CN108118293B - Negative Poisson ratio perovskite type thin film material and preparation method thereof - Google Patents

Negative Poisson ratio perovskite type thin film material and preparation method thereof Download PDF

Info

Publication number
CN108118293B
CN108118293B CN201611086729.0A CN201611086729A CN108118293B CN 108118293 B CN108118293 B CN 108118293B CN 201611086729 A CN201611086729 A CN 201611086729A CN 108118293 B CN108118293 B CN 108118293B
Authority
CN
China
Prior art keywords
thin film
ratio
film material
negative poisson
perovskite
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201611086729.0A
Other languages
Chinese (zh)
Other versions
CN108118293A (en
Inventor
陈朗
李晓文
黄传威
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Southwest University of Science and Technology
Original Assignee
Southwest University of Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Southwest University of Science and Technology filed Critical Southwest University of Science and Technology
Priority to CN201611086729.0A priority Critical patent/CN108118293B/en
Publication of CN108118293A publication Critical patent/CN108118293A/en
Application granted granted Critical
Publication of CN108118293B publication Critical patent/CN108118293B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/08Oxides
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/01Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
    • C04B35/46Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates
    • C04B35/462Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates based on titanates
    • C04B35/465Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates based on titanates based on alkaline earth metal titanates
    • C04B35/468Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates based on titanates based on alkaline earth metal titanates based on barium titanates
    • C04B35/4682Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates based on titanates based on alkaline earth metal titanates based on barium titanates based on BaTiO3 perovskite phase
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/622Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/28Vacuum evaporation by wave energy or particle radiation

Abstract

The invention relates to a negative poisson ratio perovskite type thin film material and a preparation method thereof. The chemical component of the perovskite type film material is BaTiO3Of perovskite type ABO3The structure of (1). Experiments show that the perovskite type thin film material has a negative Poisson ratio and is a material with a negative Poisson ratio characteristic.

