CN108333596A - A kind of non-ken imaging technique based on single-photon detector - Google Patents
A kind of non-ken imaging technique based on single-photon detector Download PDFInfo
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Abstract
A kind of non-ken imaging technique based on single-photon detector proposed in the present invention, main contents include：Forward direction is imaged with reverse optical transport, the boundary of non-ken imaging, using the non-ken of single-photon detector, and process is total radiation flux when being reflected away first from material surface to light extraction；Then visible luminescent material panel is by detected pixel direct imaging；Then by imaging model according to alphabet sortord vector quantization, there is shown indirect illumination component, and solved using interative least square method；The behavior that photon is finally recorded with single photon avalanche diode detector is recorded the time of incident photon stream using determining time window, the probability for detecting a certain number of photon behaviors is indicated with Poisson distribution, problem is described as maximal possibility estimation problem and is solved.The present invention is based on single-photon detectors, it is proposed that a kind of nonlinear model that the non-ken is imaged and a kind of method for solving of biconvex have the advantages that algorithm performance is more excellent, system is more robust.
Description
Technical field
The present invention relates to non-ken imaging fields, are imaged more particularly, to a kind of non-ken based on single-photon detector
Technology.
Background technology
With the fast development of technique of laser imaging and the raising of detector precision, occur at present a kind of new optics at
As pattern, i.e., non-ken imaging technique.It specifically for the regional imaging other than detector sight, as behind wall turning, cigarette
The subsequent object of mist.Non- ken imaging technique is mainly used for detecting avenue corner, the hidden objects in house, can be around
Turning or barrier are crossed to hiding target object imaging, realizes zone location target other than sight.It can be effective using the technology
The fight capability for preventing the position of life entity in urban traffic accident, positioning disaster relief (fire, earthquake etc.), promoting army
Deng.Over the past decade, with the continuous maturation of technique of laser imaging and detector technology, non-ken imaging technique has also obtained soon
The development of speed.The shortcomings of that there are algorithm performances is low for existing non-ken imaging technique, system inadequate robust.
The present invention proposes a kind of non-ken imaging technique based on single-photon detector, gives light extraction from material surface first
Total radiation flux when reflecting away；Then visible luminescent material panel is by detected pixel direct imaging；Then by imaging model
According to alphabet sortord vector quantization, there is shown indirect illumination component, and solved using interative least square method；It finally uses single
Photon avalanches diode detector records the behavior of photon, the time of incident photon stream is recorded using determining time window, with pool
Pine distribution indicates to detect the probability of a certain number of photon behaviors, problem is described as maximal possibility estimation problem and is solved.This
Invention is based on single-photon detector, it is proposed that a kind of nonlinear model that the non-ken is imaged and a kind of method for solving of biconvex,
It has the advantages that algorithm performance is more excellent, system is more robust.
Invention content
The shortcomings of that there are algorithm performances is low for the prior art, system inadequate robust, the purpose of the present invention is to provide
A kind of non-ken imaging technique based on single-photon detector, total radiation is logical when being reflected away first from material surface to light extraction
Amount；Then visible luminescent material panel is by detected pixel direct imaging；Then imaging model is sweared according to alphabet sortord
Quantization, there is shown indirect illumination component, and solved using interative least square method；Finally use single photon avalanche diode detector
The behavior for recording photon records the time of incident photon stream using determining time window, and one fixed number of detection is indicated with Poisson distribution
Problem is described as maximal possibility estimation problem and solved by the probability of the photon behavior of amount.
To solve the above problems, the present invention provides a kind of non-ken imaging technique based on single-photon detector, it is main
Content includes：
(1) forward direction and reverse optical transport；
(2) boundary of non-ken imaging；
(3) the non-ken of single-photon detector is utilized to be imaged.
Wherein, the forward direction and retrograde optical transport mainly include the non-ken optical transport, time-resolved of barrier
Non- ken optical transport, reverse non-ken optical transport.
