CN108106723A - A kind of device and method for enhancing Terahertz Electro-optic sampling detectivity - Google Patents
A kind of device and method for enhancing Terahertz Electro-optic sampling detectivity Download PDFInfo
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- CN108106723A CN108106723A CN201711364883.4A CN201711364883A CN108106723A CN 108106723 A CN108106723 A CN 108106723A CN 201711364883 A CN201711364883 A CN 201711364883A CN 108106723 A CN108106723 A CN 108106723A
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- 238000005070 sampling Methods 0.000 title claims abstract description 26
- 238000000034 method Methods 0.000 title claims abstract description 21
- 230000002708 enhancing effect Effects 0.000 title claims abstract description 12
- 230000010287 polarization Effects 0.000 claims abstract description 68
- 239000013078 crystal Substances 0.000 claims abstract description 24
- 239000011159 matrix material Substances 0.000 claims description 19
- 230000005684 electric field Effects 0.000 claims description 13
- 238000001514 detection method Methods 0.000 claims description 6
- 238000005259 measurement Methods 0.000 claims description 4
- 238000010606 normalization Methods 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims 1
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- 238000007796 conventional method Methods 0.000 description 1
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- 238000003199 nucleic acid amplification method Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4238—Pulsed light
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Abstract
The present invention discloses a kind of device and method for enhancing Terahertz Electro-optic sampling detectivity.Apparatus of the present invention include：Linear polarizer, for exploring laser light to be converted to linear polarization；Electro-optic crystal, for exploring laser light to be converted to elliptical polarization by linear polarization；Brewster window, for removing s polarized components extra in exploring laser light；Quarter-wave plate, for exploring laser light to be converted to approximate circular polarization state；Wollaston prism, for separating the s polarized components and p-polarization component in exploring laser light；Photodetector is balanced, for measuring the strength difference of s polarized components and p-polarization component in exploring laser light.The method that the present invention also specifically provides enhancing Terahertz Electro-optic sampling detectivity.The present invention utilizes the polarization state dependent attenuation characteristic of Brewster window, removes the garbage component included in exploring laser light signal, enhances the detectivity of Electro-optic sampling on the basis of it need not improve exploring laser light energy.
Description
Technical field
The present invention relates to THz wave field of detecting.It is visited more particularly, to a kind of enhancing Terahertz Electro-optic sampling
Survey the device and method of sensitivity.
Background technology
THz wave refers to electromagnetic wave of the frequency in the range of 0.1THz~10THz, in electromagnetic spectrum millimeter wave and
Between infrared ray.
Terahertz Electro-optic sampling is a kind of typical THz wave Detection Techniques.It is caused using THz wave electric field
Electrooptical material birefringence effect detect THz wave.Its principle is to make exploring laser light pulse signal and tested THz wave same
When through electro-optic crystal, THz wave electric field causes electro-optic crystal birefringence effect so as to change the inclined of exploring laser light pulse signal
Polarization state, the variation of polarization state is directly proportional to the size of THz wave electric field, by changing exploring laser light pulse signal with being tested
The relative time relationship of THz wave, and measure exploring laser light pulse two using balance photodetector and be mutually perpendicular to polarization point
The difference of amount obtains the time domain waveform result of THz wave.
Due to the tested usual intensity very little of terahertz wave signal, need to enhance electro-optic sampling skill when detecting it
The detectivity of art, traditional method are the increasings for the energy realization Electro-optic sampling detectivity for improving exploring laser light
By force, but for exploring laser light polarization state variation balance photodetector there are input energy threshold value, more than input energy threshold
The exploring laser light energy of value can cause balance photodetector saturation, cause Electro-optic sampling detectivity that cannot expire completely
Sufficient application demand improves exploring laser light energy and is also required to additional amplification compensation device, can greatly increase system complex in addition
Degree and cost, are unfavorable for implementing.
Accordingly, it is desirable to provide a kind of device and method for enhancing Terahertz Electro-optic sampling detectivity, more just
Just the detectivity of Terahertz Electro-optic sampling, is effectively enhanced.
The content of the invention
It is an object of the invention to provide a kind of devices for enhancing Terahertz Electro-optic sampling detectivity.
It is another object of the present invention to provide it is a kind of enhance Terahertz Electro-optic sampling detectivity method,
Using the polarization state dependent attenuation characteristic of Brewster window, the garbage component included in exploring laser light signal is removed,
Need not improve enhances the detectivity of Electro-optic sampling on the basis of exploring laser light energy.
