CN108152734B - Testing system and testing method for valve overhaul - Google Patents
Testing system and testing method for valve overhaul Download PDFInfo
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Abstract
The invention provides a test system and a test method for valve overhaul, wherein the test system comprises an upper computer, a parameter input unit, a plurality of signal output channels, a plurality of signal isolation measurement channels, an MCU control unit and a display screen; the upper computer is used for setting configuration information required by the load to be tested according to the types of the test signals and the feedback signals; the parameter input unit is used for inputting test parameters; the display screen is used for displaying information of the test main interface; the signal output channel generates a corresponding test signal according to the test parameter; the feedback signal of the load to be measured, which is acquired by the signal isolation measuring channel in real time, is transmitted to the MCU control unit through the third ADC circuit; and the MCU control unit acquires feedback signals returned by the load to be tested in real time according to the test signals output by the signal output channel and the signal isolation measurement channel, and outputs and displays detection results. The invention has the advantages of scientific design, strong practicability, high detection efficiency and high detection precision.
Description
Technical Field
The invention relates to the technical field of valve overhaul equipment, in particular to a test system and a test method for valve overhaul.
Background
The dynamic flow balance valve can be used for keeping the flow of the water system constant, and automatically changing the resistance coefficient according to the change of the working condition of the system, so that the passing flow can be effectively controlled to keep a constant value in a certain pressure difference range, namely, when the pressure difference between the front and the rear of the valve is increased, the flow can be kept not to be increased through the automatic closing action of the valve, otherwise, when the pressure difference is reduced, the valve is automatically opened, the flow still keeps constant, the water system can be stably operated, the normal operation of the central air conditioner refrigerating function of a station is ensured, the system fault rate is reduced, and the service life of equipment is prolonged. The electric air valve actuator is suitable for air valve control of a ventilation and air conditioning system. Subway and industrial occasions use actuators of various types, and when equipment fails, a simple and effective means for locating failure points is lacking.
The commonly used service methods fall into a general category: 1. and performing fault diagnosis by using an empirical method and an alternative method. 2. The fault diagnosis is performed using a signal generator and a multimeter. 3. Fault diagnosis is performed using a signal generator or process check meter having an output signal and a simultaneous measurable signal.
The fault diagnosis is carried out by using an empirical method and an alternative method, and the defects are as follows: the fault processing time is longer, the real and effective data support is lacked, misjudgment is easy to cause, a great deal of manpower and material resource waste is caused, normal production tasks are affected, and huge losses are caused.
The method comprises the steps of performing fault diagnosis by using a signal generator and a universal meter, outputting a set voltage or current signal during fault investigation, collecting a feedback voltage or current signal, generating an adjustable voltage source or current source by using the signal generator on a use site, and measuring the voltage or current by using the universal meter; the disadvantages are: the required equipment is more, the wiring is more, the carrying and the operation are inconvenient, and the data of the output signal and the measured data can not be synchronously recorded, so that the specific analysis can not be carried out.
Fault diagnosis is performed using a signal generator or process check meter having an output signal and a simultaneous measurable signal. The signal generator or the process calibrator in the market are all universal measuring instruments and meters, and the instruments in the market are a signal source mode and a measuring mode switching mode.
One path of output signals is often needed in a working site, one path of signals are measured and used simultaneously, recorded measurement data are analyzed, and instruments and meters special for fault investigation and testing of various actuators are not available in the market; the signal source channel and the measuring channel are designed structures with common reference ground, so that the floating voltage value cannot be measured, and the voltage difference between two points output by the equipment cannot be measured. The universal measuring instrument is high in universality and poor in specificity; the operation and the setting are complex, and the display interface is not visual, so that the test and the fault diagnosis of certain equipment are affected.
In order to solve the above problems, an ideal technical solution is always sought.
Disclosure of Invention
The invention aims at overcoming the defects of the prior art, and provides a test system and a test method for valve overhaul, which are scientific in design, strong in practicability, high in detection efficiency and high in detection precision.
