CN108226882B - Method for screening ADC amplitude consistency and change rate thereof based on chip level - Google Patents

Method for screening ADC amplitude consistency and change rate thereof based on chip level Download PDF

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Publication number
CN108226882B
CN108226882B CN201611154108.1A CN201611154108A CN108226882B CN 108226882 B CN108226882 B CN 108226882B CN 201611154108 A CN201611154108 A CN 201611154108A CN 108226882 B CN108226882 B CN 108226882B
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amplitude
adc
change rate
amplitude consistency
consistency
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CN108226882A (en
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陈川
张坤
吴翼虎
楚要钦
景得胜
闫昆
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Xian Aeronautics Computing Technique Research Institute of AVIC
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Xian Aeronautics Computing Technique Research Institute of AVIC
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/02Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
    • G01S7/40Means for monitoring or calibrating

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  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Radar Systems Or Details Thereof (AREA)

Abstract

The invention belongs to the technical field of index testing of high-speed ADC (analog-to-digital converter) in radar signal processing. The high-speed ADC converts the intermediate-frequency analog signal into a digital signal in real time, so that a subsequent processing platform can conveniently complete the functions of target detection, positioning and the like in a digital signal processing mode. In radar signal processing, the acquisition of antenna data of three channels of distance, azimuth and elevation is completed through an ADC (analog to digital converter). In order to ensure the accuracy of angle measurement and direction measurement in subsequent signal processing, the amplitude consistency between ADCs is required to be within 2dB, and the change rate is required to be within 0.5 dB. The invention aims to solve the problem that ADC chips with the amplitude consistency indexes exceeding the standard are screened out before product production to avoid a large amount of repair correction parameters of a subsequent signal processor, and provides a chip-level screening algorithm.

Description

Method for screening ADC amplitude consistency and change rate thereof based on chip level
Technical Field
The invention belongs to the technical field of index testing of a high-speed ADC (analog-to-digital converter).
Background
The radar signal processor adopts processing algorithms such as angle measurement, direction measurement and the like to require that the unique amplitude consistency and the change rate index of the ADC are limited in a certain range so as to meet the precision requirement of the algorithm. However, the index relates to comparison among ADCs, and is not a single ADC index, so that the index is not embodied in a high-speed ADC data manual, and a chip manufacturer does not perform screening test on the index. When the signal processing machine is actually used, the signal processing machine is frequently repaired and corrected due to the special requirement of the index, the yield of products is influenced, the reliability of the products is reduced, and even the condition that the whole processing board is wasted due to repeated repairing exists. Therefore, how to complete the test of the unique index of ADC amplitude consistency and change rate thereof at the chip level is very important.
Disclosure of Invention
The invention aims to solve the problem that the amplitude consistency and the change rate of a board-level ADC channel exceed the standard, and adopts an effective testing algorithm to screen and classify the amplitude consistency and the change rate index of the ADC in advance at a chip level.
The specific embodiment is as follows:
1. a screening method of ADC amplitude consistency and change rate based on chip level is characterized in that: comprises the following steps; (1) building a standard ATE acquisition hardware platform, which comprises a low-phase-noise and high-stability clock source, an amplitude-adjustable signal source, a low-distortion power divider, a standard ADC chip and a test machine; (2) adjusting the frequency of the signal source and the clock source to meet coherent sampling; (3) the standard ADC and the ADC chip to be tested are adopted to simultaneously acquire data of output signals of the power divider, and an acquisition result is sent to a test machine table in real time; (4) the testing machine stores two paths of ADC (analog to digital converter) collected data with the depth of 32K, deletes a certain number of sampling points according to coherent sampling requirements, performs fast Fourier transform on the sampling points, respectively calculates the amplitudes of two paths of signals, and records the amplitude consistency result; (5) controlling the output amplitude of the signal source by the test machine through the network port, repeating the steps (3) and (4), and respectively recording the amplitude consistency results; (6) taking the average value of the 10 amplitude consistency results obtained in the step 5, subtracting the average value from the 10 amplitude consistency results to obtain a change rate result and recording the change rate result; (7) repeating the steps according to normal temperature, high temperature +125 ℃ and low temperature-55 ℃, and recording the amplitude consistency and the amplitude consistency change rate indexes under the normal temperature, the high temperature and the low temperature conditions; (8) and classifying the ADC chips with similar indexes according to the recorded indexes of the amplitude consistency and the amplitude consistency change rate, wherein the classification standard is that the amplitude consistency does not exceed 1dB and the amplitude consistency change rate does not exceed 0.5 dB.
2. The method is characterized in that the output amplitude of the control signal source is tested according to the amplitude interval of 5dbm, 0dbm, -10dbm, -20dbm, -30dbm, -40dbm, -50dbm, -60dbm, -70dbm and-80 dbm.
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FIG. 1 is a schematic diagram of a method for screening ADC amplitude consistency and change rate thereof based on a chip level.
Detailed Description
The invention has been successfully applied to the ADC chip screening test of a certain key type missile signal processor, and the test verifies that the fault rate of the ADC chip amplitude consistency and the standard exceeding of the change rate index of the product is reduced by 5 times, the one-time yield is improved to more than 90 percent, the good economic effect is obtained, and the product quality is effectively improved.

