CN108020325A - A kind of time-of-flight measurement system based on microchannel plate gating technique - Google Patents
A kind of time-of-flight measurement system based on microchannel plate gating technique Download PDFInfo
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Abstract
The present invention relates to a kind of time-of-flight measurement system based on microchannel plate gating technique.The system includes photocathode, anodic grid mesh, magnetic lenses, microchannel plate, microstrip transmission line, fluorescent screen, CCD photographing modules, delay circuit etc., delay circuit adjusts the time delay of the second electric signal, photoelectron and the second gate pulse is synchronously arrived at microstrip transmission line；When CCD photographing modules collect dynamic image, photoelectron and the second gate pulse synchronously arrive at microstrip transmission line.Photoelectron is by microchannel plate gating and gain, and the photoelectron bombardment fluorescent screen after multiplication produces visible ray Dynamic Graph, then the difference of the first electrical pulse time and the second electrical pulse time is the photoelectronic flight time.By applying the present invention, measuring electron time-of-flight by microchannel plate gating technique, temporal resolution is improved.
Description
Technical field
The present invention relates to flight time measurement field in electron-optical system, more specifically to one kind based on micro- logical
The time-of-flight measurement system of guidance tape gating technique.
Background technology
In electron-optical system, the flight time, (time of flight, TOF) was a highly important physical quantity,
Electronics or the speed and energy of other particles can be obtained by TOF, thus using TOF can distinguish or select that there is difference
The particle of parameter (energy, momentum or quality etc.), such as time of-flight mass spectrometer, electron spectrometer.Nineteen forty-six, WEStephens
It is proposed to utilize the flight time first, principle makes mass spectrograph.1948, Cameron A E et al. succeeded in developing First flight
Time mass spectrum instrument model machine, hereafter time of-flight mass spectrometer is as the hot spot studied.With going deep into for research, mass spectrograph performance is continuous
Improve, it is widely used in the neck such as material science, biomedicine, geoscience, environmental science, analytical chemistry, microelectronics
Domain.In addition, in the study of high energy physics such as laser plasma interactions, synchrotron radiation field, flight time or electronic energy
Spectrum is also an important research object.And the temporal resolution of existing time-of-flight system is not high.
The content of the invention
The technical problem to be solved in the present invention is, for the time point of the above-mentioned existing time-of-flight system of the prior art
A kind of the defects of resolution is not high, there is provided time-of-flight measurement system based on microchannel plate gating technique.
The technical solution adopted by the present invention to solve the technical problems is：Construct a kind of based on microchannel plate gating technique
Time-of-flight measurement system, including laser, half-reflecting half mirror M2, the first photodetector PIN1, oscillograph, the second photoelectricity are visited
Device PIN2, impulse generator, microchannel plate strobe unit are surveyed, wherein,
First optical signal of laser transmitting passes through the transmission and reflection of the half-reflecting half mirror M2 to first light
The input terminal of electric explorer PIN1；The output terminal of the first photodetector PIN1 connects the input terminal of the oscillograph, institute
State the first photodetector PIN1 the first electric signals of output to the oscillograph, the oscillograph and detect first electric signal
First electrical pulse time；
Second optical signal of the laser transmitting inputs the input terminal of the second photodetector PIN2；Described second
The output terminal of photodetector PIN2 connects the input terminal of the impulse generator, the second photodetector PIN2 outputs the
Two electric signals are to the impulse sender；The output terminal of the impulse sender connects the oscillograph, and launches the first gating
Pulse is to the oscillograph, the second electrical pulse time of the first gate pulse described in the oscilloscope measurement；
The microchannel plate strobe unit include photocathode, anodic grid mesh, magnetic lenses, microchannel plate, microstrip transmission line,
Fluorescent screen, wherein, the microstrip transmission line is arranged on the microchannel plate, the photocathode, anodic grid mesh, magnetic lenses,
Microchannel plate and fluorescent screen sequentially arrange successively, the anodic grid mesh and microchannel plate interval pre-set flight distance；
First optical signal, to the photocathode, and produces photoelectricity by the transmission of the half-reflecting half mirror M2
Son, photoelectron microchannel plate described in directive after the photocathode and anodic grid mesh accelerate；The impulse generator
The microchannel plate is connected, and launches the second gate pulse to the microchannel plate；By adjusting, make the photoelectron and second
Gate pulse synchronously arrives at the microstrip transmission line, and the photoelectron is by microchannel plate gating and gain, the institute after multiplication
State photoelectron and bombard the fluorescent screen and produce visible ray Dynamic Graph, then first electrical pulse time and the second electrical pulse time it
Difference is the photoelectronic flight time.