In order to achieve the above purpose, the technical scheme adopted by the invention is as follows: a test system for valve overhaul comprises an upper computer, a parameter input unit, a plurality of signal output channels, a plurality of signal isolation measurement channels, an MCU control unit and a display screen;
the upper computer is connected with the MCU control unit and is used for setting configuration information required by a load to be tested according to the types of the test signals and the feedback signals;
the parameter input unit is connected with the MCU control unit and used for inputting test parameters;
the display screen is connected with the MCU control unit and used for displaying information of the test main interface;
the signal output channel comprises a DAC circuit, a signal conditioning circuit, a constant voltage source driving circuit, a constant current source driving circuit, a constant voltage source real value stoping circuit and a constant current source real value stoping circuit;
the constant voltage source driving circuit and the constant current source driving circuit are connected to the MCU control unit sequentially through the signal conditioning circuit and the DAC circuit, and corresponding test signals are generated according to the test parameters;
the test signal is transmitted to the load to be tested through an output switching circuit; the constant voltage source real value extraction circuit and the constant current source real value extraction circuit collect actually output test signals in real time and feed back the actually output test signals to the MCU control unit;
the signal isolation measurement channel comprises a signal input circuit, a voltage/current switching circuit, a gear switching circuit, an input signal protection circuit and a voltage isolation transmission circuit which are connected in sequence; the voltage/current switching circuit and the gear switching circuit are connected with the MCU control unit through an isolation driving circuit; the signal input circuit is connected with the load to be tested, the voltage isolation transmission circuit is connected with the MCU control unit through a third ADC circuit, and feedback signals of the load to be tested, which are collected in real time, are transmitted to the MCU control unit through the third ADC circuit;
and the MCU control unit acquires feedback signals returned by the load to be tested in real time according to the test signals output by the signal output channel and the signal isolation measurement channel, and outputs and displays detection results.
Based on the above, the test signal is a test voltage signal or a test current signal, and the feedback signal is a feedback voltage signal or a feedback current signal.
Based on the above, the parameter input unit includes a key for inputting a test parameter, a rotary encoder for adjusting a parameter value of the test signal, and a key state feedback circuit for indicating a key state through the LED lamp.
Based on the above, the test system further comprises an LED lighting device, a temperature and humidity sensor for detecting temperature and humidity information of the test environment, an SD card for storing the feedback signal, and a serial storage module for storing the configuration information, wherein the LED lighting device, the temperature and humidity sensor, the SD card and the serial storage module are respectively connected with the MCU control unit.
Based on the above, the test system further comprises an external expansion accessory which is connected with the MCU control unit and used for providing corresponding test functions according to test requirements, and the external expansion accessory comprises a switching value output module, a switching value identification module and a programmable power supply.
Based on the above, the test system further comprises a power management circuit, wherein the power management circuit comprises a lithium battery charging circuit, a lithium battery voltage detection circuit and a one-key switching circuit which are sequentially connected, and the output end of the one-key switching circuit is respectively connected with a lithium battery voltage boosting circuit for providing 24V voltage and a DC-DC voltage boosting circuit for providing 5V voltage; the DC-DC voltage boosting circuit is connected with the LDO voltage reducing circuit to convert 5V voltage into 3.3V voltage and connected with the polarity converting circuit to convert 5V voltage into-5V voltage.
Based on the above, the parameter input unit adopts an intelligent terminal or a PC; the intelligent terminal is connected with the MCU control unit through a wireless communication module, and the PC is connected with the MCU control unit through a USB interface or an RS485 mode.
Based on the above, the signal isolation measurement channel further comprises an isolation acquisition power supply circuit and an isolation power supply floating ground circuit.
The test method of the test system for valve overhaul comprises the following steps:
step 1, the upper computer respectively sets different configuration information required by a load to be tested according to test signals and feedback signals of different types of valves, and generates a test type according to the configuration information; the configuration information comprises a test signal type, a feedback signal type, a unit, a multiplying power and a test flow;
step 2, the MCU control unit calls corresponding configuration information according to the selected test type to generate a test task of the load to be tested;
step 3, judging whether the test is a manual test or an automatic test according to the test task, and if the test is the manual test, configuring manual test parameters; if the test is automatic, automatically loading test signal parameter values;
and 4, loading a test signal parameter value according to a test task, controlling the signal output channel to output a corresponding test signal by the MCU control unit according to the test signal parameter value, controlling the signal isolation measurement channel to acquire a feedback signal returned by the load to be tested in real time, testing the load to be tested, and generating a test report according to the test signal and the feedback signal.
