CN108256790A - For the method and apparatus of monitoring of equipment - Google Patents
For the method and apparatus of monitoring of equipment Download PDFInfo
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- CN108256790A CN108256790A CN201810203343.6A CN201810203343A CN108256790A CN 108256790 A CN108256790 A CN 108256790A CN 201810203343 A CN201810203343 A CN 201810203343A CN 108256790 A CN108256790 A CN 108256790A
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- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
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- G06Q10/20—Administration of product repair or maintenance
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Abstract
The present invention relates to a kind of method and apparatus for monitoring of equipment, this method includes：When the currently practical yield of equipment is not up to its target output, the current actual value of the multiple parameters of the equipment is obtained, wherein, the multiple parameter is on the influential parameter of the yield of the equipment；According to the multiple parameter and the functional relation of the yield of the equipment and the current actual value of the multiple parameter, calculate the imaginary yield of any parameter in the multiple parameter, wherein, the imaginary yield of any parameter represents the yield of the equipment calculated when the value that the value of any parameter is equal to the other parameters in the current actual value and the multiple parameter of any parameter is equal to desired value using the functional relation；According to the imaginary yield of any parameter and the target output, the contribution margin that any parameter declines the yield of the equipment is determined.Using this method and device, the contribution margin that the parameter of equipment declines the yield of equipment can be obtained.
Description
Technical field
The present invention relates to the method and apparatus for monitoring of equipment.
Background technology
It usually is used to produce the production equipment of product or semi-finished product and for test product in the presence of many in manufacturing works
Test equipment, they are usually complicated and with numerous parameters.Due to a variety of causes such as aging or failure, these productions
Equipment and test equipment are in use it sometimes appear that yield declines, so as to influence the production capacity of factory.Every time when these
When yield decline occurs in equipment, it is equipment that maintenance personal, which usually requires the parameters of seriatim detection device to find bottom,
Which parameter causes equipment yield to decline.
The yield of equipment is caused to decline although existing detection method can find which parameter that bottom is equipment,
It is that existing detection method not can determine that the contribution margin that these parameters respectively decline the yield of equipment, so as to maintenance personal
It not can determine that the yield of equipment declines mainly as caused by which parameter of equipment, thus, maintenance personal cannot take effectively
Measure carry out rapid-maintenance equipment.
Invention content
The embodiment of the present invention provides the method and apparatus for monitoring of equipment, can at least obtain the parameter pair of equipment
The contribution margin that the yield of equipment declines.
A kind of method for monitoring of equipment of embodiment according to the invention, including：When the currently practical yield of equipment
Not up to its target output when, obtain the current actual values of the multiple parameters of the equipment, wherein, the multiple parameter is to institute
State the influential parameter of yield of equipment；According to the functional relation of the multiple parameter and the yield of the equipment and the multiple
The current actual value of parameter calculates the imaginary yield of any parameter in the multiple parameter, wherein, the vacation of any parameter
Think that yield represents to be equal to its in the current actual value and the multiple parameter of any parameter when the value of any parameter
The value of its parameter is equal to the yield of the equipment calculated during desired value using the functional relation；And according to described any
The imaginary yield of parameter and the target output determine the contribution margin that any parameter declines the yield of the equipment.
A kind of device for monitoring of equipment of embodiment according to the invention, including：Acquisition module, for working as equipment
When currently practical yield is not up to its target output, the current actual value of the multiple parameters of the equipment is obtained, wherein, it is described more
A parameter is on the influential parameter of the yield of the equipment；Computing module, for according to the multiple parameter and the equipment
The functional relation of yield and the current actual value of the multiple parameter, calculate the imagination of any parameter in the multiple parameter
Yield, wherein, the imaginary yield of any parameter represents to be equal to the current of any parameter when the value of any parameter
It is set when the value of actual value and the other parameters in the multiple parameter is equal to desired value using described in functional relation calculating
Standby yield；And determining module, for the imaginary yield according to any parameter and the target output, determine described
The contribution margin that any parameter declines the yield of the equipment.