Preferably, the time-of-flight measurement system of the present invention based on microchannel plate gating technique, second light
The output terminal of electric explorer PIN2 connects the input terminal of the impulse generator by delay circuit, and the delay circuit is used to adjust
The time delay of second electric signal is saved, the photoelectron and the second gate pulse is synchronously arrived at the microstrip transmission line.
Preferably, the time-of-flight measurement system of the present invention based on microchannel plate gating technique, first light
Signal, to lens group, is imaged on the photocathode through the lens group, produced by the transmission of the half-reflecting half mirror M2
The raw photoelectron；
The lens group includes the first lens L1 and the second lens L2.
Preferably, the time-of-flight measurement system of the present invention based on microchannel plate gating technique, first light
Signal passes beam Propagation to the half-reflecting half mirror M2 by optical fiber；
The optical fiber, which passes light beam, includes 30 close-packed arrays, and input terminal is circle, output terminal for rectangle multimode fibre, 30
Multimode fibre described in root is arranged as 3 rows, often row 10；
The length of 30 multimode fibres is sequentially increased.
Preferably, the time-of-flight measurement system of the present invention based on microchannel plate gating technique, first light
Signal reflexes to the half-reflecting half mirror M2 by the first speculum M1；And/or
Second optical signal reflexes to the input terminal of the second photodetector PIN2 by the second speculum M3.
Preferably, the time-of-flight measurement system of the present invention based on microchannel plate gating technique, first light
The distance that signal reaches the first photodetector PIN1 by the reflected light of the half-reflecting half mirror M2 is equal to described first
Optical signal reaches the distance of the photocathode by the transmitted light of the half-reflecting half mirror M2.
Preferably, the time-of-flight measurement system of the present invention based on microchannel plate gating technique, further includes setting
In the fluorescent screen emission side, the CCD photographing modules of the visible images produced for gathering the fluorescent screen, the CCD takes the photograph
When collecting dynamic image as module, the photoelectron and the second gate pulse synchronously arrive at the microstrip transmission line.
Preferably, the time-of-flight measurement system of the present invention based on microchannel plate gating technique, first light
The wavelength of signal is 266nm, width 130fs, intensity 0.1mJ；
The wavelength of second optical signal is 800nm；The pre-set flight distance is 50cm.
Preferably, the time-of-flight measurement system of the present invention based on microchannel plate gating technique, the photoelectricity are cloudy
Pole has 3, and the thickness of every photocathode is 80nm, width 8mm, the adjacent photocathode at intervals of 2.8mm；
The spacing of the photocathode and the anodic grid mesh is 1.8mm；
The microstrip transmission line has 3, and the width of every microstrip transmission line is 8mm, and adjacent two micro-strips pass
The spacing 2.8mm of defeated line；The thickness of the microchannel plate is 0.5mm, outside diameter 56mm, 12 μm of channel diameter, adjacent two interchannel
Away from 14 μm；
The distance 0.5mm of the fluorescent screen and microchannel plate；
The magnetic lenses is in annular shape, including 1200 circle copper coils and soft iron, and the internal diameter of the magnetic lenses is 160mm, outside
Footpath is 256mm, thickness 100mm, and there is the annulus slit that a width is 4mm in inner side, and the magnetic field of generation passes through the annulus slit
It is transmitted to drift region so that the photoelectronic imaging that photocathode produces is on the microchannel plate.
Preferably, the time-of-flight measurement system of the present invention based on microchannel plate gating technique, photoelectron pass through
Speed v is during aperture plate：
Wherein, e is photoelectron charge amount, and U is the voltage of the photocathode, and m is optoelectronic quality；
Photoelectron flight time t between the photocathode and anodic grid mesh1For：
Wherein, L1The distance between the photocathode and anodic grid mesh；
Photoelectron reach the microchannel plate when speed v ' be：
Wherein, U ' is the DC offset voltage of the microchannel plate；
Photoelectron flight time t between the anodic grid mesh and microchannel plate2For：
Wherein, L2 is the anodic grid mesh and microchannel distance between plates, and photoelectron is from the photocathode to described micro- logical
T is during the flight of guidance tape：
T=t1+t2。
Implement a kind of time-of-flight measurement system based on microchannel plate gating technique of the present invention, have below beneficial to effect
Fruit：The system include photocathode, anodic grid mesh, magnetic lenses, microchannel plate, microstrip transmission line, fluorescent screen, CCD photographing modules,
Delay circuit etc., delay circuit adjust the time delay of the second electric signal, photoelectron and the second gate pulse is synchronously arrived at micro-strip biography
Defeated line；When CCD photographing modules collect dynamic image, photoelectron and the second gate pulse synchronously arrive at microstrip transmission line.Photoelectricity
Son is by microchannel plate gating and gain, and the photoelectron bombardment fluorescent screen after multiplication produces visible ray Dynamic Graph, then the first electric pulse
The difference of time and the second electrical pulse time is the photoelectronic flight time.By applying the present invention, gated by microchannel plate
Technology measures electron time-of-flight, improves temporal resolution.
