CN108180989A - Illumination photometry system and measuring method - Google Patents
Illumination photometry system and measuring method Download PDFInfo
- Publication number
- CN108180989A CN108180989A CN201711131249.6A CN201711131249A CN108180989A CN 108180989 A CN108180989 A CN 108180989A CN 201711131249 A CN201711131249 A CN 201711131249A CN 108180989 A CN108180989 A CN 108180989A
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- China
- Prior art keywords
- illumination
- measuring probe
- under test
- device under
- terminal
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005286 illumination Methods 0.000 title claims abstract description 60
- 238000005375 photometry Methods 0.000 title claims abstract description 26
- 238000000034 method Methods 0.000 title claims abstract description 15
- 239000000523 sample Substances 0.000 claims abstract description 38
- 238000012360 testing method Methods 0.000 claims abstract description 27
- 238000001514 detection method Methods 0.000 claims abstract description 24
- 238000005259 measurement Methods 0.000 claims description 7
- 238000012545 processing Methods 0.000 claims description 6
- 230000003287 optical effect Effects 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000000205 computational method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
Abstract
The invention discloses illumination photometry system and measuring methods, the system includes illumination photometer, terminal and detection case, the measuring probe being detected in detection case equipped with device under test and multiple illumination brightness for device under test, the measuring probe is located at the lower section of device under test, measuring probe is connect with illumination photometer, illumination photometer connection terminal.The present invention only needs device to be measured being placed into detection case, and illumination is detected automatically by performing software flow, and records and analyze and process automatically, easy to operate, halfway without manpower intervention, greatly reduces error and time cost.
Description
Technical field
The present invention relates to a kind of illumination measuring technology more particularly to a kind of illumination photometry systems and measuring method.
Background technology
At present, to the optical effect of product evaluated with brightness, early period all be using briliancy instrument to shine or
Guide-lighting product carries out the measurement of a brightness.Briliancy instrument mainly takes point type and imaging type, and point type briliancy instrument is taken mainly will
Product is placed below briliancy instrument, is focused to the distance according to placement to briliancy instrument, is confirmed that measurement point position postpones and is taken a measurement
The brightness of product;Imaging type briliancy instrument is mainly the front that product is in briliancy instrument, focuses, is imaged to briliancy instrument
Operation.
But there are following defects for existing briliancy instrument:
Point type or imaging type are either taken, is required for exporting the data of measurement, then be aggregated, hand
The optical homogeneity or difference value of dynamic input results judgement product are summarized.There are operating errors and file output error for process, accurate
True rate is low, and time-consuming.
Invention content
For overcome the deficiencies in the prior art, one of the objects of the present invention is to provide a kind of illumination photometry system, energy
It enough focuses beam automatically to measure, greatly reduces error, reduce time cost.
The second object of the present invention is to provide a kind of illumination photometry method, can focus beam automatically and measure, pole
The earth reduces error, reduces time cost.
An object of the present invention adopts the following technical scheme that realization:
Illumination photometry system, be equipped with including illumination photometer, terminal and detection case, in detection case device under test and it is multiple for pair
The measuring probe that the illumination brightness of device under test is detected, the measuring probe are located at the lower section of device under test, measuring probe
It is connect with illumination photometer, illumination photometer connection terminal.
Further, the device under test is located at the top plate of detection case, and measuring probe is located at the bottom plate of detection case.
Further, the quantity of the measuring probe is three, and three measuring probes are evenly distributed.
Further, the device under test is light guide item.
Further, the terminal is computer.
Further, illumination photometer is connect by USB data line with computer.
Further, supporting seat is additionally provided in detection case, the measuring probe is placed on supporting seat.
The second object of the present invention adopts the following technical scheme that realization:
A kind of illumination photometry method, applied to one of the object of the invention any one of them illumination photometry system, including such as
Lower step:
Light beam projects step:Device under test will reflect light beam from external light source;
Beam detection step:Each measuring probe measures the brightness value of the light beam of corresponding position respectively;
Forwarding step:Illumination photometer is all sent to terminal according to by the brightness value from each measuring probe;
Processing step:Terminal handles to obtain the uniformity and otherness of light beam according to whole brightness values.
Further, in processing step, the uniform of light beam is calculated according to formula LXmin/LXmax*100% in terminal
Property, wherein, LXmin is the brightness value of numerical value minimum in whole brightness values, and LXmax is the illumination of numerical value maximum in whole brightness values
Value.
