CN108228462A - parameter testing method and device for O L TP system - Google Patents
parameter testing method and device for O L TP system Download PDFInfo
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Abstract
the invention discloses a parameter testing method of an O L TP system, which comprises the steps of obtaining a plurality of groups of parameter configuration information for testing a target O L TP system, wherein each group of parameter configuration information at least comprises the concurrency amount, the memory, the data amount, the data type and the CPU core number of the O L TP system, calculating and recording TPMC values corresponding to each group of parameter configuration information according to a pre-deployed TPC-C testing model, comparing the TPMC values corresponding to each group of parameter configuration information, determining the maximum TPMC value, and taking the parameter configuration information corresponding to the maximum TPMC value as the optimal parameter configuration information of the target O L TP system.
Description
Technical field
The present invention relates to database technical field of measurement and test, more specifically to a kind of parameter testing side of OLTP systems
Method, device, equipment and computer readable storage medium.
Background technology
The type of service of database is generally divided into OLAP and OLTP.Wherein, OLAP is online transaction analysis system, main right
The historical data of OLTP is processed, analyzing and processing, for handling the important decision information such as business intelligence, decision support；Its
Feature is：Handling capacity is big, and concurrent visit capacity is not high, and the consumption of single transaction resource is big, a large amount of inquiry operation or batch operation master
If substantially daily issued transaction is performed, for example the additions and deletions of data-base recording are looked into and changed.For example recorded in a transaction of bank,
It is exactly a typical affairs.And OLTP is online transaction processing system, and it is main to perform substantially daily issued transaction, than in full
The additions and deletions recorded according to library, which are looked into, to be changed.For example recorded in a transaction of bank, it is exactly a typical affairs；Its feature is：Response
Speed is very high, and handling capacity is small, and concurrent visit capacity is high, and the resource consumption of single affairs is small, is inserted into and modification operation (DML) occupies
It is more.
At present, for the parameter of OLTP systems preset it is general by virtue of experience and the understanding of each parameter is configured,
The dimensional comparison of reference is single, it is impossible to the bottleneck of comprehensive assessment database, so as to which the performance entirely applied optimization cannot be given to carry
For more fully foundation.Parameter setting is so carried out, in actual application, system is likely to also that there are redundancies, causes to provide
Source wastes.
Therefore, how for the most preferred parameter of OLTP systemic presuppositions, the utilization rate of OLTP systems is improved, reduces cost
With being those skilled in the art's problem to be solved.
Invention content
The purpose of the present invention is to provide a kind of parameter test method of OLTP systems, device, equipment and computer-readable
Storage medium to be embodied as the most preferred parameter of OLTP systemic presuppositions, improves the utilization rate of OLTP systems, reduces cost.
To achieve the above object, an embodiment of the present invention provides following technical solutions：
A kind of parameter test method of OLTP systems, including：
Multigroup parameter configuration for test target OLTP systems is obtained, every group of parameter configuration includes at least：
Concurrency, memory, data volume, data type and the CPU core number of OLTP systems；
The corresponding TPMC values of every group of parameter configuration are calculated according to the TPC-C test models disposed in advance and are remembered
Record；
The corresponding TPMC values of more every group of parameter configuration, determine maximum TPMC values, and by the maximum TPMC
It is worth optimized parameter configuration information of the corresponding parameter configuration as the target OLTP systems.
Wherein, the multigroup parameter configuration obtained for test target OLTP systems, including：
The multigroup parameter for being used for test target OLTP systems is obtained out of preset database according to preset index information
Configuration information.
Wherein, it is described corresponding according to every group of parameter configuration of the TPC-C test models disposed in advance calculating
TPMC values simultaneously record, including：
Every group of parameter configuration letter is calculated according to the TPC-C test models disposed in advance, and using BenchnarkSQL tools
It ceases corresponding TPMC values and records.
Wherein, it is described using the corresponding parameter configuration of the maximum TPMC values as the optimal of the target OLTP systems
After parameter configuration, further include：
The optimized parameter configuration information and the corresponding TPMC values of the optimized parameter configuration information are subjected to visualization exhibition
Show.
Wherein, when the arbitrary target parameter for testing the target OLTP systems, including：
Obtain for test the target OLTP systems target component multigroup parameter configuration, wherein, by every group
Target component in parameter configuration is preset as different test values, and the other parameter in every group of parameter configuration is default
It is quantitative；
The corresponding TPMC values of every group of parameter configuration are calculated according to the TPC-C test models disposed in advance and are remembered
Record；
The corresponding TPMC values of more every group of parameter configuration, determine maximum TPMC values, and by the maximum TPMC
It is worth optimal value of the test value of the target component in corresponding parameter configuration as the target component.