Brief description of the drawings
Below in conjunction with accompanying drawings and embodiments, the invention will be further described, in attached drawing：
Fig. 1 is a kind of structure diagram of the time-of-flight measurement system based on microchannel plate gating technique of the present invention；
Fig. 2 is the structure diagram of microchannel plate strobe unit of the present invention；
Fig. 3 is the structure diagram that optical fiber of the present invention passes light beam；
Fig. 4 is electron time-of-flight measurement result figure of the present invention；
Fig. 5 is electron time-of-flight and energy relationship figure in the present invention；
Fig. 6 is optical fiber still image of the present invention；
Fig. 7 is optical fiber dynamic image of the present invention；
Fig. 8 is temporal resolution measurement result figure of the present invention.
Embodiment
In order to which the technical features, objects and effects of the present invention are more clearly understood, now compare attached drawing and describe in detail
The embodiment of the present invention.
The present invention using microchannel plate (microchannle plate, MCP) gating technique to flight time of electronics into
Row measurement, the technology are mainly used in X-ray framing camera at present.1986, M.J.Eckart was proposed microstrip line direct plating
In the input face of MCP, MCP output face plated electrodes so that two end faces of MCP form microstrip transmission line structure.In MCP input faces
Microstrip line on load time narrower in width gate pulse, when detected signal is without synchronous upper gate pulse, the letter
It number will be absorbed by MCP, be exported without image.Conversely, the photoelectron that signal produces will be gated by MCP, gain, then pass through fluorescence
Electronic image after multiplication is converted into visible images by screen.Since the time width of gate pulse is very narrow, generally hundreds of ps,
Thus, MCP gating techniques can obtain very high system timing resolution.
Fig. 1 is a kind of structure diagram of the time-of-flight measurement system based on microchannel plate gating technique of the present invention.
Specifically, being somebody's turn to do the time-of-flight measurement system based on microchannel plate gating technique includes laser, half-reflecting half mirror
M2, the first photodetector PIN1, oscillograph, the second photodetector PIN2, impulse generator, microchannel plate strobe unit,
Wherein,
First optical signal of laser transmitting passes through the transmission and reflection of half-reflecting half mirror M2 to the first photodetector PIN1
Input terminal；The input terminal of the output terminal connection oscillograph of first photodetector PIN1, the first photodetector PIN1 outputs
First electric signal to oscillograph, oscillograph detects the first electrical pulse time of the first electric signal.
Second optical signal of laser transmitting inputs the input terminal of the second photodetector PIN2；Second photodetector
The input terminal of the output terminal connection impulse generator of PIN2, the second photodetector PIN2 export the second electric signal to impulse ejection
Device.The output terminal connection oscillograph of impulse sender, and launch the first gate pulse to oscillograph, oscilloscope measurement first and gate
Second electrical pulse time of pulse.
With reference to figure 2, Fig. 2 is the structure diagram of microchannel plate strobe unit of the present invention.
Specifically, microchannel plate strobe unit includes photocathode, anodic grid mesh, magnetic lenses, microchannel plate, micro-strip transmission
Line, fluorescent screen, wherein, microstrip transmission line is arranged on microchannel plate, photocathode, anodic grid mesh, magnetic lenses, microchannel plate,
And fluorescent screen sequentially arranges successively, and on an axis so that microchannel plate can be struck after photoelectron is accelerated.Anode
Aperture plate and microchannel plate interval pre-set flight distance, i.e. electronics drift region.Preferably, the first optical signal passes through half-reflecting half mirror M2
Reflected light reach the first photodetector PIN1 distance arrived equal to the first optical signal by the transmitted light of half-reflecting half mirror M2
Up to the distance of photocathode, then the first photodetector PIN1 produces time of electric pulse and photoelectronic generation time almost one
Cause.