A kind of control unit of embodiment according to the invention, including：Processor；And memory, being stored thereon with can
Execute instruction, wherein, the executable instruction causes the processor to perform aforementioned method upon being performed.
A kind of machine readable media of embodiment according to the invention, is stored thereon with executable instruction, wherein, it is described can
Execute instruction causes machine to perform aforementioned method upon being performed.
It can be seen from the above that the scheme of the embodiment of the present invention is not up to mesh in the currently practical yield of equipment
When marking yield using the desired value and current actual value of the influential special parameter of yield on equipment, equipment target output and
The functional relation of the yield of the special parameter and equipment calculates the contribution margin that the special parameter declines the yield of equipment, therefore,
Compared with prior art, the scheme of the embodiment of the present invention can obtain the contribution that the parameter of equipment declines the yield of equipment
Value.
Description of the drawings
The features and advantages of the present invention will become apparent by following description with reference to the accompanying drawings.
Fig. 1 shows the configuration diagram of the system for monitoring of equipment of one embodiment according to the invention.
Fig. 2 shows the overview flow charts of the method for monitoring of equipment of one embodiment according to the invention.
Fig. 3 shows the flow chart of the method for monitoring of equipment of one embodiment according to the invention.
Fig. 4 shows the schematic diagram of the device for monitoring of equipment of one embodiment according to the invention.
Fig. 5 shows the schematic diagram of the control unit of one embodiment according to the invention.
Specific embodiment
Theme described herein is discussed referring now to example embodiment.It should be understood that discuss these embodiments only
It is in order to enable those skilled in the art better understood when so as to fulfill theme described herein, is not to claim
Protection domain, applicability or the exemplary limitation illustrated in book.Protection domain in the present disclosure can not departed from
In the case of, the function of element and arrangement that are discussed are changed.Each example can be as needed, omit, substitute or
Add various processes or component.For example, described method can be performed according to described order different, with
And each step can be added, omits or combine.In addition, the described feature of some opposite examples is in other examples
It can be combined.
As used in this article, term " comprising " and its modification represent open term, are meant that " including but not limited to ".
Term "based" represents " being based at least partially on ".Term " one embodiment " and " embodiment " expression " at least one implementation
Example ".Term " another embodiment " expression " at least one other embodiment ".Term " first ", " second " etc. may refer to not
With or identical object.It can include other definition below, it is either specific or implicit.It is unless bright in context
It really indicates, the otherwise definition of a term is consistent throughout the specification.
In the following, it will be described in detail with reference to accompanying drawings each embodiment of the present invention.
Fig. 1 shows the configuration diagram of the system for monitoring of equipment of one embodiment according to the invention.Fig. 1 institutes
The system 10 for monitoring of equipment shown can include one or more production/test equipments 20 and control unit 30, wherein, control
Unit 30 processed can be connect by way of wire communication or wireless communication with each production/test equipment 20.
Production/test equipment 20 is used to produce/test product.In addition, during production/test product, production/survey
The operation data of its parameters is also stored in its journal file by examination equipment 20 in real time.
Control unit 30 can be the various equipment for having computing capability, including but not limited to all-purpose computer, industry
Computer, microcontroller, server etc..Control unit 30 prestores the influence of each production/test equipment 20i its yield
Parameters and the functional relation of its yield.Technical staff can be set with numerous parameters of ex ante analysis equipment 20i with finding out influence
Those parameters P of the yield of standby 20i, such as the function of the yield determining parameter P and equipment 20i by way of testing etc. close
System, and identified functional relation is stored in control unit 30.In addition, control unit 30 also prestores equipment 20i's
The desired value of the parameters P of its yield of target output and the influence of equipment 20i.
When the actual production of equipment 20i is not up to its target output, in the journal file of 30 slave device 20i of control unit
Obtain the actual value of the parameter P for the yield for influencing equipment 20i, then, the mesh of actual value, parameter P based on acquired parameter P
The target output of scale value and equipment 20i determines the contribution margin that each parameter in parameter P declines the yield of equipment 20i, this
It will be described in detail below with reference to Fig. 2.