Claims (1)

1. A screening method of ADC amplitude consistency and change rate based on chip level is characterized in that: comprises the following steps; (1) building a standard ATE acquisition hardware platform, which comprises a low-phase-noise and high-stability clock source, an amplitude-adjustable signal source, a low-distortion power divider, a standard ADC chip and a test machine; (2) adjusting the frequency of the signal source and the clock source to meet coherent sampling; (3) the standard ADC and the ADC chip to be tested are adopted to simultaneously acquire data of output signals of the power divider, and an acquisition result is sent to a test machine table in real time; (4) the testing machine stores two paths of ADC (analog to digital converter) collected data with the depth of 32K, deletes a certain number of sampling points according to coherent sampling requirements, performs fast Fourier transform on the sampling points, respectively calculates the amplitudes of two paths of signals, and records the amplitude consistency result; (5) the test machine controls the output amplitude of the signal source through the network port, repeats the steps (3) and (4), and respectively records the amplitude consistency results; (6) taking the average value of the 10 amplitude consistency results obtained in the step 5, subtracting the average value from the 10 amplitude consistency results to obtain a change rate result and recording the change rate result; (7) repeating the steps according to normal temperature, high temperature +125 ℃ and low temperature-55 ℃, and recording the amplitude consistency and the amplitude consistency change rate indexes under the normal temperature, the high temperature and the low temperature conditions; (8) according to the recorded amplitude consistency and amplitude consistency change rate indexes, classifying the ADC chips with similar indexes, wherein the classification standard is that the amplitude consistency is not more than 1dB, and the amplitude consistency change rate is not more than 0.5 dB; the output amplitude of the control signal source is tested according to the amplitude interval of 5dbm, 0dbm, -10dbm, -20dbm, -30dbm, -40dbm, -50dbm, -60dbm, -70dbm and-80 dbm.
CN201611154108.1A 2016-12-14 2016-12-14 Method for screening ADC amplitude consistency and change rate thereof based on chip level Active CN108226882B (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101587499A (en) * 2009-06-24 2009-11-25 北京理工大学 Multi-channel signal acquiring system based on NAND
CN103178846A (en) * 2013-03-29 2013-06-26 华南理工大学 LMS (Least Mean Squares) algorithm for calibrating ADC (Analog to Digital Converter)
CN103675652A (en) * 2012-09-21 2014-03-26 复旦大学 Test for ADC chip based on non-homogeneous time clock
US9998136B1 (en) * 2017-02-17 2018-06-12 Seagate Technology Llc Loop consistency using multiple channel estimates

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103592637B (en) * 2013-11-07 2015-07-15 中国电子科技集团公司第四十一研究所 Method and device for testing digital array module transmitting channel phase congruency
CN103713281B (en) * 2013-12-12 2016-06-08 中国人民解放军海军工程大学 Based on radar signal unit performance test and the fault diagnosis system of general-utility test platform

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101587499A (en) * 2009-06-24 2009-11-25 北京理工大学 Multi-channel signal acquiring system based on NAND
CN103675652A (en) * 2012-09-21 2014-03-26 复旦大学 Test for ADC chip based on non-homogeneous time clock
CN103178846A (en) * 2013-03-29 2013-06-26 华南理工大学 LMS (Least Mean Squares) algorithm for calibrating ADC (Analog to Digital Converter)
US9998136B1 (en) * 2017-02-17 2018-06-12 Seagate Technology Llc Loop consistency using multiple channel estimates

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
多通道ADC一致性的高精度测量方法;刘楷,吴琼之,孙林,苏福顺;《电子设计工程》;20141031;第22卷(第19期);正文第86页,87页左栏第1-2段,图1 *

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