First optical signal, to photocathode, and produces photoelectron by the transmission of half-reflecting half mirror M2, photoelectron warp
Directive microchannel plate after photocathode and anodic grid mesh accelerate is crossed, loads negative dc high voltage on photocathode, anodic grid mesh ground connection,
Photocathode forms electric field with anodic grid mesh, accelerates for photoelectron, photoelectron is obtained energy.Impulse generator connects microchannel
Plate, and launch the second gate pulse to microchannel plate.Photoelectron is imaged on microchannel plate by electronics drift region through magnetic lenses
On microstrip transmission line.Second gate pulse is transmitted along microstrip transmission line, when photoelectron and the second gate pulse do not synchronously arrive at
During microchannel plate, which can be absorbed by microchannel plate, the output of microchannel plate no signal.By adjusting, make photoelectron and the
Two gate pulses synchronously arrive at microstrip transmission line, and for photoelectron by microchannel plate gating and gain, the photoelectron bombardment after multiplication is glimmering
Optical screen produces visible ray Dynamic Graph.At this time, the first electrical pulse time and the difference of the second electrical pulse time gathered by oscillograph
The as photoelectron flight time.
Further, impulse generator is made of ramp pulse circuit and pulse former two parts, by more snowslides three
Pole pipe is connected into Marx impulse generators and snowslide pipe string combining form, and triode is installed on the signal with 50 Ω transmission line structures
In transmission path, circuit is in high voltage low current state after power supply.When there is trigger signal, trigger signal is amplified through transformer
Wherein certain triode is triggered, the then triode snowslide turns on, and circuit is immediately transferred to high current low-voltage state, electric current stream
Cross whole circuit and increase, when electric current increases to a certain extent, triode is secondary breakdown, and producing, there is picosecond magnitude to rise
The ultrafast high pressure ramp pulse on edge.The ramp pulse is transmitted to avalanche diode through a current-limiting inductance, as driving pulse and makes
Diode reverse is pressurizeed, and when inputting the ramp pulse certain amplitude of arrival, diode is exceedingly fast by avalanche breakdown, therewith generation one
Voltage trailing edge, by output capacitance coupled differential, then the high-pass filter again through inductance and capacitance composition is to differential shaping
Pulse filter again, so as to export the gate pulse of narrower in width.
Alternatively, the output terminal of the second photodetector PIN2 connects the input of impulse generator by delay circuit
End, delay circuit are used for the time delay for adjusting the second electric signal, photoelectron and the second gate pulse is synchronously arrived at microstrip transmission line.
Alternatively, the first optical signal is imaged on by the transmission of half-reflecting half mirror M2 to lens group through lens group
Photocathode, produces photoelectron.Preferably, lens group includes the first lens L1 and the second lens L2.
Fig. 3 is the structure diagram that optical fiber of the present invention passes light beam.
In some embodiments, the first optical signal passes beam Propagation to half-reflecting half mirror M2 by optical fiber；Optical fiber passes light beam bag
30 close-packed arrays are included, input terminal is circle, and output terminal is the multimode fibre of rectangle, and 30 root multimode fibers are arranged as 3 rows, often go
10；The length of 30 root multimode fibers is sequentially increased.Preferably, as shown in figure 3, numbering be 1 fiber lengths it is most short, compile backward
Number often increase by 1, fiber lengths increase 2mm so that the transmission time increase 10ps of ultraviolet light in a fiber, so that when obtaining output
Between press 10ps uniform increments 30 luminous points.First optical signal forms adjacent time inter as 10ps's after passing light beam by optical fiber
30 luminous points.It can be arranged as required to it is appreciated that optical fiber passes the quantity of multimode fibre and fiber lengths value added in light beam, this
The embodiment of invention is not used to limit.
Further, 30 luminous points are divided into two-way after half-reflecting half mirror M2, wherein being sent into the first photodetector all the way
PIN1 produces electric impulse signal, which is sent into oscillograph；Preferably, oscillograph is high-speed oscilloscope.Another way is through
One lens L1, the second lens L2 are imaged to photocathode and produce photoelectron, and photoelectron is by electric field between photocathode and anodic grid mesh
Backward microchannel plate is accelerated to move.Distances of the half-reflecting half mirror M2 to the first photodetector PIN1 and the distance to photocathode
Identical, then it is almost consistent to produce the photoelectronic time for the time of the first photodetector PIN1 generations electric pulse and photocathode.
