CN108181332A - A kind of detection method of luminescent material - Google Patents
A kind of detection method of luminescent material Download PDFInfo
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- CN108181332A CN108181332A CN201711379300.5A CN201711379300A CN108181332A CN 108181332 A CN108181332 A CN 108181332A CN 201711379300 A CN201711379300 A CN 201711379300A CN 108181332 A CN108181332 A CN 108181332A
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- luminescent material
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- detection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/286—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6402—Atomic fluorescence; Laser induced fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/286—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
- G01N2001/2866—Grinding or homogeneising
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- Chemical & Material Sciences (AREA)
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- Optics & Photonics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
The present invention provides a kind of detection method of luminescent material, including：(1) luminescent material to be measured is taken, is ground；(2) XRD detections are carried out to luminescent material：Luminescent material after grinding is placed in XRD detectors and is detected, obtains the XRD spectrum of luminescent material, XRD spectrum with standard card is compared, determines the matrix components of luminescent material；(3) excitation spectrum detection is carried out to luminescent material：Luminescent material after grinding is placed in progress excitation spectrum detection in Fluorescence Spectrometer, obtains the excitation spectrum of luminescent material；(4) emission spectrum detection is carried out to luminescent material：Luminescent material after grinding is placed in progress emission spectrum detection in Fluorescence Spectrometer, obtains the emission spectrum of luminescent material；(5) excitation spectrum of luminescent material and emission spectrum are analyzed, determines the doping component and luminosity of luminescent material.The method of the present invention can reduce luminescent material detection error, improve conventional efficient.
Description
Technical field
The present invention relates to luminescent material technical field more particularly to a kind of detection methods of luminescent material.
Background technology
The research of current luminescent material and laser material in the practical application of national economy and national security, accounts for master
It leads and most important position.After the new century is entered, rare earth luminescent material Science and Technology becomes prevailing tablet from now on
The development and innovation of the new and high technologies such as display, the new lighting source of forth generation, modern medical service electronic equipment, more advanced fiber optic communication
Reliable foundation and guarantee.LED semiconductor light-emitting-diodes (LED) have high luminous efficiency, energy saving, pollution-free, long lifespan, body
The advantages that product is small, light weight, is the solid-state lighting product of new generation being most expected, and in illumination market there is very big development to dive
Power.Luminescent material can be applied in LED semiconductor light-emitting-diodes.
But for newly develop luminescent material characterization and detection and analysis also there are certain difficulties.
Invention content
Present invention is generally directed to above-mentioned technical problems, propose a kind of detection method of luminescent material, can reduce luminous material
Expect detection error, exclude experiment interference, improve conventional efficient, the analysis of ingredient, luminescent properties for luminescent material provides reliably
Foundation.
The present invention provides a kind of detection method of luminescent material, including：
(1) luminescent material to be measured is taken, is ground；
(2) XRD detections are carried out to luminescent material：Luminescent material after grinding is placed in XRD detectors and is detected, is obtained
To the XRD spectrum of luminescent material, XRD spectrum with standard card is compared, determines the matrix components of luminescent material；
(3) excitation spectrum detection is carried out to luminescent material：Luminescent material after grinding is placed in Fluorescence Spectrometer and is carried out
Excitation spectrum detects, and obtains the excitation spectrum of luminescent material；
(4) emission spectrum detection is carried out to luminescent material：Luminescent material after grinding is placed in Fluorescence Spectrometer and is carried out
Emission spectrum detects, and obtains the emission spectrum of luminescent material；
(5) excitation spectrum of luminescent material and emission spectrum are analyzed, determine luminescent material doping component and
Luminosity.
Preferably, the running parameter of the XRD detectors is：
Using Ni metal target (radiation source be K lines, λ=0.15406nm) as anode, instrument electron accelerating voltage is set as
40KV, operating current 30mA, sweep speed are 2 °/min, and 2 θ angle sweeps step-lengths of selection are 0.02 °, 2 θ angle models of measurement
Enclose is 20 °~60 °.
Preferably, the running parameter of the Fluorescence Spectrometer is：
By the use of the xenon lamp of 150W as excitation light source, R928 photomultipliers are as detector, resolution ratio 1.0nm, scanning
Speed is 2400nm/min.
Preferably, it further includes：The chromaticity coordinates of luminescent material is obtained according to the excitation spectrum of luminescent material and emission spectrum, with
Carry out the chroma-matching arithmetic of luminescent material.
A kind of detection method of luminescent material provided by the invention, the method for the present invention is simple, of low cost, can reduce hair
Luminescent material detection error excludes experiment interference, improves conventional efficient, and the analysis of ingredient, luminescent properties for luminescent material provides
Reliable foundation.
Specific embodiment
For make present invention solves the technical problem that, the technical solution that uses and the technique effect that reaches it is clearer, below
The present invention is described in further detail in conjunction with the embodiments.It is understood that specific embodiment described herein is only
For explaining the present invention rather than limitation of the invention.