Further, in processing step, terminal is according to formula (LXmax-LXmin)/LX*100%
The otherness of light beam is calculated, wherein, LXmin is the brightness value of numerical value minimum in whole brightness values, and LXmax is
The brightness value of numerical value maximum in whole brightness values, LX are the average value of whole brightness values.
Compared with prior art, the beneficial effects of the present invention are:
The present invention only need device to be measured being placed into detection case, by perform software flow automatically to illumination into
Row detection, and record and analyze and process automatically, it is easy to operate, halfway without manpower intervention, greatly reduce error and when
Between cost.
Description of the drawings
Fig. 1 is the structure diagram of the illumination photometry system of the present invention;
Fig. 2 is the flow chart of the illumination photometry method of the present invention.
In figure:1st, illumination photometer;2nd, terminal;3rd, detection case;4th, device under test;5th, measuring probe;6th, supporting seat.
Specific embodiment
In the following, with reference to attached drawing and specific embodiment, the present invention is described further, it should be noted that not
Under the premise of conflicting, new implementation can be formed between various embodiments described below or between each technical characteristic in any combination
Example.
As shown in Figure 1, the present invention provides a kind of illumination photometry system, including illumination photometer 1, terminal 2 and detection case 3, inspection
The measuring probe 5 being detected in measuring tank 3 equipped with device under test 4 and multiple illumination brightness for device under test 4, the survey
Amount probe 5 is located at the lower section of device under test 4, and measuring probe 5 is connect with illumination photometer 1, and illumination photometer 1 connects terminal 2.It is actually using
In, device under test 4 is also associated with light source, and light source sends out optical signal and reflects light beam, the measurement of different location by device under test 4
The illumination of 5 pairs of its corresponding position light beams of probe measures, and multiple measuring probes 5 is set to be placed on different positions, so as to right
Whether the transmitting light beam of 4 different location of device under test is consistent or close, that is to say that illumination uniformity measures.
The illumination photometer 1 that the present invention selects is existing product, can select the illumination photometer of model CL-200A, technical staff
Can acquisition be directly being selected and purchased on the market.Terminal 2 can be selected as computer.USB interface is preferably provided in terminal 2, illumination photometer 1 is excellent
USB data line and 2 connection communication of terminal were gated, connection mode is simple and fast, convenient disassembly.In the situation that terminal 2 is computer
Under, future measurement probe 5 brightness value be uploaded to computer, analyzed, preserved, handled by computer, and intuitively show knot
Fruit.
As a kind of embodiment, in the present invention, device under test 4 is arranged on the top plate of detection case 3, measuring probe 5
In the bottom plate of detection case 3, so as to which measuring probe 5 can preferably detect the light beam come out from device under test 4.Measuring probe 5
Quantity be preferably three, these three measuring probes 5 are evenly distributed, are uniformly detected the light beam of corresponding position.
4 selected as light guide item of device under test in the present invention.
As a kind of embodiment, supporting seat 6 is additionally provided in detection case 3 of the invention, the measuring probe 5, which is placed on, to be held
It puts on seat 6.During operation, can also on supporting seat 6 rotation measuring probe 5, to find best angle most light beam
Carry out illumination photometry.
Still further aspect, the present invention provide a kind of illumination photometry method, apply in illumination photometry system, such as Fig. 2 institutes
Show, include the following steps:
S1:Device under test will reflect light beam from external light source;
Device under test is connected with light source, and the optical signal that light source is sent out is reflected light beam.
S2:Each measuring probe measures the brightness value of the light beam of corresponding position respectively;
Multiple measuring probes are set, and evenly distributed, measuring probe is detected brightness value, and is transmitted to illumination
Meter.
S3:Illumination photometer is all sent to terminal according to by the brightness value from each measuring probe;
S4:Terminal handles to obtain the uniformity and otherness of light beam according to whole brightness values.
In S4, the uniformity of light beam is calculated according to formula LXmin/LXmax*100% for terminal, wherein, LXmin is
The brightness value of numerical value minimum in whole brightness values, LXmax are the brightness value of numerical value maximum in whole brightness values.In addition, also according to
The otherness of light beam is calculated in formula (LXmax-LXmin)/LX*100%, wherein, LXmin is that numerical value is most in whole brightness values
Small brightness value, LXmax are the brightness value of numerical value maximum in whole brightness values, and LX is the average value of whole brightness values.All shine
The average value of angle value can be easy to get by existing computational methods.