Further, the non-ken optical transport for having barrier, it is assumed that all surfaces can use Lambertian double
It is described to Reflectance Distribution Function, each piece of luminescent material panel i is by position xi, surface normal niWith scattered reflection rate ρiThree ginsengs
Amount indicates；The radiancy b of luminescent material panel iiRadiation flux total when light is reflected away from material surface is given, i.e.,：
Wherein eiIndicate emitted energy, FijIndicate the Geometric structure factor between the surface luminescent material panel of two fragments,
Its form is：
Wherein vijIt is the two-value visuality function between luminescent material panel；
Non- ken imaging is to restore the reflectivity for the luminescent material panel that those can not directly be obtained by video camera；It is non-to regard
Domain reconstructs the optical property that hidden luminescent material panel is speculated using the object of indirec radiation；Expansion formula (1) can obtain：
Wherein transmitting light ekIt is the radiancy of luminescent material panel k.
Further, the time-resolved non-ken optical transport, using the light source of movement as a pulse laser,
It is used in combination a sensor to carry out ultra-fast measurement；Time-resolved radiometry value can be derived by by formula (3), i.e.,：
WhereinIt is the radiancy of a time-varying, indicates that visible luminescent material panel k is sent out in moment t by pulse laser
It is mapped to the radiancy of luminescent material panel l；Visible luminescent material panel can be located at x by onesDetected pixel direct imaging,
I.e.：
By imaging model according to alphabet sortord vector quantization, can obtain：
WhereinIt is the direct illumination component of time-resolved conversion process, indirect illumination component is by space-time conversion matrix
Γ(l)It indicates；By several different visible light material panel l=1,2 ..., L, it can derive that imaging model is：
Wherein
Further, the space-time conversion matrix, Γ(l)Four parts, including time sampling matrix T can be decomposed into(l), visible form factor matrix A(l), hidden form factor matrix N(l)With visibility matrix V(l)：
Wherein matrix T(l)Including the configured transmission unrelated with transmission time, other transmission matrixs are all related with transmission time；
Matrix A(l)Including the geometric shapes factor unrelated with hidden luminescent material panel；Matrix N(l)Including with all hidden finishes
The related ingredient of charge level plate；Matrix V(l)Include the item visible of accumulation, i.e.,
Further, the reverse non-ken optical transport, by ignoring normal direction and item visible (i.e.), formula
(7) it will become linear；The radiometric inverse problem for restoring hidden luminescent material panel can be expressed as：
Using formula (7), a kind of nonlinear model can be proposed, as follows：
Wherein Λ (n) is the Prior function of normal direction n, for forcingAnd its slickness；It is logical
Cross loose constraint condition：V must be two-value, and assume that Prior function is convex function, can obtain the object function of the above problem
It is non-linear but three convex functions；
The above problem is solved using Iterative Least Squares Method；For this purpose, giving item visible V, normal direction n and hidden surface simultaneously
The random initial value of reflectivity ρ, then pass through the problem of iterative solution (10)；In the renewal process of reflectivity ρ, sytem matrix All it is changeless in iterative process k each time；The renewal process of item visible V is still
It is so the process of a convex optimization, is asked this is because a matrix can be constructed and then problem is described as being a quadratic programming
Topic, secondary object function are about the derivative of item visible V：
It, can be single normal direction n in the renewal process of normal direction niIt is expressed as：
ni(u, v)=[cos (u) sin (v), sin (u) cos (v), cos (v)]T (12)
In this process, usually there are ‖ ni‖=1 (u, v).
Wherein, the boundary of non-ken imaging, quantifies the posteriority of reconstruct Reflectivity Model using Bayesian frame
The covariance of distribution function, it is σ to use variance to the noise of sensor2Gauss model, covariance matrix Λnoise=σ2I；To which posteriority function is：
Wherein ΛpriorIt is the covariance matrix of Prior function, it can be modeled as laplacian distribution, be approximately two height
The sum of this distribution, i.e.,：
Λ is solved using the approximate method of low-rankpost；It is hidden from the measured value recovery one obtained by single laser
Amount, combination obtains to obtain measured value by five different lasers, confidence interval allowed to maximize.
Wherein, the non-ken using single-photon detector is imaged, including single-photon avalanche diode model, monochromatic light
Sub- inversion imaging.
