CN108375971A - Integrated Electronic System health control module and health control method for moonlet - Google Patents
Integrated Electronic System health control module and health control method for moonlet Download PDFInfo
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- CN108375971A CN108375971A CN201810221868.2A CN201810221868A CN108375971A CN 108375971 A CN108375971 A CN 108375971A CN 201810221868 A CN201810221868 A CN 201810221868A CN 108375971 A CN108375971 A CN 108375971A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24065—Real time diagnostics
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Abstract
The present invention is to provide a kind of Integrated Electronic System health control modules and health control method for moonlet.Including ADSP SC589 types DSP 1, flash storage 2, SRAM 3, PROM 4,82C250 type CAN bus electrical level transferring chip 5.Moonlet Autonomous fault detection in orbit, Fault Isolation, fault identification may be implemented in the present invention, and carries out health status judgement to moonlet Integrated Electronic System according to its result.For the upgrading of moonlet follow-up system and improved provide important references information.In addition, the present invention can also realize that moonlet Autonomous fault in orbit is predicted, prediction generates the time that the source of trouble of failure, the size of failure and failure occur, for moonlet selfreparing provide according to, and then extend the moonlet service life, reduce moonlet maintenance cost.
Description
Technical field
Invention refers to a kind of the Integrated Electronic System health controller and health control method of moonlet.
Background technology
With the development of Small Satellite Technology, need to reduce moonlet maintenance cost, this requires moonlets to carry out
The detection of rail Autonomous fault, Fault Isolation, fault identification, failure predication carry out health status judgement, and according to satellite itself software
Or the fault-tolerant of hardware aspect, self-reparing capability are independently independently repaired according to the output data information of health management system arranged module
Operation.Once traditional moonlet software or hardware failure cannot normal operation, error in data, signal can be caused dry
It disturbs, serious that satellite derailing will be caused even to fall, moonlet end-of-life is retired in advance, is not completed to complete this moonlet
Task, need to emit another moonlet equally configured, increase maintenance cost.In addition, moonlet Integrated Electronic System has
There is the work characteristics of " primary transmitting, longtime running ", if the failure of moonlet in orbit can be detected, be isolated,
Identification, prediction, enable moonlet independently to be repaired according to the fault-tolerant and redundancy properties of itself, can effectively extend the moonlet longevity
Life improves its active time, reduces maintenance cost.
Invention content
The purpose of the present invention is to provide one kind capable of extending the moonlet service life, and being used for for reduction moonlet maintenance cost is small
The Integrated Electronic System health control module of satellite.The present invention also aims to provide it is a kind of based on the present invention be used for little Wei
The health control method of the Integrated Electronic System health control module of star.
The present invention the Integrated Electronic System health control module for moonlet include processor 1, flash memory 2, static state with
Machine accesses memory 3, programmable read only memory 4, CAN bus electrical level transferring chip 5,
Processor 1 is connected with programmable read only memory 4, and the guiding of processor 1 is stored in programmable read only memory 4
File, processor 1 are connected with flash memory 2, on flash memory 2 points three sections in different address storage program files, processor 1 with it is static
Random access memory 3 is connected, memory headroom when static RAM 3 is executed as 1 program of processor, processor
1 data input output ports are connected with CAN bus electrical level transferring chip 5,
CAN bus electrical level transferring chip 5 is connected with processor 1 and CAN bus 6,5 one side of CAN bus electrical level transferring chip
It face will be in the data transfer from processor 1 to CAN bus 6, on the other hand by the data transfer in CAN bus 6 to processor
1。
The present invention the Integrated Electronic System health control module for moonlet can also include：Processor 1 is ADSP-
SC589 types, CAN bus electrical level transferring chip 5 are 82C250 types.
The health control method of the Integrated Electronic System health control module for moonlet based on the present invention is：
Processor 1 obtains the detection from each satellite borne sensor in CAN bus 6 by CAN bus electrical level transferring chip 5
Data, and the parameter of characterization failure generation is extracted, according to the different types of data of characterization failure data, feature is divided into time domain event
Hinder two kinds of feature and frequency domain fault signature, time domain failure extraction method uses variance extraction method, time domain failure extraction method to use frequency spectrum
Extraction method is analyzed, the parameter after being extracted according to failure judges whether moonlet Integrated Electronic System breaks down.