Fig. 2 shows the overview flow charts of the method for monitoring of equipment of one embodiment according to the invention.Fig. 2 institutes
The method 200 shown is realized by control unit 30.
As shown in Figure 1, in box 202, control unit 30 is from the journal file of each production/test equipment 20i, week
Extract to phase the data for the currently practical yield for being used to indicate equipment 20i.
In box 204, whether the currently practical yield of the equipment 20i indicated by the extracted data of the judgement of analytical equipment 20
Reach the target output of equipment 20i.
If the judging result of box 204 is affirmative, flow returns to box 202.
In box 206, if the judging result of box 204 is negative, the journal file of 30 slave device 20i of control unit
In, retrieve the respective current actual values of those parameter P influential on the yield of equipment 20i.
Parameter is worked as in the imaginary yield of each parameter Pi in box 208,30 calculating parameter P of control unit, expression
The value of current actual value of the value of Pi equal to parameter Pi and the other parameters in parameter P utilizes pre-stored when being equal to desired value
The yield for the equipment 20i that the functional relation of the yield of parameter P and equipment 20i calculates.
For example, it is assumed that influential parameter P includes three parameters X, Y and Z, parameter P and equipment on the yield of equipment 20i
The functional relation of the yield of 20i is f (X, Y, Z), and the current actual value and desired value of parameter X are Xa and Xt respectively, and parameter Y's works as
Preceding actual value and desired value are Ya and Yt respectively, and the current actual value and desired value of parameter Z are Za and Zt respectively, then, parameter X
Imaginary yield for f (Xa, Yt, Zt), the imaginary yield of parameter Y for f (Xt, Ya, Zt) and, the imaginary yield of parameter Z is f
(Xt,Yt,Za)。
The tribute that each parameter Pi in box 210,30 calculating parameter P of control unit declines the yield of equipment 20i
Value is offered, imaginary yield and the difference of target output of equipment 20i divided by the target output of equipment 20i equal to parameter Pi.Parameter
The contribution amount that Pi declines the yield of equipment 20i the contribution margin expression parameter Pi that the yield of equipment 20i declines, wherein, parameter
The contribution that Pi declines the yield of equipment 20i is bigger, and the absolute value of contribution margin that parameter Pi declines the yield of equipment 20i is got over
Greatly.
For example, the target output for continuing the example above and assuming equipment 20i is Ct, then productions of the parameter X to equipment 20i
The contribution margin that amount declines be (f (Xa, Yt, Zt)-Ct)/Ct, parameter Y is to the contribution margin that the yield of equipment 20i declines (f (Xt,
Ya, Zt)-Ct)/Ct and, parameter Z is (f (Xt, Yt, Za)-Ct)/Ct to the contribution margin that the yield of equipment 20i declines.
In box 212, control unit 30 determines the parameter Pt that the yield of equipment 20i is caused to decline in parameter P, wherein, ginseng
Number Pt is the parameter of its imaginary target output of the yield less than equipment 20i in parameter P.
In the contribution that box 214, control unit 30 decline the yield of equipment 20i each parameter Pi in parameter P
It is worth and cause the parameter Pt that the yield of equipment 20i declines to be sent to Pit Crew, so as to which Pit Crew can quickly determine out
The principal element that the yield of equipment 20i is caused to decline, so as to the maintenance of equipment 20i that takes measures in time
It can be seen from the above that currently practical yield miss the mark yield of the scheme of the present embodiment in equipment
Shi Liyong is on the desired value and current actual value of the influential special parameter of the yield of equipment, the target output of equipment and this is specific
The functional relation of the yield of parameter and equipment calculates the contribution margin that the special parameter declines the yield of equipment, therefore, this implementation
The scheme of example can obtain the contribution margin that the parameter of equipment declines the yield of equipment.In addition, the scheme of the present embodiment utilizes shadow
The imaginary yield of parameter and the target output of equipment of the yield of equipment are rung to determine each ginseng that the yield of equipment is caused to decline
Number, therefore, the scheme of the present embodiment can quick lock in lead to the parameters that the yield of equipment declines.