Description

Negative Poisson ratio perovskite type thin film material and preparation method thereof
Technical Field
The invention relates to the technical field of metamaterials, in particular to a negative Poisson ratio perovskite type thin film material and a preparation method thereof.
Background
Metamaterials have a special microstructure with many unusual properties in electromagnetic, acoustic, plasmonic, mechanical, and thermal aspects. The poisson ratio of a material refers to the ratio of the absolute value of transverse positive strain and axial positive strain of the material when the material is unidirectionally pulled or pressed, and is also called a transverse deformation coefficient, which is an elastic constant reflecting transverse deformation of the material. The materials with different Poisson ratios show different mechanical properties, compared with the traditional material with the positive Poisson ratio characteristic, the material with the negative Poisson ratio characteristic has better physical properties, and the mechanical properties of the material with the negative Poisson ratio, including shear rigidity, anti-nicking, anti-fatigue and other properties, can be obviously improved compared with the material with the positive Poisson ratio. Therefore, the material with the negative Poisson ratio characteristic can be applied to many fields, and particularly has good application prospect in the fields of space, biomedicine, weapons, intelligent materials and the like.
However, in conventional materials, the poisson's ratio of the incompressible liquid is typically 0.5, i.e., the liquid does not change volume under load. The poisson's ratio of gas and cork is close to 0, that is gas and cork are compressible objects. Whereas for solid and functional oxides the poisson ratio is typically 0.1 to 0.3. Although theoretically the theoretical poisson's ratio of isotropic materials can vary from-1 to 0.5, no experiment has been done to date to observe the negative poisson's ratio phenomenon of solid materials. Perovskite type material (molecular general formula is ABO) in metamaterial3) Is a novel inorganic non-metallic material with unique physical and chemical properties, and the physical properties thereof have been studied by people in a large quantity, but most of the ABOs are considered3The poisson's ratio of the oxides of the structure is approximately 0.3 and a systematic approach to producing negative poisson's ratio perovskite-type materials has not been found.
Disclosure of Invention
Based on the above, it is necessary to provide a negative poisson ratio perovskite thin film material and a preparation method thereof.
The negative Poisson ratio perovskite type thin film material comprises BaTiO as a chemical component3The perovskite thin film material has a negative Poisson's ratio.
In one embodiment, the negative poisson's ratio perovskite thin film material has a poisson's ratio of-0.421 to-0.225.
The preparation method of the negative Poisson ratio perovskite thin film material comprises the following steps:
providing a target material, wherein the chemical component of the target material is BaTiO3
Placing the target material in pulsed laser deposition equipment, and in an oxygen atmosphere, controlling the laser energy density to be 1.5J/cm2~2.5J/cm2Bombarding the target material by laser with the laser frequency of 1.5 Hz-2.5 Hz, so that the target material is melted to generate plasma; and
and depositing the plasma on a substrate with the temperature of 500-700 ℃ to form the negative Poisson ratio perovskite thin film material.
In one embodiment, the target material is prepared by the following method:
mixing BaCO3And TiO2Mixing to obtain a mixture;
ball-milling the mixture to obtain a first powder material;
presintering the first powder for 9-11 h at 850-950 ℃ to obtain a presintering material;
ball-milling the pre-sintered material to obtain a second powder material;
and pressing and molding the second powder, and sintering for 9-11 h at 1000-1200 ℃ to obtain the target material.
In one embodiment, the oxygen pressure in the oxygen atmosphere is 0.5Pa to 10 Pa.
In one embodiment, the BaCO in the mixture3With the TiO mentioned2The mass ratio of (A) to (B) is 0.8-1.2: 1.
in one embodiment, the BaCO in the mixture3With the TiO mentioned2The mass ratio of (1): 1.
in one embodiment, the step of drying the mixture at 80 ℃ to 120 ℃ is further included before the step of ball milling the mixture.
In one embodiment, the operation of ball milling the pre-sintering material is specifically to put the pre-sintering material into a ball mill for ball milling for 4 to 6 hours.
In one embodiment, the negative poisson's ratio perovskite thin film material is formed to have a thickness of 50nm to 150 nm.
The inventor conducts a great deal of research on perovskite type materials to prepare a negative Poisson ratio perovskite type thin film material. The chemical component of the film material is BaTiO3Of perovskite type ABO3The structure of (1). Experiments show that the perovskite type thin film material has a negative Poisson ratio and is a material with a negative Poisson ratio characteristic.
Drawings
FIG. 1 is a flow chart of a method for preparing a negative Poisson's ratio perovskite thin film material according to an embodiment;
FIG. 2 is a flow chart of a method of preparing a target according to one embodiment;
FIG. 3 is a schematic diagram of the principle of the Poisson's ratio experiment for determining perovskite thin film material.
Detailed Description
The following mainly refers to the accompanying drawings and specific examples to further explain the negative poisson ratio perovskite thin film material and the preparation method thereof in detail.
An embodiment of the negative poisson's ratio perovskite thin film material has a chemical composition of BaTiO3(barium titanate) having a negative poisson's ratio.
Experiments show that the perovskite type thin film material has a Poisson ratio of less than 0, the Poisson ratios measured in multiple directions are negative numbers, and the perovskite type thin film material has the mechanical properties of a negative Poisson ratio material.
Specifically, the Poisson ratio of the perovskite thin film material is-0.421 to-0.225.
The results of multi-directional poisson's ratio measurements on the perovskite thin film materials of the examples show that the perovskite thin film materials have the characteristics of a negative poisson's ratio, wherein the poisson's ratio is between-0.421 and-0.225, and is less than 0.