The present invention provides a kind of detection method of luminescent material, including：
(1) luminescent material to be measured is taken, is ground；
(2) XRD detections are carried out to luminescent material：Luminescent material after grinding is placed in XRD detectors and is detected, is obtained
To the XRD spectrum of luminescent material, XRD spectrum with standard card is compared, determines the matrix components of luminescent material；
(3) excitation spectrum detection is carried out to luminescent material：Luminescent material after grinding is placed in Fluorescence Spectrometer and is carried out
Excitation spectrum detects, and obtains the excitation spectrum of luminescent material；
(4) emission spectrum detection is carried out to luminescent material：Luminescent material after grinding is placed in Fluorescence Spectrometer and is carried out
Emission spectrum detects, and obtains the emission spectrum of luminescent material；
(5) excitation spectrum of luminescent material and emission spectrum are analyzed, determine luminescent material doping component and
Luminosity.
Preferably, the running parameter of the XRD detectors is：
Using Ni metal target (radiation source be K lines, λ=0.15406nm) as anode, instrument electron accelerating voltage is set as
40KV, operating current 30mA, sweep speed are 2 °/min, and 2 θ angle sweeps step-lengths of selection are 0.02 °, 2 θ angle models of measurement
Enclose is 20 °~60 °.
Preferably, the running parameter of the Fluorescence Spectrometer is：
By the use of the xenon lamp of 150W as excitation light source, R928 photomultipliers are as detector, resolution ratio 1.0nm, scanning
Speed is 2400nm/min.
Preferably, it further includes：The chromaticity coordinates of luminescent material is obtained according to the excitation spectrum of luminescent material and emission spectrum, with
Carry out the chroma-matching arithmetic of luminescent material.
A kind of detection method of luminescent material provided by the invention, the method for the present invention is simple, of low cost, can reduce hair
Luminescent material detection error excludes experiment interference, improves conventional efficient, and the analysis of ingredient, luminescent properties for luminescent material provides
Reliable foundation.
Finally it should be noted that：The above embodiments are only used to illustrate the technical solution of the present invention., rather than its limitations；To the greatest extent
Pipe is described in detail the present invention with reference to foregoing embodiments, it will be understood by those of ordinary skill in the art that：Its is right
Technical solution recorded in foregoing embodiments modifies and either which part or all technical features is equally replaced
It changes, the range for various embodiments of the present invention technical solution that it does not separate the essence of the corresponding technical solution.
Claims (4)
1. a kind of detection method of luminescent material, which is characterized in that including：
(1) luminescent material to be measured is taken, is ground；
(2) XRD detections are carried out to luminescent material：Luminescent material after grinding is placed in XRD detectors and is detected, is sent out
XRD spectrum with standard card is compared, determines the matrix components of luminescent material by the XRD spectrum of luminescent material；
(3) excitation spectrum detection is carried out to luminescent material：Luminescent material after grinding is placed in Fluorescence Spectrometer and is excited
Spectral detection obtains the excitation spectrum of luminescent material；
(4) emission spectrum detection is carried out to luminescent material：Luminescent material after grinding is placed in Fluorescence Spectrometer and is emitted
Spectral detection obtains the emission spectrum of luminescent material；
(5) excitation spectrum of luminescent material and emission spectrum are analyzed, determine the doping component of luminescent material and shone
Property.
2. the detection method of luminescent material according to claim 1, which is characterized in that the work ginseng of the XRD detectors
Number is：
Using Ni metal target (radiation source be K lines, λ=0.15406nm) as anode, instrument electron accelerating voltage is set as
40KV, operating current 30mA, sweep speed are 2 °/min, and 2 θ angle sweeps step-lengths of selection are 0.02 °, 2 θ angle models of measurement
Enclose is 20 °~60 °.
3. the detection method of luminescent material according to claim 1, which is characterized in that the work ginseng of the Fluorescence Spectrometer
Number is：
By the use of the xenon lamp of 150W as excitation light source, R928 photomultipliers are as detector, resolution ratio 1.0nm, sweep speed
For 2400nm/min.
4. the detection method of luminescent material according to claim 1, which is characterized in that further include：According to luminescent material
Excitation spectrum and emission spectrum obtain the chromaticity coordinates of luminescent material, to carry out the chroma-matching arithmetic of luminescent material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711379300.5A CN108181332A (en) | 2017-12-20 | 2017-12-20 | A kind of detection method of luminescent material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711379300.5A CN108181332A (en) | 2017-12-20 | 2017-12-20 | A kind of detection method of luminescent material |
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| Publication Number | Publication Date |
|---|---|
| CN108181332A true CN108181332A (en) | 2018-06-19 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201711379300.5A Withdrawn CN108181332A (en) | 2017-12-20 | 2017-12-20 | A kind of detection method of luminescent material |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110940685A (en) * | 2019-11-22 | 2020-03-31 | 南昌航空大学 | Organic electroluminescent material, organic electroluminescent device and control method |
| CN112432934A (en) * | 2020-11-05 | 2021-03-02 | 北京中科生仪科技有限公司 | Emitted light detection method |
-
2017
- 2017-12-20 CN CN201711379300.5A patent/CN108181332A/en not_active Withdrawn
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110940685A (en) * | 2019-11-22 | 2020-03-31 | 南昌航空大学 | Organic electroluminescent material, organic electroluminescent device and control method |
| CN112432934A (en) * | 2020-11-05 | 2021-03-02 | 北京中科生仪科技有限公司 | Emitted light detection method |
| CN112432934B (en) * | 2020-11-05 | 2021-07-06 | 北京中科生仪科技有限公司 | Emitted light detection method |
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Application publication date: 20180619 |