Laser selects femto-second laser, and the optical signal that another wavelength of femto-second laser output is 800nm is sent into second after delay
Photodetector PIN2 produces trigger signal, and trigger generator produces gate pulse, including the first gate pulse and second
Gate pulse.Adjust delay circuit delay so that photoelectron and the second gate pulse synchronously arrive at the micro-strip transmission of microchannel plate
Line, photoelectron will be gated by microchannel plate and gain, the electron bombardment fluorescent screen after multiplication produce Visible Dynamic Image, use
The observation of CCD photographing modules gathers the dynamic image.Therefore, when CCD photographing modules observe dynamic image, photoelectron and second
Gate pulse reaches the time synchronization of the microstrip transmission line of microchannel plate.Again because the first gate pulse and the second gate pulse when
Between it is the same, the first gate pulse is input to high-speed oscilloscope.The first photodetector PIN1 generations are measured on oscillograph
The time of electrical pulse time (i.e. photocathode produces the photoelectronic time) and the first gate pulse, (i.e. the second gate pulse reached
The time of the microstrip transmission line of microchannel plate, that is, photoelectron reach the time of the microstrip transmission line of microchannel plate), both
Time difference be flight time of the photoelectron from photocathode to microchannel plate.
Alternatively, in actually systematic procedure is built, if the first optical signal cannot be directly transferred to half-reflecting half mirror
M2, then set the first speculum M1, and the first optical signal reflexes to half-reflecting half mirror M2 by the first speculum M1.
Alternatively, in actually systematic procedure is built, if the second optical signal cannot be directly transferred to the spy of the second photoelectricity
Device PIN2 is surveyed, then the second speculum M3 is set, and the second optical signal reflexes to the second photodetector by the second speculum M3
The input terminal of PIN2.
Preferably, the time-of-flight measurement system of the invention based on microchannel plate gating technique, which further includes, is arranged on fluorescence
The CCD photographing modules of screen emission side, the visible images produced for gathering fluorescent screen, CCD photographing modules collect Dynamic Graph
During picture, photoelectron and the second gate pulse synchronously arrive at microstrip transmission line.
Preferably, the wavelength of the first optical signal is 266nm, width 130fs, intensity 0.1mJ；The ripple of second optical signal
A length of 800nm；Pre-set flight distance is 50cm.
Preferably, photocathode has 3, and material is metal, it is preferable that material is gold.The thickness of every photocathode
For 80nm, width 8mm, adjacent photo cathode at intervals of 2.8mm；The spacing of photocathode and anodic grid mesh is 1.8mm；It is micro-
Band transmission line has 3, and the width of every microstrip transmission line is 8mm, the spacing 2.8mm of adjacent two microstrip transmission lines；Microchannel
The thickness of plate is 0.5mm, and outside diameter 56mm, 12 μm of channel diameter, adjacent two interchannel is away from 14 μm.
Preferably, the distance 0.5mm of fluorescent screen and microchannel plate.
Preferably, magnetic lenses is in annular shape, including 1200 circle copper coils and soft iron, and the internal diameter of magnetic lenses is 160mm, outside diameter
For 256mm, thickness 100mm, there is the annulus slit that a width is 4mm in inner side, and the magnetic field of generation is transmitted to by annulus slit
Drift region so that the photoelectronic imaging that photocathode produces is on microchannel plate.
Preferably, when the voltage of photocathode is -3.5kV, the loading amplitude of microchannel plate is -1.6kV, halfwidth
(full width at half maxima, FWHM) is the second gate pulses of 200ps and -400V DC offset voltages.Fluorescent screen
When voltage is 3.4kV, CCD photographing modules observe dynamic image, i.e. photoelectron and the second gate pulse synchronously arrives at microchannel
Plate, the impulse waveform obtained at this time on oscillograph is as shown in figure 4, Fig. 4 is electron time-of-flight measurement result figure of the present invention.By scheming
4 can obtain, and the electric signal of the first photodetector PIN1 and the time difference of the first gate pulse are 15ns, i.e., energy is 3.5keV's
Flight time of the electronics from photocathode to microchannel plate is about 15ns.
Specifically, since only at the time of photoelectron reaches microchannel plate, the second gate pulse is just transmitted to microchannel
Plate, therefore influence of the gate pulse to electron time-of-flight can be ignored.When -400V direct current biasings the electricity added by consideration microchannel plate
When pressing the influence to electron time-of-flight, electron time-of-flight can be as follows with simple computation：
Speed v is when photoelectron passes through aperture plate：
Wherein, e is photoelectron charge amount, and U is the voltage of photocathode, and m is optoelectronic quality；
Photoelectron flight time t between photocathode and anodic grid mesh1For：
Wherein, L1 distances between photocathode and anodic grid mesh；
Photoelectron reach microchannel plate when speed v ' be：
Wherein, U ' is the DC offset voltage of microchannel plate；
Photoelectron flight time t between anodic grid mesh and microchannel plate2For：
Wherein, L2For anodic grid mesh and microchannel distance between plates, t during flight of the photoelectron from photocathode to microchannel plate
For：
T=t1+t2。
Change the voltage of photocathode, the relation between energy when the electron time-of-flight and electronics of acquisition reach aperture plate
As shown in figure 5, Fig. 5 is electron time-of-flight and energy relationship figure in the present invention.It can be obtained by Fig. 5, electron energy is bigger, and electronics flies
The row time is smaller, and notional result is consistent with Comparison of experiment results.