Based on the above, the test type includes a class a valve test type, a class B valve test type, a class C valve test type, or a class D valve test type, where the class a valve test type is configured such that the test signal and the feedback signal are both voltage signals, and the class B valve test type is configured such that the test signal and the feedback signal are both current signals; the C-type valve test type is configured such that the test signal is a voltage signal and the feedback signal is a current signal; the class D valve test type is configured such that the test signal is a current signal and the feedback signal is a voltage signal.
Compared with the prior art, the invention has outstanding substantive characteristics and remarkable progress, and concretely comprises the following steps:
1) The invention provides a test system and a test method for valve overhaul, wherein the test system comprises an upper computer, a parameter input unit, a plurality of signal output channels, a plurality of signal isolation measurement channels, an MCU control unit, a display screen and the like; the traditional testing procedure is realized through the testing system, and corresponding testing signals are output through the signal output channel; the feedback signals returned by the load to be tested are synchronously collected in real time through the signal isolation measuring channel, so that the testing efficiency is greatly improved, and the labor input cost is saved;
2) The upper computer sets configuration information required by a type A valve test type, a type B valve test type, a type C valve test type and a type D valve test type according to the test signal and the feedback signal type, and performs data acquisition of different types of valve overhaul work;
3) The signal output channel and the signal isolation measuring channel can work independently or simultaneously, and the signal output channel and the signal isolation measuring channel are isolated;
in conclusion, the invention has the advantages of scientific design, strong practicability, high detection efficiency and high detection precision.
Drawings
Fig. 1 is a schematic structural view of the present invention.
Fig. 2 is a block diagram of the signal output channel structure of the present invention.
Fig. 3 is a block diagram of the signal isolation measurement channel structure of the present invention.
FIG. 4 is a schematic diagram of a program system of the present invention.
FIG. 5 is a schematic diagram of the testing workflow of the present invention.
Fig. 6 is a schematic diagram of a master circuit of the present invention.
Fig. 7 is a schematic diagram of an ADS1256 multichannel AD acquisition circuit of the present invention.
Fig. 8 is a schematic diagram of a signal output channel circuit of the present invention.
FIG. 9 is a schematic diagram of a signal isolation measurement channel circuit of the present invention.
Detailed Description
The technical scheme of the invention is further described in detail through the following specific embodiments.
1-9, a test system for valve overhaul comprises an upper computer, a parameter input unit, a plurality of signal output channels, a plurality of signal isolation measurement channels, an MCU control unit and a display screen; the upper computer is connected with the MCU control unit and is used for respectively setting configuration information required by a load to be tested according to the types of the test signal and the feedback signal; the parameter input unit is connected with the MCU control unit and used for inputting test parameter parameters; the display screen is connected with the MCU control unit and used for displaying the test main interface according to the configuration information and displaying the test main interface to display information of the test main interface; the signal output channel comprises a DAC circuit, a signal conditioning circuit, a constant voltage source driving circuit, a constant current source driving circuit, a constant voltage source real value stoping circuit and a constant current source real value stoping circuit; the constant voltage source driving circuit and the constant current source driving circuit are connected to the MCU control unit sequentially through the signal conditioning circuit and the DAC circuit, and corresponding test signals are generated according to the test parameters; the test signal is transmitted to the load to be tested through an output switching circuit; the constant voltage source real value extraction circuit and the constant current source real value extraction circuit collect actually output test signals in real time and feed back the actually output test signals to the MCU control unit; the signal isolation measurement channel comprises a signal input circuit, a voltage/current switching circuit, a gear switching circuit, an input signal protection circuit, a voltage isolation transmission circuit and an ADC circuit which are connected in sequence; the voltage/current switching circuit and the gear switching circuit are connected with the MCU control unit through an isolation driving circuit; the signal input circuit is connected with the voltage isolation transmission circuit of the load to be tested, the voltage isolation transmission circuit is connected with the MCU control unit through a third ADC circuit, and the feedback signal of the load to be tested, which is collected in real time, is transmitted to the MCU control unit through the third ADC circuit; and the MCU control unit acquires feedback signals returned by the load to be tested in real time according to the test signals output by the signal output channel and the signal isolation measurement channel, and outputs and displays detection results.