In one embodiment, the thickness of the perovskite thin film material is 50nm to 150 nm.
The chemical component of the perovskite thin film material is BaTiO3Of perovskite type ABO3The structure of (1). Experiments show that the perovskite type thin film material has a negative Poisson ratio and is a material with a negative Poisson ratio characteristic. Can be applied to the fields of space, biomedicine, weapons, intelligent materials and the like.
The invention also provides a preparation method of the negative Poisson ratio perovskite thin film material.
Referring to fig. 1, a method for preparing a negative poisson' S ratio perovskite thin film material according to an embodiment includes the following steps S110 to S130.
S110, providing a target material, wherein the chemical component of the target material is BaTiO3
The chemical component of the target material is BaTiO3Pulse and vesselAfter laser deposition, BaTiO can be formed3A film of (2).
S120, placing the target obtained in the step S110 in pulsed laser deposition equipment, and in an oxygen atmosphere, enabling the laser energy density to be 1.5J/cm2~2.5J/cm2And the laser with the laser frequency of 1.5 Hz-2.5 Hz bombards the target material, so that the target material is melted to generate plasma.
In this embodiment, a Pulsed Laser Deposition (PLD) method is used to prepare the perovskite thin film. Bombarding the target material by using laser, melting the target material to generate plasma, and depositing the plasma on the substrate to obtain the film.
Specifically, the energy density of the laser is 1.5J/cm2~2.5J/cm2And the laser frequency is 1.5 Hz-2.5 Hz.
In one embodiment, the laser has an energy density of 2J/cm2~2.5J/cm2And the laser frequency is 1.5 Hz-2 Hz.
In another embodiment, the laser has an energy density of 1.5J/cm2~2J/cm2And the laser frequency is 2 Hz-2.5 Hz.
Specifically, the time of laser bombardment on the target material is 30-90 min, so that the target material is melted to generate plasma.
Specifically, the oxygen atmosphere refers to introducing pure oxygen into the pulsed laser deposition equipment, and the oxygen pressure of the oxygen atmosphere is 0.5-10 Pa. Bombarding the target material with laser in oxygen atmosphere, which is favorable for melting the target material to generate plasma, and depositing the plasma on a substrate with the temperature of 500-700 ℃ to form the negative Poisson ratio perovskite type thin film material.
In one embodiment, the oxygen atmosphere has an oxygen pressure of 1 Pa.
And S130, depositing the plasma obtained in the step S120 on a substrate with the temperature of 500-700 ℃ to form the negative Poisson ratio perovskite type thin film material.
The target material is melted to generate plasma, and the plasma is emitted and deposited on the substrate, so that the perovskite type thin film material is formed on the substrate.
In general, the temperature of the substrate can be controlled to be 500 to 700 ℃ by connecting a heater to the substrate. The substrate has a certain temperature, and when the plasma is deposited on the substrate, the temperature is not quenched, so that the deposited perovskite type thin film material has a specific microstructure and thus has a negative Poisson ratio characteristic.
In one embodiment, the substrate may be a silicon wafer. The silicon wafer has good high temperature resistance and can bear the temperature required by pulsed laser deposition.
Specifically, the thickness of the negative Poisson ratio perovskite thin film material obtained by deposition is 50nm to 150 nm. Of course, it will be appreciated that in other embodiments, the deposition time may also be adjusted to obtain different thicknesses of negative poisson's ratio perovskite thin film materials.
The preparation method of the negative Poisson's ratio perovskite type thin film material can prepare BaTiO chemical composition by improving parameters of pulse laser deposition3The perovskite thin film material has a negative Poisson's ratio characteristic.
Referring to fig. 2, in one embodiment, the target is prepared by the following steps S210 to S250.
S210, mixing BaCO3And TiO2Mixing to obtain a mixture.
In particular, BaCO3The purity of the (barium carbonate) is more than 99.99%. TiO 22The purity of the titanium dioxide is more than 99.99 percent.
In one embodiment, the mixture comprises BaCO3With TiO2The mass ratio of (A) to (B) is 0.8-1.2: 1.
further, BaCO in the mixture3With TiO2The mass ratio of (1): 1.
in one embodiment, the operation of ball milling the mixture further comprises drying the mixture at 80 ℃ to 120 ℃. Specifically, the mixture may be baked in an oven set at 100 ℃ for about 10 hours to remove moisture.
S220, ball-milling the mixture obtained in the S210 to obtain a first powder material.
Specifically, the mixture can be placed in a ball mill for ball milling for 4 to 6 hours, so thatBaCO3And TiO2And (4) changing into powder to obtain first powder.
S230, pre-burning the first powder obtained in the step S220 for 9 to 11 hours at the temperature of 850 to 950 ℃ to obtain a pre-burned material.
Pre-burning BaCO at 850-950 deg.C3And TiO2Of mixed powder of, BaCO3With TiO2Reaction to produce BaTiO3Therefore, the chemical component in the pre-sintering material is BaTiO3
Specifically, the first powder is pre-sintered for 10 hours at the temperature of 900 ℃ to obtain a pre-sintered material.
S240, ball-milling the pre-sintered material obtained in the S230 to obtain second powder.
Pre-sintering to produce BaTiO3And further ball milling to change the pre-sintered material into powder to obtain second powder.
Specifically, the operation of ball milling the pre-sintering material is to put the pre-sintering material into a ball mill for ball milling for 4 to 6 hours. And the pre-sintered material is changed into powder after ball milling to obtain second powder.
S250, pressing and forming the second powder obtained in the step S240, and sintering for 9-11 hours at the temperature of 1000-1200 ℃ to obtain the target material.
Specifically, the second powder may be pressed into various desired shapes as required.
In this embodiment, the target material is obtained by sintering at 1200 ℃ for 10 hours.