In order to achieve the above objectives, the present invention uses following technical proposals：
Present invention firstly provides it is a kind of enhance Terahertz Electro-optic sampling detectivity device, including：
Linear polarizer, for exploring laser light to be converted to linear polarization；
Electro-optic crystal, for exploring laser light to be converted to elliptical polarization by linear polarization；
Brewster window, for removing s polarized components extra in the exploring laser light of elliptical polarization；
Quarter-wave plate, for the exploring laser light for removing s polarized components to be converted to approximate circular polarization state；
Wollaston prism, for separating the s polarized components and p-polarization component in the exploring laser light of approximate circular polarization state；
Photodetector is balanced, for measuring the strength difference of s polarized components and p-polarization component in exploring laser light.
Further, the Brewster window can be including at least a Brewster window group.
The present invention provides a kind of method for enhancing Terahertz Electro-optic sampling detectivity, comprises the following steps：
1) exploring laser light is converted into linear polarization：
By exploring laser light by linear polarizer, rotational line linear polarizer so that the exploring laser light linear polarization penetrated is vertical
Nogata to, the exploring laser light after linear polarizer can use Jones vector by way of be expressed as：
2) exploring laser light is converted into elliptical polarization by linear polarization：
Make exploring laser light with tested THz wave simultaneously through electro-optic crystal, by the electric light by THz wave electric field action
Exploring laser light after crystal is converted to elliptical polarization by linear polarization, is expressed as by the exploring laser light after electro-optic crystal：
L1=CLin (2)
Wherein, C represents the electro-optic crystal Jones matrix under THz wave electric field action：
Wherein, φ is amount of delay, THz wave effect under can regard electro-optic crystal as phase retarders, amount of delay φ and
THz wave electric field level is directly proportional；
3) s polarized components extra in the exploring laser light of elliptical polarization are removed：Exploring laser light is entered with Brewster's angle
Brewster window was shot through, can be expressed as by the exploring laser light after Brewster window using Jones matrix：
L2=BCLin (4)
Wherein, B represents the Jones matrix of Brewster window：
Wherein, t represents light intensity transmitance of the Brewster window to s polarized components in exploring laser light,It declines as electric field
Decrement, Brewster window are 100% to the p-polarization component transmitance in exploring laser light；
4) exploring laser light for removing s polarized components is converted into approximate circular polarization state：Exploring laser light is made to penetrate a quarter
Wave plate, adjustment quarter-wave plate fast axis direction make it at 45 ° with s polarization directions, are swashed by the detection after quarter-wave plate
The Jones matrix of light is expressed as：
L=QBCLin (7)
Wherein, Q is the Jones matrix of quarter-wave plate：
5) the s polarized components in the exploring laser light of approximate circular polarization state and p-polarization component are separated and measures its strength difference：
The s polarized components light in exploring laser light and p-polarization light components are separated using wollaston prism, can be calculated by formula (7)
The expression matrix form for obtaining final exploring laser light is：
Using balance photodetector measurement s polarized components light and the strength difference of p-polarization light components, final measurement obtains
S polarized components and p-polarization component intensity difference normalization result S be：
In actual test, terahertz wave signal intensity is very low, and φ values are minimum and φ<<T, therefore can be by simplified formula
For：
Beneficial effects of the present invention are as follows：
The exploring laser light two that a kind of method for enhancing Terahertz Electro-optic sampling detectivity of the present invention obtains is partially
The intensity difference normalization result S of component of shaking is proportional to the detectivity of Electro-optic sampling, is understood by step (3) in formula
T represents Brewster window to s polarized components transmitance in exploring laser light, and the value of t is necessarily smaller than 1, therefore uses present invention side
Method can improve detectivityTimes, in addition if forming group of windows using n pieces Brewster window, can will detect
Sensitivity improvesTimes.
Description of the drawings
The specific embodiment of the present invention is described in further detail below in conjunction with the accompanying drawings.
Fig. 1 shows to enhance the scheme schematic diagram of Terahertz Electro-optic sampling sensitivity in embodiment；
Fig. 2 is shown in embodiment using the scheme and exploring laser light polarization state of tested THz wave Electric Field Modulated exploring laser light
Variation diagram；
Fig. 3 show in embodiment removal through the scheme of s polarized components extra in the exploring laser light after electro-optic crystal and
Exploring laser light polarization state variation diagram；
The exploring laser light that Fig. 4 shows to will transmit through after Brewster window is converted to the scheme of approximate circular polarization state and detection swashs
Polarization state variation diagram；
Fig. 5 shows to separate the s polarized components in exploring laser light in embodiment and p-polarization component and measures its strength difference
Scheme and exploring laser light polarization state variation diagram；
Fig. 6 shows the Comparative result obtained according to the THz wave measurement result that embodiment method obtains with conventional method
Figure.