The test signal is a test voltage signal or a test current signal, and the feedback signal is a feedback voltage signal or a feedback current signal. The invention can be provided with two paths of signal output channels and two paths of signal isolation measurement channels, or four paths of signal output channels and four paths of signal isolation measurement channels, and the invention is particularly arranged according to the requirement.
Specifically, the parameter input unit comprises a key for inputting a test parameter, a rotary encoder for adjusting a parameter value of a test signal, and a key state feedback circuit for indicating a key state through an LED lamp; the key, the rotary encoder and the key state feedback circuit are respectively connected with the MCU control unit. The rotary encoder can conveniently and flexibly adjust test parameters, can roughly and finely adjust the test parameters, has better operability, optimizes a human-computer interaction mode, has an LED indication under the key and has a key state feedback LED indication, is used for feeding back the key operation state, and is convenient to operate and use in an environment with insufficient light.
The test system further comprises an LED lighting device, a temperature and humidity sensor used for detecting temperature and humidity information of the test environment, an SD card used for storing the feedback signals and a serial storage module used for storing the configuration information, wherein the LED lighting device, the temperature and humidity sensor, the SD card and the serial storage module are respectively connected with the MCU control unit. The LED lighting device is arranged on the front side surface of the tester body, and is convenient to operate and use in environments with insufficient light by controlling the LED to be turned on and off; the temperature and humidity sensor can detect temperature and humidity information of the use environment of the testing instrument and display the temperature and humidity information on a display interface; the SD card is used for data recording and storage, and can record data offline, so that the real-time data and the historical data of the test signal and the feedback signal can be conveniently analyzed and compared; the serial memory module stores configuration information and stores related commands and flags.
In order to realize function expansion, the test system further comprises an external expansion accessory which is connected with the MCU control unit and used for providing corresponding test functions according to test requirements, the external expansion accessory is connected to the MCU control unit through a USB interface, and the external expansion accessories comprise a switching value output module, a switching value identification module and a programmable power supply. The USB interface is used as an external expansion interface to realize the connection of various functional expansion accessories; the USB interface also supports OTG firmware upgrades. Some loads to be tested output a relay mechanical switching value signal or an optical coupler numerical switching value signal, and the test system can only realize the output of a test voltage signal and a test current signal and the isolation measurement of a feedback voltage signal and a feedback current signal; the switching value signals of the load to be tested cannot be collected at the same time, so that the test system flexibly realizes the test work of the valve type through the switching value output module and the switching value identification module. The external expansion accessory can be a 0-36V or 0-3A programmable power supply, so that manual adjustment is realized or parameter configuration is performed through a USB interface, but the external expansion accessory is not limited to the voltage range, and only represents the control and design framework. The test system can be connected with a single or a plurality of external expansion accessories through the USB interface, so that the improvement of test functions and the expansion of functions are realized.
The test system also comprises a power management circuit, wherein the power management circuit comprises a lithium battery charging circuit, a lithium battery voltage detection circuit and a one-key switch circuit which are sequentially connected, and the output end of the one-key switch circuit is respectively connected with a lithium battery voltage boosting circuit for providing 24V voltage and a DC-DC voltage boosting circuit for providing 5V voltage; the DC-DC voltage boosting circuit is connected with the LDO voltage reducing circuit to convert 5V voltage into 3.3V voltage and connected with the polarity converting circuit to convert 5V voltage into-5V voltage. The lithium battery charging circuit comprises a lithium battery power supply module and a USB interface, the USB interface is used for charging the test system, power supply and power supply parameter monitoring are carried out on a load to be tested, when faults or abnormal conditions of the load to be tested cause interference to the test system, feedback signals of the load to be tested are monitored, dynamic monitoring and analysis of working states of the load to be tested are facilitated, the abnormal working states of the load to be tested are found in time, protection measures are taken, and further expansion of losses caused by faults is avoided.