A kind of parameter test device of OLTP systems, including：
Acquisition module, for obtaining multigroup parameter configuration for test target OLTP systems, every group of parameter configuration
Information includes at least：Concurrency, memory, data volume, data type and the CPU core number of OLTP systems；
Computing module corresponds to respectively for calculating every group of parameter configuration according to the TPC-C test models disposed in advance
TPMC values and record；
Execution module for the corresponding TPMC values of more every group of parameter configuration, determines maximum TPMC values, and will
Optimized parameter configuration information of the corresponding parameter configuration of the maximum TPMC values as the target OLTP systems.
Wherein, the acquisition module is specifically used for：
The multigroup parameter for being used for test target OLTP systems is obtained out of preset database according to preset index information
Configuration information.
Wherein, the computing module is specifically used for：
Every group of parameter configuration letter is calculated according to the TPC-C test models disposed in advance, and using BenchnarkSQL tools
It ceases corresponding TPMC values and records.
A kind of parametric test equipment, including：
Memory, for storing computer program；
Processor realizes the parameter of the OLTP systems as described in above-mentioned any one during for performing the computer program
The step of test method.
A kind of computer readable storage medium is stored with computer program on the computer readable storage medium, described
The step of parameter test method of the OLTP systems as described in above-mentioned any one is realized when computer program is executed by processor.
By above scheme it is found that a kind of parameter test method of OLTP systems provided in an embodiment of the present invention, including：It obtains
It takes in multigroup parameter configuration of test target OLTP systems, every group of parameter configuration includes at least：OLTP systems
Concurrency, memory, data volume, data type and CPU core number；Every group of parameter is calculated according to the TPC-C test models disposed in advance
The corresponding TPMC values of configuration information simultaneously record；The corresponding TPMC values of more every group of parameter configuration determine maximum
TPMC values, and be configured the corresponding parameter configuration of the maximum TPMC values as the optimized parameter of the target OLTP systems
Information.
As it can be seen that the method is by the corresponding TPMC values of the multigroup parameter configuration for testing OLTP systems, and really
Fixed maximum TPMC values, and then using the corresponding parameter configuration of the maximum TPMC values as the optimal of the target OLTP systems
Parameter configuration has tested out the optimized parameter configuration information of target OLTP systems.To so have optimized parameter configuration
It is optimal can so that the existing hardware device of OLTP systems dependence shows applied to practical business processing for the OLTP systems of information
Process performance improves the utilization rate of whole system, cost-effective so as to achieve the purpose that.
Correspondingly, a kind of parameter test device of OLTP systems provided in an embodiment of the present invention, equipment and computer-readable
Storage medium, similarly with above-mentioned technique effect.
Description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, to embodiment or will show below
There is attached drawing needed in technology description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention, for those of ordinary skill in the art, without creative efforts, can be with
Other attached drawings are obtained according to these attached drawings.
Fig. 1 is a kind of parameter test method flow chart of OLTP systems disclosed by the embodiments of the present invention；
Fig. 2 is the parameter test method flow chart of another kind OLTP systems disclosed by the embodiments of the present invention；
Fig. 3 is a kind of parameter test device schematic diagram of OLTP systems disclosed by the embodiments of the present invention；
Fig. 4 is a kind of parametric test equipment schematic diagram of OLTP systems disclosed by the embodiments of the present invention.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present invention, the technical solution in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other without making creative work
Embodiment shall fall within the protection scope of the present invention.
The embodiment of the invention discloses a kind of parameter test method of OLTP systems, device, equipment and computer-readable deposit
Storage media to be embodied as the most preferred parameter of OLTP systemic presuppositions, improves the utilization rate of OLTP systems, reduces cost.
Referring to Fig. 1, a kind of parameter test method of OLTP systems provided in an embodiment of the present invention, including：
S101, the multigroup parameter configuration for being used for test target OLTP systems is obtained, every group of parameter configuration is at least
Including：Concurrency, memory, data volume, data type and the CPU core number of OLTP systems；
In the present embodiment, in test target OLTP systems, can multigroup parameter configuration, every group of ginseng be set for it
Number configuration information includes at least：Concurrency, memory, data volume, data type and the CPU core number of OLTP systems.Specifically, can be with
It gives the parameter setting in every group of parameter configuration different test values according to actual needs, is matched with detecting system in different parameters
Traffic handing capacity under putting.