The preparation method of the target material adopts BaCO3And TiO2As reaction raw materials, the BaTiO chemical component is prepared by the processes of ball milling, presintering, ball milling again, sintering and the like3The target material has good uniformity. After deposition of the pulse laser, the target material can be melted to generate plasma to be deposited on the substrate, so that the perovskite thin film material with the negative Poisson's ratio characteristic is obtained.
The preparation method of the perovskite thin film material can prepare BaTiO with chemical components3The perovskite thin film material of (1). Experiments show that the Poisson ratio of the perovskite thin film material is negative.
The following are specific examples.
In the following examples, BaCO is not particularly specified3Has a purity of 99.99% or more, TiO2The purity of (A) is 99.99% or more. The pulsed laser deposition apparatus was purchased from compax corporation, laser emitter model compax pro102F, chamber model BRM-133.
The prepared perovskite type thin film material is measured according to the conventional method for the Poisson's ratio of the perovskite type thin film material. The specific test principle is shown in fig. 3, the material to be tested is placed in a nanoindenter, and the elastic modulus of the material under a coordinate (x, y, z) is measured by a mechanical probe. Calculating a rigidity matrix of the material under the current coordinate system according to the elastic modulus of the material, and solving an inverse matrix according to the rigidity matrix to obtain the flexibility tensor S of the material under the current coordinate systemijkl. Rotating the material to be measured at the current coordinate (x, y, z) by a certain angle around the origin to obtain a new coordinate (x ', y', z '), measuring the elastic modulus of the material under the coordinate (x', y ', z'), calculating the rigidity matrix of the material under the rotated coordinate system according to the elastic modulus of the material, and obtaining the flexibility tensor S 'of the material under the new coordinate according to the inversion matrix of the rigidity matrix'ijkl. The poisson ratio (V) may be expressed as:
Figure BDA0001167389590000061
wherein i, j, k, l is 1,2, 3.
Example 1
Mixing BaCO with the mass ratio of 1:13And TiO2Mixing to obtain a mixture. The mixture is baked at 100 ℃ for about 10h to remove water. Then ball milling is carried out for 5 hours in a ball mill to obtain first powder. And after the ball milling is finished, pre-burning the first powder for 10 hours at 900 ℃ to obtain a pre-sintered material. And placing the pre-sintered material in a ball mill for ball milling for 5 hours to obtain second powder. Pressing and molding the second powder, and sintering for 10 hours at 1200 ℃ to obtain BaTiO powder with the chemical component3The target of (1). Placing the target material in a pulsed laser deposition device, and under the condition of oxygen pressure of 1Pa, controlling the laser energy density to be 2J/cm2Laser bombardment target with laser frequency of 2HzMelting the target material for 60min to generate plasma. Plasma deposition is carried out on a substrate with the temperature of 600 ℃ to form the perovskite type thin film material with the thickness of about 100 nm.
The prepared perovskite type thin film material is placed in a nanoindentor, the elastic modulus is measured in different directions through a mechanical probe, and the Poisson ratio of the material in each direction is calculated to be negative and is between-0.421 and-0.225.
Example 2
Mixing BaCO with the mass ratio of 0.8:13And TiO2Mixing to obtain a mixture. The mixture is baked at 80 ℃ for about 10h to remove water. Then ball milling is carried out for 4 hours in a ball mill to obtain first powder. After the ball milling is finished, pre-burning the first powder for 11 hours at 850 ℃ to obtain a pre-sintered material. And placing the pre-sintered material in a ball mill for ball milling for 4 hours to obtain second powder. Pressing and molding the second powder, and sintering for 9 hours at 1000 ℃ to obtain BaTiO powder with a chemical component3The target of (1). Placing the target material in a pulsed laser deposition device, and under the condition of 0.5Pa oxygen pressure, controlling the laser energy density to be 1.5J/cm2And bombarding the target material for 30min by laser with the laser frequency of 2.5Hz, so that the target material is melted to generate plasma. Plasma deposition is carried out on a substrate with the temperature of 500 ℃ to form the perovskite type thin film material with the thickness of about 50 nm.
The prepared perovskite type thin film material is placed in a nanoindentor, the elastic modulus is measured in different directions through a mechanical probe, and the Poisson ratio of the material in each direction is calculated to be negative and is between-0.421 and-0.225.
Example 3
Mixing BaCO with the mass ratio of 1.2:13And TiO2Mixing to obtain a mixture. The mixture was baked at 120 ℃ for about 10 hours to remove water. Then ball milling is carried out for 6 hours in a ball mill to obtain first powder. And after the ball milling is finished, pre-burning the first powder for 9 hours at 950 ℃ to obtain a pre-sintered material. And placing the pre-sintered material in a ball mill for ball milling for 6 hours to obtain second powder. Pressing and molding the second powder, and sintering for 11 hours at 1100 ℃ to obtain BaTiO powder with the chemical composition3The target of (1). Placing the target material in a pulsed laser deposition deviceUnder the condition of 10Pa oxygen pressure, the laser energy density is 2.5J/cm2And bombarding the target material for 90min by laser with the laser frequency of 1.5Hz, so that the target material is melted to generate plasma. Plasma deposition is carried out on a substrate with the temperature of 700 ℃ to form the perovskite type thin film material with the thickness of about 150 nm.
The prepared perovskite type thin film material is placed in a nanoindentor, the elastic modulus is measured in different directions through a mechanical probe, and the Poisson ratio of the material in each direction is calculated to be negative and is between-0.421 and-0.225.
Experiments show that the Poisson ratio of the cork is close to 0 by using the same method, which indicates that the testing method is feasible. The perovskite thin film material prepared by the invention has the Poisson ratio of-0.421 to-0.225, and is a material with the negative Poisson ratio characteristic.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (8)