Other modifications
It will be understood by those skilled in the art that although in the above embodiments, each parameter Pi in parameter P is to equipment
The difference divided by equipment 20i of imaginary yield of the contribution margin equal to parameter Pi of the yield decline of 20i and the target output of equipment 20i
Target output, however, the present invention is not limited thereto.In some other embodiment of the present invention, such as, but not limited to, ginseng
Each parameter Pi in number P can also be equal to the contribution margin that the yield of equipment 20i declines the target output and ginseng of equipment 20i
The number difference of imaginary yield of Pi divided by the target output of equipment 20i.
Although it will be understood by those skilled in the art that in the above embodiments, it is used to indicate the currently practical production of equipment 20i
Data of amount and on the current actual value of the influential parameter of the yield of equipment 20i obtained in the journal file of slave device 20i
, however, the present invention is not limited thereto.In some other embodiment of the present invention, it is used to indicate the current reality of equipment 20i
The data of border yield and the current actual value of the influential parameter of the yield of equipment 20i can also for example be obtained otherwise
It takes.
Although it will be understood by those skilled in the art that in the above embodiments, method 200 includes box 202-204, with by
Control unit 30 oneself determines whether the currently practical yield of equipment 20i reaches its target output, however, the present invention does not limit to
In this.In some other embodiment of the present invention, such as, but not limited to, it can also be notified by third direction control unit 30
Whether the currently practical yield of equipment 20i reaches its target output, and in this case, method 200 can not also include box
202-204。
Although it will be understood by those skilled in the art that in the above embodiments, control unit 30 is by each in parameter P
The contribution margin that parameter Pi declines the yield of equipment 20i is sent to repair with the parameters that the yield of equipment 20i is caused to decline
Team, however, the present invention is not limited thereto.In some other embodiment of the present invention, such as, but not limited to, control is single
Member 30 can also be in display parameters P the contribution margins that decline to the yield of equipment 20i of each parameter Pi and lead to equipment 20i's
The parameters that yield declines are consulted for Pit Crew.
It will be understood by those skilled in the art that although in the above embodiments, method 200 includes box 212 to determine to lead
The parameter that the yield of equipment is caused to decline, however, the present invention is not limited thereto.In some other embodiment of the present invention, side
Method 200 can not also include box 212.
Fig. 3 shows the flow chart of the method for monitoring of equipment of one embodiment according to the invention.It is shown in Fig. 3
Method is performed by control unit 30.
As shown in figure 3, method 300 can include, in box 302, when the currently practical yield of equipment is not up to its target
During yield, the current actual value of the multiple parameters of the equipment is obtained, wherein, the multiple parameter is the yield to the equipment
Influential parameter.
Method 300 can also include, and in box 304, be closed according to the function of the multiple parameter and the yield of the equipment
System and the current actual value of the multiple parameter calculate the imaginary yield of any parameter in the multiple parameter, wherein, it is described
The imaginary yield of any parameter represents to be equal to the current actual value of any parameter and described more when the value of any parameter
The value of other parameters in a parameter is equal to the yield of the equipment calculated during desired value using the functional relation.
Method 300 can also include, in box 306, according to the imaginary yield of any parameter and the target output,
Determine the contribution margin that any parameter declines the yield of the equipment.
In one aspect, method 300 can also include：When the imaginary yield of any parameter is less than the target output
When, it is the parameter that the yield of the equipment is caused to decline to determine any parameter.
On the other hand, the contribution margin that any parameter declines the yield of the equipment is equal to any parameter
Imaginary yield and the target output difference divided by the target output.
In another aspect, the current actual value of the multiple parameter is obtained from the journal file of the equipment.
In yet another aspect, method 300 can also include：From the journal file of the equipment, extraction periodically is used for
The data of the currently practical yield of the equipment；And based on the data extracted, judge the currently practical yield of the equipment
Whether the target output of the equipment is reached.
Fig. 4 shows the schematic diagram of the device for monitoring of equipment of one embodiment according to the invention.It is shown in Fig. 4
Device 400 can be realized using the mode of software, hardware or software and hardware combining.It is single that device 400 for example may be mounted at control
In member 30.