S102, the corresponding TPMC values of every group of parameter configuration are calculated according to the TPC-C test models disposed in advance
And it records；
Specifically, TPC-C test models as the standard in industry, are generally acknowledged to have authoritative in-system decryption
Benchmark test.It tests extensive database function by simulated warehouse and order management system, including inquiring, update and
Mini-batch affairs (queue-type small lot affairs).
Wherein, the test result of TPC-C is mainly there are two index, i.e., flow indicator (Throughput, abbreviation tpmC) and
Cost performance (Price/Performance, abbreviation Price/tpmC).Flow indicator describes system and is performing delivery operation, ordering
It is per minute to handle how many a new order transaction while this 4 kinds transaction of single status inquiry, delivery and inventory status query.
The response time of All Activity must satisfy the requirement of TPC-C test specifications, and the ratio shared by various number of transaction also should
Meet the requirement of TPC-C test specifications.In this case, the bigger Transaction Processing ability for illustrating system of flow indicator value
It is higher.Cost performance, that is, overall price of test system and the ratio of flow indicator, in the case where obtaining identical TPMC values, valency
The lower lattice the better.
It should be noted that the TPMC values in this specification represent flow indicator.
Simulated in TPC-C test models one it is more complicated and with representing the OLTP application environments of meaning：Assuming that have
One large scale commercial product whole seller, it possesses several commodity libraries for being distributed in different zones；Each warehouse is responsible for 10 sale
The point supply of material；Each point of sale is 3000 offering customers services；Each client order that is averaged has 10 products；All orders
Middle about 1% product does not have stock in its directly affiliated warehouse, needs the warehouse by other regions to supply.Meanwhile often
A warehouse will service companies sale 100000 kinds of commodity inventory record.
Wherein, system transaction to be treated is following several：
New-Order：Client inputs a new order transaction；
Payment:Client account balance is updated to reflect its payment status；
Delivery:Delivery (simulation batch processing transaction)；
Order-Status:Inquire the state of client's last sale；
Stock-Level:Warehouse inventory situation is inquired, so as to replenish in time.
Transaction for preceding four type, it is desirable that the response time is within 5 seconds；Inventory Performance is inquired and is merchandised, it is desirable that
Response time is within 20 seconds.
S103, the corresponding TPMC values of more every group of parameter configuration, determine maximum TPMC values, and by the maximum
Optimized parameter configuration information of the corresponding parameter configuration of TPMC values as the target OLTP systems.
Specifically, for the calculated TPMC values of every group of parameter configuration, compare its size, determine maximum TPMC
Value, and match confidence using the corresponding parameter configuration of the maximum TPMC values as the optimized parameter of the target OLTP systems
Breath, thus just determines the optimized parameter configuration information of target OLTP systems, and target OLTP systems are optimal so as to show its
Traffic handing capacity, improve the utilization rate of whole system.
As it can be seen that a kind of parameter test method of OLTP systems provided in this embodiment, the method is by testing OLTP systems
Corresponding TPMC values of multigroup parameter configuration of system, and determine maximum TPMC values, and then by the maximum TPMC values pair
Optimized parameter configuration information of the parameter configuration answered as the target OLTP systems, that is, tested out target OLTP systems
Optimized parameter configuration information.Such OLTP systems can rely on existing hardware device and show optimal process performance, carry
The utilization rate of high whole system, it is cost-effective so as to achieve the purpose that.
The embodiment of the invention discloses the parameter test method of another OLTP systems, relative to a upper embodiment, this reality
It applies example and further instruction and optimization has been made to technical solution.
Referring to Fig. 2, the parameter test method of another kind OLTP systems provided in an embodiment of the present invention, when the test target
During the arbitrary target parameter of OLTP systems, including：
S201, obtain for test the target OLTP systems target component multigroup parameter configuration, wherein, will
Target component in every group of parameter configuration is preset as different test values, and the other parameter in every group of parameter configuration is equal
It is preset as quantitative；
In the present embodiment, the target component is a certain parameter that tested in OLTP systems, to test certain
A kind of parameter needs to preset multiple and different test values for it.Such as：The concurrency of OLTP systems is tested, then is concurrency
The default different test values such as 100,200,300.