In order to enable in orbit moonlet independently carry out fault detect, Fault Isolation, fault identification, failure predication,
Health status judgement is carried out, solves the problems, such as that traditional moonlet Integrated Electronic System maintenance cost is high, the present invention provides one kind
Integrated Electronic System health control module for moonlet.It includes that ADSP-SC589 types DSP 1, Flash (dodge that it, which is mainly formed,
Deposit) memory 2, SRAM (static RAM) 3, PROM (programmable read only memory) 4,82C250 type CAN bus
Electrical level transferring chip 5.
DSP1 is connected with PROM4, and PROM4 belongs to that non-volatile memory capacity is small but in-orbit data reliability is high,
The guiding file of DSP1 is stored on PROM4.DSP1 is connected with Flash2, Flash2 belong to non-volatile memory capacity it is big but
Rail data reliability is less than PROM4, on Flash2 points three sections in different address storage program files.DSP1 and SRAM3 phases
Even, SRAM3 belongs to 32 memories, memory headroom when being executed as DSP1 programs.The data input output ports of DSP1 with
82C250 type CAN bus electrical level transferring chip 5 is connected.
82C250 type CAN bus electrical level transferring chip 5 is connected with DSP1 and CAN bus, on the one hand by the number from DSP1
According to being transmitted in CAN bus 6, on the one hand by the data transfer in CAN bus 6 to DSP1.
It is an advantage of the invention that：The present invention, as processor, has arithmetic speed fast using ADSP-SC589 types DSP, single
The big advantage of position time data transmission quantity.The present invention using 82C250 type CAN bus electrical level transferring chips as dsp processor with
The interface of CAN bus, the ability with bidirectional transmit-receive, strong electromagnetism interference, and there is Thermal protection in CAN bus short circuit
Effect.The present invention can independently be completed for moonlet in orbit the fault detect of satellite, Fault Isolation, fault identification,
Failure predication carries out health status judgement and prediction, and it is high that moonlet in orbit carries out artificial maintenance operation difficulty again,
Can only just it rely on satellite itself software or the fault-tolerant of hardware aspect, self-reparing capability independently according to health management system arranged module at this time
Output data information carry out it is autonomous repair operation, extend the moonlet service life, reduce moonlet maintenance cost, and output data will
As follow-up system upgrading and improved important references information.
Description of the drawings
Fig. 1 is the structural schematic diagram of the Integrated Electronic System health control module for moonlet of the present invention.
Fig. 2 is the flow chart of the health control method of the present invention.
Specific implementation mode
The invention will be further described for citing below.
Specific implementation mode one：Moonlet Integrated Electronic System fault detect.Fault detect be failure judgement occur according to
According to being the parameter extracted characterization failure from detection data and occurred, and judge whether moonlet Integrated Electronic System breaks down.
The present invention includes ADSP-SC589 types DSP 1, flash storage 2, SRAM 3, PROM 4,82C250 types CAN total
Line electrical level transferring chip 5.
DSP1 is connected with PROM4, and PROM4 belongs to that non-volatile memory capacity is small but in-orbit data reliability is high,
The guiding file of DSP1 is stored on PROM4.DSP1 is connected with Flash2, Flash2 belong to non-volatile memory capacity it is big but
Rail data reliability is less than PROM4, on Flash2 points three sections in different address storage program files.DSP1 and SRAM3 phases
Even, SRAM3 belongs to 32 memories, memory headroom when being executed as DSP1 programs.
DSP 1 by CAN bus electrical level transferring chip 5 obtain CAN bus 6 on from each satellite borne sensor (8,
9 ... ..., n+7) detection data, and extract characterization failure generation parameter.According to the different data class of characterization failure data
Feature can be divided into two kinds of time domain fault signature and frequency domain fault signature by type, can be taken for both different features
Different methods carries out failure extraction.Wherein, time domain failure extraction method uses variance extraction method, and time domain failure extraction method is using frequency
Spectrum analysis extraction method.
Variance extraction method：
Variance is shown below to describe the dynamic component of random signal：
In formula：X (t) indicates to collect detection data to be tested, μ by sensorxIndicate the mean value of semaphore x, σxIt indicates
The variance of semaphore x, variance size reflect dispersion degree of the stochastic variable to mean value, that is, represent the dynamic component of signal.
Its positive square root is known as standard deviation.Estimate of variance is shown below：
Spectrum analysis extraction method：
Spectrum analysis is from the Energy distribution of frequency-domain analysis signal, and analysis method has very much, and this programme is used from power
Spectrum analysis method, auto-power spectrum reflect signal in the Energy distribution situation of frequency domain, are shown below：
In formula：Rx(τ) indicates the power spectral density function of semaphore x, Sx(f) auto-power spectrum of semaphore x is indicated.