As shown in figure 4, device 400 can include acquisition module 402, computing module 404 and determining module 406.Obtain mould
Block 402 be used for when the currently practical yield of equipment is not up to its target output, obtain the equipment multiple parameters it is current
Actual value, wherein, the multiple parameter is on the influential parameter of the yield of the equipment.Computing module 404 is used for according to institute
Multiple parameters and the functional relation of yield of the equipment and the current actual value of the multiple parameter are stated, calculate the multiple ginseng
The imaginary yield of any parameter in number, wherein, the imaginary yield of any parameter is represented when value of any parameter etc.
When the value of other parameters in the current actual value and the multiple parameter of any parameter is equal to desired value described in
The yield for the equipment that functional relation calculates.Determining module 406 is used for according to the imaginary yield of any parameter and described
Target output determines the contribution margin that any parameter declines the yield of the equipment.
In one aspect, determining module 406 is additionally operable to：When the imaginary yield of any parameter is less than the target output
When, it is the parameter that the yield of the equipment is caused to decline to determine any parameter.
On the other hand, the contribution margin that any parameter declines the yield of the equipment is equal to any parameter
Imaginary yield and the target output difference divided by the target output.
In another aspect, the current actual value of the multiple parameter is obtained from the journal file of the equipment.
In yet another aspect, device 400 can also include：Extraction module, for from the journal file of the equipment, week
Extract to phase the data of the currently practical yield for the equipment；And judgment module, for based on the data extracted,
Judge whether the currently practical yield of the equipment reaches the target output of the equipment.
Fig. 5 shows the schematic diagram of the analytical equipment of one embodiment according to the invention.As shown in figure 5, control unit
30 can include processor 502 and memory 504, wherein, executable instruction is stored on memory 504, wherein, it is described to hold
Row instruction is upon being performed so that processor 502 performs method 200 or method shown in Fig. 3 300 shown in Fig. 2.
The embodiment of the present invention also provides a kind of machine readable media, is stored thereon with executable instruction, wherein, it is described can
Execute instruction causes machine to perform method 200 or method shown in Fig. 3 300 shown in Fig. 2 upon being performed.
The specific embodiment illustrated above in conjunction with attached drawing describes exemplary embodiment, it is not intended that can realize
Or fall into all embodiments of the protection domain of claims." exemplary " meaning of term used in entire this specification
Taste " being used as example, example or illustration ", is not meant to than other embodiments " preferably " or " having advantage ".For offer pair
The purpose of the understanding of described technology, specific embodiment include detail.However, it is possible in these no details
In the case of implement these technologies.In some instances, it is public in order to avoid the concept to described embodiment causes indigestion
The construction and device known is shown in block diagram form.
Foregoing description in the present disclosure is provided so that any those of ordinary skill in this field can realize or make
Use present disclosure.To those skilled in the art, the various modifications carried out to present disclosure are apparent
, also, can also be in the case where not departing from protection domain in the present disclosure, it should by generic principles defined herein
For other modifications.Therefore, present disclosure is not limited to examples described herein and design, but disclosed herein with meeting
Principle and novel features widest scope it is consistent.
Claims (12)
1. a kind of method for monitoring of equipment, including：
When the currently practical yield of equipment is not up to its target output, obtain the equipment multiple parameters it is currently practical
Value, wherein, the multiple parameter is on the influential parameter of the yield of the equipment；
According to the multiple parameter and the functional relation of the yield of the equipment and the current actual value of the multiple parameter, calculate
The imaginary yield of any parameter in the multiple parameter, wherein, the imaginary yield of any parameter is represented when described any
The value of parameter is equal to the current actual value of any parameter and the value of the other parameters in the multiple parameter is equal to desired value
The yield for the equipment that functional relation described in Shi Liyong calculates；And
According to the imaginary yield of any parameter and the target output, yield of any parameter to the equipment is determined
The contribution margin of decline.
