CN108398584A - current sampling structure and switching device - Google Patents
current sampling structure and switching device Download PDFInfo
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- CN108398584A CN108398584A CN201810324339.5A CN201810324339A CN108398584A CN 108398584 A CN108398584 A CN 108398584A CN 201810324339 A CN201810324339 A CN 201810324339A CN 108398584 A CN108398584 A CN 108398584A
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- sampling
- sampling end
- current
- current sampling
- sample resistance
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- 238000005070 sampling Methods 0.000 title claims abstract description 271
- 230000002093 peripheral effect Effects 0.000 claims description 12
- 229910000881 Cu alloy Inorganic materials 0.000 claims description 6
- 239000000956 alloy Substances 0.000 claims description 5
- 239000004020 conductor Substances 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 238000000465 moulding Methods 0.000 claims description 3
- 239000000523 sample Substances 0.000 description 84
- 238000010586 diagram Methods 0.000 description 5
- HPDFFVBPXCTEDN-UHFFFAOYSA-N copper manganese Chemical compound [Mn].[Cu] HPDFFVBPXCTEDN-UHFFFAOYSA-N 0.000 description 4
- 230000005611 electricity Effects 0.000 description 4
- 238000009434 installation Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000004992 fission Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/002—Switches for altering the measuring range or for multitesters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
Abstract
The present invention provides a kind of current sampling structure and the switching device with the current sampling structure, the current sampling structure includes the first sampling end, the second sampling end spaced apart and the sample resistance being connected between first sampling end and second sampling end between the first sampling end, first sampling end is equipped with first positioning hole, second sampling end is equipped with second location hole, the first positioning hole and the second location hole are axially aligned, the first positioning hole and the second location hole for positioning piece for wearing and realizing the positioning to the current sampling structure.
Description
Technical field
The present invention relates to current sampling, more particularly to a kind of current sampling structure and the switch with the current sampling structure
Device.
Background technology
It usually requires to be sampled current signal to realize the link of current control and current protection in switching circuit.This
In, switching circuit refers to comprising switching device, such as the circuit system of breaker, fuse, change-over switch.Currently, switch electricity
The overload protection mode on road is relatively simple and there are drawbacks, is mainly adopted using pyromagnetic principle or using mutual inductor progress electric current
The mode of collection is realized.There is a problem of that precision is not high however, being realized by the way of pyromagnetic principle, and mutual inductor is used to carry out electricity
The mode of stream acquisition realizes there are problems that not installed by installation space restricted part circuit.
In the related technology, for the above problem, it there is no effective solution.
Invention content
To solve existing technical problem, the embodiment of the present application provides one kind and can ensure that sampling precision and convenient for peace
The current sampling structure and switching device of dress.
In order to achieve the above objectives, the technical solution of the embodiment of the present application is realized in：
A kind of current sampling structure, including spaced apart second taken between the first sampling end and the first sampling end
Sample end and the sample resistance being connected between first sampling end and second sampling end are set in first sampling end
There are first positioning hole, second sampling end to be equipped with second location hole, the first positioning hole and the second location hole edge
It axially aligns, the first positioning hole and the second location hole for positioning piece for wearing and realizing to the current sampling
The positioning of structure.
Wherein, the sample resistance is connected to the inner peripheral of the inner peripheral and second sampling end of first sampling end
Between.
Wherein, first sampling end and/or second sampling end are equipped with card slot, and the card slot is for accommodating electric current
Sample line and/or voltage sample line.
Wherein, first sampling end and second sampling end are in annular shape, first sampling end and/or institute respectively
It includes that the fixture block to be formed is extended radially outward from outer peripheral edge to state the second sampling end, the card slot at least two, and is set side by side
It is placed in the end of the fixture block.
Wherein, mounting hole, the current sampling structure are additionally provided in first sampling end and/or second sampling end
Further include the temperature sensor being installed in the mounting hole, the temperature sensor is contacted with the sample resistance.
Wherein, the outer profile of first sampling end and second sampling end is rectangular, and the sample resistance is connected to
Between the side of first sampling end and the side of second sampling end.
Wherein, the sample resistance forms the receipts of U-shaped towards the side of first sampling end and second sampling end
Hold space, the current sampling structure further includes the temperature sensor being installed in the receiving space, the temperature sensor
It is contacted with the sample resistance.