It should be noted that the test for a certain target component, may be used control variate method and carries out control experiment.Example
Such as：System process performance when the concurrency for testing OLTP systems is respectively 100,200,300, can set other target components
It is set to and quantifies, i.e.,：Remain unchanged the parameters such as memory, data volume, data type and the CPU core number of OLTP systems, in test
It is the variation for observing OLTP system process performances by changing its test value, so that it is determined that concurrency for variable to make concurrency
Optimal value.
S202, the corresponding TPMC values of every group of parameter configuration are calculated according to the TPC-C test models disposed in advance
And it records；
Specifically, the test for OLTP systems is usually embodied by TPMC values, TPMC values are bigger, represent OLTP systematicness
It can be better.Therefore the corresponding TPMC values of each test value can be calculated respectively and are recorded, in order under more different test values
System performance.
S203, the corresponding TPMC values of more every group of parameter configuration, determine maximum TPMC values, and by the maximum
Optimal value of the test value of target component in the corresponding parameter configuration of TPMC values as the target component.
Such as：A certain OLTP systems, in the situation of the parameter constants such as Installed System Memory, data volume, data type and CPU core number
Under, concurrency shows that more greatly its process performance is better.Thus when target component is concurrency, more each test value is corresponding
TPMC values obtain maximum TPMC values, and using the corresponding test value of the maximum TPMC values as the optimal value of concurrency.
It is realized it should be noted that the above method may be used for the test of other parameter.It is carried using the present embodiment
The method of confession can accurately test out the inflection point of each parameter, which is the optimal value of the parameter, when certain OLTP system
When all parameters are disposed as inflection point parameter, processing process performance is optimal, so as to improve the utilization of whole system
Rate has saved cost.
Based on above-mentioned any embodiment, it should be noted that the multigroup ginseng obtained for test target OLTP systems
Number configuration information, including：
The multigroup parameter for being used for test target OLTP systems is obtained out of preset database according to preset index information
Configuration information.
Specifically, this method in specific implementation process, can preset different index informations, and by the index information and
Parameter configuration is prestored into preset database, when system is tested, according to preset index information from pre-
If database in obtain for test target OLTP systems multigroup parameter configuration.
Based on above-mentioned any embodiment, it should be noted that described to be calculated often according to the TPC-C test models disposed in advance
The corresponding TPMC values of group parameter configuration simultaneously record, including：
Every group of parameter configuration letter is calculated according to the TPC-C test models disposed in advance, and using BenchnarkSQL tools
It ceases corresponding TPMC values and records.
It should be noted that in TPC-C test models, other tools such as dbt2-v0.23 cooperation TPC- can also be used
C test models test the process performance of OLTP systems.
Based on above-mentioned any embodiment, it should be noted that described to believe the corresponding parameter configuration of the maximum TPMC values
After ceasing the optimized parameter configuration information as the target OLTP systems, further include：
The optimized parameter configuration information and the corresponding TPMC values of the optimized parameter configuration information are subjected to visualization exhibition
Show.
After the method provided using this specification completes parameter testing, can also by the optimized parameter configuration information and
The corresponding TPMC values of the optimized parameter configuration information are visualized, in order to which technical staff matches according to the optimized parameter
Confidence breath deployment hardware device.Wherein, the modes such as report or wicket displaying may be used to realize.
Based on above-mentioned any embodiment, it should be noted that carry out OLTP data in the method provided using this specification
During the concurrency parameter testing in library, the test pressure model of similar TPC-C can be utilized, is verified in same hardware configuration, identical
Data volume, the expandability of database performance in the case of concurrent user number increase.
Specifically, when building table by bechmarkSQL tools, if number used in test specified 100warehouse
It is 10.4G according to data file and index file is probably generated in library, in order to ensure all test datas all in memory, in phase
12G can be selected to be tested in the case of same memory, to ensure that all data will not be caused since io reads and writes in performance
Loss；65min representatives are run 65 minutes in benchmarkSQL, and the electric business number to simulation was completed during this 65 minutes
Practical business operation is carried out according to library, specific operating process depends on benchmarkSQL tools；Tool meeting equal proportion
The practical operation of finishing service, to ensure the comparability tested every time, wherein, 5 minutes of front are used for all numbers
According to and index be pre-loaded in memory, to avoid the read-write problem of disk.All exist in the identical and all data of guarantee data volume
In the case of memory, adjust practical concurrent user number, with this Data Analysis Data Base under different user concurrency database
Performance indicator.