Specifically, the parameter input unit may also adopt an intelligent terminal or a PC; the intelligent terminal or the PC is connected with the MCU control unit through a wireless communication module; and the intelligent terminal or the PC sends test parameters to the MCU control unit and receives feedback signals returned by the MCU control unit. The wireless communication module adopts Bluetooth, WIFI or other wireless communication modes, the intelligent terminal is an intelligent terminal such as a mobile phone and a tablet personal computer, and the testing system can remotely control and remotely monitor a load to be tested through the intelligent terminal or the PC, so that electrical connection is avoided, and personal injury caused by severe testing environment is prevented. The intelligent terminal or the PC is also connected to the Internet, test data are transmitted to other monitoring platform equipment through the Internet, so that a worker can conveniently conduct remote control and monitoring, and meanwhile, the test system is also connected with the Internet of things and is used as a data acquisition and monitoring link in big data.
The signal isolation measurement channel also comprises an isolation acquisition power supply circuit and an isolation power supply floating ground circuit. The isolation acquisition power supply circuit comprises a B0509S_1WR2 chip, capacitors C43-C46 and a resistor R54, wherein a pin VCC of the B0509S_1WR2 chip is connected to a +5V power supply end through a resistor FB2, a pin GND is connected to a grounding end through a resistor FB5, a pin ISO_VCC connecting resistor FB3 is used as an isolation power supply analog power supply positive output end, and a pin ISO_GND connecting resistor FB6 is used as an isolation power supply analog power supply negative output end. The isolated power supply suspension circuit comprises an operational amplifier LM321MF, resistors R57-R61, capacitors C51-C55 and a light emitting diode LED. The isolation acquisition power supply circuit and the isolation power supply floating ground circuit charge the signal isolation measurement channel of the test system, and isolation power supply and USB isolation communication are adopted.
The signal input circuit adopts a shielding wire to transmit signals, one end of the shielding wire is connected with the metal aviation plug, and the other end of the shielding wire is provided with a measuring probe connected with a load to be measured, so that the output signal is prevented from being interfered by the outside. The gear switching circuit comprises a photoelectric coupler AQY212EH, and a pin 3 and a pin 4 of the photoelectric coupler AQY212EH are respectively connected with a movable contact of a double-pole double-throw relay G6K_2F_Y and are used for realizing mV and V gear switching; the input signal protection circuit comprises a precision operational amplifier U11, capacitors C28-C31 and a capacitor C33; the voltage isolation transmission circuit comprises a linear optocoupler TIL300A and a precision operational amplifier U12, a pin LEDA of the linear optocoupler TIL300A is connected with the output end of the precision operational amplifier U11, a pin PD1A is connected with the negative input end of the precision operational amplifier U11, and a pin PD2A is connected with the positive input end of the precision operational amplifier U12.
The MCU control unit is also connected with a display screen, the display screen displays test interfaces of different types of valves, each interface is set according to the use instruction of the equipment, the test characteristics are set, units and specific multiplying power are displayed in a self-defined mode, converted units and numerical values are displayed in real time, and the comparison with the display values of the equipment is facilitated; and realizing special test on equipment of a certain model by switching different test interfaces. The upper computer can be used for editing and customizing the test interface, so that the flexibility and the specialization of a test mode are improved, the use environment is further aimed, the time of configuration and operation of a use site is saved to the greatest extent, and the maintenance and the test are convenient.