Wherein, Cu alloy material of the sample resistance by temperature drift coefficient less than setting value is made, first sampling end
And/or second sampling end is made of an electrically conducting material, the sample resistance and first sampling end and second sampling
It is reconnected after being molded by fission between end；Or, the sample resistance, first sampling end and second sampling end by
The Cu alloy material that temperature drift coefficient is less than setting value is made, the sample resistance and first sampling end and second sampling
It is integrally formed between end.
A kind of switching device, including current sampling structure, the current sampling structure include the first sampling end, are sampled with first
It the second sampling end spaced apart and is connected between first sampling end and second sampling end between end
Sample resistance, first sampling end are equipped with first positioning hole, and second sampling end is equipped with second location hole, and described the
A positioning hole and the second location hole are axially aligned, and the first positioning hole and the second location hole are used for for a positioning
Part wears and realizes the positioning to the current sampling structure.
Wherein, the switching device includes terminal plate and crimp type terminal, and the current sampling structure is installed by locating piece
Between the terminal plate and the crimp type terminal, the locating piece is arranged in the crimp type terminal, the current sampling successively
Structure and the terminal plate and the current sampling structure is fixed on the terminal plate, the locating piece takes with the electric current
It insulate between spline structure and between locating piece and the crimp type terminal.
The current sampling structure that the above embodiments of the present application are provided, between the first sampling end and the second sampling end each other
Every sample resistance is connected between the first sampling end and the second sampling end, is respectively equipped in the first sampling end and the second sampling end
Axially aligned first positioning hole and second location hole, the first positioning hole and second location hole can be used for for positioning piece
It wears and realizes the positioning to the current sampling structure, to the overall structure more simple and compact, just of the current sampling structure
In installation；Secondly, when which carries out signal sampling, it is to be accessed in circuit by the way that sample resistance is connected, utilizes
Ohm's law realizes electric current and/or voltage sample, so as to avoid occurring distorted signals because of interference, it is ensured that sampling precision.
Description of the drawings
Fig. 1 is the stereoscopic schematic diagram of current sampling structure in one embodiment of the invention；
Fig. 2 is the vertical view of current sampling structure shown in FIG. 1；
Fig. 3 is the side view of current sampling structure shown in FIG. 1；
Fig. 4 is the signal that current sampling structure shown in FIG. 1 is installed on switching device；
Fig. 5 is the stereoscopic schematic diagram of current sampling structure in another embodiment of the present invention；
Fig. 6 is the schematic diagram that current sampling structure shown in fig. 5 is installed on switching device.
Specific implementation mode
Technical solution of the present invention is further elaborated below in conjunction with Figure of description and specific embodiment.
Unless otherwise defined, all of technologies and scientific terms used here by the article and belong to the technical field of the present invention
The normally understood meaning of technical staff is identical.Used term is intended merely to description tool in the description of the invention herein
The purpose of the embodiment of body, it is not intended that in limitation the application.Term as used herein "and/or" includes one or more phases
Any and all combinations of the Listed Items of pass.
In the description of the embodiment of the present invention, it is to be understood that term "center", "upper", "lower", "front", "rear",
The orientation or positional relationship of the instructions such as "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside" is based on attached drawing institute
The orientation or positional relationship shown, is merely for convenience of description of the present invention and simplification of the description, and does not indicate or imply the indicated dress
It sets or element must have a particular orientation, with specific azimuth configuration and operation, therefore should not be understood as the limit to the present invention
System.In the description of the present invention, unless otherwise indicated, the meaning of " plurality " is two or more.
In the description of the present application, it should be noted that unless otherwise clearly defined and limited, term " installation ", " phase
Even ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected；It can
Can also can be indirectly connected through an intermediary the connection inside two elements to be to be connected directly.For this field
For those of ordinary skill, the concrete meaning of above-mentioned term in this application can be understood with concrete condition.
Fig. 1 show the stereoscopic schematic diagram of the current sampling structure of one embodiment of the application offer.The current sampling structure
10 include the second sampling end 12 spaced apart between the first sampling end 11 and the first sampling end 11 and described in being connected to
Sample resistance 13 between first sampling end 11 and second sampling end 12, first sampling end 11 are equipped with the first positioning
Hole, second sampling end 12 are equipped with second location hole, and the first positioning hole and the second location hole are axially aligned,
The first positioning hole and the second location hole for positioning piece 54 (Fig. 4) for wearing and realizing to the current sampling knot
The positioning of structure 10.