Further, the single-photon avalanche diode model, single photon avalanche diode detector is with a picosecond rank
To record the behavior of photon；Often record completes the behavior of a photon, and single-photon avalanche diode can all reset；This process passes through
Often need hundreds of nanoseconds；One single-photon avalanche diode is further characterized by time jitter error, and time jitter error uses
Time convolution *tCarry out the uncertainty of simulated time stamp mechanism；
The ideal photon counter of one time that incident photon stream is recorded using determining time window, can be according to following
Mode samples velocity function：
λ=(f*tJ(ρ,V))+d (15)
Assuming that the photon behavior between continuous laser pulse is independent from each other (this low photon flux being imaged in the non-ken
In the case of usually set up), the probability of a certain number of photon behaviors is detected in a histogram container, Poisson distribution table can be used
Show：
The photon detection that wherein η ∈ [0,1] are made of the quantum efficiency and probability of failure of single-photon avalanche diode is general
Rate.
Further, the single photon inversion imaging, from fuzzy and have in the single-photon avalanche diode histogram made an uproar
Non- ken image reconstruction is carried out, is a nonlinear inversion problem, needs to solve poisson solution convolution problem；Utilize formula
(16), reconstruction can be described as following maximal possibility estimation problem：
Wherein p (h |) is the likelihood function of measured value h, Jf=f*tJ is the imaging model of single-photon avalanche diode, Γ
(ρ) is the optimal Prior function for restoring signal；
Without loss of generality, the nonnegativity restrictions in formula (17) is substituted for indicator functionAnd formula (17) weight
Newly write as：
Inside above-mentioned formula, z1、z2And z3It is slack variable.
Description of the drawings
Fig. 1 is a kind of system construction drawing of the non-ken imaging technique based on single-photon detector of the present invention.
Fig. 2 is that a kind of present invention non-ken imaging technique based on single-photon detector utilizes the non-of single-photon detector
The design sketch of ken imaging technique.
Fig. 3 is the multistage bullet between a kind of different panels of the non-ken imaging technique based on single-photon detector of the present invention
It jumps reflection light and transmits schematic diagram.
Specific implementation mode
It should be noted that in the absence of conflict, the features in the embodiments and the embodiments of the present application can phase
It mutually combines, invention is further described in detail in the following with reference to the drawings and specific embodiments.
Fig. 1 is a kind of system construction drawing of the non-ken imaging technique based on single-photon detector of the present invention.
Wherein, the forward direction and retrograde optical transport mainly include the non-ken optical transport, time-resolved of barrier
Non- ken optical transport, reverse non-ken optical transport.
Further, the non-ken optical transport for having barrier, it is assumed that all surfaces can use Lambertian double
It is described to Reflectance Distribution Function, each piece of luminescent material panel i is by position xi, surface normal niWith scattered reflection rate ρiThree ginsengs
Amount indicates；The radiancy b of luminescent material panel iiRadiation flux total when light is reflected away from material surface is given, i.e.,：
Wherein eiIndicate emitted energy, FijIndicate the Geometric structure factor between the surface luminescent material panel of two fragments,
Its form is：
Wherein vijIt is the two-value visuality function between luminescent material panel；
Further, the time-resolved non-ken optical transport, using the light source of movement as a pulse laser,
It is used in combination a sensor to carry out ultra-fast measurement；Time-resolved radiometry value can be derived by by formula (18), i.e.,：
WhereinIt is the radiancy of a time-varying, indicates that visible luminescent material panel k is sent out in moment t by pulse laser
It is mapped to the radiancy of luminescent material panel l；Visible luminescent material panel can be located at x by onesDetected pixel direct imaging,
I.e.：
By imaging model according to alphabet sortord vector quantization, can obtain：
WhereinIt is the direct illumination component of time-resolved conversion process, indirect illumination component is by space-time conversion matrix
Γ(l)It indicates；By several different visible light material panel l=1,2 ..., L, it can derive that imaging model is：
Wherein
Further, the space-time conversion matrix, Γ(l)Four parts, including time sampling matrix T can be decomposed into(l), visible form factor matrix A(l), hidden form factor matrix N(l)With visibility matrix V(l)：
Wherein matrix T(l)Including the configured transmission unrelated with transmission time, other transmission matrixs are all related with transmission time；
Matrix A(l)Including the geometric shapes factor unrelated with hidden luminescent material panel；Matrix N(l)Including with all hidden finishes
The related ingredient of charge level plate；Matrix V(l)Include the item visible of accumulation, i.e.,
Further, the reverse non-ken optical transport, by ignoring normal direction and item visible (i.e.), formula
(6) it will become linear；The radiometric inverse problem for restoring hidden luminescent material panel can be expressed as：
Using formula (6), a kind of nonlinear model can be proposed, as follows：
Wherein Λ (n) is the Prior function of normal direction n, for forcingAnd its slickness；It is logical
Cross loose constraint condition：V must be two-value, and assume that Prior function is convex function, can obtain the object function of the above problem
It is non-linear but three convex functions；
The above problem is solved using Iterative Least Squares Method；For this purpose, giving item visible V, normal direction n and hidden surface simultaneously
The random initial value of reflectivity ρ, then pass through the problem of iterative solution (9)；In the renewal process of reflectivity ρ, sytem matrix All it is changeless in iterative process k each time；The renewal process of item visible V is still
It is so the process of a convex optimization, is asked this is because a matrix can be constructed and then problem is described as being a quadratic programming
Topic, secondary object function are about the derivative of item visible V：
It, can be single normal direction n in the renewal process of normal direction niIt is expressed as：
ni(u, v)=[cos (u) sin (v), sin (u) cos (v), cos (v)]T (11)
In this process, usually there are ‖ ni‖=1 (u, v).