1. The negative Poisson ratio perovskite type thin film material is characterized in that the chemical component of the perovskite type thin film material is BaTiO3The perovskite type thin film material has a negative Poisson ratio, and the thickness of the perovskite type thin film material with the negative Poisson ratio is 50 nm-150 nm.
2. The negative poisson's ratio perovskite thin film material according to claim 1, wherein the poisson's ratio of the perovskite thin film material is-0.421 to-0.225.
3. The method for preparing the negative poisson's ratio perovskite thin film material as claimed in any one of claims 1-2, characterized by comprising the following steps:
providing a target material, wherein the chemical component of the target material is BaTiO3
Placing the target material in pulsed laser deposition equipment, and in an oxygen atmosphere, controlling the laser energy density to be 1.5J/cm2~2.5J/cm2Bombarding the target material for 30-90 min by laser with the laser frequency of 1.5-2.5 Hz to melt the target material to generate plasma, wherein the oxygen pressure in the oxygen atmosphere is 0.5-10 Pa; and
and depositing the plasma on a substrate with the temperature of 500-700 ℃ to form the negative Poisson's ratio perovskite thin film material, wherein the substrate is a silicon wafer.
4. The method for preparing the negative poisson's ratio perovskite thin film material according to claim 3, wherein the target material is prepared by adopting the following method:
mixing BaCO3And TiO2Mixing to obtain a mixture;
ball-milling the mixture to obtain a first powder material;
presintering the first powder for 9-11 h at 850-950 ℃ to obtain a presintering material;
ball-milling the pre-sintered material to obtain a second powder material;
and pressing and molding the second powder, and sintering for 9-11 h at 1000-1200 ℃ to obtain the target material.
5. The method of claim 4, wherein the BaCO in the mixture is present in the form of a thin film of negative Poisson's ratio perovskite material3With the TiO mentioned2The mass ratio of (A) to (B) is 0.8-1.2: 1.
6. the method for preparing a negative Poisson's ratio perovskite thin film material according to claim 4 or 5, wherein the BaCO in the mixture3With the TiO mentioned2The mass ratio of (1): 1.
7. the method for preparing a negative poisson's ratio perovskite thin film material according to claim 4, wherein the step of drying the mixture at 80-120 ℃ is further included before the step of ball milling the mixture.
8. The preparation method of the negative poisson's ratio perovskite thin film material according to claim 4, wherein the operation of ball milling the pre-sintering material is specifically to put the pre-sintering material into a ball mill for ball milling for 4-6 h.
CN201611086729.0A 2016-11-30 2016-11-30 Negative Poisson ratio perovskite type thin film material and preparation method thereof Active CN108118293B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201611086729.0A CN108118293B (en) 2016-11-30 2016-11-30 Negative Poisson ratio perovskite type thin film material and preparation method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201611086729.0A CN108118293B (en) 2016-11-30 2016-11-30 Negative Poisson ratio perovskite type thin film material and preparation method thereof