In above-described embodiment, spaced between the first sampling end 11 and the second sampling end 12, sample resistance 13 is connected to
Between first sampling end 11 and the second sampling end 12, first positioning hole is respectively equipped in the first sampling end 11 and the second sampling end 12
And second location hole, first positioning hole and second location hole is axially aligned namely the first sampling end 11 and the second sampling end 12
It is at least partly overlapped in the axial direction of current sampling structure 10, so as to reduce the whole ruler of current sampling structure 10
It is very little, and convenient for being installed to current sampling structure by first positioning hole and second location hole, the current sampling structure 10
Overall structure simple and compact is easily installed；Secondly, it is by the way that electricity will be sampled when which carries out signal sampling
In 13 series connection access circuit of resistance, so as to avoid occurring distorted signals because of interference, it is ensured that sampling precision.
Wherein, which can be integrally formed or formed by reconnection after fission molding whole
Body.Such as, sample resistance 13 reconnects after being separately formed with first sampling end 11 and/or second sampling end 12, or
It is integrally formed between sample resistance 13 and first sampling end 11 and second sampling end 12.Such as use sample resistance 13 with
It is reconnected after first sampling end 11 and the seperated molding of the second sampling end 12, then sample resistance 13 can select to be less than by temperature drift coefficient
The Cu alloy material of setting value, if copper-manganese material is made, the first sampling end 11 and/or second sampling end 12 can select by
Conductive material is made of such as copper, and connection type can be welding, riveted, extruding etc..Such as use sample resistance 13 and described first
It is integrally formed between sampling end 11 and second sampling end 12, then sample resistance 13, first sampling end 11 and described
Two sampling ends 12 can be less than the Cu alloy material of setting value by temperature drift coefficient, as copper-manganese is made.Sample resistance 13 uses manganese
Copper product is made, since copper-manganese material high sensitivity, temperature-coefficient of electrical resistance are small, to which the current sampling structure 10 can be used for reality
The acquisition of now more highly sensitive current signal and voltage signal.Optionally, first positioning hole and second location hole are circle, should
Sample resistance 13 is connected between the inner peripheral of the first sampling end 11 and the inner peripheral of second sampling end 12.Sample resistance 13
Both ends connect respectively with the inner peripheral of the inner peripheral of the first sampling end 11 and the second sampling end 12 so that 13 shape of sample resistance
As hollow cylindric, it so, it is possible under the premise of not increasing volume shared by current sampling structure 10, increase sample resistance
13 overall surface size, obtains better sample effect.
In an optional specific embodiment, Fig. 2 and Fig. 3 are please referred to, shape, the size point of first sampling end 11
Not identical as shape, the size of the second sampling end 12, first positioning hole and second location hole are respectively arranged at the first sampling end 11
With the center of the second sampling end 12, and the first sampling end 11 and the second sampling end 12 in axial direction on projection it is completely overlapped,
In this way, it is in symmetric shape that the current sampling structure 10 is whole, with can maintain the first sampling end 11, the second sampling end 12 and
In the case of the enough surface sizes of sample resistance 13, the sectional dimension of the current sampling structure 10 is minimized, saves manufacture
Cost.
Further, first sampling end 11 and/or second sampling end 12 are equipped with card slot 14, the card slot 14
For accommodating current sample line and/or voltage sample line.In the present embodiment, in the first sampling end 11 and the second sampling end 12 respectively
Equipped with card slot 14, the line footpath size of the size of the card slot 14 respectively with current sample line or voltage sample line matches, for
Current sample line or voltage sample line can be arranged in card slot 14 realize position fix and both ends respectively with the first sampling end 11
And second be welded to connect between sampling end 12, and current signal or voltage are realized in access circuit to realize to connect sample resistance 13
The sampling of signal.By the way that card slot 14 is arranged, the neat of current sample line or voltage sample line can be kept and maintains current sample
Good contact performance between line or voltage sample line and sampling end.
Specifically, first sampling end 11 and/or second sampling end 12 are in annular shape respectively, first sampling
End 11 and/or second sampling end 12 include that the fixture block 15 to be formed is extended radially outward from outer peripheral edge, the card slot 14 to
It is two less, and is juxtaposed on the end of the fixture block 15.In the present embodiment, the first sampling end 11 and the second sampling end 12 are
In annular shape, fixture block 15 protrudes from the outer peripheral edge of 11 and second sampling end 12 of corresponding first sampling end, and card slot 14 is set to card
The end of block 15 facilitates manual operation by current sample line and voltage after current sampling structure 10 is installed on detected position
Sampling line is inwardly squeezed from the outside of current sampling structure 10 and is caught in card slot 14.The quantity of card slot 14 is at least two, to divide
Current sample line and voltage sample line Yong Yu be installed, so as to realize the acquisition of current signal, voltage signal simultaneously.