Wherein, the boundary of non-ken imaging, quantifies the posteriority of reconstruct Reflectivity Model using Bayesian frame
The covariance of distribution function, it is σ to use variance to the noise of sensor2Gauss model, covariance matrix Λnoise=σ2I；To which posteriority function is：
Wherein ΛpriorIt is the covariance matrix of Prior function, it can be modeled as laplacian distribution, be approximately two height
The sum of this distribution, i.e.,：
Λ is solved using the approximate method of low-rankpost；It is hidden from the measured value recovery one obtained by single laser
Amount, combination obtains to obtain measured value by five different lasers, confidence interval allowed to maximize.
Fig. 2 is that a kind of present invention non-ken imaging technique based on single-photon detector utilizes the non-of single-photon detector
The design sketch of ken imaging technique.
Wherein, the non-ken using single-photon detector is imaged, including single-photon avalanche diode model, monochromatic light
Sub- inversion imaging.
Further, the single-photon avalanche diode model, single photon avalanche diode detector is with a picosecond rank
To record the behavior of photon；Often record completes the behavior of a photon, and single-photon avalanche diode can all reset；This process passes through
Often need hundreds of nanoseconds；One single-photon avalanche diode is further characterized by time jitter error, and time jitter error uses
Time convolution *tCarry out the uncertainty of simulated time stamp mechanism；
The ideal photon counter of one time that incident photon stream is recorded using determining time window, can be according to following
Mode samples velocity function：
λ=(f*tJ(ρ,V))+d (14)
Assuming that the photon behavior between continuous laser pulse is independent from each other (this low photon flux being imaged in the non-ken
In the case of usually set up), the probability of a certain number of photon behaviors is detected in a histogram container, Poisson distribution table can be used
Show：
The photon detection that wherein η ∈ [0,1] are made of the quantum efficiency and probability of failure of single-photon avalanche diode is general
Rate.
Further, the single photon inversion imaging, from fuzzy and have in the single-photon avalanche diode histogram made an uproar
Non- ken image reconstruction is carried out, is a nonlinear inversion problem, needs to solve poisson solution convolution problem；Utilize formula
(15), reconstruction can be described as following maximal possibility estimation problem：
Wherein p (h |) is the likelihood function of measured value h, Jf=f*tJ is the imaging model of single-photon avalanche diode, Γ
(ρ) is the optimal Prior function for restoring signal；
Without loss of generality, the nonnegativity restrictions in formula (17) is substituted for indicator functionAnd formula (17) weight
Newly write as：
Inside above-mentioned formula, z1、z2And z3It is slack variable.
Fig. 3 is the multistage bullet between a kind of different panels of the non-ken imaging technique based on single-photon detector of the present invention
It jumps reflection light and transmits schematic diagram.
Non- ken imaging is to restore the reflectivity for the luminescent material panel that those can not directly be obtained by video camera；It is non-to regard
Domain reconstructs the optical property that hidden luminescent material panel is speculated using the object of indirec radiation；Expansion formula (1) can obtain：
Wherein transmitting light ekIt is the radiancy of luminescent material panel k.