In figure：1 linear polarizer, 2 electro-optic crystals, 3 Brewster window groups, 4 quarter-wave plates, 5 wollaston prisms,
6 balance photodetectors.
Specific embodiment
In order to illustrate more clearly of the present invention, the present invention is done further with reference to preferred embodiments and drawings
It is bright.Similar component is indicated with identical reference numeral in attached drawing.It will be appreciated by those skilled in the art that institute is specific below
The content of description is illustrative and be not restrictive, and should not be limited the scope of the invention with this.
A kind of device for enhancing Terahertz Electro-optic sampling detectivity, including：
Linear polarizer 1, for exploring laser light to be converted to linear polarization；
Electro-optic crystal 2, for exploring laser light to be converted to elliptical polarization by linear polarization；
Brewster window 3, for removing s polarized components extra in the exploring laser light of elliptical polarization；
Quarter-wave plate 4, for the exploring laser light for removing s polarized components to be converted to approximate circular polarization state；
Wollaston prism 5, for separating the s polarized components and p-polarization component in the exploring laser light of approximate circular polarization state；
Photodetector 6 is balanced, for measuring the strength difference of s polarized components and p-polarization component in exploring laser light.
Heretofore described Brewster window can be including at least a Brewster window group.
Terahertz wave signal is generated in a manner that femtosecond laser encourages terahertz light lead antenna, is enhanced using above device
The method of Terahertz Electro-optic sampling detectivity, comprises the following steps：
1) exploring laser light is converted into linear polarization：Exploring laser light selects centre wavelength 800nm, and pulse width is less than
The femtosecond laser of 150fs.By exploring laser light by linear polarizer 1, rotational line linear polarizer 1 is so that the exploring laser light line penetrated is inclined
Direction shake for vertical direction, is expressed as in a manner that the exploring laser light after linear polarizer 1 can use Jones vector：
2) exploring laser light is converted into elliptical polarization by linear polarization：Make exploring laser light and tested THz wave saturating simultaneously
Electro-optic crystal 2 is crossed, electro-optic crystal 2 can select the tangential GaP crystal for [110], can be regarded it as under THz wave effect
Phase retarders, amount of delay φ is directly proportional to THz wave electric field level, and Jones is used by the exploring laser light after electro-optic crystal 2
Matrix is expressed as：
L1=CLin (2)
Wherein, C represents 2 Jones matrix of electro-optic crystal under THz wave electric field action：
Change through the exploring laser light polarization state before and after electro-optic crystal 2 as shown in Fig. 2, by by THz wave electric field action
Electro-optic crystal 2 after exploring laser light elliptical polarization is become from linear polarization.
3) s polarized components extra in the exploring laser light of elliptical polarization are removed：Exploring laser light is entered with Brewster's angle
Brewster window 3 was shot through, Brewster window 3 is ideally to the p-polarization component transmitance in exploring laser light
100%, it is t to s polarized components light intensity transmitance in exploring laser light, since Jones matrix is using the polarization of electric field form expression light
Component, during using a Brewster window,It, can by the exploring laser light after Brewster window 3 as field decay amount
Jones matrix to be used to be expressed as：
L2=BCLin (4)
Wherein, B represents the Jones matrix of Brewster window 3：
The group of windows that four Brewster windows 3 form is used in the present embodiment as s polarized components in exploring laser light
Attenuator, therefore the complete attenuation effect of group of windows should be expressed as：
Changed by the exploring laser light polarization state of Brewster window group as shown in figure 3, often passing through a Brewster window
Mouthful, the extra s polarized components in exploring laser light are smaller, ellipticity (s polarized light components and the p-polarization light of exploring laser light polarization state
The ratio of component) it is smaller, the Electro-optic sampling detectivity that can finally obtain is higher.