Parameter after being extracted according to failure judges whether moonlet Integrated Electronic System breaks down, and will determine that result is made
For the input of specific embodiment two and specific embodiment four.
Specific implementation mode two：On the basis of embodiment one, the Fault Isolation of moonlet Integrated Electronic System is realized.
By Fault Isolation, specific failure source position can be identified, i.e. DSP 1 is according to the spaceborne calculating obtained from CAN bus 6
The detection data of machine 7 and each satellite borne sensor (8,9 ... ..., n+7) to each subsystem of moonlet Integrated Electronic System or
Branch point judges its health status respectively, finally judges faulty subsystem or branch point.
Specific implementation mode three：On the basis of embodiment two, moonlet Integrated Electronic System fault identification is realized, i.e.,
The fault degree of system components is judged, the failure symptom size of no system unit that obvious fault occurs is carried out
Identification.This programme is directed to the nonlinear characteristic of moonlet Integrated Electronic System, is distinguished using the failure based on linearization
Knowledge method.
The state observer of moonlet Integrated Electronic System is designed first, and formula is as follows：
Y (t)=H (x (t))+Ef (t)
In formula：X (t) is state variable, and input variable, y (t) are system output variables to u (t) in order to control, and f (t) is failure
Signal, G (), H () are respectively the function of state and observation function of system, and F and E are known matrix.
Secondly linearization process is carried out at (0,0) point to it, formula is as follows：
Y (t)=Cx (t)+O (x)+Ef (t)
In formula：O (x, u) is indicated about system mode and is controlled defeated
The higher-order shear deformation entered, O (x) indicate the higher-order shear deformation of system mode.
Initial estimation is carried out to fault-signal f (t) again, it is assumed that when starting t=0, there is no failure in system, f's (t) estimates
EvaluationIt is 0；When moonlet Integrated Electronic System is in t0When moment breaks down, f (t) ≠ 0 (t >=t0), the estimated value of f (t)It is not 0, andIt is exactly the initial estimation result to fault-signal f (t).
Finally the initial estimation result of fault-signal f (t) is corrected, state observation error dynamics equation is divided
Fault Estimation error is indicated the form of following formula by analysis：
Fault Estimation error=time-varying gain matrix * state observation errors
And solve time-varying gain matrix, i.e., it obtains the initial estimation error of fault-signal indirectly by state observation error, ties
The initial estimation of fault-signal is closed as a result, obtaining the true value of fault-signal, realizes the fault identification of moonlet Integrated Electronic System.
Fault identification result can be provided for failure predication basis for estimation and be moonlet follow-up system upgrading and it is improved
Important references information.
Specific implementation mode four：On the basis of embodiment one, moonlet Integrated Electronic System failure predication is realized.When
When the output result of embodiment one is health status, using the failure prediction method based on neural network model, to moonlet
The failure of Integrated Electronic System is predicted.During being predicted based on neural network model, first using detection data as sample
This, selects rational training, test and analysis sample；Then training pattern is arranged by network parameter；Again with test sample pair
Trained network model is tested, and network performance is examined；Finally predicted that prediction will occur with model and analysis sample
The time that the source of trouble of failure, the size of failure and failure occur, and be moonlet according to the superfluous of its own software or hardware
Remaining and fault-tolerant ability independently carries out selfreparing to moonlet Integrated Electronic System and provides foundation, and then can effectively extend moonlet
Service life improves its active time, reduces maintenance cost.
Claims (6)
1. a kind of Integrated Electronic System health control module for moonlet, including processor (1), flash memory (2), static random
Memory (3), programmable read only memory (4), CAN bus electrical level transferring chip (5) are accessed, it is characterized in that：
Processor (1) is connected with programmable read only memory (4), and processor (1) is stored in programmable read only memory (4)
It guides file, processor (1) to be connected with flash memory (2), three sections is divided on flash memory (2) in different address storage program files, is located
Reason device (1) is connected with static RAM (3), when static RAM (3) is executed as 1 program of processor
Memory headroom, the data input output ports of processor (1) are connected with CAN bus electrical level transferring chip (5),
CAN bus electrical level transferring chip (5) is connected (6) with processor (1) and CAN bus, CAN bus electrical level transferring chip (5)
On the one hand it will come from the data transfer to CAN bus (6) of processor (1), on the other hand by the data in CAN bus (6) and pass
It is handed to processor (1).