Based on above-mentioned any embodiment, it should be noted that carry out OLTP data in the method provided using this specification
During the concurrency parameter testing in library, using the test pressure model of similar TPC-C, verify and be configured in same hardware, data volume increases
Add, in the case of number of users increase database performance expandability.
Based on above-mentioned any embodiment, it should be noted that carry out OLTP data in the method provided using this specification
During the concurrency parameter testing in library, using the test pressure model of similar TPC-C, verify and be configured in same hardware, identical data
Amount/number of users, in the case of different memories, the expandability of database performance.
Specifically, service concurrence 100 or so, then number of concurrent can be fixed on fixed in business model
Then 100u is tested with 100warehouse+100u；Continuous adjustment memory buf；To observe practical TPMC values；From
And it is analyzed by TPMC values in identical concurrency, the performance change in the case of memory is continually changing.
Based on above-mentioned any embodiment, it should be noted that carry out OLTP data in the method provided using this specification
During the concurrency parameter testing in library, using the test pressure model of similar TPC-C, verify and be configured in same hardware, identical data
Amount/number of users, same memory, in the case of different types of data, the expandability of database performance.
Specifically, in presetting database, data type is modified, such as：Int is revised as numeric；It will
Int is revised as numeric (256,130), and Varchar is revised as CLOB, wherein, c_last, c_first two, which is arranged, not to be changed.
And then run benchmarkSQL tools and carry out operational trials, analyze TPMC values.
Based on above-mentioned any embodiment, it should be noted that using the test pressure model of similar TPC-C, verify in CPU
System extended capability in the case of increased number of.
Specifically, when disposing OLTP systems on large server, the method test that this specification offer may be used is early
The participation of CPU core number of influence in the case of to(for) system performance.
Based on above-mentioned any embodiment, it should be noted that using the parameter testing for the OLTP systems that this specification provides
Method test obtained by optimized parameter configuration information can be applied in random service system so that operation system show it is good
Traffic handing capacity.
A kind of parameter test device provided in an embodiment of the present invention is introduced below, a kind of OLTP systems described below
The parameter test device of system can be cross-referenced with a kind of above-described parameter test method of OLTP systems.
Referring to Fig. 3, a kind of parameter test device of OLTP systems provided in an embodiment of the present invention, including：
Acquisition module 301, for obtaining multigroup parameter configuration for test target OLTP systems, every group of parameter is matched
Confidence breath includes at least：Concurrency, memory, data volume, data type and the CPU core number of OLTP systems；
Computing module 302, it is right respectively for calculating every group of parameter configuration according to the TPC-C test models disposed in advance
The TPMC values answered simultaneously record；
Execution module 303 for the corresponding TPMC values of more every group of parameter configuration, determines maximum TPMC values,
And using the corresponding parameter configuration of the maximum TPMC values as the optimized parameter configuration information of the target OLTP systems.
Wherein, the acquisition module is specifically used for：
The multigroup parameter for being used for test target OLTP systems is obtained out of preset database according to preset index information
Configuration information.
Wherein, the computing module is specifically used for：
Every group of parameter configuration letter is calculated according to the TPC-C test models disposed in advance, and using BenchnarkSQL tools
It ceases corresponding TPMC values and records.
Wherein, the acquisition module is specifically used for：
The multigroup parameter for being used for test target OLTP systems is obtained out of preset database according to preset index information
Configuration information.
Wherein, the computing module is specifically used for：
Every group of parameter configuration letter is calculated according to the TPC-C test models disposed in advance, and using BenchnarkSQL tools
It ceases corresponding TPMC values and records.
Wherein, it further includes：
Display module, for by the optimized parameter configuration information and the corresponding TPMC values of the optimized parameter configuration information
It is visualized.
A kind of parametric test equipment of OLTP systems provided in an embodiment of the present invention is introduced below, it is described below
A kind of parametric test equipment of OLTP systems and the parameter test method and device of a kind of above-described OLTP systems can phases
Mutual reference.
Referring to Fig. 4, a kind of parametric test equipment of OLTP systems provided in an embodiment of the present invention, including：
Memory 401, for storing computer program；
Processor 402 realizes the OLTP systems as described in above-mentioned any embodiment during for performing the computer program
Parameter test method the step of.
A kind of computer readable storage medium provided in an embodiment of the present invention is introduced below, one kind described below
Computer readable storage medium can mutually be joined with above-described a kind of parameter test method, device and the equipment of OLTP systems
According to.
