CN108317968A - Structured light projection rapid measurement device and method - Google Patents
Structured light projection rapid measurement device and method Download PDFInfo
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- CN108317968A CN108317968A CN201810045427.1A CN201810045427A CN108317968A CN 108317968 A CN108317968 A CN 108317968A CN 201810045427 A CN201810045427 A CN 201810045427A CN 108317968 A CN108317968 A CN 108317968A
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- diffraction grating
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- phase
- structured light
- measurement device
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2531—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
Abstract
The invention belongs to field of photodetection, and in particular to a kind of structured light projection rapid measurement device and method.Measuring device includes camera and the optical projection system that is arranged in around camera, the optical projection system include N number of diffraction grating and with diffraction grating N number of light source correspondingly, the phase shift bar graph of sinusoidal pattern is generated after light sources project to grating；The phase difference with 2 π/N, N number of light source are connected by synchronous circuit with camera respectively between the N width phase shift bar graphs that N number of diffraction grating generates.The present invention solves the technical problem that existing measuring apparatus volume is big, quality weight and measuring speed are slow.
Description
Technical field
The invention belongs to field of photodetection, and in particular to a kind of structured light projection rapid measurement device and method.
Background technology
Structured light projection method is measurement of full field method, there is that measuring speed is fast, precision is high, simple in measurement system structure, is easy to real
The advantages that existing computer control, the structural light stripes figure that one group is distributed by structured light projection method according to certain rules by optical projection system
(such as sine streak) projects to testee surface, and the height of testee adjusts the amplitude and phase of projected fringe
System, the distressed structure striations figure acquired using imaging system, using certain algorithm by the elevation information in deforming stripe figure
It demodulates and, to obtain the three-D profile of object.
Structured light projection method measuring apparatus is mostly the combination that camera adds projecting apparatus, the larger space of the hold facility, volume
Greatly, quality weight, it has not been convenient to carry, and measuring speed is slower.
Invention content
It is an object of the present invention to provide a kind of structured light projection rapid measurement device and methods, solve existing measuring apparatus
The technical problem that volume is big, quality is heavy and measuring speed is slow.
Technical solution of the invention is：A kind of structured light projection rapid measurement device, is characterized in that：Including
Camera and the optical projection system being arranged in around camera, the optical projection system include N number of diffraction grating and and diffraction light
Grid N number of light source correspondingly generates the phase shift bar graph of sinusoidal pattern after light sources project to grating；N number of diffraction grating generates
N width phase shift bar graphs between the phase difference with 2 π/N, N number of light source is connected by synchronous circuit with camera respectively.
Further, above-mentioned diffraction grating is provided centrally with full impregnated light circular hole, utilizes the light and mark by this circular hole
Fixed board information simultaneous resolves position and the posture relationship of camera and diffraction grating, is provided finally accurately to acquire three-dimensional reconstruction result
Parameter.
Further, N number of diffraction grating is arranged in parallel.
Further, the quantity of the diffraction grating in above-mentioned optical projection system is four.
Further, above-mentioned optical projection system is in rectangular layout, and four diffraction grating are located at four tops of rectangle
Point, the camera are located at the center of rectangle.
The present invention also provides a kind of structured light projection method for fast measuring, are characterized in that, include the following steps：
1) building structure light projects rapid measurement device；
2) the distance between N number of diffraction grating and camera and angular relationship, the intrinsic parameter of calibration for cameras are demarcated；
3) N number of light source is controlled to shine successively, phase shift bar graph from optical projection system to object under test projection sinogram case,
Camera measuring targets, which synchronize to take pictures, collects N width images；
4) it utilizes N step phase shift methods to solve the phase distribution of deformation phase shift bar graph, acquires the wrapped phase of object；
5) Phase- un- wrapping technology is utilized, wrapped phase is reverted into complete continuous phase；
6) calibration result in step 2) is utilized, converts the phase information that step 5) obtains to true object under test three
Tie up profile information.
Further, the distance between diffraction grating and camera and the scaling method of angular relationship are in step 2)：It will mark
Fixed board puts several different locations and posture, while recording what center of circle light in diffraction grating was shot with scaling board intersection point in camera
Image, in simultaneous equations of light ray and each image equation of the scaling board plane under camera coordinates system acquire each diffraction grating and
The distance between camera and angular relationship.