For those skilled in the art, the present invention is not limited to the details of above-described embodiment, in the essence without departing substantially from the present invention
In the case of refreshing and range, the present invention can be realized in other specific forms.In addition, those skilled in the art can be to this hair
Bright to carry out various modification and variations without departing from the spirit and scope of the present invention, these improvements and modifications also should be regarded as the present invention's
Protection domain.Therefore, the following claims are intended to be interpreted as including preferred embodiment and falls into all changes of the scope of the invention
More and change.
Claims (10)
1. a kind of non-ken imaging technique based on single-photon detector, which is characterized in that main to be passed to reverse light including preceding
Defeated (one)；The boundary (two) of non-ken imaging；It is imaged (three) using the non-ken of single-photon detector.
2. based on forward direction and retrograde optical transport (one) described in claims 1, which is characterized in that mainly include barrier
Non- ken optical transport, time-resolved non-ken optical transport, reverse non-ken optical transport.
3. based on the non-ken optical transport for having barrier described in claims 2, which is characterized in that assuming that all surfaces are all
It can be described with Lambertian bidirectional reflectance distribution function, each piece of luminescent material panel i is by position xi, surface normal niAnd scattering
Reflectivity ρiThree expressed as parameters；The radiancy b of luminescent material panel iiGive radiation total when light is reflected away from material surface
Flux, i.e.,：
Wherein eiIndicate emitted energy, FijIndicate the Geometric structure factor between the surface luminescent material panel of two fragments, shape
Formula is：
Wherein vijIt is the two-value visuality function between luminescent material panel；
Non- ken imaging is to restore the reflectivity for the luminescent material panel that those can not directly be obtained by video camera；Non- ken weight
Structure speculates the optical property of hidden luminescent material panel using the object of indirec radiation；Expansion formula (1) can obtain：
Wherein transmitting light ekIt is the radiancy of luminescent material panel k.
4. based on the time-resolved non-ken optical transport described in claims 2, which is characterized in that using the light source of movement as
One pulse laser is used in combination a sensor to carry out ultra-fast measurement；Time-resolved radiometry value can be by formula
(3) it is derived by, i.e.,：
WhereinIt is the radiancy of a time-varying, indicates visible luminescent material panel k in moment t by pulse laser emission to light
The radiancy of material panel l；Visible luminescent material panel can be located at x by onesDetected pixel direct imaging, i.e.,：
By imaging model according to alphabet sortord vector quantization, can obtain：
WhereinIt is the direct illumination component of time-resolved conversion process, indirect illumination component is by space-time conversion matrix Γ(l)Table
Show；By several different visible light material panel l=1,2 ..., L, it can derive that imaging model is：
Wherein
5. based on the space-time conversion matrix described in claims 4, which is characterized in that Γ(l)Four parts can be decomposed into, are wrapped
Include time sampling matrix T(l), visible form factor matrix A(l), hidden form factor matrix N(l)With visibility matrix V(l)：
Wherein matrix T(l)Including the configured transmission unrelated with transmission time, other transmission matrixs are all related with transmission time；Matrix
A(l)Including the geometric shapes factor unrelated with hidden luminescent material panel；Matrix N(l)Including with all hidden finish charge levels
The related ingredient of plate；Matrix V(l)Include the item visible of accumulation, i.e.,
6. based on the reverse non-ken optical transport described in claims 2, which is characterized in that by ignoring normal direction and item visible
(i.e.Formula (7) will become linear；The radiometric inverse problem for restoring hidden luminescent material panel can be expressed as：
Using formula (7), a kind of nonlinear model can be proposed, as follows：
Wherein Λ (n) is the Prior function of normal direction n, for forcingAnd its slickness；Pass through pine
Relaxation constraints：V must be two-value, and assume that Prior function is convex function, can obtain the object function right and wrong of the above problem
Linear but three convex functions；
The above problem is solved using Iterative Least Squares Method；For this purpose, giving the anti-of item visible V, normal direction n and hidden surface simultaneously
The random initial values of rate ρ are penetrated, then by iteratively solving problem (10)；In the renewal process of reflectivity ρ, sytem matrix All it is changeless in iterative process k each time；The renewal process of item visible V is still
It is so the process of a convex optimization, is asked this is because a matrix can be constructed and then problem is described as being a quadratic programming
Topic, secondary object function are about the derivative of item visible V：
It, can be single normal direction n in the renewal process of normal direction niIt is expressed as：
ni(u, v)=[cos (u) sin (v), sin (u) cos (v), cos (v)]T (12)
In this process, usually there are ‖ ni‖=1 (u, v).