A kind of computer readable storage medium is stored with computer program on the computer readable storage medium, described
The step of the parameter test method of the OLTP systems as described in above-mentioned any embodiment is realized when computer program is executed by processor
Suddenly.
Each embodiment is described by the way of progressive in this specification, the highlights of each of the examples are with other
The difference of embodiment, just to refer each other for identical similar portion between each embodiment.
The foregoing description of the disclosed embodiments enables professional and technical personnel in the field to realize or use the present invention.
A variety of modifications of these embodiments will be apparent for those skilled in the art, it is as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, it is of the invention
The embodiments shown herein is not intended to be limited to, and is to fit to and the principles and novel features disclosed herein phase one
The most wide range caused.
Claims (10)
1. a kind of parameter test method of OLTP systems, which is characterized in that including：
Multigroup parameter configuration for test target OLTP systems is obtained, every group of parameter configuration includes at least：OLTP
Concurrency, memory, data volume, data type and the CPU core number of system；
The corresponding TPMC values of every group of parameter configuration are calculated according to the TPC-C test models disposed in advance and are recorded；
The corresponding TPMC values of more every group of parameter configuration, determine maximum TPMC values, and by the maximum TPMC values pair
Optimized parameter configuration information of the parameter configuration answered as the target OLTP systems.
2. the parameter test method of OLTP systems according to claim 1, which is characterized in that described to obtain to test mesh
Multigroup parameter configuration of OLTP systems is marked, including：
The multigroup parameter configuration for being used for test target OLTP systems is obtained out of preset database according to preset index information
Information.
3. the parameter test method of OLTP systems according to claim 1, which is characterized in that described according to disposing in advance
TPC-C test models calculate the corresponding TPMC values of every group of parameter configuration and record, including：
Every group of parameter configuration point is calculated according to the TPC-C test models disposed in advance, and using BenchnarkSQL tools
Not corresponding TPMC values simultaneously record.
4. the parameter test method of OLTP systems according to claim 1, which is characterized in that described by the maximum TPMC
It is worth after optimized parameter configuration information of the corresponding parameter configuration as the target OLTP systems, further includes：
The optimized parameter configuration information and the corresponding TPMC values of the optimized parameter configuration information are visualized.
5. the parameter test method of OLTP systems according to any one of claims 1-4, which is characterized in that when test institute
When stating the arbitrary target parameter of target OLTP systems, including：
Obtain for test the target OLTP systems target component multigroup parameter configuration, wherein, by every group of parameter
Target component in configuration information is preset as different test values, and the other parameter in every group of parameter configuration is preset as fixed
Amount；
The corresponding TPMC values of every group of parameter configuration are calculated according to the TPC-C test models disposed in advance and are recorded；
The corresponding TPMC values of more every group of parameter configuration, determine maximum TPMC values, and by the maximum TPMC values pair
Optimal value of the test value of target component in the parameter configuration answered as the target component.
6. a kind of parameter test device of OLTP systems, which is characterized in that including：
Acquisition module, for obtaining multigroup parameter configuration for test target OLTP systems, every group of parameter configuration
It includes at least：Concurrency, memory, data volume, data type and the CPU core number of OLTP systems；
Computing module, it is corresponding for calculating every group of parameter configuration according to the TPC-C test models disposed in advance
TPMC values simultaneously record；
Execution module for the corresponding TPMC values of more every group of parameter configuration, determines maximum TPMC values, and by described in
Optimized parameter configuration information of the corresponding parameter configuration of maximum TPMC values as the target OLTP systems.
7. the parameter test device of OLTP systems according to claim 6, which is characterized in that the acquisition module is specifically used
In：
The multigroup parameter configuration for being used for test target OLTP systems is obtained out of preset database according to preset index information
Information.
8. the parameter test device of OLTP systems according to claim 6, which is characterized in that the computing module is specifically used
In：
Every group of parameter configuration point is calculated according to the TPC-C test models disposed in advance, and using BenchnarkSQL tools
Not corresponding TPMC values simultaneously record.
9. a kind of parametric test equipment of OLTP systems, which is characterized in that including：
Memory, for storing computer program；
Processor, the OLTP systems as described in claim 1-5 any one are realized during for performing the computer program
The step of parameter test method.
10. a kind of computer readable storage medium, which is characterized in that be stored with computer on the computer readable storage medium
Program realizes the ginseng of the OLTP systems as described in claim 1-5 any one when the computer program is executed by processor
The step of number test method.
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