Further, the method for calibration for cameras intrinsic parameter is solved by shooting several scaling board images in step 2)
It calculates.
Further, the Phase- un- wrapping technology used in step 5) is min-cost max-flow algorithm.
The beneficial effects of the present invention are：The present invention integrates camera and projection device, and projection device is using throwing
Shadow grating, small, light weight；It realizes measuring apparatus integrated design and makes.Traditional method is avoided, projection is passed through
Instrument projects several bar graphs to body surface；The present invention is projected respectively by multiple gratings, takes full advantage of the space of camera, is surveyed
Measure system compact.Projection device grenade instrumentation and camera use hardware synchronization triggering mode, and synchronization accuracy is high, may be implemented faster
The quick measurement of speed.In measurement process after one-shot measurement triggering, the acquisition of several different phase shift bar graphs can be automatically performed；
Measuring system measures quick；When avoiding several phase diagrams of traditional projection, in the way of software triggering.
Description of the drawings
Fig. 1 is the preferred embodiment structural schematic diagram that structure of the invention light projects rapid measurement device.
Fig. 2 is the four width phase shift bar graphs that structure of the invention light projects that rapid measurement device projects.
Fig. 3 is the calibration process schematic diagram that structure of the invention light projects rapid measurement device.
Specific implementation mode
The present invention is a kind of structured light projection rapid measurement device, and the structure of preferred embodiment includes camera and is arranged in
Optical projection system around camera, optical projection system include N number of diffraction grating and with diffraction grating N number of light correspondingly
Source generates the phase shift bar graph of sinusoidal pattern after light sources project to grating；The N width phase shifts bar graph that N number of diffraction grating generates it
Between the phase difference with 2 π/N, N number of light source is connected by synchronous circuit with camera respectively.
Further, diffraction grating is provided centrally with full impregnated light circular hole, utilizes the light and scaling board by this circular hole
Information simultaneous resolves position and the posture relationship of camera and diffraction grating, for finally accurately acquiring three-dimensional reconstruction result provides ginseng
Number.The arrangement of N number of diffraction grating should as possible be made using optical means it is parallel, and to demarcate N number of grating space phase
Relationship.
As shown in Figure 1, the quantity of diffraction grating is four in the present embodiment.Optical projection system is in rectangular layout, four
Diffraction grating 1 is located at four vertex of rectangle, and camera 2 is located at the center of rectangle.It projects to obtain by this four diffraction grating
Pattern as shown in Fig. 2, the centre dot of each pattern indicates the circular hole of full impregnated light.
Included the following steps using the method that the present embodiment structured light projection rapid measurement device measures：
The first step arranges camera；Camera is placed in the centre position of measuring apparatus.
Second step makes diffraction grating, and phase shift bar graph is generated after light sources project to diffraction grating, and phase shift bar graph is just
String pattern, the fourth officer phase shift bar graph of generation, adjacent bar graph have that pi/2 phase is poor, make four pieces of diffraction grating altogether, and every
A full impregnated light circular hole is carved in the centre position of block diffraction grating, and optical projection system is formed by light source and diffraction grating.
Third walks, and the optical projection system that camera and second step generate is put together, Fig. 1 only gives a kind of placement
Scheme can reasonably arrange the spatial position of optical projection system and camera according to the bulk of measuring apparatus；Four diffraction
The arrangement of grating should as possible be made using optical means it is parallel, and to demarcate four diffraction grating space phase relation.
4th step demarcates the distance between four diffraction grating and camera and angular relationship, the intrinsic parameter of calibration for cameras.It adopts
Use gridiron pattern scaling board as calibration object, the intrinsic parameter of camera can be by shooting several scaling board image calculations；It then again will mark
Fixed board puts several different locations and posture, while the image of recording laser ranging information and camera shooting, as shown in Figure 3.
The dot at diffraction grating center centre coordinate under camera coordinates system is O1, radiation direction D1, then equations of light ray
It is represented by
Equation of the scaling board plane under camera coordinates system in each image it is also known that, be expressed as：
Ax+by+cz+d=0 (2)
So, light intersects at a point with scaling board plane, is denoted as P.Simultaneous formula (1), (2), pass through what is repeatedly shot
Information can build equation group, to calculate equations of light ray.And then obtain position and appearance between each diffraction grating and camera
State relationship.