Publications (2)

Publication Number Publication Date
CN108118293A CN108118293A (en) 2018-06-05
CN108118293B true CN108118293B (en) 2020-04-03

Family

ID=62227197

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201611086729.0A Active CN108118293B (en) 2016-11-30 2016-11-30 Negative Poisson ratio perovskite type thin film material and preparation method thereof

Country Status (1)

Country Link
CN (1) CN108118293B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000216349A (en) * 1998-11-12 2000-08-04 Internatl Business Mach Corp <Ibm> Ferroelectric storage read/write memory
CN101262040A (en) * 2008-04-24 2008-09-10 湘潭大学 Oxide lanthanon magnetic semiconductor/ferroelectric heterogeneous structure and its making method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7449738B2 (en) * 2004-10-29 2008-11-11 Wisconsin Alumni Research Foundation Strain-engineered ferroelectric thin films
CN103325942B (en) * 2013-06-24 2015-09-09 济南大学 Ferroelectric tunnel junction device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000216349A (en) * 1998-11-12 2000-08-04 Internatl Business Mach Corp <Ibm> Ferroelectric storage read/write memory
CN101262040A (en) * 2008-04-24 2008-09-10 湘潭大学 Oxide lanthanon magnetic semiconductor/ferroelectric heterogeneous structure and its making method