Optionally, mounting hole 16, the current sampling structure are additionally provided in the first sampling end 11 and/or the second sampling end 12
10 further include the temperature sensor being installed in the mounting hole 16, and the temperature sensor is contacted with the sample resistance 13.
In the present embodiment, mounting hole 16 is set to the second sampling end 12, and temperature sensor is installed in mounting hole 16, temperature sensor
Probe is contacted with sample resistance 13, the temperature signal for acquiring 13 surface of sample resistance.Optionally, mounting hole 16 can be arranged
In one end that corresponding fixture block 15 is connect with the second sampling end 12, after facilitating temperature sensor to be installed in mounting hole 16,
The probe of temperature sensor can be contacted with sample resistance 13.It is taken it should be understood that can also first be set to mounting hole 16
Sample end 11；Or first be respectively set mounting hole 16 in sampling end 11 and the second sampling end 12；So that temperature sensor may be selected
Be installed in one of them mounting hole 16.
Referring to Fig. 4, being installed on the application scenarios of a switching device for the current sampling structure 10 of embodiment illustrated in fig. 1
Figure.Wherein, which includes terminal plate 52 and crimp type terminal 51, and current sampling structure 10 is installed on institute by locating piece 54
It states between terminal plate 52 and the crimp type terminal 51, locating piece 54 wears the crimp type terminal 51, first sampling end successively
11, the second sampling end 12 and the terminal plate 52 described in sample resistance 13 and the current sampling structure 10 is fixed on described open
It closes on device, between the locating piece 54 and the contact surface of the current sampling structure 10 and locating piece 54 is crimped with described
It is respectively equipped with insulating layer between the contact surface of terminal 51.Wherein, the current sampling structure 10 is by being arranged 11 He of the first sampling end
Second sampling end 12 in axial direction on projection overlapping, be respectively set in an axial direction in the first sampling end 11 and the second sampling end 12
The first positioning hole and second location hole of upper alignment, and sample resistance 13 be connected to the first sampling end 11 and the second sampling end 12 it
Between, it realizes the overall dimensions for reducing current sampling structure 10 and is easily installed；Secondly, by the first sampling end 11 and second
Card slot 14 and mounting hole 16 are provided in sampling end 12, convenient for installing voltage and temperature sampling detecting element additional, to facilitate positioning
Voltage sample line, current sample line and temperature sensor can be achieved at the same time current signal sampling, voltage signal sampling and temperature
On the basis of degree sampling, sampling line is not easy at random or falls off from current sample structure, and overall structure is more succinct and performance is steady
It is fixed.
Referring to Fig. 5, the stereoscopic schematic diagram of the current sampling structure 20 provided for another embodiment of the application, the electric current take
Spline structure 20 includes the first sampling end 21, the second sampling end 22 spaced apart between the first sampling end 21 and connect
Sample resistance 23 between first sampling end 21 and second sampling end 22, first sampling end 21 are equipped with the
A positioning hole, second sampling end 22 are equipped with second location hole, and the first positioning hole and the second location hole are along axis
To alignment, first positioning hole and the second location hole for positioning piece 54 for wearing and realizing to the current sampling structure 20
Positioning.The difference of the current sampling structure 20 and the current sampling structure 10 in previous embodiment essentially consists in：First sampling
Hold the 21, second sampling end 22 and the shape of sample resistance 23 different.
Wherein, the outer profile of the first sampling end 21 of the current sampling structure 20 and the second sampling end 22 difference is rectangular,
Sample resistance 23 is connected to the side of the first sampling end 21 and the second sampling end 22.The both ends of sample resistance 23 take with first respectively
Sample end 21 is connected with the side of the second sampling end 22 so that sample resistance 23 is formed to have the plate of one fixed width, to same
Sample can increase the overall surface size of sample resistance 23, obtain under the premise of not increasing volume shared by current sampling structure 20
Take better sample effect.