4th step controls the light source after diffraction grating and shines successively successively respectively, and optical projection system just projects sinusoidal item
Line figure is to body surface, and when projecting sine streak every time, camera is taken pictures；Light source illuminates successively, and camera is in each point of light source
Synchronous photo taking when bright；
5th step preserves collected 4 width image, and completing four-stepped switching policy using formula (1) solves deformation phase shift item
The phase distribution of line figure acquires the wrapped phase of object, that is, the phase main value codomain acquired is (- π, π)；
Similarly, if using three gratings, the adjacent striped of each grating has the phase difference of 2 π/3, can utilize at this time
Three step phase shift methods, acquire phase result；Similarly, using N number of grating, phase shift method can be walked with N, acquires phase result；
Wrapped phase is reverted to complete continuous phase by the 6th step using Phase- un- wrapping technology.It may be used most
The phase unwrapping package method of small expense max-flow, this method have stronger noise resisting ability, and solving speed is fast, can also protect well
Hold the consistency of phase.
7th step converts phase result to true three-D profile information using the calibration result of camera and grating.Profit
Phase transition with structured light projection formula measuring system, which is the relationship of three-D profile, can obtain true three-D profile information.
Claims (9)
1. a kind of structured light projection rapid measurement device, it is characterised in that：It is thrown including camera and the optics being arranged in around camera
Shadow system, the optical projection system include N number of diffraction grating and with diffraction grating N number of light source correspondingly, light sources project
The phase shift bar graph of sinusoidal pattern is generated after to grating；With 2 π/N between the N width phase shift bar graphs that N number of diffraction grating generates
Phase difference, N number of light source are connected by synchronous circuit with camera respectively.
2. structured light projection rapid measurement device according to claim 1, it is characterised in that：The center of the diffraction grating
It is provided with full impregnated light circular hole.
3. structured light projection rapid measurement device according to claim 2, it is characterised in that：N number of diffraction grating is mutually flat
Row setting.
4. according to any structured light projection rapid measurement device in claim 1-3, it is characterised in that：The optics is thrown
The quantity of diffraction grating in shadow system is four.
5. structured light projection rapid measurement device according to claim 4, it is characterised in that：The optical projection system is in
Rectangular arrangement, four diffraction grating are located at four vertex of rectangle, and the camera is located at the center of rectangle.
6. a kind of structured light projection method for fast measuring, which is characterized in that include the following steps：
1) the structured light projection rapid measurement device as described in any in claim 1-5 is built；
2) the distance between N number of diffraction grating and camera and angular relationship, the intrinsic parameter of calibration for cameras are demarcated；
3) it controls N number of light source to shine successively, optical projection system is to the phase shift bar graph of object under test projection sinogram case, camera
Measuring targets, which synchronize to take pictures, collects N width images；
4) it utilizes N step phase shift methods to solve the phase distribution of deformation phase shift bar graph, acquires the wrapped phase of object；
5) Phase- un- wrapping technology is utilized, wrapped phase is reverted into complete continuous phase；
6) calibration result in step 2) is utilized, converts the phase information that step 5) obtains to true object under test three-dimensional wheel
Wide information.
7. structured light projection method for fast measuring according to claim 6, which is characterized in that in step 2) diffraction grating with
The distance between camera and the scaling method of angular relationship are：Several different locations of board placing and posture will be demarcated, will be recorded simultaneously
The image that center of circle light and scaling board intersection point are shot in camera in diffraction grating, scaling board in simultaneous equations of light ray and each image
Equation of the plane under camera coordinates system acquires distance and angular relationship between each diffraction grating and camera.
8. structured light projection method for fast measuring according to claim 7, it is characterised in that：In step 2) in calibration for cameras
The method of parameter is resolved by shooting several scaling board images.