4) exploring laser light for removing s polarized components is converted into approximate circular polarization state：Exploring laser light is made to penetrate a quarter
Wave plate 4, adjustment 4 fast axis direction of quarter-wave plate make it at 45 ° with s polarization directions, pass through the detection after quarter-wave plate 4
Laser can be expressed as using Jones matrix：
L=QBCLin (7)
Wherein Q is the Jones matrix of quarter-wave plate 4：
It is as shown in Figure 4 by the exploring laser light polarization state variation of quarter-wave plate 4
5) the s polarized components in the exploring laser light of approximate circular polarization state and p-polarization component are separated and measures its strength difference：
The s polarized components light in exploring laser light and p-polarization light components are separated using wollaston prism 5, pass through wollaston prism 5
Front and rear exploring laser light is as shown in figure 5, measure the strength difference of two light components using balance photodetector, by formula (7)
The expression matrix form that final exploring laser light can be calculated is：
Then the strength difference of two light components is measured using balance photodetector 6, finally measures obtained s polarizations point
Amount normalizes result S with p-polarization component intensity difference：
In actual test, terahertz wave signal intensity is very low, therefore φ values are minimum and φ<<T, therefore can be by formula
It is reduced to：
Above-mentioned polarized component intensity difference S is directly proportional to Electro-optic sampling detectivity, according to what is provided in embodiment
Method can improve sensitivityTimes, if selecting the Brewster window made by refractive index ZnSe materials, to detection
Sensitivity can be improved about 20 times by s polarized components light intensity transmitance t ≈ 0.22 in laser according to method provided by the invention,
It is as shown in Figure 6 to promote effect.
Obviously, the above embodiment of the present invention is only intended to clearly illustrate example of the present invention, and is not pair
The restriction of embodiments of the present invention for those of ordinary skill in the art, may be used also on the basis of the above description
To make other variations or changes in different ways, all embodiments can not be exhaustive here, it is every to belong to this hair
The obvious changes or variations that bright technical solution is extended out is still in the row of protection scope of the present invention.
Claims (7)
1. a kind of device for enhancing Terahertz Electro-optic sampling detectivity, which is characterized in that including：
Linear polarizer, for exploring laser light to be converted to linear polarization；
Electro-optic crystal, for exploring laser light to be converted to elliptical polarization by linear polarization；
Brewster window, for removing s polarized components extra in the exploring laser light of elliptical polarization；
Quarter-wave plate, for the exploring laser light for removing s polarized components to be converted to approximate circular polarization state；
Wollaston prism, for separating the s polarized components and p-polarization component in the exploring laser light of approximate circular polarization state；
Photodetector is balanced, for measuring the strength difference of s polarized components and p-polarization component in exploring laser light.
A kind of 2. method for enhancing Terahertz Electro-optic sampling detectivity, which is characterized in that comprise the following steps：
1) exploring laser light is converted into linear polarization；
2) exploring laser light is converted into elliptical polarization by linear polarization；
3) s polarized components extra in the exploring laser light of elliptical polarization are removed
4) exploring laser light for removing s polarized components is converted into approximate circular polarization state；
5) the s polarized components in the exploring laser light of approximate circular polarization state and p-polarization component are separated and measures its strength difference.
3. according to the method described in claim 2, it is characterized in that：
The step 1) is specially by linear polarizer by exploring laser light, and rotational line linear polarizer causes the exploring laser light line penetrated
Polarization direction is vertical direction, is expressed as in a manner that the exploring laser light after linear polarizer is using Jones vector：
4. according to the method described in claim 2, it is characterized in that：
The step 2) is specially to make exploring laser light with tested THz wave simultaneously through electro-optic crystal, by by THz wave electricity
Exploring laser light after the electro-optic crystal of field action is converted to elliptical polarization by linear polarization, is swashed by the detection after electro-optic crystal
Light representations are：L1=CLin, wherein, C represents the electro-optic crystal Jones matrix under THz wave electric field action：Wherein, φ is amount of delay.
5. according to the method described in claim 2, it is characterized in that：
The step 3) is specially to pass through Brewster window through Brewster window with brewster angle incidence by exploring laser light
Exploring laser light after mouthful is expressed as using Jones matrix：L2=BCLin, wherein, B represents Jones's square of Brewster window
Battle array：Wherein, t represents light intensity transmitance of the Brewster window to s polarized components in exploring laser light,Make
For field decay amount.
6. according to the method described in claim 2, it is characterized in that：
The step 4) is specially to make exploring laser light through quarter-wave plate, adjustment quarter-wave plate fast axis direction make its with
S polarization directions are at 45 °, are expressed as by the Jones matrix of the exploring laser light after quarter-wave plate：L=QBCLin,
In, Q is the Jones matrix of quarter-wave plate：
7. according to the method described in claim 2, it is characterized in that：
The step 5) is specially to be divided the s polarized components light in exploring laser light and p-polarization light components using wollaston prism
From the expression matrix form that final exploring laser light is calculated is：It uses
Photodetector measurement s polarized components light and the strength difference of p-polarization light components are balanced, finally measures obtained s polarized components
It is with p-polarization component intensity difference normalization result S：
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