CN108072337B - 一种考虑缺陷尺寸情况下的物体缺陷深度的测量方法 - Google Patents
一种考虑缺陷尺寸情况下的物体缺陷深度的测量方法 Download PDFInfo
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- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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CN108871224B (zh) * | 2018-06-06 | 2020-04-21 | 杭州电子科技大学 | 一种用于led玻璃灯杯的凹槽深度检测方法 |
CN109187597B (zh) * | 2018-09-28 | 2021-05-18 | 山东非金属材料研究所 | 一种x射线数字成像缺陷尺寸测量方法 |
CN110320236B (zh) * | 2019-07-19 | 2021-09-14 | 沈阳工业大学 | 大型风力机叶片内部缺陷深度的红外测量方法 |
CN110880170B (zh) * | 2019-10-22 | 2023-10-31 | 四川沐迪圣科技有限公司 | 一种复合材料缺陷的深度预测方法 |
CN111380618A (zh) * | 2020-03-23 | 2020-07-07 | 西南科技大学 | 一种光阵列分控便携式光激励红外热成像检测装置 |
CN113030182B (zh) * | 2021-01-20 | 2023-10-27 | 南方医科大学顺德医院(佛山市顺德区第一人民医院) | 基于温度-位置曲线分析的热异常尺寸测量方法及装置 |
CN114487015B (zh) * | 2022-02-14 | 2023-07-14 | 首都师范大学 | 方波热成像测量低热导率材料内部缺陷深度的方法 |
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CN102221339A (zh) * | 2011-06-09 | 2011-10-19 | 首都师范大学 | 脉冲红外热波技术测厚方法 |
CN102967267A (zh) * | 2012-06-06 | 2013-03-13 | 首都师范大学 | 基于红外热波技术的双层结构第二层介质厚度测量方法 |
CN103148799A (zh) * | 2013-01-30 | 2013-06-12 | 首都师范大学 | 基于对数一阶微分峰值法的缺陷深度测量方法 |
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US20160138385A1 (en) * | 2014-11-18 | 2016-05-19 | Baker Hughes Incorporated | Subsurface Pipe Dimension and Position Indicating Device |
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CN102221339A (zh) * | 2011-06-09 | 2011-10-19 | 首都师范大学 | 脉冲红外热波技术测厚方法 |
CN102967267A (zh) * | 2012-06-06 | 2013-03-13 | 首都师范大学 | 基于红外热波技术的双层结构第二层介质厚度测量方法 |
CN103148799A (zh) * | 2013-01-30 | 2013-06-12 | 首都师范大学 | 基于对数一阶微分峰值法的缺陷深度测量方法 |
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《采用缺陷宽深比系数定量研究缺陷尺寸对缺陷深度测量的影响》;曾智 等;《中国激光》;20111231;第38卷;第1-5页 * |
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