9. according to any structured light projection method for fast measuring in claim 6-8, it is characterised in that：It is adopted in step 5)
Phase- un- wrapping technology is min-cost max-flow algorithm.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109932371A (en) * | 2019-04-02 | 2019-06-25 | 易思维（杭州）科技有限公司 | Mirror surface/class mirror article defect detecting device |
| CN111476788A (en) * | 2020-04-27 | 2020-07-31 | 武汉精立电子技术有限公司 | Display screen interlayer defect detection method and system |
| CN112762859A (en) * | 2020-12-22 | 2021-05-07 | 四川大学 | High-precision three-dimensional measuring device for sine stripe structured light of non-digital optical machine |
| CN115014724A (en) * | 2022-08-10 | 2022-09-06 | 歌尔光学科技有限公司 | System, method and device for testing diffraction light waveguide |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101292540A (en) * | 2005-08-22 | 2008-10-22 | 德克萨斯仪器股份有限公司 | Apparatus and methods for combining camera and projector functions in a single device |
| CN201234971Y (en) * | 2008-07-09 | 2009-05-13 | 中国科学院上海光学精密机械研究所 | Three-dimensional endoscopic measurement apparatus based on amplitude type transmission grating projection |
| CN203037221U (en) * | 2013-01-22 | 2013-07-03 | 廖怀宝 | Measuring apparatus used for realizing N step phase-shift method (PMP algorithm) |
| CN104132624A (en) * | 2014-08-14 | 2014-11-05 | 北京卫星环境工程研究所 | Device for measuring spacecraft structure deformation based on speckle interference and fringe projection and measurement method |
| CN105657403A (en) * | 2016-02-22 | 2016-06-08 | 易喜林 | FPGA (Field Programmable Gate Array) based structural light projection and image acquisition synchronization system |
| CN205864632U (en) * | 2016-07-28 | 2017-01-04 | 易喜林 | 3D camera external trigger synchronous integration system |
| CN207741710U (en) * | 2018-01-17 | 2018-08-17 | 中国科学院西安光学精密机械研究所 | Structured light projection rapid measurement device |
-
2018
- 2018-01-17 CN CN201810045427.1A patent/CN108317968A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101292540A (en) * | 2005-08-22 | 2008-10-22 | 德克萨斯仪器股份有限公司 | Apparatus and methods for combining camera and projector functions in a single device |
| CN201234971Y (en) * | 2008-07-09 | 2009-05-13 | 中国科学院上海光学精密机械研究所 | Three-dimensional endoscopic measurement apparatus based on amplitude type transmission grating projection |
| CN203037221U (en) * | 2013-01-22 | 2013-07-03 | 廖怀宝 | Measuring apparatus used for realizing N step phase-shift method (PMP algorithm) |
| CN104132624A (en) * | 2014-08-14 | 2014-11-05 | 北京卫星环境工程研究所 | Device for measuring spacecraft structure deformation based on speckle interference and fringe projection and measurement method |
| CN105657403A (en) * | 2016-02-22 | 2016-06-08 | 易喜林 | FPGA (Field Programmable Gate Array) based structural light projection and image acquisition synchronization system |
| CN205864632U (en) * | 2016-07-28 | 2017-01-04 | 易喜林 | 3D camera external trigger synchronous integration system |
| CN207741710U (en) * | 2018-01-17 | 2018-08-17 | 中国科学院西安光学精密机械研究所 | Structured light projection rapid measurement device |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109932371A (en) * | 2019-04-02 | 2019-06-25 | 易思维（杭州）科技有限公司 | Mirror surface/class mirror article defect detecting device |
| CN111476788A (en) * | 2020-04-27 | 2020-07-31 | 武汉精立电子技术有限公司 | Display screen interlayer defect detection method and system |
| CN111476788B (en) * | 2020-04-27 | 2023-08-25 | 武汉精立电子技术有限公司 | Display screen interlayer defect detection method and system |
| CN112762859A (en) * | 2020-12-22 | 2021-05-07 | 四川大学 | High-precision three-dimensional measuring device for sine stripe structured light of non-digital optical machine |
| CN112762859B (en) * | 2020-12-22 | 2022-08-09 | 四川大学 | High-precision three-dimensional measuring device for sine stripe structured light of non-digital optical machine |
| CN115014724A (en) * | 2022-08-10 | 2022-09-06 | 歌尔光学科技有限公司 | System, method and device for testing diffraction light waveguide |
| CN115014724B (en) * | 2022-08-10 | 2022-11-22 | 歌尔光学科技有限公司 | System, method and device for testing diffraction light waveguide |
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