2. it the method for claim 1, wherein further includes：
When the imaginary yield of any parameter is less than the target output, it is to lead to the equipment to determine any parameter
Yield decline parameter.
3. the method for claim 1, wherein
Any parameter the contribution margin that the yield of the equipment declines is equal to the imaginary yield of any parameter with it is described
The difference of target output divided by the target output.
4. the method for claim 1, wherein
The current actual value of the multiple parameter is obtained from the journal file of the equipment.
5. it the method for claim 1, wherein further includes：
From the journal file of the equipment, extraction periodically is used for the data of the currently practical yield of the equipment；And
Based on the data extracted, judge whether the currently practical yield of the equipment reaches the target output of the equipment.
6. a kind of device for monitoring of equipment, including：
Acquisition module, for when the currently practical yield of equipment is not up to its target output, obtaining multiple ginsengs of the equipment
Several current actual values, wherein, the multiple parameter is on the influential parameter of the yield of the equipment；
Computing module, for according to the multiple parameter and the functional relation of the yield of the equipment and working as the multiple parameter
Preceding actual value calculates the imaginary yield of any parameter in the multiple parameter, wherein, the imaginary rate schedule of any parameter
Show the current actual value for being equal to any parameter when the value of any parameter and the other parameters in the multiple parameter
Value is equal to the yield of the equipment calculated during desired value using the functional relation；And
Determining module for the imaginary yield according to any parameter and the target output, determines any parameter pair
The contribution margin that the yield of the equipment declines.
7. device as claimed in claim 6, wherein,
The determining module is additionally operable to, when the imaginary yield of any parameter is less than the target output, determine described any
Parameter is the parameter that the yield of the equipment is caused to decline.
8. device as claimed in claim 6, wherein,
Any parameter the contribution margin that the yield of the equipment declines is equal to the imaginary yield of any parameter with it is described
The difference of target output divided by the target output.
9. device as claimed in claim 6, wherein,
The current actual value of the multiple parameter is obtained from the journal file of the equipment.
10. device as claimed in claim 6, wherein, it further includes：
Extraction module, for from the journal file of the equipment, extraction periodically to be used for the currently practical yield of the equipment
Data；And
Judgment module, for based on the data extracted, judging whether the currently practical yield of the equipment reaches the equipment
Target output.
11. a kind of control unit, including：
Processor；And
Memory, is stored thereon with executable instruction, and the executable instruction causes the processor right of execution upon being performed
Profit requires any one of method in 1-5.
12. a kind of machine readable storage medium, is stored thereon with executable instruction, the executable instruction causes upon being performed
Any one of method in machine perform claim requirement 1-5.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810203343.6A CN108256790A (en) | 2018-03-13 | 2018-03-13 | For the method and apparatus of monitoring of equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810203343.6A CN108256790A (en) | 2018-03-13 | 2018-03-13 | For the method and apparatus of monitoring of equipment |
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Family
ID=62745832
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| CN201810203343.6A Pending CN108256790A (en) | 2018-03-13 | 2018-03-13 | For the method and apparatus of monitoring of equipment |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103984326A (en) * | 2014-05-28 | 2014-08-13 | 杭州迈可思法电气工程有限公司 | Production management system and method |
| CN104199754A (en) * | 2013-03-13 | 2014-12-10 | 西部数据技术公司 | Production failure analysis system |
| CN106327048A (en) * | 2015-07-07 | 2017-01-11 | 沈阳中科博微自动化技术有限公司 | Industrial enterprise energy efficiency evaluation method based on energy efficiency benchmark model |
-
2018
- 2018-03-13 CN CN201810203343.6A patent/CN108256790A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104199754A (en) * | 2013-03-13 | 2014-12-10 | 西部数据技术公司 | Production failure analysis system |
| CN103984326A (en) * | 2014-05-28 | 2014-08-13 | 杭州迈可思法电气工程有限公司 | Production management system and method |
| CN106327048A (en) * | 2015-07-07 | 2017-01-11 | 沈阳中科博微自动化技术有限公司 | Industrial enterprise energy efficiency evaluation method based on energy efficiency benchmark model |
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