When photocathode voltage is -3.5kV, and microchannel plate only loads the DC voltage of -600V, the still image of optical fiber
As shown in fig. 6, Fig. 6 is optical fiber still image of the present invention.When photocathode voltage is -3.5kV, microchannel plate loads gate pulse
During with -400V DC offset voltages, the dynamic image of optical fiber is as shown in fig. 7, Fig. 7 is optical fiber dynamic image of the present invention.Will dynamic
Image is normalized with still image, then by light intensity-spatial distribution of dynamic picture after normalization be converted into light intensity-when
Between be distributed, then to experimental data carry out Gauss curve fitting, you can obtain dynamic picture strength versus time distribution curve, the curve
FWHM is the temporal resolution of system.
With reference to figure 8, Fig. 8 is temporal resolution measurement result figure of the present invention.The FWHM of Gauss curve fitting curve is in Fig. 8
The temporal resolution of 88ps, i.e. system are 88ps.System timing resolution and microchannel plate thickness, microchannel plate gate pulse are close
Cut phase is closed, and temporal resolution can be improved by reducing microchannel plate thickness.In addition, reduce gate pulse FWHM or increase gate pulse
Amplitude can also improve system timing resolution.Thus, optimization above-mentioned parameter can make the temporal resolution of system acquisition higher.
By applying the present invention, measuring electron time-of-flight by microchannel plate gating technique, temporal resolution is improved.
Above example only technical concepts and features to illustrate the invention, its object is to allow person skilled in the art
Scholar can understand present disclosure and implement accordingly, can not limit the scope of the invention.It is all to be wanted with right of the present invention
The equivalent changes and modifications that scope is done are sought, the covering scope of the claims in the present invention should all be belonged to.
Claims (10)
1. a kind of time-of-flight measurement system based on microchannel plate gating technique, it is characterised in that including laser, half anti-half
Lens M2, the first photodetector PIN1, oscillograph, the second photodetector PIN2, impulse generator, microchannel plate gating dress
Put, wherein,
First optical signal of the laser transmitting is visited by transmission and reflection to first photoelectricity of the half-reflecting half mirror M2
Survey the input terminal of device PIN1；The output terminal of the first photodetector PIN1 connects the input terminal of the oscillograph, and described the
One photodetector PIN1 exports the first electric signal to the oscillograph, the oscillograph and detects the first of first electric signal
Electrical pulse time；
Second optical signal of the laser transmitting inputs the input terminal of the second photodetector PIN2；Second photoelectricity
The output terminal of detector PIN2 connects the input terminal of the impulse generator, second electricity of the second photodetector PIN2 outputs
Signal is to the impulse sender；The output terminal of the impulse sender connects the oscillograph, and launches the first gate pulse
To the oscillograph, the second electrical pulse time of the first gate pulse described in the oscilloscope measurement；
The microchannel plate strobe unit includes photocathode, anodic grid mesh, magnetic lenses, microchannel plate, microstrip transmission line, fluorescence
Screen, wherein, the microstrip transmission line is arranged on the microchannel plate, the photocathode, anodic grid mesh, magnetic lenses, micro- logical
Guidance tape and fluorescent screen sequentially arrange successively, the anodic grid mesh and microchannel plate interval pre-set flight distance；
First optical signal, to the photocathode, and produces photoelectron by the transmission of the half-reflecting half mirror M2,
Photoelectron microchannel plate described in directive after the photocathode and anodic grid mesh accelerate；The impulse generator connection
The microchannel plate, and launch the second gate pulse to the microchannel plate；By adjusting, gate the photoelectron and second
Impulsive synchronization reaches the microstrip transmission line, and the photoelectron is by microchannel plate gating and gain, the light after multiplication
Fluorescent screen described in electron bombardment produces visible ray Dynamic Graph, then the difference of first electrical pulse time and the second electrical pulse time is
For the photoelectronic flight time.
2. the time-of-flight measurement system according to claim 1 based on microchannel plate gating technique, it is characterised in that institute
The output terminal for stating the second photodetector PIN2 connects the input terminal of the impulse generator, the delay electricity by delay circuit
Road is used for the time delay for adjusting second electric signal, the photoelectron and the second gate pulse is synchronously arrived at the micro-strip transmission
Line.
3. the time-of-flight measurement system according to claim 1 based on microchannel plate gating technique, it is characterised in that institute
The first optical signal is stated by the transmission of the half-reflecting half mirror M2 to lens group, the photoelectricity is imaged on through the lens group
Cathode, produces the photoelectron；
The lens group includes the first lens L1 and the second lens L2.
4. the time-of-flight measurement system according to claim 1 based on microchannel plate gating technique, it is characterised in that institute
State the first optical signal and beam Propagation is passed to the half-reflecting half mirror M2 by optical fiber；
The optical fiber, which passes light beam, includes 30 close-packed arrays, and input terminal is circle, and output terminal is the multimode fibre of rectangle, 30 institutes
State multimode fibre and be arranged as 3 rows, often row 10；
The length of 30 multimode fibres is sequentially increased.
5. the time-of-flight measurement system according to claim 1 based on microchannel plate gating technique, it is characterised in that institute
State the first optical signal and the half-reflecting half mirror M2 is reflexed to by the first speculum M1；And/or
Second optical signal reflexes to the input terminal of the second photodetector PIN2 by the second speculum M3.
6. the time-of-flight measurement system according to claim 1 based on microchannel plate gating technique, it is characterised in that institute
The distance for stating reflected light arrival the first photodetector PIN1 that the first optical signal passes through the half-reflecting half mirror M2 is equal to
First optical signal reaches the distance of the photocathode by the transmitted light of the half-reflecting half mirror M2.
7. the time-of-flight measurement system according to claim 1 based on microchannel plate gating technique, it is characterised in that also
The CCD photographing modules of the visible images produced including being arranged on the fluorescent screen emission side, for gathering the fluorescent screen, institute
When stating CCD photographing modules and collecting dynamic image, the photoelectron and the second gate pulse synchronously arrive at the microstrip transmission line.
8. the time-of-flight measurement system according to claim 1 based on microchannel plate gating technique, it is characterised in that institute
The wavelength for stating the first optical signal is 266nm, width 130fs, intensity 0.1mJ；
The wavelength of second optical signal is 800nm；The pre-set flight distance is 50cm.
9. the time-of-flight measurement system according to claim 1 based on microchannel plate gating technique, it is characterised in that institute
Stating photocathode has 3, and the thickness of every photocathode is 80nm, width 8mm, the interval of the adjacent photocathode
For 2.8mm；The spacing of the photocathode and the anodic grid mesh is 1.8mm；
The microstrip transmission line has 3, and the width of every microstrip transmission line is 8mm, adjacent two microstrip transmission lines
Spacing 2.8mm；The thickness of the microchannel plate is 0.5mm, and outside diameter 56mm, 12 μm of channel diameter, adjacent two interchannel is away from 14 μ
m；
The distance 0.5mm of the fluorescent screen and microchannel plate；
The magnetic lenses is in annular shape, including 1200 circle copper coils and soft iron, and the internal diameter of the magnetic lenses is 160mm, and outside diameter is
There are the annulus slit that a width is 4mm in 256mm, thickness 100mm, inner side, and the magnetic field of generation is transmitted by the annulus slit
To drift region so that the photoelectronic imaging that photocathode produces is on the microchannel plate.