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
Anelastic anomalies and negative Poisson’s ratio in tetragonal BaTiO3 ceramics;Liang Dong等;《Applied physics letters》;20100406;摘要,图2 *
In situ stress measurements during pulsed laser deposition of BaTiO3 and SrTiO3 atomic layers on Pt(001);J.Premper等;《Applied Surface Science》;20150209;第335卷;第44页右栏第2段-第45页左栏第10段 *
J.Premper等.In situ stress measurements during pulsed laser deposition of BaTiO3 and SrTiO3 atomic layers on Pt(001).《Applied Surface Science》.2015,第335卷 *
不同厚度BaTiO3薄膜的铁电隧道结电学性质的研究;温嘉红;《中国优秀硕士学位论文全文数据库 基础科学辑》;20150215(第02期);正文第17页,图2-2、2-3 *

Also Published As

Publication number Publication date
CN108118293A (en) 2018-06-05

Similar Documents

Publication Publication Date Title
Cardoso et al. Micro and nanofilms of poly (vinylidene fluoride) with controlled thickness, morphology and electroactive crystalline phase for sensor and actuator applications
Chen et al. Electrical properties and energy-storage performance of (Pb0. 92Ba0. 05La0. 02)(Zr0. 68Sn0. 27Ti0. 05) O3 antiferroelectric thick films prepared by tape-casing method
US10280091B2 (en) Yttrium oxyfluoride, starting material powder for production of stabilized yttrium oxyfluoride, and method for producing stabilized yttrium oxyfluoride
Wang et al. Intensive particle rearrangement in the early stage of spark plasma sintering process
CN109234679B (en) Double-layer PNZST perovskite antiferroelectric film and preparation method thereof
JP2008150247A (en) Manufacturing method of piezoelectric ceramic, piezoelectric ceramic, and piezoelectric element
US20160104551A1 (en) Yttria based conductive plasma-resistant member and methods thereof
Liao et al. Dielectric and tunable properties of columnar Ba0. 6Sr0. 4TiO3-MgO composites prepared by spark plasma sintering
Unlu et al. The spark plasma sintering of silicon carbide ceramics using alumina
CN108118293B (en) Negative Poisson ratio perovskite type thin film material and preparation method thereof
Wang et al. Effect of pore content on diffuse phase transition behaviour of porous 0.5 BaZr0. 2Ti0. 8O3–0.5 Ba0. 7Ca0. 3TiO3 ceramics
JP6347085B2 (en) Ferroelectric film and manufacturing method thereof
Ayrikyan et al. Multilayer lead‐free piezoceramic composites: Influence of co‐firing on microstructure and electromechanical behavior
KR20180034340A (en) Manufacturing method of translucent yttria by hot pressing sintering
Nie et al. Properties of Low‐Temperature Sintering PNN–PMW–PSN–PZT Piezoelectric Ceramics with Ba (Cu1/2W1/2) O3 Sintering Aids
Kühnlein et al. Development of a model for the sintering of PZT multilayer ceramics and their dielectric properties
CN109797367B (en) Lead zirconate titanate/nickel iron oxide electric superlattice thin film material and preparation method thereof
KR101925215B1 (en) Polycrystal zirconia compounds and preparing method of the same
Zhu et al. Fabrication of 0.655 Pb (Mg 1/3 Nb 2/3) O 3-0.345 PbTiO 3 functionally graded piezoelectric actuator by tape-casting
Veselov et al. Modification properties of the dielectric membrane films using high temperature annealing
Li et al. A Pb (In1/2Nb1/2) O3–Pb (Zn1/3Nb2/3) O3–PbTiO3 ternary ferroelectric system with high Tc and high piezoelectric properties
CN108511112A (en) A kind of nickel acid lanthanum conductive film and its preparation method and application
CN110357629A (en) A kind of solid solution and preparation method of tungsten bronze and perovskite structure oxide formation
Lee et al. Stress modulation and ferroelectric properties of nanograined PbTiO 3 thick films on the different substrates fabricated by aerosol deposition
Park et al. Application of spark plasma sintering for growing dense Pb (Mg 1/3 Nb 2/3) O 3–35 mol% PbTiO 3 single crystal by solid-state crystal growth

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant