim 7, which is characterized in that the voltage regulator include selection voltage output unit and
Multiple divider resistances, operating voltage are connected to ground by the divider resistance, and the selection voltage output unit is in the control
Different voltage is exported under the control of unit to the memory.
9. system according to claim 7, which is characterized in that the thermoregulator includes counter, the counter
" 0 " and " 1 " is written to the memory cycle under the control of described control unit, to adjust the temperature of the memory.
10. according to the system described in any one of claim 6-9, which is characterized in that the memory is deposited for static random
Access to memory.
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