7. the boundary (two) based on the non-ken imaging described in claims 1, which is characterized in that using Bayesian frame come amount
The covariance for changing the Posterior distrbutionp function of reconstruct Reflectivity Model, it is σ to use variance to the noise of sensor2Gauss model,
Its covariance matrix is Λnoise=σ2I；To which posteriority function is：
Wherein ΛpriorIt is the covariance matrix of Prior function, it can be modeled as laplacian distribution, be approximately two Gausses point
The sum of cloth, i.e.,：
Λ is solved using the approximate method of low-rankpost；Restore a hidden amount from the measured value obtained by single laser,
Combination obtains to obtain measured value by five different lasers, and confidence interval is allowed to maximize.
8. being imaged (three) based on the non-ken using single-photon detector described in claims 1, which is characterized in that including list
Photon avalanches diode model, single photon inversion imaging.
9. based on the single-photon avalanche diode model described in claims 8, which is characterized in that single-photon avalanche diode is visited
Survey the behavior that device records photon with picosecond rank；Often record completes the behavior of a photon, and single-photon avalanche diode all can
It resets；This process is frequently necessary to hundreds of nanoseconds；One single-photon avalanche diode is further characterized by time jitter error, when
Jitter error usage time convolution *tCarry out the uncertainty of simulated time stamp mechanism；
The ideal photon counter of one time that incident photon stream is recorded using determining time window, can as follows
Velocity function is sampled：
λ=(f*tJ(ρ,V))+d (15)
Assuming that the photon behavior between continuous laser pulse is independent from each other (this low photon flux situation being imaged in the non-ken
Under usually set up), the probability of a certain number of photon behaviors is detected in a histogram container, can be indicated with Poisson distribution：
The photon detection probability that wherein η ∈ [0,1] are made of the quantum efficiency and probability of failure of single-photon avalanche diode.
10. based on the single photon inversion imaging described in claims 8, which is characterized in that avenged from obscuring and having the single photon made an uproar
It collapses and carries out non-ken image reconstruction in diode histogram, be a nonlinear inversion problem, need to solve Poisson uncoiling
Product problem；Using formula (16), reconstruction can be described as following maximal possibility estimation problem：
Wherein p (h |) is the likelihood function of measured value h, Jf=f*tJ is the imaging model of single-photon avalanche diode, Γ (ρ)
It is the optimal Prior function for restoring signal；
Without loss of generality, the nonnegativity restrictions in formula (17) is substituted for indicator functionAnd formula (17) is write again
At：
Inside above-mentioned formula, z1、z2And z3It is slack variable.
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| CN109100028A (en) * | 2018-08-28 | 2018-12-28 | 南昌大学 | A kind of device and method for simulating single photon pulses signal source |
| CN109100028B (en) * | 2018-08-28 | 2020-06-16 | 南昌大学 | Device and method for simulating single photon pulse signal source |
| CN109816603A (en) * | 2018-12-30 | 2019-05-28 | 天津大学 | The imaging sensor image restoring method of single photon counting imaging |
| CN109816603B (en) * | 2018-12-30 | 2023-04-11 | 天津大学 | Image restoration method for image sensor based on single photon counting imaging |
| CN109887018A (en) * | 2019-02-28 | 2019-06-14 | 中国计量大学 | A kind of photon 3D imaging system based on deep learning |
| CN110187356A (en) * | 2019-06-14 | 2019-08-30 | 中国科学技术大学 | Remote super-resolution single photon image reconstructing method |
| CN110187356B (en) * | 2019-06-14 | 2021-07-09 | 中国科学技术大学 | Remote super-resolution single photon imaging reconstruction method |
| CN112444821A (en) * | 2020-11-11 | 2021-03-05 | 中国科学技术大学 | Remote non-visual field imaging method, apparatus, device and medium |
| CN112444821B (en) * | 2020-11-11 | 2022-09-09 | 中国科学技术大学 | Remote non-visual field imaging method, apparatus, device and medium |
| CN116087983A (en) * | 2023-04-07 | 2023-05-09 | 清华大学 | Non-visual field imaging method and device for very few detection points |
| CN116087983B (en) * | 2023-04-07 | 2023-07-11 | 清华大学 | Non-visual field imaging method and device for very few detection points |
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