The present invention only need device to be measured being placed into detection case, by perform software flow automatically to illumination into
Row detection, and record and analyze and process automatically, it is easy to operate, halfway without manpower intervention, greatly reduce error and when
Between cost.
The above embodiment is only the preferred embodiment of the present invention, it is impossible to the scope of protection of the invention is limited with this,
The variation and replacement for any unsubstantiality that those skilled in the art is done on the basis of the present invention belong to institute of the present invention
Claimed range.
Claims (10)
1. illumination photometry system, which is characterized in that be equipped with including illumination photometer, terminal and detection case, in detection case device under test and
The measuring probe that multiple illumination brightness for device under test are detected, the measuring probe are located under device under test
Side, measuring probe are connect with illumination photometer, illumination photometer connection terminal.
2. illumination photometry system as described in claim 1, which is characterized in that the device under test is located at the top plate of detection case,
Measuring probe is located at the bottom plate of detection case.
3. illumination photometry system as described in claim 1, which is characterized in that the quantity of the measuring probe is three, three
Measuring probe is evenly distributed.
4. illumination photometry system as described in claim 1, which is characterized in that the device under test is light guide item.
5. illumination photometry system as described in claim 1, which is characterized in that the terminal is computer.
6. illumination photometry system as claimed in claim 5, which is characterized in that illumination photometer is connect by USB data line with computer.
7. illumination photometry system as described in claim 1, which is characterized in that supporting seat, the measurement are additionally provided in detection case
Probe placement is on supporting seat.
A kind of 8. illumination photometry method, which is characterized in that applied to claim 1-7 any one of them illumination photometry systems,
Include the following steps:
Light beam projects step:Device under test will reflect light beam from external light source;
Beam detection step:Each measuring probe measures the brightness value of the light beam of corresponding position respectively;
Forwarding step:Illumination photometer is all sent to terminal according to by the brightness value from each measuring probe;
Processing step:Terminal handles to obtain the uniformity and otherness of light beam according to whole brightness values.
9. illumination photometry method as claimed in claim 8, which is characterized in that in processing step, terminal is according to formula
The uniformity of light beam is calculated in LXmin/LXmax*100%, wherein, LXmin is the illumination of numerical value minimum in whole brightness values
Value, LXmax are the brightness value of numerical value maximum in whole brightness values.
10. illumination photometry method as claimed in claim 9, which is characterized in that in processing step, terminal is according to formula
(LXmax-LXmin) otherness of light beam is calculated in/LX*100%, wherein, LXmin is that numerical value is minimum in whole brightness values
Brightness value, LXmax are the brightness value of numerical value maximum in whole brightness values, and LX is the average value of whole brightness values.
Priority Applications (1)
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CN201711131249.6A CN108180989A (en) | 2017-11-15 | 2017-11-15 | Illumination photometry system and measuring method |
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CN201711131249.6A CN108180989A (en) | 2017-11-15 | 2017-11-15 | Illumination photometry system and measuring method |
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CN201711131249.6A Pending CN108180989A (en) | 2017-11-15 | 2017-11-15 | Illumination photometry system and measuring method |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109186652A (en) * | 2018-07-27 | 2019-01-11 | 上海与德通讯技术有限公司 | The automatic test cabinet and machine to be measured of photosensitive sensors |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201111756A (en) * | 2009-09-23 | 2011-04-01 | Univ Kun Shan | Distributed multi-point illumination detection system on illuminated plane |
US20130027696A1 (en) * | 2011-07-26 | 2013-01-31 | Olympus Corporation | Wavelength distribution measuring apparatus |
CN206002200U (en) * | 2016-09-20 | 2017-03-08 | 上海时代之光照明电器检测有限公司 | A kind of Multi probe stadiums illumination test system |
-
2017
- 2017-11-15 CN CN201711131249.6A patent/CN108180989A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201111756A (en) * | 2009-09-23 | 2011-04-01 | Univ Kun Shan | Distributed multi-point illumination detection system on illuminated plane |
US20130027696A1 (en) * | 2011-07-26 | 2013-01-31 | Olympus Corporation | Wavelength distribution measuring apparatus |
CN206002200U (en) * | 2016-09-20 | 2017-03-08 | 上海时代之光照明电器检测有限公司 | A kind of Multi probe stadiums illumination test system |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109186652A (en) * | 2018-07-27 | 2019-01-11 | 上海与德通讯技术有限公司 | The automatic test cabinet and machine to be measured of photosensitive sensors |
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