The working flow of the test system is shown in fig. 5: (1) initializing; (2) The MCU control unit loads configuration information set by the upper computer, wherein the configuration information comprises a test signal type, a feedback signal type, a unit, multiplying power and a test flow; (3) The MCU control unit invokes corresponding configuration information according to the selected test type to generate a test task of the load to be tested, and judges whether to perform manual test or automatic test according to the test task; (4) If the manual test is performed, configuring manual test parameters, manually setting output parameters through the parameter input unit, and entering a manual test flow; (5) If the test signal parameter value is the automatic test, automatically loading the test signal parameter value, controlling the signal output channel to output a corresponding test signal, controlling the signal isolation measurement channel to acquire a feedback signal returned by the load to be tested in real time, and judging whether the feedback signal is in a normal range according to configuration information; the test signal parameter value is preconfigured through the upper computer; (6) If the feedback signal is not in the normal range, judging the fault type according to the configuration information; (7) And if the feedback signal is in the normal range, the function of the load test to be tested is normal, and if the test task is completed, the test is ended, and a test message is generated.
The test method of the test system for valve overhaul comprises the following steps:
step 1, the upper computer sets different configuration information required by a load to be tested according to test signals and feedback signals of different types of valves respectively, and stores the different configuration information in a serial storage module; the configuration information comprises a test signal type, a feedback signal type, a unit, a multiplying power and a test flow;
displaying a test main interface which generates different test types according to the configuration information on the display screen and performing the test main interface; the test main interface comprises test types of different valve types, and the test types are in one-to-one correspondence with the configuration information;
step 2, according to the type of the load to be tested, selecting different valve test types on a test main interface through the parameter input unit; the MCU control unit calls corresponding configuration information pre-stored in the serial storage module according to the selected test type to generate a test task of the load to be tested;
step 3, judging whether the test is a manual test or an automatic test according to the test task, and if the test is the manual test, configuring manual test parameters; if the test is automatic, automatically loading a test signal parameter value, wherein the test signal parameter value is preset;
and 4, loading a test signal parameter value according to a test task, controlling the signal output channel to output a corresponding test signal by the MCU control unit according to the test signal parameter value, controlling the signal isolation measurement channel to acquire a feedback signal returned by the load to be tested in real time, testing the load to be tested, and generating a test report according to the test signal and the feedback signal.
The test type comprises a class A valve test type, a class B valve test type, a class C valve test type or a class D valve test type, wherein the class A valve test type is configured to be a voltage signal and the feedback signal, and the class B valve test type is configured to be a current signal and the feedback signal; the C-type valve test type is configured such that the test signal is a voltage signal and the feedback signal is a current signal; the class D valve test type is configured such that the test signal is a current signal and the feedback signal is a voltage signal.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention and not for limiting the same; while the invention has been described in detail with reference to the preferred embodiments, those skilled in the art will appreciate that: modifications may be made to the specific embodiments of the present invention or equivalents may be substituted for part of the technical features thereof; without departing from the spirit of the invention, it is intended to cover the scope of the invention as claimed.
Claims (7)
1. A test system for valve service, characterized by: the system comprises an upper computer, a parameter input unit, a plurality of signal output channels, a plurality of signal isolation measurement channels, an MCU control unit and a display screen;
the upper computer is connected with the MCU control unit and is used for setting configuration information required by a load to be tested according to the types of the test signals and the feedback signals;
the parameter input unit is connected with the MCU control unit and used for inputting test parameters; the display screen is connected with the MCU control unit and used for displaying information of the test main interface; the signal output channel comprises a DAC circuit, a signal conditioning circuit, a constant voltage source driving circuit, a constant current source driving circuit, a constant voltage source real value stoping circuit and a constant current source real value stoping circuit; the constant voltage source driving circuit and the constant current source driving circuit are connected to the MCU control unit sequentially through the signal conditioning circuit and the DAC circuit, and corresponding test signals are generated according to the test parameters; the test signal is transmitted to the load to be tested through an output switching circuit; the constant voltage source real value extraction circuit and the constant current source real value extraction circuit collect actually output test signals in