Optionally, side of the sample resistance 23 towards first sampling end 21 and second sampling end 22 is formed
The receiving space 27 of U-shaped, the current sampling structure 20 further include the temperature sensor being installed in the receiving space 27, institute
Temperature sensor is stated to contact with the sample resistance 23.Here, 23 Formation cross-section of sample resistance is the curve form of U-shaped, just
It is formed by the receiving space 27 of U-shaped in temperature sensor to be directly arranged to sample resistance 23.The probe of temperature sensor
It is contacted with the surface of sample resistance 23, the temperature signal for acquiring 23 surface of sample resistance.Further, first sampling
Card slot 24 is respectively equipped on end 21 and second sampling end 22, the card slot 24 is for accommodating current sample line and voltage sample
Line.Specifically, card slot 24 is set to the position that the first sampling end 21 and the second sampling end 22 are connect with sample resistance 23 respectively
At marginal position, manual operation is facilitated inwardly to squeeze current sample line and voltage sample line from the outside of current sampling structure 20
It is caught in card slot 24.The quantity of card slot 24 is at least two, to be respectively used to installation current sample line and voltage sample line, to
It can be realized simultaneously the acquisition of electric current, voltage signal.
Referring to Fig. 6, being installed on the application scenarios of a switching device for the current sampling structure 20 of embodiment illustrated in fig. 5
Figure.Wherein, locating piece 54 is arranged in the crimp type terminal 51, the first sampling end 21, the second sampling end 23 and the wiring successively
Plate 52 and the current sampling structure 20 is fixed on the terminal plate 52.Wherein, sample resistance 20 convexedly stretches in crimp type terminal
51 are formed by the outside of grasping part with terminal plate 52, distributing for the heat that sample resistance 20 of being more convenient for generates in working, fixed
Position part 54 and the contact surface of the current sampling structure 20 between and the contact surface of locating piece 54 and the crimp type terminal 51 it
Between be equipped with insulating layer.
On the other hand the embodiment of the present invention provides a kind of switching device, which includes terminal plate 52, crimp type terminal
51 and the current sampling structure that is installed between the terminal plate 52 and the crimp type terminal 51.The current sampling structure can this
Current sampling structure 10,20 in application described in any embodiment.Wherein, under the first sampling end 11,21 and crimp type terminal 51
Surface against the upper surface of, the second sampling end 12,22 and terminal plate 52 against, locating piece 54 wear successively the crimp type terminal,
The current sampling structure 10,20 and the terminal plate 52 and the current sampling structure 10 is fixed on terminal plate 52.Electricity
Stream sampling line and voltage sample line are arranged in respectively in the card slot 14,24 of current sampling structure and end and sampling end are welded, with
Circuit where the series connection of the current sampling structure 10,20 is accessed the switching device.The locating piece 54 and current sampling knot
It insulate between the contact surface of structure 10,20 and between locating piece 54 and the contact surface of crimp type terminal 51, such as the appearance of locating piece 54
Face is coated with insulating materials；Or the outer surface of locating piece 54 adds insulation sleeve；Either in locating piece 54 and crimp type terminal 51 it
Between setting insulation spacer 57 and part in locating piece 54 between the first sampling end 11,21 and the second sampling end 12,22
Outer surface is arranged insulation sleeve.The switching device can be specifically breaker.
The above description is merely a specific embodiment, but scope of protection of the present invention is not limited thereto, any
Those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, and should all contain
Lid is within protection scope of the present invention.Therefore, protection scope of the present invention should be based on the protection scope of the described claims.
Claims (10)
1. a kind of current sampling structure, which is characterized in that including spaced apart between the first sampling end and the first sampling end
The second sampling end and the sample resistance that is connected between first sampling end and second sampling end, described first takes
Sample end is equipped with first positioning hole, and second sampling end is equipped with second location hole, the first positioning hole and described second
Location hole is axially aligned, and the first positioning hole and the second location hole for positioning piece for wearing and realizing to described
The positioning of current sampling structure.
2. current sampling structure as described in claim 1, which is characterized in that the sample resistance is connected to first sampling end
Inner peripheral and the inner peripheral of second sampling end between.
3. current sampling structure as described in claim 1, which is characterized in that first sampling end and/or described second take
Sample end is equipped with card slot, and the card slot is for accommodating current sample line and/or voltage sample line.
4. current sampling structure as claimed in claim 3, which is characterized in that first sampling end and second sampling end
It is in respectively annular shape, first sampling end and/or second sampling end include extending radially outward to be formed from outer peripheral edge
Fixture block, the card slot at least two, and be juxtaposed on the end of the fixture block.
5. current sampling structure as described in claim 1, which is characterized in that first sampling end and/or described second take
Mounting hole is additionally provided on sample end, the current sampling structure further includes the temperature sensor being installed in the mounting hole, described
Temperature sensor is contacted with the sample resistance.