2. the Integrated Electronic System health control module according to claim 1 for moonlet, it is characterized in that：Processor
(1) it is ADSP-SC589 types, CAN bus electrical level transferring chip (5) is 82C250 types.
3. a kind of health control side based on the Integrated Electronic System health control module described in claim 1 for moonlet
Method, it is characterized in that：Processor (1) is obtained by CAN bus electrical level transferring chip (5) and comes from each spaceborne biography in CAN bus (6)
The detection data of sensor, and the parameter of characterization failure generation is extracted, according to the different types of data of characterization failure data, by feature
It is divided into two kinds of time domain fault signature and frequency domain fault signature, time domain failure extraction method uses variance extraction method, the extraction of time domain failure
Method uses spectrum analysis extraction method, the parameter after being extracted according to failure to judge whether moonlet Integrated Electronic System breaks down.
4. health control method according to claim 3, it is characterized in that it is described extracted according to failure after parameter judge it is small
Whether satellite Integrated Electronic System breaks down specially：I.e. processor (1) is according to the spaceborne meter obtained from CAN bus (6)
The detection data of calculation machine (7) and each satellite borne sensor (8,9 ... ..., n+7) is to each point of moonlet Integrated Electronic System
System or branch point judge that its health status, isolation finally judge faulty subsystem or branch point respectively.
5. health control method according to claim 4, it is characterized in that further including：The fault degree of system components is done
Go out to judge, the failure symptom size of no system unit that obvious fault occurs is recognized, the identification is to use to be based on
The fault identification method of linearization specifically includes：
The state observer of moonlet Integrated Electronic System is designed first, and formula is as follows：
Y (t)=H (x (t))+Ef (t)
In formula：X (t) is state variable, and input variable, y (t) are system output variables to u (t) in order to control, and f (t) is fault-signal,
G (), H () are respectively the function of state and observation function of system, and F and E are known matrix,
Secondly linearization process is carried out at (0,0) point to it, formula is as follows：
Y (t)=Cx (t)+O (x)+Ef (t)
In formula：O (x, u) is indicated about system mode and is controlled input
Higher-order shear deformation, O (x) indicate the higher-order shear deformation of system mode,
Initial estimation is carried out to fault-signal f (t) again, it is assumed that when starting t=0, there is no failure, the estimated value of f (t) in systemIt is 0；When moonlet Integrated Electronic System is in t0When moment breaks down, f (t) ≠ 0 (t >=t0), the estimated value of f (t)
It is not 0, andBe exactly to the initial estimation of fault-signal f (t) as a result,
Finally the initial estimation result of fault-signal f (t) is corrected, state observation error dynamics equation is analyzed,
Fault Estimation error is indicated to the form of following formula：
Fault Estimation error=time-varying gain matrix * state observation errors
And solve time-varying gain matrix, i.e., the initial estimation error of fault-signal is obtained indirectly by state observation error, in conjunction with event
Hinder the initial estimation of signal as a result, obtaining the true value of fault-signal, realizes the fault identification of moonlet Integrated Electronic System.
6. health control method according to claim 3, it is characterized in that it is described extracted according to failure after parameter judge it is small
Whether satellite Integrated Electronic System breaks down specially：When it is health status to export result, using based on neural network mould
The failure prediction method of type is predicted the failure of moonlet Integrated Electronic System, is specifically included：
First using detection data as sample, rational training, test and analysis sample are selected；Then it is arranged by network parameter and is instructed
Practice model；Trained network model is tested with test sample again, examines network performance；Finally use model and analysis sample
It is predicted, predicts the time that the source of trouble that will be broken down, the size of failure and failure occur, and be moonlet root
Selfreparing independently is carried out to moonlet Integrated Electronic System according to the redundancy and fault-tolerant ability of its own software or hardware, foundation is provided.
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| CN109813309A (en) * | 2019-03-08 | 2019-05-28 | 哈尔滨工程大学 | A kind of six gyro redundance type Strapdown Inertial Navigation System Dual Failures partition methods |
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| CN110795309A (en) * | 2019-10-29 | 2020-02-14 | 中国科学院微小卫星创新研究院 | Hierarchical software health management method and system for microsatellite |
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| CN110795309B (en) * | 2019-10-29 | 2023-05-12 | 中国科学院微小卫星创新研究院 | Hierarchical software health management method and system for microsatellite |
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