real time and feed back the actually output test signals to the MCU control unit; the signal isolation measurement channel comprises a signal input circuit, a voltage/current switching circuit, a gear switching circuit, an input signal protection circuit and a voltage isolation transmission circuit which are connected in sequence; the voltage/current switching circuit and the gear switching circuit are connected with the MCU control unit through an isolation driving circuit; the signal input circuit is connected with the load to be tested, the voltage isolation transmission circuit is connected with the MCU control unit through a third ADC circuit, and feedback signals of the load to be tested, which are collected in real time, are transmitted to the MCU control unit through the third ADC circuit; the MCU control unit acquires feedback signals returned by the load to be tested in real time according to the test signals output by the signal output channel and the signal isolation measurement channel, and outputs and displays detection results;
the test method of the test system comprises the following steps:
step 1, the upper computer respectively sets different configuration information required by a load to be tested according to test signals and feedback signals of different types of valves, and generates a test type according to the configuration information; the configuration information comprises a test signal type, a feedback signal type, a unit, a multiplying power and a test flow;
the test type comprises a class A valve test type, a class B valve test type, a class C valve test type or a class D valve test type, wherein the class A valve test type is configured to be a voltage signal and the feedback signal, and the class B valve test type is configured to be a current signal and the feedback signal; the C-type valve test type is configured such that the test signal is a voltage signal and the feedback signal is a current signal; the class D valve test type is configured such that the test signal is a current signal and the feedback signal is a voltage signal;
step 2, the MCU control unit calls corresponding configuration information according to the selected test type to generate a test task of the load to be tested;
step 3, judging whether the test is a manual test or an automatic test according to the test task, and if the test is the manual test, configuring manual test parameters; if the test is automatic, automatically loading test signal parameter values;
and 4, loading a test signal parameter value according to a test task, controlling the signal output channel to output a corresponding test signal by the MCU control unit according to the test signal parameter value, controlling the signal isolation measurement channel to acquire a feedback signal returned by the load to be tested in real time, testing the load to be tested, and generating a test report according to the test signal and the feedback signal.
2. The test system for valve service according to claim 1, wherein: the parameter input unit comprises a key for inputting test parameters, a rotary encoder for adjusting the parameter values of the test signals, and a key state feedback circuit for indicating the key states through the LED lamps.
3. A test system for valve service according to claim 1 or 2, characterized in that: the test system further comprises an LED lighting device, a temperature and humidity sensor used for detecting temperature and humidity information of the test environment, an SD card used for storing the feedback signals and a serial storage module used for storing the configuration information, wherein the LED lighting device, the temperature and humidity sensor, the SD card and the serial storage module are respectively connected with the MCU control unit.
4. A test system for valve service according to claim 3, wherein: the test system also comprises an external expansion accessory which is connected with the MCU control unit and used for providing corresponding test functions according to test requirements, wherein the external expansion accessory comprises a switching value output module, a switching value identification module and a programmable power supply.
5. A test system for valve service according to claim 3, wherein: the test system also comprises a power management circuit, wherein the power management circuit comprises a lithium battery charging circuit, a lithium battery voltage detection circuit and a one-key switch circuit which are sequentially connected, and the output end of the one-key switch circuit is respectively connected with a lithium battery voltage boosting circuit for providing 24V voltage and a DC-DC voltage boosting circuit for providing 5V voltage; the DC-DC voltage boosting circuit is connected with the LDO voltage reducing circuit to convert 5V voltage into 3.3V voltage and connected with the polarity converting circuit to convert 5V voltage into-5V voltage.
6. The test system for valve service according to claim 1, wherein: the parameter input unit adopts an intelligent terminal or a PC; the intelligent terminal is connected with the MCU control unit through a wireless communication module, and the PC is connected with the MCU control unit through a USB interface or an RS485 mode.
7. The test system for valve service according to claim 5, wherein: the signal isolation measurement channel also comprises an isolation acquisition power supply circuit and an isolation power supply floating ground circuit.
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| CN112034280B (en) * | 2020-07-23 | 2023-08-08 | 郑州地铁集团有限公司运营分公司 | Portable platform door system multiplex detection switch testing arrangement |
| CN112034334A (en) * | 2020-08-31 | 2020-12-04 | 龙铁纵横（北京）轨道交通科技股份有限公司 | Rail transit locomotive safety loop relay function testing device and method |
| CN112698993B (en) * | 2020-11-19 | 2022-11-15 | 苏州浪潮智能科技有限公司 | Method and device for measuring load of hard disk backboard |
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