6. current sampling structure as described in claim 1, which is characterized in that first sampling end and second sampling end
Outer profile is rectangular, and the sample resistance is connected to the side of first sampling end and second sampling end.
7. current sampling structure as claimed in claim 6, which is characterized in that the sample resistance towards first sampling end and
The side of second sampling end forms the receiving space of U-shaped, and the current sampling structure further includes being installed on the receiving sky
Interior temperature sensor, the temperature sensor are contacted with the sample resistance.
8. the current sampling structure as described in any one of claim 1 to 7, which is characterized in that the sample resistance is by temperature drift
The Cu alloy material that coefficient is less than setting value is made, and first sampling end and second sampling end are made of an electrically conducting material,
By being reconnected after seperated molding between the sample resistance and first sampling end and/or second sampling end；Or,
The sample resistance, first sampling end and second sampling end are less than the copper alloy of setting value by temperature drift coefficient
Material is made, and is integrally formed between the sample resistance and first sampling end and second sampling end.
9. a kind of switching device includes the current sampling structure as described in any one of the claims 1 to 8.
10. switching device as claimed in claim 9, which is characterized in that the switching device includes terminal plate and crimp type terminal, institute
It states current sampling structure to be installed between the terminal plate and the crimp type terminal by locating piece, the locating piece is worn successively
The current sampling structure is fixed on the wiring in the crimp type terminal, the current sampling structure and the terminal plate
On plate, insulate between the locating piece and the current sampling structure and between locating piece and the crimp type terminal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810324339.5A CN108398584A (en) | 2018-04-12 | 2018-04-12 | current sampling structure and switching device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810324339.5A CN108398584A (en) | 2018-04-12 | 2018-04-12 | current sampling structure and switching device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108398584A true CN108398584A (en) | 2018-08-14 |
Family
ID=63099993
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810324339.5A Pending CN108398584A (en) | 2018-04-12 | 2018-04-12 | current sampling structure and switching device |
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| US20030020592A1 (en) * | 2001-06-14 | 2003-01-30 | Koichi Hirasawa | Current detection resistor, mounting structure thereof and method of measuring effective inductance |
| CN201740810U (en) * | 2010-08-11 | 2011-02-09 | 阿滨仪器(天津)有限公司 | Sampling resistor |
| CN202562985U (en) * | 2012-05-30 | 2012-11-28 | 钱炳宇 | Rated current divider |
| CN103630716A (en) * | 2013-11-26 | 2014-03-12 | 厦门宏发电力电器有限公司 | Antijamming shunt and electronic electric meter thereof |
| CN203630639U (en) * | 2013-11-08 | 2014-06-04 | 福州开发区星云电子自动化有限公司 | Thermostatic device for current sampling |
| CN204045304U (en) * | 2014-07-30 | 2014-12-24 | 联合汽车电子有限公司 | Sampling resistor construction package |
| JP2018014420A (en) * | 2016-07-21 | 2018-01-25 | 株式会社デンソー | Shunt resistor and mounting method thereof |
| CN208721728U (en) * | 2018-04-12 | 2019-04-09 | 彭浩明 | Current sampling structure and switching device |
-
2018
- 2018-04-12 CN CN201810324339.5A patent/CN108398584A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030020592A1 (en) * | 2001-06-14 | 2003-01-30 | Koichi Hirasawa | Current detection resistor, mounting structure thereof and method of measuring effective inductance |
| CN201740810U (en) * | 2010-08-11 | 2011-02-09 | 阿滨仪器(天津)有限公司 | Sampling resistor |
| CN202562985U (en) * | 2012-05-30 | 2012-11-28 | 钱炳宇 | Rated current divider |
| CN203630639U (en) * | 2013-11-08 | 2014-06-04 | 福州开发区星云电子自动化有限公司 | Thermostatic device for current sampling |
| CN103630716A (en) * | 2013-11-26 | 2014-03-12 | 厦门宏发电力电器有限公司 | Antijamming shunt and electronic electric meter thereof |
| CN204045304U (en) * | 2014-07-30 | 2014-12-24 | 联合汽车电子有限公司 | Sampling resistor construction package |
| JP2018014420A (en) * | 2016-07-21 | 2018-01-25 | 株式会社デンソー | Shunt resistor and mounting method thereof |
| CN208721728U (en) * | 2018-04-12 | 2019-04-09 | 彭浩明 | Current sampling structure and switching device |
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