10. the time-of-flight measurement system according to claim 1 based on microchannel plate gating technique, it is characterised in that
Speed v is when photoelectron passes through aperture plate：
<mrow>
<mi>v</mi>
<mo>=</mo>
<msqrt>
<mrow>
<mo>-</mo>
<mn>2</mn>
<mi>e</mi>
<mi>U</mi>
<mo>/</mo>
<mi>m</mi>
</mrow>
</msqrt>
<mo>-</mo>
<mo>-</mo>
<mo>-</mo>
<mrow>
<mo>(</mo>
<mn>1</mn>
<mo>)</mo>
</mrow>
</mrow>
Wherein, e is photoelectron charge amount, and U is the voltage of the photocathode, and m is optoelectronic quality；
Photoelectron flight time t between the photocathode and anodic grid mesh1For：
<mrow>
<msub>
<mi>t</mi>
<mn>1</mn>
</msub>
<mo>=</mo>
<mfrac>
<mrow>
<mn>2</mn>
<msub>
<mi>L</mi>
<mn>1</mn>
</msub>
</mrow>
<mi>v</mi>
</mfrac>
<mo>-</mo>
<mo>-</mo>
<mo>-</mo>
<mrow>
<mo>(</mo>
<mn>2</mn>
<mo>)</mo>
</mrow>
</mrow>
Wherein, L1The distance between the photocathode and anodic grid mesh；
Photoelectron reach the microchannel plate when speed v ' be：
<mrow>
<msup>
<mi>v</mi>
<mo>&prime;</mo>
</msup>
<mo>=</mo>
<msqrt>
<mrow>
<msup>
<mi>v</mi>
<mn>2</mn>
</msup>
<mo>+</mo>
<mn>2</mn>
<msup>
<mi>eU</mi>
<mo>&prime;</mo>
</msup>
<mo>/</mo>
<mi>m</mi>
</mrow>
</msqrt>
<mo>-</mo>
<mo>-</mo>
<mo>-</mo>
<mrow>
<mo>(</mo>
<mn>3</mn>
<mo>)</mo>
</mrow>
</mrow>
Wherein, U ' is the DC offset voltage of the microchannel plate；
Photoelectron flight time t between the anodic grid mesh and microchannel plate2For：
<mrow>
<msub>
<mi>t</mi>
<mn>2</mn>
</msub>
<mo>=</mo>
<mfrac>
<mrow>
<mn>2</mn>
<msub>
<mi>L</mi>
<mn>2</mn>
</msub>
</mrow>
<mrow>
<mi>v</mi>
<mo>+</mo>
<msup>
<mi>v</mi>
<mo>&prime;</mo>
</msup>
</mrow>
</mfrac>
<mo>-</mo>
<mo>-</mo>
<mo>-</mo>
<mrow>
<mo>(</mo>
<mn>4</mn>
<mo>)</mo>
</mrow>
</mrow>
Wherein, L2For the anodic grid mesh and microchannel distance between plates, photoelectron is from the photocathode to the microchannel plate
T is during flight：
T=t1+t2。
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112345809A (en) * | 2020-10-15 | 2021-02-09 | 深圳大学 | Electron beam time amplification oscilloscope and measurement system thereof |
| CN113192814A (en) * | 2021-03-25 | 2021-07-30 | 中国工程物理研究院激光聚变研究中心 | Hybrid magnetic focusing lens electron beam imaging system |
| WO2022198555A1 (en) * | 2021-03-25 | 2022-09-29 | 中国工程物理研究院激光聚变研究中心 | Electron beam imaging system using hybrid magnetic focusing lens |
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| US7006741B1 (en) * | 2005-03-22 | 2006-02-28 | Bi Yu | Contact-field optical microscope |
| CN105372572A (en) * | 2015-11-19 | 2016-03-02 | 北方夜视技术股份有限公司 | Gain measuring device and method of cascaded micro channel plate |
| CN107402401A (en) * | 2017-09-12 | 2017-11-28 | 中国工程物理研究院激光聚变研究中心 | It is a kind of to carry time-gated multichannel hard x-ray imaging detector |
| CN207798271U (en) * | 2017-12-13 | 2018-08-31 | 深圳大学 | A kind of time-of-flight measurement system based on microchannel plate gating technique |
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| US7006741B1 (en) * | 2005-03-22 | 2006-02-28 | Bi Yu | Contact-field optical microscope |
| CN105372572A (en) * | 2015-11-19 | 2016-03-02 | 北方夜视技术股份有限公司 | Gain measuring device and method of cascaded micro channel plate |
| CN107402401A (en) * | 2017-09-12 | 2017-11-28 | 中国工程物理研究院激光聚变研究中心 | It is a kind of to carry time-gated multichannel hard x-ray imaging detector |
| CN207798271U (en) * | 2017-12-13 | 2018-08-31 | 深圳大学 | A kind of time-of-flight measurement system based on microchannel plate gating technique |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112345809A (en) * | 2020-10-15 | 2021-02-09 | 深圳大学 | Electron beam time amplification oscilloscope and measurement system thereof |
| CN112345809B (en) * | 2020-10-15 | 2022-04-19 | 深圳大学 | Electron beam time amplification oscilloscope and measurement system thereof |
| CN113192814A (en) * | 2021-03-25 | 2021-07-30 | 中国工程物理研究院激光聚变研究中心 | Hybrid magnetic focusing lens electron beam imaging system |
| WO2022198555A1 (en) * | 2021-03-25 | 2022-09-29 | 中国工程物理研究院激光聚变研究中心 | Electron beam imaging system using hybrid magnetic focusing lens |
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